-
-exclusively focused on the so-called limited language pack, which consists of only ten hours of recorded telephone conversations. Our experiments were conducted using the Bengali, Tamil, Turkish and Zulu languages. The languages that we selected for our experiments have the largest vocabulary sizes (See Table I) of the languages in the Babel program and thus suffer the most from the data sparsity problem. As a point of comparison, Tagalog, which was not used in our experiments, has one third as m",0.037590773173857325,"information between adjacent tokens in the data. This corresponds to maximizing the likelihood of the data assuming a bigram model.
-
-The benefit of using word classes is that the resulting language model can have fewer parameters than a word-based n-gram model. In our case, the in-domain training text is so small that it can be a real advantage to have fewer parameters to learn in the language model. The problem is that if the data is too small to reliably estimate word transition probabilities ($p(w_i|w_{i-1})$), then it will also be difficult to learn a good partitioning of the words into classes.
-
-Our hypothesis is that the advantage in learning the word class assignments on the Twitter data, which solves the data sparsity problem, outweighs any performance penalty that is incurred due to domain mis-match. This differs from the traditional approach where the class assignments ($w_i \in c_j$) are learned from the same training text which is used to estimate the class transition probabilities ($p(c_i|c_{i-1})$) and the word probabilities ($p(w_i|c_j)$). Twitter data, in these experiments, refers to the concatenation of the text downloaded from Twitter with our in-domain data for the reasons described above. The experiments in Section IV-C will compare learning the class assignments on out-of-domain data (hybrid method) to the traditional approach (baseline).
-
-## IV. EXPERIMENTS
-
-### A. Experimental Data
-
-The in-domain data used in the experiments in this paper comes from the IARPA Babel program.[^1] This program focuses on keyword search for low-resource languages. The languages are low resource in the sense that they have fewer native speakers than the languages receiving the most attention from researchers and also in the sense that the provided training data is small in comparison to what is typically used. We exclusively focused on the so-called limited language pack, which consists of only ten hours of recorded telephone conversations. Our experiments were conducted using the Bengali, Tamil, Turkish and Zulu languages. The languages that we selected for our experiments have the largest vocabulary sizes (See Table I) of the languages in the Babel program and thus suffer the most from the data sparsity problem. As a point of comparison, Tagalog, which was not used in our experiments, has one thir",0.05126014523707817,"is corresponds to maximizing the likelihood of the data assuming a bigram model.
-
-The benefit of using word classes is that the resulting language model can have fewer parameters than a word-based n-gram model. In our case, the in-domain training text is so small that it can be a real advantage to have fewer parameters to learn in the language model. The problem is that if the data is too small to reliably estimate word transition probabilities ($$p(w_i|w_{i-1})$$), then it will also be difficult to learn a good partitioning of the words into classes.
-
-Our hypothesis is that the advantage in learning the word class assignments on the Twitter data, which solves the data sparsity problem, outweighs any performance penalty that is incurred due to domain mis-match. This differs from the traditional approach where the class assignments ($$w_i \in c_j$$) are learned from the same training text which is used to estimate the class transition probabilities ($$p(c_i|c_{i-1})$$) and the word probabilities ($$p(w_i|c_j)$$). Twitter data, in these experiments, refers to the concatenation of the text downloaded from Twitter with our in-domain data for the reasons described above. The experiments in Section IV-C will compare learning the class assignments on out-of-domain data (hybrid method) to the traditional approach (baseline).
-
-## IV. EXPERIMENTS
-
-### A. Experimental Data
-
-The in-domain data used in the experiments in this paper comes from the IARPA Babel program.1 This program focuses on keyword search for low-resource languages. The languages are low resource in the sense that they have fewer native speakers than the languages receiving the most attention from researchers and also in the sense that the provided training data is small in comparison to what is typically used. We exclusively focused on the so-called limited language pack, which consists of only ten hours of recorded telephone conversations. Our experiments were conducted using the Bengali, Tamil, Turkish and Zulu languages. The languages that we selected for our experiments have the largest vocabulary sizes (See Table I) of the languages in the Babel program and thus suffer the most from the data sparsity problem. As a point of comparison, Tagalog, which was not used in our experiments, has one third as many vocabulary items as Tamil",0.09568560444254592,"kelihood of the data assuming a bigram model.
-
-The benefit of using word classes is that the resulting language model can have fewer parameters than a word-based n-gram model. In our case, the in-domain training text is so small that it can be a real advantage to have fewer parameters to learn in the language model. The problem is that if the data is too small to reliably estimate word transition probabilities ( _p_ ( _wi|wi−_ 1)), then it will also be difficult to learn a good partitioning of the words into classes.
-
-Our hypothesis is that the advantage in learning the word class assignments on the Twitter data, which solves the data sparsity problem, outweighs any performance penalty that is incurred due to domain mis-match. This differs from the traditional approach where the class assignments ( _wi ∈ cj_ ) are learned from the same training text which is used to estimate the class transition probabilities ( _p_ ( _ci|ci−_ 1)) and the word probabilities ( _p_ ( _wi|cj_ )). Twitter data, in these experiments, refers to the concatenation of the text downloaded from Twitter with our in-domain data for the reasons described above. The experiments in Section IV-C will compare learning the class assignments on out-of-domain data (hybrid method) to the traditional approach (baseline).
-
-## IV. EXPERIMENTS
-
-## _A. Experimental Data_
-
-The in-domain data used in the experiments in this paper comes from the IARPA Babel program.[1] This program focuses on keyword search for low-resource languages. The languages are low resource in the sense that they have fewer native speakers than the languages receiving the most attention from researchers and also in the sense that the provided training data is small in comparison to what is typically used. We
-
-1http://www.iarpa.gov/index.php/research-programs/babel
-
-exclusively focused on the so-called limited language pack, which consists of only ten hours of recorded telephone conversations. Our experiments were conducted using the Bengali, Tamil, Turkish and Zulu languages. The languages that we selected for our experiments have the largest vocabulary sizes (See Table I) of the languages in the Babel program and thus suffer the most from the data sparsity problem. As a point of comparison, Tagalog, which was not used in our experiments, has one third as many vocab",0.09440410081161897,"information between adjacent tokens in the data. This corresponds to maximizing the likelihood of the data assuming a bigram model.
-
-The benefit of using word classes is that the resulting language model can have fewer parameters than a word-based n-gram model. In our case, the in-domain training text is so small that it can be a real advantage to have fewer parameters to learn in the language model. The problem is that if the data is too small to reliably estimate word transition probabilities ( p ( w i | w i -1 ) ), then it will also be difficult to learn a good partitioning of the words into classes.
-
-Our hypothesis is that the advantage in learning the word class assignments on the Twitter data, which solves the data sparsity problem, outweighs any performance penalty that is incurred due to domain mis-match. This differs from the traditional approach where the class assignments ( w i ∈ c j ) are learned from the same training text which is used to estimate the class transition probabilities ( p ( c i | c i -1 ) ) and the word probabilities ( p ( w i | c j ) ). Twitter data, in these experiments, refers to the concatenation of the text downloaded from Twitter with our in-domain data for the reasons described above. The experiments in Section IV-C will compare learning the class assignments on out-of-domain data (hybrid method) to the traditional approach (baseline).
-
-## IV. EXPERIMENTS
-
-## A. Experimental Data
-
-The in-domain data used in the experiments in this paper comes from the IARPA Babel program. 1 This program focuses on keyword search for low-resource languages. The languages are low resource in the sense that they have fewer native speakers than the languages receiving the most attention from researchers and also in the sense that the provided training data is small in comparison to what is typically used. We
-
-1 http://www.iarpa.gov/index.php/research-programs/babel
-
-exclusively focused on the so-called limited language pack, which consists of only ten hours of recorded telephone conversations. Our experiments were conducted using the Bengali, Tamil, Turkish and Zulu languages. The languages that we selected for our experiments have the largest vocabulary sizes (See Table I) of the languages in the Babel program and thus suffer the most from the data sparsity problem. As a point of compa",0.09440410081161897,"information between adjacent tokens in the data. This corresponds to maximizing the likelihood of the data assuming a bigram model.
-
-The benefit of using word classes is that the resulting language model can have fewer parameters than a word-based n-gram model. In our case, the in-domain training text is so small that it can be a real advantage to have fewer parameters to learn in the language model. The problem is that if the data is too small to reliably estimate word transition probabilities ( p ( w i | w i -1 ) ), then it will also be difficult to learn a good partitioning of the words into classes.
-
-Our hypothesis is that the advantage in learning the word class assignments on the Twitter data, which solves the data sparsity problem, outweighs any performance penalty that is incurred due to domain mis-match. This differs from the traditional approach where the class assignments ( w i ∈ c j ) are learned from the same training text which is used to estimate the class transition probabilities ( p ( c i | c i -1 ) ) and the word probabilities ( p ( w i | c j ) ). Twitter data, in these experiments, refers to the concatenation of the text downloaded from Twitter with our in-domain data for the reasons described above. The experiments in Section IV-C will compare learning the class assignments on out-of-domain data (hybrid method) to the traditional approach (baseline).
-
-## IV. EXPERIMENTS
-
-## A. Experimental Data
-
-The in-domain data used in the experiments in this paper comes from the IARPA Babel program. 1 This program focuses on keyword search for low-resource languages. The languages are low resource in the sense that they have fewer native speakers than the languages receiving the most attention from researchers and also in the sense that the provided training data is small in comparison to what is typically used. We
-
-1 http://www.iarpa.gov/index.php/research-programs/babel
-
-exclusively focused on the so-called limited language pack, which consists of only ten hours of recorded telephone conversations. Our experiments were conducted using the Bengali, Tamil, Turkish and Zulu languages. The languages that we selected for our experiments have the largest vocabulary sizes (See Table I) of the languages in the Babel program and thus suffer the most from the data sparsity problem. As a point of compa",14,science_sample
-14,1,"We performed data collection and language model train- ing experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.",False,0.002242152466367713,"We performed data collection and language model train ing experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.",0.008968609865470852,"
-We performed data collection and language model training experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.
-",0.008968609865470852,"
-We performed data collection and language model training experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.
-",0.008968609865470852,"
-
-We performed data collection and language model training experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.",0.008968609865470852,"
-
-We performed data collection and language model training experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.",0.008968609865470852,"
-We performed data collection and language model training experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.
-",0.008968609865470852,"
-We performed data collection and language model training experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.
-",14,science_sample
-14,2,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",False,0.0,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",0.0,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",0.0,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",0.0,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",0.0,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",0.0,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",0.0,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",14,science_sample
-15,0,"web text sources for conversational speech language modeling using class-dependent mixtures,” in Proc. HLT/NAACL, 2003, pp. 7–9. [5] S. Schwarm, I. Bulyko, and M. Ostendorf, “Adaptive language modeling with varied sources to cover new vocabulary items,” IEEE Trans. Speech and Audio, vol. 12, no. 3, pp. 334–342, 2004. [6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, “Web resources for language modeling in conversational speech recognition,” ACM Transactions on Speech and Language Processing, vol. 5, no. 1, pp. 1–xx, 2007. [7] A. Sethy, P. Georgiou, and S. Narayanan, “Building topic-specific language models from webdata using competitive models,” in Proc. Interspeech, 2005, pp. 1293–1296. [8] R. Sarikaya, A. Gravano, and Y. Gao, “Rapid language model develop- ment using external resources for new spoken dialog domains,” in Proc. ICASSP, vol. I, 2005, pp. 573–576. [9] K. Yoshino, S. Mori, and T. Kawahara, “Incorporating semantic infor- mation to selection of web texts for language model of spoken dialogue system,” in Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on, May 2013, pp. 8252–8256. [10] R. Moore and W. Lewis, “Intelligent selection of language model training,” in Proc. ACL, 2010. [11] A. Axelrod, X. He, and J. Gao, “Domain adaptation via pseudo in- domain data selection,” in Proc. EMNLP, 2011. [12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, “Supervised and unsupervised web-based language model domain adaptation,” in Proc. Interspeech, 2012. [13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, “Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,” in Proc. Interspeech, 2013. [14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mer- cer, “Class-based n-gram models of natural language,” Computational Linguistics, vol. 18, no. 4, pp. 467–479, 1992. [15] R. Iyer and M. Ostendorf, “Transforming out-of-domain estimates to improve in-domain language models,” in Proc. Eurospeech, vol. 4, 1997, pp. 1975–1978. [16] A. Stolcke, “SRILM – an extensible language modeling toolkit,” in Proc. ICSLP, 2002, pp. 901–904. [17] P. Liang, “Semi-supervised learning for natural language,” Ph.D. disser- tation, Massachusetts Institute of Technology, 2005. [18] I. H. Witten and T. Bell, “The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,” Information Theory, IEEE Transactions on, vol. 37, no. 4, pp. 1085–1094, 1991. [19] J. Cho, H. Garcia-Molina, and L. Page, “Efficient crawling through url ordering,” Comput. Netw. ISDN Syst., vol. 30, no. 1-7, pp. 161–172, 1998. [Online]. Available: http://dx.doi.org/10.1016/S0169-7552(98) 00108-1 [20] A. Liaw and M. Wiener, “Classification and regression by randomforest,” R News, vol. 2, no. 3, pp. 18–22, 2002. [Online]. Available: http://CRAN.R-project.org/doc/Rnews/",False,0.021283899759697907,"or conversational speech language modeling using class-dependent mixtures,” in Proc. HLT/NAACL, 2003, pp. 7–9.
-
-[5] S. Schwarm, I. Bulyko, and M. Ostendorf, “Adaptive language modeling with varied sources to cover new vocabulary items,” IEEE Trans. Speech and Audio, vol. 12, no. 3, pp. 334–342, 2004.
-
-[6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, “Web resources for language modeling in conversational speech recognition,” ACM Transactions on Speech and Language Processing, vol. 5, no. 1, pp. 1–xx, 2007.
-
-[7] A. Sethy, P. Georgiou, and S. Narayanan, “Building topic-specific language models from webdata using competitive models,” in Proc. Interspeech, 2005, pp. 1293–1296.
-
-[8] R. Sarikaya, A. Gravano, and Y. Gao, “Rapid language model develop ment using external resources for new spoken dialog domains,” in Proc. ICASSP, vol. I, 2005, pp. 573–576.
-
-[9] K. Yoshino, S. Mori, and T. Kawahara, “Incorporating semantic infor mation to selection of web texts for language model of spoken dialogue system,” in Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on, May 2013, pp. 8252–8256.
-
-[10] R. Moore and W. Lewis, “Intelligent selection of language model training,” in Proc. ACL, 2010.
-
-[11] A. Axelrod, X. He, and J. Gao, “Domain adaptation via pseudo in domain data selection,” in Proc. EMNLP, 2011.
-
-[12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, “Supervised and unsupervised web-based language model domain adaptation,” in Proc. Interspeech, 2012.
-
-[13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, “Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,” in Proc. Interspeech, 2013.
-
-[14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mer cer, “Class-based n-gram models of natural language,” Computational Linguistics, vol. 18, no. 4, pp. 467–479, 1992.
-
-[15] R. Iyer and M. Ostendorf, “Transforming out-of-domain estimates to improve in-domain language models,” in Proc. Eurospeech, vol. 4, 1997, pp. 1975–1978.
-
-[16] A. Stolcke, “SRILM – an extensible language modeling toolkit,” in Proc. ICSLP, 2002, pp. 901–904.
-
-[17] P. Liang, “Semi-supervised learning for natural language,” Ph.D. disser tation, Massachusetts Institute of Technology, 2005.
-
-[18] I. H. Witten and T. Bell, “The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,” Information Theory, IEEE Transactions on, vol. 37, no. 4, pp. 1085–1094, 1991.
-
-[19] J. Cho, H. Garcia-Molina, and L. Page, “Efficient crawling through url ordering,” Comput. Netw. ISDN Syst., vol. 30, no. 1-7, pp. 161–172, 1998. [Online]. Available: http://dx.doi.org/10.1016/S0169-7552(98) 00108-1
-
-[20] A. Liaw and M. Wiener, “Classification and regression by randomforest,” R News, vol. 2, no. 3, pp. 18–22, 2002. [Online]. Available: http://CRAN.R-project.org/doc/Rnews",0.07689667009955373,"eb text sources for conversational speech language modeling using class-dependent mixtures,” in *Proc. HLT/NAACL*, 2003, pp. 7–9.
-
-[5] S. Schwarm, I. Bulyko, and M. Ostendorf, “Adaptive language modeling with varied sources to cover new vocabulary items,” *IEEE Trans. Speech and Audio*, vol. 12, no. 3, pp. 334–342, 2004.
-
-[6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, “Web resources for language modeling in conversational speech recognition,” *ACM Transactions on Speech and Language Processing*, vol. 5, no. 1, pp. 1–xx, 2007.
-
-[7] A. Sethy, P. Georgiou, and S. Narayanan, “Building topic-specific language models from webdata using competitive models,” in *Proc. Interspeech*, 2005, pp. 1293–1296.
-
-[8] R. Sarikaya, A. Gravano, and Y. Gao, “Rapid language model development using external resources for new spoken dialog domains,” in *Proc. ICASSP*, vol. I, 2005, pp. 573–576.
-
-[9] K. Yoshino, S. Mori, and T. Kawahara, “Incorporating semantic information to selection of web texts for language model of spoken dialogue system,” in *Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on*, May 2013, pp. 8252–8256.
-
-[10] R. Moore and W. Lewis, “Intelligent selection of language model training,” in *Proc. ACL*, 2010.
-
-[11] A. Axelrod, X. He, and J. Gao, “Domain adaptation via pseudo in-domain data selection,” in *Proc. EMNLP*, 2011.
-
-[12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, “Supervised and unsupervised web-based language model domain adaptation,” in *Proc. Interspeech*, 2012.
-
-[13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, “Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,” in *Proc. Interspeech*, 2013.
-
-[14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mercer, “Class-based n-gram models of natural language,” *Computational Linguistics*, vol. 18, no. 4, pp. 467–479, 1992.
-
-[15] R. Iyer and M. Ostendorf, “Transforming out-of-domain estimates to improve in-domain language models,” in *Proc. Eurospeech*, vol. 4, 1997, pp. 1975–1978.
-
-[16] A. Stolcke, “SRILM – an extensible language modeling toolkit,” in *Proc. ICSLP*, 2002, pp. 901–904.
-
-[17] P. Liang, “Semi-supervised learning for natural language,” Ph.D. dissertation, Massachusetts Institute of Technology, 2005.
-
-[18] I. H. Witten and T. Bell, “The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,” *Information Theory, IEEE Transactions on*, vol. 37, no. 4, pp. 1085–1094, 1991.
-
-[19] J. Cho, H. Garcia-Molina, and L. Page, “Efficient crawling through url ordering,” *Comput. Netw. ISDN Syst.*, vol. 30, no. 1-7, pp. 161–172, 1998. [Online]. Available: [http://dx.doi.org/10.1016/S0169-7552\(98\)00108-1](http://dx.doi.org/10.1016/S0169-7552(98)00108-1)
-
-[20] A. Liaw and M. Wiener, “Classification and regression by randomforest,” *R New",0.05149330587023687,"web text sources for conversational speech language modeling using class-dependent mixtures,” in *Proc. HLT/NAACL*, 2003, pp. 7–9.
-
-## References
-
-[5] S. Schwarm, I. Bulyko, and M. Ostendorf, “Adaptive language modeling with varied sources to cover new vocabulary items,” *IEEE Trans. Speech and Audio*, vol. 12, no. 3, pp. 334–342, 2004.
-
-[6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, “Web resources for language modeling in conversational speech recognition,” *ACM Transactions on Speech and Language Processing*, vol. 5, no. 1, pp. 1–xx, 2007.
-
-[7] A. Sethy, P. Georgiou, and S. Narayanan, “Building topic-specific language models from webdata using competitive models,” in *Proc. Interspeech*, 2005, pp. 1293–1296.
-
-[8] R. Sarikaya, A. Gravano, and Y. Gao, “Rapid language model development using external resources for new spoken dialog domains,” in *Proc. ICASSP*, vol. I, 2005, pp. 573–576.
-
-[9] K. Yoshino, S. Mori, and T. Kawahara, “Incorporating semantic information to selection of web texts for language model of spoken dialogue system,” in *Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on*, May 2013, pp. 8252–8256.
-
-[10] R. Moore and W. Lewis, “Intelligent selection of language model training,” in *Proc. ACL*, 2010.
-
-[11] A. Axelrod, X. He, and J. Gao, “Domain adaptation via pseudo in-domain data selection,” in *Proc. EMNLP*, 2011.
-
-[12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, “Supervised and unsupervised web-based language model domain adaptation,” in *Proc. Interspeech*, 2012.
-
-[13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, “Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,” in *Proc. Interspeech*, 2013.
-
-[14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mercer, “Class-based n-gram models of natural language,” *Computational Linguistics*, vol. 18, no. 4, pp. 467–479, 1992.
-
-[15] R. Iyer and M. Ostendorf, “Transforming out-of-domain estimates to improve in-domain language models,” in *Proc. Eurospeech*, vol. 4, 1997, pp. 1975–1978.
-
-[16] A. Stolcke, “SRILM – an extensible language modeling toolkit,” in *Proc. ICSLP*, 2002, pp. 901–904.
-
-[17] P. Liang, “Semi-supervised learning for natural language,” Ph.D. dissertation, Massachusetts Institute of Technology, 2005.
-
-[18] I. H. Witten and T. Bell, “The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,” *Information Theory, IEEE Transactions on*, vol. 37, no. 4, pp. 1085–1094, 1991.
-
-[19] J. Cho, H. Garcia-Molina, and L. Page, “Efficient crawling through url ordering,” *Comput. Netw. ISDN Syst.*, vol. 30, no. 1-7, pp. 161–172, 1998. [Online]. Available: http://dx.doi.org/10.1016/S0169-7552(98)00108-1
-
-[20] A. Liaw and M. Wiener, “Classification and regression by randomforest,” *R News*, vol. 2, no. 3, pp. 18–22, 2002. [",0.05286646069344319,"ch language modeling using class-dependent mixtures,"" in *Proc. HLT/NAACL*, 2003, pp. 7–9.
-
-[5] S. Schwarm, I. Bulyko, and M. Ostendorf, ""Adaptive language modeling with varied sources to cover new vocabulary items,"" *IEEE Trans. Speech and Audio*, vol. 12, no. 3, pp. 334–342, 2004.
-
-[6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, ""Web resources for language modeling in conversational speech recognition,"" *ACM Transactions on Speech and Language Processing*, vol. 5, no. 1, pp. 1–xx, 2007.
-
-[7] A. Sethy, P. Georgiou, and S. Narayanan, ""Building topic-specific language models from webdata using competitive models,"" in *Proc. Interspeech*, 2005, pp. 1293–1296.
-
-[8] R. Sarikaya, A. Gravano, and Y. Gao, ""Rapid language model development using external resources for new spoken dialog domains,"" in *Proc. ICASSP*, vol. I, 2005, pp. 573–576.
-
-[9] K. Yoshino, S. Mori, and T. Kawahara, ""Incorporating semantic information to selection of web texts for language model of spoken dialogue system,"" in *Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on*, May 2013, pp. 8252–8256.
-
-[10] R. Moore and W. Lewis, ""Intelligent selection of language model training,"" in *Proc. ACL*, 2010.
-
-[11] A. Axelrod, X. He, and J. Gao, ""Domain adaptation via pseudo in-domain data selection,"" in *Proc. EMNLP*, 2011.
-
-[12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, ""Supervised and unsupervised web-based language model domain adaptation,"" in *Proc. Interspeech*, 2012.
-
-[13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, ""Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,"" in *Proc. Interspeech*, 2013.
-
-[14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mercer, ""Class-based n-gram models of natural language,"" *Computational Linguistics*, vol. 18, no. 4, pp. 467–479, 1992.
-
-[15] R. Iyer and M. Ostendorf, ""Transforming out-of-domain estimates to improve in-domain language models,"" in *Proc. Eurospeech*, vol. 4, 1997, pp. 1975–1978.
-
-[16] A. Stolcke, ""SRILM – an extensible language modeling toolkit,"" in *Proc. ICSLP*, 2002, pp. 901–904.
-
-[17] P. Liang, ""Semi-supervised learning for natural language,"" Ph.D. dissertation, Massachusetts Institute of Technology, 2005.
-
-[18] I. H. Witten and T. Bell, ""The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,"" *Information Theory, IEEE Transactions on*, vol. 37, no. 4, pp. 1085–1094, 1991.
-
-[19] J. Cho, H. Garcia-Molina, and L. Page, ""Efficient crawling through url ordering,"" *Comput. Netw. ISDN Syst.*, vol. 30, no. 1-7, pp. 161–172, 1998. [Online]. Available: http://dx.doi.org/10.1016/S0169-7552(98)00108-1
-
-[20] A. Liaw and M. Wiener, ""Classification and regression by randomforest,"" *R News*, vol. 2, no. 3, pp. 18–22, 2002. [Online]. Available: http://CRAN.R-project.org/doc/Rnews",0.08753861997940268,"xt sources for conversational speech language modeling using class-dependent mixtures,” in _Proc. HLT/NAACL_ , 2003, pp. 7–9.
-
-- [5] S. Schwarm, I. Bulyko, and M. Ostendorf, “Adaptive language modeling with varied sources to cover new vocabulary items,” _IEEE Trans. Speech and Audio_ , vol. 12, no. 3, pp. 334–342, 2004.
-
-- [6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, “Web resources for language modeling in conversational speech recognition,”
-
- - _ACM Transactions on Speech and Language Processing_ , vol. 5, no. 1, pp. 1–xx, 2007.
-
-- [7] A. Sethy, P. Georgiou, and S. Narayanan, “Building topic-specific language models from webdata using competitive models,” in _Proc. Interspeech_ , 2005, pp. 1293–1296.
-
-- [8] R. Sarikaya, A. Gravano, and Y. Gao, “Rapid language model development using external resources for new spoken dialog domains,” in _Proc. ICASSP_ , vol. I, 2005, pp. 573–576.
-
-- [9] K. Yoshino, S. Mori, and T. Kawahara, “Incorporating semantic information to selection of web texts for language model of spoken dialogue system,” in _Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on_ , May 2013, pp. 8252–8256.
-
-- [10] R. Moore and W. Lewis, “Intelligent selection of language model training,” in _Proc. ACL_ , 2010.
-
-- [11] A. Axelrod, X. He, and J. Gao, “Domain adaptation via pseudo indomain data selection,” in _Proc. EMNLP_ , 2011.
-
-- [12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, “Supervised and unsupervised web-based language model domain adaptation,” in _Proc. Interspeech_ , 2012.
-
-- [13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, “Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,” in _Proc. Interspeech_ , 2013.
-
-- [14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mercer, “Class-based n-gram models of natural language,” _Computational Linguistics_ , vol. 18, no. 4, pp. 467–479, 1992.
-
-- [15] R. Iyer and M. Ostendorf, “Transforming out-of-domain estimates to improve in-domain language models,” in _Proc. Eurospeech_ , vol. 4, 1997,
-
- - pp. 1975–1978.
-
-- [16] A. Stolcke, “SRILM – an extensible language modeling toolkit,” in _Proc. ICSLP_ , 2002, pp. 901–904.
-
-- [17] P. Liang, “Semi-supervised learning for natural language,” Ph.D. dissertation, Massachusetts Institute of Technology, 2005.
-
-- [18] I. H. Witten and T. Bell, “The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,” _Information Theory, IEEE Transactions on_ , vol. 37, no. 4, pp. 1085–1094, 1991.
-
-- [19] J. Cho, H. Garcia-Molina, and L. Page, “Efficient crawling through url ordering,” _Comput. Netw. ISDN Syst._ , vol. 30, no. 1-7, pp. 161–172, 1998. [Online]. Available: http://dx.doi.org/10.1016/S0169-7552(98) 00108-1
-
-- [20] A. Liaw and M. Wiener, “Classification and regression by ra",0.051836594576038446,"ch language modeling using class-dependent mixtures,' in Proc. HLT/NAACL , 2003, pp. 7-9.
-- [5] S. Schwarm, I. Bulyko, and M. Ostendorf, 'Adaptive language modeling with varied sources to cover new vocabulary items,' IEEE Trans. Speech and Audio , vol. 12, no. 3, pp. 334-342, 2004.
-- [6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, 'Web resources for language modeling in conversational speech recognition,' ACM Transactions on Speech and Language Processing , vol. 5, no. 1, pp. 1-xx, 2007.
-- [7] A. Sethy, P. Georgiou, and S. Narayanan, 'Building topic-specific language models from webdata using competitive models,' in Proc. Interspeech , 2005, pp. 1293-1296.
-- [8] R. Sarikaya, A. Gravano, and Y. Gao, 'Rapid language model development using external resources for new spoken dialog domains,' in Proc. ICASSP , vol. I, 2005, pp. 573-576.
-- [9] K. Yoshino, S. Mori, and T. Kawahara, 'Incorporating semantic information to selection of web texts for language model of spoken dialogue system,' in Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on , May 2013, pp. 8252-8256.
-- [10] R. Moore and W. Lewis, 'Intelligent selection of language model training,' in Proc. ACL , 2010.
-- [11] A. Axelrod, X. He, and J. Gao, 'Domain adaptation via pseudo indomain data selection,' in Proc. EMNLP , 2011.
-- [12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, 'Supervised and unsupervised web-based language model domain adaptation,' in Proc. Interspeech , 2012.
-- [13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, 'Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,' in Proc. Interspeech , 2013.
-- [14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mercer, 'Class-based n-gram models of natural language,' Computational Linguistics , vol. 18, no. 4, pp. 467-479, 1992.
-- [15] R. Iyer and M. Ostendorf, 'Transforming out-of-domain estimates to improve in-domain language models,' in Proc. Eurospeech , vol. 4, 1997, pp. 1975-1978.
-- [16] A. Stolcke, 'SRILM - an extensible language modeling toolkit,' in Proc. ICSLP , 2002, pp. 901-904.
-- [17] P. Liang, 'Semi-supervised learning for natural language,' Ph.D. dissertation, Massachusetts Institute of Technology, 2005.
-- [18] I. H. Witten and T. Bell, 'The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,' Information Theory, IEEE Transactions on , vol. 37, no. 4, pp. 1085-1094, 1991.
-- [19] J. Cho, H. Garcia-Molina, and L. Page, 'Efficient crawling through url ordering,' Comput. Netw. ISDN Syst. , vol. 30, no. 1-7, pp. 161-172, 1998. [Online]. Available: http://dx.doi.org/10.1016/S0169-7552(98) 00108-1
-- [20] A. Liaw and M. Wiener, 'Classification and regression by randomforest,' R News , vol. 2, no. 3, pp. 18-22, 2002. [Online]. Available: http://CRAN.R-project.org/doc/Rnews",0.051836594576038446,"ch language modeling using class-dependent mixtures,' in Proc. HLT/NAACL , 2003, pp. 7-9.
-- [5] S. Schwarm, I. Bulyko, and M. Ostendorf, 'Adaptive language modeling with varied sources to cover new vocabulary items,' IEEE Trans. Speech and Audio , vol. 12, no. 3, pp. 334-342, 2004.
-- [6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, 'Web resources for language modeling in conversational speech recognition,' ACM Transactions on Speech and Language Processing , vol. 5, no. 1, pp. 1-xx, 2007.
-- [7] A. Sethy, P. Georgiou, and S. Narayanan, 'Building topic-specific language models from webdata using competitive models,' in Proc. Interspeech , 2005, pp. 1293-1296.
-- [8] R. Sarikaya, A. Gravano, and Y. Gao, 'Rapid language model development using external resources for new spoken dialog domains,' in Proc. ICASSP , vol. I, 2005, pp. 573-576.
-- [9] K. Yoshino, S. Mori, and T. Kawahara, 'Incorporating semantic information to selection of web texts for language model of spoken dialogue system,' in Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on , May 2013, pp. 8252-8256.
-- [10] R. Moore and W. Lewis, 'Intelligent selection of language model training,' in Proc. ACL , 2010.
-- [11] A. Axelrod, X. He, and J. Gao, 'Domain adaptation via pseudo indomain data selection,' in Proc. EMNLP , 2011.
-- [12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, 'Supervised and unsupervised web-based language model domain adaptation,' in Proc. Interspeech , 2012.
-- [13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, 'Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,' in Proc. Interspeech , 2013.
-- [14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mercer, 'Class-based n-gram models of natural language,' Computational Linguistics , vol. 18, no. 4, pp. 467-479, 1992.
-- [15] R. Iyer and M. Ostendorf, 'Transforming out-of-domain estimates to improve in-domain language models,' in Proc. Eurospeech , vol. 4, 1997, pp. 1975-1978.
-- [16] A. Stolcke, 'SRILM - an extensible language modeling toolkit,' in Proc. ICSLP , 2002, pp. 901-904.
-- [17] P. Liang, 'Semi-supervised learning for natural language,' Ph.D. dissertation, Massachusetts Institute of Technology, 2005.
-- [18] I. H. Witten and T. Bell, 'The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,' Information Theory, IEEE Transactions on , vol. 37, no. 4, pp. 1085-1094, 1991.
-- [19] J. Cho, H. Garcia-Molina, and L. Page, 'Efficient crawling through url ordering,' Comput. Netw. ISDN Syst. , vol. 30, no. 1-7, pp. 161-172, 1998. [Online]. Available: http://dx.doi.org/10.1016/S0169-7552(98) 00108-1
-- [20] A. Liaw and M. Wiener, 'Classification and regression by randomforest,' R News , vol. 2, no. 3, pp. 18-22, 2002. [Online]. Available: http://CRAN.R-project.org/doc/Rnews",15,science_sample
-16,0,"Figure 7: The red arcs are the trajectory of the system (5.60) with initial value (0, 1.2) and the blue arcs are the orbit with initial value (0, 1.5). Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time increases.",False,0.00749063670411985,"Figure 7: The red arcs are the trajectory of the system (5.60) with initial value (0, 1.2) and the blue arcs are the orbit with initial value (0, 1.5) . Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time increases",0.0599250936329588,"gure 7: The red arcs are the trajectory of the system (5.60) with initial value $(0, 1.2)$ and the blue arcs are the orbit with initial value $(0, 1.5)$ . Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time incr",0.0449438202247191,"e 7:** The red arcs are the trajectory of the system (5.60) with initial value $(0, 1.2)$ and the blue arcs are the orbit with initial value $(0, 1.5)$. Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time increases",0.0,"Figure 7: The red arcs are the trajectory of the system (5.60) with initial value (0, 1.2) and the blue arcs are the orbit with initial value (0, 1.5). Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time increases.",0.0,"Figure 7: The red arcs are the trajectory of the system (5.60) with initial value (0, 1.2) and the blue arcs are the orbit with initial value (0, 1.5). Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time increases.",0.052434456928838954,"Figure 7: The red arcs are the trajectory of the system (5.60) with initial value (0 , 1 . 2) and the blue arcs are the orbit with initial value (0 , 1 . 5) . Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time inc",0.052434456928838954,"Figure 7: The red arcs are the trajectory of the system (5.60) with initial value (0 , 1 . 2) and the blue arcs are the orbit with initial value (0 , 1 . 5) . Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time inc",16,science_sample
-16,1,"Let us start with the linearization of system (5.71) around the periodic solution Ψ0(t). Consider a near solution y(t) = y(t, 0, y∗+∆y), where ∆y = (∆y1, ∆y2), to the periodic solution Ψ0(t). Assume that",False,0.06403940886699508,"et us start with the linearization of system (5.71) around the periodic solution Yo(t). Consider a near solution y(t) = y(t, 0, y* + Ay), where Ay = (Ay1, Ay2), to the periodic solution Vo(t). Assume tha",0.35960591133004927,"Let us start with the linearization of system (5.71) around the periodic solution $\Psi_0(t)$ . Consider a near solution $y(t) = y(t, 0, y^* + \Delta y)$ , where $\Delta y = (\Delta y_1, \Delta y_2)$ ",0.4039408866995074,"e linearization of system (5.71) around the periodic solution $\Psi_0(t)$. Consider a near solution $y(t) = y(t, 0, y^* +\Delta y)$, where $\Delta y = (\Delta y_1, \Delta y_2)$, to the periodic solution ",0.3645320197044335,"
-
-Let us start with the linearization of system (5.71) around the periodic solution $$\Psi_0(t)$$. Consider a near solution $$y(t) = y(t, 0, y^* + \Delta y)$$, where $$\Delta y = (\Delta y_1, \Delta y_2)",0.029556650246305417,"et us start with the linearization of system (5.71) around the periodic solution Ψ0(t). Consider a near solution y(t) = y(t, 0, y[∗] +∆y), where ∆y = (∆y1, ∆y2), to the periodic solution Ψ0(t). Assume th",0.23645320197044334,"tart with the linearization of system (5.71) around the periodic solution Ψ 0 ( t ) . Consider a near solution y ( t ) = y ( t, 0 , y ∗ +∆ y ) , where ∆ y = (∆ y 1 , ∆ y 2 ) , to the periodic solution Ψ ",0.23645320197044334,"tart with the linearization of system (5.71) around the periodic solution Ψ 0 ( t ) . Consider a near solution y ( t ) = y ( t, 0 , y ∗ +∆ y ) , where ∆ y = (∆ y 1 , ∆ y 2 ) , to the periodic solution Ψ ",16,science_sample
-16,2,"near solution y(t) = y(t, 0, y∗+∆y), where ∆y = (∆y1, ∆y2), to the periodic solution Ψ0(t). Assume that y(t) satisfies condition (N1), and it meets the surface of discontinuity Γ at the moment t = ξ and at the point ¯y = y(ξ, 0, y∗+ ∆y). Considering the formula (3.10) for the transversal point ¯y = (¯y1, ¯y2), the first ∂τ(¯y) ∂τ(¯y) component can be evaluated as = . From the last equality, the singularity is seen at the ∂y0 ∂y0 −1¯y",False,0.13333333333333333,"a near solution y(t) = y(t, 0, y* + Ay), where Ay = (Ay1, Ay2), to the periodic solution Vo(t). Assume that y(t) satisfies condition (N1), and it meets the surface of discontinuity I at the moment t = { and at the point y = y(§, 0, y* + Ay). Considering the formula (3.10) for the transversal point y (1,2), the first дт(у) aT(y) 1 component ду can be evaluated as მყი Y2 From the last equality, the singularity is seen at the дт(у) gr",0.4942528735632184,"ear solution $y(t) = y(t, 0, y^* + \Delta y)$ , where $\Delta y = (\Delta y_1, \Delta y_2)$ , to the periodic solution $\Psi_0(t)$ . Assume that $y(t)$ satisfies condition (N1), and it meets the surface of discontinuity $\Gamma$ at the moment $t = \xi$ and at the point $\bar{y} = y(\xi, 0, y^* + \Delta y)$ . Considering the formula (3.10) for the transversal point $\bar{y} = (\bar{y}_1, \bar{y}_2)$ , the first component ",0.4666666666666667,"a near solution $y(t) = y(t, 0, y^* +\Delta y)$, where $\Delta y = (\Delta y_1, \Delta y_2)$, to the periodic solution $\Psi_0(t)$. Assume that $y(t)$ satisfies condition (N1), and it meets the surface of discontinuity $\Gamma$ at the moment $t = \xi$ and at the point $\bar{y} = y(\xi, 0, y^* + \Delta y)$. Considering the formula (3.10) for the transversal point $\bar{y} = (\bar{y}_1, \bar{y}_2)$, the first component $\frac{\partia",0.49885057471264366,"ear solution $$y(t) = y(t, 0, y^* + \Delta y)$$, where $$\Delta y = (\Delta y_1, \Delta y_2)$$, to the periodic solution $$\Psi_0(t)$$. Assume that $$y(t)$$ satisfies condition (N1), and it meets the surface of discontinuity $$\Gamma$$ at the moment $$t = \xi$$ and at the point $$\bar{y} = y(\xi, 0, y^* + \Delta y)$$. Considering the formula (3.10) for the transversal point $$\bar{y} = (\bar{y}_1, \bar{y}_2)$$, the first component ",0.19540229885057472,"ution y(t) = y(t, 0, y[∗] +∆y), where ∆y = (∆y1, ∆y2), to the periodic solution Ψ0(t). Assume that y(t) satisfies condition (N 1), and it meets the surface of discontinuity Γ at the moment t = ξ and at the point ¯y = y(ξ, 0, y[∗] + ∆y). Considering the formula (3.10) for the transversal point ¯y = (¯y1, ¯y2), the first component[∂τ][(¯][y][)] can be evaluated as[∂τ][(¯][y][)] = − ¯[1] . From the last equality, the singularity is se",0.3057471264367816," near solution y ( t ) = y ( t, 0 , y ∗ +∆ y ) , where ∆ y = (∆ y 1 , ∆ y 2 ) , to the periodic solution Ψ 0 ( t ) . Assume that y ( t ) satisfies condition ( N 1) , and it meets the surface of discontinuity Γ at the moment t = ξ and at the point ¯ y = y ( ξ, 0 , y ∗ +∆ y ) . Considering the formula (3.10) for the transversal point ¯ y = (¯ y 1 , ¯ y 2 ) , the first component ∂τ (¯ y ) ∂y 0 1 can be evaluated as ∂τ (¯ y ) ∂y 0 1 = ",0.3057471264367816," near solution y ( t ) = y ( t, 0 , y ∗ +∆ y ) , where ∆ y = (∆ y 1 , ∆ y 2 ) , to the periodic solution Ψ 0 ( t ) . Assume that y ( t ) satisfies condition ( N 1) , and it meets the surface of discontinuity Γ at the moment t = ξ and at the point ¯ y = y ( ξ, 0 , y ∗ +∆ y ) . Considering the formula (3.10) for the transversal point ¯ y = (¯ y 1 , ¯ y 2 ) , the first component ∂τ (¯ y ) ∂y 0 1 can be evaluated as ∂τ (¯ y ) ∂y 0 1 = ",16,science_sample
-17,0,"Y0−W ≥Y1−Y0and Pr , Y1 ≥Y0 ≥W = 1, respectively, where td is a level of input for each treatment t1−t0 t0−tW status d ∈{0, 1} while tW is a level of input without the treatment and tW < t0 < t1. Given W = w, concavity and convexity of the treatment response function restrict the support of (Y0, Y1) to the region below the straight line Y1 = t1−tWt0−tW Y0 − t0−tWt1−t0 w and above the straight line Y1 = Y0, and to the region above two",False,0.1834862385321101," Y₁ ≥ Y ≥ W) = 1 to-tw and Pr (Yo-WY-Yo, Y₁ ≥ Yo≥ W) = 1, respectively, where ta is a level of input for each treatment to-tw status d = {0,1} while tw is a level of input without the treatment and tw < to < t₁. Given W = w, concavity and convexity of the treatment response function restrict the support of (Yo, Y₁) to the region below the straight line Y₁ t₁-tw Yo₁-tow and above the straight line Y₁ = Yo, and to the region above two",0.3440366972477064,"ctively, where $t_d$ is a level of input for each treatment status $d\in\{0,1\}$ while $t_W$ is a level of input without the treatment and $t_W < t_0 < t_1$ . Given $W=w$ , concavity and convexity of the treatment response function restrict the support of $(Y_0, Y_1)$ to the region below the straight line $Y_1=\frac{t_1-t_W}{t_0-t_W}Y_0-\frac{t_1-t_0}{t_0-t_W}w$ and above the straight line $Y_1=Y_0$ , and to the region ",0.2889908256880734,", respectively, where $t_d$ is a level of input for each treatment status $d \in \{0, 1\}$ while $t_W$ is a level of input without the treatment and $t_W < t_0 < t_1$. Given $W = w$, concavity and convexity of the treatment response function restrict the support of $(Y_0, Y_1)$ to the region below the straight line $Y_1 = \frac{t_1-t_W}{t_0-t_W} Y_0 - \frac{t_1-t_0}{t_0-t_W} w$ and above the straight line $Y_1 = Y_0$, and to the reg",0.4197247706422018,"respectively, where* $$t_d$$ *is a level of input for each treatment status* $$d \in \{0,1\}$$ *while* $$t_W$$ *is a level of input without the treatment and* $$t_W \leq t_0 \leq t_1$$*.* *Given* $$W = w$$*, concavity and convexity of the treatment response function restrict the support of* $$(Y_0, Y_1)$$ *to the region below the straight line* $$Y_1 = \frac{t_1-t_W}{t_0-t_W}Y_0 - \frac{t_1-t_0}{t_0-t_W}w$$ *and above the straight l",0.3256880733944954,"W]_ � = 1 _, respectively, where td is a level of input for each treatment status d ∈{_ 0 _,_ 1 _} while tW is a level of input without the treatment and tW < t_ 0 _< t_ 1 _. Given W_ = _w, concavity and convexity of the treatment response function restrict the support of_ ( _Y_ 0 _, Y_ 1) _to the region below the straight line Y_ 1 = _[t] t_[1] 0 _[−] −[t] t[W] W[Y]_[0] _[ −] tt_ 01 _−−ttW_ 0 _[w][ and above the straight line][ Y]_",0.20871559633027523," ) = 1 , respectively, where t d is a level of input for each treatment status d ∈ { 0 , 1 } while t W is a level of input without the treatment and t W < t 0 < t 1 . Given W = w, concavity and convexity of the treatment response function restrict the support of ( Y 0 , Y 1 ) to the region below the straight line Y 1 = t 1 -t W t 0 -t W Y 0 -t 1 -t 0 t 0 -t W w and above the straight line Y 1 = Y 0 , and to the region above tw",0.20871559633027523," ) = 1 , respectively, where t d is a level of input for each treatment status d ∈ { 0 , 1 } while t W is a level of input without the treatment and t W < t 0 < t 1 . Given W = w, concavity and convexity of the treatment response function restrict the support of ( Y 0 , Y 1 ) to the region below the straight line Y 1 = t 1 -t W t 0 -t W Y 0 -t 1 -t 0 t 0 -t W w and above the straight line Y 1 = Y 0 , and to the region above tw",17,science_sample
-17,1,"Example 3 (Roy Model) In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equation:",False,0.010169491525423728,"Example 3 (Roy Model) In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equation",0.023728813559322035,"Example 3 (Roy Model)** In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equati",0.030508474576271188,"ple 3 (Roy Model)*** In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equation:",0.030508474576271188,"ple 3** *(Roy Model) In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equation:",0.030508474576271188,"ample 3** _(Roy Model) In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equatio",0.010169491525423728,"xample 3 (Roy Model) In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equation:",0.010169491525423728,"xample 3 (Roy Model) In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equation:",17,science_sample
-17,2,"where µC (Z) represents nonpecuniary costs with a vector of observables Z. Then treated (D = 1) and untreated people (D = 0) are the observed groups satisfying support restrictions {Y1 −Y0 ≥µC (Z)} and {Y1 −Y0 < µC (Z)}, respectively. Example 4 (DTE conditional on Potential Outcomes) The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain set C is written as",False,0.05012531328320802,"
-where μc (Z) represents nonpecuniary costs with a vector of observables Z. Then treated (D = 1) and untreated people (D = 0) are the observed groups satisfying support restrictions {Y₁ = Y ≥ µc (Z)} and {Y₁ Yoμc (Z)}, respectively.
-
-Example 4 (DTE conditional on Potential Outcomes) The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain set C is written as
-",0.21553884711779447,"represents nonpecuniary costs with a vector of observables $Z$ . Then treated ( $D=1$ ) and untreated people ( $D=0$ ) are the observed groups satisfying support restrictions $\{Y_1=Y_0\ge\mu_C(Z)\}$ and $\{Y_1=Y_0<\mu_C(Z)\}$ , respectively.
-
-**Example 4 (DTE conditional on Potential Outcomes)** The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain se",0.20050125313283207,"represents nonpecuniary costs with a vector of observables $Z$. Then treated ($D = 1$) and untreated people ($D = 0$) are the observed groups satisfying support restrictions $\{Y_1 - Y_0 \geq \mu_C (Z)\}$ and $\{Y_1 - Y_0 < \mu_C (Z)\}$, respectively.
-
-***Example 4 (DTE conditional on Potential Outcomes)*** The conditional DTE for the unobservable subgroup whose potential outcomes belong to a cer",0.3082706766917293,"ts with a vector of observables* $$Z$$*.* *Then treated* $$(D = 1)$$ *and untreated people* $$(D = 0)$$ *are the observed groups satisfying support restrictions* $$\{Y_1 - Y_0 \geq \mu_C(Z)\}$$ *and* $$\{Y_1 - Y_0 < \mu_C(Z)\}$$*, respectively.*
-
-**Example 4** *(DTE conditional on Potential Outcomes) The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain se",0.23558897243107768,"y costs with a vector of observables Z. Then treated_ ( _D_ = 1) _and untreated people_ ( _D_ = 0) _are the observed groups satisfying support restrictions {Y_ 1 _− Y_ 0 _≥ µC_ ( _Z_ ) _} and {Y_ 1 _− Y_ 0 _< µC_ ( _Z_ ) _}, respectively._
-
-**Example 4** _(DTE conditional on Potential Outcomes) The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain set C i",0.12531328320802004,"represents nonpecuniary costs with a vector of observables Z . Then treated ( D = 1) and untreated people ( D = 0) are the observed groups satisfying support restrictions { Y 1 -Y 0 ≥ µ C ( Z ) } and { Y 1 -Y 0 < µ C ( Z ) } , respectively.
-
-Example 4 (DTE conditional on Potential Outcomes) The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain set C is ",0.12531328320802004,"represents nonpecuniary costs with a vector of observables Z . Then treated ( D = 1) and untreated people ( D = 0) are the observed groups satisfying support restrictions { Y 1 -Y 0 ≥ µ C ( Z ) } and { Y 1 -Y 0 < µ C ( Z ) } , respectively.
-
-Example 4 (DTE conditional on Potential Outcomes) The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain set C is ",17,science_sample
-20,0,"Note that ǫ1,2,3 are all proportional to X which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio (g/¯g5)2 originates from the presence of brane localized kinetic terms. The ǫ parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters α, GF and mZ in terms of the model parameters. For convenience we rewrite the results:",False,0.027950310559006212,"t ǫ 1 ,2 ,3 are all proportional to X which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio (g/g ¯ 5) 2 originates from the presence of brane localized kinetic terms.
-
-The ǫ parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters α, GF and mZ in terms of the model parameters. For convenience we rewrite the results:",0.14130434782608695," which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio $(g/\bar{g}_5)^2$ originates from the presence of brane localized kinetic terms.
-
-The $\epsilon$ parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters $\alpha$ , $G_F$ and $m_Z$ in terms of the model parameters. For convenience we rewrite the result",0.11801242236024845,"rline{X}$ which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio $(g/\bar{g}_5)^2$ originates from the presence of brane localized kinetic terms.
-
-The $\epsilon$ parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters $\alpha$, $G_F$ and $m_Z$ in terms of the model parameters. For convenience we rewrite the results:",0.14130434782608695," which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio $$(g/\bar{g}_5)^2$$ originates from the presence of brane localized kinetic terms.
-
-The $$\epsilon$$ parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters $$\alpha$$, $$G_F$$ and $$m_Z$$ in terms of the model parameters. For convenience we rewrite the results",0.023291925465838508,"Note that ǫ1,2,3 are all proportional to X which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW ¯ precision tests. In the five dimensional formulation of this model the ratio (g/g5)[2] originates from the presence of brane localized kinetic terms.
-
-The ǫ parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters α, GF and mZ in terms of the model parameters. For convenience we rewrite the re",0.06366459627329192,"3 are all proportional to X which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio ( g/ ¯ g 5 ) 2 originates from the presence of brane localized kinetic terms.
-
-The /epsilon1 parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters α , G F and m Z in terms of the model parameters. For convenience we rewrite the resu",0.06366459627329192,"3 are all proportional to X which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio ( g/ ¯ g 5 ) 2 originates from the presence of brane localized kinetic terms.
-
-The /epsilon1 parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters α , G F and m Z in terms of the model parameters. For convenience we rewrite the resu",20,science_sample
-20,1,"In section VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b(y) ≡1 (flat extra dimension) and b(y) = e−2ky (a slice of AdS5). To this aim we need to invert (73), (74) and (75),",False,0.03571428571428571,"ection VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b(y ) ≡ 1 (flat extra dimension) and b (y) = e−2ky (a slice of AdS5). To this aim we need to invert (73), (74) and (75),",0.24603174603174602,"section VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, $b(y)\equiv 1$ (flat extra dimension) and $b(y)=e^{-2ky}$ (a slice of $\text{AdS}_5$ ). To this aim we need to inv",0.20238095238095238,"VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, $b(y) \equiv 1$ (flat extra dimension) and $b(y) = e^{-2ky}$ (a slice of $\text{AdS}_5$). To this aim we need to invert (73), (",0.25,"tion VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, $$b(y) \equiv 1$$ (flat extra dimension) and $$b(y) = e^{-2ky}$$ (a slice of $$\text{AdS}_5$$). To this aim we need to inv",0.06746031746031746,"ection VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b(y) ≡ 1 (flat extra dimension) and b(y) = e[−][2][ky] (a slice of AdS5). To this aim we need to invert (73), (74) and (",0.10317460317460317,"ection VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b ( y ) ≡ 1 (flat extra dimension) and b ( y ) = e -2 ky (a slice of AdS 5 ). To this aim we need to invert (73), (74) a",0.10317460317460317,"ection VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b ( y ) ≡ 1 (flat extra dimension) and b ( y ) = e -2 ky (a slice of AdS 5 ). To this aim we need to invert (73), (74) a",20,science_sample
-21,0,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where ak+1 −ak = δ for each integer k at the optimum. In this case, the lower bound reduces to",False,0.008403361344537815,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where ak+1 − ak = δ for each integer k at the optimum. In this case, the lower bound reduces t",0.15966386554621848,"t the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where $a_{k+1} - a_k = \delta$ for each integer $k$ at the optimum. In this case, the lower bound redu",0.12605042016806722,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where $a_{k+1} - a_k = \delta$ for each integer $k$ at the optimum. In this case, the lower bo",0.20588235294117646,"sent the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where $$a_{k+1} = a_k \equiv \delta$$ for each integer $$k$$ at the optimum. In this case, the lower bo",0.08403361344537816,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where _ak_ +1 _− ak_ = _δ_ for each integer _k_ at the optimum. In this case, the lower bound ",0.029411764705882353,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where a k +1 -a k = δ for each integer k at the optimum. In this case, the lower bound reduces",0.029411764705882353,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where a k +1 -a k = δ for each integer k at the optimum. In this case, the lower bound reduces",21,science_sample
-21,1,and computation of (B.1) poses a simple one-dimensional optimization problem.,False,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,21,science_sample
-21,2,"It is not straightforward to solve the problem (B.2) numerically in Step 3; the function max{x, 0} is non- differentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicated",False,0.018604651162790697,"It is not straightforward to solve the problem (B.2) numerically in Step 3; the function max{x, 0} is non differentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicate",0.07906976744186046,"t is not straightforward to solve the problem (B.2) numerically in Step 3; the function $\max\{x,0\}$ is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complic",0.06046511627906977,"It is not straightforward to solve the problem (B.2) numerically in Step 3; the function $\max\{x, 0\}$ is non-differentiable. Furthermore in practice, marginal distribution functions are often estimated in a compli",0.07906976744186046,"t is not straightforward to solve the problem (B.2) numerically in Step 3; the function $$\max\{x, 0\}$$ is non-differentiable. Furthermore in practice, marginal distribution functions are often estimated in a compl",0.06976744186046512,"s not straightforward to solve the problem (B.2) numerically in Step 3; the function max _{x,_ 0 _}_ is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicate",0.04186046511627907," is not straightforward to solve the problem (B.2) numerically in Step 3; the function max { x, 0 } is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicated",0.04186046511627907," is not straightforward to solve the problem (B.2) numerically in Step 3; the function max { x, 0 } is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicated",21,science_sample
-22,0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",False,0.0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",0.01990049751243781,"LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput $C$ taking the worst case ICI into account can be written as follow",0.05970149253731343,"e optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput $\mathcal{C}$ taking the worst case ICI into account can be written as follows",0.05970149253731343," optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput $\mathcal{C}$ taking the worst case ICI into account can be written as follows:",0.0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",0.0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",0.0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",22,science_sample
-22,1,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Qn,k,l where:",False,0.0,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Qn,k,l where:",0.08870967741935484,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes $Q_{n,k,l}$ ",0.08064516129032258,"tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes $Q_{n,k,l}$ whe",0.08064516129032258,"ighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes $Q_{n,k,l}$ wher",0.0,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Qn,k,l where:",0.016129032258064516,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Q n,k,l where",0.016129032258064516,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Q n,k,l where",22,science_sample
-22,2,"Thus, Qn,k,l is an SINR term for each user k at each subcarrier n in each cell l assuming worst case interference. We collect these SINR terms into a vector qn,l = [qn,1,l, qn,2,l...., qn,K,l] and then stack all the vectors in a matrix Ql ∈RN×K. The resulting allocations based on this criteria are then used to compute the LB network throughput using (1). Note that if ξn,l = 0, than Qn,k,l becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner. B. Upper Bound on the Optimal Network Throughput Establishing an UB is significantly important in order to calibrate the performance of sub- optimal resource allocation schemes with respect to the optimal solution. The UB can be derived",False,0.0330812854442344,",l is an SINR term for each user k at each subcarrier n in each cell l assuming worst case interference. We collect these SINR terms into a vector qn,l = [qn,1,l, qn,2,l...., qn,K,l] and then stack all the vectors in a matrix Ql ∈ R N ×K . The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
-
-Note that if ξn,l = 0, than Qn,k,l becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner.
-
-## B. Upper Bound on the Optimal Network Throughput
-
-Establishing an UB is significantly important in order to calibrate the performance of sub optimal resource allocation schemes with respect to the optimal solution. The UB can be der",0.1833648393194707,"g worst case interference. We collect these SINR terms into a vector $\mathbf{q}_{n,l} = [q_{n,1,l}, q_{n,2,l}, \dots, q_{n,K,l}]$ and then stack all the vectors in a matrix $\mathbf{Q}_l \in \mathbb{R}^{N \times K}$ . The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
-
-Note that if $\xi_{n,l} = 0$ , then $Q_{n,k,l}$ becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner.
-
-## B. Upper Bound on the Optimal Network Throughput
-
-Establishing an UB is significantly important in order to calibrate the performance of sub-optimal resource allocation schemes with respect to the optimal solution. The UB can be derive",0.16918714555765596," assuming worst case interference. We collect these SINR terms into a vector $\mathbf{q}_{n,l} = [q_{n,1,l}, q_{n,2,l}, \dots, q_{n,K,l}]$ and then stack all the vectors in a matrix $\mathbf{Q}_l \in \mathbb{R}^{N \times K}$. The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
-
-Note that if $\xi_{n,l} = 0$, than $Q_{n,k,l}$ becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner.
-
-### B. Upper Bound on the Optimal Network Throughput
-
-Establishing an UB is significantly important in order to calibrate the performance of sub-optimal resource allocation schemes with respect to the optimal solution. The UB can be deriv",0.166351606805293,"assuming worst case interference. We collect these SINR terms into a vector $\mathbf{q}_{n,l} = [q_{n,1,l}, q_{n,2,l}, ..., q_{n,K,l}]$ and then stack all the vectors in a matrix $\mathbf{Q}_l \in \mathbb{R}^{N \times K}$. The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
-
-Note that if $\xi_{n,l} = 0$, than $Q_{n,k,l}$ becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner.
-
-### *B. Upper Bound on the Optimal Network Throughput*
-
-Establishing an UB is significantly important in order to calibrate the performance of sub-optimal resource allocation schemes with respect to the optimal solution. The UB can be derive",0.052930056710775046,"is an SINR term for each user k at each subcarrier n in each cell l assuming worst case interference. We collect these SINR terms into a vector qn,l = [qn,1,l, qn,2,l...., qn,K,l] and then stack all the vectors in a matrix Ql ∈ R[N][×][K] . The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
-
-̸ Note that if ξn,l = 0, than Qn,k,l becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner.
-
-̸ _B. Upper Bound on the Optimal Network Throughput_
-
-̸ Establishing an UB is significantly important in order to calibrate the performance of suboptimal resource allocation schemes with respect to the optimal solution. The UB can",0.06427221172022685," for each user k at each subcarrier n in each cell l assuming worst case interference. We collect these SINR terms into a vector q n,l = [ q n, 1 ,l , q n, 2 ,l ...., q n,K,l ] and then stack all the vectors in a matrix Q l ∈ R N × K . The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
-
-Note that if ξ n,l = 0 , than Q n,k,l becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner.
-
-## B. Upper Bound on the Optimal Network Throughput
-
-Establishing an UB is significantly important in order to calibrate the performance of suboptimal resource allocation schemes with respect to the optimal solution. The UB can be derive",0.06427221172022685," for each user k at each subcarrier n in each cell l assuming worst case interference. We collect these SINR terms into a vector q n,l = [ q n, 1 ,l , q n, 2 ,l ...., q n,K,l ] and then stack all the vectors in a matrix Q l ∈ R N × K . The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
-
-Note that if ξ n,l = 0 , than Q n,k,l becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner.
-
-## B. Upper Bound on the Optimal Network Throughput
-
-Establishing an UB is significantly important in order to calibrate the performance of suboptimal resource allocation schemes with respect to the optimal solution. The UB can be derive",22,science_sample
-23,0,Let us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E(k) and spectral coupling v(k),False,0.022222222222222223,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E(k) and spectral coupling v(k),0.08148148148148149,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion $E(k)$ and spectral coupling ,0.06666666666666667, us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion $E(k)$ and spectral coupling $v(k,0.08148148148148149,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion $$E(k)$$ and spectral coupling ,0.022222222222222223,Let us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E(k) and spectral coupling v(k,0.06666666666666667,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E ( k ) and spectral coupling v,0.06666666666666667,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E ( k ) and spectral coupling v,23,science_sample
-23,1,"The condition for the non-Hermitian Hamiltonian to pos- sess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the contin- uum) is derived in Appendix B. Precisely, let ξ1,2 be the two roots of the second-order algebraic equation",False,0.02181818181818182,"The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let ξ1,2 be the two roots of the second-order algebraic equation
-
-",0.06909090909090909,"The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let $\xi_{1,2}$ be the two roots of the second-order algebraic equ",0.05454545454545454," condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let $\xi_{1,2}$ be the two roots of the second-order algebraic equation",0.06909090909090909,"The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let $$\xi_{1,2}$$ be the two roots of the second-order algebraic equ",0.02909090909090909,"
-
-The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let ξ1,2 be the two roots of the second-order algebraic equation
-",0.02909090909090909,"
-The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let ξ 1 , 2 be the two roots of the second-order algebraic equation",0.02909090909090909,"
-The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let ξ 1 , 2 be the two roots of the second-order algebraic equation",23,science_sample
-24,0,"Figure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static func- tional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text.",False,0.025157232704402517,"ure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main te",0.02389937106918239,"gure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main te",0.028930817610062894," S1:** We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text",0.02389937106918239,"re S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text",0.02389937106918239,"e S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text.",0.02389937106918239,"Figure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main ",0.02389937106918239,"Figure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main ",24,science_sample
-24,1,Figure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coeffi- cients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile ma- trix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity.,False,0.03428571428571429,Figure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connecti,0.06857142857142857,omparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is $r \approx 1$ . (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity,0.06095238095238095, Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is $r \approx 1$. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity,0.02857142857142857,gure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity,0.03619047619047619,re S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is _r ≈_ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity,0.02857142857142857,Figure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivi,0.02857142857142857,Figure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivi,24,science_sample
-25,0,"(vi) Kinetic energy weapons (excluding firearms) or projectiles, or parts thereof (vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof (viii) Military vessels, their hulls or accessories, or parts thereof (ix) Military aircraft, their accessories, or parts thereof (x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping (xi) Armor plates, military helmets, body armors, or parts thereof (xii) Military searchlights or control equipment therefor (xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof (xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials (xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof (xv) Equipment and devices used in the production or testing of military propellants, or parts thereof (xvi) Equipment specially designed for the production of weapons, test devices, or parts or accessories therefor (xvii) Military satellites, or parts thereof",False,0.1793103448275862,"ii) Military vehicles, their accessories, bridges
specially designed for military use, or parts thereof
(viii) Military vessels, their hulls or accessories, or
parts thereof
(ix) Military aircraft, their accessories, or parts thereof
(x) Antisubmarine nets, anti-torpedo nets, or buoyant
electric power cables for magnetic mine sweeping
(xi) Armor plates, military helmets, body armors, or
parts thereof
(xii) Military searchlights or control equipment therefor
(xiii) Military bacterial agents, chemical warfare (CW)
agents, radioactive materials, or equipment or parts for
the dissemination, protection, decontamination,
detection, or identification thereof
(xiii)-2 Chemical mixtures specially formulated for the
decontamination of military bacterial agents, CW
agents, or radioactive materials
(xiv) Biopolymers for the detection or identification of
CW agents, culture of cells used for the production of
such biopolymers, biocatalysts for the decontamination
or degradation of CW agents, or expression vectors,
viruses, or cultures of cells that contain genetic codes
required for production thereof
(xv) Equipment and devices used in the production or
testing of military propellants, or parts thereof
(xvi) Equipment specially designed for the production of
weapons, test devices, or parts or accessories therefo",0.10620689655172413,"nergy weapons (excluding firearms) or projectiles, or parts thereof (vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof
(viii) Military vessels, their hulls or accessories, or parts thereof
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(x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping
(xi) Armor plates, military helmets, body armors, or parts thereof
(xii) Military searchlights or control equipment therefor
(xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof
(xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials
(xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof
(xv) Equipment and devices used in the production or testing of military propellants, or parts thereof
(xvi) Equipment specially designed for the production of weapons, test devices, or parts or ac",0.11379310344827587,"inetic energy weapons (excluding firearms) or projectiles, or parts thereof
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(viii) Military vessels, their hulls or accessories, or parts thereof
(ix) Military aircraft, their accessories, or parts thereof
(x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping
(xi) Armor plates, military helmets, body armors, or parts thereof
(xii) Military searchlights or control equipment therefor
(xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof
(xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials
(xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof
(xv) Equipment and devices used in the production or testing of military propellants, or parts thereof
(xvi) Equipment specially designed for the production of weapons, test devices, or par",0.06896551724137931,"(vi) Kinetic energy weapons (excluding firearms) or projectiles, or parts thereof
(vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof
(viii) Military vessels, their hulls or accessories, or parts thereof
(ix) Military aircraft, their accessories, or parts thereof
(x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping
(xi) Armor plates, military helmets, body armors, or parts thereof
(xii) Military searchlights or control equipment therefor
(xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof
(xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials
(xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof
(xv) Equipment and devices used in the production or testing of military propellants, or parts thereof
(xvi) Equipment specially designed for the production of weapons, test devices, or parts or accessories therefor<",0.1310344827586207,">(vii) Military vehicles, their accessories, bridges
specially designed for military use, or parts thereof
(viii) Military vessels, their hulls or accessories, or
parts thereof
(ix) Military aircraft, their accessories, or parts thereof
(x) Antisubmarine nets, anti-torpedo nets, or buoyant
electric power cables for magnetic mine sweeping
(xi) Armor plates, military helmets, body armors, or
parts thereof
(xii) Military searchlights or control equipment therefor
(xiii) Military bacterial agents, chemical warfare (CW)
agents, radioactive materials, or equipment or parts for
the dissemination, protection, decontamination,
detection, or identification thereof
(xiii)-2 Chemical mixtures specially formulated for the
decontamination of military bacterial agents, CW
agents, or radioactive materials
(xiv) Biopolymers for the detection or identification of
CW agents, culture of cells used for the production of
such biopolymers, biocatalysts for the decontamination
or degradation of CW agents, or expression vectors,
viruses, or cultures of cells that contain genetic codes
required for production thereof
(xv) Equipment and devices used in the production or
testing of military propellants, or parts thereof
(xvi) Equipment specially designed for the production of
weapons, test devices, or parts or accessories therefor
(xvii) Military satellites, or parts thereof",0.06482758620689655,"| | (vi) Kinetic energy weapons (excluding firearms) or projectiles, or parts thereof (vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof (viii) Military vessels, their hulls or accessories, or parts thereof (ix) Military aircraft, their accessories, or parts thereof (x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping (xi) Armor plates, military helmets, body armors, or parts thereof (xii) Military searchlights or control equipment therefor (xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof (xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials (xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof (xv) Equipment and devices used in the production or testing of military propellants, or parts thereof (xvi) Equipment specially designed for the production of | ",0.06482758620689655,"| | (vi) Kinetic energy weapons (excluding firearms) or projectiles, or parts thereof (vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof (viii) Military vessels, their hulls or accessories, or parts thereof (ix) Military aircraft, their accessories, or parts thereof (x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping (xi) Armor plates, military helmets, body armors, or parts thereof (xii) Military searchlights or control equipment therefor (xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof (xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials (xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof (xv) Equipment and devices used in the production or testing of military propellants, or parts thereof (xvi) Equipment specially designed for the production of | ",25,laws_sample
-25,1,"Goods listed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry (i) Nuclear fuel materials or nuclear source materials (ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reactors",False,0.16556291390728478,"e specifications comply with
Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries
therefor, or power-generating or propulsion equipment
specially designed for nuclear reacto",0.09271523178807947,"listed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear ",0.09933774834437085,"ed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reac",0.059602649006622516,"s listed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reac",0.11589403973509933,"oods listed below whose specifications comply with
Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries
therefor, or power-generating or propulsion equipment
specially designed for nu",0.0,"Goods listed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry (i) Nuclear fuel materials or nuclear source materials (ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reactors",0.0,"Goods listed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry (i) Nuclear fuel materials or nuclear source materials (ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reactors",25,laws_sample
-26,0,"Shadow NAVAID boxes indicate Flight Service Station (FSS) loca- tions. Frequencies 122.2 and 255.4 (Conterminous U.S.); 121.5, 122.2, 243.0 and 255.4 (Alaska); and 121.5, 126.7, and 243.0 (Canada) are available at many FSSs and are not shown. All other frequencies are shown above the box. Certain FSSs provide Local Airport Advisory (LAA) on 123.6. Frequencies transmit and receive except those followed by R and q T: R - Receive Only T - Transmit Only",False,0.5894039735099338,"## RADIO AIDS TO NAVIGATION (Continued)
-
-## Stand Alone Flight Services and Communication Outlets
-
-Key Entities in the image:
-
-* **Flight Service Station (FSS)**: Locations and frequencies (122.2, 255.4, 121.5, 126.7, 243.0). Provides Local Airport Advisory (LAA) on 123.6. Frequencies transmit and receive unless followed by R (Receive Only) or T (Transmit Only",0.026490066225165563,"Shadow NAVAID boxes indicate Flight Service Station (FSS) locations. Frequencies 122.2 and 255.4 (Conterminous U.S.); 121.5, 122.2, 243.0 and 255.4 (Alaska); and 121.5, 126.7, and 243.0 (Canada) are available at many FSSs and are not shown. All other frequencies are shown above the box.
-
-Certain FSSs provide Local Airport Advisory (LAA) on 123.6.
-
-Frequencies transmit and receive except those followed by R and T:
-
-R - Receive Only
-
-T - Transmit Only",0.06622516556291391,"dow NAVAID boxes indicate Flight Service Station (FSS) locations. Frequencies 122.2 and 255.4 (Conterminous U.S.); 121.5, 122.2, 243.0 and 255.4 (Alaska); and 121.5, 126.7, and 243.0 (Canada) are available at many FSSs and are not shown. All other frequencies are shown above the box.
-
-Certain FSSs provide Local Airport Advisory (LAA) on 123.6.
-
-Frequencies transmit and receive except those followed by R and T:
-- **R** - Receive Only
-- **T** - Transm",0.026490066225165563,"
-Shadow NAVAID boxes indicate Flight Service Station (FSS) locations. Frequencies 122.2 and 255.4 (Conterminous U.S.); 121.5, 122.2, 243.0 and 255.4 (Alaska); and 121.5, 126.7, and 243.0 (Canada) are available at many FSSs and are not shown. All other frequencies are shown above the box.
-
-Certain FSSs provide Local Airport Advisory (LAA) on 123.6.
-
-Frequencies transmit and receive except those followed by R and T:
-R - Receive Only
-T - Transmit Only
-",0.82560706401766,"## **RADIO AIDS TO NAVIGATION (Continued)**
-
-## **Stand Alone Flight Services and Communication Outlets**
-
-**==> picture [566 x 545] intentionally omitted <==**
-
-**==> picture [121 x 40] intentionally omitted <==**
-
-**==> picture [117 x 38] intentionally omitted <==**
-
-74
-
-",0.8675496688741722,"## RADIO AIDS TO NAVIGATION (Continued)
-
-## Stand Alone Flight Services and Communication Outlets
-
-",0.8675496688741722,"## RADIO AIDS TO NAVIGATION (Continued)
-
-## Stand Alone Flight Services and Communication Outlets
-
-",26,laws_sample
-26,1,"Thin line NAVAID boxes without frequencies and controlling FSS name indicate no FSS frequencies available. Frequencies posi- tioned above the thin line boxes are remoted to the NAVAID sites. Other frequencies at the controlling FSS named are available, however altitude and terrain may determine their reception. In Canada, a “D” after the frequency indicates a dial-up remote communications outlet.",False,0.6766917293233082,"uencies (122.2, 255.4, 121.5, 126.7, 243.0). Provides Local Airport Advisory (LAA) on 123.6. Frequencies transmit and receive unless followed by R (Receive Only) or T (Transmit Only).
-* **Remote Communications Outlet (RCO)**: Frequencies are remoted to the NAVAID sites. Indicated by thin line NAVAID boxes without frequencies. ""D"" after frequency indicates a dial-up remote communications outlet ",0.017543859649122806,"
-Thin line NAVAID boxes without frequencies and controlling FSS name indicate no FSS frequencies available. Frequencies positioned above the thin line boxes are remoted to the NAVAID sites. Other frequencies at the controlling FSS named are available, however altitude and terrain may determine their reception.
-
-In Canada, a ""D"" after the frequency indicates a dial-up remote communications outlet.",0.017543859649122806,"Thin line NAVAID boxes without frequencies and controlling FSS name indicate no FSS frequencies available. Frequencies positioned above the thin line boxes are remoted to the NAVAID sites. Other frequencies at the controlling FSS named are available, however altitude and terrain may determine their reception.
-
-In Canada, a ""D"" after the frequency indicates a dial-up remote communications outlet.
-",0.022556390977443608,"Thin line NAVAID boxes without frequencies and controlling FSS name indicate no FSS frequencies available. Frequencies positioned above the thin line boxes are remoted to the NAVAID sites. Other frequencies at the controlling FSS named are available, however altitude and terrain may determine their reception.*
-
-*In Canada, a ""D"" after the frequency indicates a dial-up remote communications outlet",0.7969924812030075,"## **RADIO AIDS TO NAVIGATION (Continued)**
-
-## **Stand Alone Flight Services and Communication Outlets**
-
-**==> picture [566 x 545] intentionally omitted <==**
-
-**==> picture [121 x 40] intentionally omitted <==**
-
-**==> picture [117 x 38] intentionally omitted <==**
-
-74
-
-",0.8546365914786967,"## RADIO AIDS TO NAVIGATION (Continued)
-
-## Stand Alone Flight Services and Communication Outlets
-
-",0.8546365914786967,"## RADIO AIDS TO NAVIGATION (Continued)
-
-## Stand Alone Flight Services and Communication Outlets
-
-",26,laws_sample
-27,0,"The Secretary of State for Health and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006(a). Citation, interpretation and commencement 1.—(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020. (2) In this Order “coronavirus” has the meaning described in section 1(1) of the Coronavirus Act 2020(b) (meaning of “coronavirus” and related terminology). (3) This Order comes into force on 17th April 2020. Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity 2.—(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity. (2) Paragraph (1) applies to testing carried out by the following persons — (a) members of Her Majesty’s Forces; (b) employees of The Boots Company plc, company number 00027657; and",False,0.03327338129496403,"tary of State for Health and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006(a).
-
-## Citation, interpretation and commencement
-
-1.—(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.
-
-(2) In this Order “coronavirus” has the meaning described in section 1(1) of the Coronavirus Act 2020(b) (meaning of “coronavirus” and related terminology).
-
-(3) This Order comes into force on 17th April 2020.
-
-## Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity
-
-2.—(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity.
-
-(2) Paragraph (1) applies to testing carried out by the following persons —
-
-(a) members of Her Majesty’s Forces;
-
-(b) employees of The Boots Company plc, company number 0002765",0.053057553956834536,"e Secretary of State for Health and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006(a).
-
-### **Citation, interpretation and commencement**
-
-1.—(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.
-
-(2) In this Order “coronavirus” has the meaning described in section 1(1) of the Coronavirus Act 2020(b) (meaning of “coronavirus” and related terminology).
-
-(3) This Order comes into force on 17th April 2020.
-
-### **Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity**
-
-2.—(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity.
-
-(2) Paragraph (1) applies to testing carried out by the following persons —
-
-(a) members of Her Majesty's Forces;
-(b) employees of The Boots Company plc, comp",0.06205035971223022,"y of State for Health and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006[^a].
-
-### Citation, interpretation and commencement
-
-**1.**—(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.
-
-(2) In this Order “coronavirus” has the meaning described in section 1(1) of the Coronavirus Act 2020[^b] (meaning of “coronavirus” and related terminology).
-
-(3) This Order comes into force on 17th April 2020.
-
-### Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity
-
-**2.**—(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity.
-
-(2) Paragraph (1) applies to testing carried out by the following persons —
-
-* (a) members of Her Majesty’s Forces;
-* (b) employees of The Boots Company plc, company nu",0.05755395683453238,"r Health and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006(a).
-
-**Citation, interpretation and commencement**
-
-**1.**—(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.
-
-(2) In this Order ""coronavirus"" has the meaning described in section 1(1) of the Coronavirus Act 2020(b) (meaning of ""coronavirus"" and related terminology).
-
-(3) This Order comes into force on 17th April 2020.
-
-**Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity**
-
-**2.**—(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity.
-
-(2) Paragraph (1) applies to testing carried out by the following persons —
-
-(a) members of Her Majesty's Forces;
-
-(b) employees of The Boots Company plc, company number 00027657; and",0.10431654676258993," and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006( **a** ).
-
-## **Citation, interpretation and commencement**
-
-**1.** —(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.
-
-(2) In this Order “coronavirus” has the meaning described in section 1(1) of the Coronavirus Act 2020( **b** ) (meaning of “coronavirus” and related terminology).
-
-- (3) This Order comes into force on 17th April 2020.
-
-## **Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity**
-
-**2.** —(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity.
-
-(2) Paragraph (1) applies to testing carried out by the following persons —
-
-- (a) members of Her Majesty’s Forces;
-
-(b) employees of The Boots Company plc, com",0.05485611510791367," Secretary of State for Health and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006( a ).
-
-## Citation, interpretation and commencement
-
-1. -(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.
-
-(2) In this Order 'coronavirus' has the meaning described in section 1(1) of the Coronavirus Act 2020( b ) (meaning of 'coronavirus' and related terminology).
-
-(3) This Order comes into force on 17th April 2020.
-
-## Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity
-
-2. -(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity.
-
-(2) Paragraph (1) applies to testing carried out by the following persons -
-
-- (a) members of Her Majesty's Forces;
-- (b) employees of The Boots Company plc, company",0.05485611510791367," Secretary of State for Health and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006( a ).
-
-## Citation, interpretation and commencement
-
-1. -(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.
-
-(2) In this Order 'coronavirus' has the meaning described in section 1(1) of the Coronavirus Act 2020( b ) (meaning of 'coronavirus' and related terminology).
-
-(3) This Order comes into force on 17th April 2020.
-
-## Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity
-
-2. -(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity.
-
-(2) Paragraph (1) applies to testing carried out by the following persons -
-
-- (a) members of Her Majesty's Forces;
-- (b) employees of The Boots Company plc, company",27,laws_sample
-27,1,The Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020,False,0.02197802197802198,he Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.,0.0,The Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020,0.0,The Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020,0.0,The Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020,0.0,The Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020,0.0,The Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020,0.0,The Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020,27,laws_sample
-28,0,"due to thc~ low combustion pressure and values of c, from 2.0 to 4.0 are typical with aftet- burner operation. p The turbojet engine usually has a strong preference fot high RPM to produce low specif- ic fuel consumption. Since the normal rated thrust condition is a particular design point for the engine, the minimum value of c, will occur at or near this range of RPM. The illustration of figure 2.10 shows a typical vati- ation of c, with percent maximum RPM where values of RPM less than 80 to 85 percent pro- duce a specific fuel consumption much greater than the minimum obtainable. This pref- erence for high.RPM to obtain low values of C, is very pronounced in the fixed geometry engine. Turbojet engines with multispool compressors tend to be less sensitive in this respect and are more flexible in their operating characteristics. Whenever low values of cI ate necessary to obtain range or endurance, the preference of the turboiet engine for the design operating RPM can be a factor of great influence. Altitude is one factor which strongly affects the performance of the turbojet engine. An increase in altitude produces a decrease in density and pressure and, if below the tropo- pause, a decrease in temperature. If a typical nonaftcrbutning turbojet engine is operated at a constant RPM and true airspeed, the vatia- tion of thtust and specific fuel consumption with altitude can be approximated from figure 221. The variation of density in the standard atmosphere is shown by the values of density ratio at vatious altitudes. Typical values of the density ratio at specific altitudes are as follows:",False,0.05012376237623763,"to thc~low combustion pressure and values of c, from 2.0 to 4.0 are typical with aftetburner operation.
-
-The turbojet engine usually has a strong
-
-preference fot high RPM to produce low specific fuel consumption. Since the normal rated
-
-thrust condition is a particular design point
-for the engine, the minimum value of c, will
-occur at or near this range of RPM. The
-
-illustration of figure 2.10 shows a typical vatiation of c, with percent maximum RPM where
-
-values of RPM less than 80 to 85 percent produce a specific fuel consumption much greater
-
-than the minimum obtainable. This preference for high.RPM to obtain low values of
-
-C, is very pronounced in the fixed geometry
-engine. Turbojet engines with multispool [ ]
-compressors tend to be less sensitive in this
-respect and are more flexible in their operating
-characteristics. Whenever low values of cI ate
-necessary to obtain range or endurance, the
-preference of the turboiet engine for the design
-operating RPM can be a factor of great
-influence.
-
-Altitude is one factor which strongly affects
-the performance of the turbojet engine. An [ ]
-increase in altitude produces a decrease in
-
-density and pressure and, if below the tropopause, a decrease in temperature. If a typical
-
-nonaftcrbutning turbojet engine is operated at
-
-a constant RPM and true airspeed, the vatiation of thtust and specific fuel consumption
-
-with altitude can be approximated from figure
-221. The variation of density in the standard [ ]
-atmosphere is shown by the values of density
-ratio at vatious altitudes. Typical values of
-the density ratio at specific altitudes are ",0.04641089108910891,"e low combustion pressure and values of $c_i$ from 2.0 to 4.0 are typical with afterburner operation.
-
-The turbojet engine usually has a strong preference for high RPM to produce low specific fuel consumption. Since the normal rated thrust condition is a particular design point for the engine, the minimum value of $c_i$ will occur at or near this range of RPM. The illustration of figure 2.10 shows a typical variation of $c_i$ with percent maximum RPM where values of RPM less than 80 to 85 percent produce a specific fuel consumption much greater than the minimum obtainable. This preference for high RPM to obtain low values of $c_i$ is very pronounced in the fixed geometry engine. Turbojet engines with multispool compressors tend to be less sensitive in this respect and are more flexible in their operating characteristics. Whenever low values of $c_i$ are necessary to obtain range or endurance, the preference of the turbojet engine for the design operating RPM can be a factor of great influence.
-
-Altitude is one factor which strongly affects the performance of the turbojet engine. An increase in altitude produces a decrease in density and pressure and, if below the tropopause, a decrease in temperature. If a typical nonafterburning turbojet engine is operated at a constant RPM and true airspeed, the variation of thrust and specific fuel consumption with altitude can be approximated from figure 2.11. The variation of density in the standard atmosphere is shown by the values of density ratio at various altitudes. Typical values of the density ratio at specific altitudes are as follow",0.034653465346534656,"ue to the low combustion pressure and values of $c_t$ from 2.0 to 4.0 are typical with afterburner operation.
-
-The turbojet engine usually has a strong preference for high RPM to produce low specific fuel consumption. Since the normal rated thrust condition is a particular design point for the engine, the minimum value of $c_t$ will occur at or near this range of RPM. The illustration of figure 2.10 shows a typical variation of $c_t$ with percent maximum RPM where values of RPM less than 80 to 85 percent produce a specific fuel consumption much greater than the minimum obtainable. This preference for high RPM to obtain low values of $c_t$ is very pronounced in the fixed geometry engine. Turbojet engines with multispool compressors tend to be less sensitive in this respect and are more flexible in their operating characteristics. Whenever low values of $c_t$ are necessary to obtain range or endurance, the preference of the turbojet engine for the design operating RPM can be a factor of great influence.
-
-Altitude is one factor which strongly affects the performance of the turbojet engine. An increase in altitude produces a decrease in density and pressure and, if below the tropopause, a decrease in temperature. If a typical nonafterburning turbojet engine is operated at a constant RPM and true airspeed, the variation of thrust and specific fuel consumption with altitude can be approximated from figure 2.11. The variation of density in the standard atmosphere is shown by the values of density ratio at various altitudes. Typical values of the density ratio at specific altitudes are as follows:",0.0823019801980198,"
-due to the low combustion pressure and values of ct from 2.0 to 4.0 are typical with afterburner operation.
-
-The turbojet engine usually has a strong preference for high RPM to produce low specific fuel consumption. Since the normal rated thrust condition is a particular design point for the engine, the minimum value of ct will occur at or near this range of RPM. The variation of ct with percent maximum RPM where values of RPM less than 80 to 85 percent produce a specific fuel consumption much greater than the minimum obtainable. This preference for high RPM to obtain low values of ct is very pronounced in the fixed geometry engine. Turbojet engines with multispool compressors tend to be less sensitive in this respect and are more flexible in their operating characteristics. Whenever low values of ct are necessary to obtain range or endurance, the preference of the turbojet engine for the design operating RPM can be a factor of great influence.
-
-Altitude is one factor which strongly affects the performance of the turbojet engine. An increase in altitude produces a decrease in density and pressure and, if below the tropopause, a decrease in temperature. If a typical nonafterburning turbojet engine is operated at a constant RPM and true airspeed, the variation of thrust and specific fuel consumption with altitude can be approximated from figure 2.11. The variation of density in the standard atmosphere is shown by the values of density ratio at various altitudes. Typical values of the density ratio at specific altitudes are as follows:
-
-",0.011138613861386138,"due to thc~ low combustion pressure and values of c, from 2.0 to 4.0 are typical with aftetburner operation.
-
-The turbojet engine usually has a strong preference fot high RPM to produce low specific fuel consumption. Since the normal rated thrust condition is a particular design point for the engine, the minimum value of c, will occur at or near this range of RPM. The illustration of figure 2.10 shows a typical vatiation of c, with percent maximum RPM where values of RPM less than 80 to 85 percent produce a specific fuel consumption much greater than the minimum obtainable. This preference for high.RPM to obtain low values of C, is very pronounced in the fixed geometry engine. Turbojet engines with multispool compressors tend to be less sensitive in this respect and are more flexible in their operating characteristics. Whenever low values of cI ate necessary to obtain range or endurance, the preference of the turboiet engine for the design operating RPM can be a factor of great influence.
-
-Altitude is one factor which strongly affects the performance of the turbojet engine. An increase in altitude produces a decrease in density and pressure and, if below the tropopause, a decrease in temperature. If a typical nonaftcrbutning turbojet engine is operated at a constant RPM and true airspeed, the vatiation of thtust and specific fuel consumption with altitude can be approximated from figure 221. The variation of density in the standard atmosphere is shown by the values of density ratio at vatious altitudes. Typical values of the density ratio at specific altitudes are as follows:",0.11757425742574257,"e typical with aftetburner operation.
-
-The turbojet engine usually has a strong preference fot high RPM to produce low specific fuel consumption. Since the normal rated thrust condition is a particular design point for the engine, the minimum value of c, will occur at or near this range of RPM. The illustration of figure 2.10 shows a typical vatiation of c, with percent maximum RPM where values of RPM less than 80 to 85 percent produce a specific fuel consumption much greater than the minimum obtainable. This preference for high.RPM to obtain low values of C, is very pronounced in the fixed geometry engine. Turbojet engines with multispool compressors tend to be less sensitive in this respect and are more flexible in their operating characteristics. Whenever low values of cI ate necessary to obtain range or endurance, the preference of the turboiet engine for the design operating RPM can be a factor of great influence.
-
-Altitude is one factor which strongly affects the performance of the turbojet engine. An increase in altitude produces a decrease in density and pressure and, if below the tropopause, a decrease in temperature. If a typical nonaftcrbutning turbojet engine is operated at a constant RPM and true airspeed, the vatiation of thtust and specific fuel consumption with altitude can be approximated from figure 221. The variation of density in the standard atmosphere is shown by the values of density ratio at vatious altitudes. Typical values of the density ratio at specific altitudes are as",0.11757425742574257,"e typical with aftetburner operation.
-
-The turbojet engine usually has a strong preference fot high RPM to produce low specific fuel consumption. Since the normal rated thrust condition is a particular design point for the engine, the minimum value of c, will occur at or near this range of RPM. The illustration of figure 2.10 shows a typical vatiation of c, with percent maximum RPM where values of RPM less than 80 to 85 percent produce a specific fuel consumption much greater than the minimum obtainable. This preference for high.RPM to obtain low values of C, is very pronounced in the fixed geometry engine. Turbojet engines with multispool compressors tend to be less sensitive in this respect and are more flexible in their operating characteristics. Whenever low values of cI ate necessary to obtain range or endurance, the preference of the turboiet engine for the design operating RPM can be a factor of great influence.
-
-Altitude is one factor which strongly affects the performance of the turbojet engine. An increase in altitude produces a decrease in density and pressure and, if below the tropopause, a decrease in temperature. If a typical nonaftcrbutning turbojet engine is operated at a constant RPM and true airspeed, the vatiation of thtust and specific fuel consumption with altitude can be approximated from figure 221. The variation of density in the standard atmosphere is shown by the values of density ratio at vatious altitudes. Typical values of the density ratio at specific altitudes are as",28,laws_sample
-28,1,"If the fixed geometry engine is operated at a constant V (TAS) in subsonic flight and con- stant N (RPM) the inlet velocity, inlet ram, and compressor pressure ratio are essentially constant with altitude. An increase in alti- tude then causes the engine air mass flow to decrease in a manner very nearly identical to the altitude density ratio. Of coutsc, this de- crease in mass flow will produce a significant e&ct on the output thrust of the engine. Actually, the variation of thrust with altitude is not quite as severe as the density variation because favorable decreases in temperature occut. The decrease in inlet air temperature will provide a relatively greater combustion gas &ergy and allow a greater jet velocity. The increase in jet velocity somewhat offsets the decrease in mass flow. Of course, an in- crease in altitude provides lower temperatures below the tropopause. Above the tropopause, no further favorable decrease in temperature takes place so a more rapid variation of thrust will take place. The approximate variation of thrust with altitude is represented by figure 2.11 and some typical values at specific alti- tudes ate as follows :",False,0.043852106620808254,"he fixed geometry engine is operated at a
-
-constant V (TAS) in subsonic flight and con-
- stant N (RPM) the inlet velocity, inlet ram,
-
-and compressor pressure ratio are essentially
-
-constant with altitude. An increase in altitude then causes the engine air mass flow to
-
-decrease in a manner very nearly identical to
-
-the altitude density ratio. Of coutsc, this decrease in mass flow will produce a significant
-
-e&ct on the output thrust of the engine.
-Actually, the variation of thrust with altitude
-is not quite as severe as the density variation
-because favorable decreases in temperature
-occut. The decrease in inlet air temperature [ ]
-will provide a relatively greater combustion
-gas &ergy and allow a greater jet velocity.
-The increase in jet velocity somewhat offsets
-
-the decrease in mass flow. Of course, an increase in altitude provides lower temperatures
-
-below the tropopause. Above the tropopause,
-no further favorable decrease in temperature
-takes place so a more rapid variation of thrust
-will take place. The approximate variation
-of thrust with altitude is represented by figure
-
-2.11 and some typical values at specific altitudes ate as fol",0.02407566638005159,"If the fixed geometry engine is operated at a constant $V$ (TAS) in subsonic flight and constant $N$ (RPM) the inlet velocity, inlet ram, and compressor pressure ratio are essentially constant with altitude. An increase in altitude then causes the engine air mass flow to decrease in a manner very nearly identical to the altitude density ratio. Of course, this decrease in mass flow will produce a significant effect on the output thrust of the engine. Actually, the variation of thrust with altitude is not quite as severe as the density variation because favorable decreases in temperature occur. The decrease in inlet air temperature will provide a relatively greater combustion gas energy and allow a greater jet velocity. The increase in jet velocity somewhat offsets the decrease in mass flow. Of course, an increase in altitude provides lower temperatures below the tropopause. Above the tropopause, no further favorable decrease in temperature takes place so a more rapid variation of thrust will take place. The approximate variation of thrust with altitude is represented by figure 2.11 and some typical values at specific altitudes are as follows:",0.02407566638005159," |
-
-If the fixed geometry engine is operated at a constant $V$ (TAS) in subsonic flight and constant $N$ (RPM) the inlet velocity, inlet ram, and compressor pressure ratio are essentially constant with altitude. An increase in altitude then causes the engine air mass flow to decrease in a manner very nearly identical to the altitude density ratio. Of course, this decrease in mass flow will produce a significant effect on the output thrust of the engine. Actually, the variation of thrust with altitude is not quite as severe as the density variation because favorable decreases in temperature occur. The decrease in inlet air temperature will provide a relatively greater combustion gas energy and allow a greater jet velocity. The increase in jet velocity somewhat offsets the decrease in mass flow. Of course, an increase in altitude provides lower temperatures below the tropopause. Above the tropopause, no further favorable decrease in temperature takes place so a more rapid variation of thrust will take place. The approximate variation of thrust with altitude is represented by figure 2.11 and some typical values at specific altitudes are as follows:",0.023215821152192607,"If the fixed geometry engine is operated at a constant V (TAS) in subsonic flight and constant N (RPM) the inlet velocity, inlet ram, and compressor pressure ratio are essentially constant with altitude. An increase in altitude then causes the engine air mass flow to decrease in a manner very nearly identical to the altitude density ratio. Of course, this decrease in mass flow will produce a significant effect on the output thrust of the engine. Actually, the variation of thrust with altitude is not quite as severe as the density variation because favorable decreases in temperature occur. The decrease in inlet air temperature will provide a relatively greater combustion gas energy and allow a greater jet velocity. The increase in jet velocity somewhat offsets the decrease in mass flow. Of course, an increase in altitude provides lower temperatures below the tropopause. Above the tropopause, no further favorable decrease in temperature takes place so a more rapid variation of thrust will take place. The approximate variation of thrust with altitude is represented by figure 2.11 and some typical values at specific altitudes are as follows:
-
-| Alti",0.017196904557179708,"If the fixed geometry engine is operated at a constant V (TAS) in subsonic flight and constant N (RPM) the inlet velocity, inlet ram, and compressor pressure ratio are essentially constant with altitude. An increase in altitude then causes the engine air mass flow to decrease in a manner very nearly identical to the altitude density ratio. Of coutsc, this decrease in mass flow will produce a significant e&ct on the output thrust of the engine. Actually, the variation of thrust with altitude is not quite as severe as the density variation because favorable decreases in temperature occut. The decrease in inlet air temperature will provide a relatively greater combustion gas &ergy and allow a greater jet velocity. The increase in jet velocity somewhat offsets the decrease in mass flow. Of course, an increase in altitude provides lower temperatures below the tropopause. Above the tropopause, no further favorable decrease in temperature takes place so a more rapid variation of thrust will take place. The approximate variation of thrust with altitude is represented by figure 2.11 and some typical values at specific altitudes ate as follows :
-
-|RIrio ",0.12725709372312985,"ed at a constant V (TAS) in subsonic flight and constant N (RPM) the inlet velocity, inlet ram, and compressor pressure ratio are essentially constant with altitude. An increase in altitude then causes the engine air mass flow to decrease in a manner very nearly identical to the altitude density ratio. Of coutsc, this decrease in mass flow will produce a significant e&ct on the output thrust of the engine. Actually, the variation of thrust with altitude is not quite as severe as the density variation because favorable decreases in temperature occut. The decrease in inlet air temperature will provide a relatively greater combustion gas &ergy and allow a greater jet velocity. The increase in jet velocity somewhat offsets the decrease in mass flow. Of course, an increase in altitude provides lower temperatures below the tropopause. Above the tropopause, no further favorable decrease in temperature takes place so a more rapid variation of thrust will take place. The approximate variation of thrust with altitude is represented by figure 2.11 and some typical values at specifi",0.12725709372312985,"ed at a constant V (TAS) in subsonic flight and constant N (RPM) the inlet velocity, inlet ram, and compressor pressure ratio are essentially constant with altitude. An increase in altitude then causes the engine air mass flow to decrease in a manner very nearly identical to the altitude density ratio. Of coutsc, this decrease in mass flow will produce a significant e&ct on the output thrust of the engine. Actually, the variation of thrust with altitude is not quite as severe as the density variation because favorable decreases in temperature occut. The decrease in inlet air temperature will provide a relatively greater combustion gas &ergy and allow a greater jet velocity. The increase in jet velocity somewhat offsets the decrease in mass flow. Of course, an increase in altitude provides lower temperatures below the tropopause. Above the tropopause, no further favorable decrease in temperature takes place so a more rapid variation of thrust will take place. The approximate variation of thrust with altitude is represented by figure 2.11 and some typical values at specifi",28,laws_sample
-28,2,"Since the change in density with altitude is quite rapid at low altitude turbojet takeoff pet- formance wil1 Abegreatly affected at high alti- tude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value. The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 per- cent at high altitude.",False,0.02028397565922921,"
-Since the change in density with altitude is quite rapid at low altitude turbojet takeoff petformance wil1 Abe greatly affected at high altitude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value.
-
-The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 percent at high altitude.",0.02434077079107505,"Since the change in density with altitude is quite rapid at low altitude turbojet takeoff performance will be greatly affected at high altitude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value.
-
-The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 percent at high altitude.",0.034482758620689655," |
-
-Since the change in density with altitude is quite rapid at low altitude turbojet takeoff performance will be greatly affected at high altitude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value.
-
-The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 percent at high altitude.
-",0.034482758620689655,"Since the change in density with altitude is quite rapid at low altitude turbojet takeoff performance will be greatly affected at high altitude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value.
-
-The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 percent at high altitude.
-
-119",0.02434077079107505,"
-
-
-Since the change in density with altitude is quite rapid at low altitude turbojet takeoff petformance wil1 Abe greatly affected at high altitude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value.
-
-The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 percent at high altitude.",0.1359026369168357,"change in density with altitude is quite rapid at low altitude turbojet takeoff petformance wil1 Abe greatly affected at high altitude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value.
-
-The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 percent ",0.1359026369168357,"change in density with altitude is quite rapid at low altitude turbojet takeoff petformance wil1 Abe greatly affected at high altitude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value.
-
-The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 percent ",28,laws_sample
-29,0,"Abkommen für T‑DAB Wiesbaden 1995 und Maastricht 2002 und für DVB‑T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). b fü di j il f bhä i i d f ld ä k i d fü l d gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU‑R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKW- Tonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T‑DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position „Medianwert der Mindestfeldstärke“) und Angaben für den Betrieb eines DVB‑T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position „Medianwert für die minimale äquivalente Feldstärke“). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt. f d i d b b i k i d fü i S d f k l i Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt. Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",False,0.20122365737593473,"Ein Service des Bundesministeriums der Justiz und für Verbraucherschutz
-
-sowie des Bundesamts für Justiz ‒ www.gesetze-im-internet.de
-
-Abkommen für T‑DAB Wiesbaden 1995 und Maastricht 2002 und für DVB‑T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992).
-
-Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU‑R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKWTonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T‑DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position „Medianwert der Mindestfeldstärke“) und Angaben für den Betrieb eines DVB‑T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position „Medianwert für die minimale äquivalente Feldstärke“). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt.
-
-Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",0.1617946974847043,"
-
-Abkommen für T-DAB Wiesbaden 1995 und Maastricht 2002 und für DVB-T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU-R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKW-Tonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T-DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position „Medianwert der Mindestfeldstärke“) und Angaben für den Betrieb eines DVB-T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position „Medianwert für die minimale äquivalente Feldstärke“). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt. Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",0.22365737593473828,"Ein Service des Bundesministeriums der Justiz und für Verbraucherschutz sowie des Bundesamts für Justiz ‒ [www.gesetze-im-internet.de](http://www.gesetze-im-internet.de)
-
----
-
-Abkommen für T‑DAB Wiesbaden 1995 und Maastricht 2002 und für DVB‑T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992).
-
-Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU‑R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKW-Tonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T‑DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position „Medianwert der Mindestfeldstärke“) und Angaben für den Betrieb eines DVB‑T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position „Medianwert für die minimale äquivalente Feldstärke“). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt.
-
-Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung $r$ vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement $A$ berechnet werden:",0.20394289598912305,"
-
-Ein Service des Bundesministeriums der Justiz und für Verbraucherschutz
-sowie des Bundesamts für Justiz – www.gesetze-im-internet.de
-
-Abkommen für T-DAB Wiesbaden 1995 und Maastricht 2002 und für DVB-T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992).
-
-Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU-R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKW-Tonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T-DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position „Medianwert der Mindestfeldstärke"") und Angaben für den Betrieb eines DVB-T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position „Medianwert für die minimale äquivalente Feldstärke""). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt.
-
-Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",0.19850441876274644,"Ein Service des Bundesministeriums der Justiz und für Verbraucherschutz sowie des Bundesamts für Justiz ‒ www.gesetze-im-internet.de
-
-Abkommen für T‑DAB Wiesbaden 1995 und Maastricht 2002 und für DVB‑T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU‑R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKWTonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T‑DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position „Medianwert der Mindestfeldstärke“) und Angaben für den Betrieb eines DVB‑T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position „Medianwert für die minimale äquivalente Feldstärke“). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt.
-
-Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",0.16383412644459552,"Abkommen für T-DAB Wiesbaden 1995 und Maastricht 2002 und für DVB-T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU-R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKWTonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T-DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position 'Medianwert der Mindestfeldstärke') und Angaben für den Betrieb eines DVB-T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position 'Medianwert für die minimale äquivalente Feldstärke'). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt. Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",0.16383412644459552,"Abkommen für T-DAB Wiesbaden 1995 und Maastricht 2002 und für DVB-T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU-R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKWTonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T-DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position 'Medianwert der Mindestfeldstärke') und Angaben für den Betrieb eines DVB-T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position 'Medianwert für die minimale äquivalente Feldstärke'). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt. Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",29,laws_sample
-30,0,"Chapter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph; (b) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph, a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless- (i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembly; and",False,0.025714285714285714,"ter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
-
- (b) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph,
-
-## a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless-
-
- (i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembly;",0.015714285714285715,"hapter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
-(b) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph;
-
-a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless-
-
-(i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembly; ",0.012857142857142857,"pter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
-
-(b) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph,
-
-a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless-
-
-(i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembly; and",0.012857142857142857,"apter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
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-(b) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph,
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-a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless-
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-(i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembly; an",0.06285714285714286,"s 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
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- - ( _b_ ) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph,
-
-- a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless-
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- - (i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembly; ",0.024285714285714285,"apter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
-- ( b ) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph,
-
-a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless-
-
-- (i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembl",0.024285714285714285,"apter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
-- ( b ) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph,
-
-a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless-
-
-- (i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembl",30,laws_sample
-31,0,"(1) The seat of an Elected Member or a Specially Elected Member of the National Assembly shall become vacant- (a) upon the dissolution of Parliament; (b) if he or she is absent from the sittings of the Assembly for such period and in such circumstances as may be prescribed in the rules of procedure of the Assembly; (c) subject to the provisions of subsections (2) to (3) of this section, if any circumstances arise that, if he or she were not a Member of the Assembly, would cause him or her to be disqualified for election thereto. (2) If circumstances such as are referred to in paragraph (c) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a period of 30 days",False,0.015012510425354461,"1) The seat of an Elected Member or a Specially Elected Member of the National Assembly shall become vacant-
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- (a) upon the dissolution of Parliament;
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- (b) if he or she is absent from the sittings of the Assembly for such period and in such circumstances as may be prescribed in the rules of procedure of the Assembly;
-
- (c) subject to the provisions of subsections (2) to (3) of this section, if any circumstances arise that, if he or she were not a Member of the Assembly, would cause him or her to be disqualified for election thereto.
-
-(2) If circumstances such as are referred to in paragraph (c) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a period of 3",0.012510425354462052,"
-(1) The seat of an Elected Member or a Specially Elected Member of the National Assembly shall become vacant-
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-
-(2) If circumstances such as are referred to in paragraph (c) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a period of 30 days",0.011676396997497914,"1) The seat of an Elected Member or a Specially Elected Member of the National Assembly shall become vacant-
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-(a) upon the dissolution of Parliament;
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-(c) subject to the provisions of subsections (2) to (3) of this section, if any circumstances arise that, if he or she were not a Member of the Assembly, would cause him or her to be disqualified for election thereto.
-
-(2) If circumstances such as are referred to in paragraph (c) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a period of 30",0.014178482068390326,"The seat of an Elected Member or a Specially Elected Member of the National Assembly shall become vacant-
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-* (a) upon the dissolution of Parliament;
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-(2) If circumstances such as are referred to in paragraph (c) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a period of 30 ",0.0567139282735613,"lected Member or a Specially Elected Member of the National Assembly shall become vacant-
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-- ( _a_ ) upon the dissolution of Parliament;
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-- ( _b_ ) if he or she is absent from the sittings of the Assembly for such period and in such
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-- circumstances as may be prescribed in the rules of procedure of the Assembly;
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-- ( _c_ ) subject to the provisions of subsections (2) to (3) of this section, if any circumstances arise that, if he or she were not a Member of the Assembly, would cause him or her to be disqualified for election thereto.
-
-(2) If circumstances such as are referred to in paragraph ( _c_ ) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a per",0.027522935779816515,"(1) The seat of an Elected Member or a Specially Elected Member of the National Assembly shall become vacant-
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-- ( a ) upon the dissolution of Parliament;
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-(2) If circumstances such as are referred to in paragraph ( c ) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a p",0.027522935779816515,"(1) The seat of an Elected Member or a Specially Elected Member of the National Assembly shall become vacant-
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-- ( a ) upon the dissolution of Parliament;
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-- ( c ) subject to the provisions of subsections (2) to (3) of this section, if any circumstances arise that, if he or she were not a Member of the Assembly, would cause him or her to be disqualified for election thereto.
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-(2) If circumstances such as are referred to in paragraph ( c ) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a p",31,laws_sample
-32,0,"invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment. p p p q p (3) Operating Limitatiom. The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident. p y (4) Flight Characteristics. While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot. (5) Operating Data. The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and elnccate the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane. p Great time and effort are expended in the 1 preparation of the flight handbook to provide the most exact information, data, and pro- cedures. Diligent study and continuous UC of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.",False,0.02601156069364162," OF FLYl.NG
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-invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment.
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-(3) Operating Limitatiom. The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
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-(4) Flight Characteristics. While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot.
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-(5) Operating Data. The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and elnccate the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane.
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-Great time and effort are expended in the 1 preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent study and continuous UC of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.",0.03540462427745665,"FLYING
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-invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment.
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-(3) *Operating Limitations.* The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
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-(4) *Flight Characteristics.* While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot.
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-(5) *Operating Data.* The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and execute the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane.
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-Great time and effort are expended in the preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent study and continuous use of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.
-",0.03540462427745665,"
-invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment.
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-(3) *Operating Limitations*. The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
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-(4) *Flight Characteristics*. While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot.
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-(5) *Operating Data*. The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and execute the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane.
-
-Great time and effort are expended in the preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent *study* and continuous *use* of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.
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-![",0.03540462427745665,"*
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-invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment.
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-(3) *Operating Limitations.* The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
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-(4) *Flight Characteristics.* While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot.
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-(5) *Operating Data.* The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and execute the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane.
-
-Great time and effort are expended in the preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent *study* and continuous *use* of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.
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-",0.023121387283236993,"NG
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-invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment. (3) Operating Limitatiom. The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
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-(4) Flight Characteristics. While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot.
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-(5) Operating Data. The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and elnccate the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane.
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-Great time and effort are expended in the 1 preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent study and continuous UC of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.
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-**==",0.08164739884393063,"invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment.
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-(3) Operating Limitatiom. The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
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-(4) Flight Characteristics. While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot.
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-(5) Operating Data. The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and elnccate the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane.
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-Great time and effort are expended in the preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent study and continuous UC of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the ",0.08164739884393063,"invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment.
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-(3) Operating Limitatiom. The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
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-(4) Flight Characteristics. While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot.
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-(5) Operating Data. The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and elnccate the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane.
-
-Great time and effort are expended in the preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent study and continuous UC of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the ",32,laws_sample
-33,0,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right. Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24.",False,0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.008583690987124463,"unway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",33,laws_sample
-34,0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",False,0.0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",0.0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",0.0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",0.0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",0.0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",0.0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",0.0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",34,laws_sample
-35,0,"As illustrated, at high gross weights above the basic configuration weight, the limit and ulti- mate load factors may be seriously reduced. For the airplane shown, a 5-g maneuver im- mediately after a high gross weight takeoff could be very near the “disaster regime,” especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience great- ly increased limit and ultimate load factors. Operation in this region of high load factors at .low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncom- mon to have a modern airplane configuration with more than SO percent of its gross weight as fuel. GUST LOAD FACTORS. Gusts are asso- ciated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vec- torial addition of the gust velocity to the air- plane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The incre- ment change in load factor due to the vertical gust can be determined from the following equation:",False,0.04236200256739409," illustrated, at high gross weights above the
-
-basic configuration weight, the limit and ultimate load factors may be seriously reduced.
-
-For the airplane shown, a 5-g maneuver immediately after a high gross weight takeoff
-
-could be very near the “disaster regime,”
-especially if turbulence is associated with the
-maneuver. In the same sense, this airplane [ ]
-at very low operating weights below that of
-
-the basic configuration would experience greatly increased limit and ultimate load factors.
-
-Operation in this region of high load factors at .low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncommon to have a modern airplane configuration with more than SO percent of its gross weight as fuel.
-
-GUST LOAD FACTORS. Gusts are associated with the vertical and horizontal velocity
-
-gradients in the atmosphere. A horizontal [ ]
-gust produces a change in dynamic pressure on
-the airplane but causes relatively small and
-unimportant changes in flight load factor.
-The more important gusts are the vertical gusts
-which cause changes in angle of attack. This
-
-process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of
-
-attack and change in lift. The change in angle
-of attack at some flight condition causes a
-
-change in the flight load factor. The increment change in load factor due to the vertical
-
-gust can be determined from the following",0.025673940949935817,"
-
-As illustrated, at high gross weights above the basic configuration weight, the limit and ultimate load factors may be seriously reduced. For the airplane shown, a 5-g maneuver immediately after a high gross weight takeoff could be very near the ""disaster regime,"" especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience greatly increased limit and ultimate load factors.
-
-Operation in this region of high load factors at low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncommon to have a modern airplane configuration with more than 50 percent of its gross weight as fuel.
-
-**GUST LOAD FACTORS.** Gusts are associated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The increment change in load factor due to the vertical gust can be determined from the following equation:
-
-$$\Delt",0.02631578947368421,"12.60 |
-
-As illustrated, at high gross weights above the basic configuration weight, the limit and ultimate load factors may be seriously reduced. For the airplane shown, a 5-g maneuver immediately after a high gross weight takeoff could be very near the ""disaster regime,"" especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience greatly increased limit and ultimate load factors.
-
-Operation in this region of high load factors at low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncommon to have a modern airplane configuration with more than 50 percent of its gross weight as fuel.
-
-### GUST LOAD FACTORS
-
-Gusts are associated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The increment change in load factor due to the vertical gust can be determined from the following equation:
-
-",0.025673940949935817," |
-
-
-As illustrated, at high gross weights above the basic configuration weight, the limit and ultimate load factors may be seriously reduced. For the airplane shown, a 5-*g* maneuver immediately after a high gross weight takeoff could be very near the ""disaster regime,"" especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience greatly increased limit and ultimate load factors.
-
-Operation in this region of high load factors at low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncommon to have a modern airplane configuration with more than 50 percent of its gross weight as fuel.
-
-GUST LOAD FACTORS. Gusts are associated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The increment change in load factor due to the vertical gust can be determined from the following equation:
-
-$$\Del",0.02053915275994865,"
-
-
-As illustrated, at high gross weights above the basic configuration weight, the limit and ultimate load factors may be seriously reduced. For the airplane shown, a 5-g maneuver immediately after a high gross weight takeoff could be very near the “disaster regime,” especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience greatly increased limit and ultimate load factors.
-
-Operation in this region of high load factors at .low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncommon to have a modern airplane configuration with more than SO percent of its gross weight as fuel.
-
-GUST LOAD FACTORS. Gusts are associated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The increment change in load factor due to the vertical gust can be determined from the following equation:
-
-where ",0.11938382541720154,"rated, at high gross weights above the basic configuration weight, the limit and ultimate load factors may be seriously reduced. For the airplane shown, a 5-g maneuver immediately after a high gross weight takeoff could be very near the ' disaster regime,' especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience greatly increased limit and ultimate load factors.
-
-Operation in this region of high load factors at .low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncommon to have a modern airplane configuration with more than SO percent of its gross weight as fuel.
-
-GUST LOAD FACTORS. Gusts are associated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The increment change in load factor due ",0.11938382541720154,"ted, at high gross weights above the basic configuration weight, the limit and ultimate load factors may be seriously reduced. For the airplane shown, a 5-g maneuver immediately after a high gross weight takeoff could be very near the ' disaster regime,' especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience greatly increased limit and ultimate load factors.
-
-Operation in this region of high load factors at .low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncommon to have a modern airplane configuration with more than SO percent of its gross weight as fuel.
-
-GUST LOAD FACTORS. Gusts are associated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The increment change in load factor due to",35,laws_sample
-36,0,第五条 国家采取措施，监测、防御、处置来源于中华人民共和国境内外的网络安 全风险和威胁，保护关键信息基础设施免受攻击、侵入、干扰和破坏，依法惩治网络违法 犯罪活动，维护网络空间安全和秩序。 第六条 国家倡导诚实守信、健康文明的网络行为，推动传播社会主义核心价值观， 采取措施提高全社会的网络安全意识和水平，形成全社会共同参与促进网络安全的良好环 境。 第七条 国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯 罪等方面的国际交流与合作，推动构建和平、安全、开放、合作的网络空间，建立多边、 民主、透明的网络治理体系。,False,0.12406015037593984,"第五条 国家采取措施,监测、防御、处置来源于中华人民共和国境内外的网络安
-
-全风险和威胁,保护关键信息基础设施免受攻击、侵入、干扰和破坏,依法惩治网络违法
-
-犯罪活动,维护网络空间安全和秩序。
-
-第六条 国家倡导诚实守信、健康文明的网络行为,推动传播社会主义核心价值观,
-
-采取措施提高全社会的网络安全意识和水平,形成全社会共同参与促进网络安全的良好环
-
-境。
-
-第七条 国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯
-
-罪等方面的国际交流与合作,推动构建和平、安全、开放、合作的网络空间,建立多边、
-
-民主、透明",0.08270676691729323,"国家采取措施，监测、防御、处置来源于中华人民共和国境内外的网络安全风险和威胁，保护关键信息基础设施免受攻击、侵入、干扰和破坏，依法惩治网络违法犯罪活动，维护网络空间安全和秩序。
-
-**第六条** 国家倡导诚实守信、健康文明的网络行为，推动传播社会主义核心价值观，采取措施提高全社会的网络安全意识和水平，形成全社会共同参与促进网络安全的良好环境。
-
-**第七条** 国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯罪等方面的国际交流与合作，推动构建和平、安全、开放、合作的网络空间，建立多边、民主、透明的网络治理体系。",0.08270676691729323," 国家采取措施，监测、防御、处置来源于中华人民共和国境内外的网络安全风险和威胁，保护关键信息基础设施免受攻击、侵入、干扰和破坏，依法惩治网络违法犯罪活动，维护网络空间安全和秩序。
-
-**第六条** 国家倡导诚实守信、健康文明的网络行为，推动传播社会主义核心价值观，采取措施提高全社会的网络安全意识和水平，形成全社会共同参与促进网络安全的良好环境。
-
-**第七条** 国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯罪等方面的国际交流与合作，推动构建和平、安全、开放、合作的网络空间，建立多边、民主、透明的网络治理体系",0.08270676691729323,"国家采取措施，监测、防御、处置来源于中华人民共和国境内外的网络安全风险和威胁，保护关键信息基础设施免受攻击、侵入、干扰和破坏，依法惩治网络违法犯罪活动，维护网络空间安全和秩序。
-
-## 第六条
-
-国家倡导诚实守信、健康文明的网络行为，推动传播社会主义核心价值观，采取措施提高全社会的网络安全意识和水平，形成全社会共同参与促进网络安全的良好环境。
-
-## 第七条
-
-国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯罪等方面的国际交流与合作，推动构建和平、安全、开放、合作的网络空间，建立多边、民主、透明的网络治理体系。",0.03007518796992481,"第五条 国家采取措施，监测、防御、处置来源于中华人民共和国境内外的网络安 全风险和威胁，保护关键信息基础设施免受攻击、侵入、干扰和破坏，依法惩治网络违法 犯罪活动，维护网络空间安全和秩序。
-
-第六条 国家倡导诚实守信、健康文明的网络行为，推动传播社会主义核心价值观， 采取措施提高全社会的网络安全意识和水平，形成全社会共同参与促进网络安全的良好环 境。
-
-第七条 国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯 罪等方面的国际交流与合作，推动构建和平、安全、开放、合作的网络空间，建立多边、 民主、透明的网络治",0.03007518796992481,"条 国家采取措施，监测、防御、处置来源于中华人民共和国境内外的网络安 全风险和威胁，保护关键信息基础设施免受攻击、侵入、干扰和破坏，依法惩治网络违法 犯罪活动，维护网络空间安全和秩序。
-- 第六条 国家倡导诚实守信、健康文明的网络行为，推动传播社会主义核心价值观， 采取措施提高全社会的网络安全意识和水平，形成全社会共同参与促进网络安全的良好环 境。
-- 第七条 国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯 罪等方面的国际交流与合作，推动构建和平、安全、开放、合作的网络空间，建立多边、 民主、透明的网络治理体",0.03007518796992481,"条 国家采取措施，监测、防御、处置来源于中华人民共和国境内外的网络安 全风险和威胁，保护关键信息基础设施免受攻击、侵入、干扰和破坏，依法惩治网络违法 犯罪活动，维护网络空间安全和秩序。
-- 第六条 国家倡导诚实守信、健康文明的网络行为，推动传播社会主义核心价值观， 采取措施提高全社会的网络安全意识和水平，形成全社会共同参与促进网络安全的良好环 境。
-- 第七条 国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯 罪等方面的国际交流与合作，推动构建和平、安全、开放、合作的网络空间，建立多边、 民主、透明的网络治理体",36,laws_sample
-37,0,MCA for aircraft traveling West along V520 to cross JAC at 15200’ MCA for aircraft traveling West along V330 to cross JAC at 13400’ MTA for aircraft crossing over and turning at JAC: Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000’ or higher,False,0.018575851393188854,"A for aircraft traveling West along V520 to cross JAC at 15200’ MCA for aircraft traveling West along V330 to cross JAC at 13400’
-
-MTA for aircraft crossing over and turning at JAC:
-
-Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000’ or higher",0.04024767801857585,"MCA for aircraft traveling West along V520 to cross JAC at 15200'
-MCA for aircraft traveling West along V330 to cross JAC at 13400'
-
-MTA for aircraft crossing over and turning at JAC:
-
-Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000' or hi",0.09287925696594428,"raft traveling West along V520 to cross JAC at 15200’**
-**MCA for aircraft traveling West along V330 to cross JAC at 13400’**
-
-**MTA for aircraft crossing over and turning at JAC:**
-
-- Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000’ or high",0.030959752321981424,"CA for aircraft traveling West along V520 to cross JAC at 15200'
-MCA for aircraft traveling West along V330 to cross JAC at 13400'
-
-MTA for aircraft crossing over and turning at JAC:
-
-Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000' or highe",0.02476780185758514,"A for aircraft traveling West along V520 to cross JAC at 15200’ MCA for aircraft traveling West along V330 to cross JAC at 13400’
-
-MTA for aircraft crossing over and turning at JAC:
-
-Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000’ or high",0.02786377708978328,"CA for aircraft traveling West along V520 to cross JAC at 15200' MCA for aircraft traveling West along V330 to cross JAC at 13400'
-
-MTA for aircraft crossing over and turning at JAC:
-
-Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000' or highe",0.02786377708978328,"CA for aircraft traveling West along V520 to cross JAC at 15200' MCA for aircraft traveling West along V330 to cross JAC at 13400'
-
-MTA for aircraft crossing over and turning at JAC:
-
-Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000' or highe",37,laws_sample
-39,0,"(3) In this section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description. (4) Subsection (1) of this section shall not apply to any law so far as that law makes provision-",False,0.013311148086522463,") In this section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description.
-
-## (4) Subsection (1) of this section shall not apply to any law so far as that law makes provisio",0.004991680532445923,"(3) In this section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description.
-
-(4) Subsection (1) of this section shall not apply to any law so far as that law makes provision",0.004991680532445923,"(3) In this section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description.
-
-(4) Subsection (1) of this section shall not apply to any law so far as that law makes provision",0.04159733777038269,"his section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description.
-
-(4) Subsection (1) of this section shall not apply to any law so far as that law makes provis",0.013311148086522463,"In this section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description.
-
-(4) Subsection (1) of this section shall not apply to any law so far as that law makes
-
-provision-",0.013311148086522463,") In this section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description.
-
-## (4) Subsection (1) of this section shall not apply to any law so far as that law makes provisio",0.013311148086522463,") In this section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description.
-
-## (4) Subsection (1) of this section shall not apply to any law so far as that law makes provisio",39,laws_sample
-40,0,"MISSED APPROACH: Climb to 13000 on RIL VOR/DME R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in- hold to 13000.",False,0.1497005988023952," MISSED APPROACH: Climb to 13000 on RIL VOR/DME
R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME
R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in-
R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME
R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in-
hold to ",0.0,"MISSED APPROACH: Climb to 13000 on RIL VOR/DME R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in- hold to 13000.",0.0,"MISSED APPROACH: Climb to 13000 on RIL VOR/DME R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in- hold to 13000.",40,laws_sample
-40,1,"MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",False,0.0970873786407767,"SSED APPROACH: Climbing left turn to 8000 via SVC
R-128, then reverse course to SVC VOR/DME and ho",0.019417475728155338,"MISSSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold",0.0,"MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",0.0,"MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",0.06796116504854369,"ISSED APPROACH: Climbing left turn to 8000 via SVC
R-128, then reverse course to SVC VOR/DME and hol",0.0,"MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",0.0,"MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",40,laws_sample
-40,2,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",False,0.11363636363636363,"ISSED APPROACH: Climb to 9000 on track 112° to JETRY,
cross JETRY at or above 6700, and on track 112° to PAKPE,
right turn to WULKU, and on track 289° to JNC VOR/DME ",0.011363636363636364,"MISSSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold",0.0,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",0.0,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",0.07386363636363637,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY,
cross JETRY at or above 6700, and on track 112° to PAKPE,
ight turn to WULKU, and on track 289° to JNC VOR/DME and<",0.0,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",0.0,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",40,laws_sample
-41,0,"3.—(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E. (2) Paragraph (1) does not apply to any aircraft—",False,0.008108108108108109,".—(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
-
-(2) Paragraph (1) does not apply to any aircraft—",0.008108108108108109,"3.—(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
-
-(2) Paragraph (1) does not apply to any aircraft",0.010810810810810811,"*—(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
-
-(2) Paragraph (1) does not apply to any aircraft—",0.02972972972972973,"(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.~~
-
-~~(2) Paragraph (1) does not apply to any aircraf",0.03783783783783784,"(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
-
- - (2) Paragraph (1) does not apply to any aircr",0.016216216216216217,"3. -(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
-
-(2) Paragraph (1) does not apply to any aircraf",0.016216216216216217,"3. -(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
-
-(2) Paragraph (1) does not apply to any aircraf",41,laws_sample
-41,1,"(a) S.I. 2016/765, to which there are amendments not relevant to these Regulations. (b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST).",False,0.029940119760479042,"a) S.I. 2016/765, to which there are amendments not relevant to these Regulations.
-
-( b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.017964071856287425,"(a) S.I. 2016/765, to which there are amendments not relevant to these Regulations.
-
-(b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.0718562874251497,".I. 2016/765, to which there are amendments not relevant to these Regulations.
-[^b]: (b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.017964071856287425,"(a) S.I. 2016/765, to which there are amendments not relevant to these Regulations.
-
-(b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.11976047904191617,".I. 2016/765, to which there are amendments not relevant to these Regulations.
-
-> ( **b** ) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (",0.041916167664670656,") S.I. 2016/765, to which there are amendments not relevant to these Regulations.
-
-( b ) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.041916167664670656,") S.I. 2016/765, to which there are amendments not relevant to these Regulations.
-
-( b ) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",41,laws_sample
-42,0,"That airspace from 18,000’ MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airspace less than 1,500’ AGL.",False,0.15544041450777202,"ce from 18,000’ MSL to and including FL 600,
including the airspace overflying the waters within 12 NM
of the coast of the contiguous United States and Alaska
and designated offshore areas, excluding Santa Barbara
Island, Farallon Island, the airspace south of latitude
25° 04’00” N, the Alaska peninsula west of longitude
160°00’00” W, and the airspace le",0.02072538860103627,"That airspace from 18,000' MSL to and including FL 600, including the airspace overlying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00"" N, the Alaska peninsula west of longitude 160°00'00"" W, and the airspace less than 1,500' AGL. ",0.0,"That airspace from 18,000’ MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airspace less than 1,500’ AGL.",0.015544041450777202,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00"" N, the Alaska peninsula west of longitude 160°00'00"" W, and the airspace less than 1,500' AGL.",0.12435233160621761,"airspace from 18,000’ MSL to and including FL 600, including the airspace overflying the waters within 12 NM _Controlled_ of the coast of the contiguous United States and Alaska _Airspace_ and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airspace le",0.015544041450777202,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00' N, the Alaska peninsula west of longitude 160°00'00' W, and the airspace less than 1,500' AGL.",0.015544041450777202,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00' N, the Alaska peninsula west of longitude 160°00'00' W, and the airspace less than 1,500' AGL.",42,laws_sample
-42,1,"That airspace from 18,000’ MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00’00” W, and designated offshore areas.",False,0.1595744680851064,"airspace from 18,000’ MSL to and including FL
450, including Santa Barbara Island, Farallon Island, the
Alaska peninsula west of longitude 160°00’00” W, and
designated offsh",0.015957446808510637,"That airspace from 18,000' MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00'00"" W, and designated offshore areas.",0.0,"That airspace from 18,000’ MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00’00” W, and designated offshore areas.",0.015957446808510637,"That airspace from 18,000' MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00'00"" W, and designated offshore areas.",0.6063829787234043,"d designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airs",0.015957446808510637,"That airspace from 18,000' MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00'00' W, and designated offshore areas.",0.015957446808510637,"That airspace from 18,000' MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00'00' W, and designated offshore areas.",42,laws_sample
-42,2,"That airspace from the surface to 10,000’ MSL (unless otherwise designated) surrounding the nation’s busi- est airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.",False,0.013215859030837005,"
-That airspace from the surface to 10,000’ MSL (unless otherwise designated) surrounding the nation’s busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.",0.02643171806167401,"
-That airspace from the surface to 10,000' MSL (unless otherwise designated) surrounding the nation's busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.
-",0.01762114537444934,"That airspace from the surface to 10,000’ MSL (unless otherwise designated) surrounding the nation’s busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.
-
-",0.02643171806167401,"That airspace from the surface to 10,000' MSL (unless otherwise designated) surrounding the nation's busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.
-
-",0.01762114537444934,"
-
-That airspace from the surface to 10,000’ MSL (unless otherwise designated) surrounding the nation’s busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.",0.7048458149779736,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Is",0.7048458149779736,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Is",42,laws_sample
-42,3,That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215),False,0.5235294117647059," | Class B airspace and within 10 NM of designated airports. | See Chart example above. |
-| Controlled | Mode-C transponder equipment is required. (See FAR ",0.0,That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215),0.0,That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215),0.0,That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215),0.15294117647058825, airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. _Controlled_ Mode-C transponder equipment is required. (See FA,0.0,That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215),0.0,That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215),42,laws_sample
-43,0,"On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is , g ( avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names q y g q y ( ) and identification boxes (shown in blue) take precedence. Only ( ) p y those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.",False,0.3234932349323493,"## RADIO AIDS TO NAVIGATION
-
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is
-
-avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only
-
-| Callout / Legend item | Text or example shown in ima",0.06888068880688807,"GATION
-
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.
-
-![Diagram illustra",0.06888068880688807,"# RADIO AIDS TO NAVIGATION
-
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.",0.06888068880688807,"ATION
-
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.
-
-| Crosshatch indica",0.06888068880688807,"ATION**
-
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.
-
-A NAVAID that i",0.05781057810578106,"N
-
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only
-
-
-
-those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.
-
-A NAVA",0.05781057810578106,"N
-
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only
-
-
-
-those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.
-
-A NAVA",43,laws_sample
-43,1,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,False,0.0,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,0.0,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,0.0,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,0.0,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,0.0,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,0.0,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,0.0,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,43,laws_sample
-43,2,Hard-surfaced runways greater than 8069’ or some multiple runways less than 8069’ Hard-surfaced runways 1500’ to 8069’ Other than hard-surfaced runways Seaplane bases,False,0.1566265060240964,"surfaced runways greater than 8069’ or some multiple runways less than 8069’
-
-
-
-Hard-surfaced runways 1500’ to 8069’
-
-[ ]
-
-Other than hard-surfaced runways
-
-
-
-Seaplan",0.0963855421686747,"urfaced runways greater than 8069' or some multiple runways less than 8069'
-- Hard-surfaced runways 1500' to 8069'
-- Other than hard-surfaced runways
-- Seaplane bases",0.3795180722891566,"ard-surfaced runways greater than 8069’ or some multiple runways less than 8069’
-* **[Icon: Magenta circle with white X]** Hard-surfaced runways 1500’ to 8069’
-* ",0.39759036144578314,"Hard-surfaced runways greater than 8069' or some multiple runways less than 8069'
-
-[Purple circle with airplane symbol] Hard-surfaced runways 1500' to 8069'
-
-[Purple ",0.07228915662650602,"rd-surfaced runways greater than 8069’ or some multiple runways less than 8069’
-
-Hard-surfaced runways 1500’ to 8069’
-
-Other than hard-surfaced runways
-
-Seaplane b",0.0963855421686747,"Hard-surfaced runways greater than 8069' or some multiple runways less than 8069'
-- Hard-surfaced runways 1500' to 8069'
-- Other than hard-surfaced runways
-- Seaplane",0.0963855421686747,"Hard-surfaced runways greater than 8069' or some multiple runways less than 8069'
-- Hard-surfaced runways 1500' to 8069'
-- Other than hard-surfaced runways
-- Seaplane",43,laws_sample
-44,0,"member of a Delimitation Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly. (6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such. (7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission: Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of the Commission.",False,0.0069821567106283944,"ber of a Delimitation Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly.
-
-(6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such.
-
-(7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission:
-
-Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of the Commission.",0.0069821567106283944,"ember of a Delimitation Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly.
-
-(6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such.
-
-(7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission:
-
-Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of the Commissio",0.0069821567106283944,"member of a Delimitation Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly.
-
-(6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such.
-
-(7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission:
-
-Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of the Commissi",0.05818463925523662,"n Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly.
-
-(6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such.
-
-(7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission:
-
-Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of th",0.009309542280837859,"ber of a Delimitation Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly.
-
-(6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such.
-
-(7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission:
-
-Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of the Commissi",0.0069821567106283944,"ber of a Delimitation Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly.
-
-(6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such.
-
-(7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission:
-
-Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of the Commission.",0.0069821567106283944,"ber of a Delimitation Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly.
-
-(6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such.
-
-(7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission:
-
-Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of the Commission.",44,laws_sample
-45,0,"(3) For the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine. (4) A Member of the Ntlo ya Dikgosi shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the Ntlo ya Dikgosi shall not bar any person from being such a Member.",False,0.005136986301369863,"(3) For the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
-
-(4) A Member of the Ntlo ya Dikgosi shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the Ntlo ya Dikgosi shall not bar any person from being such a Member",0.018835616438356163,"or the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
-
-(4) A Member of the *Ntlo ya Dikgosi* shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the *Ntlo ya Dikgosi* shall not bar any person from being such a Member.",0.018835616438356163,"For the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
-
-(4) A Member of the *Ntlo ya Dikgosi* shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the *Ntlo ya Dikgosi* shall not bar any person from being such a Member",0.05650684931506849," the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
-
-(4) A Member of the *Ntlo ya Dikgosi* shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the *Ntlo ya Dikgosi* shall not bar any person from being such ",0.07534246575342465,"he purposes of this section, two or more terms of imprisonment that are required to
-
-be served consecutively shall be regarded as a single term of imprisonment for the aggregate
-
-period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
-
- - (4) A Member of the _Ntlo ya Dikgosi_ shall not, while he or she is such a Member,
-
-- participate in party politics, but active participation in politics prior to being a Member of the _Ntlo ya Dikgosi_ shall not bar any person from being s",0.005136986301369863,"3) For the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
-
-(4) A Member of the Ntlo ya Dikgosi shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the Ntlo ya Dikgosi shall not bar any person from being such a Member.",0.005136986301369863,"3) For the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
-
-(4) A Member of the Ntlo ya Dikgosi shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the Ntlo ya Dikgosi shall not bar any person from being such a Member.",45,laws_sample
-46,0,"Where a physical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to them.",False,0.0,"Where a physical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to them.",0.0297723292469352,"a **physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the 'Terms of Reference'. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to the",0.05253940455341506,"physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the **'Terms of Reference'**. The **access of third parties (for example subcontractors)** is prohibited. Attendees will not be permitted to take copies in any form of the data made available to",0.028021015761821366,"e a **physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to t",0.028021015761821366,"Where a **physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available ",0.05604203152364273,"hysical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available t",0.05604203152364273,"hysical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available t",46,govt tenders
-47,0,"not use confidential information or documents for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party; (b) ensure the protection of such confidential information or documents with the same level of protection as its own confidential information or documents, and in any case with due diligence;",False,0.01366120218579235,"ot use confidential information or documents for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
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- (b) ensure the protection of such confidential information or documents with the same level of protection as its own confidential information or documents, and in any case with due diligence",0.030054644808743168," use *confidential information or documents* for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
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-(b) ensure the protection of such *confidential information or documents* with the same level of protection as its own confidential information or documents, and in any case with due diligenc",0.03278688524590164," use *confidential information or documents* for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
-- (b) ensure the protection of such *confidential information or documents* with the same level of protection as its own confidential information or documents, and in any case with due diligen",0.030054644808743168,"se *confidential information or documents* for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
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-(b) ensure the protection of such *confidential information or documents* with the same level of protection as its own confidential information or documents, and in any case with due diligence;",0.0546448087431694,"nfidential information or documents_ for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
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- - (b) ensure the protection of such _confidential information or documents_ with the same level of protection as its own confidential information or documents, and in any case with due diligence;",0.12021857923497267," information or documents for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
-- (b) ensure the protection of such confidential information or documents with the same level of protection as its own confidential information or documents, and in any case with due diligen",0.12021857923497267," information or documents for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
-- (b) ensure the protection of such confidential information or documents with the same level of protection as its own confidential information or documents, and in any case with due diligen",47,govt tenders
-48,0,"Le pouvoir adjudicateur est soumis au protocole nº 7 sur les privilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant. Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur. La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtemps.",False,0.003929273084479371,"e pouvoir adjudicateur est soumis au protocole nº 7 sur les privilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant.
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-Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur.
-
-La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtemps",0.0045841519318926,"Le pouvoir adjudicateur est soumis au protocole n° 7 sur les privilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant.
-
-Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur.
-
-La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtemp",0.003929273084479371,"Le pouvoir adjudicateur est soumis au protocole nº 7 sur les privilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant.
-
-Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur.
-
-La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtemp",0.003929273084479371," pouvoir adjudicateur est soumis au protocole nº 7 sur les privilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant.
-
-Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur.
-
-La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtemps.",0.005239030779305829,"pouvoir adjudicateur est soumis au protocole nº 7 sur les privilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant.
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-Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur.
-
-La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtemps",0.09037328094302555,"ilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant.
-
-Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur.
-
-La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtem",0.09037328094302555,"ilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant.
-
-Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur.
-
-La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtem",48,govt tenders
-49,0,"Avant de procéder au recouvrement, le pouvoir adjudicateur doit notifier formellement au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification. Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en notifiant formellement une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit. Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus: a) par compensation avec des sommes que l'Union doit au contractant; b) par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur; c) par une action en justice.",False,0.013501350135013501,"t de procéder au recouvrement, le pouvoir adjudicateur doit notifier formellement au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification.
-
-Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en notifiant formellement une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit.
-
-Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus:
-
-a) par compensation avec des sommes que l'Union doit au contractant;
-
-b) par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur;
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-c) par une action en justice",0.022502250225022502,"nt de procéder au recouvrement, le pouvoir adjudicateur doit *notifier formellement* au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification.
-
-Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en *notifiant formellement* une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit.
-
-Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus:
-
-1. par compensation avec des sommes que l'Union doit au contractant;
-2. par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur;
-3. par une action en just",0.041404140414041404,"t de procéder au recouvrement, le pouvoir adjudicateur doit *notifier formellement* au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification.
-
-Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en *notifiant formellement* une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit.
-
-Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus :
-
-* a) par compensation avec des sommes que l'Union doit au contractant ;
-* b) par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur ;
-* c) par une ",0.020702070207020702,"t de procéder au recouvrement, le pouvoir adjudicateur doit *notifier formellement* au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification.
-
-Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en *notifiant formellement* une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit.
-
-Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus:
-
-a) par compensation avec des sommes que l'Union doit au contractant;
-
-b) par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur;
-
-c) par une action en jus",0.036003600360036005,"vant de procéder au recouvrement, le pouvoir adjudicateur doit _notifier formellement_ au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification.
-
-Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en _notifiant formellement_ une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit.
-
-Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus:
-
-- a) par compensation avec des sommes que l'Union doit au contractant;
-
-- b) par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur;
-
-- c) par une",0.1188118811881188,"oit notifier formellement au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification.
-
-Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en notifiant formellement une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit.
-
-Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus:
-
-- a) par compensation avec des sommes que l'Union doit au contractant;
-- b) par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur;
-- c) par une action en jus",0.1188118811881188,"oit notifier formellement au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification.
-
-Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en notifiant formellement une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit.
-
-Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus:
-
-- a) par compensation avec des sommes que l'Union doit au contractant;
-- b) par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur;
-- c) par une action en jus",49,govt tenders
-50,0,European Union Agency for Cybersecurity Vasilissis Sofias Str 1 151 24 Maroussi | Attiki | Greece Tel: +30 28 14 40 9711 Email: procurement@enisa.europa.eu www.enisa.europa.eu,False,0.08571428571428572,"pean Union Agency for Cybersecurity
-
-Vasilissis Sofias Str 1
-
-151 24 Maroussi | Attiki | Greece
-
-Tel: +30 28 14 40 9711
-
-Email: procurement@enisa.europa.eu
-
-www.enisa.europa.e",0.68,"European Union Agency for Cybersecurity (ENISA) referred to below as *the contracting authority*, is planning to award the contract(s) resulting from the above procurement pro",0.13714285714285715,"Union Agency for Cybersecurity**
-Vasilissis Sofias Str 1
-151 24 Maroussi | Attiki | Greece
-Tel: +30 28 14 40 9711
-Email: procurement@enisa.europa.eu
-www.enisa.europa",0.02857142857142857,"European Union Agency for Cybersecurity
-Vasilissis Sofias Str 1
-151 24 Maroussi | Attiki | Greece
-Tel: +30 28 14 40 9711
-Email: procurement@enisa.europa.eu
-www.enisa.europa.eu",0.0,European Union Agency for Cybersecurity Vasilissis Sofias Str 1 151 24 Maroussi | Attiki | Greece Tel: +30 28 14 40 9711 Email: procurement@enisa.europa.eu www.enisa.europa.eu,0.06857142857142857,"opean Union Agency for Cybersecurity
-
-Vasilissis Sofias Str 1
-
-151 24 Maroussi | Attiki | Greece
-
-Tel: +30 28 14 40 9711
-
-Email: procurement@enisa.europa.eu www.enisa.europa.e",0.06857142857142857,"opean Union Agency for Cybersecurity
-
-Vasilissis Sofias Str 1
-
-151 24 Maroussi | Attiki | Greece
-
-Tel: +30 28 14 40 9711
-
-Email: procurement@enisa.europa.eu www.enisa.europa.e",50,govt tenders
-51,0," Relying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded. 2.5. Tender submission: how many tenders may an economic operator submit? Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is missing.",False,0.01282051282051282,"elying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
-
-## 2.5. Tender submission: how many tenders may an economic operator submit?
-
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is missin",0.01282051282051282,"lying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
-
-## 2.5. Tender submission: how many tenders may an economic operator submit?
-
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is missing",0.01282051282051282,"Relying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
-
-## 2.5. Tender submission: how many tenders may an economic operator submit?
-
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is missi",0.022144522144522144,"lying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
-
-## **2.5. Tender submission: how many tenders may an economic operator submit?**
-
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is mis",0.018648018648018648,"elying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
-
-**2.5. Tender submission: how many tenders may an economic operator submit?**
-
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is mis",0.05944055944055944,"ies of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
-
-## 2.5. Tender submission: how many tenders may an economic operator submit?
-
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is missing",0.05944055944055944,"ies of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
-
-## 2.5. Tender submission: how many tenders may an economic operator submit?
-
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is missing",51,govt tenders
-52,0,"When making use of the results, the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority’s official position. The contracting authority may waive this obligation in writing or provide the text of the disclaimer.",False,0.0,"When making use of the results, the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority’s official position. The contracting authority may waive this obligation in writing or provide the text of the disclaimer.",0.014084507042253521,"When making use of the *results*, the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority's official position. The contracting authority may waive this obligation in writing or provide the text of the disclaime",0.011267605633802818,"hen making use of the *results*, the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority’s official position. The contracting authority may waive this obligation in writing or provide the text of the disclaimer",0.014084507042253521,"hen making use of the *results*, the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority's official position. The contracting authority may waive this obligation in writing or provide the text of the disclaimer",0.016901408450704224,"When making use of the _results_ , the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority’s official position. The contracting authority may waive this obligation in writing or provide the text of the disclaim",0.014084507042253521,"hen making use of the results , the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority's official position. The contracting authority may waive this obligation in writing or provide the text of the disclaimer",0.014084507042253521,"hen making use of the results , the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority's official position. The contracting authority may waive this obligation in writing or provide the text of the disclaimer",52,govt tenders
-53,0,"2) Copies of the profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity. If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the Contracting Authority considers appropriate. The contracting authority must at least be notified of the reason and its justification. The Contracting Authority reserves the right to request any other document enabling it to verify the economic operator’s economic and financial capacity. → All of the above specified evidence of economic and financial capacity must be provided with the tender. 3.2.3. Technical and professional capacity Tenderers must comply with the following selection criteria in order to prove that they have the necessary technical and professional capacity to perform the contract.",False,0.5261472785485592,"s of the profit and loss accounts, it may prove its economic
and financial capacity by any other document, which the Contracting
Authority considers appropriate. The contracting authority must at
least be notified of the reason and its justification. |
-| | The Contracting Authority reserves the right to request any other
document enabling it to verify the economic operator’s economic and
financial capacity. |
-
-→ All of the above specified evidence of economic and financial capacity must be provided with the tender.
-
-## 3.2.3. Technical and professional capacity
-
-Tenderers must comply with the following selection criteria in order to prove that they have the necessary technical and professional ",0.4311632870864461,"alid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the Contracting Authority considers appropriate. The contracting authority must at least be notified of the reason and its justification. |
-| The Contracting Authority reserves the right to request any other document enabling it to verify the economic operator's economic and financial capacity. |
-
-→ All of the above specified evidence of economic and financial capacity must be provided with the tender.
-
-### 3.2.3. Technical and professional capacity
-
-Tenderers must comply with the following selection criteria in order to prove that they have the necessary technical ",0.051227321237993596,"e profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity.
->
-> If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the *Contracting Authority* considers appropriate. The contracting authority must at least be notified of the reason and its justification.
->
-> The *Contracting Authority* reserves the right to request any other document enabling it to verify the economic operator’s economic and financial capacity.
-
-→ **All of the above specified evidence of economic and financial capacity must be provided with the tender.**
-
-### 3.2.3. Technical and professional capacity
-
-Tenderers must comply with the following selection criteria in order to prove that they have the necessary technical and professional capacity to perform the c",0.08751334044823907,"ccounts for the last two years for which accounts have been closed from each concerned involved entity. |
-| | |
-| | If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the *Contracting Authority* considers appropriate. The contracting authority must at least be notified of the reason and its justification. |
-| | |
-| | The *Contracting Authority* reserves the right to request any other document enabling it to verify the economic operator's economic and financial capacity. |
-
-→ **All of the above specified evidence of economic and financial capacity must be provided with the tender.**
-
-## 3.2.3. Technical and professional capacity
-
-Tenderers must comply with the following selection criteria in order to prove that they have the necessary technical and professional capacity to perform the con",0.16008537886872998,"e profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity. If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the _Contracting Authority_ considers appropriate. The contracting authority must at least be notified of the reason and its justification. The _Contracting Authority_ reserves the right to request any other document enabling it to verify the economic operator’s economic and financial capacity.
-
-**==> picture [96 x 164] intentionally omitted <==**
-
-**→ All of the above specified evidence of economic and financial capacity must be provided with the tender.**
-
-## **3.2.3. Technical and professional capacity**
-
-Tenderers must comply with the following selection criteria in order to prove that they have the necessary ",0.35645677694770544,"
-
-| 2) Copies of the profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity. If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the Contracting Authority considers appropriate. The contracting authority must at least be notified of the reason and its justification. The Contracting Authority reserves the right to request any other document enabling it to verify the economic operator's economic and financial capacity. ",0.35645677694770544,"
-
-| 2) Copies of the profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity. If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the Contracting Authority considers appropriate. The contracting authority must at least be notified of the reason and its justification. The Contracting Authority reserves the right to request any other document enabling it to verify the economic operator's economic and financial capacity. ",53,govt tenders
-53,1,The tenderers must have worked on at least 10 contracts15 with at least 3 different clients over the last 4 years (i.e. 23/11/2016 – 08/01/2021). 2. The 10 contract references must cover the provision of Transformation services in the following domains: - Information systems consultancy and/or studies – minimum 6 references; - Information systems development and support – minimum 4 references; 3. Minimum volumes for each referenced contract for Information systems consultancy and/or studies: a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-days.,False,0.18968133535660092,s must have worked on at least 10 contracts 15 with
at least 3 different clients over the last 4 years (i.e. 23/11/2016
- 08/01/2021).
2. The 10 contract references must cover the provision of
Transformation services in the following domains:
- Information systems consultancy and/or studies - minimum
6 references;
■ Information systems development and support – minimum 4
references;
3. Minimum volumes for each referenced contract for Information
systems consultancy and/or studies:
a. Engagement of IT experts corresponding to the relevant IT
profiles listed in Annex 11 of the Technical Specifi,0.23823975720789076,"h at least 3 different clients over the last 4 years (i.e. 23/11/2016 – 08/01/2021).The 10 contract references must cover the provision of Transformation services in the following domains:- Information systems consultancy and/or studies – minimum 6 references;
- Information systems development and support – minimum 4 references;
Minimum volumes for each referenced contract for Information systems consultancy and/or studies:- Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 p",0.38088012139605465,3/11/2016 – 08/01/2021**).
2. The **10** contract references **must** cover the provision of **Transformation services** in the following domains:
- **Information systems consultancy and/or studies – minimum 6 references;**
- **Information systems development and support – minimum 4 references;**
3. **Minimum volumes for each referenced contract for Information systems consultancy and/or studies:**
a. **Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-day,0.4597875569044006,"he 10 contract references must cover the provision of Transformation services in the following domains:- Information systems consultancy and/or studies – minimum 6 references;
-- Information systems development and support – minimum 4 references; |
-| | 3. | Minimum volumes for each referenced contract for Information systems **consultancy and/or studies:**- a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-days.",0.11684370257966616,10 contracts[15]** with **level of** at least **3 different clients** over the **last 4 years** (i.e. 23/11/2016 **capacity – 08/01/2021)** . 2. The 10 contract references must cover the provision of Transformation services in the following domains: - Information systems consultancy and/or studies – minimum 6 references; - Information systems development and support – minimum 4 references; 3. Minimum volumes for each referenced contract for Information systems **consultancy and/or studies:** a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-days.,0.010622154779969651,The tenderers must have worked on at least 10 contracts 15 with at least 3 different clients over the last 4 years (i.e. 23/11/2016 - 08/01/2021) . 2. The 10 contract references must cover the provision of Transformation services in the following domains: - Information systems consultancy and/or studies - minimum 6 references; - Information systems development and support - minimum 4 references; 3. Minimum volumes for each referenced contract for Information systems consultancy and/or studies: a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-day,0.010622154779969651,The tenderers must have worked on at least 10 contracts 15 with at least 3 different clients over the last 4 years (i.e. 23/11/2016 - 08/01/2021) . 2. The 10 contract references must cover the provision of Transformation services in the following domains: - Information systems consultancy and/or studies - minimum 6 references; - Information systems development and support - minimum 4 references; 3. Minimum volumes for each referenced contract for Information systems consultancy and/or studies: a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-day,53,govt tenders
-53,2,Minimum level of capacity,False,0.52, />level of
capacity,0.0,Minimum level of capacity,0.0,Minimum level of capacity,0.0,Minimum level of capacity,0.56, Minimum volumes for each,0.0,Minimum level of capacity,0.0,Minimum level of capacity,53,govt tenders
-54,0,"The joint tender must clearly indicate the role and tasks of each member and of the Group Leader who will act as the Contracting Authority's contact point for the contract's administrative or financial aspects and operational management. The Group Leader will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the Contracting Authority shall sign the contract with the Group Leader, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in Annex 04 “Power of Attorney”.",False,0.0032733224222585926,"he joint tender must clearly indicate the role and tasks of each member and of the Group Leader who will act as the Contracting Authority's contact point for the contract's administrative or financial aspects and operational management. The Group Leader will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the Contracting Authority shall sign the contract with the Group Leader, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in Annex 04 “Power of Attorney” .",0.04091653027823241," tender must clearly indicate the role and tasks of each member and of the *Group Leader* who will act as the *Contracting Authority's* contact point for the contract's administrative or financial aspects and operational management. The *Group Leader* will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the *Contracting Authority* shall sign the contract with the *Group Leader*, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in **Annex 04 ""Power of Attorne",0.03927986906710311," joint tender must clearly indicate the role and tasks of each member and of the *Group Leader* who will act as the *Contracting Authority's* contact point for the contract's administrative or financial aspects and operational management. The *Group Leader* will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the *Contracting Authority* shall sign the contract with the *Group Leader*, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in **Annex 04 “Power of A",0.03436988543371522,"oint tender must clearly indicate the role and tasks of each member and of the *Group Leader* who will act as the *Contracting Authority*'s contact point for the contract's administrative or financial aspects and operational management. The *Group Leader* will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the *Contracting Authority* shall sign the contract with the Group Leader, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in **Annex 04 ""Power of Attor",0.03927986906710311,"he joint tender must clearly indicate the role and tasks of each member and of the _Group Leader_ who will act as the _Contracting Authority_ 's contact point for the contract's administrative or financial aspects and operational management. The _Group Leader_ will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the _Contracting Authority_ shall sign the contract with the Group Leader, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in **Annex 04 “Power of",0.04091653027823241,"nt tender must clearly indicate the role and tasks of each member and of the Group Leader who will act as the Contracting Authority 's contact point for the contract's administrative or financial aspects and operational management. The Group Leader will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the Contracting Authority shall sign the contract with the Group Leader, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in Annex 04 'Power of Attor",0.04091653027823241,"nt tender must clearly indicate the role and tasks of each member and of the Group Leader who will act as the Contracting Authority 's contact point for the contract's administrative or financial aspects and operational management. The Group Leader will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the Contracting Authority shall sign the contract with the Group Leader, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in Annex 04 'Power of Attor",54,govt tenders
-54,1,9 References to tenderer or tenderers in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tender.,False,0.012048192771084338,"
-9 References to tenderer ortenderers in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tender.",0.04819277108433735,eferences to *tenderer* or *tenderers* in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tender,0.04819277108433735,eferences to *tenderer* or *tenderers* in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tender,0.04819277108433735,References to *tenderer* or *tenderers* in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tende,0.04819277108433735,References to _tenderer_ or _tenderers_ in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tende,0.006024096385542169, References to tenderer or tenderers in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tender.,0.006024096385542169, References to tenderer or tenderers in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tender.,54,govt tenders
-55,0,Renewed pre-financing payments and interim payments,False,0.19607843137254902,ed pre-financing payments and interim
payments,0.0,Renewed pre-financing payments and interim payments,0.0,Renewed pre-financing payments and interim payments,0.0,Renewed pre-financing payments and interim payments,0.27450980392156865,Renewed**|** pre-financing payments and interim**|*,0.0,Renewed pre-financing payments and interim payments,0.0,Renewed pre-financing payments and interim payments,55,govt tenders
-55,1,Forecast balance,False,0.0,Forecast balance,0.0,Forecast balance,0.0,Forecast balance,0.0,Forecast balance,0.0,Forecast balance,0.0,Forecast balance,0.0,Forecast balance,55,govt tenders
-56,0,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send such communication within a specified deadline.",False,0.0,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send such communication within a specified deadline.",0.0,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send such communication within a specified deadline.",0.0,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send such communication within a specified deadline.",0.0,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send such communication within a specified deadline.",0.0,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send such communication within a specified deadline.",0.16544117647058823,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send su",0.16544117647058823,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send su",56,govt tenders
-57,0,"The contractor shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority.",False,0.0,"The contractor shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority.",0.0,"The contractor shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority.",0.0,"The contractor shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority.",0.0,"The contractor shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority.",0.0,"The contractor shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority.",0.06631299734748011,"or shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority",0.06631299734748011,"or shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority",57,govt tenders
-58,0,"Each delivery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or to its carrier.",False,0.0,"Each delivery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or to its carrier.",0.0,"Each delivery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or to its carrier.",0.0,"Each delivery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or to its carrier.",0.0,"Each delivery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or to its carrier.",0.0,"Each delivery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or to its carrier.",0.1580547112462006,"ery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or",0.1580547112462006,"ery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or",58,govt tenders
-59,0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",False,0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",0.023809523809523808,"rès l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité.
->
-> Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice ",0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",59,govt tenders
-60,0,"Payments must be made to the contractor’s (or leader’s in the case of a joint tender) bank account denominated in euro, identified as follows:",False,0.0,"Payments must be made to the contractor’s (or leader’s in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",0.0,"Payments must be made to the contractor’s (or leader’s in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",60,govt tenders
-61,0,"Le contractant doit satisfaire aux exigences minimales prévues dans le cahier des charges. Cela comprend le respect des obligations applicables en vertu de la législation environnementale et sociale et de la législation du travail établies par le droit de l'Union, le droit national et les conventions collectives ou par les dispositions législatives internationales dans le domaine environnemental et social et dans le domaine du travail énumérées à l'annexe X de la directive 2014/24/UE4, ainsi que le respect des obligations en matière de protection des données découlant des règlements (UE) 2016/6795 et (UE) 2018/17256.",False,0.0,"Le contractant doit satisfaire aux exigences minimales prévues dans le cahier des charges. Cela comprend le respect des obligations applicables en vertu de la législation environnementale et sociale et de la législation du travail établies par le droit de l'Union, le droit national et les conventions collectives ou par les dispositions législatives internationales dans le domaine environnemental et social et dans le domaine du travail énumérées à l'annexe X de la directive 2014/24/UE4, ainsi que le respect des obligations en matière de protection des données découlant des règlements (UE) 2016/6795 et (UE) 2018/17256.",0.05128205128205128," Le contractant doit satisfaire aux exigences minimales prévues dans le cahier des charges. Cela comprend le respect des obligations applicables en vertu de la législation environnementale et sociale et de la législation du travail établies par le droit de l'Union, le droit national et les conventions collectives ou par les dispositions législatives internationales dans le domaine environnemental et social et dans le domaine du travail énumérées à l'annexe X de la directive 2014/24/UE4, ainsi que le respect des obligations en matière de protection des données découlant des règlements (UE) 2016/67954, ainsi que le respect des obligations en matière de protection des données découlant des règlements (UE) 2016/6795reference the use of the templates provided in Annex 09 to this
document is mandatory. Only references submitted on these forms will
be considered.
Tenderers who fail to provide a description, or who only provide generic
content, which does not specifically describe the relevance of the
contract reference with regard to the minimum level of capacity
detailed above, will be considered as not having the technical and
professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments,
divisions, directorates, and other entities of a same body (including the
same EU Institution) will be regarded as the same client. Each EU
Institution (including an EU agency) is considered a different client.
Under a framework contract (or framework contracts) with different
specific contracts, a specific contract (alone or in combination with
other specific contracts) can be used only once (i.e. it will be considered
as a single reference). In case of a joint tender, the same reference
contract cannot be submitted as a separate contract reference by
different economic operators for the same tender.
The Contracting Authority may request statements issued by the
clients, public or private, as supporting documents for each contract
reference. These documents should be ready to be provided within five
working days of the Contracting Authority’s request. The contact
persons for the customers indicated in the contract reference form may
be contacted in the context of this call for tenders to crosscheck the
validity of the information pro",0.0439621591541458,"(and in any case no more than 20) contract references. Evidence must be provided in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in Annex 09 to this document is mandatory. Only references submitted on these forms will be considered.
Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client. Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender.
The Contracting Authority may request statements issued by the clients, public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority's request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as evid",0.04006677796327212,"imum 10 (and in any case no more than 20) contract references**. Evidence must be provided in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in **Annex 09** to this document is mandatory. Only references submitted on these forms will be considered.
Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client.
Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender.
The Contracting Authority may request **statements issued by the clients**, public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority’s request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as e",0.03672787979966611,"minimum 10 (and in any case no more than 20) contract references**. Evidence must be provided in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in **Annex 09** to this document is mandatory. Only references submitted on these forms will be considered.
Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client. Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender.
The Contracting Authority may request **statements issued by the clients**, public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority's request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as e",0.11352253756260434,". Evidence must be provided in the
form of a filled-in contract reference per project. For each contract
reference the use of the templates provided in**Annex 09** to this
document is mandatory. Only references submitted on these forms will
be considered.
Tenderers who fail to provide a description, or who only provide generic
content, which does not specifically describe the relevance of the
contract reference with regard to the minimum level of capacity
detailed above, will be considered as not having the technical and
professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments,
divisions, directorates, and other entities of a same body (including the
same EU Institution) will be regarded as the same client. Each EU
Institution (including an EU agency) is considered a different client.
Under a framework contract (or framework contracts) with different
specific contracts, a specific contract (alone or in combination with
other specific contracts) can be used only once (i.e. it will be considered
as a single reference). In case of a joint tender, the same reference
contract cannot be submitted as a separate contract reference by
different economic operators for the same tender.
The Contracting Authority may request**statements issued by the**
**clients**, public or private, as supporting documents for each contract
reference. These documents should be ready to be provided within five
working days of the Contracting Authority’s request. The contact
persons for the customers indicated in the contract reference form may
be contacted in the context of this call for tenders to crosscheck the
validity of the information provided as evidence",0.0038953811908736783,"nderers must provide minimum 10 (and in any case no more than 20) contract references . Evidence must be provided in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in Annex 09 to this document is mandatory. Only references submitted on these forms will be considered. Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract. The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client. Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender. The Contracting Authority may request statements issued by the clients , public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority 's request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as evidence",0.0038953811908736783,"nderers must provide minimum 10 (and in any case no more than 20) contract references . Evidence must be provided in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in Annex 09 to this document is mandatory. Only references submitted on these forms will be considered. Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract. The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client. Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender. The Contracting Authority may request statements issued by the clients , public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority 's request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as evidence",64,govt tenders
-64,1,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",False,0.09216589861751152," consolidated assessment of the tenderer as a whole (including, if
applicable, all members of a joint tender and/or other entities on which
the tenderer relies to fulfil this selection criterion) will be car",0.0,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",0.0,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",0.0,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",0.06451612903225806,"nsolidated assessment of the tenderer as a whole (including, if
applicable, all members of a joint tender and/or other entities on which
the tenderer relies to fulfilthis selection criterion) willbe carried out.",0.0,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",0.0,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",64,govt tenders
-64,2,Capacity to deliver within a quality and security framework in compliance with relevant ISO standards,False,0.09900990099009901,ity to deliver within a quality and security framework in compliance with
relevant ISO standards,0.0,Capacity to deliver within a quality and security framework in compliance with relevant ISO standards,0.0,Capacity to deliver within a quality and security framework in compliance with relevant ISO standards,0.0,Capacity to deliver within a quality and security framework in compliance with relevant ISO standards,0.0,Capacity to deliver within a quality and security framework in compliance with relevant ISO standards,0.0,Capacity to deliver within a quality and security framework in compliance with relevant ISO standards,0.0,Capacity to deliver within a quality and security framework in compliance with relevant ISO standards,64,govt tenders
-64,3,The tenderer must be certified in the following ISO standards in the areas covered by this call for tenders: • T 2.1: ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that will be used by,False,0.17647058823529413, must be certified in the following ISO standards in the
areas covered by this call for tenders:
• T 2.1: ISO 9001:2015 or equivalent (specify): for all the parts
of the organisation(s) and all location(s) that will b,0.15126050420168066,er must be certified in the following ISO standards in the areas covered by this call for tenders:
- T 2.1: ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that will be ,0.12184873949579832, tenderer must be certified in the following ISO standards in the areas covered by this call for tenders:
- **T 2.1: ISO 9001:2015** or equivalent (specify): for all the parts of the organisation(s) and all location(s) that will ,0.1134453781512605,enderer must be certified in the following ISO standards in the areas covered by this call for tenders:
• **T 2.1**: ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that will be,0.29411764705882354," certified in the following ISO standards in the **level of** areas covered by this call for tenders:
-
-**capacity**
-
-• **T 2.1** : ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that ",0.008403361344537815,The tenderer must be certified in the following ISO standards in the areas covered by this call for tenders: • T 2.1 : ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that will be used b,0.008403361344537815,The tenderer must be certified in the following ISO standards in the areas covered by this call for tenders: • T 2.1 : ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that will be used b,64,govt tenders
-65,1," The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption. For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.",False,0.006640106241699867,"The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.
-",0.00398406374501992," The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.",0.010624169986719787,"e European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
->
-> For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.",0.010624169986719787," The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
->
-> For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from V",0.005312084993359893,"The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.",0.1049136786188579,"opean Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the Euro",0.1049136786188579,"opean Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the Euro",65,govt tenders
-66,0,"There are two objectives. The lower magnification objective has a greater depth of field and view. p In order to observe the specimen easily use the lower magnification objective first. Then, by rotating the case, the magnification can be changed. CHANGING THE INTERPUPILLARY DISTANCE The distance between the observer's pupils is the interpupillary distance. p p p p y To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece. FOCUSING Remove the lens protective cover. p 2. Place the specimen on the working stage. g 3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp. g pp p 4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear. CHANGING THE BULB 1. Disconnect the power cord. p 2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap. g p 3. Replace with a new halogen bulb. p g 4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.",False,0.12984670874661858,"ectives. The lower magnification objective has a greater depth of field and view.
-
-2. In order to observe the specimen
-easily use the lower magnification
-objective first. Then, by rotating the
-case, the magnification can be
- changed.
-
-## CHANGING THE INTERPUPILLARY
-DISTANCE
-
-1. The distance between the observer's pupils is the interpupillary distance.
-
-2. To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece.
-
-## FOCUSING
-
-1. Remove the lens protective cover.
-
-2. Place the specimen on the working
- stage.
-
-3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp.
-
-4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-## CHANGING THE BULB
-
-1. Disconnect the power cord.
-
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-
-3. Replace with a new halogen bulb.
-
-3. Make sure that both the images in
-
-4. Open the window in the base plate and
-replace the halogen lamp or
-fluorescent lamp of",0.061316501352569885,". There are two objectives. The lower magnification objective has a greater depth of field and view.
-2. In order to observe the specimen easily use the lower magnification objective first. Then, by rotating the case, the magnification can be changed.
-
-### CHANGING THE INTERPUPILLARY DISTANCE
-
-1. The distance between the observer's pupils is the interpupillary distance.
-2. To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece.
-
-### FOCUSING
-
-1. Remove the lens protective cover.
-2. Place the specimen on the working stage.
-3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp.
-4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-### CHANGING THE BULB
-
-1. Disconnect the power cord.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-",0.061316501352569885,"1. There are two objectives. The lower magnification objective has a greater depth of field and view.
-2. In order to observe the specimen easily use the lower magnification objective first. Then, by rotating the case, the magnification can be changed.
-
-### CHANGING THE INTERPUPILLARY DISTANCE
-1. The distance between the observer's pupils is the interpupillary distance.
-2. To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece.
-
-### FOCUSING
-1. Remove the lens protective cover.
-2. Place the specimen on the working stage.
-3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp.
-4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-### CHANGING THE BULB
-1. Disconnect the power cord.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
--",0.061316501352569885,"
-1. There are two objectives. The lower magnification objective has a greater depth of field and view.
-2. In order to observe the specimen easily use the lower magnification objective first. Then, by rotating the case, the magnification can be changed.
-
-### CHANGING THE INTERPUPILLARY DISTANCE
-1. The distance between the observer's pupils is the interpupillary distance.
-2. To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece.
-
-### FOCUSING
-1. Remove the lens protective cover.
-2. Place the specimen on the working stage.
-3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp.
-4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-### CHANGING THE BULB
-1. Disconnect the power cord.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
-",0.7114517583408476,"that you focus at the lowest
-
-- 1. The distance between the observer's
-
- - magnification, then move to a higher magnification and re-focus as
-
-- pupils is the interpupillary distance.
-
-- 2. To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece.
-
-- necessary.
-
-- 3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment.
-
-at the same time, the diopter ring may
-
-## **FOCUSING**
-
-## **DIOPTER RING ADJUSTMENT**
-
-- 1. Remove the lens protective cover.
-
- - 1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
-
-- 2. Place the specimen on the working stage.
-
-- 3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp. 4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-- a. Observe an image through the left eyepiece and bring a specific point
-
-- into focus using the focus knob.",0.061316501352569885,"
-1. There are two objectives. The lower magnification objective has a greater depth of field and view.
-2. In order to observe the specimen easily use the lower magnification objective first. Then, by rotating the case, the magnification can be changed.
-
-## CHANGING THE INTERPUPILLARY DISTANCE
-
-1. The distance between the observer's pupils is the interpupillary distance.
-2. To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece.
-
-## FOCUSING
-
-1. Remove the lens protective cover.
-2. Place the specimen on the working stage.
-3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp.
-4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-## CHANGING THE BULB
-
-1. Disconnect the power cord.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
-",0.061316501352569885,"
-1. There are two objectives. The lower magnification objective has a greater depth of field and view.
-2. In order to observe the specimen easily use the lower magnification objective first. Then, by rotating the case, the magnification can be changed.
-
-## CHANGING THE INTERPUPILLARY DISTANCE
-
-1. The distance between the observer's pupils is the interpupillary distance.
-2. To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece.
-
-## FOCUSING
-
-1. Remove the lens protective cover.
-2. Place the specimen on the working stage.
-3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp.
-4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-## CHANGING THE BULB
-
-1. Disconnect the power cord.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
-",66,manuals_sample
-66,1,"1. Turn the focusing knob away or toward you until a clear image is viewed. y g 2. If the image is unclear, adjust the height of the elevator up or down, then turn the focusing knob again. ZOOM MAGNIFICATION 1. Turn the zoom magnification knob to the desired magnification and field of view. 2. In most situations, it is recommended that you focus at the lowest magnification, then move to a higher magnification and re-focus as necessary. y 3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment. DIOPTER RING ADJUSTMENT 1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps: p a. Observe an image through the left eyepiece and bring a specific point into focus using the focus knob. g b. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp focus. c.Then bring the same point into focus through the right eyepiece by turning the right diopter ring. y g g p g d.With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that setting.",False,0.042984590429845905,"urn the focusing knob away or toward you until a clear image is viewed.
-
-2. If the image is unclear, adjust the height of the elevator up or down, then turn the focusing knob again.
-
-## ZOOM MAGNIFICATION
-
-1. Turn the zoom magnification knob to
-the desired magnification and field of
- view.
-
-2. In most situations, it is recommended
-that you focus at the lowest
-magnification, then move to a higher
-magnification and re-focus as
- necessary.
-
-3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment.
-
-## DIOPTER RING ADJUSTMENT
-
-1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
-
-a. Observe an image through the left eyepiece and bring a specific point into focus using the focus knob.
-
-b. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp
-
-focus.
-
-- c.Then bring the same point into focus through the right eyepiece by turning the right diopter ring.
-
-- d.With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that setting.",0.039740470397404706,"rn the focusing knob away or toward you until a clear image is viewed.
-2. If the image is unclear, adjust the height of the elevator up or down, then turn the focusing knob again.
-
-### ZOOM MAGNIFICATION
-
-1. Turn the zoom magnification knob to the desired magnification and field of view.
-2. In most situations, it is recommended that you focus at the lowest magnification, then move to a higher magnification and re-focus as necessary.
-3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment.
-
-### DIOPTER RING ADJUSTMENT
-
-1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
- 1. Observe an image through the left eyepiece and bring a specific point into focus using the focus knob.
- 2. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp focus.
- 3. Then bring the same point into focus through the right eyepiece by turning the right diopter ring.
- 4. With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that setting",0.038929440389294405,"Turn the focusing knob away or toward you until a clear image is viewed.
-2. If the image is unclear, adjust the height of the elevator up or down, then turn the focusing knob again.
-
-### ZOOM MAGNIFICATION
-1. Turn the zoom magnification knob to the desired magnification and field of view.
-2. In most situations, it is recommended that you focus at the lowest magnification, then move to a higher magnification and re-focus as necessary.
-3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment.
-
-### DIOPTER RING ADJUSTMENT
-1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
- a. Observe an image through the left eyepiece and bring a specific point into focus using the focus knob.
- b. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp focus.
- c. Then bring the same point into focus through the right eyepiece by turning the right diopter ring.
- d. With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that set",0.0340632603406326," Turn the focusing knob away or toward you until a clear image is viewed.
-2. If the image is unclear, adjust the height of the elevator up or down, then turn the focusing knob again.
-
-### ZOOM MAGNIFICATION
-1. Turn the zoom magnification knob to the desired magnification and field of view.
-2. In most situations, it is recommended that you focus at the lowest magnification, then move to a higher magnification and re-focus as necessary.
-3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment.
-
-### DIOPTER RING ADJUSTMENT
-1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
- a. Observe an image through the left eyepiece and bring a specific point into focus using the focus knob.
- b. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp focus.
- c. Then bring the same point into focus through the right eyepiece by turning the right diopter ring.
- d. With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that settin",0.537712895377129,"e time, the diopter ring may need adjustment.
-
-at the same time, the diopter ring may
-
-## **FOCUSING**
-
-## **DIOPTER RING ADJUSTMENT**
-
-- 1. Remove the lens protective cover.
-
- - 1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
-
-- 2. Place the specimen on the working stage.
-
-- 3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp. 4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-- a. Observe an image through the left eyepiece and bring a specific point
-
-- into focus using the focus knob.
-
-- b. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp focus.
-
-## **CHANGING THE BULB**
-
-- 1. Disconnect the power cord.
-
-- 2. When the bulb is cool, remove the
-
- - c.Then bring the same point into focus through the right eyepiece by turning the right diopter ring. d.With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that setting. ",0.030819140308191405,"1. Turn the focusing knob away or toward you until a clear image is viewed.
-2. If the image is unclear, adjust the height of the elevator up or down, then turn the focusing knob again.
-
-## ZOOM MAGNIFICATION
-
-1. Turn the zoom magnification knob to the desired magnification and field of view.
-2. In most situations, it is recommended that you focus at the lowest magnification, then move to a higher magnification and re-focus as necessary.
-3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment.
-
-## DIOPTER RING ADJUSTMENT
-
-1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
-- a. Observe an image through the left eyepiece and bring a specific point into focus using the focus knob.
-- b. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp focus.
-4. c.Then bring the same point into focus through the right eyepiece by turning the right diopter ring.
-5. d.With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that setting.",0.030819140308191405,"1. Turn the focusing knob away or toward you until a clear image is viewed.
-2. If the image is unclear, adjust the height of the elevator up or down, then turn the focusing knob again.
-
-## ZOOM MAGNIFICATION
-
-1. Turn the zoom magnification knob to the desired magnification and field of view.
-2. In most situations, it is recommended that you focus at the lowest magnification, then move to a higher magnification and re-focus as necessary.
-3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment.
-
-## DIOPTER RING ADJUSTMENT
-
-1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
-- a. Observe an image through the left eyepiece and bring a specific point into focus using the focus knob.
-- b. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp focus.
-4. c.Then bring the same point into focus through the right eyepiece by turning the right diopter ring.
-5. d.With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that setting.",66,manuals_sample
-66,2,"USING THE VERTICAL TUBE - MODELS AY11230/11234 1. The vertical tube can be used for instructional viewing or to photograph the image with a digital camera or a micro TV unit 2. Loosen the retention screw, then rotate the adjustment ring to change the length of the vertical tube. 3. Make sure that both the images in",False,0.13924050632911392,".
-
-## USING THE VERTICAL TUBE -
-MODELS AY11230/11234
-
-1. The vertical tube can be used for instructional viewing or to photograph the image with a digital camera or a micro TV unit
-
-2. Loosen the retention screw, then rotate the adjustment ring to change the length of the vertical tube.
-
-## Model AY11234
-
-## FOCUSI",0.015822784810126583,"SING THE VERTICAL TUBE - MODELS AY11230/11234
-
-1. The vertical tube can be used for instructional viewing or to photograph the image with a digital camera or a micro TV unit
-2. Loosen the retention screw, then rotate the adjustment ring to change the length of the vertical tube.
-3. Make sure that both the images in",0.022151898734177215,"SING THE VERTICAL TUBE - MODELS AY11230/11234
-
-1. The vertical tube can be used for instructional viewing or to photograph the image with a digital camera or a micro TV unit.
-2. Loosen the retention screw, then rotate the adjustment ring to change the length of the vertical tube.
-3. Make sure that both the images i",0.00949367088607595,"USING THE VERTICAL TUBE - MODELS AY11230/11234
-1. The vertical tube can be used for instructional viewing or to photograph the image with a digital camera or a micro TV unit
-2. Loosen the retention screw, then rotate the adjustment ring to change the length of the vertical tube.
-3. Make sure that both the images in",0.509493670886076,"l outlet.
-
-- 1. The vertical tube can be used for instructional viewing or to photograph
-
-- the image with a digital camera or a micro TV unit
-
-- 2. When the bulb is cool, remove the
-
-- oblique illuminator cap and remove the halogen bulb with cap.
-
-2. Loosen the retention screw, then rotate the adjustment ring",0.022151898734177215,"USING THE VERTICAL TUBE MODELS AY11230/11234
-
-1. The vertical tube can be used for instructional viewing or to photograph the image with a digital camera or a micro TV unit
-2. Loosen the retention screw, then rotate the adjustment ring to change the length of the vertical tube.
-3. Make sure that both the images in
-",0.022151898734177215,"USING THE VERTICAL TUBE MODELS AY11230/11234
-
-1. The vertical tube can be used for instructional viewing or to photograph the image with a digital camera or a micro TV unit
-2. Loosen the retention screw, then rotate the adjustment ring to change the length of the vertical tube.
-3. Make sure that both the images in
-",66,manuals_sample
-66,3,"CHANGING THE BULB 1. Disconnect the power cord from the electrical outlet. 2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap. g p 3. Replace with a new halogen bulb. p g 4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.",False,0.0634441087613293,"## CHANGING THE BULB
-
-1. Disconnect the power cord from the
-electrical outlet.
-
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-
-3. Replace with a new halogen bulb.
-
-4. Open the window in the base plate
-and replace the halogen lamp or
-fluorescent lamp of transmitted
- illuminator.",0.06042296072507553,".
-
-### CHANGING THE BULB
-
-1. Disconnect the power cord from the electrical outlet.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.",0.06042296072507553," CHANGING THE BULB
-1. Disconnect the power cord from the electrical outlet.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
----
-
-",0.06042296072507553,"
-
-### CHANGING THE BULB
-1. Disconnect the power cord from the electrical outlet.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
-",0.3081570996978852,"for the left and right eyepieces, then before viewing set the diopter ring adjustments to that setting.
-
-- oblique illuminator cap and remove the halogen bulb with cap.
-
-- 3. Replace with a new halogen bulb.
-
-- 4. Open the window in the base plate and
-
-- replace the halogen lamp or fluorescent lamp of transmitted illuminator.",0.06042296072507553,"
-## CHANGING THE BULB
-
-1. Disconnect the power cord from the electrical outlet.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
-<",0.06042296072507553,"
-## CHANGING THE BULB
-
-1. Disconnect the power cord from the electrical outlet.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
-<",66,manuals_sample
-66,4,MICROSCOPE USAGE BARSKA Model AY11236 is a powerful fixed power compound microscope designed for biological studies such as specimen examination. It can also be used for examining bacteria and for general clinical and medical studies and other scientific uses.,False,0.011538461538461539,"ICROSCOPE USAGE
-
-BARSKA Model AY11236 is a powerful fixed power compound microscope designed for biological studies such as specimen examination. It can also be used for examining bacteria and for general clinical and medical studies and other scientific uses.",0.011538461538461539,"ICROSCOPE USAGE
-
-BARSKA Model AY11236 is a powerful fixed power compound microscope designed for biological studies such as specimen examination. It can also be used for examining bacteria and for general clinical and medical studies and other scientific uses.",0.011538461538461539,"MICROSCOPE USAGE
-
-BARSKA Model AY11236 is a powerful fixed power compound microscope designed for biological studies such as specimen examination. It can also be used for examining bacteria and for general clinical and medical studies and other scientific uses",0.011538461538461539,"MICROSCOPE USAGE
-
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-BARSKA Model AY11236 is a powerful fixed power compound microscope designed for biological studies such as specimen examination. It can also be used for examining bacteria and for general clinical and medical studies and other scientific uses",66,manuals_sample
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-BARSKA Model AY11236 is a fixed power compound microscope. It is constructed with two optical paths at the same angle. It is equipped with transmitted illumination. By using this instrument, the user can observe specimens at magnification from 40x to 1000x by selecting the desired objective lens. Coarse and fine focus adjustments provide accuracy and image detail. The rotating head allows the user to position the eyepieces for maximum viewing comfort and easy access to all adjustment knobs",0.005905511811023622,"CONSTRUCTION
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-BARSKA Model AY11236 is a fixed power compound microscope. It is constructed with two optical paths at the same angle. It is equipped with transmitted illumination. By using this instrument, the user can observe specimens at magnification from 40x to 1000x by selecting the desired objective lens. Coarse and fine focus adjustments provide accuracy and image detail. The rotating head allows the user to position the eyepieces for maximum viewing comfort and easy access to all adjustment knobs",0.005905511811023622,"CONSTRUCTION
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-BARSKA Model AY11236 is a fixed power compound microscope. It is constructed with two optical paths at the same angle. It is equipped with transmitted illumination. By using this instrument, the user can observe specimens at magnification from 40x to 1000x by selecting the desired objective lens. Coarse and fine focus adjustments provide accuracy and image detail. The rotating head allows the user to position the eyepieces for maximum viewing comfort and easy access to all adjustment knobs",0.015748031496062992,"ONSTRUCTION**
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-BARSKA Model AY11236 is a fixed power compound microscope. It is constructed with two optical paths at the same angle. It is equipped with transmitted illumination. By using this instrument, the user can observe specimens at magnification from 40x to 1000x by selecting the desired objective lens. Coarse and fine focus adjustments provide accuracy and image detail. The rotating head allows the user to position the eyepieces for maximum viewing comfort and easy access to all adjustment kno",0.005905511811023622,"CONSTRUCTION
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-BARSKA Model AY11236 is a fixed power compound microscope. It is constructed with two optical paths at the same angle. It is equipped with transmitted illumination. By using this instrument, the user can observe specimens at magnification from 40x to 1000x by selecting the desired objective lens. Coarse and fine focus adjustments provide accuracy and image detail. The rotating head allows the user to position the eyepieces for maximum viewing comfort and easy access to all adjustment knobs",0.005905511811023622,"CONSTRUCTION
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-BARSKA Model AY11236 is a fixed power compound microscope. It is constructed with two optical paths at the same angle. It is equipped with transmitted illumination. By using this instrument, the user can observe specimens at magnification from 40x to 1000x by selecting the desired objective lens. Coarse and fine focus adjustments provide accuracy and image detail. The rotating head allows the user to position the eyepieces for maximum viewing comfort and easy access to all adjustment knobs",66,manuals_sample
-67,0,"Each paragraph should contain one main thought or idea, and there should be a logical link between each paragraph and the next. Make sure that you focus on answering the question – only include relevant information, and remember to present logical arguments in support of your answer.",False,0.02112676056338028,"Each paragraph should contain one main thought or idea, and there should be a logical link between each paragraph and the next.
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-67,3,"10. When you get your assignment back from your tutor: Read through the feedback, and learn from your mistakes. This will help you to prepare for your exams (if you have to write them), as well as to help you achieve better marks in future assignments.",False,0.0,"10. When you get your assignment back from your tutor: Read through the feedback, and learn from your mistakes. This will help you to prepare for your exams (if you have to write them), as well as to help you achieve better marks in future assignments.",0.06349206349206349,"0. When you get your assignment back from your tutor:**
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-67,4,"TYPES OF QUESTIONS THAT YOU WILL FREQUENTLY COME ACROSS IN ASSIGNMENTS In your assignments, you will often be asked to write short paragraphs or longer essays in which you have to “explain” a particular concept, “iden- tify” certain features, or “prove” a certain point. It’s sometimes difficult to figure out exactly what these questions mean -- which is why we are providing you with the following explanations:",False,0.01694915254237288,"TYPES OF QUESTIONS THAT YOU WILL FREQUENTLY COME ACROSS IN ASSIGNMENTS
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-It's sometimes difficult to figure out exactly what these questions mean -- which is why we are providing you with the following explanations:",0.031476997578692496,"TYPES OF QUESTIONS THAT YOU WILL FREQUENTLY COME ACROSS IN ASSIGNMENTS
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-68,1,A copy of your ID Proof of your highest grade passed Proof of any other relevant qualifications you have obtained,False,0.07964601769911504,"py of your ID
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-68,2,"Important Note: If you don't fill in your correct address, we won't be able to deliver your study material. You therefore need to take special care when filling in your address.",True,0.0,"Important Note: If you don't fill in your correct address, we won't be able to deliver your study material. You therefore need to take special care when filling in your address.",0.022598870056497175,"Important Note:** If you don't fill in your correct address, we won't be able to deliver your study material. You therefore need to take special care when filling in your addres",0.03389830508474576,"portant Note:** If you don’t fill in your correct address, we won’t be able to deliver your study material. You therefore need to take special care when filling in your address.",0.022598870056497175,"Important Note:** If you don't fill in your correct address, we won't be able to deliver your study material. You therefore need to take special care when filling in your addres",0.768361581920904,"py of your ID
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-70,0,"environment. The Master, Infrastructure and Compute Roles are deployed to a single node (Figure 6-1).",False,0.0,"environment. The Master, Infrastructure and Compute Roles are deployed to a single node (Figure 6-1).",0.0,"environment. The Master, Infrastructure and Compute Roles are deployed to a single node (Figure 6-1).",0.0,"environment. The Master, Infrastructure and Compute Roles are deployed to a single node (Figure 6-1).",0.0,"environment. The Master, Infrastructure and Compute Roles are deployed to a single node (Figure 6-1).",0.0,"environment. The Master, Infrastructure and Compute Roles are deployed to a single node (Figure 6-1).",0.6039603960396039,"le and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the ",0.6039603960396039,"le and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the ",70,manuals_sample
-70,1,"Seven nodes deployment is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2).",False,0.0,"Seven nodes deployment is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2).",0.015748031496062992,"Seven nodes deployment** is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2",0.015748031496062992,"even nodes deployment** is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2)",0.015748031496062992,"Seven nodes deployment** is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2",0.015748031496062992,"even nodes deployment** is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2)",0.0,"Seven nodes deployment is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2).",0.0,"Seven nodes deployment is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2).",70,manuals_sample
-71,0,"By right-clicking and selecting Properties, you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure 5-30.",False,0.0,"By right-clicking and selecting Properties, you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure 5-30.",0.04419889502762431,"right-clicking and selecting **Properties**, you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure 5-30",0.04419889502762431,"By right-clicking and selecting **Properties**, you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure 5",0.04419889502762431,"ight-clicking and selecting **Properties**, you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure 5-30.",0.055248618784530384,"By right-clicking and selecting **Properties** , you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure ",0.011049723756906077,"By right-clicking and selecting Properties , you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure 5-30",0.011049723756906077,"By right-clicking and selecting Properties , you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure 5-30",71,manuals_sample
-71,1,"In an environment with multiple IBM Storwize V7000 clusters, you can easily direct the onsite personnel or technician to the correct device by enabling the identification LED on the front pane. Click Turn Identify On in the menu that is shown in Figure 5-31. Wait for confirmation from the technician that the device in the data center was correctly identified. In the GUI, you see a flashing light, which indicates that the Identify LED was turned on.",False,0.3495575221238938,"ion
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-72,0,Approve/Approve of To “approve” something is to give consent. E.g. The director approved the budget. To “approve of” something is to express a favourable opinion about it. E.g. The mother did not approve of the way her daughter was dressed for the school dance.,False,0.034482758620689655,"Approve/Approve of
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-72,1,Borrow/Lend To “borrow” something is to take it with the intention of giving it back. E.g. He borrowed the book from his colleague. To “lend” something is to give it to someone with the expectation that they will give it back. E.g. She is lending the car to him so that he can drive to work today.,False,0.030303030303030304,"row/Lend
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-To “borrow” something is to take it with the intention of giving it back.
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-To ""borrow"" something is to take it with the intention of giving it back.
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-To ""lend"" something is to give it to someone with the expectation that they will give it back.
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-To “borrow” something is to take it with the intention of giving it back. E.g. He borrowed the book from his colleague.
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-To “lend” something is to give it to someone with the expectation that they will give it back. E.g. She is lending the car to him so that he can drive to work t",0.03367003367003367,"orrow/Lend
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-To 'borrow' something is to take it with the intention of giving it back. E.g. He borrowed the book from his colleague.
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-To 'lend' something is to give it to someone with the expectation that they will give it back. E.g. She is lending the car to him so that he can drive to work today",72,manuals_sample
-72,2,Compliment/Complement You “compliment” someone when you make a favourable comment about them. E.g. He complimented her by telling her that she was a good writer. You “complement” something (or someone) when you add something else to it that suits or fits it well. E.g.That scarf complements her dress.,False,0.046511627906976744,"liment/Complement
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-You “compliment” someone when you make a favourable comment about them.
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-E.g. He complimented her by telling her that she was a good writer.
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-E.g. That scarf complements her dress",0.046511627906976744,"mpliment/Complement
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-You “compliment” someone when you make a favourable comment about them.
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-E.g. He complimented her by telling her that she was a good writer.
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-You “complement” something (or someone) when you add something else to it that suits or fits it well.
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-E.g. That scarf complements her dre",0.053156146179401995,"mpliment/Complement
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-You “compliment” someone when you make a favourable comment about them.
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-You “complement” something (or someone) when you add something else to it that suits or fits it well.
-E.g. That scarf complements her d",0.046511627906976744,"pliment/Complement
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-You ""compliment"" someone when you make a favourable comment about them.
-E.g. He complimented her by telling her that she was a good writer.
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-You ""complement"" something (or someone) when you add something else to it that suits or fits it well.
-E.g. That scarf complements her dress.",0.059800664451827246,"ent/Complement**
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-You “compliment” someone when you make a favourable comment about them.
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-E.g. He complimented her by telling her that she was a good writer.
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-You 'compliment' someone when you make a favourable comment about them. E.g. He complimented her by telling her that she was a good writer.
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-You 'complement' something (or someone) when you add something else to it that suits or fits it well. E.g. That scarf complements her dress.",0.03986710963455149,"pliment/Complement
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-You 'compliment' someone when you make a favourable comment about them. E.g. He complimented her by telling her that she was a good writer.
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-You 'complement' something (or someone) when you add something else to it that suits or fits it well. E.g. That scarf complements her dress.",72,manuals_sample
-73,0,STEP 4 – PAY YOUR REGISTRATION FEE AND SEND IN OU YOUR FORM,False,0.1016949152542373,"# STEP 4 – PAY YOUR REGISTRATION FEE AND SEND IN YOUR FORM
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-73,1,"Different courses have different registration fees. Please check the course fees list (www.oxbridgeacademy.co.za/Documents/ Price-list-2015.pdf) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment. If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees.",False,0.003911342894393742,"Different courses have different registration fees. Please check the course fees list (www.oxbridgeacademy.co.za/Documents/ Price-list-2015.pdf) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
-
-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees",0.10430247718383312,"he course fees list ([www.oxbridgeacademy.co.za/Documents/Price-list-2015.pdf](http://www.oxbridgeacademy.co.za/Documents/Price-list-2015.pdf)) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
-
-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees.",0.003911342894393742,"ifferent courses have different registration fees. Please check the course fees list (www.oxbridgeacademy.co.za/Documents/ Price-list-2015.pdf) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees.",0.003911342894393742,"Different courses have different registration fees. Please check the course fees list (www.oxbridgeacademy.co.za/Documents/ Price-list-2015.pdf) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees",0.007822685788787484,"ferent courses have different registration fees. Please check the course fees list (www.oxbridgeacademy.co.za/Documents/ Price-list-2015.pdf) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees.",0.00651890482398957,"fferent courses have different registration fees. Please check the course fees list (www.oxbridgeacademy.co.za/Documents/ Price-list-2015.pdf) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees.",0.00651890482398957,"Different courses have different registration fees. Please check the course fees list (www.oxbridgeacademy.co.za/Documents/ Price-list-2015.pdf) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fee",73,manuals_sample
-73,2,"Registration fee payable upon registration either by cheque, postal order, bank deposit, electronic transfer or ATM deposit. Enclose the registration fee when submitting this form and we will send you a Welcome Pack that includes your 1st Study Unit, Success Study Guide and Student card. International students will be required to pay a deposit of R2400.",True,0.0,"Registration fee payable upon registration either by cheque, postal order, bank deposit, electronic transfer or ATM deposit. Enclose the registration fee when submitting this form and we will send you a Welcome Pack that includes your 1st Study Unit, Success Study Guide and Student card. International students will be required to pay a deposit of R2400.",0.0,"Registration fee payable upon registration either by cheque, postal order, bank deposit, electronic transfer or ATM deposit. Enclose the registration fee when submitting this form and we will send you a Welcome Pack that includes your 1st Study Unit, Success Study Guide and Student card. International students will be required to pay a deposit of R2400.",0.0,"Registration fee payable upon registration either by cheque, postal order, bank deposit, electronic transfer or ATM deposit. Enclose the registration fee when submitting this form and we will send you a Welcome Pack that includes your 1st Study Unit, Success Study Guide and Student card. International students will be required to pay a deposit of R2400.",0.0,"Registration fee payable upon registration either by cheque, postal order, bank deposit, electronic transfer or ATM deposit. Enclose the registration fee when submitting this form and we will send you a Welcome Pack that includes your 1st Study Unit, Success Study Guide and Student card. International students will be required to pay a deposit of R2400.",0.7549295774647887,"out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration wi",0.7577464788732394," out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration wi",0.11549295774647887,"
-Registration feepayableuponregistraton eitherby cheque,postalorder,bank deposit,electronic transferorATM deposit Endlose the registration fee when submitting this form and we will sendyoua Welcome Pack thatincludesyour IstStudy Unit, Success Study Guide and Student card. Intemational students willbe required to pay a deposit of R2400.
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-Attach proof ofp",73,manuals_sample
-73,3,"If you need help with your studies, read our blog post:",True,0.03636363636363636,"If you need help
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-74,0,3. Create the A → C relationship (or the B → C relationship).,False,0.0,3. Create the A → C relationship (or the B → C relationship).,0.36065573770491804,e $A \to C$ relationship (or the $B \to C$ relationship).,0.0,3. Create the A → C relationship (or the B → C relationship).,0.03278688524590164,3. Create the A ⇒ C relationship (or the B ⇒ C relationship).,0.0,3. Create the A → C relationship (or the B → C relationship).,0.0,3. Create the A → C relationship (or the B → C relationship).,0.0,3. Create the A → C relationship (or the B → C relationship).,74,manuals_sample
-74,1,"4. Synchronize to system C, and ensure that A → C is established: – A → B, A → C, A → D, B → C, B → D, and C → D – A → B, A → C, and B → C Figure 11-84 shows an example of a triangle topology (A → B, A → C, and B → C). Figure 11-84 Triangle topology",False,0.37349397590361444,"he B → C relationship).
-
-4. Synchronize to system C, and ensure that A → C is established: A-BA-C, A. & D. B → C, B D, and C and B → C
-
-Figure 11-84 shows an example of a triangle topology (A → B, A → C, and B →C).
-
-Triangle topology diagram with no",0.5261044176706827,". Synchronize to system C, and ensure that $A \to C$ is established:
-
-$A \to B$ , $A \to C$ , $A \to D$ , $B \to C$ , $B \to D$ , and $C \to D$
- $A \to B$ , $A \to C$ , and $B \to C$
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-Figure 11-84 shows an example of a triangle topology ",0.10441767068273092,"ronize to system C, and ensure that A → C is established:
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- - A → B, A → C, and B → C
-
-Figure 11-84 shows an example of a triangle topology (A → B, A → C, and B → C).
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-
-
-Monday-Friday 8:30AM-5:30PM PST
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-**NOTE:** This warranty is valid to U.S.A. customers who have purchased this product from an authorized BARSKA dealer in the ",0.025108493490390578,"nts your microscope to be free from defects in materials and workmanship for one (1) year. BARSKA will repair or replace such product or part thereof which, upon inspection by BARSKA, is found to be defective in materials or workmanship. As a condition to the obligation of BARSKA to repair or replace such product, the product must be returned to BARSKA together with proof-of-purchase satisfactory to BARSKA.
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-The Proper Return Merchandise Authorization Number (RMA) must be obtained from BARSKA in advance of return. Call BARSKA at (909) 445-8168 to receive the number to be displayed on the outside of your shipping container.
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-The customer shall be responsible for all costs of transportation and insurance, both to and from BARSKA, and shall be required to prepay such costs.
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-BARSKA shall use reasonable efforts to repair or replace any microscope covered by this warranty within thirty days of receipt. In the event repair or replacement shall require more than thirty days, BARSKA shall notify the customer accordingly. BARSKA reserves the right to replace any product which has been discontinued from its product line with a new product of comparable value and function.
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-This warranty shall be void and of no force of effect in the event a covered product has been modified in design or function, or subjected to abuse, misuse, mishandling or unauthorized repair. Further, product malfunction or deterioration due to normal wear is not covered by this warranty.
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-> BARSKA DISCLAIMS ANY WARRANTIES, EXPRESS OR IMPLIED, WHETHER OF MERCHANTABILITY OF FITNESS FOR A PARTICULAR USE, EXCEPT AS EXPRESSLY SET FORTH HEREIN. THE SOLE OBLIGATION OF BARSKA UNDER THIS LIMITED WARRANTY SHALL BE TO REPAIR OR REPLACE THE COVERED PRODUCT, IN ACCORDANCE WITH THE TERMS SET FORTH HEREIN. BARSKA EXPRESSLY DISCLAIMS ANY LOST PROFITS, GENERAL, SPECIAL, INDIRECT OR CONSEQUENTIAL DAMAGES WHICH MAY RESULT FROM BREACH OF ANY WARRANTY, OR ARISING OUT OF THE USE OR INABILITY TO USE ANY BARSKA PRODUCT. ANY WARRANTIES WHICH ARE IMPLIED AND WHICH CANNOT BE DISCLAIMED SHALL BE LIMITED IN DURATION TO A TERM OF ONE YEAR FROM THE DATE OF ORIGINAL RETAIL PURCHASE.
-
-Some states do not allow the exclusion or limitation of incidental or consequential damages or limitation on how long an implied warranty lasts, so the above limitations and exclusions may not apply to you.
-
-This warranty gives you specific legal rights, and you may also have other rights which vary from state to state.
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-BARSKA reserves the right to modify or discontinue, without prior notice to you, any model or style microscope.
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-If warranty problems arise, or if you need assistance in using your microscope contact:
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-e-mail: service@barska.com
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-**Monday-Friday 8:30AM-5:30PM PST**
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-**NOTE:** This warranty is valid to U.S.A. customers who have purchased this product from an authorized BARSKA dealer in t",0.014879107253564786,"RANTY
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-The Proper Return Merchandise Authorization Number (RMA) must be obtained from BARSKA in advance of return. Call BARSKA at (909) 445-8168 to receive the number to be displayed on the outside of your shipping container.
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-The customer shall be responsible for all costs of transportation and insurance, both to and from BARSKA, and shall be required to prepay such costs.
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-BARSKA shall use reasonable efforts to repair or replace any microscope covered by this warranty within thirty days of receipt. In the event repair or replacement shall require more than thirty days, BARSKA shall notify the customer accordingly. BARSKA reserves the right to replace any product which has been discontinued from its product line with a new product of comparable value and function.
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-BARSKA DISCLAIMS ANY WARRANTIES, EXPRESS OR IMPLIED, WHETHER OF MERCHANTABILITY OF FITNESS FOR A PARTICULAR USE, EXCEPT AS EXPRESSLY SET FORTH HEREIN. THE SOLE OBLIGATION OF BARSKA UNDER THIS LIMITED WARRANTY SHALL BE TO REPAIR OR REPLACE THE COVERED PRODUCT, IN ACCORDANCE WITH THE TERMS SET FORTH HEREIN. BARSKA EXPRESSLY DISCLAIMS ANY LOST PROFITS, GENERAL, SPECIAL, INDIRECT OR CONSEQUENTIAL DAMAGES WHICH MAY RESULT FROM BREACH OF ANY WARRANTY, OR ARISING OUT OF THE USE OR INABILITY TO USE ANY BARSKA PRODUCT. ANY WARRANTIES WHICH ARE IMPLIED AND WHICH CANNOT BE DISCLAIMED SHALL BE LIMITED IN DURATION TO A TERM OF ONE YEAR FROM THE DATE OF ORIGINAL RETAIL PURCHASE.
-
-Some states do not allow the exclusion or limitation of incidental or consequential damages or limitation on how long an implied warranty lasts, so the above limitations and exclusions may not apply to you.
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-This warranty gives you specific legal rights, and you may also have other rights which vary from state to state.
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-BARSKA reserves the right to modify or discontinue, without prior notice to you, any model or style microscope.
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-
-The customer shall be responsible for all costs of transportation and insurance, both to and from BARSKA, and shall be required to prepay such costs.
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-BARSKA shall use reasonable efforts to repair or replace any microscope covered by this warranty within thirty days of receipt. In the event repair or replacement shall require more than thirty days, BARSKA shall notify the customer accordingly. BARSKA reserves the right to replace any product which has been discontinued from its product line with a new product of comparable value and function.
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-This warranty shall be void and of no force of effect in the event a covered product has been modified in design or function, or subjected to abuse, misuse, mishandling or unauthorized repair. Further, product malfunction or deterioration due to normal wear is not covered by this warranty.
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-BARSKA DISCLAIMS ANY WARRANTIES, EXPRESS OR IMPLIED, WHETHER OF MERCHANTABILITY OF FITNESS FOR A PARTICULAR USE, EXCEPT AS EXPRESSLY SET FORTH HEREIN. THE SOLE OBLIGATION OF BARSKA UNDER THIS LIMITED WARRANTY SHALL BE TO REPAIR OR REPLACE THE COVERED PRODUCT, IN ACCORDANCE WITH THE TERMS SET FORTH HEREIN. BARSKA EXPRESSLY DISCLAIMS ANY LOST PROFITS, GENERAL, SPECIAL, INDIRECT OR CONSEQUENTIAL DAMAGES WHICH MAY RESULT FROM BREACH OF ANY WARRANTY, OR ARISING OUT OF THE USE OR INABILITY TO USE ANY BARSKA PRODUCT. ANY WARRANTIES WHICH ARE IMPLIED AND WHICH CANNOT BE DISCLAIMED SHALL BE LIMITED IN DURATION TO A TERM OF ONE YEAR FROM THE DATE OF ORIGINAL RETAIL PURCHASE.
-
-Some states do not allow the exclusion or limitation of incidental or consequential damages or limitation on how long an implied warranty lasts, so the above limitations and exclusions may not apply to you.
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-This warranty gives you specific legal rights, and you may also have other rights which vary from state to state.
-
-BARSKA reserves the right to modify or discontinue, without prior notice to you, any model or style microscope.
-
-If warranty problems arise, or if you need assistance in using your microscope contact:
-
-BARSKA Customer Service Department Tel. (909) 445-8168 Fax. (909) 445-8169 e-mail: service@barska.com Monday-Friday 8:30AM-5:30PM PST
-
-NOTE: This warranty is valid to U.S.A. customers who have purchased this product from an authorized BARSKA dealer in the",0.0712957222566646," one (1) year. BARSKA will repair or replace such product or part thereof which, upon inspection by BARSKA, is found to be defective in materials or workmanship. As a condition to the obligation of BARSKA to repair or replace such product, the product must be returned to BARSKA together with proof-of-purchase satisfactory to BARSKA.
-
-The Proper Return Merchandise Authorization Number (RMA) must be obtained from BARSKA in advance of return. Call BARSKA at (909) 445-8168 to receive the number to be displayed on the outside of your shipping container.
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-
-The customer shall be responsible for all costs of transportation and insurance, both to and from BARSKA, and shall be required to prepay such costs.
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-BARSKA shall use reasonable efforts to repair or replace any microscope covered by this warranty within thirty days of receipt. In the event repair or replacement shall require more than thirty days, BARSKA shall notify the customer accordingly. BARSKA reserves the right to replace any product which has been discontinued from its product line with a new product of comparable value and function.
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-This warranty shall be void and of no force of effect in the event a covered product has been modified in design or function, or subjected to abuse, misuse, mishandling or unauthorized repair. Further, product malfunction or deterioration due to normal wear is not covered by this warranty.
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-BARSKA DISCLAIMS ANY WARRANTIES, EXPRESS OR IMPLIED, WHETHER OF MERCHANTABILITY OF FITNESS FOR A PARTICULAR USE, EXCEPT AS EXPRESSLY SET FORTH HEREIN. THE SOLE OBLIGATION OF BARSKA UNDER THIS LIMITED WARRANTY SHALL BE TO REPAIR OR REPLACE THE COVERED PRODUCT, IN ACCORDANCE WITH THE TERMS SET FORTH HEREIN. BARSKA EXPRESSLY DISCLAIMS ANY LOST PROFITS, GENERAL, SPECIAL, INDIRECT OR CONSEQUENTIAL DAMAGES WHICH MAY RESULT FROM BREACH OF ANY WARRANTY, OR ARISING OUT OF THE USE OR INABILITY TO USE ANY BARSKA PRODUCT. ANY WARRANTIES WHICH ARE IMPLIED AND WHICH CANNOT BE DISCLAIMED SHALL BE LIMITED IN DURATION TO A TERM OF ONE YEAR FROM THE DATE OF ORIGINAL RETAIL PURCHASE.
-
-Some states do not allow the exclusion or limitation of incidental or consequential damages or limitation on how long an implied warranty lasts, so the above limitations and exclusions may not apply to you.
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-This warranty gives you specific legal rights, and you may also have other rights which vary from state to state.
-
-BARSKA reserves the right to modify or discontinue, without prior notice to you, any model or style microscope.
-
-If warranty problems arise, or if you need assistance in using your microscope contact:
-
-## BARSKA
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-Customer Service Department
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-Tel. (909) 445-8168 Fax. (909) 445-8169 e-mail: service@barska.com
-
-Monday-Friday 8:30AM-5:30PM PST
-
-NOTE: This warranty is valid to U.S.A. customers who have purchased this product from an authorized BARSKA dealer in the U",0.0712957222566646," one (1) year. BARSKA will repair or replace such product or part thereof which, upon inspection by BARSKA, is found to be defective in materials or workmanship. As a condition to the obligation of BARSKA to repair or replace such product, the product must be returned to BARSKA together with proof-of-purchase satisfactory to BARSKA.
-
-The Proper Return Merchandise Authorization Number (RMA) must be obtained from BARSKA in advance of return. Call BARSKA at (909) 445-8168 to receive the number to be displayed on the outside of your shipping container.
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-All returns must be accompanied by a written statement setting forth the name, address, and daytime telephone number of the owner, together with a brief description of any claimed defects. Parts or product for which replacement is made shall become the property of BARSKA.
-
-The customer shall be responsible for all costs of transportation and insurance, both to and from BARSKA, and shall be required to prepay such costs.
-
-BARSKA shall use reasonable efforts to repair or replace any microscope covered by this warranty within thirty days of receipt. In the event repair or replacement shall require more than thirty days, BARSKA shall notify the customer accordingly. BARSKA reserves the right to replace any product which has been discontinued from its product line with a new product of comparable value and function.
-
-This warranty shall be void and of no force of effect in the event a covered product has been modified in design or function, or subjected to abuse, misuse, mishandling or unauthorized repair. Further, product malfunction or deterioration due to normal wear is not covered by this warranty.
-
-BARSKA DISCLAIMS ANY WARRANTIES, EXPRESS OR IMPLIED, WHETHER OF MERCHANTABILITY OF FITNESS FOR A PARTICULAR USE, EXCEPT AS EXPRESSLY SET FORTH HEREIN. THE SOLE OBLIGATION OF BARSKA UNDER THIS LIMITED WARRANTY SHALL BE TO REPAIR OR REPLACE THE COVERED PRODUCT, IN ACCORDANCE WITH THE TERMS SET FORTH HEREIN. BARSKA EXPRESSLY DISCLAIMS ANY LOST PROFITS, GENERAL, SPECIAL, INDIRECT OR CONSEQUENTIAL DAMAGES WHICH MAY RESULT FROM BREACH OF ANY WARRANTY, OR ARISING OUT OF THE USE OR INABILITY TO USE ANY BARSKA PRODUCT. ANY WARRANTIES WHICH ARE IMPLIED AND WHICH CANNOT BE DISCLAIMED SHALL BE LIMITED IN DURATION TO A TERM OF ONE YEAR FROM THE DATE OF ORIGINAL RETAIL PURCHASE.
-
-Some states do not allow the exclusion or limitation of incidental or consequential damages or limitation on how long an implied warranty lasts, so the above limitations and exclusions may not apply to you.
-
-This warranty gives you specific legal rights, and you may also have other rights which vary from state to state.
-
-BARSKA reserves the right to modify or discontinue, without prior notice to you, any model or style microscope.
-
-If warranty problems arise, or if you need assistance in using your microscope contact:
-
-## BARSKA
-
-Customer Service Department
-
-Tel. (909) 445-8168 Fax. (909) 445-8169 e-mail: service@barska.com
-
-Monday-Friday 8:30AM-5:30PM PST
-
-NOTE: This warranty is valid to U.S.A. customers who have purchased this product from an authorized BARSKA dealer in the U",75,manuals_sample
-75,1,"855 Towne Center Drive Pomona, CA 91767 , Tel: 888-666-6769 Fax: 909.445.8169 www.barska.com",False,0.06521739130434782,"
-855 Towne Center Drive Pomona, CA 91767
-Tel: 888-666-6769 Fax: 909.445.8169
-www.barska.com
-",0.08695652173913043,"55 Towne Center Drive Pomona, CA 91767
-Tel: 888-666-6769 Fax: 909.445.8169
-[www.barska.c",0.08695652173913043," Towne Center Drive Pomona, CA 91767
-Tel: 888-666-6769 Fax: 909.445.8169
-[www.barska.com",0.4673913043478261,"5 Towne Center Drive Pomona, CA 91767
-©2015 BARSKA Optics Tel: 888-666-6769 Fax: 909.445.",0.043478260869565216,"855 Towne Center Drive Pomona, CA 91767 Tel: 888-666-6769 Fax: 909.445.8169 **www.barska.com",0.043478260869565216,"
-
-855 Towne Center Drive Pomona, CA 91767 Tel: 888-666-6769 Fax: 909.445.8169 www.barska.com",0.043478260869565216,"
-
-855 Towne Center Drive Pomona, CA 91767 Tel: 888-666-6769 Fax: 909.445.8169 www.barska.com",75,manuals_sample
-75,2,MICROSCOPE USER MANUAL,False,0.045454545454545456,"MICROSCOPE
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-75,3,"MODEL AY11240 40X,100X,400X , , COMPOUND MONOCULAR",False,0.2,"A
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-MODEL AY11240
-40X,100X,400X
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-",0.18,"MODEL AY11240**
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-MODEL AY11240 40X,100X,400X COMPOUND MONOCULAR
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-<",0.16,"
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-<",75,manuals_sample
-76,0,Figure 6-4 Create Pool dialog box,False,0.0,Figure 6-4 Create Pool dialog box,0.0,Figure 6-4 Create Pool dialog box,0.06060606060606061,Figure 6-4: Create Pool dialog bo,0.18181818181818182,gure 6-4** *Create Pool dialog bo,0.12121212121212122,gure 6-4 Create Pool dialog box,0.12121212121212122,Figure 6-4 Create Pool dialog b,0.12121212121212122,Figure 6-4 Create Pool dialog b,76,manuals_sample
-76,1,"Mark the Data Reduction check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool. A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later. If you want to specify a different extent size, you can enable this option by clicking Settings → GUI Preferences → General and checking Advanced pool settings, as shown in Figure 6-5. Figure 6-5 Advanced pool settings",False,0.06666666666666667," the Data Reduction check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool.
-
-A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this option by clicking Settings → GUI Preferences → General and checking Advanced pool settings, as shown in Figure 6-5.
-
-The image shows the ""General"" sett",0.09649122807017543,"Mark the **Data Reduction** check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool.
-
-A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this option by clicking **Settings** → **GUI Preferences** → **General** and checking **Advanced pool settings**, as shown in Figure 6-5.
-
-![Screensh",0.08596491228070176," check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool.
-
-A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this option by clicking **Settings** → **GUI Preferences** → **General** and checking **Advanced pool settings**, as shown in Figure 6-5.
-
-![Figure 6-5: Advanced pool settings]",0.1,"
-Mark the **Data Reduction** check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool.
-
-A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this option by clicking **Settings** ⇒ **GUI Preferences** ⇒ **General** and checking **Advanced pool settings**, as shown in Figure 6-5.
-
-[Screensh",0.1,"rk the **Data Reduction** check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool.
-
-A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this option by clicking **Settings** → **GUI Preferences** → **General** and checking **Advanced pool settings** , as shown in Figure 6-5.
-
-**==> pi",0.02631578947368421,"Mark the Data Reduction check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool.
-
-A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this option by clicking Settings → GUI Preferences → General and checking Advanced pool settings , as shown in Figure 6-5.
-
-Figure 6-5 Advanced pool se",0.02631578947368421,"Mark the Data Reduction check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool.
-
-A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this option by clicking Settings → GUI Preferences → General and checking Advanced pool settings , as shown in Figure 6-5.
-
-Figure 6-5 Advanced pool se",76,manuals_sample
-76,2,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",False,0.0,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",0.0,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",0.0,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",0.0,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",0.0,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",0.0,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",0.0,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",76,manuals_sample
-76,3,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,False,0.0,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,0.8450704225352113,"pg)
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-Screenshot of the 'Settings' menu, showing the 'General' tab selec",0.8028169014084507,summary):** The Settings menu is shown with the General tab selected. T,0.0,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,0.0,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,0.8873239436619719,ction check box to create the Data Reduction Pool. Leaving it unmarked ,0.8873239436619719,ction check box to create the Data Reduction Pool. Leaving it unmarked ,76,manuals_sample
-76,4,"If the physical capacity usage of a data reduction pool exceeds more than 85%, I/O performance can be affected. The system needs 15% of physical capacity available in data reduction pools to ensure that capacity reclamation can be performed efficiently.",True,0.6245059288537549,"cted if the physical capacity usage of a data reduction pool exceeds 85%. The system requires 15% available capacity for efficient reclamation.
-
-Figure 6-4 Create Pool dialog box
-
-Mark the Data Reduction check box to create the Data Reduction Pool. Leav",0.0,"If the physical capacity usage of a data reduction pool exceeds more than 85%, I/O performance can be affected. The system needs 15% of physical capacity available in data reduction pools to ensure that capacity reclamation can be performed efficiently.",0.0,"If the physical capacity usage of a data reduction pool exceeds more than 85%, I/O performance can be affected. The system needs 15% of physical capacity available in data reduction pools to ensure that capacity reclamation can be performed efficiently.",0.0,"If the physical capacity usage of a data reduction pool exceeds more than 85%, I/O performance can be affected. The system needs 15% of physical capacity available in data reduction pools to ensure that capacity reclamation can be performed efficiently.",0.7470355731225297,"g the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this ",0.766798418972332,"l that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent si",0.766798418972332,"l that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent si",76,manuals_sample
-77,0,Insert PivotTable Click here to summarize data using a PivotTable or to insert a PivotChart. PivotTables make it easy to arrange and summarize complicated data and drill down on details.,True,0.10752688172043011,"erbatim):
- - ""Click here to summarize data using a PivotTable or to insert a PivotChart.
- - PivotTables make it easy to arrange and summarize complicated data and drill down on details",0.10752688172043011,tip explains: 'Click here to summarize data using a PivotTable or to insert a PivotChart. PivotTables make it easy to arrange and summarize complicated data and drill down on details.'](,0.7795698924731183,"enshot of the ""Create PivotTable"" dialog box. A red box highlights the section ""Choose where you want the PivotTable report to be placed"", showing two radio button options:
-- **New Works",0.08602150537634409,"text explaining ""Click here to summarize data using a PivotTable or to insert a PivotChart. PivotTables make it easy to arrange and summarize complicated data and drill down on details.""",0.8118279569892473,"se Pi **v** ot Table wi **z** ard in the **D** ata menu. **E** xcel a **s** ow choose ks for the **d** ata source **a** nd suggest **s** Click OK.
-
-**==> picture [60 x 580] intentionall",0.8118279569892473,"e table a o add data in as many ro Rather than A $500. understand t as shown in n the future, ows as you A1:D50, you the data ran n above Slid , set the data think you u ma",0.8118279569892473,"e table a o add data in as many ro Rather than A $500. understand t as shown in n the future, ows as you A1:D50, you the data ran n above Slid , set the data think you u ma",77,manuals_sample
-77,1,"Here, we need to understand the data range. Excel suggests the table as shown in above Slide. If you expect to add data in the future, set the data range to include as many rows as you think you will ever need. Rather than A1:D50, you may want to specify $A$1:$D$500.",True,0.02247191011235955,"
-Here, we need understand the data range. Excel suggests the table as shown in above Slide. If you expect to add data in the future, set the data range to include as many rows as you think you will ever need. Rather than A1:D50, you may want to specify $A$1:$D$500.
-
-",0.0299625468164794,"re, we need to understand the data range. Excel suggests the table as shown in above Slide. If you expect to add data in the future, set the data range to include as many rows as you think you will ever need. Rather than A1:D50, you may want to specify \$A\$1:\$D\$50",0.0,"Here, we need to understand the data range. Excel suggests the table as shown in above Slide. If you expect to add data in the future, set the data range to include as many rows as you think you will ever need. Rather than A1:D50, you may want to specify $A$1:$D$500.",0.0,"Here, we need to understand the data range. Excel suggests the table as shown in above Slide. If you expect to add data in the future, set the data range to include as many rows as you think you will ever need. Rather than A1:D50, you may want to specify $A$1:$D$500.",0.48314606741573035,"Here, w **e** need to **u** nderstand **t** he data ra **n** suggests the table **a** s shown i **n** above Sli **d** expect t **o** add data i **n** the future **,** set the dat **a** include **a** s many r **o** will ever need. **R** ather than **A** ws as you 1:D5",0.7153558052434457,"e need to u the table a o add data in as many ro Rather than A $500. understand t as shown in n the future, ows as you A1:D50, you the data ran n above Slid , set the data think you u may want nge. Excel de. If you a range to will ever to specify",0.7153558052434457,"e need to u the table a o add data in as many ro Rather than A $500. understand t as shown in n the future, ows as you A1:D50, you the data ran n above Slid , set the data think you u may want nge. Excel de. If you a range to will ever to specify",77,manuals_sample
-78,0,"2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host ITSO-VMHOST-01 and click Import. Figure 8-39 import volume mappings source host selection",False,0.1598360655737705,"2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host ITSO-VMHOST-01 and click Import.
-
-- Dialog title: Import Mappings
-- Close con",0.2336065573770492,"
-
-2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host **ITSO-VMHOST-01** and click **Import**.
-
-![Screenshot o",0.10245901639344263,"2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host **ITSO-VMHOST-01** and click **Import**.
-
-![Figure 8-39: import volume mappings source ho",0.23770491803278687,"ize V8.2.1
-
-2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host `ITSO-VMHOST-01` and click **Import**.
-
-```
-Import Mappings ",0.19672131147540983,"- 2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host ITSO-VMHOST-01 and click **Import** .
-
-**==> picture [397 x 248] intention",0.18032786885245902,"2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host ITSO-VMHOST-01 and click Import .
-3. After the task complet",0.18032786885245902,"2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host ITSO-VMHOST-01 and click Import .
-3. After the task complet",78,manuals_sample
-78,1,"3. After the task completes, verify that the mappings are as expected from the Hosts menu (see Figure 8-26 on page 346), right-click the target host, and select Properties. Then, click the Mapped Volumes tab and verify that the required volumes were mapped to the new host (see Figure 8-37 on page 353).",False,0.006600660066006601,"3. After the task completes, verify that the mappings are as expected from the Hostsmenu (see Figure 8-26 on page 346), right-click the target host, and select Properties . Then, click the Mapped Volumes tab and verify that the required volumes were mapped to the new host (see Figure 8-37 on page 353).",0.07920792079207921,"3. After the task completes, verify that the mappings are as expected from the **Hosts** menu (see Figure 8-26 on page 346), right-click the target host, and select **Properties**. Then, click the **Mapped Volumes** tab and verify that the required volumes were mapped to the new host (see Figure 8-37 o",0.07920792079207921,"ter the task completes, verify that the mappings are as expected from the **Hosts** menu (see Figure 8-26 on page 346), right-click the target host, and select **Properties**. Then, click the **Mapped Volumes** tab and verify that the required volumes were mapped to the new host (see Figure 8-37 on pag",0.07920792079207921,"After the task completes, verify that the mappings are as expected from the **Hosts** menu (see Figure 8-26 on page 346), right-click the target host, and select **Properties**. Then, click the **Mapped Volumes** tab and verify that the required volumes were mapped to the new host (see Figure 8-37 on p",0.0858085808580858,"After the task completes, verify that the mappings are as expected from the **Hosts** menu (see Figure 8-26 on page 346), right-click the target host, and select **Properties** . Then, click the **Mapped Volumes** tab and verify that the required volumes were mapped to the new host (see Figure 8-37 on ",0.006600660066006601,". After the task completes, verify that the mappings are as expected from the Hosts menu (see Figure 8-26 on page 346), right-click the target host, and select Properties . Then, click the Mapped Volumes tab and verify that the required volumes were mapped to the new host (see Figure 8-37 on page 353).",0.006600660066006601,". After the task completes, verify that the mappings are as expected from the Hosts menu (see Figure 8-26 on page 346), right-click the target host, and select Properties . Then, click the Mapped Volumes tab and verify that the required volumes were mapped to the new host (see Figure 8-37 on page 353).",78,manuals_sample
-78,2,"Renaming a host To rename a host, complete the following steps: 1. Select the host, and then right-click and select Rename (see Figure 8-40). Figure 8-40 Rename a host",False,0.1497005988023952,"enaming a host
-
-To rename a host, complete the following steps:
-
-1. Select the host, and then right-click and select Rename (see Figure 8-40).
-
-| Name | Hos",0.19760479041916168,"
-
-# Renaming a host
-
-To rename a host, complete the following steps:
-
-1. Select the host, and then right-click and select **Rename** (see Figure 8-40).
-
-![Screenshot s",0.1377245508982036,"g a host
-
-To rename a host, complete the following steps:
-
-1. Select the host, and then right-click and select **Rename** (see Figure 8-40).
-
-![Figure 8-40: Rename a h",0.17964071856287425,"Renaming a host
-
-To rename a host, complete the following steps:
-
-1. Select the host, and then right-click and select **Rename** (see Figure 8-40).
-
-```
-⊕ Add Host ",0.2155688622754491,"Renaming a host**
-
-To rename a host, complete the following steps:
-
-- 1. Select the host, and then right-click and select **Rename** (see Figure 8-40).
-
-**==> pictu",0.07784431137724551,"enaming a host
-
-To rename a host, complete the following steps:
-
-1. Select the host, and then right-click and select Rename (see Figure 8-40).
-
-Figure 8-40 Rename a ",0.07784431137724551,"enaming a host
-
-To rename a host, complete the following steps:
-
-1. Select the host, and then right-click and select Rename (see Figure 8-40).
-
-Figure 8-40 Rename a ",78,manuals_sample
-78,3,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,False,0.0,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,0.8591549295774648,eenshot showing the context menu for a host (ITSO-VMHOST-01) in the Hos,0.8450704225352113,lect the source host from which you want to import the volume mappings.,0.0,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,0.0,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,0.8169014084507042,"omplete the following steps:
-
-1. Select the host, and then right-click ",0.8169014084507042,"omplete the following steps:
-
-1. Select the host, and then right-click ",78,manuals_sample
-79,0,"Draft Document for Review December 11, 2019 1:55 pm",False,0.0,"Draft Document for Review December 11, 2019 1:55 pm",0.803921568627451,"rtunities for revenue growth, Deliver better (more ",0.0,"Draft Document for Review December 11, 2019 1:55 pm",0.0,"Draft Document for Review December 11, 2019 1:55 pm",0.0,"Draft Document for Review December 11, 2019 1:55 pm",0.803921568627451,"reat customer experiences at scale.
-- /SM590000 Int",0.803921568627451,"reat customer experiences at scale.
-- /SM590000 Int",79,manuals_sample
-79,1,8459ch03.fm,False,0.0,8459ch03.fm,0.9090909090909091,817fe2ac05f,1.0,ge 43). Thi,0.0,8459ch03.fm,0.0,8459ch03.fm,0.9090909090909091, /SM590000 ,0.9090909090909091, /SM590000 ,79,manuals_sample
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-79,3,"IBM Cloud Pak for Automation is a containerized automation software platform with pre-integrated automation capabilities such as workflow and decision automation, content management, document processing, and operational intelligence (Figure 3-7 on page 43). This enables organizations to digitize all styles of work with AI-infused business-oriented tools and built-in operational analytics for visibility and governance. This offering empowers business users to rapidly deliver applications and services at enterprise scale for greater cost savings and operational efficiencies. The IBM Cloud Pak for Automation can run anywhere (on-premises, on private and public clouds, and in pre-integrated systems) and is Red Hat OpenShift certified. Figure 3-7 IBM Cloud Pak for Automation",False,0.046153846153846156,"
-IBM Cloud Pak for Automation is a containerized automation software platform with pre-integrated automation capabilities such as workflow and decision automation, content management, document processing, and operational intelligence (Figure 3-7 on page 43). This enables organizations to digitize all styles of work with AI-infused business-oriented tools and built-in operational analytics for visibility and governance. This offering empowers business users to rapidly deliver applications and services at enterprise scale for greater cost savings and operational efficiencies. The IBM Cloud Pak for Automation can run anywhere (on-premises, on private and public clouds, and in pre-integrated systems) and is Red Hat OpenShift certified.
-
-| Layer | Components / Description |
-",0.05128205128205128,"res
-
-IBM Cloud Pak for Automation is a containerized automation software platform with pre-integrated automation capabilities such as workflow and decision automation, content management, document processing, and operational intelligence (Figure 3-7 on page 43). This enables organizations to digitize all styles of work with AI-infused business-oriented tools and built-in operational analytics for visibility and governance. This offering empowers business users to rapidly deliver applications and services at enterprise scale for greater cost savings and operational efficiencies. The IBM Cloud Pak for Automation can run anywhere (on-premises, on private and public clouds, and in pre-integrated systems) and is Red Hat OpenShift certified.
-
-![Diagram showing IBM containeriz",0.011538461538461539," Cloud Pak for Automation is a containerized automation software platform with pre-integrated automation capabilities such as workflow and decision automation, content management, document processing, and operational intelligence (Figure 3-7 on page 43). This enables organizations to digitize all styles of work with AI-infused business-oriented tools and built-in operational analytics for visibility and governance. This offering empowers business users to rapidly deliver applications and services at enterprise scale for greater cost savings and operational efficiencies. The IBM Cloud Pak for Automation can run anywhere (on-premises, on private and public clouds, and in pre-integrated systems) and is Red Hat OpenShift certified.
-
-![Figure 3-7: IBM Cloud Pak for Automatio",0.05128205128205128,"
-IBM Cloud Pak for Automation is a containerized automation software platform with pre-integrated automation capabilities such as workflow and decision automation, content management, document processing, and operational intelligence (Figure 3-7 on page 43). This enables organizations to digitize all styles of work with AI-infused business-oriented tools and built-in operational analytics for visibility and governance. This offering empowers business users to rapidly deliver applications and services at enterprise scale for greater cost savings and operational efficiencies. The IBM Cloud Pak for Automation can run anywhere (on-premises, on private and public clouds, and in pre-integrated systems) and is Red Hat OpenShift certified.
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-| **IBM containerized soft",0.04230769230769231,"
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-Figure 3-8 IBM Cloud Pak for Automation benefits
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-- Drive growth with enhanced customer experiences and new business models.
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-",0.2629558541266795,"op-line': New business models, Find new opportunities for revenue growth, Deliver better (more personalized, more relevant...) products and services.
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-Figure 3-8 IBM Cloud Pak for Automation benefits
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-Additional features of the IBM Cloud Pak for Automation are:
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-- Drive scale, speed, and assist with complex knowledge work.
-- Automate complex and less-structured business processes and optimize lighter customer experiences for task efficiency.
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-* Drive growth with enhanced customer experiences and new business models.
-* ",0.46641074856046066,"----------------------------------------------------------------------- |
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-*Figure 3-8 IBM Cloud Pak for Automation benefits*
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-* Drive scale, speed, and assist with complex knowledge work.
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-**==> picture [412 x 120] intentionally omitted <==**
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-_Figure 3-8 IBM Cloud Pak for Automation benefits_
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-- � Automate complex and less-structured business processes and optimize lighter customer
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- - experiences for task eff",0.22072936660268713,"ses look for modernizing their business operations with intelligent automation lowering costs and increasing revenue as shown in Figure 3-8.
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-Figure 3-8 IBM Cloud Pak for Automation benefits
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-
-
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-- /SM590000 Drive scale, speed, and assist with complex knowledge work.
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-- /SM590000 Drive growth with enhanced custome",0.22072936660268713,"ses look for modernizing their business operations with intelligent automation lowering costs and increasing revenue as shown in Figure 3-8.
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-Figure 3-8 IBM Cloud Pak for Automation benefits
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-
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-- /SM590000 Drive scale, speed, and assist with complex knowledge work.
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-80,1,"1.3.4 ENJOY POWERFUL AND IMPROVED TABLE FEATURES Create, filter, format and expand multiple tables with a set of formulas since Microsoft excel has improved features for tables. For instance, if you want to view data in an extended table, Office Excel keeps table headers in view as you scroll.",False,0.01020408163265306,".3.4 ENJOY POWERFUL AND IMPROVED TABLE FEATURES
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-80,2,"1.3.5 SHARE SPREADSHEETS Use Microsoft Excel to share multiple spreadsheets with co-workers. Other parties may also access the data online as it renders the spreadsheets as HTML. Additionally, you can navigate, filter, sort and input parameters, all within the Web browser. Besides its numerous benefits, Microsoft Excel also has its share of shortcoming as well. Many users claim that Office Excel is not easily shared compared to other office applications.",False,0.013100436681222707,"3.5 SHARE SPREADSHEETS
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-Besides its numerous benefits, Microsoft Excel also has its share of shortcoming as well. Many users claim that Office Excel is not easily shared compared to other office applications.",0.013100436681222707,"3.5 SHARE SPREADSHEETS
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-Besides its numerous benefits, Microsoft Excel also has its share of shortcoming as well. Many users claim that Office Excel is not easily shared compared to other office applications.",0.008733624454148471,".3.5 SHARE SPREADSHEETS
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-Besides its numerous benefits, Microsoft Excel also has its share of shortcoming as well. Many users claim that Office Excel is not easily shared compared to other office applications.",0.013100436681222707,".3.5 SHARE SPREADSHEETS
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-Besides its numerous benefits, Microsoft Excel also has its share of shortcoming as well. Many users claim that Office Excel is not easily shared compared to other office applications",0.026200873362445413,".3.5 SHARE SPREADSHEETS**
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-80,3,"2. ERROR MESSAGES (CELL REFERENCE) If you get an error message in Excel you might not get much help from the program in finding out the cause. The articles listed here cover the cause and cures for a number of common error messages in Excel, such as #REF!, #NULL!, and #####.",False,0.01090909090909091,"2. ERROR MESSAGES (CELL REFERENCE)
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-80,5,"In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.",False,0.0,"In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.",0.0,"In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.",0.030418250950570342,"above example, if you click on the cell that contains the `#REF!` error, you will see that the cell reference within the cell has been replaced with `#REF!`. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula",0.0,"In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.",0.0,"In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.",0.0,"In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.",0.0,"In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.",80,manuals_sample
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-81,0,INDEX Maintenance............................................ 1 Model AY11240/Model AY11238.................. 2-5 Model AY11228/Model AY11232.................. 6-9 Model AY11230/Model AY11234.................. 10-13 Model AY11236........................................ 14-18 Warranty Information................................ Back Cover,False,0.5339233038348082,"## INDEX
-
-| Maintenance... | |
-|-|-|
-| Model AY11240/Model AY11238. | 2-5 |
-| Model AY11228/Model AY11232. | 6-9 |
-| Model AY11230/Model AY11234. | 10-13 |
-| Model AY11236.. | 14-18 |
-| Warranty Information..... | Back Cover",0.6696165191740413,"
-
-# INDEX
-
-| Maintenance | 1 |
-|-----------------------------|------------|
-| Model AY11240/Model AY11238 | 2-5 |
-| Model AY11228/Model AY11232 | 6-9 |
-| Model AY11230/Model AY11234 | 10-13 |
-| Model AY11236 | 14-18 |
-| Warranty Information | Back Cover",0.7551622418879056,"---
-title: ""BARSKA Microscope User Manual: Models AY11240 & AY11238""
----
-
-# INDEX
-
-| Section | Page |
-| :--- | :--- |
-| Maintenance | 1 |
-| Model AY11240/Model AY11238 | 2-5 |
-| Model AY11228/Model AY11232 | 6-9 |
-| Model AY11230/Model AY11234 | 10-13 |
-| Model AY11236 | 14-18 |
-| Warranty Information | Back Cover",0.05014749262536873,"Maintenance............................................ 1
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-Model AY11240/Model AY11238.................. 2-5
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-Model AY11228/Model AY11232.................. 6-9
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-Model AY11230/Model AY11234.................. 10-13
-
-Model AY11236........................................ 14-18
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-Warranty Information................................ Back Cover
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-
-Maintenance............................................ 1 Model AY11240/Model AY11238.................. 2-5 Model AY11228/Model AY11232.................. 6-9 Model AY11230/Model AY11234.................. 10-13 Model AY11236........................................ 14-18 Warranty Information................................
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-Back Cover",0.44542772861356933,"1240/Model AY11238.................. | 2-5 |
-| Model AY11228/Model AY11232.................. | 6-9 |
-| Model AY11230/Model AY11234.................. | 10-13 |
-| Model AY11236........................................ | 14-18 |
-| Warranty Information............................",0.44542772861356933,"1240/Model AY11238.................. | 2-5 |
-| Model AY11228/Model AY11232.................. | 6-9 |
-| Model AY11230/Model AY11234.................. | 10-13 |
-| Model AY11236........................................ | 14-18 |
-| Warranty Information............................",81,manuals_sample
-81,1,"IMPORTANT NOTES Congratulations on your purchase of this high quality BARSKA microscope. With proper care, this microscope will provide many years of use. Please read the following instructions before operating this instrument. 1. Do not attempt to disassemble the instrument. This product has been carefully assembled at the factory and should only be examined by a factory-trained technician. 2. This instrument should only be used in an environment with an indoor temperature range of 32oF to 104oF. 3. Do not use this instrument in an environment with a lot of dust. Cover the instrument when not in use. 4. Do not subject the instrument to shock.",False,0.02304147465437788,"ORTANT NOTES
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-81,2,"MAINTENANCE Proper care and storage of this instrument is essential. Please read the following guidelines: 1. Keep the instrument in a dry and moisture-free location. 2. Do not expose to acid, alkali fumes or moisture. 3. Keep optical parts clean and free of dust. To clean optical parts gently wipe with lens cleaning tissue and a mixture of alcohol and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios: Wet weather: 1:2 Dry Weather: 1:1 4. After use, cover the instrument with the plastic dust cover. 5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof container.",False,0.03488372093023256,"AINTENANCE
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-
-1. Keep the instrument in a dry and moisture-free location.
-2. Do not expose to acid, alkali fumes or moisture.
-3. Keep optical parts clean and free of dust. To clean optical parts gently wipe with lens cleaning tissue and a mixture of alcohol and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios:
- Wet weather: 1:2
- Dry weather: 1:1
-4. After use, cover the instrument with the plastic dust cover.
-5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof container.
-",0.056686046511627904,"per care and storage of this instrument is essential. Please read the following guidelines:
-
-1. Keep the instrument in a dry and moisture-free location.
-2. Do not expose to acid, alkali fumes or moisture.
-3. Keep optical parts clean and free of dust. To clean optical parts gently wipe with lens cleaning tissue and a mixture of alcohol and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios:
- * Wet weather: 1:2
- * Dry Weather: 1:1
-4. After use, cover the instrument with the plastic dust cover.
-5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof containe",0.04505813953488372,"Proper care and storage of this instrument is essential. Please read the following guidelines:
-
-1. Keep the instrument in a dry and moisture-free location.
-
-2. Do not expose to acid, alkali fumes or moisture.
-
-3. Keep optical parts clean and free of dust. To clean optical parts gently wipe with lens cleaning tissue and a mixture of alcohol and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios:
-
- Wet weather: 1:2
-
- Dry Weather: 1:1
-
-4. After use, cover the instrument with the plastic dust cover.
-
-5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof container",0.10465116279069768,"and storage of this instrument is essential. Please read the following guidelines:
-
-- 1. Keep the instrument in a dry and moisture-free location.
-
-- 2. Do not expose to acid, alkali fumes or moisture.
-
-- 3. Keep optical parts clean and free of dust. To clean optical parts
-
-- gently wipe with lens cleaning tissue and a mixture of alcohol
-
-- and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios:
-
-- Wet weather: 1:2
-
-- Dry Weather: 1:1
-
-- 4. After use, cover the instrument with the plastic dust cover.
-
-- 5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proo",0.10755813953488372,"k.
-
-## MAINTENANCE
-
-Proper care and storage of this instrument is essential. Please read the following guidelines:
-
-1. Keep the instrument in a dry and moisture-free location.
-2. Do not expose to acid, alkali fumes or moisture.
-3. Keep optical parts clean and free of dust. To clean optical parts gently wipe with lens cleaning tissue and a mixture of alcohol and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios:
-4. After use, cover the instrument with the plastic dust cover.
-5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof container.
-
-Wet weather: 1:2
-
-Dry W",0.10755813953488372,"k.
-
-## MAINTENANCE
-
-Proper care and storage of this instrument is essential. Please read the following guidelines:
-
-1. Keep the instrument in a dry and moisture-free location.
-2. Do not expose to acid, alkali fumes or moisture.
-3. Keep optical parts clean and free of dust. To clean optical parts gently wipe with lens cleaning tissue and a mixture of alcohol and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios:
-4. After use, cover the instrument with the plastic dust cover.
-5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof container.
-
-Wet weather: 1:2
-
-Dry W",81,manuals_sample
-81,3,MODEL AY11240/AY11238,False,0.0,MODEL AY11240/AY11238,0.0,MODEL AY11240/AY11238,0.0,MODEL AY11240/AY11238,0.0,MODEL AY11240/AY11238,0.0,MODEL AY11240/AY11238,0.0,MODEL AY11240/AY11238,0.0,MODEL AY11240/AY11238,81,manuals_sample
-81,4,MICROSCOPE USAGE BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction.,False,0.010380622837370242,"ICROSCOPE USAGE
-
-BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction.",0.010380622837370242,"MICROSCOPE USAGE
-
-BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction",0.010380622837370242,"MICROSCOPE USAGE
-
-BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction",0.010380622837370242,"MICROSCOPE USAGE
-
-BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction",0.02768166089965398,"MICROSCOPE USAGE**
-
-BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruct",0.010380622837370242,"ICROSCOPE USAGE
-
-BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction.",0.010380622837370242,"ICROSCOPE USAGE
-
-BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction.",81,manuals_sample
-81,5,"CONSTRUCTION BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90o vertical to 45o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45o angle. The head rotates 360o. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.",False,0.006060606060606061,"ONSTRUCTION
-
-BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90o vertical to 45o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45o angle. The head rotates 360o. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.",0.014141414141414142,"CONSTRUCTION
-
-BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90° vertical to 45° level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45° angle. The head rotates 360°. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube",0.12727272727272726,"11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from $90^\circ$ vertical to $45^\circ$ level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen.
-
-BARSKA Model AY11238 features a monocular tube that is slanted at a $45^\circ$ angle. The head rotates $360^\circ$. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube",0.17777777777777778," fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90o vertical to 45o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45o angle. The head rotates 360o. The Eyepiece Set Screw prevents the eyepiece from falling out of the",0.044444444444444446,"*
-
-BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90[o] vertical to 45[o] level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45[o] angle. The head rotates 360[o] . The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.",0.030303030303030304,"TRUCTION
-
-BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90 o vertical to 45 o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45 o angle. The head rotates 360 o . The Eyepiece Set Screw prevents the eyepiece from falling out of the tu",0.030303030303030304,"TRUCTION
-
-BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90 o vertical to 45 o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45 o angle. The head rotates 360 o . The Eyepiece Set Screw prevents the eyepiece from falling out of the tu",81,manuals_sample
-82,0,"15.Click Finish to end the storage migration wizard, as shown in Figure 9-14.",False,0.012987012987012988,"15.ClickFinish to end the storage migration wizard, as shown in Figure 9-14.",0.1038961038961039,"5.Click **Finish** to end the storage migration wizard, as shown in Figure 9-",0.1038961038961039,"Click **Finish** to end the storage migration wizard, as shown in Figure 9-14",0.1038961038961039,"lick **Finish** to end the storage migration wizard, as shown in Figure 9-14.",0.1038961038961039,"lick **Finish** to end the storage migration wizard, as shown in Figure 9-14.",0.0,"15.Click Finish to end the storage migration wizard, as shown in Figure 9-14.",0.0,"15.Click Finish to end the storage migration wizard, as shown in Figure 9-14.",82,manuals_sample
-82,1,Figure 9-14 Migration is started,False,0.0,Figure 9-14 Migration is started,0.0,Figure 9-14 Migration is started,0.0625,Figure 9-14: Migration is starte,0.1875,gure 9-14 Migration is starte,0.125,Figure 9-14 Migration is start,0.125,gure 9-14 Migration is started,0.125,gure 9-14 Migration is started,82,manuals_sample
-82,2,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",False,0.0,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",0.0,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",0.0,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",0.0,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",0.0,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",0.0,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",0.0,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",82,manuals_sample
-82,3,Figure 9-15 The ongoing Migration is listed in the Storage Migration window,False,0.0,Figure 9-15 The ongoing Migration is listed in the Storage Migration window,0.0,Figure 9-15 The ongoing Migration is listed in the Storage Migration window,0.02666666666666667,igure 9-15: The ongoing Migration is listed in the Storage Migration window,0.08,igure 9-15 The ongoing Migration is listed in the Storage Migration wind,0.05333333333333334,gure 9-15 The ongoing Migration is listed in the Storage Migration window,0.05333333333333334,Figure 9-15 The ongoing Migration is listed in the Storage Migration wind,0.05333333333333334,Figure 9-15 The ongoing Migration is listed in the Storage Migration wind,82,manuals_sample
-82,4,"16.If you want to check the progress by using the CLI, run the lsvdisksyncprogress command because the process is essentially a volume copy, as shown in Figure 9-16.",False,0.0,"16.If you want to check the progress by using the CLI, run the lsvdisksyncprogress command because the process is essentially a volume copy, as shown in Figure 9-16.",0.048484848484848485,".If you want to check the progress by using the CLI, run the **lsvdisksyncprogress** command because the process is essentially a volume copy, as shown in Figure 9-1",0.03636363636363636,". If you want to check the progress by using the CLI, run the `lsvdisksyncprogress` command because the process is essentially a volume copy, as shown in Figure 9-16",0.030303030303030304," If you want to check the progress by using the CLI, run the `lsvdisksyncprogress` command because the process is essentially a volume copy, as shown in Figure 9-16.",0.048484848484848485,".If you want to check the progress by using the CLI, run the **lsvdisksyncprogress** command because the process is essentially a volume copy, as shown in Figure 9-1",0.0,"16.If you want to check the progress by using the CLI, run the lsvdisksyncprogress command because the process is essentially a volume copy, as shown in Figure 9-16.",0.0,"16.If you want to check the progress by using the CLI, run the lsvdisksyncprogress command because the process is essentially a volume copy, as shown in Figure 9-16.",82,manuals_sample
-82,5,Figure 9-16 Checking migration progress by using CLI,False,0.0,Figure 9-16 Checking migration progress by using CLI,0.0,Figure 9-16 Checking migration progress by using CLI,0.038461538461538464,Figure 9-16: Checking migration progress by using CL,0.11538461538461539,gure 9-16 Checking migration progress by using CL,0.07692307692307693,igure 9-16 Checking migration progress by using CL,0.07692307692307693,igure 9-16 Checking migration progress by using CL,0.07692307692307693,igure 9-16 Checking migration progress by using CL,82,manuals_sample
-82,6,"17.When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click Finalize, as shown in Figure 9-17 on page 400.",False,0.0,"17.When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click Finalize, as shown in Figure 9-17 on page 400.",0.046511627906976744,"When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click **Finalize**, as shown in Figure 9-17 on page 400",0.046511627906976744,"When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click **Finalize**, as shown in Figure 9-17 on page 400",0.046511627906976744,"When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click **Finalize**, as shown in Figure 9-17 on page 400",0.05813953488372093,".When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click **Finalize** , as shown in Figure 9-17 on page 4",0.011627906976744186,"17.When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click Finalize , as shown in Figure 9-17 on page 400",0.011627906976744186,"17.When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click Finalize , as shown in Figure 9-17 on page 400",82,manuals_sample
-82,7,The data migration has begun. After it is completed use the finalize action in the Migration panel of the management GUI to remove the image-mode volume copies. Then unzone and remove the original storage system.,True,0.3867924528301887,"age Migration Wizard"" interface. The migration has begun; after completion, use the ""finalize"" action in the Migration panel to remove image-mode volume copies, unzone, and remove the original storage system. The",0.7075471698113207,"he migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displaye",0.0,The data migration has begun. After it is completed use the finalize action in the Migration panel of the management GUI to remove the image-mode volume copies. Then unzone and remove the original storage system.,0.0,The data migration has begun. After it is completed use the finalize action in the Migration panel of the management GUI to remove the image-mode volume copies. Then unzone and remove the original storage system.,0.7075471698113207,"he migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displaye",0.7075471698113207,"he migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displaye",0.7075471698113207,"he migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displaye",82,manuals_sample
-83,0,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save (see Figure 5-80).",False,0.0031645569620253164,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save(see Figure 5-80).",0.02531645569620253,"e content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-80",0.02531645569620253,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-",0.02531645569620253,"content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-80).",0.02531645569620253,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-",0.0,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save (see Figure 5-80).",0.0,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save (see Figure 5-80).",83,manuals_sample
-83,1,Figure 5-80 Enabling login message,False,0.0,Figure 5-80 Enabling login message,0.0,Figure 5-80 Enabling login message,0.058823529411764705,Figure 5-80: Enabling login messag,0.11764705882352941,igure 5-80 Enabling login messag,0.11764705882352941,Figure 5-80 Enabling login messa,0.11764705882352941,gure 5-80 Enabling login message,0.11764705882352941,gure 5-80 Enabling login message,83,manuals_sample
-83,2,The resulting log-in screen is shown in Figure 5-81.,False,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,83,manuals_sample
-83,3,Figure 5-81 Welcome message in GUI,False,0.0,Figure 5-81 Welcome message in GUI,0.0,Figure 5-81 Welcome message in GUI,0.058823529411764705,Figure 5-81: Welcome message in GU,0.11764705882352941,igure 5-81 Welcome message in GU,0.11764705882352941,gure 5-81 Welcome message in GUI,0.11764705882352941,Figure 5-81 Welcome message in G,0.11764705882352941,Figure 5-81 Welcome message in G,83,manuals_sample
-83,4,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",False,0.0,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",0.0,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",0.0,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",0.0,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",0.0,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",0.0,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",0.0,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",83,manuals_sample
-83,5,Figure 5-82 Banner message in CLI,False,0.0,Figure 5-82 Banner message in CLI,0.0,Figure 5-82 Banner message in CLI,0.06060606060606061,igure 5-82: Banner message in CLI,0.12121212121212122,gure 5-82 Banner message in CLI,0.12121212121212122,igure 5-82 Banner message in CL,0.12121212121212122,gure 5-82 Banner message in CLI,0.12121212121212122,gure 5-82 Banner message in CLI,83,manuals_sample
-83,6,182 Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,False,0.0,182 Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,0.7733333333333333,-81 shows the Storwize V7000 Storage Management login screen (ITSO\_V7000G2,0.72, A screenshot of the Storwize V7000 login screen. The standard Username and,0.05333333333333334," Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1
-",0.05333333333333334,82** Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.,0.7866666666666666," message by using the GUI, edit the text area with the message content and ",0.7866666666666666," message by using the GUI, edit the text area with the message content and ",83,manuals_sample
-83,7,This is an ITSO-managed system. Unauthorized access is restricted.,True,0.0,This is an ITSO-managed system. Unauthorized access is restricted.,0.0,This is an ITSO-managed system. Unauthorized access is restricted.,0.0,This is an ITSO-managed system. Unauthorized access is restricted.,0.0,This is an ITSO-managed system. Unauthorized access is restricted.,0.7878787878787878,"out some important information about the system, such as security ",0.7878787878787878,"bout some important information about the system, such as security",0.7878787878787878,"bout some important information about the system, such as security",83,manuals_sample
-84,0,12.3.3 Start activation process on a running system,False,0.0,12.3.3 Start activation process on a running system,0.0,12.3.3 Start activation process on a running system,0.0,12.3.3 Start activation process on a running system,0.0,12.3.3 Start activation process on a running system,0.0392156862745098,2.3.3 Start activation process on a running system,0.0392156862745098,12.3.3 Start activation process on a running syste,0.0392156862745098,12.3.3 Start activation process on a running syste,84,manuals_sample
-84,1,"To activate encryption on a running system, complete the following steps: 1. Click Settings → System → Licensed Functions. 2. Click Encryption Licenses, as shown in Figure 12-9.",False,0.03389830508474576,"o activate encryption on a running system, complete the following steps:
-
-1. Click Settings →System → Licensed Functions.
-
-2. Click Encryption Licenses, as shown in Figure 12-9.",0.2033898305084746,"encryption on a running system, complete the following steps:
-
-1. Click **Settings** → **System** → **Licensed Functions**.
-2. Click **Encryption Licenses**, as shown in Figure ",0.2033898305084746,"encryption on a running system, complete the following steps:
-
-1. Click **Settings** → **System** → **Licensed Functions**.
-2. Click **Encryption Licenses**, as shown in Figure ",0.22598870056497175,"activate encryption on a running system, complete the following steps:
-
-1. Click **Settings** ⇒ **System** ⇒ **Licensed Functions**.
-
-2. Click **Encryption Licenses**, as shown ",0.2711864406779661,"To activate encryption on a running system, complete the following steps:
-
-- 1. Click **Settings** → **System** → **Licensed Functions** .
-
-- 2. Click **Encryption Licenses** ",0.04519774011299435,"o activate encryption on a running system, complete the following steps:
-
-1. Click Settings → System → Licensed Functions .
-2. Click Encryption Licenses , as shown in Figure 12-",0.04519774011299435,"o activate encryption on a running system, complete the following steps:
-
-1. Click Settings → System → Licensed Functions .
-2. Click Encryption Licenses , as shown in Figure 12-",84,manuals_sample
-84,2,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window,False,0.0,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window,0.0,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window,0.024390243902439025,Figure 12-9: Expanding Encryption Licenses section on the Licensed Functions windo,0.0,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window,0.04878048780487805,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions wind,0.04878048780487805,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions wind,0.04878048780487805,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions wind,84,manuals_sample
-84,3,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (Activate License Automatically and Activate License Manually), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on page 617.",False,0.0032102728731942215,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options ( Activate License Automaticallyand Activate License Manually), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on page 617.",0.025682182985553772,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate License Manually**), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on p",0.025682182985553772,". The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate License Manually**), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on pa",0.03210272873194221,"The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate License Manually**), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, ""Activate the license automatically"" on page 614. For more information about how to complete a manual activation process, see 12.3.5, ""Activate the license manually"" on page",0.7367576243980738,"## **12.3.3 Start activation process on a running system**
-
-To activate encryption on a running system, complete the following steps:
-
-- 1. Click **Settings** → **System** → **Licensed Functions** .
-
-- 2. Click **Encryption Licenses** , as shown in Figure 12-9.
-
-**==> picture [397 x 226] intentionally omitted <==**
-
-_Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window_
-
-**==> picture [412 x 96] intentionally omitted <==**
-
-**==> picture [397 x 139] intentionally omitted ",0.012841091492776886,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options ( Activate License Automatically and Activate License Manually ), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, 'Activate the license automatically' on page 614. For more information about how to complete a manual activation process, see 12.3.5, 'Activate the license manually' on page 61",0.012841091492776886,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options ( Activate License Automatically and Activate License Manually ), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, 'Activate the license automatically' on page 614. For more information about how to complete a manual activation process, see 12.3.5, 'Activate the license manually' on page 61",84,manuals_sample
-84,4,Figure 12-10 Select the Control Enclosure on which you want to enable the encryption,False,0.0,Figure 12-10 Select the Control Enclosure on which you want to enable the encryption,0.0,Figure 12-10 Select the Control Enclosure on which you want to enable the encryption,0.023809523809523808,igure 12-10: Select the Control Enclosure on which you want to enable the encryption,0.5,ures. Right-click the enclosure on which you want to install an encryption license. ,0.047619047619047616,Figure 12-10 Select the Control Enclosure on which you want to enable the encrypti,0.047619047619047616,igure 12-10 Select the Control Enclosure on which you want to enable the encryptio,0.047619047619047616,igure 12-10 Select the Control Enclosure on which you want to enable the encryptio,84,manuals_sample
-84,5,Chapter 12. Encryption 613,False,0.0,Chapter 12. Encryption 613,0.5384615384615384,he encryption,0.6153846153846154,"tline.
-
-3. The Encryption ",0.5769230769230769," There is an ""Encryption L",0.15384615384615385,hapter 12. Encryption **61,0.6153846153846154,"e 12-9.
-3. The Encryption ",0.6153846153846154,"e 12-9.
-3. The Encryption ",84,manuals_sample
-85,0,SPECIFICATIONS 1. Length of mechanical tube: 160mm 2. Conjugate distance between object and image: 195mm 3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion) 4. Illumination: Input 110V or 200V; Output: 20W 5. Fine adjustment range: .002mm 6. Coarse Adjustment Range: 20mm 7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm 8. Condenser Elevation Range: 15mm 9. Iris diaphragm aperture: 2mm-30mm,False,0.5510688836104513,"e: 195mm |
-| 3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion) |
-| 4. Illumination: Input 110V or 200V; Output: 20W |
-| 5. Fine adjustment range: .002mm |
-| 6. Coarse Adjustment Range: 20mm |
-| 7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm |
-| 8. Condenser Elevation Range: 15mm ",0.026128266033254157,"SPECIFICATIONS
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-1. Length of mechanical tube: 160mm
-2. Conjugate distance between object and image: 195mm
-3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion)
-4. Illumination: Input 110V or 200V; Output: 20W
-5. Fine adjustment range: .002mm
-6. Coarse Adjustment Range: 20mm
-7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm
-8. Condenser Elevation Range: 15mm
-9. Iris diaphragm aperture: 2mm-30m",0.026128266033254157,"SPECIFICATIONS
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-1. Length of mechanical tube: 160mm
-2. Conjugate distance between object and image: 195mm
-3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion)
-4. Illumination: Input 110V or 200V; Output: 20W
-5. Fine adjustment range: .002mm
-6. Coarse Adjustment Range: 20mm
-7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm
-8. Condenser Elevation Range: 15mm
-9. Iris diaphragm aperture: 2mm-30m",0.026128266033254157,"SPECIFICATIONS
-
-1. Length of mechanical tube: 160mm
-2. Conjugate distance between object and image: 195mm
-3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion)
-4. Illumination: Input 110V or 200V; Output: 20W
-5. Fine adjustment range: .002mm
-6. Coarse Adjustment Range: 20mm
-7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm
-8. Condenser Elevation Range: 15mm
-9. Iris diaphragm aperture: 2mm-30m",0.15201900237529692,"h of mechanical tube: 160mm
-
-- 2. Conjugate distance between object and image: 195mm
-
-- 3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion)
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-- 4. Illumination: Input 110V or 200V; Output: 20W
-
-- 5. Fine adjustment range: .002mm
-
-- 6. Coarse Adjustment Range: 20mm
-
-- 7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm
-
-- 8. Condenser Elevation Range: 15mm
-
-- 9. Iris diaphragm aperture:",0.06413301662707839,"IFICATIONS
-
-1. Length of mechanical tube: 160mm
-
-2. Conjugate distance between object and image: 195mm
-
-3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion)
-
-4. Illumination: Input 110V or 200V; Output: 20W
-
-5. Fine adjustment range: .002mm
-
-6. Coarse Adjustment Range: 20mm
-
-7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm
-
-8. Condenser Elevation Range: 15mm
-
-9. Iris diaphragm aperture: 2mm",0.06413301662707839,"IFICATIONS
-
-1. Length of mechanical tube: 160mm
-
-2. Conjugate distance between object and image: 195mm
-
-3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion)
-
-4. Illumination: Input 110V or 200V; Output: 20W
-
-5. Fine adjustment range: .002mm
-
-6. Coarse Adjustment Range: 20mm
-
-7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm
-
-8. Condenser Elevation Range: 15mm
-
-9. Iris diaphragm aperture: 2mm",85,manuals_sample
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-85,3,Magnification,False,0.0,Magnification,0.0,Magnification,0.0,Magnification,0.0,Magnification,0.0,Magnification,0.0,Magnification,0.0,Magnification,85,manuals_sample
-85,4,Numerical Aperture,False,0.16666666666666666,umerical aperture:,0.0,Numerical Aperture,0.0,Numerical Aperture,0.0,Numerical Aperture,0.1111111111111111,numerical aperture,0.0,Numerical Aperture,0.0,Numerical Aperture,85,manuals_sample
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-85,10,4x (parfocal distance adjustable),False,0.0,4x (parfocal distance adjustable),0.0,4x (parfocal distance adjustable),0.0,4x (parfocal distance adjustable),0.0,4x (parfocal distance adjustable),0.0,4x (parfocal distance adjustable),0.0,4x (parfocal distance adjustable),0.0,4x (parfocal distance adjustable),85,manuals_sample
-85,11,Achromatic Objective,False,0.5,hromatic
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-85,13,Packing List,False,0.0,Packing List,0.0,Packing List,0.0,Packing List,0.0,Packing List,0.0,Packing List,0.0,Packing List,0.0,Packing List,85,manuals_sample
-86,0,Basic English Language Skills,False,0.0,Basic English Language Skills,0.8275862068965517," B
-
-Screenshot of an email co",0.0,Basic English Language Skills,0.0,Basic English Language Skills,0.0,Basic English Language Skills,0.896551724137931,"s:
-
-## Example A
-
-
-
-## Example B
-
-",0.8484848484848485,"## Compare the following examples:
-
-## Example A
-
-
-
-## Example B
-
-",86,manuals_sample
-86,3,"Hello Mr Smith Could you please help me with question 2 of the Safety Management 101 assignment? The question refers to a newspaper article, but the article has not been included in my study material. Do you perhaps know where I could find a copy of the article? Kind regards [Name] [Student Number]",True,0.013377926421404682,"Hello Mr Smith
-Could you please help me with question 2 of the Safety Management 101 assignment? The question refers to a newspaper article, but the article has not been included in my study material. Do you perhaps know where I could find a copy of the article?
-Kind regards
-[Name]
-[Student Number]",0.046822742474916385," Mr Smith
-
-Could you please help me with question 2 of the Safety Management 101 assignment? The question refers to a newspaper article, but the article has not been included in my study material. Do you perhaps know where I could find a copy of the article?
-
-Kind regards
-[Name]
-[Student Number",0.08695652173913043," Could you please help me with question 2 of the Safety Management 101 assignment? The question refers to a newspaper article, but the article has not been included in my study material. Do you perhaps know where I could find a copy of the article?
->
-> Kind regards
-> [Name]
-> [Student Number]",0.026755852842809364,"ello Mr Smith
-
-Could you please help me with question 2 of the Safety Management 101 assignment? The question refers to a newspaper article, but the article has not been included in my study material. Do you perhaps know where I could find a copy of the article?
-
-Kind regards
-[Name]
-[Student Number",0.7892976588628763,"Basic English Language Skills
-
-Compare the following examples:
-
-## Example A
-
-**==> picture [472 x 256] intentionally omitted <==**
-
-## Example B
-
-**==> picture [472 x 255] intentionally omitted <==**
-
-",0.862876254180602,"## Compare the following examples:
-
-## Example A
-
-
-
-## Example B
-
-",0.862876254180602,"## Compare the following examples:
-
-## Example A
-
-
-
-## Example B
-
-",86,manuals_sample
-87,0,"Direct operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hardware. Direct operating costs also include a $657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were:",False,0.0282574568288854,"erating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1",0.01020408163265306,"t operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to \$24.4 million for the year ended December 31, 2000 from \$21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled \$3.5 million and \$2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of \$1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hardware. Direct operating costs also include a \$657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were",0.0,"Direct operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hardware. Direct operating costs also include a $657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were:",0.0007849293563579278,"Direct operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hardware. Direct operating costs also include a $657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were:",0.0282574568288854,"ating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 199",0.06828885400313972,"e Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000",0.06828885400313972,"e Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000",87,finance_samples
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-88,0,"The project consists of three well-defined miner- alised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimberos and Teterita. Arqueros was previously mined on a limited scale by under- ground methods and Chimberos was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60)1.",False,0.011741682974559686,"The project consists of three well-defined mineralised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimberos and Teterita. Arqueros was previously mined on a limited scale by underground methods and Chimberos was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60)1 .
-",0.025440313111545987,"The project consists of three well-defined mineralised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimeros and Teterita. Arqueros was previously mined on a limited scale by underground methods and Chimeros was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60)11",0.015655577299412915,"
-The project consists of three well-defined mineralised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimberos and Teterita. Arqueros was previously mined on a limited scale by underground methods and Chimberos was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60)[1] .",0.015655577299412915,"
-
-The project consists of three well-defined mineralised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimberos and Teterita. Arqueros was previously mined on a limited scale by underground methods and Chimberos was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60) 1 .",0.015655577299412915,"
-
-The project consists of three well-defined mineralised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimberos and Teterita. Arqueros was previously mined on a limited scale by underground methods and Chimberos was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60) 1 .",88,finance_samples
-88,1,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",False,0.0,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.004901960784313725," Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.004901960784313725," Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0196078431372549,"Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content *divided* by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0196078431372549,"Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content _divided_ by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",88,finance_samples
-89,0,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone’s directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",False,0.0,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone’s directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.0015873015873015873,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone's directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.0,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone’s directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.0015873015873015873,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone's directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.012698412698412698,"goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone’s directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.014285714285714285,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone's directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone custom",0.014285714285714285,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone's directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone custom",89,finance_samples
-89,1,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",False,0.0,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",0.0,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",0.0,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",0.0,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",0.0038684719535783366,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits",0.0038684719535783366,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits",0.0038684719535783366,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits",89,finance_samples
-89,2,"Through ShentelPages, businesses have a new way of reaching thousands more potential customers within the six- county area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walking.",False,0.008797653958944282,"
-Through ShentelPages, businesses have a new way of reaching thousands more potential customers within the sixcounty area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walking.",0.005865102639296188,"Through ShentelPages, businesses have a new way of reaching thousands more potential customers within the six-county area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walking.
-",0.005865102639296188,"
-Through ShentelPages, businesses have a new way of reaching thousands more potential customers within the six-county area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walking.",0.005865102639296188," Through ShentelPages, businesses have a new way of reaching thousands more potential customers within the six-county area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walking.",0.011730205278592375,"
-Through ShentelPages, businesses have a new way of reaching thousands more potential customers within the sixcounty area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walking.",0.17008797653958943,"inesses have a new way of reaching thousands more potential customers within the sixcounty area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walkin",0.17008797653958943,"inesses have a new way of reaching thousands more potential customers within the sixcounty area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walkin",89,finance_samples
-89,3,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",False,0.0,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",0.0,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",0.0,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",0.0,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",0.0,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",0.0,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",0.0,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",89,finance_samples
-90,0,Net profit / (loss) after income tax (‘000s),False,0.11363636363636363,Net profit/(loss) after income tax ('000s) |,0.022727272727272728,Net profit / (loss) after income tax ('000s),0.022727272727272728,Net profit / (loss) after income tax ('000s),0.022727272727272728,Net profit / (loss) after income tax ('000s),0.8181818181818182,es the performance of the Group over the las,0.022727272727272728,Net profit / (loss) after income tax ('000s),0.022727272727272728,Net profit / (loss) after income tax ('000s),90,finance_samples
-90,1,"32,522",False,0.0,"32,522",0.0,"32,522",0.0,"32,522",0.0,"32,522",0.6666666666666666,**52,0.0,"32,522",0.0,"32,522",90,finance_samples
-90,2,"73,066",False,0.0,"73,066",0.0,"73,066",0.0,"73,066",0.0,"73,066",0.8333333333333334,370] i,0.0,"73,066",0.0,"73,066",90,finance_samples
-90,3,"20,879",False,0.0,"20,879",0.0,"20,879",0.0,"20,879",0.0,"20,879",0.6666666666666666,"2012, ",0.0,"20,879",0.0,"20,879",90,finance_samples
-90,4,"75,006",False,0.0,"75,006",0.0,"75,006",0.0,"75,006",0.0,"75,006",0.8333333333333334, [505 ,0.0,"75,006",0.0,"75,006",90,finance_samples
-90,5,"(323,726)",False,0.0,"(323,726)",0.0,"(323,726)",0.0,"(323,726)",0.0,"(323,726)",1.0,"2, the Gr",0.0,"(323,726)",0.0,"(323,726)",90,finance_samples
-90,7,"Threshold – Represents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure. p y Managing Director / CEO – up to 15% of TFR, COO & CFO – up to 12.5% of TFR, Other Key Management Personnel – up to 10% of TFR. Target – Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives. y g q p j Managing Director / CEO – up to 30% of TFR, COO & CFO – up to 25% of TFR, Other Key Management Personnel – up to 20% of TFR. Stretch (Maximum) – Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement. Managing Director / CEO – up to 60% of TFR, COO & CFO – up to 50% of TFR, Other Key Management Personnel – up to 40% of TFR. (TFR - Total Fixed Remuneration)",False,0.708029197080292," |
-| How much can the
executives earn under
the STI Plan? | Stretch (Maximum) – Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement.
Managing Director / CEO – up to 60% of TFR, COO & CFO – up to 50% of TFR, Other Key Management Personnel – up to 40% of TFR.
(TFR - Total Fixed Remuneration) ",0.0667361835245047,"resents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure.
Managing Director / CEO – up to 15% of TFR, COO & CFO – up to 12.5% of TFR, Other Key Management Personnel – up to 10% of TFR.
Target – Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives.
Managing Director / CEO – up to 30% of TFR, COO & CFO – up to 25% of TFR, Other Key Management Personnel – up to 20% of TFR.
Stretch (Maximum) – Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement.
Managing Director / CEO – up to 60% of TFR, COO & CFO – up to 50% of TFR, Other Key Management Personnel – up to 40% of TFR.
(TFR - Total Fixed Remunerati",0.08133472367049009,"epresents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure.
Managing Director / CEO – up to 15% of TFR, COO & CFO – up to 12.5% of TFR, Other Key Management Personnel – up to 10% of TFR.
**Target** – Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives.
Managing Director / CEO – up to 30% of TFR, COO & CFO – up to 25% of TFR, Other Key Management Personnel – up to 20% of TFR.
**Stretch (Maximum)** – Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement.
Managing Director / CEO – up to 60% of TFR, COO & CFO – up to 50% of TFR, Other Key Management Personnel – up to 40% of TFR.
*(TFR - Total Fixed R",0.047966631908237745,"old – Represents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure.
Managing Director / CEO – up to 15% of TFR, COO & CFO – up to 12.5% of TFR, Other Key Management Personnel – up to 10% of TFR.
Target – Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives.
Managing Director / CEO – up to 30% of TFR, COO & CFO – up to 25% of TFR, Other Key Management Personnel – up to 20% of TFR.
Stretch (Maximum) – Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement.
Managing Director / CEO – up to 60% of TFR, COO & CFO – up to 50% of TFR, Other Key Management Personnel – up to 40% of TFR.
(TFR - Total Fixed Remunerat",0.7528675703858185,"**52**
-
-Directors’ Report
-
-The following summarises the performance of the Group over the last five years:
-
-**==> picture [505 x 98] intentionally omitted <==**
-
-## Short-Term Incentives
-
-Effective from 1 July 2012, the Group implemented an STI Plan. The objectives of the STI Plan are to link the remuneration of certain executives to their performance and the performance of the Group. The Board set key performance measures and indicators for individual executives on an annual basis that reinforce the Group’s business plan and targets for the year.
-
-Key features of the STI Plan are outlined in the following table.
-
-**==> picture [505 x 370] intentionally omitted <==**
-
-www.kingsgate.com.au
-
-",0.04171011470281543,"Threshold - Represents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure. Managing Director / CEO - up to 15% of TFR, COO & CFO - up to 12.5% of TFR, Other Key Management Personnel - up to 10% of TFR. Target - Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives. Managing Director / CEO - up to 30% of TFR, COO & CFO - up to 25% of TFR, Other Key Management Personnel - up to 20% of TFR. Stretch (Maximum) - Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement. Managing Director / CEO - up to 60% of TFR, COO & CFO - up to 50% of TFR, Other Key Management Personnel - up to 40% of TFR. (TFR - Total Fixed Remuneration) ",0.04171011470281543,"Threshold - Represents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure. Managing Director / CEO - up to 15% of TFR, COO & CFO - up to 12.5% of TFR, Other Key Management Personnel - up to 10% of TFR. Target - Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives. Managing Director / CEO - up to 30% of TFR, COO & CFO - up to 25% of TFR, Other Key Management Personnel - up to 20% of TFR. Stretch (Maximum) - Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement. Managing Director / CEO - up to 60% of TFR, COO & CFO - up to 50% of TFR, Other Key Management Personnel - up to 40% of TFR. (TFR - Total Fixed Remuneration) ",90,finance_samples
-91,0,"— global economic and political conditions, — currency fluctuations, — product demand and industry capacity, — competitive products and pricing,",False,0.08333333333333333,"lobal economic and political conditions,
-
- - currency fluctuations,
-
-— product demand and industry capacity,
-
-— competitive products and pricing",0.05555555555555555," global economic and political conditions,
-- currency fluctuations,
-- product demand and industry capacity,
-- competitive products and pricing,
-",0.05555555555555555," global economic and political conditions,
-- currency fluctuations,
-- product demand and industry capacity,
-- competitive products and pricing,
-",0.020833333333333332,"— global economic and political conditions,
-— currency fluctuations,
-— product demand and industry capacity,
-— competitive products and pricing,",0.16666666666666666," economic and political conditions,
-
-- — currency fluctuations,
-
-- — product demand and industry capacity,
-
-- — competitive products and pric",0.08333333333333333,"global economic and political conditions,
-- -currency fluctuations,
-- -product demand and industry capacity,
-- -competitive products and pricing",0.08333333333333333,"global economic and political conditions,
-- -currency fluctuations,
-- -product demand and industry capacity,
-- -competitive products and pricing",91,finance_samples
-92,0,Creating Opportunities,False,0.0,Creating Opportunities,0.2727272727272727,oration opportunities ,0.0,Creating Opportunities,0.0,Creating Opportunities,0.0,Creating Opportunities,0.2727272727272727,loration opportunities,0.2727272727272727,loration opportunities,92,finance_samples
-92,1,DELIVERING ON THE EXPLORATION STRATEGY,False,0.0,DELIVERING ON THE EXPLORATION STRATEGY,0.0,DELIVERING ON THE EXPLORATION STRATEGY,0.0,DELIVERING ON THE EXPLORATION STRATEGY,0.0,DELIVERING ON THE EXPLORATION STRATEGY,0.0,DELIVERING ON THE EXPLORATION STRATEGY,0.0,DELIVERING ON THE EXPLORATION STRATEGY,0.0,DELIVERING ON THE EXPLORATION STRATEGY,92,finance_samples
-92,2,"Exploration is a key growth driver for Santos and success with the drill bit is vital to adding value for Santos shareholders. During the past four years Santos has been working to build exploration opportunities by: • acquiring new exploration acreage • adding material exploration prospects • drilling wildcat exploration wells. SUCCESS RATE OF 44% IN 2004 Santos’ 2004 exploration effort produced good results, as the Company high graded its exploration acreage and started drilling one of the most exciting portfolios in the industry. Santos discovered hydrocarbons in seven of the sixteen wildcat wells that were drilled, achieving an impressive success rate of 44%. The program added at least 93 million boe (including the pre-drill estimate for Jeruk) of recoverable resources that will be further evaluated by delineation and, in some cases, production history to determine 1P and 2P reserve additions. Importantly, these results were achieved with financial discipline, spending $126 million which was substantially less than forecast. The most significant drilling result for the year was the Jeruk oil discovery in the Sampang PSC offshore East Java, Indonesia. The Jeruk discovery is still under evaluation but its commercial significance appears encouraging. Santos has confirmed an oil column of at least 379 metres with a likely gross recoverable resource in excess of the pre-drill estimate of 170 million barrels. Santos also had further exploration successes in the Cooper Basin in central Australia where four of six wildcat wells were cased and suspended as gas discoveries. There was also success in the offshore Otway Basin with the Martha gas discovery near the Casino field, which is currently being evaluated to determine its commercial significance. Additional drilling is planned to occur nearby in 2005 to follow up this encouraging result. Santos discovered gas in the United States at the Torres 1A onshore well, which was brought onto production only two months after drilling was completed. Other wells in the offshore Otway Basin included the deep water Amrit 1 well, which was plugged and abandoned after failing to intersect economic hydrocarbons, and Callister 1 which was also plugged and abandoned with gas shows.",False,0.03953798311861395,"xploration is a key growth driver for Santos and success with the drill bit is vital to adding value for Santos shareholders. During the past four years Santos has been working to build exploration opportunities by:
-
-• acquiring new
-exploration acreage
-
-- adding material
-exploration prospects
-
-• drilling wildcat
-exploration wells.
-
-## SUCCESS RATE OF 44% IN 2004
-
-Santos' 2004 exploration effort
-produced good results, as the
-Company high graded its
-exploration acreage and started
-drilling one of the most exciting
-portfolios in the industry.
-
-Santos discovered hydrocarbons
-in seven of the sixteen wildcat
-wells that were drilled, achieving
-an impressive success rate
-of 44%.
-
-The program added at least
-93 million boe (including the
-pre-drill estimate for Jeruk) of
-recoverable resources that will be
-further evaluated by delineation
-and, in some cases, production
-history to determine 1P and 2P
-reserve additions.
-
-Importantly, these results were
-achieved with financial discipline,
-spending $126 million which was
-substantially less than forecast.
-
-The most significant drilling result for the year was the Jeruk oil discovery in the Sampang PSC offshore East Java, Indonesia. The Jeruk discovery is still under evaluation but its commercial significance appears encouraging. Santos has confirmed an oil column of at least 379 metres with a likely gross recoverable resource in excess of the pre-drill estimate of 170 million barrels.
-
-Santos also had further
-exploration successes in the
-
-Cooper Basin in central Australia
-where four of six wildcat wells
-were cased and suspended as
-gas discoveries.
-
-There was also success in the
-offshore Otway Basin with the
-Martha gas discovery near the
-Casino field, which is currently
-being evaluated to determine
-its commercial significance.
-Additional drilling is planned to
-occur nearby in 2005 to follow
-up this encouraging result.
-
-Santos discovered gas in the United States at the Torres 1A onshore well, which was brought onto production only two months after drilling was completed.
-
-Other wells in the offshore Otway
-Basin included the deep water
-Amrit 1 well, which was plugged
-and abandoned after failing to
-intersect economic hydrocarbons,
-and Callister 1 which was also
-plugged and abandoned",0.021768103065304308,"is a key growth driver for Santos and success with the drill bit is vital to adding value for Santos shareholders. During the past four years Santos has been working to build exploration opportunities by:
-
-- acquiring new exploration acreage
-- adding material exploration prospects
-- drilling wildcat exploration wells.
-
-## SUCCESS RATE OF 44% IN 2004
-
-Santos' 2004 exploration effort produced good results, as the Company high graded its exploration acreage and started drilling one of the most exciting portfolios in the industry.
-
-Santos discovered hydrocarbons in seven of the sixteen wildcat wells that were drilled, achieving an impressive success rate of 44%.
-
-The program added at least 93 million boe (including the pre-drill estimate for Jeruk) of recoverable resources that will be further evaluated by delineation and, in some cases, production history to determine 1P and 2P reserve additions.
-
-Importantly, these results were achieved with financial discipline, spending \$126 million which was substantially less than forecast.
-
-The most significant drilling result for the year was the Jeruk oil discovery in the Sampang PSC offshore East Java, Indonesia. The Jeruk discovery is still under evaluation but its commercial significance appears encouraging. Santos has confirmed an oil column of at least 379 metres with a likely gross recoverable resource in excess of the pre-drill estimate of 170 million barrels. Santos also had further exploration successes in the
-
-Cooper Basin in central Australia where four of six wildcat wells were cased and suspended as gas discoveries.
-
-There was also success in the offshore Otway Basin with the Martha gas discovery near the Casino field, which is currently being evaluated to determine its commercial significance.
-
-Additional drilling is planned to occur nearby in 2005 to follow up this encouraging result.
-
-Santos discovered gas in the United States at the Torres 1A onshore well, which was brought onto production only two months after drilling was completed.
-
-Other wells in the offshore Otway Basin included the deep water Amrit 1 well, which was plugged and abandoned after failing to intersect economic hydrocarbons, and Callister 1 which was also plugged and abandoned with gas sh",0.13060861839182586,"cques-gouadain-placeholder.png)
->
-> ‘2004 was a great year for our explorers. We started drilling one of the most exciting portfolios in our industry and our success to date shows that our strategy of basin excellence is delivering.’
->
-> **JACQUES GOUADAIN**
-> Vice President
-> Geoscience and New Ventures
-
-## SUCCESS RATE OF 44% IN 2004
-
-Santos’ 2004 exploration effort produced good results, as the Company high graded its exploration acreage and started drilling one of the most exciting portfolios in the industry.
-
-Santos discovered hydrocarbons in seven of the sixteen wildcat wells that were drilled, achieving an impressive success rate of 44%.
-
-The program added at least 93 million boe (including the pre-drill estimate for Jeruk) of recoverable resources that will be further evaluated by delineation and, in some cases, production history to determine 1P and 2P reserve additions.
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-![Jack",0.02221235006663705,"loration is a key growth driver for Santos and success with the drill bit is vital to adding value for Santos shareholders. During the past four years Santos has been working to build exploration opportunities by:
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-- • adding material exploration prospects
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-94,0,"The Promise of Emerging Markets Expanding Poland’s Payment Infrastructure Although still under- developed compared to western economies, Poland is one of the most dynamic and promising markets in all of Europe. Since entering Poland in 1995, Euronet Worldwide has become one of the largest transaction processing service providers in the country, establishing a network of over 600 ATMs and providing software to eight major banks. Our agreement for electronic airtime distribution with all three mobile phone operators in the country – ERA GSM, Plus GSM and IDEA Centertel – further confirms that Euronet is embedded in the financial payments fabric in Poland.",False,0.2813918305597579,"ts of Central Europe, the Middle East, Africa, Asia-Pacific, Latin America and the Caribbean.
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-",0.26777609682299547,"sale (POS), interactive voice response (IVR), Internet, mobile solutions and other innovative payment options, we can play a vital role in developing the electronic payments fabric of these countries.
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-94,2,"While credit is used for electronic transactions in Western Europe and North America, the model is quite different in many ""cash-based"" economies around the world. And that's where Euronet continues to look for new opportunities - particularly in the emerging markets of Central Europe, the Middle East, Africa.",True,0.02572347266881029,"hile credit is used for electronic transactions in Western Europe and North America, the model is quite different in many “cash-based” economies around the world. And that’s where Euronet continues to look for new opportunities – particularly in the emerging
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-95,0,Santos is investing in the future of Australia’s petroleum industry through the funding of the Australian School of Petroleum at the University of Adelaide.,False,0.00641025641025641,Santos is investing in the future of Australia's petroleum industry through the funding of the Australian School of Petroleum at the University of Adelaide.,0.00641025641025641,Santos is investing in the future of Australia's petroleum industry through the funding of the Australian School of Petroleum at the University of Adelaide.,0.0,Santos is investing in the future of Australia’s petroleum industry through the funding of the Australian School of Petroleum at the University of Adelaide.,0.00641025641025641,Santos is investing in the future of Australia's petroleum industry through the funding of the Australian School of Petroleum at the University of Adelaide.,0.0,Santos is investing in the future of Australia’s petroleum industry through the funding of the Australian School of Petroleum at the University of Adelaide.,0.00641025641025641,Santos is investing in the future of Australia's petroleum industry through the funding of the Australian School of Petroleum at the University of Adelaide.,0.00641025641025641,Santos is investing in the future of Australia's petroleum industry through the funding of the Australian School of Petroleum at the University of Adelaide.,95,finance_samples
-95,1,"be working in business operations with a lean and efficient corporate and services group. With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed. As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%. CULTURE CHANGE The need to develop a culture that supports the newly designed business processes was another of the major outcomes of the change program. A Santos-wide culture change program led by employees is currently underway. This long-term program is designed to ensure that the way employees work together enhances Santos’ ability to be successful. One of the first tasks undertaken was a voluntary employee survey to identify the gaps between the existing culture and the desired culture. The outcomes of the survey will assist in the development of programs and activities that will better align work practices with Santos’ strategic goals. TRAINING AND DEVELOPING PEOPLE Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos’ human resources strategy. Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to support culture change initiatives.",False,0.052692530399536766,"ing in business operations
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-## CULTURE CHANGE
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-
-## TRAINING AND DEVELOPING
-
-PEOPLE
-
-Making sure training and
-development supports current
-and future business requirements,
-and provides opportunities for
-people to develop their skills to
-achieve optimum performance,
-are key aspects of Santos' human
-resources strategy.
-
-Santos has a number of long-term
-projects underway which will
-optimise the substantial
-investment the Company makes
-in training people. Importantly,
-these projects will deliver
-programs that are targeted to
-meet business and individual
-needs and to support culture
-change init",0.01910828025477707,"in business operations with a lean and efficient corporate and services group.
-
-With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed. As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%.
-
-# CULTURE CHANGE
-
-The need to develop a culture that supports the newly designed business processes was another of the major outcomes of the change program. A Santos-wide culture change program led by employees is currently underway.
-
-This long-term program is designed to ensure that the way employees work together enhances Santos' ability to be successful.
-
-One of the first tasks undertaken was a voluntary employee survey to identify the gaps between the existing culture and the desired culture. The outcomes of the survey will assist in the development of programs and activities that will better align work practices with Santos' strategic goals.
-
-# TRAINING AND DEVELOPING PEOPLE
-
-Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos' human resources strategy.
-
-Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to support culture change initiatives",0.02374059061957151,"g in business operations with a lean and efficient corporate and services group.
-
-With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed.
-
-As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%.
-
-### CULTURE CHANGE
-
-The need to develop a culture that supports the newly designed business processes was another of the major outcomes of the change program. A Santos-wide culture change program led by employees is currently underway.
-
-This long-term program is designed to ensure that the way employees work together enhances Santos’ ability to be successful.
-
-One of the first tasks undertaken was a voluntary employee survey to identify the gaps between the existing culture and the desired culture. The outcomes of the survey will assist in the development of programs and activities that will better align work practices with Santos’ strategic goals.
-
-### TRAINING AND DEVELOPING PEOPLE
-
-Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos’ human resources strategy.
-
-Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to support culture change init",0.021424435437174292,"rking in business operations with a lean and efficient corporate and services group.
-
-With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed. As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%.
-
-## CULTURE CHANGE
-
-The need to develop a culture that supports the newly designed business processes was another of the major outcomes of the change program. A Santos-wide culture change program led by employees is currently underway.
-
-This long-term program is designed to ensure that the way employees work together enhances Santos' ability to be successful.
-
-One of the first tasks undertaken was a voluntary employee survey to identify the gaps between the existing culture and the desired culture. The outcomes of the survey will assist in the development of programs and activities that will better align work practices with Santos' strategic goals.
-
-## TRAINING AND DEVELOPING PEOPLE
-
-Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos' human resources strategy.
-
-Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to support culture change ini",0.45454545454545453,"ng in business operations with a lean and efficient corporate and services group.
-
-With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed. As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%.
-
-One of the first tasks undertaken was a voluntary employee survey to identify the gaps between the existing culture and the desired culture. The outcomes of the survey will assist in the development of programs and activities that will better align work practices with Santos’ strategic goals.
-
-## **TRAINING AND DEVELOPING PEOPLE**
-
-Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos’ human resources strategy.
-
-## **CULTURE CHANGE**
-
-The need to develop a culture that supports the newly designed business processes was another of the major outcomes of the change program. A Santos-wide culture change program led by employees is currently underway.
-
-across Santos operations. The long-term environmental and financial benefits of using this technology are expected to be considerable.
-
-Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to sup",0.021424435437174292," working in business operations with a lean and efficient corporate and services group.
-
-With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed. As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%.
-
-## CULTURE CHANGE
-
-The need to develop a culture that supports the newly designed business processes was another of the major outcomes of the change program. A Santos-wide culture change program led by employees is currently underway.
-
-This long-term program is designed to ensure that the way employees work together enhances Santos' ability to be successful.
-
-One of the first tasks undertaken was a voluntary employee survey to identify the gaps between the existing culture and the desired culture. The outcomes of the survey will assist in the development of programs and activities that will better align work practices with Santos' strategic goals.
-
-## TRAINING AND DEVELOPING PEOPLE
-
-Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos' human resources strategy.
-
-Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to support culture change ",0.021424435437174292," working in business operations with a lean and efficient corporate and services group.
-
-With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed. As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%.
-
-## CULTURE CHANGE
-
-The need to develop a culture that supports the newly designed business processes was another of the major outcomes of the change program. A Santos-wide culture change program led by employees is currently underway.
-
-This long-term program is designed to ensure that the way employees work together enhances Santos' ability to be successful.
-
-One of the first tasks undertaken was a voluntary employee survey to identify the gaps between the existing culture and the desired culture. The outcomes of the survey will assist in the development of programs and activities that will better align work practices with Santos' strategic goals.
-
-## TRAINING AND DEVELOPING PEOPLE
-
-Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos' human resources strategy.
-
-Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to support culture change ",95,finance_samples
-95,2,"BANKSIA AWARDS Santos was selected in 2004 as a finalist in the Banksia Environmental Awards for the work undertaken in the Company- led initiative to protect the world-renowned Coongie Lakes, resulting in the area being declared a new National Park by the South Australian Government. As a finalist for this award Santos was recognised for its leadership role in bringing together a group of disparate parties to develop a Memorandum of Understanding recommending further protection for the Coongie Lakes. WASTE MANAGEMENT Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement. This technology will be implemented where possible",False,0.05104408352668213,"KSIA AWARDS
-
-Santos was selected in 2004
-as a finalist in the Banksia
-Environmental Awards for the
-work undertaken in the Company-
-led initiative to protect the
-world-renowned Coongie Lakes,
-resulting in the area being
-declared a new National Park by
-the South Australian Government.
-
-As a finalist for this award Santos
-was recognised for its leadership
-role in bringing together a group
-of disparate parties to develop a
-Memorandum of Understanding
-recommending further protection
-for the Coongie Lakes.
-
-## WASTE MANAGEMENT
-
-Santos trialled innovative waste
-management techniques during
-2004 to reduce the volume of
-hydrocarbon waste generated
-from Cooper Basin operations.
-Preliminary results indicate that
-these waste volumes can be
-reduced to 3-5% of their original
-volume, which is a significant
-achievement.
-
-This technology will be
-implemented where pos",0.02088167053364269,"KSIA AWARDS
-
-Santos was selected in 2004 as a finalist in the Banksia Environmental Awards for the work undertaken in the Company-led initiative to protect the world-renowned Coongie Lakes, resulting in the area being declared a new National Park by the South Australian Government.
-
-As a finalist for this award Santos was recognised for its leadership role in bringing together a group of disparate parties to develop a Memorandum of Understanding recommending further protection for the Coongie Lakes.
-
-# WASTE MANAGEMENT
-
-Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement.
-
-This technology will be implemented where possi",0.025522041763341066,"ANKSIA AWARDS
-
-Santos was selected in 2004 as a finalist in the Banksia Environmental Awards for the work undertaken in the Company-led initiative to protect the world-renowned Coongie Lakes, resulting in the area being declared a new National Park by the South Australian Government.
-
-As a finalist for this award Santos was recognised for its leadership role in bringing together a group of disparate parties to develop a Memorandum of Understanding recommending further protection for the Coongie Lakes.
-
-### WASTE MANAGEMENT
-
-Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement.
-
-This technology will be implemented where p",0.02320185614849188,"NKSIA AWARDS
-
-Santos was selected in 2004 as a finalist in the Banksia Environmental Awards for the work undertaken in the Company-led initiative to protect the world-renowned Coongie Lakes, resulting in the area being declared a new National Park by the South Australian Government.
-
-As a finalist for this award Santos was recognised for its leadership role in bringing together a group of disparate parties to develop a Memorandum of Understanding recommending further protection for the Coongie Lakes.
-
-## WASTE MANAGEMENT
-
-Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement.
-
-This technology will be implemented where pos",0.36078886310904873,"onal greenhouse gas teams that have the right skill sets and responsibilities to progress this initiative. These teams will manage Greenhouse Policy and regulation, carbon management and trading opportunities, and energy efficiency. A key internal driver for emissions reduction will be the promotion of energy efficiency.
-
-was recognised for its leadership role in bringing together a group of disparate parties to develop a Memorandum of Understanding recommending further protection for the Coongie Lakes.
-
-## **WASTE MANAGEMENT**
-
-Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement.
-
-Santos is committed to achieving e",0.02320185614849188,"IA AWARDS
-
-Santos was selected in 2004 as a finalist in the Banksia Environmental Awards for the work undertaken in the Companyled initiative to protect the world-renowned Coongie Lakes, resulting in the area being declared a new National Park by the South Australian Government.
-
-As a finalist for this award Santos was recognised for its leadership role in bringing together a group of disparate parties to develop a Memorandum of Understanding recommending further protection for the Coongie Lakes.
-
-## WASTE MANAGEMENT
-
-Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement.
-
-This technology will be implemented where possibl",0.02320185614849188,"IA AWARDS
-
-Santos was selected in 2004 as a finalist in the Banksia Environmental Awards for the work undertaken in the Companyled initiative to protect the world-renowned Coongie Lakes, resulting in the area being declared a new National Park by the South Australian Government.
-
-As a finalist for this award Santos was recognised for its leadership role in bringing together a group of disparate parties to develop a Memorandum of Understanding recommending further protection for the Coongie Lakes.
-
-## WASTE MANAGEMENT
-
-Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement.
-
-This technology will be implemented where possibl",95,finance_samples
-96,0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,False,0.0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,0.0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,0.0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,0.0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,0.0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,0.0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,0.0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,96,finance_samples
-96,1,"Because of its relatively low operating costs, the Eagle Ford to remains profitable during current oil commodity pricing conditions. Sundance has quickly transformed the Eagle Ford position acquired in its merger with Texon Petroleum Ltd to its most valuable asset in its portfolio through development and growing its drilling inventory. In 2014, the Company brought 35 gross (26.1 net) Eagle Ford wells into production by D&P investments of $244 million. Through $26 million of direct mineral leases and $36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations. Since its entrance into the Eagle Ford in March 2013, the Company has: • increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR); • increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of $449.3 million (an 18x increase)); • increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County); • increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end; • increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)",False,0.23067010309278352,"105 | ~3.5 |
-| JAN-14 | ~35 | ~55 | ~90 | ~2.8 |
-| JAN-15 | ~50 | ~100 | ~150 | ~4.3 |
-
-In 2014, the Company brought 35 gross (26.1 net) Eagle Ford wells into production by D&P investments of $244 million. Through $26 million of direct mineral leases and $36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
-
-Since its entrance into the Eagle Ford in March 2013, the Company has:
-
-PROVED
-
-PROBABLE AND POSSIBLE
-
--DRILLING INVENTORY (YEARS)
-
-• increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR);
-
-• increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of $449.3 million (an 18x increase));
-
-• increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-
-• increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end; • increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)",0.20876288659793815,"SSIBLE | DRILLING INVENTORY (YEARS) |
-|--------|--------|-----------------------|----------------------------|
-| JAN-13 | ~10 | ~100 | ~1.5 |
-| JAN-14 | ~10 | ~80 | ~1.0 |
-| JAN-15 | ~10 | ~150 | ~4.5 |
-
-In 2014, the Company brought 35 gross (26.1 net) Eagle Ford wells into production by D&P investments of \$244 million. Through \$26 million of direct mineral leases and \$36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
-
-Since its entrance into the Eagle Ford in March 2013, the Company has:
-
-- increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR);
-- increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of \$449.3 million (an 18x increase));
-- increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-- increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end;
-- increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)
-",0.026417525773195876,"s relatively low operating costs, the Eagle Ford remains profitable during current oil commodity pricing conditions. Sundance has quickly transformed the Eagle Ford position acquired in its merger with Texon Petroleum Ltd to its most valuable asset in its portfolio through development and growing its drilling inventory.
-
-In 2014, the Company brought 35 gross (26.1 net) Eagle Ford wells into production by D&P investments of \$244 million. Through \$26 million of direct mineral leases and \$36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
-
-Since its entrance into the Eagle Ford in March 2013, the Company has:
-
-* increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR);
-* increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of \$449.3 million (an 18x increase));
-* increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-* increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end;
-* increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing",0.19072164948453607,"| E\&E Capital Invested and Acquisitions | $ 59,903 |
-| Gross producing wells | 77 |
-| Net Producing wells | 53.8 |
-| Gross Wells in Progress | 19 |
-| Net Wells in Progress | 10.6 |
-| Net Acres | 26,160 |
-
-
-In 2014, the Company brought 35 gross (26.1 net) Eagle Ford wells into production by D&P investments of $244 million. Through $26 million of direct mineral leases and $36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
-
-Since its entrance into the Eagle Ford in March 2013, the Company has:
-
-• increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR);
-
-• increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of $449.3 million (an 18x increase));
-
-• increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-
-• increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end;
-
-• increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)",0.4735824742268041," picture [192 x 138] intentionally omitted <==**
-
-production by D&P investments of $244 million. Through $26 million of direct mineral leases and $36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled
-
-3P Reserves locations.
-
-Since its entrance into the Eagle Ford in March 2013, the Company has:
-
-- • increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR);
-
-- • increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of $449.3 million (an 18x increase));
-
-- • increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-
-- • increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end;
-
-**EAGLE FORD CONSTANT CASE RESERVES** _As at and for the Year Ended 31 December 2014_
-
-|1P Reserves (mboe)|18,131.9|
-|---|---|
-|3P Reserves (mboe)|100,404.1|
-|1P Reserves (PV10 ($000s))|$ 449,287.5|
-|3P Reserves (PV10 ($000s))|$ 1,202,313.1|
-|Net 1P Reserves Drilling Locations|42.6|
-|Net 3P Reserves Drilling Locations|153.7|
-
-
-
-• increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)
-",0.23518041237113402," |
-| D&P Capital Invested | $ 244,134 |
-| E&E Capital Invested and Acquisitions | $ 59,903 |
-| Gross producing wells | 77 |
-| Net Producing wells | 53.8 |
-| GrossWells in Progress | 19 |
-| NetWells in Progress | 10.6 |
-| Net Acres | 26,160 |
-
-production by D&P investments of $244 million. Through $26 million of direct mineral leases and $36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
-
-Since its entrance into the Eagle Ford in March 2013, the Company has:
-
-- increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR);
-- increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of $449.3 million (an 18x increase));
-- increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-
-· increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end; · increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)
-
-E",0.23646907216494845," |
-| D&P Capital Invested | $ 244,134 |
-| E&E Capital Invested and Acquisitions | $ 59,903 |
-| Gross producing wells | 77 |
-| Net Producing wells | 53.8 |
-| GrossWells in Progress | 19 |
-| NetWells in Progress | 10.6 |
-| Net Acres | 26,160 |
-
-production by D&P investments of $244 million. Through $26 million of direct mineral leases and $36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
-
-Since its entrance into the Eagle Ford in March 2013, the Company has:
-
-- increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR);
-- increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of $449.3 million (an 18x increase));
-- increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-
-· increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end; · increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)
-
-TEX",96,finance_samples
-97,0,"1) The Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of $3,044 creating deferred tax assets, of which $2,064 were unrecognized.",False,0.0,"1) The Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of $3,044 creating deferred tax assets, of which $2,064 were unrecognized.",0.014388489208633094," The Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of \$3,044 creating deferred tax assets, of which \$2,064 were unrecognized.",0.0035971223021582736,"1. The Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of $3,044 creating deferred tax assets, of which $2,064 were unrecognized.",0.0,"1) The Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of $3,044 creating deferred tax assets, of which $2,064 were unrecognized.",0.07194244604316546," Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant|
-|||portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of $3,044|
-|||creating deferred tax assets, of which $2,064 were unrecogniz",0.007194244604316547,"1) The Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of $3,044 creating deferred tax assets, of which $2,064 were unrecognized",0.007194244604316547,"1) The Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of $3,044 creating deferred tax assets, of which $2,064 were unrecognized",97,finance_samples
-98,0,ENHANCING THE PORTFOLIO,False,0.0,ENHANCING THE PORTFOLIO,0.0,ENHANCING THE PORTFOLIO,0.0,ENHANCING THE PORTFOLIO,0.0,ENHANCING THE PORTFOLIO,0.0,ENHANCING THE PORTFOLIO,0.0,ENHANCING THE PORTFOLIO,0.0,ENHANCING THE PORTFOLIO,98,finance_samples
-98,1,"In 2004, Santos continued its normal business of actively managing its portfolio through the divestment of non-core assets and the acquisition of assets that fit well with existing Santos assets or can add to the ability of the Company to meet its strategic goals. As a result of this activity, Santos realised an after-tax profit of $47.4 million on oil and gas asset sales and will continue to high-grade its portfolio on an ongoing basis. Santos entered into an agreement with PT Medco during the first half of 2004 to acquire some of Novus Petroleum’s Indonesian and Cooper Basin assets conditional on the success of PT Medco’s takeover offer for Novus, which was ultimately successful. Specifically, Santos announced in September 2004 that it had executed formal agreements to acquire an additional 4.75% of the South Australian Cooper Basin, 18% of the Brantas PSC and 9% of the Kakap PSC from Medco for US$110 million. On 31 December 2004, Santos paid Medco US$98 million for the majority of the assets, with payment for the remaining 2.75% of Kakap PSC expected to be made in the first quarter of 2005. This acquisition was an important piece in the strategic puzzle to tie up access to follow-up potential from the successful exploration at Jeruk and to provide a production base for the newly established Indonesian core area. Also during the first half of 2004, Santos divested its remaining 18.4% shareholding in Magellan Petroleum Australia Ltd, raising approximately $10.6 million. Early in the second half of 2004, Santos concluded the sale of its non-core onshore Otway Basin interests to Origin Energy for $25.75 million. This sale resulted in an after-tax profit of $18 million that was booked in 2004.",False,0.026744186046511628,"2004, Santos continued its
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-fit well with existing Santos
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-As a result of this activity, Santos realised an after-tax profit of $47.4 million on oil and gas asset sales and will continue to high-grade its portfolio on an ongoing basis.
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-Santos entered into an agreement with PT Medco during the first half of 2004 to acquire some of Novus Petroleum's Indonesian and Cooper Basin assets conditional on the success of PT Medco's takeover offer for Novus, which was ultimately successful.
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-Specifically, Santos announced in September 2004 that it had executed formal agreements to acquire an additional 4.75% of the South Australian Cooper Basin, 18% of the Brantas PSC and 9% of the Kakap PSC from Medco for US$110 million. On 31 December 2004, Santos paid Medco US$98 million for the majority of the assets, with payment for the remaining 2.75% of Kakap PSC expected to be made in the first quarter of 2005.
-
-This acquisition was an important
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-tie up access to follow-up
-potential from the successful
-exploration at Jeruk and to
-provide a production base for
-the newly established Indonesian
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-
-Also during the first half of 2004, Santos divested its remaining 18.4% shareholding in Magellan
-
-Petroleum Australia Ltd, raising
-approximately $10.6 million.
-
-Early in the second half of 2004,
-Santos concluded the sale of its
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-interests to Origin Energy for
-$25.75 million. This sale
-resulted in an after-tax profit
-of $18 million that was booked
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-This acquisition was an important piece in the strategic puzzle to tie up access to follow-up potential from the successful exploration at Jeruk and to provide a production base for the newly established Indonesian core area.
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-Also during the first half of 2004, Santos divested its remaining 18.4% shareholding in Magellan
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-Early in the second half of 2004, Santos concluded the sale of its non-core onshore Otway Basin interests to Origin Energy for \$25.75 million. This sale resulted in an after-tax profit of \$18 million that was booked in",0.010465116279069767,"2004, Santos continued its normal business of actively managing its portfolio through the divestment of non-core assets and the acquisition of assets that fit well with existing Santos assets or can add to the ability of the Company to meet its strategic goals.
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-This acquisition was an important piece in the strategic puzzle to tie up access to follow-up potential from the successful exploration at Jeruk and to provide a production base for the newly established Indonesian core area.
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-As a result of this activity, Santos realised an after-tax profit of $47.4 million on oil and gas asset sales and will continue to high-grade its portfolio on an ongoing basis.
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-
-This acquisition was an important piece in the strategic puzzle to tie up access to follow-up potential from the successful exploration at Jeruk and to provide a production base for the newly established Indonesian core area.
-
-Also during the first half of 2004, Santos divested its remaining 18.4% shareholding in Magellan Petroleum Australia Ltd, raising approximately $10.6 million.
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-Early in the second half of 2004, Santos concluded the sale of its non-core onshore Otway Basin interests to Origin Energy for $25.75 million. This sale resulted in an after-tax profit of $18 million that was booked in 2",0.01627906976744186,"n 2004, Santos continued its normal business of actively managing its portfolio through the divestment of non-core assets and the acquisition of assets that fit well with existing Santos assets or can add to the ability of the Company to meet its strategic goals.
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-As a result of this activity, Santos realised an after-tax profit of $47.4 million on oil and gas asset sales and will continue to high-grade its portfolio on an ongoing basis.
-
-Santos entered into an agreement with PT Medco during the first half of 2004 to acquire some of Novus Petroleum’s Indonesian and Cooper Basin assets conditional on the success of PT Medco’s takeover offer for Novus, which was ultimately successful.
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-Specifically, Santos announced in September 2004 that it had executed formal agreements to acquire an additional 4.75% of the South Australian Cooper Basin, 18% of the Brantas PSC and 9% of the Kakap PSC from Medco for US$110 million. On 31 December 2004, Santos paid Medco US$98 million for the majority of the assets, with payment for the remaining 2.75% of Kakap PSC expected to be made in the first quarter of 2005.
-
-This acquisition was an important piece in the strategic puzzle to tie up access to follow-up potential from the successful exploration at Jeruk and to provide a production base for the newly established Indonesian core area.
-
-Also during the first half of 2004, Santos divested its remaining 18.4% shareholding in Magellan
-
-Petroleum Australia Ltd, raising approximately $10.6 million.
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-As a result of this activity, Santos realised an after-tax profit of $47.4 million on oil and gas asset sales and will continue to high-grade its portfolio on an ongoing basis.
-
-Santos entered into an agreement with PT Medco during the first half of 2004 to acquire some of Novus Petroleum's Indonesian and Cooper Basin assets conditional on the success of PT Medco's takeover offer for Novus, which was ultimately successful.
-
-Specifically, Santos announced in September 2004 that it had executed formal agreements to acquire an additional 4.75% of the South Australian Cooper Basin, 18% of the Brantas PSC and 9% of the Kakap PSC from Medco for US$110 million. On 31 December 2004, Santos paid Medco US$98 million for the majority of the assets, with payment for the remaining 2.75% of Kakap PSC expected to be made in the first quarter of 2005.
-
-This acquisition was an important piece in the strategic puzzle to tie up access to follow-up potential from the successful exploration at Jeruk and to provide a production base for the newly established Indonesian core area.
-
-Also during the first half of 2004, Santos divested its remaining 18.4% shareholding in Magellan
-
-Petroleum Australia Ltd, raising approximately $10.6 million.
-
-Early in the second half of 2004, Santos concluded the sale of its non-core onshore Otway Basin interests to Origin Energy for $25.75 million. This sale resulted in an after-tax profit of $18 million that was booked i",0.013372093023255814,"In 2004, Santos continued its normal business of actively managing its portfolio through the divestment of non-core assets and the acquisition of assets that fit well with existing Santos assets or can add to the ability of the Company to meet its strategic goals.
-
-As a result of this activity, Santos realised an after-tax profit of $47.4 million on oil and gas asset sales and will continue to high-grade its portfolio on an ongoing basis.
-
-Santos entered into an agreement with PT Medco during the first half of 2004 to acquire some of Novus Petroleum's Indonesian and Cooper Basin assets conditional on the success of PT Medco's takeover offer for Novus, which was ultimately successful.
-
-Specifically, Santos announced in September 2004 that it had executed formal agreements to acquire an additional 4.75% of the South Australian Cooper Basin, 18% of the Brantas PSC and 9% of the Kakap PSC from Medco for US$110 million. On 31 December 2004, Santos paid Medco US$98 million for the majority of the assets, with payment for the remaining 2.75% of Kakap PSC expected to be made in the first quarter of 2005.
-
-This acquisition was an important piece in the strategic puzzle to tie up access to follow-up potential from the successful exploration at Jeruk and to provide a production base for the newly established Indonesian core area.
-
-Also during the first half of 2004, Santos divested its remaining 18.4% shareholding in Magellan
-
-Petroleum Australia Ltd, raising approximately $10.6 million.
-
-Early in the second half of 2004, Santos concluded the sale of its non-core onshore Otway Basin interests to Origin Energy for $25.75 million. This sale resulted in an after-tax profit of $18 million that was booked i",98,finance_samples
-99,0,"Chesapeake’s Five-Year and Ten-Year Common Stock Performance The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an invest- ment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.",False,0.005928853754940711,"Chesapeake’s Five-Year and Ten-Year Common Stock Performance The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.
-",0.015810276679841896,"hesapeake's Five-Year and Ten-Year Common Stock Performance
-
-The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of \$100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of \$100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.",0.01383399209486166,"hesapeake’s Five-Year and Ten-Year Common Stock Performance
-
-The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of \$100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of \$100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.",0.011857707509881422,"Chesapeake's Five-Year and Ten-Year Common Stock Performance
-
-The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.
-",0.11067193675889328,"p., Devon Energy Corp., Encana Corp. and EOG Resources, Inc.
-
-The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.",0.037549407114624504,"sapeake's Five-Year and Ten-Year Common Stock Performance
-
-80 The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an invest -ment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each ",0.037549407114624504,"sapeake's Five-Year and Ten-Year Common Stock Performance
-
-80 The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an invest -ment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each ",99,finance_samples
-100,0,"This has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low, there is likely to be a material decline in U.S. production (say 8-9%) over the course of 2016.",False,0.0,"This has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low, there is likely to be a material decline in U.S. production (say 8-9%) over the course of 2016.",0.0,"This has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low, there is likely to be a material decline in U.S. production (say 8-9%) over the course of 2016.",0.0,"This has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low, there is likely to be a material decline in U.S. production (say 8-9%) over the course of 2016.",0.0,"This has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low, there is likely to be a material decline in U.S. production (say 8-9%) over the course of 2016.",0.0106951871657754,"his has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low, there is likely to be a material decline in U.S. production (say 8-9%) over the course of 20",0.013368983957219251,"his has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low , there is likely to be a material decline in U.S. production (say 8-9%) over the course of 2",0.013368983957219251,"his has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low , there is likely to be a material decline in U.S. production (say 8-9%) over the course of 2",100,finance_samples
-100,1,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,False,0.0,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,0.0,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,0.0,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,0.0,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,0.0,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,0.0,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,0.0,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,100,finance_samples
-101,0,"ADDING MATERIAL PROSPECTS Santos is now in a position that exploration success in 2004 and good acreage management has created future options that will ultimately translate into greater value for the business in 2005 and beyond. This has been achieved by focusing on ‘basin excellence’. This means becoming a technical leader in basins, within our focus areas, entering early where possible to keep entry costs down, balancing the commercial and the technical risks and selecting the right co-venturers. An example of this is the strong position Santos has created in the Kutei Basin, with interests in three neighbouring production sharing contracts: Popodi, Donggala and Papalang. 2004 also marked the year that Santos drilled its first operated deep water wells – a significant achievement for a company that had its beginnings in a desert environment.",False,0.39766081871345027,"ADDING MATERIAL PROSPECTS
-Santos is now in a position that
-exploration success in 2004 and
-good acreage management has
-created future options that will
-ultimately translate into greater
-value for the business in 2005
-and beyond.
-
-This has been achieved by
-focusing on 'basin excellence.
-This means becoming a technical
-leader in basins, within our focus
-areas, entering early where
-possible to keep entry costs
-down, balancing the commercial
-and the technical risks and
-selecting the right co-venturers.
-
-## 2004 EXPLORATION
-
-EXPENDITURE BY CATEGORY
-
-| Category | Amount (million $) | % of total |
-|---|---:|---:|
-| Drilling | $63.6 | 50.7% |
-| Geoscience and other | $37.5 | 29.9% |
-| Seismic | $17.2 | 13.7% |
-| New ventures | $7.3 | 5.8% |
-| **Total** | **$125.6** | **100%** |
-
-## 2004 EXPLORATION
-
-EXPENDITURE BY REGION
-
-[x]
-
-Offshore Australia
-
-$32.",0.36374269005847953," ADDING MATERIAL PROSPECTS
-
-Santos is now in a position that exploration success in 2004 and good acreage management has created future options that will ultimately translate into greater value for the business in 2005 and beyond.
-
-This has been achieved by focusing on 'basin excellence'. This means becoming a technical leader in basins, within our focus areas, entering early where possible to keep entry costs down, balancing the commercial and the technical risks and selecting the right co-venturers.
-
-## 2004 EXPLORATION EXPENDITURE BY CATEGORY
-
-
-
-Pie chart showing 2004 exploration expenditure by category.
-
-- Drilling \$63.6 million
-- Geoscience and other \$37.5 million
-- Seismic \$17.2 million
-- New ventures \$7.3 million
-
-An example of th",0.021052631578947368,"DING MATERIAL PROSPECTS
-
-Santos is now in a position that exploration success in 2004 and good acreage management has created future options that will ultimately translate into greater value for the business in 2005 and beyond.
-
-This has been achieved by focusing on ‘basin excellence’. This means becoming a technical leader in basins, within our focus areas, entering early where possible to keep entry costs down, balancing the commercial and the technical risks and selecting the right co-venturers.
-
-> An example of this is the strong position Santos has created in the Kutei Basin, with interests in three neighbouring production sharing contracts: Popodi, Donggala and Papalang.
-
-> 2004 also marked the year that Santos drilled its first operated deep water wells – a significant achievement for a company that had its beginnings in a desert enviro",0.37894736842105264,"
-## ADDING MATERIAL PROSPECTS
-
-Santos is now in a position that exploration success in 2004 and good acreage management has created future options that will ultimately translate into greater value for the business in 2005 and beyond.
-
-This has been achieved by focusing on 'basin excellence'. This means becoming a technical leader in basins, within our focus areas, entering early where possible to keep entry costs down, balancing the commercial and the technical risks and selecting the right co-venturers.
-
-## 2004 EXPLORATION EXPENDITURE BY CATEGORY
-
-| Category | Amount |
-| -------------------- | ------------- |
-| Drilling | $63.6 million |
-| Geoscience and other | $37.5 million |
-| Seismic | $17.2 million |
-| New ventures | $7.3 million |
-
-
-## 2004 EXPLORATION EXPENDITURE BY REGION
-
-| Region",0.36374269005847953,"ADDING MATERIAL PROSPECTS** Santos is now in a position that exploration success in 2004 and good acreage management has created future options that will ultimately translate into greater value for the business in 2005 and beyond.
-
-This has been achieved by focusing on ‘basin excellence’. This means becoming a technical leader in basins, within our focus areas, entering early where possible to keep entry costs down, balancing the commercial and the technical risks and selecting the right co-venturers.
-
-**2004 EXPLORATION EXPENDITURE BY CATEGORY**
-
-**2004 EXPLORATION EXPENDITURE BY REGION**
-
-**==> picture [65 x 82] intentionally omitted <==**
-
-- Drilling $63.6 million
-
- - Offshore Australia $32.6 million Onshore Australia $23.4 million South East Asia $41.4 million United States $28.2 million
-
-- Geoscience and other $37.5 million
-
-- Se",0.2573099415204678,"IAL PROSPECTS Santos is now in a position that exploration success in 2004 and good acreage management has created future options that will ultimately translate into greater value for the business in 2005 and beyond.
-
-This has been achieved by focusing on 'basin excellence' . This means becoming a technical leader in basins, within our focus areas, entering early where possible to keep entry costs down, balancing the commercial and the technical risks and selecting the right co-venturers.
-
-## 2004 EXPLORATION EXPENDITURE BY CATEGORY
-
-## 2004 EXPLORATION EXPENDITURE BY REGION
-
-
-
-An example of this is the strong position Santos has created in the Kutei Basin, with interests in three neighbouring production sharing contracts: Popodi, Donggala and Papalang.
-
-2004 also marked the year that Santos drilled its first operated deep water ",0.2573099415204678,"IAL PROSPECTS Santos is now in a position that exploration success in 2004 and good acreage management has created future options that will ultimately translate into greater value for the business in 2005 and beyond.
-
-This has been achieved by focusing on 'basin excellence' . This means becoming a technical leader in basins, within our focus areas, entering early where possible to keep entry costs down, balancing the commercial and the technical risks and selecting the right co-venturers.
-
-## 2004 EXPLORATION EXPENDITURE BY CATEGORY
-
-## 2004 EXPLORATION EXPENDITURE BY REGION
-
-
-
-An example of this is the strong position Santos has created in the Kutei Basin, with interests in three neighbouring production sharing contracts: Popodi, Donggala and Papalang.
-
-2004 also marked the year that Santos drilled its first operated deep water ",101,finance_samples
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-103,0,"(1) Types of Risk to Be Managed At SMFG, we classify risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk catego- ries are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group. (2) Fundamental Principles and Basic Policies for Risk Management SMFG’s Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspec- tives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring con- sistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group companies.",False,0.013015184381778741,"1) Types of Risk to Be Managed
-
-At SMFG, we classify risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk categories are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group.
-
-## (2) Fundamental Principles and Basic Policies for Risk
-Management
-
-SMFG’s Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspectives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring consistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group companie",0.010845986984815618,"(1) Types of Risk to Be Managed
-
-At SMFG, we classify risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk categories are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group.
-
-## (2) Fundamental Principles and Basic Policies for Risk Management
-
-SMFG's Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspectives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring consistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group companies.",0.011569052783803326,"1) Types of Risk to Be Managed
-
-At SMFG, we classify risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk categories are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group.
-
-### (2) Fundamental Principles and Basic Policies for Risk Management
-
-SMFG’s Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspectives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring consistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group companies.",0.010845986984815618,"(1) Types of Risk to Be Managed
-
-At SMFG, we classify risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk categories are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group.
-
-## (2) Fundamental Principles and Basic Policies for Risk Management
-
-SMFG's Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspectives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring consistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group companies.",0.023138105567606652," of Risk to Be Managed**
-
-At SMFG, we classify risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk categories are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group.
-
-## **(2) Fundamental Principles and Basic Policies for Risk Management**
-
-SMFG’s Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspectives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring consistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group companies",0.09255242227042661," risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk categories are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group.
-
-## ■ SMFG's Risk Management System
-
-
-
-32
-
-## (2) Fundamental Principles and Basic Policies for Risk Management
-
-SMFG's Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspectives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring consistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group compa",0.09255242227042661," risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk categories are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group.
-
-## ■ SMFG's Risk Management System
-
-
-
-32
-
-## (2) Fundamental Principles and Basic Policies for Risk Management
-
-SMFG's Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspectives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring consistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group compa",103,finance_samples
-104,0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",False,0.0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",0.0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",0.0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",0.0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",0.0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",0.0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",0.0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",104,finance_samples
-104,1,"LEADER IN CANADIAN COMMUNICATIONS INDUSTRY Canada’s largest wireless carrier and a leading cable television provider, offering a “quadruple play” of wireless, Internet, television and telephony services to consumers and businesses.",False,0.017316017316017316,"EADER IN CANADIAN
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-Canada's largest wireless carrier and a leading cable television provider, offering a 'quadruple play' of wireless, Internet, television and telephony services to consumers and businesses",104,finance_samples
-104,2,MUST-HAVE PRODUCTS AND SERVICES A leading provider of communications and entertainment products and services that are increasingly becoming integrated necessities in today’s world.,False,0.03888888888888889,"MUST-HAVE PRODUCTS
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-A leading provider of communications
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-A leading provider of communications and entertainment products and services that are increasingly becoming integrated necessities in today's world.",0.022222222222222223,"UST-HAVE PRODUCTS AND SERVICES
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-A leading provider of communications and entertainment products and services that are increasingly becoming integrated necessities in today's world.",104,finance_samples
-104,3,"CATEGORY-LEADING MEDIA ASSETS Unique and complementary collection of leading broadcast radio and television, specialty TV, sports entertainment, publishing and digital media assets.",False,0.049723756906077346,"ATEGORY-LEADING
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-
-Unique and complementary collection
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-Unique and complementary collection of leading broadcast radio and television, specialty TV, sports entertainment, publishing and digital media assets",0.8011049723756906," CANADIAN COMMUNICATIONS INDUSTRY**
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-Canada’s largest wireless carrier and a leading cable television provider, offering a “quadruple play” of wireless, Internet, television and te",0.016574585635359115,"ATEGORY-LEADING MEDIA ASSETS
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-Unique and complementary collection of leading broadcast radio and television, specialty TV, sports entertainment, publishing and digital media assets.",0.016574585635359115,"ATEGORY-LEADING MEDIA ASSETS
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-104,4,"SUPERIOR ASSET MIX Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry.",False,0.017857142857142856,"SUPERIOR ASSET MIX
-
-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry",0.017857142857142856,"SUPERIOR ASSET MIX
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-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry",0.005952380952380952,"SUPERIOR ASSET MIX
-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry.",0.017857142857142856,"SUPERIOR ASSET MIX
-
-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry",0.125," omitted <==**
-
-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry.
-
-",0.017857142857142856,"SUPERIOR ASSET MIX
-
-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry",0.017857142857142856,"SUPERIOR ASSET MIX
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-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry",104,finance_samples
-104,5,"STRONG FRANCHISES AND POWERFUL BRANDS Strong franchises with nationally recognized and highly respected brands that stand solidly in Canada for innovation, choice and value.",False,0.04046242774566474,"STRONG FRANCHISES
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-
-Strong franchises with nationally
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-Strong franchises with nationally recognized and highly respected brands that stand solidly in Canada for innovation, choice and value",0.005780346820809248,"STRONG FRANCHISES AND POWERFUL BRANDS
-Strong franchises with nationally recognized and highly respected brands that stand solidly in Canada for innovation, choice and value.",0.017341040462427744,"STRONG FRANCHISES AND POWERFUL BRANDS
-
-Strong franchises with nationally recognized and highly respected brands that stand solidly in Canada for innovation, choice and value",0.6763005780346821,"## **WHY INVEST** IN ROGERS
-
-**Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven manage",0.017341040462427744,"STRONG FRANCHISES AND POWERFUL BRANDS
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-Strong franchises with nationally recognized and highly respected brands that stand solidly in Canada for innovation, choice and value",0.017341040462427744,"STRONG FRANCHISES AND POWERFUL BRANDS
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-Strong franchises with nationally recognized and highly respected brands that stand solidly in Canada for innovation, choice and value",104,finance_samples
-104,6,"LEADING NETWORKS AND INNOVATIVE PRODUCTS Leading wireless and broadband network platforms that deliver the most innovative communications, information and entertainment services.",False,0.0449438202247191,"LEADING NETWORKS
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-
-Leading wireless and broadband
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-Leading wireless and broadband network platforms that deliver the most innovative communications, information and entertainment services",0.7471910112359551," and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry.
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-**==> picture [117 x 21] intentionally omitte",0.016853932584269662,"EADING NETWORKS AND INNOVATIVE PRODUCTS
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-Leading wireless and broadband network platforms that deliver the most innovative communications, information and entertainment services.",0.016853932584269662,"EADING NETWORKS AND INNOVATIVE PRODUCTS
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-Leading wireless and broadband network platforms that deliver the most innovative communications, information and entertainment services.",104,finance_samples
-104,7,"PROVEN LEADERSHIP AND ENGAGED EMPLOYEE BASE Experienced, performance-oriented management and operating teams with solid industry expertise, supported by the spirit of innovation and an entrepreneurial culture.",False,0.03827751196172249,"ROVEN LEADERSHIP AND
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-
-Experienced, performance-oriented
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-Experienced, performance-oriented management and operating teams with solid industry expertise, supported by the spirit of innovation and an entrepreneurial culture",0.7033492822966507,"## **WHY INVEST** IN ROGERS
-
-**Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long re",0.20095693779904306,"
-
-## FINANCIAL STRENGTH AND FLEXIBILITY
-
-Experienced, performance-oriented management and operating teams with solid industry expertise, supported by the spirit of innovation and an entrepreneurial culture.
-
-F",0.20095693779904306,"
-
-## FINANCIAL STRENGTH AND FLEXIBILITY
-
-Experienced, performance-oriented management and operating teams with solid industry expertise, supported by the spirit of innovation and an entrepreneurial culture.
-
-F",104,finance_samples
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-104,9,"HEALTHY TRADING VOLUME AND GROWING DIVIDENDS RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of $1.83 per share in 2014.",False,0.01694915254237288,"EALTHY TRADING VOLUME
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-RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of $1.83 per share in 2014.",0.0211864406779661,"EALTHY TRADING VOLUME AND GROWING DIVIDENDS
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-RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of \$1.83 per share in 2014",0.00423728813559322,"HEALTHY TRADING VOLUME AND GROWING DIVIDENDS
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-RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of $1.83 per share in 2014.",0.8177966101694916,"HY INVEST** IN ROGERS
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-**Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength ",0.012711864406779662,"HEALTHY TRADING VOLUME AND GROWING DIVIDENDS
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-105,6,"DEFINING RESERVES Santos has in place an evaluation and reporting process that is in line with international industry practice and is in general conformity with reserves definitions and resource classification systems published by the Society of Petroleum Engineers (SPE), World Petroleum Congress (WPC) and the American",False,0.0375,"EFINING RESERVES
-
-Santos has in place an evaluation
-and reporting process that is in
-line with international industry
-practice and is in general
-conformity with reserves
-definitions and resource
-classification systems published by
-the Society of Petroleum Engineers
-(SPE), World Petroleum Congress
-(WPC) and the American",0.009375,"EFINING RESERVES
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-Santos has in place an evaluation and reporting process that is in line with international industry practice and is in general conformity with reserves definitions and resource classification systems published by the Society of Petroleum Engineers (SPE), World Petroleum Congress (WPC) and the American",0.009375,"EFINING RESERVES
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-Santos has in place an evaluation and reporting process that is in line with international industry practice and is in general conformity with reserves definitions and resource classification systems published by the Society of Petroleum Engineers (SPE), World Petroleum Congress (WPC) and the American",0.0125,"EFINING RESERVES** Santos has in place an evaluation and reporting process that is in line with international industry practice and is in general conformity with reserves definitions and resource classification systems published by the Society of Petroleum Engineers (SPE), World Petroleum Congress (WPC) and the America",0.728125, Santos has in place an evaluation Geologists (AAPG). The definitions and reporting process that is in used are consistent with the line with international industry requirements of the Australian practice and is in general Stock Exchange Ltd (ASX). conformity with reserves Reserves are defined as those definitions and ,0.009375,"EFINING RESERVES
-
-Santos has in place an evaluation and reporting process that is in line with international industry practice and is in general conformity with reserves definitions and resource classification systems published by the Society of Petroleum Engineers (SPE), World Petroleum Congress (WPC) and the American",0.009375,"EFINING RESERVES
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-Santos has in place an evaluation and reporting process that is in line with international industry practice and is in general conformity with reserves definitions and resource classification systems published by the Society of Petroleum Engineers (SPE), World Petroleum Congress (WPC) and the American",105,finance_samples
-105,7,"Association of Petroleum Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX). Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules.",False,0.037953795379537955,"ssociation of Petroleum
-Geologists (AAPG). The definitions
-used are consistent with the
-requirements of the Australian
-Stock Exchange Ltd (ASX).
-
-Reserves are defined as those
-quantities of petroleum which are
-anticipated to be commercially
-recovered from known
-accumulations from a given date
-
-forward. Santos reports reserves
-net of the gas required for
-processing and transportation to
-the customer. Reserves reported are
-based on, and accurately reflect,
-information compiled by full-time
-employees of the Company who
-have the requisite qualifications
-and experience prescribed by the
-ASX Listing Rules",0.03135313531353135,"ssociation of Petroleum
-
-Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX).
-
-Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date
-
-### forward. Santos reports reserves
-
-net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing",0.0049504950495049506,"Association of Petroleum Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX).
-
-Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules",0.0,"Association of Petroleum Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX). Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules.",0.3564356435643564,"s are defined as those definitions and resource quantities of petroleum which are classification systems published by anticipated to be commercially the Society of Petroleum Engineers recovered from known (SPE), World Petroleum Congress accumulations from a given date (WPC) and the American
-
-forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules.",0.0049504950495049506,"ssociation of Petroleum Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX).
-
-Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules.",0.0049504950495049506,"ssociation of Petroleum Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX).
-
-Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules.",105,finance_samples
-105,8,"EXTERNALLY REVIEWED BOOKING PROCESS Santos’ reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be ‘appropriate to providing robust estimates of Santos’ reserve position in accordance with international industry practice’.",False,0.05653710247349823,"EXTERNALLY REVIEWED
-
-BOOKING PROCESS
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-Santos' reserves processes and
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-& Associates, and found to be
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-estimates of Santos' reserve
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-international industry practice",0.04946996466431095,"XTERNALLY REVIEWED
-
-## BOOKING PROCESS
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-Santos' reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be 'appropriate to providing robust estimates of Santos' reserve position in accordance with international industry practi",0.01060070671378092,"EXTERNALLY REVIEWED BOOKING PROCESS
-
-Santos’ reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be ‘appropriate to providing robust estimates of Santos’ reserve position in accordance with international industry practice’",0.024734982332155476,"EXTERNALLY REVIEWED BOOKING PROCESS** Santos' reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be 'appropriate to providing robust estimates of Santos' reserve position in accordance with international industry practice",0.014134275618374558,"TERNALLY REVIEWED BOOKING PROCESS** Santos’ reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be ‘appropriate to providing robust estimates of Santos’ reserve position in accordance with international industry practice’.",0.04946996466431095,"EXTERNALLY REVIEWED BOOKING PROCESS
-
-Santos' reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be 'appropriate to providing robust estimates of Santos' reserve position in accordance with international industry pract",0.04946996466431095,"EXTERNALLY REVIEWED BOOKING PROCESS
-
-Santos' reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be 'appropriate to providing robust estimates of Santos' reserve position in accordance with international industry pract",105,finance_samples
-106,0,"2.3 Composition of the Board The composition of the Board is determined in accordance with the Company’s Constitution and the Board Guidelines which, among other things, require that: • the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO); • the Board should comprise a substantial majority of independent, non-executive Directors;",False,0.056,"2.3 Composition of the Board
-The composition of the Board is
-determined in accordance with
-the Company's Constitution and
-the Board Guidelines which,
-among other things, require that:
-
-⚫the Board is to comprise
-a minimum of five and a
-maximum of ten Directors
-(exclusive of the CEO);
-
- - the Board should comprise a
-substantial majority of
-independent, non-executive
-Director",0.02666666666666667,"3 Composition of the Board
-
-The composition of the Board is determined in accordance with the Company's Constitution and the Board Guidelines which, among other things, require that:
-
-- the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
-- the Board should comprise a substantial majority of independent, non-executive Directors;",0.04,"3 Composition of the Board
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-The composition of the Board is determined in accordance with the Company’s Constitution and the Board Guidelines which, among other things, require that:
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-* the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
-* the Board should comprise a substantial majority of independent, non-executive Direct",0.058666666666666666,"Composition of the Board
-
-The composition of the Board is determined in accordance with the Company's Constitution and the Board Guidelines which, among other things, require that:
-
-> * the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
->
-> * the Board should comprise a substantial majority of independent, non-executive Direc",0.042666666666666665,"position of the Board** The composition of the Board is determined in accordance with the Company’s Constitution and the Board Guidelines which, among other things, require that:
-
-• the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
-
-- • the Board should comprise a substantial majority of independent, non-executive Directors",0.018666666666666668,"2.3 Composition of the Board The composition of the Board is determined in accordance with the Company's Constitution and the Board Guidelines which, among other things, require that:
-
-- the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
-- the Board should comprise a substantial majority of independent, non-executive Directors",0.018666666666666668,"2.3 Composition of the Board The composition of the Board is determined in accordance with the Company's Constitution and the Board Guidelines which, among other things, require that:
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-- the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
-- the Board should comprise a substantial majority of independent, non-executive Directors",106,finance_samples
-106,1,"Generally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be perceived to materially interfere with, the Director’s ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors: • a holding of 5% or more of the Company’s voting shares or a direct association with an entity that holds more than 5% of the Company’s voting shares; • an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Company.",False,0.03416856492027335,"nerally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be
-
-perceived to materially interfere
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-independence on a case by case
-basis and has adopted
-materiality guidelines to assist in
-that assessment. Under these
-guidelines, the following
-interests are regarded as material
-in the absence of any mitigating
-factors:
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-• a holding of 5% or more of
-the Company's voting shares or
-a direct association with an
-entity that holds more than
-5% of the Company's voting
-shares;
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-• an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Company",0.01366742596810934,"Generally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be
-
-perceived to materially interfere with, the Director's ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
-
-- a holding of 5% or more of the Company's voting shares or a direct association with an entity that holds more than 5% of the Company's voting shares;
-- an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Compan",0.01366742596810934,"enerally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be perceived to materially interfere with, the Director’s ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
-
-* a holding of 5% or more of the Company’s voting shares or a direct association with an entity that holds more than 5% of the Company’s voting shares;
-* an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Comp",0.02847380410022779,"lly, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be perceived to materially interfere with, the Director's ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
->
-> * a holding of 5% or more of the Company's voting shares or a direct association with an entity that holds more than 5% of the Company's voting shares;
->
-> * an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Comp",0.02733485193621868,"enerally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be
-
-perceived to materially interfere with, the Director’s ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted
-
-materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
-
-- • a holding of 5% or more of the Company’s voting shares or a direct association with an entity that holds more than 5% of the Company’s voting shares;
-
-- • an affiliation with an entity which accounts for 5% or more or the revenue or expense of t",0.010250569476082005,"enerally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be perceived to materially interfere with, the Director's ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
-
-- a holding of 5% or more of the Company's voting shares or a direct association with an entity that holds more than 5% of the Company's voting shares;
-- an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Company.",0.010250569476082005,"enerally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be perceived to materially interfere with, the Director's ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
-
-- a holding of 5% or more of the Company's voting shares or a direct association with an entity that holds more than 5% of the Company's voting shares;
-- an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Company.",106,finance_samples
-106,2,"The names and details of the experience, qualifications, special responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director’s attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report.",False,0.015432098765432098,"he names and details of the
-experience, qualifications, special
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-responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director's attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report.",0.012345679012345678,"The names and details of the experience, qualifications, special
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-responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director's attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report",0.0,"The names and details of the experience, qualifications, special responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director’s attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report.",0.0030864197530864196,"The names and details of the experience, qualifications, special responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director's attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report.",0.012345679012345678,"The names and details of the experience, qualifications, special
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-responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director’s attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Repor",0.0030864197530864196,"The names and details of the experience, qualifications, special responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director's attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report.",0.0030864197530864196,"The names and details of the experience, qualifications, special responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director's attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report.",106,finance_samples
-107,0,"innovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that’s pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improve- ments have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box.",False,0.0040609137055837565,"innovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their
-
-product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that’s pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improve ments have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box",0.008121827411167513,"nnovate more** Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their
-
-product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that's pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box.",0.02030456852791878,"e more** Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, *Hormel* chili varieties were first in their product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include *SPAM Singles* and *Jennie-O Turkey Store* Oven Ready Turkey, a fool-proof, whole frozen turkey that’s pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our *Hormel* microwave meals by revising packaging to draw attention to the convenient bowl rather than the box",0.02131979695431472,"ovate more** Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, *Hormel* chili varieties were first in their product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include *SPAM* Singles and *Jennie-O Turkey Store* Oven Ready Turkey, a fool-proof, whole frozen turkey that's pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our *Hormel* microwave meals by revising packaging to draw attention to the convenient bowl rather than the",0.02030456852791878,"ovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, _Hormel_ chili varieties were first in their
-
-product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include _SPAM_ Singles and _Jennie-O Turkey Store_ Oven Ready Turkey, a fool-proof, whole frozen turkey that’s pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our _Hormel_ microwave meals by revising packaging to draw attention to the convenient bowl rather than the",0.006091370558375634,"
-innovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their product category to offer Tetra Recart carton packaging - an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that's pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box.
-",0.006091370558375634,"
-innovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their product category to offer Tetra Recart carton packaging - an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that's pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box.
-",107,finance_samples
-108,0,EP 2 000 008 B1,False,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,108,patents
-108,1,EUROPEAN PATENT SPECIFICATION,False,0.0,EUROPEAN PATENT SPECIFICATION,0.0,EUROPEAN PATENT SPECIFICATION,0.0,EUROPEAN PATENT SPECIFICATION,0.0,EUROPEAN PATENT SPECIFICATION,0.0,EUROPEAN PATENT SPECIFICATION,0.0,EUROPEAN PATENT SPECIFICATION,0.0,EUROPEAN PATENT SPECIFICATION,108,patents
-108,2,(45) Date of publication and mention of the grant of the patent: 27.04.2011 Bulletin 2011/17,False,0.0,(45) Date of publication and mention of the grant of the patent: 27.04.2011 Bulletin 2011/17,0.08695652173913043,"45) Date of publication and mention
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-27.04.2011 Bulletin 2011",0.05434782608695652,"(45) Date of publication and mention of the grant of the patent:**
-27.04.2011 Bulletin 2011/",0.06521739130434782,"5) Date of publication and mention
-of the grant of the patent:
-**27.04.2011 Bulletin 2011/17",0.043478260869565216,45) Date of publication and mention of the grant of the patent: **27.04.2011 Bulletin 2011/1,0.03260869565217391,"45) Date of publication and mention of the grant of the patent:
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-27.04.2011 Bulletin 2011/17",0.03260869565217391,"45) Date of publication and mention of the grant of the patent:
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-27.04.2011 Bulletin 2011/17",108,patents
-108,3,(21) Application number: 07759411.7,False,0.0,(21) Application number: 07759411.7,0.0,(21) Application number: 07759411.7,0.14285714285714285,"21) Application number:**
-07759411.",0.11428571428571428,21) Application number: **07759411.,0.11428571428571428,21) Application number: **07759411.,0.0,(21) Application number: 07759411.7,0.0,(21) Application number: 07759411.7,108,patents
-108,4,(22) Date of filing: 26.03.2007,False,0.0,(22) Date of filing: 26.03.2007,0.0,(22) Date of filing: 26.03.2007,0.16129032258064516,"(22) Date of filing:**
-26.03.20",0.12903225806451613,2) Date of filing: **26.03.2007,0.12903225806451613,(22) Date of filing: **26.03.20,0.0,(22) Date of filing: 26.03.2007,0.0,(22) Date of filing: 26.03.2007,108,patents
-108,5,(51) Int Cl.: C23C 16/455(2006.01) C23C 16/54(2006.01) H05B 33/10(2006.01),False,0.3918918918918919,"/17
-
- (51) Int Cl.:
-C23C 16/455 (2006.01)
-C23C 16/54 (2006.01)
-
-(22) Date ",0.5135135135135135,"etin 2011/17
-
-(51) Int Cl.:
-C23C 16/455 (2006.01) H05B 33/10 (2006.01) ",0.47297297297297297,"2007
-
-**(51) Int Cl.:**
-* C23C 16/455 (2006.01)
-* H05B 33/10 (2006.01)",0.527027027027027," 2011/17**
-
-(51) Int Cl.:
-*C23C 16/455 (2006.01) H05B 33/10 (2006.01)*
-*C2",0.8648648648648649," - (86) International application number: **PCT/US2007/064961**
-
-- (21) A",0.16216216216216217,") Int Cl.:
-
-C23C 16/455 (2006.01) C23C 16/54 (2006.01)
-
-H05B 33/10 (2006.0",0.16216216216216217,") Int Cl.:
-
-C23C 16/455 (2006.01) C23C 16/54 (2006.01)
-
-H05B 33/10 (2006.0",108,patents
-108,6,(54) ATOMIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON FLEXIBLEN SUBSTRATEN DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE SUBSTRATS FLEXIBLES,False,0.02766798418972332,"4) ATOMIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES
-
-ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON
-FLEXIBLEN SUBSTRATEN
-
-DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE SUBSTRATS FLEXIBLES",0.07114624505928854,"MIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES**
-
-ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON
-FLEXIBLEN SUBSTRATEN
-
-DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE
-SUBSTRATS FLEXIBLES",0.039525691699604744,"54) ATOMIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES**
-
-ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON FLEXIBLEN SUBSTRATEN
-
-DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE SUBSTRATS FLEXIB",0.05533596837944664,"ATOMIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES**
-
-ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON
-FLEXIBLEN SUBSTRATEN
-
-DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE
-SUBSTRATS FLEXIBLES
-",0.04743083003952569,"TOMIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES** ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON FLEXIBLEN SUBSTRATEN
-
-# DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE SUBSTRATS FLEXIBLES",0.023715415019762844,"4) ATOMIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES
-
-ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON FLEXIBLEN SUBSTRATEN
-
-DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE SUBSTRATS FLEXIBLES",0.023715415019762844,"4) ATOMIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES
-
-ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON FLEXIBLEN SUBSTRATEN
-
-DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE SUBSTRATS FLEXIBLES",108,patents
-108,7,"(72) Inventors: • DICKEY, Eric R. Beaverton, Oregon 97006 (US)",False,0.06451612903225806,"72) Inventors:
-
-• DICKEY, Eric R.
-Beaverton, Oregon 97006 (US)",0.3225806451612903,"ventors:
-
-- **DICKEY, Eric R.**
- Beaverton, Oregon 97006 (U",0.4032258064516129,"ventors:**
-* **DICKEY, Eric R.**
- Beaverton, Oregon 97006",0.11290322580645161,"(72) Inventors:
-* **DICKEY, Eric R.
-Beaverton, Oregon 97006 (U",0.2903225806451613,"(72) Inventors:
-
- - **• DICKEY, Eric R. Beaverton, Oregon 9",0.25806451612903225,"B2- 6 888 172
-
-- DICKEY, Eric R. Beaverton, Oregon 97006 (US)
-",0.25806451612903225,"B2- 6 888 172
-
-- DICKEY, Eric R. Beaverton, Oregon 97006 (US)
-",108,patents
-108,9,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",False,0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.009900990099009901,"te:** Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.007425742574257425,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent
-Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the
-Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been
-paid. (Art. 99(1) European Patent Convention).",0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",108,patents
-109,1,c12) United States Patent,False,0.08,12) United States Patent,0.16,12) **United States Paten,0.08,"12) United States Patent
-",0.04,(12) United States Patent,0.16,12) **United States Paten,0.0,c12) United States Patent,0.0,c12) United States Patent,109,patents
-109,2,Takizawa et al.,False,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,109,patents
-109,3,"(IO) Patent No.: US 9,423,690 B2",False,0.1875,") Patent No.:
-
-# US 9,423,690 B2",0.3125,"Patent No.:** **US 9,423,690 B2*",0.15625,"0) Patent No.:** US 9,423,690 B2",0.0625,"(10) Patent No.: US 9,423,690 B2",0.125,"IO) **Patent No.: US 9,423,690 B",0.25,")
-
-Patent No.:
-
-US 9,423,690 B2",0.25,")
-
-Patent No.:
-
-US 9,423,690 B2",109,patents
-109,4,"(45) Date of Patent: Aug. 23, 2016",False,0.14705882352941177,"5) Date of Patent:
-
-Aug. 23, 2016",0.2647058823529412,"*Date of Patent:** **Aug. 23, 2016",0.11764705882352941,"45) Date of Patent:** Aug. 23, 201",0.0,"(45) Date of Patent: Aug. 23, 2016",0.11764705882352941,"5) **Date of Patent: Aug. 23, 2016",0.3235294117647059,"Date of Patent:
-
-Aug. 23, 2016
-
-##",0.3235294117647059,"Date of Patent:
-
-Aug. 23, 2016
-
-##",109,patents
-109,5,"(54) PATTERN FORMING METHOD, ELECTRON , BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",False,0.04807692307692308," (54) PATTERN FORMING METHOD, ELECTRON
-BEAM-SENSITIVE OR EXTREME
-ULTRAVIOLET RAY-SENSITIVE RESIN
-COMPOSITION, RESIST FILM, AND
-METHOD FOR MANUFACTURING
-ELECTRONIC DEVICE, AND ELECTRONIC
-DEVICE USING THE SAME",0.019230769230769232,"(54) **PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.019230769230769232,"(54) PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME
-
-",0.019230769230769232,"**(54) PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.019230769230769232,"(54) **PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.019230769230769232,"- (54) PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.019230769230769232,"- (54) PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",109,patents
-109,6,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP)",False,0.0,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP)",0.20833333333333334,"Applicant:** **FUJIFILM Corporation, Tokyo (JP)*",0.08333333333333333,"71) Applicant:** FUJIFILM Corporation, Tokyo (JP",0.0,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP)",0.16666666666666666," Applicant: **FUJIFILM Corporation,** Tokyo (JP)",0.041666666666666664,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP",0.041666666666666664,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP",109,patents
-109,7,"(72) Inventors: Hiroo Takizawa, Shizuoka (JP); Shuji , ( ) Hirano, Shizuoka (JP); Natsumi Yokokawa, Shizuoka (JP); Wataru Nihashi, Shizuoka (JP)",False,0.0763888888888889,"(72) Inventors: Hiroo Takizawa, Shizuoka (JP); Shuji
-Hirano, Shizuoka (JP); Natsumi
-Yokokawa, Shizuoka (JP); Wataru
-Nihashi, Shizuoka (JP)",0.08333333333333333,"(72) **Inventors:** **Hiroo Takizawa, Shizuoka (JP); Shuji Hirano, Shizuoka (JP); Natsumi Yokokawa, Shizuoka (JP); Wataru Nihashi, Shizuoka (JP)",0.08333333333333333,"
-**(72) Inventors:** Hiroo Takizawa, Shizuoka (JP); Shuji Hirano, Shizuoka (JP); Natsumi Yokokawa, Shizuoka (JP); Wataru Nihashi, Shizuoka (JP)
-",0.08333333333333333,"*(72) Inventors: Hiroo Takizawa, Shizuoka (JP); Shuji Hirano, Shizuoka (JP); Natsumi Yokokawa, Shizuoka (JP); Wataru Nihashi, Shizuoka (JP)**
-
-*",0.2222222222222222,"ventors: **Hiroo Takizawa,** Shizuoka (JP); **Shuji Hirano,** Shizuoka (JP); **Natsumi Yokokawa,** Shizuoka (JP); **Wataru Nihashi,** Shizuoka (",0.08333333333333333,"- (72) Inventors: Hiroo Takizawa, Shizuoka (JP); Shuji Hirano, Shizuoka (JP); Natsumi Yokokawa, Shizuoka (JP); Wataru Nihashi, Shizuoka (JP)
-- (",0.08333333333333333,"- (72) Inventors: Hiroo Takizawa, Shizuoka (JP); Shuji Hirano, Shizuoka (JP); Natsumi Yokokawa, Shizuoka (JP); Wataru Nihashi, Shizuoka (JP)
-- (",109,patents
-109,8,"(57) ABSTRACT There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition contain- ing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo!% or more based on a whole repeating units in the resin (A).",False,0.009404388714733543,"(57) ABSTRACT
-
-There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and (c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo!% or more based on a whole repeating units in the resin (A).",0.0219435736677116,") **ABSTRACT**
-
-There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and (c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A).",0.017241379310344827," (57) ABSTRACT
-
-There is provided a pattern forming method, including:
-(a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
-(b) exposing the film by using an electron beam or extreme ultraviolet ray; and
-(c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A).",0.01567398119122257,"(57) ABSTRACT**
-
-There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and (c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A)",0.018808777429467086,") **ABSTRACT**
-
-There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo!% or more based on a whole repeating units in the resin (A)",0.09561128526645768,"There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition contain› ing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo!% or more based on a whole repeating units ",0.09561128526645768,"There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition contain› ing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo!% or more based on a whole repeating units ",109,patents
-110,0,US 2020/0050106 Al,False,0.0,US 2020/0050106 Al,0.7777777777777778,"a (1):
-
-[0051] As ",0.05555555555555555,US 2020/0050106 A,0.1111111111111111,"
-US 2020/0050106 A",0.0,US 2020/0050106 Al,0.7777777777777778,"a (1):
-
-[0051] As ",0.7777777777777778,"a (1):
-
-[0051] As ",110,patents
-110,1,2,False,0.0,2,0.0,2,0.0,2,0.0,2,0.0,2,0.0,2,0.0,2,110,patents
-110,2,"Feb. 13, 2020",False,0.0,"Feb. 13, 2020",0.7692307692307693,eferably 0.20,0.6153846153846154,US 2020,0.0,"Feb. 13, 2020",0.0,"Feb. 13, 2020",0.7692307692307693,ferably 0.24,0.7692307692307693,ferably 0.24,110,patents
-110,3,DESCRIPTION OF THE PREFERRED EMBODIMENTS,False,0.025,"DESCRIPTION OF THE PREFERRED
-EMBODIMENTS",0.0,DESCRIPTION OF THE PREFERRED EMBODIMENTS,0.0,DESCRIPTION OF THE PREFERRED EMBODIMENTS,0.0,DESCRIPTION OF THE PREFERRED EMBODIMENTS,0.0,DESCRIPTION OF THE PREFERRED EMBODIMENTS,0.0,DESCRIPTION OF THE PREFERRED EMBODIMENTS,0.0,DESCRIPTION OF THE PREFERRED EMBODIMENTS,110,patents
-110,4,"[0039] Hereinafter, an example of embodiments for car- rying out the present invention will be described.",False,0.02857142857142857,"
-[0039] Hereinafter, an example of embodiments for carrying out the present invention will be described.",0.0380952380952381,"
-
-[0039] Hereinafter, an example of embodiments for carrying out the present invention will be described.",0.0380952380952381,"[0039]** Hereinafter, an example of embodiments for carrying out the present invention will be described.",0.0380952380952381,"[0039]** Hereinafter, an example of embodiments for carrying out the present invention will be described.",0.0380952380952381,"[0039]** Hereinafter, an example of embodiments for carrying out the present invention will be described.",0.10476190476190476,"9] Hereinafter, an example of embodiments for car› rying out the present invention will be described",0.10476190476190476,"9] Hereinafter, an example of embodiments for car› rying out the present invention will be described",110,patents
-110,5,"y g p [0040] In the present specification, a numerical range expressed using ""to"" is used in a meaning of a range that includes the preceding and succeeding numerical values of ""to"" as the lower limit value and the upper limit value, respectively.",False,0.04048582995951417,"
-
-[0040] In the present specification, a numerical range expressed using ""to"" is used in a meaning of a range that includes the preceding and succeeding numerical values of ""to"" as the lower limit value and the upper limit value, respectively.
-
-[0",0.05263157894736842,".
-
-[0040] In the present specification, a numerical range expressed using “to” is used in a meaning of a range that includes the preceding and succeeding numerical values of “to” as the lower limit value and the upper limit value, respectively.
-
-[",0.06072874493927125,"*[0040]** In the present specification, a numerical range expressed using “to” is used in a meaning of a range that includes the preceding and succeeding numerical values of “to” as the lower limit value and the upper limit value, respectively.
-
-*",0.044534412955465584,"*[0040]** In the present specification, a numerical range expressed using ""to"" is used in a meaning of a range that includes the preceding and succeeding numerical values of ""to"" as the lower limit value and the upper limit value, respectively.
-
-*",0.03643724696356275,"
-**[0040]** In the present specification, a numerical range expressed using ""to"" is used in a meaning of a range that includes the preceding and succeeding numerical values of ""to"" as the lower limit value and the upper limit value, respectively. ",0.13765182186234817,"he present specification, a numerical range expressed using ""to"" is used in a meaning of a range that includes the preceding and succeeding numerical values of ""to"" as the lower limit value and the upper limit value, respectively.",0.13765182186234817,"he present specification, a numerical range expressed using ""to"" is used in a meaning of a range that includes the preceding and succeeding numerical values of ""to"" as the lower limit value and the upper limit value, respectively.",110,patents
-110,6,g [0050] Condition 1: The A value determined by Formula (1) is 0.14 or more. A~([H]x0.04+[C]x 1.0+[N]x2.1 +[O]x30.6+[F]x50. 6+ [S]x 1.5+[I]x39 .5)/([H]x 1 +[C]x 12+[N]x 14+[O]x 16+[F]x19+[S]x32+[I]x127) Formula (1):,False,0.15813953488372093,". [0050] Condition 1: The A value determined by Formula (1) is 0.14 or more.
-
-A=([H]×0.04+[C]×1.0+[N]×2.1+[O]×30.6+[F]×50.6+
-[S]×1.5+[1]×39.5)/([H]x1+[C]x12+[N]x14+[O]×
-16+[F]×19+[S]x32+[I]×127) Formula (1):
-
-[0051]",0.5534883720930233,"[0050] Condition 1: The A value determined by Formula (1) is 0.14 or more.
-
-$$A=\frac{([H]\times 0.04+[C]\times 1.0+[N]\times 2.1+[O]\times 30.6+[F]\times 50.6+[S]\times 1.5+[I]\times 39.5)}{([H]\times 1+[C]\times 1",0.6139534883720931,"
-**[0050]** Condition 1: The $A$ value determined by Formula (1) is 0.14 or more.
-
-$$
-A = \frac{([\text{H}] \times 0.04 + [\text{C}] \times 1.0 + [\text{N}] \times 2.1 + [\text{O}] \times 30.6 + [\text{F}] \times 50",0.18604651162790697,"o.
-
-**[0050]** Condition 1: The A value determined by Formula (1) is 0.14 or more.
-
-A=([H]×0.04+[C]×1.0+[N]×2.1+[O]×30.6+[F]×50.6+[S]×1.5+[I]×39.5)/([H]×1+[C]×12+[N]×14+[O]×16+[F]×19+[S]×32+[I]×127) Formula (1):",0.037209302325581395,"050]** Condition 1: The A value determined by Formula (1) is 0.14 or more.
-
-A~([H]x0.04+[C]x 1.0+[N]x2.1 +[O]x30.6+[F]x50. 6+ [S]x 1.5+[I]x39 .5)/([H]x 1 +[C]x 12+[N]x 14+[O]x 16+[F]x19+[S]x32+[I]x127) Formula (1):",0.13488372093023257,"ndition 1: The A value determined by Formula (1) is 0.14 or more.
-
-## A~([H]x0.04+[C]x 1.0+[N]x2.1 +[O]x30.6+[F]x50. 6+ [S]x 1.5+[I]x39 .5)/([H]x 1 +[C]x 12+[N]x 14+[O]x 16+[F]x19+[S]x32+[I]x127)
-
-Formula (",0.13488372093023257,"ndition 1: The A value determined by Formula (1) is 0.14 or more.
-
-## A~([H]x0.04+[C]x 1.0+[N]x2.1 +[O]x30.6+[F]x50. 6+ [S]x 1.5+[I]x39 .5)/([H]x 1 +[C]x 12+[N]x 14+[O]x 16+[F]x19+[S]x32+[I]x127)
-
-Formula (",110,patents
-110,7,"[0051] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",False,0.0,"[0051] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",0.0026041666666666665,"[0051] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as “the effect of the present invention is more excellent”), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",0.018229166666666668," As described, the $A$ value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as “the effect of the present invention is more excellent”), the $A$ value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the $A$ value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",0.005208333333333333,"051]** As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",0.005208333333333333,"0051]** As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less",0.10416666666666667,"51] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or l",0.10416666666666667,"51] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or l",110,patents
-111,0,"US 9,423,690 B2",False,0.0,"US 9,423,690 B2",0.8666666666666667," 2561(2002), an",0.0,"US 9,423,690 B2",0.0,"US 9,423,690 B2",0.0,"US 9,423,690 B2",0.9333333333333333,". 2561(2002), ",0.9333333333333333,". 2561(2002), ",111,patents
-111,1,"The polar group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) prefer- ably contain a repeating unit having a cyclic carbonate ester structure. The repeating unit having a cyclic carbonate ester struc- ture is preferably the repeating unit represented by Formula (A-1).",False,0.050666666666666665," group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) prefer- ably contain a repeating unit having a cyclic carbonate ester structure.
-
-15
-
-The repeating unit having a cyclic carbonate ester struc- 20
-
-ture is preferably the repeating unit represented by Formula (A-1).",0.024,"]
-
-The polar group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) preferably contain a repeating unit having a cyclic carbonate ester structure.
-
-The repeating unit having a cyclic carbonate ester structure is preferably the repeating unit represented by Formula (A-1).",0.024,"
-
-The polar group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) preferably contain a repeating unit having a cyclic carbonate ester structure.
-
-The repeating unit having a cyclic carbonate ester structure is preferably the repeating unit represented by Formula (A-1).
-",0.024,"
-The polar group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) preferably contain a repeating unit having a cyclic carbonate ester structure.
-
-The repeating unit having a cyclic carbonate ester structure is preferably the repeating unit represented by Formula (A-1).
-
-",0.2906666666666667,"
-
-The polar group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) preferably contain a repeating unit having a cyclic carbonate ester structure.
-
-15 a 5-membered ring (nA=2).
-
-The polycyclic group containing -O----C(=O)-Orepresented by Z may, for example, be a structu",0.088,"oup which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) prefer› ably contain a repeating unit having a cyclic carbonate ester structure.
-
-5
-
-10
-
-15
-
-The repeating unit having a cyclic carbonate ester struc› ture is preferably the repeating unit represented by Formula (A-",0.088,"oup which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) prefer› ably contain a repeating unit having a cyclic carbonate ester structure.
-
-5
-
-10
-
-15
-
-The repeating unit having a cyclic carbonate ester struc› ture is preferably the repeating unit represented by Formula (A-",111,patents
-111,2,"In Formula (A-1 ), RA 1 represents a hydrogen atom or an alkyl group. If n is 2 or more, RA 2's each independently represents a substituent. A represents a single bond or a divalent linking group. Z represents a atomic group forming a monocyclid or polycyclic structure together with a group represented by -O----C(=O)-O- in the formula. n represents an integer of 0 or more. Formula (A-1) will be described in detail. ( ) The alkyl group represented by RA 1 may have a substitu- ent such as a fluorine atom. RA 1 represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group. p y y g p The substituent represented by RA 2 is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxycarbonylamino group. The substituent is preferably an alkyl group having 1 to 5 p y y g p g carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and at-butyl group. An alkyl group g p y g p y g p y g p may have a substituent such as a hydroxyl group. n represents the number of substituents, and is an integer of 0 or more. For example, n is preferably Oto 4, and more preferably 0. Examples of the a divalent linking group represented by p g g p p y A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond, an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, and the like. In one aspect of the present invention, A is preferably a single bond, or an alkylene group.",False,0.26416065911431513," more, R²'s each independently represents a If n is 2 or more, R²'s each independently represents a
-
-40 40
-
-A represents a single bond or a divalent linking group.
-
-Z represents a atomic group forming a monocyclid or polycyclic structure together with a group represented by -O-C(=O)—0— in the formula.
-
-65 65
-
-n represents an integer of 0 or more.
-
-Formula (A-1) will be described in detail.
-
-The alkyl group represented by R may have a substitu- ent such as a fluorine atom. R represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group.
-
-The substituent represented by R ² is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxycarbonylamino group. The substituent is preferably an alkyl group having 1 to 5 The substituent is preferably an alkyl group having 1 to 5 carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and a t-butyl group. An alkyl group group, an isobutyl group and a t-butyl group. An alkyl group may have a substituent such as a hydroxyl group.
-
-n represents the number of substituents, and is an integer of 0 or more. For example, n is preferably 0 to 4, and more preferably 0.
-
-50 50
-
-55 55
-
-104
-
-an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, methylene group, an ethylene group, an propylene group, and the like.
-
-5 5
-
-10
-
-In one aspect of the present invention, A is preferably a single bond, or an alkylene group.",0.09423274974253347," $R_A^1$ represents a hydrogen atom or an alkyl group.
-
-If $n$ is 2 or more, $R_A^2$ 's each independently represents a substituent.
-
-A represents a single bond or a divalent linking group.
-
-Z represents an atomic group forming a monocyclid or polycyclic structure together with a group represented by $\text{O}—\text{C}(=\text{O})—\text{O}—$ in the formula.
-
-$n$ represents an integer of 0 or more.
-
-Formula (A-1) will be described in detail.
-
-The alkyl group represented by $R_A^1$ may have a substituent such as a fluorine atom. $R_A^1$ represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group.
-
-The substituent represented by $R_A^2$ is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxy carbonyl amino group. The substituent is preferably an alkyl group having 1 to 5 carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and a t-butyl group. An alkyl group may have a substituent such as a hydroxyl group.
-
-$n$ represents the number of substituents, and is an integer of 0 or more. For example, $n$ is preferably 0 to 4, and more preferably 0.
-
-Examples of the divalent linking group represented by A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond,
-
-an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, a propylene group, and the like.
-
-In one aspect of the present invention, A is preferably a single bond, or an alkylene group.",0.07363542739443872,"up.
-
-In Formula (A-1), $R_A^1$ represents a hydrogen atom or an alkyl group.
-If $n$ is 2 or more, $R_A^2$'s each independently represents a substituent.
-$A$ represents a single bond or a divalent linking group.
-$Z$ represents a atomic group forming a monocyclid or polycyclic structure together with a group represented by $-\ce{O-C(=O)-O}-$ in the formula.
-$n$ represents an integer of 0 or more.
-
-Formula (A-1) will be described in detail.
-
-The alkyl group represented by $R_A^1$ may have a substituent such as a fluorine atom. $R_A^1$ represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group.
-
-The substituent represented by $R_A^2$ is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxycarbonylamino group. The substituent is preferably an alkyl group having 1 to 5 carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and a t-butyl group. An alkyl group may have a substituent such as a hydroxyl group.
-
-$n$ represents the number of substituents, and is an integer of 0 or more. For example, $n$ is preferably 0 to 4, and more preferably 0.
-
-Examples of the a divalent linking group represented by $A$ may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond,
-
-### 104
-
-an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, and the like.
-
-In one aspect of the present invention, $A$ is preferably a single bond, or an alkylene group.
-
-Th",0.11894953656024716,"s a hydrogen atom or an alkyl group.
-
-If n is 2 or more, R42's each independently represents a substituent.
-
-A represents a single bond or a divalent linking group.
-
-Z represents a atomic group forming a monocyclid or polycyclic structure together with a group represented by —O—C(=O)—O— in the formula.
-
-n represents an integer of 0 or more.
-
-Formula (A-1) will be described in detail.
-
-The alkyl group represented by R41 may have a substituent such as a fluorine atom. R41 represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group.
-
-The substituent represented by R42 is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxycarbonylamino group. The substituent is preferably an alkyl group having 1 to 5 carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and a t-butyl group. An alkyl group may have a substituent such as a hydroxyl group.
-
-n represents the number of substituents, and is an integer of 0 or more. For example, n is preferably 0 to 4, and more preferably 0.
-
-Examples of the a divalent linking group represented by A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond,
-
-## 104
-
-an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, and the like.
-
-In one aspect of the present invention, A is preferably a single bond, or an alkylene",0.46343975283213185," Formula (A-1) may be contained either alone or in a combination of two or more thereof.
-
-A represents a single bond or a divalent linking group. Z represents a atomic group forming a monocyclid or polycyclic structure together with a group represented by -O----C(=O)-O- in the formula.
-
-45
-
-Hereinafter, specific examples of the repeating unit having a cyclic carbonate ester structure are shown below, but the present invention is not limited thereto.
-
-n represents an integer of 0 or more.
-
-Formula (A-1) will be described in detail.
-
-The alkyl group represented by _RA_[1 ] may have a substituent such as a fluorine atom. _RA_[1 ] represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group.
-
-In addition, _RA_[1 ] in the following specific examples has the
-
-50 same meaning as RA[1 ] in Formula (A-1).
-
-The substituent represented by _RA_[2 ] is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxycarbonylamino group. The substituent is preferably an alkyl group having 1 to 5 carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and at-butyl group. An alkyl group An alkyl group alkyl group may have a substituent such as a hydroxyl group.
-
-The substituent is preferably an alkyl group having 1 to 5 55
-
-group, an isobutyl group and at-butyl group. An alkyl group An alkyl group alkyl group 60
-
-n represents the number of substituents, and is an integer of 0 or more. For example, n is preferably Oto 4, and more preferably 0.
-
-Examples of the a divalent linking group represented by 65 A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond,
-",0.14572605561277033,"r more, RA 2 's each independently represents a substituent.
-
-A represents a single bond or a divalent linking group. Z represents a atomic group forming a monocyclid or polycyclic structure together with a group represented by
-
--O----C(=O)-O- in the formula.
-
-n represents an integer of 0 or more.
-
-Formula (A-1) will be described in detail.
-
-The alkyl group represented by RA 1 may have a substitu› ent such as a fluorine atom. RA 1 represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group.
-
-The substituent represented by RA 2 is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxycarbonylamino group. The substituent is preferably an alkyl group having 1 to 5 carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and at-butyl group. An alkyl group may have a substituent such as a hydroxyl group.
-
-40
-
-45
-
-50
-
-55
-
-60
-
-n represents the number of substituents, and is an integer of 0 or more. For example, n is preferably Oto 4, and more preferably 0.
-
-Examples of the a divalent linking group represented by 65 A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond, an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, and the like.
-
-In one aspect of the present invention, A is preferably a single bond, or an alkylene group.",0.14572605561277033,"r more, RA 2 's each independently represents a substituent.
-
-A represents a single bond or a divalent linking group. Z represents a atomic group forming a monocyclid or polycyclic structure together with a group represented by
-
--O----C(=O)-O- in the formula.
-
-n represents an integer of 0 or more.
-
-Formula (A-1) will be described in detail.
-
-The alkyl group represented by RA 1 may have a substitu› ent such as a fluorine atom. RA 1 represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group.
-
-The substituent represented by RA 2 is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxycarbonylamino group. The substituent is preferably an alkyl group having 1 to 5 carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and at-butyl group. An alkyl group may have a substituent such as a hydroxyl group.
-
-40
-
-45
-
-50
-
-55
-
-60
-
-n represents the number of substituents, and is an integer of 0 or more. For example, n is preferably Oto 4, and more preferably 0.
-
-Examples of the a divalent linking group represented by 65 A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond, an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, and the like.
-
-In one aspect of the present invention, A is preferably a single bond, or an alkylene group.",111,patents
-112,0,US 2012/0003590 Al,False,0.0,US 2012/0003590 Al,0.8333333333333334,"m 1,000 to 3,000 r",0.05555555555555555,US 2012/0003590 A,0.05555555555555555,US 2012/0003590 A1,0.0,US 2012/0003590 Al,0.8333333333333334,"om 1,000 to 3,000 ",0.8333333333333334,"om 1,000 to 3,000 ",112,patents
-112,1,100,False,0.0,100,0.6666666666666666,008,0.0,100,0.0,100,0.0,100,0.3333333333333333,101,0.3333333333333333,101,112,patents
-112,2,"Jan. 5, 2012",False,0.0,"Jan. 5, 2012",0.75,0.02 to 0.1 ,0.0,"Jan. 5, 2012",0.0,"Jan. 5, 2012",0.0,"Jan. 5, 2012",0.75,0.1 to 20 ,0.75,0.1 to 20 ,112,patents
-112,3,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",False,0.0,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",0.0,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",0.0,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",0.0,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",0.030534351145038167,"0480]** Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above",0.10687022900763359,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film",0.10687022900763359,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film",112,patents
-112,4,"[0481] The composition of the present invention is typi- cally used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.",False,0.015306122448979591,"[0481] The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.
-",0.02040816326530612,"
-
-[0481] The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.",0.02040816326530612,"[0481] The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.
-
-",0.02040816326530612,"
-
-[0481] The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.",0.02040816326530612,"[0481]** The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.",0.025510204081632654,"0481] The composition of the present invention is typi› cally used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film",0.025510204081632654,"0481] The composition of the present invention is typi› cally used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film",112,patents
-112,5,"[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a sub- strate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.",False,0.014084507042253521,"
-[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.",0.1267605633802817,"0482] The thickness of the film is preferably from 0.02 to 0.1 $\mu\text{m}$ . The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to ",0.018779342723004695,"[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.
-
-",0.018779342723004695,"
-
-[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.",0.018779342723004695,"[0482]** The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.",0.07981220657276995,"The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a sub› strate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm",0.07981220657276995,"The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a sub› strate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm",112,patents
-112,6,"[0483] For example, the composition is coated on such a substrate ( e.g., silicon/silicon dioxide-coated substrate, sili- con nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray- sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antire- flection film may be previously provided by coating.",False,0.034545454545454546,"0483] For example, the composition is coated on such a [ ]
-substrate (e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used
-in the production of a precision integrated circuit device, an
-imprint mold or the like, by using a spinner, a coater or the
-like. Thereafter, the coating is dried to obtain an actinic raysensitive or radiation-sensitive film (hereinafter, sometimes
-
-referred to as a ""resist film""). Incidentally, a known antireflection film may be previously provided by coating",0.02181818181818182,"pm.
-
-[0483] For example, the composition is coated on such a substrate (e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray-sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antireflection film may be previously provided by coating.
-",0.025454545454545455,"rpm.
-
-[0483] For example, the composition is coated on such a substrate (e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray-sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a “resist film”). Incidentally, a known antireflection film may be previously provided by coating.",0.02181818181818182,"[0483] For example, the composition is coated on such a substrate (e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray-sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antireflection film may be previously provided by coating.
-
-[048",0.02181818181818182,"
-**[0483]** For example, the composition is coated on such a substrate ( e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic raysensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antireflection film may be previously provided by coating. ",0.04909090909090909,"483] For example, the composition is coated on such a substrate ( e.g., silicon/silicon dioxide-coated substrate, sili› con nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray› sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antire› flection film may be previously provided b",0.04909090909090909,"483] For example, the composition is coated on such a substrate ( e.g., silicon/silicon dioxide-coated substrate, sili› con nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray› sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antire› flection film may be previously provided b",112,patents
-112,7,"[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008- 162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion•Application Development of Nanoimprint-Sub- strate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan"".",False,0.006185567010309278,"[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008- 162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan"".
-",0.041237113402061855,"0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008-162101, and ""Yoshihiko Hirai (compiler), *Nanoimprint no Kiso to Gijutsu Kaihatsu*•*Oyo Tenkai*-*Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai* (*Basic and Technology Expansion*•*Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion*), Frontier Shu",0.018556701030927835,"
-[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008-162101, and “Yoshihiko Hirai (compiler), *Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai—Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai* (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan”.",0.012371134020618556,".
-
-[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008-162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan"".",0.016494845360824743,"[0491]** Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008162101, and ""Yoshihiko Hirai (compiler), _Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion),_ Frontier Shuppan"".",0.08041237113402062,"an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu·Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion·Application Development of Nanoimprint-Sub› strate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppa",0.08041237113402062,"an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu·Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion·Application Development of Nanoimprint-Sub› strate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppa",112,patents
-112,8,EXAMPLES,False,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,112,patents
-113,0,"US 6,482,565 Bl",False,0.06666666666666667,"US 6,482,565 B",1.0," 250-ml flask, ",0.13333333333333333," US 6,482,565 B",0.13333333333333333,"
-US 6,482,565 B",0.26666666666666666," 6,482,565 **Bl",0.9333333333333333,a 250-ml flas,0.9333333333333333,a 250-ml flas,113,patents
-113,1,7,False,0.0,7,0.0,7,0.0,7,0.0,7,0.0,7,0.0,7,0.0,7,113,patents
-113,2,"Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was p generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure com- pound represented by following Chemical Formula 6a (yield: 45%).",False,0.008547008547008548,"
-Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was 5 generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure compound represented by following Chemical Formula 6a (yield: 45%).",0.01282051282051282,"
-
-Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure compound represented by following Chemical Formula 6a (yield: 45%).",0.017094017094017096,"1
-
-Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure compound represented by following Chemical Formula 6a (yield: 45%).
-",0.017094017094017096,"
-Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure compound represented by following Chemical Formula 6a (yield: 45%).
-
-<",0.017094017094017096,".
-
-Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure compound represented by following Chemical Formula 6a (yield: 45%).",0.17735042735042736,"hus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure com› pound represented by following Chemical",0.17735042735042736,"hus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure com› pound represented by following Chemical",113,patents
-113,3,,False,0.0,,0.0,,0.09523809523809523, Chemical Formula 6a ,0.0,,0.0,,0.19047619047619047,Chemical Formula 6a,0.19047619047619047,Chemical Formula 6a,113,patents
-113,4,"As the reaction catalyst, an acid such as trifluoromethane- sulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",False,0.14705882352941177,"onic acid, hydrochloric acid or boron trifluoride-etherate sulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.
-",0.014705882352941176,"As the reaction catalyst, an acid such as trifluoromethanesulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.
-
-",0.014705882352941176,"
-
-As the reaction catalyst, an acid such as trifluoromethanesulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",0.014705882352941176,"
-
-As the reaction catalyst, an acid such as trifluoromethanesulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",0.014705882352941176,"
-
-As the reaction catalyst, an acid such as trifluoromethanesulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",0.003676470588235294,"As the reaction catalyst, an acid such as trifluoromethane› sulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",0.003676470588235294,"As the reaction catalyst, an acid such as trifluoromethane› sulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",113,patents
-113,5,"EXAMPLE 2 The procedure according to Example I was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%).",False,0.05699481865284974,"AMPLE 2
-
-25
-
-The procedure according to Example I was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45",0.02072538860103627,"EXAMPLE 2
-
-The procedure according to Example 1 was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%)",0.02072538860103627,"XAMPLE 2
-
-The procedure according to Example 1 was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%).",0.02072538860103627,"XAMPLE 2
-
-The procedure according to Example 1 was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%).",0.06735751295336788,"*
-
-> The procedure according to Example I was repeated but
-
-> using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%).",0.05699481865284974,"MPLE 2
-
-The procedure according to Example I was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%",0.05699481865284974,"MPLE 2
-
-The procedure according to Example I was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%",113,patents
-114,0,US 2020/0050106 Al,False,0.0,US 2020/0050106 Al,0.7777777777777778,ly 0.001% to 10% b,0.05555555555555555,US 2020/0050106 A,0.1111111111111111,"
-US 2020/0050106 A",0.0,US 2020/0050106 Al,0.7777777777777778, 0.001 % to 10% by,0.7777777777777778, 0.001 % to 10% by,114,patents
-114,1,40,False,0.0,40,0.0,40,0.0,40,0.0,40,0.0,40,0.0,40,0.0,40,114,patents
-114,2,-continued,False,0.3, contained,0.0,-continued,0.0,-continued,0.0,-continued,0.4,contained ,0.3, contained,0.3, contained,114,patents
-114,3,"Feb. 13, 2020",False,0.0,"Feb. 13, 2020",0.7692307692307693," 5.0 to 200, ",0.0,"Feb. 13, 2020",0.0,"Feb. 13, 2020",0.0,"Feb. 13, 2020",0.8461538461538461,".0 to 200, ",0.8461538461538461,".0 to 200, ",114,patents
-114,4,"[0397] The content of the acid diffusion control agent in the resist composition is preferably 0.001 % to 10% by mass, and more preferably 0.01 % to 5% by mass with respect to the total solid content of the composition.",False,0.0,"[0397] The content of the acid diffusion control agent in the resist composition is preferably 0.001 % to 10% by mass, and more preferably 0.01 % to 5% by mass with respect to the total solid content of the composition.",0.0182648401826484,"[0397]** The content of the acid diffusion control agent in the resist composition is preferably 0.001% to 10% by mass, and more preferably 0.01% to 5% by mass with respect to the total solid content of the composition.",0.0182648401826484,"
-
-[0397] The content of the acid diffusion control agent in the resist composition is preferably 0.001% to 10% by mass, and more preferably 0.01% to 5% by mass with respect to the total solid content of the composition.",0.0182648401826484,"[0397]** The content of the acid diffusion control agent in the resist composition is preferably 0.001% to 10% by mass, and more preferably 0.01% to 5% by mass with respect to the total solid content of the composition.",0.0182648401826484,"0397]** The content of the acid diffusion control agent in the resist composition is preferably 0.001 % to 10% by mass, and more preferably 0.01 % to 5% by mass with respect to the total solid content of the composition",0.0182648401826484,"397] The content of the acid diffusion control agent in the resist composition is preferably 0.001 % to 10% by mass, and more preferably 0.01 % to 5% by mass with respect to the total solid content of the composition.",0.0182648401826484,"397] The content of the acid diffusion control agent in the resist composition is preferably 0.001 % to 10% by mass, and more preferably 0.01 % to 5% by mass with respect to the total solid content of the composition.",114,patents
-114,5,[0398] The acid diffusion control agents may be used alone or in combination of two or more kinds thereof.,False,0.0,[0398] The acid diffusion control agents may be used alone or in combination of two or more kinds thereof.,0.03773584905660377,[0398]** The acid diffusion control agents may be used alone or in combination of two or more kinds thereo,0.0,[0398] The acid diffusion control agents may be used alone or in combination of two or more kinds thereof.,0.03773584905660377,398]** The acid diffusion control agents may be used alone or in combination of two or more kinds thereof.,0.03773584905660377,[0398]** The acid diffusion control agents may be used alone or in combination of two or more kinds thereo,0.1509433962264151,98] The acid diffusion control agents may be used alone or in combination of two or more kinds the,0.1509433962264151,98] The acid diffusion control agents may be used alone or in combination of two or more kinds the,114,patents
-114,6,"[0399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is pref- erably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffu- sion control agent (molar ratio) is more preferably 5 .0 to 200, and still more preferably 7.0 to 150.",False,0.009345794392523364,"
-
-[0399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5 .0 to 200, and still more preferably 7.0 to 150.",0.01557632398753894,"*[0399]** The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5.0 to 200, and still more preferably 7.0 to 150.
-
-",0.01557632398753894,"
-
-[0399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5.0 to 200, and still more preferably 7.0 to 150.
-
-[",0.01557632398753894,"
-**[0399]** The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5.0 to 200, and still more preferably 7.0 to 150.",0.012461059190031152,"**[0399]** The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5 .0 to 200, and still more preferably 7.0 to 150.",0.102803738317757,"399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is pref› erably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffu› sion control agent (molar ratio) is more preferably 5 .0 to 200, and sti",0.102803738317757,"399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is pref› erably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffu› sion control agent (molar ratio) is more preferably 5 .0 to 200, and sti",114,patents
-114,7,"[0400] Examples of the acid diffusion control agent include the compounds (amine compounds, amido group- containing compounds, urea compounds, nitrogen-contain- ing heterocyclic compounds, and the like) described m paragraphs <0140> to <0144> of JP2013-011833A.",False,0.022988505747126436,"
-[0400] Examples of the acid diffusion control agent include the compounds (amine compounds, amido groupcontaining compounds, urea compounds, nitrogen-containing heterocyclic compounds, and the like) described m paragraphs <0140> to <0144> of JP2013-011833A.
-",0.02681992337164751,"[0400]** Examples of the acid diffusion control agent include the compounds (amine compounds, amido group-containing compounds, urea compounds, nitrogen-containing heterocyclic compounds, and the like) described in paragraphs <0140> to <0144> of JP2013-011833A.",0.02681992337164751,"[0400] Examples of the acid diffusion control agent include the compounds (amine compounds, amido group-containing compounds, urea compounds, nitrogen-containing heterocyclic compounds, and the like) described in paragraphs <0140> to <0144> of JP2013-011833A.
-
-",0.02681992337164751,"[0400]** Examples of the acid diffusion control agent include the compounds (amine compounds, amido group-containing compounds, urea compounds, nitrogen-containing heterocyclic compounds, and the like) described in paragraphs <0140> to <0144> of JP2013-011833A.",0.03065134099616858,"**[0400]** Examples of the acid diffusion control agent include the compounds (amine compounds, amido groupcontaining compounds, urea compounds, nitrogen-containing heterocyclic compounds, and the like) described m paragraphs <0140> to <0144> of JP2013-011833A.",0.1724137931034483,"400] Examples of the acid diffusion control agent include the compounds (amine compounds, amido group› containing compounds, urea compounds, nitrogen-contain› ing heterocyclic compounds, and the like) described m paragraphs <0140> to <0144",0.1724137931034483,"400] Examples of the acid diffusion control agent include the compounds (amine compounds, amido group› containing compounds, urea compounds, nitrogen-contain› ing heterocyclic compounds, and the like) described m paragraphs <0140> to <0144",114,patents
-114,8,[0401] <(E) Hydrophobic Resin>,False,0.06666666666666667,0401] <(E) Hydrophobic Resin>,0.13333333333333333,401]** <(E) Hydrophobic Resin>,0.4666666666666667,"# (E) Hydrophobic Resin
-
-[0402",0.13333333333333333,[0401]** <(E) Hydrophobic Resi,0.13333333333333333,[0401]** <(E) Hydrophobic Resi,0.3,01] <(E) Hydrophobic Resin,0.3,01] <(E) Hydrophobic Resin,114,patents
-114,9,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A).",False,0.0,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A).",0.03418803418803419,"[0402]** The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A",0.0,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A).",0.03418803418803419,"402]** The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A).",0.03418803418803419,"0402]** The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A)",0.017094017094017096,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A)",0.017094017094017096,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A)",114,patents
-114,10,"[0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar materials.",False,0.0,"[0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar materials.",0.012084592145015106,"[0403]** Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar material",0.0,"[0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar materials.",0.012084592145015106,"[0403]** Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar material",0.012084592145015106,"[0403]** Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar material",0.10876132930513595,"0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and no",0.10876132930513595,"0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and no",114,patents
-114,11,[0404] Examples of the effect of addition of the hydro- phobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.,False,0.014634146341463415,"
-[0404] Examples of the effect of addition of the hydrophobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.",0.01951219512195122,[0404]** Examples of the effect of addition of the hydrophobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.,0.01951219512195122,"
-[0404] Examples of the effect of addition of the hydrophobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.
-",0.01951219512195122,[0404]** Examples of the effect of addition of the hydrophobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.,0.01951219512195122,[0404]** Examples of the effect of addition of the hydrophobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.,0.07317073170731707,04] Examples of the effect of addition of the hydro› phobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out ,0.07317073170731707,04] Examples of the effect of addition of the hydro› phobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out ,114,patents
-115,0,EP 1 499 943 B1,False,0.0,EP 1 499 943 B1,0.8," 1, wobei das B",0.0,EP 1 499 943 B1,0.0,EP 1 499 943 B1,0.0,EP 1 499 943 B1,0.8,"l (130, 134) ",0.8,"l (130, 134) ",115,patents
-115,1,"der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, wobei das Computersystem eine Energieversorgung auf- weist, die eine Batterie beinhaltet; Bestimmen (404), ob das Ereignis ein vom Be- nutzer eingeleitetes Ereignis oder ein von Soft- ware eingeleitetes Ereignis ist; wenn das Ereignis ein vom Benutzer eingelei- tetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Perfor- mance-Zustand in den dritten Performance-Zu- stand, wenn das Ereignis ein von Software eingeleite- tes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten Performance-Zu- stand in den zweiten Performance-Zustand.",False,0.033566433566433566,"
-
-18
-
-der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, wobei das Computersystem eine Energieversorgung aufweist, die eine Batterie beinhaltet; Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; wenn das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand, wenn das Ereignis ein von Software eingeleitetes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand.
-
-",0.033566433566433566,"
-
-der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, wobei das Computersystem eine Energieversorgung aufweist, die eine Batterie beinhaltet;
-
-Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;
-
-wenn das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand,
-
-wenn das Ereignis ein von Software eingeleitetes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand.",0.04895104895104895,"943 B1 18
-
-der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, wobei das Computersystem eine Energieversorgung aufweist, die eine Batterie beinhaltet;
-Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;
-wenn das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand,
-wenn das Ereignis ein von Software eingeleitetes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand.
-
-2. ",0.04895104895104895," 18
-
-der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, wobei das Computersystem eine Energieversorgung aufweist, die eine Batterie beinhaltet;
-
-Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;
-
-wenn das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand,
-
-wenn das Ereignis ein von Software eingeleitetes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand.
-
-**2.",0.606993006993007," dem ersten Performance-Zustand in ware eingeleitetes Ereignis ist; den zweiten Performance-Zustand auf Basis wenn das Ereignis ein vom Benutzer eingeleides Detektierens, dass das Ereignis ein von tetes Ereignis ist, direktes Versetzen (406) der 10 Software eingeleitetes Ereignis ist. integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zu- **8.** Vorrichtung nach Anspruch 7, ferner umfassend: stand, wenn das Ereignis ein von Software eingeleiteMittel (134) zum Ändern der Betriebsfrequenz tes Ereignis ist, Versetzen (408) der integrierten 15 der integrierten Schaltung (112), um den PerSchaltung aus dem ersten Performance-Zuformance-Zustand der integrierten Schaltung zu stand",0.06433566433566433,"erste Performance- Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, wobei das Computersystem eine Energieversorgung aufweist, die eine Batterie beinhaltet;
-
-Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;
-
-wenn das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand, wenn das Ereignis ein von Software eingeleitetes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten PerformanceZustand in den zweiten Performance-Zustand",0.06433566433566433,"erste Performance- Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, wobei das Computersystem eine Energieversorgung aufweist, die eine Batterie beinhaltet;
-
-Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;
-
-wenn das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand, wenn das Ereignis ein von Software eingeleitetes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten PerformanceZustand in den zweiten Performance-Zustand",115,patents
-115,2,"2. Verfahren nach Anspruch 1, wobei das Benutzerer- eignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrie- ben wird. 3. Verfahren nach Anspruch 1, wobei direktes Verset- zen das Versetzen ohne Verzögerung ist.",False,0.03968253968253968,"
-2. Verfahren nach Anspruch 1, wobei das Benutzerereignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrieben wird.
-
-3. Verfahren nach Anspruch 1, wobei direktes Versetzen das Versetzen ohne Verzögerung ist.
-",0.051587301587301584,"
-2. Verfahren nach Anspruch 1, wobei das Benutzerereignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrieben wird.
-
-3. Verfahren nach Anspruch 1, wobei direktes Versetzen das Versetzen ohne Verzögerung ist.
-
-4.",0.051587301587301584,"
-
-2. Verfahren nach Anspruch 1, wobei das Benutzerereignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrieben wird.
-
-3. Verfahren nach Anspruch 1, wobei direktes Versetzen das Versetzen ohne Verzögerung ist.
-",0.05952380952380952,".** Verfahren nach Anspruch 1, wobei das Benutzerereignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrieben wird.
-
-**3.** Verfahren nach Anspruch 1, wobei direktes Versetzen das Versetzen ohne Verzögerung ist.",0.2896825396825397,"2.** Verfahren nach Anspruch 1, wobei das Benutzerereignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrieben wird.
-
-**9.** Vorrichtung nach Anspruch 7, ferner umfassend: 20
-
-Mittel (130) zum Ändern des Betri",0.07539682539682539,"2. Verfahren nach Anspruch 1, wobei das Benutzerereignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrieben wird.
-3. Verfahren nach Anspruch 1, wobei direktes Versetzen das Versetzen ohne Verzögerung i",0.07539682539682539,"2. Verfahren nach Anspruch 1, wobei das Benutzerereignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrieben wird.
-3. Verfahren nach Anspruch 1, wobei direktes Versetzen das Versetzen ohne Verzögerung i",115,patents
-115,3,"4. Verfahren nach Anspruch 1, ferner umfassend: Betreiben der integrierten Schaltung in einem dritten Performance-Zustand für einen vorher- bestimmten Zeitrum auf Basis von thermischen Überlegungen, um in einem dritten Perfor- mance-Zustand ausfallfrei funktionieren.",False,0.026217228464419477,"
-4. Verfahren nach Anspruch 1, ferner umfassend:
-
-Betreiben der integrierten Schaltung in einem dritten Performance-Zustand für einen vorherbestimmten Zeitrum auf Basis von thermischen Überlegungen, um in einem dritten Performance-Zustand ausfallfrei funktionieren.",0.033707865168539325,"
-4. Verfahren nach Anspruch 1, ferner umfassend:
-
-Betreiben der integrierten Schaltung in einem dritten Performance-Zustand für einen vorherbestimmten Zeitraum auf Basis von thermischen Überlegungen, um in einem dritten Performance-Zustand ausfallfrei funktionieren.
-",0.0449438202247191," Verfahren nach Anspruch 1, ferner umfassend:
- Betreiben der integrierten Schaltung in einem dritten Performance-Zustand für einen vorherbestimmten Zeitraum auf Basis von thermischen Überlegungen, um in einem dritten Performance-Zustand ausfallfrei funktionieren.
-",0.033707865168539325,"4.** Verfahren nach Anspruch 1, ferner umfassend:
-
-Betreiben der integrierten Schaltung in einem dritten Performance-Zustand für einen vorherbestimmten Zeitrum auf Basis von thermischen Überlegungen, um in einem dritten Performance-Zustand ausfallfrei funktionieren.
-",0.5393258426966292,"rfahren nach Anspruch 1, ferner umfassend: fassend: Betreiben der integrierten Schaltung in einem ein computerlesbares Medium; und dritten Performance-Zustand für einen vorher30 ein im computerlesbaren Medium gespeicherbestimmten Zeitrum auf Basis von thermischen tes",0.09737827715355805,"rfahren nach Anspruch 1, ferner umfassend:
-
-30 Betreiben der integrierten Schaltung in einem dritten Performance-Zustand für einen vorherbestimmten Zeitrum auf Basis von thermischen Überlegungen, um in einem dritten Performance-Zustand ausfallfrei funktionie",0.09737827715355805,"rfahren nach Anspruch 1, ferner umfassend:
-
-30 Betreiben der integrierten Schaltung in einem dritten Performance-Zustand für einen vorherbestimmten Zeitrum auf Basis von thermischen Überlegungen, um in einem dritten Performance-Zustand ausfallfrei funktionie",115,patents
-115,4,"5. Verfahren nach Anspruch 4, wobei das Computer- system ein Laptop-Computer ist.",False,0.037037037037037035,"
-5. Verfahren nach Anspruch 4, wobei das Computersystem ein Laptop-Computer ist.",0.04938271604938271,"
-
-5. Verfahren nach Anspruch 4, wobei das Computersystem ein Laptop-Computer ist.",0.04938271604938271,"5. Verfahren nach Anspruch 4, wobei das Computersystem ein Laptop-Computer ist.
-",0.04938271604938271,"5.** Verfahren nach Anspruch 4, wobei das Computersystem ein Laptop-Computer ist.",0.04938271604938271,"5.** Verfahren nach Anspruch 4, wobei das Computersystem ein Laptop-Computer ist.",0.04938271604938271,"
-
-5. Verfahren nach Anspruch 4, wobei das Computersystem ein Laptop-Computer ist.",0.04938271604938271,"
-
-5. Verfahren nach Anspruch 4, wobei das Computersystem ein Laptop-Computer ist.",115,patents
-115,5,"6. Verfahren nach Anspruch 1, wobei das Computer- system ein persönlicher digitaler Assistent ist.",False,0.030612244897959183,"
-6. Verfahren nach Anspruch 1, wobei das Computersystem ein persönlicher digitaler Assistent ist.",0.04081632653061224,"
-
-6. Verfahren nach Anspruch 1, wobei das Computersystem ein persönlicher digitaler Assistent ist.",0.04081632653061224,"
-6. Verfahren nach Anspruch 1, wobei das Computersystem ein persönlicher digitaler Assistent ist.",0.04081632653061224,"6.** Verfahren nach Anspruch 1, wobei das Computersystem ein persönlicher digitaler Assistent ist.",0.04081632653061224,"6.** Verfahren nach Anspruch 1, wobei das Computersystem ein persönlicher digitaler Assistent ist.",0.04081632653061224,"6. Verfahren nach Anspruch 1, wobei das Computersystem ein persönlicher digitaler Assistent ist.
-7",0.04081632653061224,"6. Verfahren nach Anspruch 1, wobei das Computersystem ein persönlicher digitaler Assistent ist.
-7",115,patents
-115,6,"7. Vorrichtung, umfassend: Mittel (136) zum Detektieren eines vom Benut- zer eingeleitetes Ereignisses oder eines von Software eingeleitetes Ereignisses in einem Computersystem; wobei das Computersystem eine integrierte Schaltung (112) mit mehreren Performance-Zu- ständen beinhaltet einschließlich eines ersten Performance-Zustandes, eines zweiten Perfor- mance-Zustands, der höher als der erste Per- formance-Zustand ist, und eines dritten Perfor- mance-Zustandes, der höher als der zweite Per- formance-Zustand ist; Mittel zum Bestimmen, ob ein detektiertes Er- eignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; und Mittel (130, 134) zum direkten Versetzen des integrierten Schaltung aus dem ersten Perfor- mance-Zustand in den dritten Performance-Zu- stand auf Basis des Detektierens, dass das Er- eignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schal- tung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein von Software eingeleitetes Ereignis ist.",False,0.07664562669071236,"Mittel (136) zum Detektieren eines vom Benutzer eingeleitetes Ereignisses oder eines von Software eingeleitetes Ereignisses in einem Computersystem; wobei das Computersystem eine integrierte Schaltung (112) mit mehreren Performance-Zuständen beinhaltet einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist; Mittel zum Bestimmen, ob ein detektiertes Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; und
-
-Mittel (130, 134) zum direkten Versetzen des integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein von Software eingeleitetes Ereignis ist.",0.045987376014427414,"stent ist.
-
-7. Vorrichtung, umfassend:
-
-Mittel (136) zum Detektieren eines vom Benutzer eingeleiteten Ereignisses oder eines von Software eingeleiteten Ereignisses in einem Computersystem;
-
-wobei das Computersystem eine integrierte Schaltung (112) mit mehreren Performance-Zuständen beinhaltet einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist;
-
-Mittel zum Bestimmen, ob ein detektiertes Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; und
-
-Mittel (130, 134) zum direkten Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein von Software eingeleitetes Ereignis ist.
-
-8. V",0.03967538322813345,"st.
-
-7. Vorrichtung, umfassend:
- Mittel (136) zum Detektieren eines vom Benutzer eingeleitetes Ereignisses oder eines von Software eingeleitetes Ereignisses in einem Computersystem;
- wobei das Computersystem eine integrierte Schaltung (112) mit mehreren Performance-Zuständen beinhaltet einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist;
- Mittel zum Bestimmen, ob ein detektiertes Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; und
- Mittel (130, 134) zum direkten Versetzen des integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein von Software eingeleitetes Ereignis ist.",0.04328223624887286,"ist.
-
-**7.** Vorrichtung, umfassend:
-
-Mittel (136) zum Detektieren eines vom Benutzer eingeleitetes Ereignisses oder eines von Software eingeleitetes Ereignisses in einem Computersystem;
-
-wobei das Computersystem eine integrierte Schaltung (112) mit mehreren Performance-Zuständen beinhaltet einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist;
-
-Mittel zum Bestimmen, ob ein detektiertes Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; und
-
-Mittel (130, 134) zum direkten Versetzen des integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein von Software eingeleitetes Ereignis ist.
-
-**8.**",0.4418394950405771,"nce-Zustand auf Basis wenn das Ereignis ein vom Benutzer eingeleides Detektierens, dass das Ereignis ein von tetes Ereignis ist, direktes Versetzen (406) der 10 Software eingeleitetes Ereignis ist. integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zu- **8.** Vorrichtung nach Anspruch 7, ferner umfassend: stand, wenn das Ereignis ein von Software eingeleiteMittel (134) zum Ändern der Betriebsfrequenz tes Ereignis ist, Versetzen (408) der integrierten 15 der integrierten Schaltung (112), um den PerSchaltung aus dem ersten Performance-Zuformance-Zustand der integrierten Schaltung zu stand in den zweiten Performance-Zustand. ändern.
-
-Mittel (130, 134) zum direkten Versetzen des integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein von Software eingeleitetes Ereignis ist.",0.13976555455365194,". Vorrichtung, umfassend:
-
-Mittel (136) zum Detektieren eines vom Benutzer eingeleitetes Ereignisses oder eines von Software eingeleitetes Ereignisses in einem Computersystem;
-
-35
-
-40
-
-45
-
-50
-
-wobei das Computersystem eine integrierte Schaltung (112) mit mehreren Performance-Zuständen beinhaltet einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist;
-
-Mittel zum Bestimmen, ob ein detektiertes Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; und
-
-55
-
-18
-
-Mittel (130, 134) zum direkten Versetzen des integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das",0.13976555455365194,". Vorrichtung, umfassend:
-
-Mittel (136) zum Detektieren eines vom Benutzer eingeleitetes Ereignisses oder eines von Software eingeleitetes Ereignisses in einem Computersystem;
-
-35
-
-40
-
-45
-
-50
-
-wobei das Computersystem eine integrierte Schaltung (112) mit mehreren Performance-Zuständen beinhaltet einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist;
-
-Mittel zum Bestimmen, ob ein detektiertes Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; und
-
-55
-
-18
-
-Mittel (130, 134) zum direkten Versetzen des integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das",115,patents
-115,7,"8. Vorrichtung nach Anspruch 7, ferner umfassend: Mittel (134) zum Ändern der Betriebsfrequenz der integrierten Schaltung (112), um den Per- formance-Zustand der integrierten Schaltung zu ändern.",False,0.14358974358974358,"8. Vorrichtung nach Anspruch 7, ferner umfassend:
-
-20
-
-25
-
-30
-
-Mittel (134) zum Ändern der Betriebsfrequenz der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltun",0.02564102564102564,"
-8. Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (134) zum Ändern der Betriebsfrequenz der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern.",0.041025641025641026," Vorrichtung nach Anspruch 7, ferner umfassend:
- Mittel (134) zum Ändern der Betriebsfrequenz der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern.",0.035897435897435895,"8.** Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (134) zum Ändern der Betriebsfrequenz der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern",0.1641025641025641,"htung nach Anspruch 7, ferner umfassend: 20
-
-Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern",0.15897435897435896,"8. Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (134) zum Ändern der Betriebsfrequenz der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltu",0.15897435897435896,"8. Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (134) zum Ändern der Betriebsfrequenz der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltu",115,patents
-115,8,"9. Vorrichtung nach Anspruch 7, ferner umfassend: Mittel (130) zum Ändern des Betriebsspan- nungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern.",False,0.019801980198019802,"9. Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern.",0.024752475247524754,"9. Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern.
-",0.039603960396039604," Vorrichtung nach Anspruch 7, ferner umfassend:
- Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern.",0.034653465346534656,"9.** Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern",0.04950495049504951," Vorrichtung nach Anspruch 7, ferner umfassend: 20
-
-Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern",0.09405940594059406,". Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ä",0.09405940594059406,". Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ä",115,patents
-115,9,"10. Vorrichtung nach einem der Ansprüche 7 bis 9, um- fassend: ein computerlesbares Medium; und ein im computerlesbaren Medium gespeicher- tes Programm zum Managen des Energiever- brauchs innerhalb der integrierten Schaltung, dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten Schaltung (112) aus dem ersten Performance- Zustand in den dritten Performance-Zustand auf Basis des Detektierens eines Benutzerereignis- ses.",False,0.033185840707964605,"
-10. Vorrichtung nach einem der Ansprüche 7 bis 9, umfassend:
-
- - ein computerlesbares Medium; und ein im computerlesbaren Medium gespeichertes Programm zum Managen des Energieverbrauchs innerhalb der integrierten Schaltung, dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten Schaltung (112) aus dem ersten PerformanceZustand in den dritten Performance-Zustand auf Basis des Detektierens eines Benutzerereignisses.",0.0420353982300885,".
-
-10. Vorrichtung nach einem der Ansprüche 7 bis 9, umfassend:
-
-ein computerlesbares Medium; und
-ein im computerlesbaren Medium gespeichertes Programm zum Managen des Energieverbrauchs innerhalb der integrierten Schaltung, dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten Schaltung (112) aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens eines Benutzerereignisses.
-
-1",0.03982300884955752,"
-10. Vorrichtung nach einem der Ansprüche 7 bis 9, umfassend:
- ein computerlesbares Medium; und
- ein im computerlesbaren Medium gespeichertes Programm zum Managen des Energieverbrauchs innerhalb der integrierten Schaltung, dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten Schaltung (112) aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens eines Benutzerereignisses.",0.04424778761061947,"
-**10.** Vorrichtung nach einem der Ansprüche 7 bis 9, umfassend:
-
-ein computerlesbares Medium; und
-
-ein im computerlesbaren Medium gespeichertes Programm zum Managen des Energieverbrauchs innerhalb der integrierten Schaltung, dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten Schaltung (112) aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens eines Benutzerereignisses.
-
-",0.5663716814159292,"gen des EnergieverÜberlegungen, um in einem dritten Perforbrauchs innerhalb der integrierten Schaltung, mance-Zustand ausfallfrei funktionieren. dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten **5.** Verfahren nach Anspruch 4, wobei das Computer35 Schaltung (112) aus dem ersten Performancesystem ein Laptop-Computer ist. Zustand in den dritten Performance-Zustand auf Basis des Detektierens eines Benutzerereignis- ",0.11283185840707964,"10. Vorrichtung nach einem der Ansprüche 7 bis 9, umfassend:
-
-ein computerlesbares Medium; und ein im computerlesbaren Medium gespeichertes Programm zum Managen des Energieverbrauchs innerhalb der integrierten Schaltung, dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten Schaltung (112) aus dem ersten PerformanceZustand in den dritten PerformanceZustand auf Basis des Detektierens eines Benutz",0.11283185840707964,"10. Vorrichtung nach einem der Ansprüche 7 bis 9, umfassend:
-
-ein computerlesbares Medium; und ein im computerlesbaren Medium gespeichertes Programm zum Managen des Energieverbrauchs innerhalb der integrierten Schaltung, dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten Schaltung (112) aus dem ersten PerformanceZustand in den dritten PerformanceZustand auf Basis des Detektierens eines Benutz",115,patents
-116,0,"US 9,423,690 B2",False,0.0,"US 9,423,690 B2",0.8,"r. 15, 2013, th",0.0,"US 9,423,690 B2",0.0,"US 9,423,690 B2",0.0,"US 9,423,690 B2",0.8666666666666667,". 15, 2013, t",0.8666666666666667,". 15, 2013, t",116,patents
-116,1,1,False,0.0,1,0.0,1,0.0,1,0.0,1,0.0,1,0.0,1,0.0,1,116,patents
-116,2,"PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",False,0.029850746268656716,"PATTERN FORMING METHOD, ELECTRON
-BEAM-SENSITIVE OR EXTREME
-ULTRAVIOLET RAY-SENSITIVE RESIN
-COMPOSITION, RESIST FILM, AND
-METHOD FOR MANUFACTURING
-ELECTRONIC DEVICE, AND ELECTRONIC
-DEVICE USING THE SAME",0.0,"PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.0,"PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.0,"PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.0,"PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.0,"PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.0,"PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",116,patents
-116,3,"CROSS-REFERENCE TO RELATED APPLICATION This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012- 181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorpo- rated herein by reference.",False,0.014577259475218658,"CROSS-REFERENCE TO RELATED
-APPLICATION
-
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012- 181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorporated herein by reference.",0.02040816326530612,"CROSS-REFERENCE TO RELATED APPLICATION
-
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012-181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorporated herein by reference.
-
-",0.02040816326530612,"CROSS-REFERENCE TO RELATED APPLICATION
-
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012-181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorporated herein by reference.
-
-",0.02040816326530612," CROSS-REFERENCE TO RELATED APPLICATION
-
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012-181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorporated herein by reference.
-",0.14868804664723032,"fine hole patterns are formed.
-
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorporated herein by reference.
-
-> 15 sh",0.13994169096209913,"ELATED APPLICATION
-
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorpo› rated herein by reference",0.13994169096209913,"ELATED APPLICATION
-
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorpo› rated herein by reference",116,patents
-116,4,"TECHNICAL FIELD The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufac- turing an electronic device, and an electronic device using g g the same. More specifically, the present invention relates to",False,0.12181818181818181,"tern forming method using a developer containing an organic solvent, which is using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufac- turing an electronic device, and an electronic device using the same. More specifically, the present invention relates to",0.023636363636363636,"
-
-## TECHNICAL FIELD
-
-The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufacturing an electronic device, and an electronic device using the same. More specifically, the present invention relates to",0.023636363636363636,"
-
-## TECHNICAL FIELD
-
-The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufacturing an electronic device, and an electronic device using the same. More specifically, the present invention relates to",0.023636363636363636,"TECHNICAL FIELD
-
-The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufacturing an electronic device, and an electronic device using the same. More specifically, the present invention relates to a pa",0.02181818181818182," TECHNICAL FIELD
-
-The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufacturing an electronic device, and an electronic device using the same. More specifically, the present invention relates to a ",0.08181818181818182,"e present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufac› turing an electronic device, and an electronic device using the same. More specifically, the present invention relates to",0.08181818181818182,"e present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufac› turing an electronic device, and an electronic device using the same. More specifically, the present invention relates to",116,patents
-116,5,"BACKGROUND ART A micromachining by a lithography using a photoresist composition has been conducted in a conventional manu- facturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, because",False,0.013071895424836602,"BACKGROUND ART
-
-A micromachining by a lithography using a photoresist composition has been conducted in a conventional manufacturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, because",0.016339869281045753,"BACKGROUND ART
-
-A micromachining by a lithography using a photoresist composition has been conducted in a conventional manufacturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, because ",0.016339869281045753," BACKGROUND ART
-
-A micromachining by a lithography using a photoresist composition has been conducted in a conventional manufacturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, because",0.016339869281045753," BACKGROUND ART
-
-A micromachining by a lithography using a photoresist composition has been conducted in a conventional manufacturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, because",0.013071895424836602,"BACKGROUND ART
-
-A micromachining by a lithography using a photoresist composition has been conducted in a conventional manufacturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, because",0.0784313725490196,"ROUND ART
-
-A micromachining by a lithography using a photoresist composition has been conducted in a conventional manu› facturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, b",0.0784313725490196,"ROUND ART
-
-A micromachining by a lithography using a photoresist composition has been conducted in a conventional manu› facturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, b",116,patents
-116,6,"SUMMARY OF INVENTION The present invention is as follows. [1] A pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition contain- ing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo! % or more based on a whole repeating units in the resin (A):",False,0.08221225710014948,"e present invention is as follows.
-
-[1] A pattern forming method, including:
-
-55 55
-
-(a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
-
-60 60
-
-(b) exposing the film by using an electron beam or extreme ultraviolet ray; and
-
-(c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern,
-
-65 65
-
-wherein a content of the repeating unit represented by Formula (1-0) is 45 mo! % or more based on a whole repeating units in the resin (A)",0.028400597907324365,"MMARY OF INVENTION
-
-The present invention is as follows.
-
-[1] A pattern forming method, including:
-
-(a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
-
-(b) exposing the film by using an electron beam or extreme ultraviolet ray; and
-
-(c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern,
-
-wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A)",0.07324364723467862,"The present invention is as follows.
-
-1. A pattern forming method, including:
- (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
- (b) exposing the film by using an electron beam or extreme ultraviolet ray; and
- (c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern,
-
- wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A):",0.028400597907324365,"MMARY OF INVENTION
-
-The present invention is as follows.
-
-[1] A pattern forming method, including:
-
-(a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
-
-(b) exposing the film by using an electron beam or extreme ultraviolet ray; and
-
-(c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern,
-
-wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A)",0.40059790732436473,"SUMMARY OF INVENTION
-
-The present invention is as follows.
-
-[1] A pattern forming method, including:
-
-(a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
-
-55
-
-These electron beam or X-ray or EUV ray lithography takes a position as a pattern forming technique of the next generation or the next of the next generation, and a resist composition of a high sensitivity and high resolution is desired. Particularly, a high sensitization is a very important problem to be solved for sh",0.17937219730941703,"SUMMARY OF INVENTION
-
-The present invention is as follows.
-
-- [1] A pattern forming method, including:
-2. (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition contain› ing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
-3. (b) exposing the film by using an electron beam or extreme ultraviolet ray; and
-4. ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern,
-
-wherein a content of the repeating unit represented by Formula (1-0) is 45 mo! ",0.17937219730941703,"SUMMARY OF INVENTION
-
-The present invention is as follows.
-
-- [1] A pattern forming method, including:
-2. (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition contain› ing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
-3. (b) exposing the film by using an electron beam or extreme ultraviolet ray; and
-4. ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern,
-
-wherein a content of the repeating unit represented by Formula (1-0) is 45 mo! ",116,patents
-117,0,EP 2 000 008 B1,False,0.0,EP 2 000 008 B1,0.8666666666666667,0020]** FIG. 1 ,0.8,[0020]** FIG. 1,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.8, 20. [0021] In ,0.8, 20. [0021] In ,117,patents
-117,1,"ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many ad- ditional advantages and uses of the systems and meth- ods will become apparent from the following detailed de- scription, which proceeds with reference to the accom- panying drawings.",False,0.033707865168539325,"
-
-ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many additional advantages and uses of the systems and methods will become apparent from the following detailed description, which proceeds with reference to the accompanying drawings.
-
-",0.028089887640449437,"
-
-ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many additional advantages and uses of the systems and methods will become apparent from the following detailed description, which proceeds with reference to the accompanying drawings.",0.02247191011235955,"ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many additional advantages and uses of the systems and methods will become apparent from the following detailed description, which proceeds with reference to the accompanying drawings.",0.033707865168539325,"6
-
-ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many additional advantages and uses of the systems and methods will become apparent from the following detailed de-5 scription, which proceeds with reference to the accompanying drawings.
-
-",0.0449438202247191,"
-
-6
-
-ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many additional advantages and uses of the systems and methods will become apparent from the following detailed description, which proceeds with reference to the accompanying drawings. ",0.05056179775280899,"ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many additional advantages and uses of the systems and methods will become apparent from the following detailed description, which proceeds with reference to the accompanying drawings",0.05056179775280899,"ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many additional advantages and uses of the systems and methods will become apparent from the following detailed description, which proceeds with reference to the accompanying drawings",117,patents
-117,2,"[0020] FIG. 1 illustrates a schematic cross-section view of a system 10 according to a first embodiment for the deposition of a thin-film coating onto a flexible sub- strate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an interme- diate isolation zone 20 in which an inert fluid is present. The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen (N2). When in use, reactive first and second pre- cursor gases (Precursor 1 and Precursor 2) are intro- duced into the respective first and second precursor zones 14,16 from first and second precursor delivery sys- tems 24, 26. Precursor delivery systems 24, 26 may in- clude precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may in- clude piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly included for injecting inert gas into isolation zone 20.",False,0.017741935483870968,"
-
-[0020] FIG. 1 illustrates a schematic cross-section view of a system 10 according to a first embodiment for the deposition of a thin-film coating onto a flexible substrate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an intermediate isolation zone 20 in which an inert fluid is present. The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen (N2). When in use, reactive first and second precursor gases (Precursor 1 and Precursor 2) are introduced into the respective first and second precursor zones 14,16 from first and second precursor delivery systems 24, 26. Precursor delivery systems 24, 26 may include precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may include piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly
-
-included for injecting inert gas into isolation zone 20.
-
-[0",0.02258064516129032,"
-**[0020]** FIG. 1 illustrates a schematic cross-section view of a system 10 according to a first embodiment for the deposition of a thin-film coating onto a flexible substrate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an intermediate isolation zone 20 in which an inert fluid is present. The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen ( $N_2$ ). When in use, reactive first and second precursor gases (Precursor 1 and Precursor 2) are introduced into the respective first and second precursor zones 14, 16 from first and second precursor delivery systems 24, 26. Precursor delivery systems 24, 26 may include precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may include piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly included for injecting inert gas into isolation zone 20.
-
-*",0.02258064516129032,"*[0020]** FIG. 1 illustrates a schematic cross-section view of a system 10 according to a first embodiment for the deposition of a thin-film coating onto a flexible substrate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an intermediate isolation zone 20 in which an inert fluid is present. The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen ($\ce{N2}$). When in use, reactive first and second precursor gases (Precursor 1 and Precursor 2) are introduced into the respective first and second precursor zones 14, 16 from first and second precursor delivery systems 24, 26. Precursor delivery systems 24, 26 may include precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may include piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly included for injecting inert gas into isolation zone 20.
-
-*",0.03387096774193549,"IG. 1 illustrates a schematic cross-section view of a system 10 according to a first embodiment for the deposition of a thin-film coating onto a flexible sub-10 strate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an intermediate isolation zone 20 in which an inert fluid is present. 15 The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen (N2). When in use, reactive first and second precursor gases (Precursor 1 and Precursor 2) are introduced into the respective first and second precursor 20 zones 14,16 from first and second precursor delivery systems 24, 26. Precursor delivery systems 24, 26 may include precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may in-25 clude piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly included for injecting inert gas into isolation zone ",0.02258064516129032,"*[0020]** FIG. 1 illustrates a schematic cross-section view of a system 10 according to a first embodiment for the deposition of a thin-film coating onto a flexible substrate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an intermediate isolation zone 20 in which an inert fluid is present. The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen (N2). When in use, reactive first and second precursor gases (Precursor 1 and Precursor 2) are introduced into the respective first and second precursor zones 14,16 from first and second precursor delivery systems 24, 26. Precursor delivery systems 24, 26 may include precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may include piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly included for injecting inert gas into isolation zone 20. **[0021]**",0.11370967741935484,"
-
-20
-
-25
-
-[0020] FIG. 1 illustrates a schematic crossection view of a system 10 according to a first embodiment for the deposition of a thin- film coating onto a flexible substrate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an intermediate isolation zone 20 in which an inert fluid is present. The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen (N 2 ). When in use, reactive first and second precursor gases (Precursor 1 and Precursor 2) are introduced into the respective first and second precursor zones 14,16 from first and second precursor delivery systems 24, 26. Precursor delivery systems 24, 26 may include precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may include piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly
-
-30",0.11370967741935484,"
-
-20
-
-25
-
-[0020] FIG. 1 illustrates a schematic crossection view of a system 10 according to a first embodiment for the deposition of a thin- film coating onto a flexible substrate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an intermediate isolation zone 20 in which an inert fluid is present. The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen (N 2 ). When in use, reactive first and second precursor gases (Precursor 1 and Precursor 2) are introduced into the respective first and second precursor zones 14,16 from first and second precursor delivery systems 24, 26. Precursor delivery systems 24, 26 may include precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may include piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly
-
-30",117,patents
-117,3,"[0021] In the embodiment shown, precursor zones 14,16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-cham- bers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Ves- sel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the exter- nal environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described below with reference to FIG. 4. A series of first passage- ways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a cor- responding series of second passageways 56 are pro- vided through second divider 36. The passageways 54, 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14,16 multiple times, and each time through isolation zone 20. For a web substrate, pas- sageways 54, 56 preferably comprise slits having a width (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) ex- tending into the plane of FIG.1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit imperfectly) from the first precursor zone 14 by first di- vider 34 and from second precursor zone 16 by second divider 36.",False,0.01721938775510204,"
-[0021] In the embodiment shown, precursor zones 14,16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-chambers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Vessel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the external environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described below with reference to FIG. 4. A series of first passageways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a corresponding series of second passageways 56 are provided through second divider 36. The passageways 54, 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14,16 multiple times, and each time through isolation zone 20. For a web substrate, passageways 54, 56 preferably comprise slits having a width (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) extending into the plane of FIG.1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit imperfectly) from the first precursor zone 14 by first divider 34 and from second precursor zone 16 by second divider 36.
-
-[0022]",0.02295918367346939,"20.
-
-**[0021]** In the embodiment shown, precursor zones 14, 16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-chambers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Vessel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the external environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described below with reference to FIG. 4. A series of first passageways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a corresponding series of second passageways 56 are provided through second divider 36. The passageways 54, 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14, 16 multiple times, and each time through isolation zone 20. For a web substrate, passageways 54, 56 preferably comprise slits having a width (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) extending into the plane of FIG. 1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit imperfectly) from the first precursor zone 14 by first divider 34 and from second precursor zone 16 by second divider 36.
-
-**[0",0.02295918367346939,"20.
-
-**[0021]** In the embodiment shown, precursor zones 14, 16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-chambers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Vessel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the external environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described below with reference to FIG. 4. A series of first passageways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a corresponding series of second passageways 56 are provided through second divider 36. The passageways 54, 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14, 16 multiple times, and each time through isolation zone 20. For a web substrate, passageways 54, 56 preferably comprise slits having a width (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) extending into the plane of FIG. 1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit imperfectly) from the first precursor zone 14 by first divider 34 and from second precursor zone 16 by second divider 36.
-
-**[0",0.021683673469387755,"[0021] In the embodiment shown, precursor zones 30 14,16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-chambers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Ves-35 sel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the external environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described 40 below with reference to FIG. 4. A series of first passageways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a corresponding series of second passageways 56 are provided through second divider 36. The passageways 54, 45 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14,16 multiple times, and each time through isolation zone 20. For a web substrate, passageways 54, 56 preferably comprise slits having a width 50 (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) extending into the plane of FIG.1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit 55 imperfectly) from the first precursor zone 14 by first divider 34 and from second precursor zone 16 by second divider 36",0.02295918367346939,"one 20. **[0021]** In the embodiment shown, precursor zones 14,16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-chambers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Vessel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the external environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described below with reference to FIG. 4. A series of first passageways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a corresponding series of second passageways 56 are provided through second divider 36. The passageways 54, 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14,16 multiple times, and each time through isolation zone 20. For a web substrate, passageways 54, 56 preferably comprise slits having a width (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) extending into the plane of FIG.1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit imperfectly) from the first precursor zone 14 by first divider 34 and from second precursor zone 16 by second divider 36.
-
-5
-",0.09438775510204081,"16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-chambers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Vessel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the external environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described below with reference to FIG. 4. A series of first passageways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a corresponding series of second passageways 56 are provided through second divider 36. The passageways 54, 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14,16 multiple times, and each time through isolation zone 20. For a web substrate, passageways 54, 56 preferably comprise slits having a width (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) extending into the plane of FIG.1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit imperfectly) from the first precursor zone 14 by first divider 34 and from second precursor zone 16 by second divide",0.09438775510204081,"16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-chambers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Vessel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the external environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described below with reference to FIG. 4. A series of first passageways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a corresponding series of second passageways 56 are provided through second divider 36. The passageways 54, 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14,16 multiple times, and each time through isolation zone 20. For a web substrate, passageways 54, 56 preferably comprise slits having a width (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) extending into the plane of FIG.1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit imperfectly) from the first precursor zone 14 by first divider 34 and from second precursor zone 16 by second divide",117,patents
-117,4,"[0022] To substantially prevent non-ALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Pas- sageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14,16, 20, to avoid or limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and mar- gins may range between microns and millimeters in cer- tain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embod- iments, the passageways 54, 56 include a wiper for fur- ther restricting flow. In one such embodiment, the sub- strate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe against opposing surfaces of the substrate.",False,0.07859078590785908,"bstantially prevent non-ALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Passageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14,16, 20, to avoid or limit diffusion of precursor gases into a common zone. limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and margins may range between microns and millimeters in certain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embodiments, the passageways 54, 56 include a wiper for further restricting flow. In one such embodiment, the substrate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe agains",0.016260162601626018,"
-**[0022]** To substantially prevent non-ALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Passageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14, 16, 20, to avoid or limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and margins may range between microns and millimeters in certain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embodiments, the passageways 54, 56 include a wiper for further restricting flow. In one such embodiment, the substrate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe against opposing surfaces of the substrate.
-
-**[0",0.016260162601626018,"
-**[0022]** To substantially prevent non-ALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Passageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14, 16, 20, to avoid or limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and margins may range between microns and millimeters in certain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embodiments, the passageways 54, 56 include a wiper for further restricting flow. In one such embodiment, the substrate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe against opposing surfaces of the substrate.
-
-**[0",0.016260162601626018,"6.
-
-[0022] To substantially prevent non-ALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Passageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14,16, 20, to avoid or limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and margins may range between microns and millimeters in certain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embodiments, the passageways 54, 56 include a wiper for further restricting flow. In one such embodiment, the substrate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe against opposing surfaces of the substrate.
-
-[0023]",0.016260162601626018,"
-**[0022]** To substantially prevent non-ALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Passageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14,16, 20, to avoid or limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and margins may range between microns and millimeters in certain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embodiments, the passageways 54, 56 include a wiper for further restricting flow. In one such embodiment, the substrate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe against opposing surfaces of the substrate.
-
-**[0",0.0948509485094851," nonALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Passageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14,16, 20, to avoid or limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and margins may range between microns and millimeters in certain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embodiments, the passageways 54, 56 include a wiper for further restricting flow. In one such embodiment, the substrate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe against opposing ",0.0948509485094851," nonALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Passageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14,16, 20, to avoid or limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and margins may range between microns and millimeters in certain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embodiments, the passageways 54, 56 include a wiper for further restricting flow. In one such embodiment, the substrate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe against opposing ",117,patents
-117,5,"[0023] In an alternate embodiment (not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extend- ing completely between precursor zones 14,16. In such an embodiment, no common inert gas chamber 50 con- nects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14,16 to help prevent precursor migra- tion and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would be formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the system as shown in FIG. 1.",False,0.13434452871072589,"nt (not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extending completely between precursor zones 14,16. In such an embodiment, no common inert gas chamber 50 connects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14,16 to help prevent precursor migration and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would be formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the",0.013001083423618635,"*[0023]** In an alternate embodiment (not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extending completely between precursor zones 14, 16. In such an embodiment, no common inert gas chamber 50 connects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14, 16 to help prevent precursor migration and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would be formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the system as shown in FIG. 1.
-",0.013001083423618635,"*[0023]** In an alternate embodiment (not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extending completely between precursor zones 14, 16. In such an embodiment, no common inert gas chamber 50 connects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14, 16 to help prevent precursor migration and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would be formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the system as shown in FIG. 1.
-",0.013001083423618635,"te.
-
-[0023] In an alternate embodiment (not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extending completely between precursor zones 14,16. In such an embodiment, no common inert gas chamber 50 connects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14,16 to help prevent precursor migration and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would be formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the system as shown in FIG. 1.
-",0.013001083423618635,"**[0023]** In an alternate embodiment (not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extending completely between precursor zones 14,16. In such an embodiment, no common inert gas chamber 50 connects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14,16 to help prevent precursor migration and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would be formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the system as shown in FIG. 1.
-",0.09750812567713976,"not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extending completely between precursor zones 14,16. In such an embodiment, no common inert gas chamber 50 connects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14,16 to help prevent precursor migration and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the system as shown in FIG. ",0.09750812567713976,"not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extending completely between precursor zones 14,16. In such an embodiment, no common inert gas chamber 50 connects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14,16 to help prevent precursor migration and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the system as shown in FIG. ",117,patents
-117,6,"[0024] To help isolate the first precursor gas from the second precursor gas, pressure differentials are prefer- ably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodi- ment, the pressure differentials may be generated by in- jecting inert gas into isolation zone 20 at a pressure great- er than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the ex- haust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pres- sure differentials may also be generated by pumping from",False,0.023017902813299233,"40
-
-[0024] To help isolate the first precursor gas from the second precursor gas, pressure differentials are preferably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodiment, the pressure differentials may be generated by injecting inert gas into isolation zone 20 at a pressure greater than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the exhaust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pressure differentials may also be generated by pumping from
-
-",0.017902813299232736,"[0024]** To help isolate the first precursor gas from the second precursor gas, pressure differentials are preferably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodiment, the pressure differentials may be generated by injecting inert gas into isolation zone 20 at a pressure greater than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the exhaust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pressure differentials may also be generated by pumping from",0.017902813299232736,"[0024]** To help isolate the first precursor gas from the second precursor gas, pressure differentials are preferably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodiment, the pressure differentials may be generated by injecting inert gas into isolation zone 20 at a pressure greater than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the exhaust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pressure differentials may also be generated by pumping from",0.015345268542199489,"[0024] To help isolate the first precursor gas from the second precursor gas, pressure differentials are preferably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodiment, the pressure differentials may be generated by injecting inert gas into isolation zone 20 at a pressure greater than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the exhaust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pressure differentials may also be generated by pumping from",0.030690537084398978,"[0024]** To help isolate the first precursor gas from the second precursor gas, pressure differentials are preferably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodiment, the pressure differentials may be generated by injecting inert gas into isolation zone 20 at a pressure greater than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the exhaust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pressure differentials may also be generated by pumping from
-
-**4**
-",0.11636828644501279,"0024] To help isolate the first precursor gas from the second precursor gas, pressure differentials are preferably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodiment, the pressure differentials may be generated by injecting inert gas into isolation zone 20 at a pressure greater than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the exhaust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pressure differentials may ",0.11636828644501279,"0024] To help isolate the first precursor gas from the second precursor gas, pressure differentials are preferably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodiment, the pressure differentials may be generated by injecting inert gas into isolation zone 20 at a pressure greater than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the exhaust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pressure differentials may ",117,patents
-118,0,EP 1 499 943 B1,False,0.0,EP 1 499 943 B1,0.9333333333333333," 15, wobei das ",0.8666666666666667,"
-
- Bestimmen",0.0,EP 1 499 943 B1,0.0,EP 1 499 943 B1,0.8666666666666667," 10, wobei d",0.8666666666666667," 10, wobei d",118,patents
-118,1,"Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfängt.",False,0.01680672268907563,"Betriebsspannung der ersten integrierten
-Schaltung, wobei die Spannungsregelungslogik
-ein Signal vom Programm empfängt.",0.0,"Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfängt.",0.0,"Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfängt.",0.0,"Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfängt.",0.0,"Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfängt.",0.05042016806722689,"Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfän",0.05042016806722689,"Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfän",118,patents
-118,2,"15. Vorrichtung nach Anspruch 10, wobei die Anweisun- gen in einem Basisdatenaustauschsystem (BIOS) residieren.",False,0.02702702702702703,"
-15. Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Basisdatenaustauschsystem (BIOS) residieren.",0.036036036036036036,"
-
-15. Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Basisdatenaustauschsystem (BIOS) residieren.",0.036036036036036036,"
-15. Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Basisdatenaustauschsystem (BIOS) residieren.
-",0.036036036036036036,"15.** Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Basisdatenaustauschsystem (BIOS) residieren.",0.036036036036036036,"15.** Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Basisdatenaustauschsystem (BIOS) residieren.",0.18018018018018017,"Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Basisdatenaustauschsystem (BIOS) residie",0.18018018018018017,"Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Basisdatenaustauschsystem (BIOS) residie",118,patents
-118,3,"16. Vorrichtung nach Anspruch 10, wobei die Anweisun- gen in einem Betriebssystem residieren.",False,0.03225806451612903,"
-16. Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Betriebssystem residieren.",0.043010752688172046,"
-
-16. Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Betriebssystem residieren.",0.043010752688172046,"
-
-16. Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Betriebssystem residieren.",0.043010752688172046,"16.** Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Betriebssystem residieren.",0.043010752688172046,"16.** Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Betriebssystem residieren.",0.12903225806451613,"Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Betriebssystem residieren.",0.12903225806451613,"Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Betriebssystem residieren.",118,patents
-118,4,"17. Vorrichtung nach Anspruch 10, wobei die Anweisun- gen in Anwendungssoftware residieren.",False,0.03296703296703297,"
-17. Vorrichtung nach Anspruch 10, wobei die Anweisungen in Anwendungssoftware residieren.",0.04395604395604396,"17. Vorrichtung nach Anspruch 10, wobei die Anweisungen in Anwendungssoftware residieren.
-
-",0.04395604395604396,"
-17. Vorrichtung nach Anspruch 10, wobei die Anweisungen in Anwendungssoftware residieren.
-",0.04395604395604396,"17.** Vorrichtung nach Anspruch 10, wobei die Anweisungen in Anwendungssoftware residieren.",0.04395604395604396,"17.** Vorrichtung nach Anspruch 10, wobei die Anweisungen in Anwendungssoftware residieren.",0.13186813186813187," Vorrichtung nach Anspruch 10, wobei die Anweisungen in Anwendungssoftware residieren",0.13186813186813187," Vorrichtung nach Anspruch 10, wobei die Anweisungen in Anwendungssoftware residieren",118,patents
-118,5,"18. Vorrichtung nach Anspruch 10, wobei die erste inte- grierte Schaltung ein Chipset umfasst.",False,0.031914893617021274,"18. Vorrichtung nach Anspruch 10, wobei die erste integrierte Schaltung ein Chipset umfasst.
-",0.0425531914893617,"
-18. Vorrichtung nach Anspruch 10, wobei die erste integrierte Schaltung ein Chipset umfasst.
-",0.0425531914893617,"
-
-18. Vorrichtung nach Anspruch 10, wobei die erste integrierte Schaltung ein Chipset umfasst.",0.0425531914893617,"18.** Vorrichtung nach Anspruch 10, wobei die erste integrierte Schaltung ein Chipset umfasst.",0.0425531914893617,"18.** Vorrichtung nach Anspruch 10, wobei die erste integrierte Schaltung ein Chipset umfasst.",0.0425531914893617,"
-18. Vorrichtung nach Anspruch 10, wobei die erste integrierte Schaltung ein Chipset umfasst.
-",0.0425531914893617,"
-18. Vorrichtung nach Anspruch 10, wobei die erste integrierte Schaltung ein Chipset umfasst.
-",118,patents
-118,6,"23. Maschinenlesbares Medium, das Anweisungen be- reitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durch- führt, umfassend: Detektieren (402) eines Ereignisses, um eine in- tegrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu verset- zen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Be- nutzer eingeleitetes Ereignis oder ein von Soft- ware eingeleitetes Ereignis ist;",False,0.025780189959294438,".
-
-23. Maschinenlesbares Medium, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; w",0.033921302578018994," erhöht.
-
-23. Maschinenlesbares Medium, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustandes, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;",0.032564450474898234,"
-23. Maschinenlesbares Medium, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-
- Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und
-
- Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;
-",0.033921302578018994,"
-
-**23.** Maschinenlesbares Medium, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; wenn",0.032564450474898234,"23.** Maschinenlesbares Medium, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; wenn da",0.16417910447761194,"m, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-
-40
-
-45
-
-50
-
-55
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance- Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance- Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingel",0.16417910447761194,"m, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-
-40
-
-45
-
-50
-
-55
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance- Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance- Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingel",118,patents
-118,7,"Revendications 1. Procédé comportant les étapes consistant à : détecter (402) un événement pour faire passer un circuit intégré d’un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de performan-",False,0.05622489959839357,"evendications
-
-1. Procédé comportant les étapes consistant à :
-
-55
-
-détecter (402) un événement pour faire passer un circuit intégré d’un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de perfo",0.028112449799196786,"evendications
-
-1. Procédé comportant les étapes consistant à :
-
-détecter (402) un événement pour faire passer un circuit intégré d'un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de performan",0.060240963855421686,"dications
-
-1. Procédé comportant les étapes consistant à :
-
- détecter (402) un événement pour faire passer un circuit intégré d’un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de performa",0.060240963855421686,"vendications
-
-**1.** Procédé comportant les étapes consistant à :
-
-détecter (402) un événement pour faire passer un circuit intégré d'un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de perfor",0.08032128514056225,"dications**
-
-**1.** Procédé comportant les étapes consistant à :
-
-détecter (402) un événement pour faire passer un circuit intégré d’un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de perfo",0.12449799196787148,"1. Procédé comportant les étapes consistant à :
-
-détecter (402) un événement pour faire passer un circuit intégré d'un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de performan-",0.12449799196787148,"1. Procédé comportant les étapes consistant à :
-
-détecter (402) un événement pour faire passer un circuit intégré d'un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de performan-",118,patents
-119,0,US 2019/0010119 Al,False,0.0,US 2019/0010119 Al,0.9444444444444444,preferably 10 mol ,0.1111111111111111, US 2019/0010119 A,0.1111111111111111,"
-US 2019/0010119 A",0.0,US 2019/0010119 Al,0.8333333333333334,"e -->
-
-[0144] As t",0.8333333333333334,"e -->
-
-[0144] As t",119,patents
-119,1,40,False,0.0,40,0.5,4],0.0,40,0.0,40,0.0,40,1.0,14,1.0,14,119,patents
-119,2,"Jan. 10, 2019",False,0.0,"Jan. 10, 2019",0.9230769230769231,referably 10 ,0.0,"Jan. 10, 2019",0.0,"Jan. 10, 2019",0.0,"Jan. 10, 2019",0.8461538461538461,eferably 10 m,0.8461538461538461,eferably 10 m,119,patents
-119,3,"[0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!%.",False,0.0,"[0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!%.",0.024691358024691357,"0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mol %, more preferably 10 mol % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mol %, more preferably 60 mol %.",0.037037037037037035,"*[0144]** As the amount of the repeating unit BN2, the lower limit is preferably 5 mol %, more preferably 10 mol % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mol %, more preferably 60 mo",0.024691358024691357,"[0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mol %, more preferably 10 mol % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mol %, more preferably 60 mol %",0.01646090534979424,"[0144]** As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!",0.00823045267489712,"0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!%.",0.00823045267489712,"0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!%.",119,patents
-119,4,"[0145] When the inventive resist composition is a chemi- cally amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.",False,0.00473186119873817,"
-[0145] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.",0.012618296529968454,"[0145] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit B1 in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mol % or more, more preferably 70 mol % or more, and still more preferably 80 mol % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.
-
-",0.012618296529968454,"[0145]** When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit B1 in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mol % or more, more preferably 70 mol % or more, and still more preferably 80 mol % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.",0.012618296529968454,"
-[0145] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit B1 in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mol % or more, more preferably 70 mol % or more, and still more preferably 80 mol % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.
-",0.006309148264984227,"[0145]** When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.",0.06782334384858044,"n the inventive resist composition is a chemi› cally amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist c",0.06782334384858044,"n the inventive resist composition is a chemi› cally amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist c",119,patents
-119,5,"g p [0146] When the inventive resist composition is a chemi- cally amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustra- tive examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesive- ness to a substrate and the solubility without showing acidity.",False,0.0197869101978691,"ion.
-
-[0146] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.
-",0.0258751902587519,"on.
-
-[0146] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (b1) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.
-
-(b1",0.030441400304414,"*[0146]** When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (b1) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.
-
-$$
-\t",0.030441400304414,"
-[0146] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (b1) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.
-
-(b1)
-
-[",0.0228310502283105,"on.
-
-**[0146]** When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.",0.1141552511415525,"[0146] When the inventive resist composition is a chemi› cally amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustra› tive examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesive› ness to a substrate and the so",0.1141552511415525,"[0146] When the inventive resist composition is a chemi› cally amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustra› tive examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesive› ness to a substrate and the so",119,patents
-120,0,EP 1 499 943 B1,False,0.0,EP 1 499 943 B1,0.8666666666666667,"s of claim 14, ",0.0,EP 1 499 943 B1,0.0,EP 1 499 943 B1,0.0,EP 1 499 943 B1,0.9333333333333333,"m.
-
-## 14. The ",0.9333333333333333,"m.
-
-## 14. The ",120,patents
-120,1,"13. The apparatus of claim 10, further comprising: frequency regulation logic to change an operat- ing frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the program.",False,0.018691588785046728,"13. The apparatus of claim 10, further comprising:
-
-frequency regulation logic to change an operating frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the program.",0.02336448598130841,"13. The apparatus of claim 10, further comprising:
-
-frequency regulation logic to change an operating frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the program.
-",0.037383177570093455,"3. The apparatus of claim 10, further comprising:
- frequency regulation logic to change an operating frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the program",0.03271028037383177,"13.** The apparatus of claim 10, further comprising:
-
-frequency regulation logic to change an operating frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the program",0.03271028037383177,".** The apparatus of claim 10, further comprising:
-
-frequency regulation logic to change an operating frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the program.",0.07009345794392523,". The apparatus of claim 10, further comprising:
-
-frequency regulation logic to change an operating frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the progr",0.07009345794392523,". The apparatus of claim 10, further comprising:
-
-frequency regulation logic to change an operating frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the progr",120,patents
-120,2,"14. The apparatus of claim 10, further comprising: voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the pro- gram.",False,0.019230769230769232,"14. The apparatus of claim 10, further comprising:
-
-voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the program.",0.02403846153846154,"14. The apparatus of claim 10, further comprising:
-
-voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the program.
-",0.038461538461538464,"4. The apparatus of claim 10, further comprising:
- voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the program",0.03365384615384615,"14.** The apparatus of claim 10, further comprising:
-
-voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the program",0.03365384615384615,".** The apparatus of claim 10, further comprising:
-
-voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the program.",0.02403846153846154,"14. The apparatus of claim 10, further comprising:
-
-voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the program.
-",0.02403846153846154,"14. The apparatus of claim 10, further comprising:
-
-voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the program.
-",120,patents
-120,3,"15. The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.",False,0.0,"15. The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.",0.0,"15. The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.",0.0,"15. The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.",0.0425531914893617,"5.** The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System",0.031914893617021274,".** The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.",0.0,"15. The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.",0.0,"15. The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.",120,patents
-120,4,"16. The apparatus of claim 10, wherein the instructions reside in an operating system.",False,0.0,"16. The apparatus of claim 10, wherein the instructions reside in an operating system.",0.0,"16. The apparatus of claim 10, wherein the instructions reside in an operating system.",0.0,"16. The apparatus of claim 10, wherein the instructions reside in an operating system.",0.03488372093023256,".** The apparatus of claim 10, wherein the instructions reside in an operating system.",0.046511627906976744,"16.** The apparatus of claim 10, wherein the instructions reside in an operating syste",0.0,"16. The apparatus of claim 10, wherein the instructions reside in an operating system.",0.0,"16. The apparatus of claim 10, wherein the instructions reside in an operating system.",120,patents
-120,5,"Patentansprüche 1. Verfahren, umfassend: Detektieren (402) eines Ereignisses, um eine in- tegrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu verset- zen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als",False,0.07323943661971831,"end: 1. Verfahren, umfassend:
-
-55
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als
-
-9",0.030985915492957747,"Patentansprüche
-
-## 1. Verfahren, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher al",0.036619718309859155,"atentansprüche
-
-1. Verfahren, umfassend:
- Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher al",0.03943661971830986,"atentansprüche
-
-**1.** Verfahren, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher al",0.056338028169014086,"Patentansprüche**
-
-**1.** Verfahren, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höh",0.1267605633802817," 1. Verfahren, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance- Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher ",0.1267605633802817," 1. Verfahren, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance- Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher ",120,patents
-121,0,US 2012/0003590 Al,False,0.0,US 2012/0003590 Al,0.9444444444444444,"
-- Monomer: A sulf",0.05555555555555555,US 2012/0003590 A1,0.05555555555555555,US 2012/0003590 A1,0.0,US 2012/0003590 Al,0.8333333333333334,"unit (B).
-
-[0319] ",0.8333333333333334,"unit (B).
-
-[0319] ",121,patents
-121,1,"Jan. 5, 2012",False,0.0,"Jan. 5, 2012",0.8333333333333334,"minus$ ), wh",0.0,"Jan. 5, 2012",0.0,"Jan. 5, 2012",0.0,"Jan. 5, 2012",0.9166666666666666,ation. The p,0.9166666666666666,ation. The p,121,patents
-121,2,60,False,0.0,60,1.0,"
-
-",0.0,60,0.0,60,0.0,60,1.0,0],1.0,0],121,patents
-121,3,-continued,False,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,121,patents
-121,4," [0317] The composition of the present invention may fur- ther contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an anti- oxidant, a solvent and the like. These components are described below. (Photo-Acid Generator)",False,0.04498269896193772,"Other Components>
-
-[0317] The composition of the present invention may further contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an antioxidant, a solvent and the like. These components are described below.
-
-## (Photo-Acid Generato",0.7820069204152249,"
-
--continued
-
-Chemical structures shown:
-
-- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone gro",0.0726643598615917,"r Components>
-
-**[0317]** The composition of the present invention may further contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an antioxidant, a solvent and the like. These components are described below.
-
-### (Photo-Acid Generator",0.09688581314878893,"ther Components>
-
-[0317] The composition of the present invention may further contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an anti-oxidant, a solvent and the like. These components are described below.
-
-(Photo-Acid Ge",0.05536332179930796,"her Components>
-
-**[0317]** The composition of the present invention may further contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an antioxidant, a solvent and the like. These components are described below.
-
-(Photo-Acid Generator",0.1384083044982699,"[0317] The composition of the present invention may fur› ther contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an anti› oxidant, a solvent and the like. These components are described below.
-
-## (Photo-Acid Generator)",0.1384083044982699,"[0317] The composition of the present invention may fur› ther contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an anti› oxidant, a solvent and the like. These components are described below.
-
-## (Photo-Acid Generator)",121,patents
-121,5,[0318] The composition of the present invention may fur- ther contain a photo-acid generator in addition to the repeat- ing unit (A) and the repeating unit (B).,False,0.0375,"
-
-[0318] The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B).",0.84375,"ted sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated ",0.05,"*[0318]** The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B).
-",0.05,"s>
-
-[0318] The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B).",0.05,*[0318]** The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B). ,0.0125,[0318] The composition of the present invention may fur› ther contain a photo-acid generator in addition to the repeat› ing unit (A) and the repeating unit (B).,0.0125,[0318] The composition of the present invention may fur› ther contain a photo-acid generator in addition to the repeat› ing unit (A) and the repeating unit (B).,121,patents
-121,6,"[0319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-dis- coloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",False,0.004335260115606936,"
-[0319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",0.8164739884393064,"
-
--continued
-
-Chemical structures shown:
-
-- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\te",0.005780346820809248,"[0319]** The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",0.005780346820809248,"
-
-[0319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",0.005780346820809248,"[0319]** The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",0.01878612716763006,"319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-dis› coloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazometha",0.01878612716763006,"319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-dis› coloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazometha",121,patents
-121,7,"[0320] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII):",False,0.007518796992481203,"[0320] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and(ZIII):",0.849624060150376,"t{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( ",0.03007518796992481,"0320]** Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII)",0.0,"[0320] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII):",0.09022556390977443," Preferred examples of the photo-acid generator include compounds represented by the following formulae **(ZI), (ZII)** and **(ZIII):",0.09022556390977443,"] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII)",0.09022556390977443,"] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII)",121,patents
-121,8,P-55,False,0.25,P-54,1.0,"
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-122,2,(43) Veröffentlichungstag: 07.04.2021 Patentblatt 2021/14,False,0.017543859649122806,"(43) Veröffentlichungstag:
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-- Veröffentlichungstag: 07.04.2021 Patentblatt 2021",0.10526315789473684,"(43)
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-122,3,(21) Anmeldenummer: 19200966.0,False,0.0,(21) Anmeldenummer: 19200966.0,0.0,(21) Anmeldenummer: 19200966.0,0.13333333333333333,21) Anmeldenummer:** 19200966.,0.13333333333333333,(21) Anmeldenummer: **19200966,0.13333333333333333,21) Anmeldenummer: **19200966.,0.13333333333333333,")
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-122,4,(22) Anmeldetag: 02.10.2019,False,0.0,(22) Anmeldetag: 02.10.2019,0.0,(22) Anmeldetag: 02.10.2019,0.14814814814814814,22) Anmeldetag:** 02.10.201,0.14814814814814814,2) Anmeldetag: **02.10.2019,0.14814814814814814,(22) Anmeldetag: **02.10.20,0.0,(22) Anmeldetag: 02.10.2019,0.0,(22) Anmeldetag: 02.10.2019,122,patents
-122,5,(51) Int Cl.: B26D 1/16 (2006.01) (2006 01),False,0.3953488372093023," Int Cl.: Cl.:
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-122,6,(84) Benannte Vertragsstaaten: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR Benannte Erstreckungsstaaten: BA ME Benannte Validierungsstaaten: KH MA MD TN,False,0.0,(84) Benannte Vertragsstaaten: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR Benannte Erstreckungsstaaten: BA ME Benannte Validierungsstaaten: KH MA MD TN,0.1036036036036036,"nannte Vertragsstaaten:
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-122,7,(71) Anmelder: Dienes Werke für Maschinenteile GmbH & Co. KG 51491 Overath (DE),False,0.05063291139240506,"(71) Anmelder:Dienes Werke für Maschinenteile
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-122,8,"(72) Erfinder: • Thielen, Rolf 50733 Köln (DE)",False,0.21739130434782608," Erfinder:
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-122,9,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,False,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.08888888888888889,4) **SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.08888888888888889,54) **SENSORVORRICHTUNG FÜR EINEN MESSERHALTE,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,122,patents
-122,10,"(57) Die vorliegende Erfindung betrifft eine Sensor- vorrichtung (4) für einen Messerhalter (1), umfassend - einen Grundkörper (6) zur Befestigung der Sensorvor- richtung (4) an einem Messerhalter (1), - mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und - einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) er- fassten Größe.",False,0.021479713603818614,"(57) Die vorliegende Erfindung betrifft eine Sensorvorrichtung (4) für einen Messerhalter (1), umfassend - einen Grundkörper (6) zur Befestigung der Sensorvorrichtung (4) an einem Messerhalter (1), - mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und - einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) erfassten Größe.
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-- mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und
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-",0.028639618138424822,"(57) Die vorliegende Erfindung betrifft eine Sensorvorrichtung (4) für einen Messerhalter (1), umfassend - einen Grundkörper (6) zur Befestigung der Sensorvorrichtung (4) an einem Messerhalter (1),
-
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-- mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und
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-123,0,"une deuxième zone précurseur (16, 116, 316) espacée de la première, le deuxième gaz pré- curseur étant différent du premier ; guidage d’un substrat flexible (12, 112, 312) se- lon un mouvement de navette entre les première et deuxième zones précurseurs, en passant par une série de passages d’étranglement (54, 56, 154, 156, 354, 356) d’une zone d’isolation (20, 120, 320) interposée entre les première et deuxième zones précurseurs, de façon à ce que le substrat traverse les première et deuxième zones précurseurs plusieurs fois, qu’une mono- couche du premier gaz précurseur adsorbe à la surface du substrat pendant le transit du subs- trat dans la première zone précurseur et que, pendant un transit ultérieur du substrat dans la deuxième zone précurseur, le deuxième gaz précurseur réagisse avec le premier précurseur adsorbé à la surface du substrat afin de déposer un film mince sur le substrat ; introduction d’un gaz inerte dans la zone d’isolation ; et création d’un premier différentiel de pression en- tre la zone d’isolation et la première zone pré- curseur et d’un deuxième différentiel de pres- sion entre la zone d’isolation et la deuxième zo- ne précurseur, les différentiels de pression étant suffisants pour empêcher la migration des pre- mier et deuxième gaz précurseurs hors des pre- mière et deuxième zones précurseurs respecti- ves et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empê- che les réactions à l’intérieur des zones entre les quantités non-adsorbées des premier et deuxième gaz précurseurs.",False,0.023106546854942234,"8 B1
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-28
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-une deuxième zone précurseur (16, 116, 316) espacée de la première, le deuxième gaz précurseur étant différent du premier ; guidage d’un substrat flexible (12, 112, 312) selon un mouvement de navette entre les première et deuxième zones précurseurs, en passant par une série de passages d’étranglement (54, 56, 154, 156, 354, 356) d’une zone d’isolation (20, 120, 320) interposée entre les première et deuxième zones précurseurs, de façon à ce que le substrat traverse les première et deuxième zones précurseurs plusieurs fois, qu’une monocouche du premier gaz précurseur adsorbe à la surface du substrat pendant le transit du substrat dans la première zone précurseur et que, pendant un transit ultérieur du substrat dans la deuxième zone précurseur, le deuxième gaz précurseur réagisse avec le premier précurseur adsorbé à la surface du substrat afin de déposer un film mince sur le substrat ; introduction d’un gaz inerte dans la zone d’isolation ; et création d’un premier différentiel de pression entre la zone d’isolation et la première zone précurseur et d’un deuxième différentiel de pression entre la zone d’isolation et la deuxième zone précurseur, les différentiels de pression étant suffisants pour empêcher la migration des premier et deuxième gaz précurseurs hors des première et deuxième zones précurseurs respectives et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empêche les réactions à l’intérieur des zones entre les quantités non-adsorbées des premier et deuxième gaz précurseurs.
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-introduction d'un gaz inerte dans la zone d'isolation ; et
-création d'un premier différentiel de pression entre la zone d'isolation et la première zone précurseur et d'un deuxième différentiel de pression entre la zone d'isolation et la deuxième zone précurseur, les différentiels de pression étant suffisants pour empêcher la migration des premier et deuxième gaz précurseurs hors des première et deuxième zones précurseurs respectives et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empêche les réactions à l'intérieur des zones entre les quantités non-adsorbées des premier et deuxième gaz précurseurs.",0.029525032092426188," B1
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-- guidage d’un substrat flexible (12, 112, 312) selon un mouvement de navette entre les première et deuxième zones précurseurs, en passant par une série de passages d’étranglement (54, 56, 154, 156, 354, 356) d’une zone d’isolation (20, 120, 320) interposée entre les première et deuxième zones précurseurs, de façon à ce que le substrat traverse les première et deuxième zones précurseurs plusieurs fois, qu’une mono-couche du premier gaz précurseur adsorbe à la surface du substrat pendant le transit du substrat dans la première zone précurseur et que, pendant un transit ultérieur du substrat dans la deuxième zone précurseur, le deuxième gaz précurseur réagisse avec le premier précurseur adsorbé à la surface du substrat afin de déposer un film mince sur le substrat ;
-- introduction d’un gaz inerte dans la zone d’isolation ; et
-- création d’un premier différentiel de pression entre la zone d’isolation et la première zone précurseur et d’un deuxième différentiel de pression entre la zone d’isolation et la deuxième zone précurseur, les différentiels de pression étant suffisants pour empêcher la migration des premier et deuxième gaz précurseurs hors des première et deuxième zones précurseurs respectives et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empêche les réactions à l’intérieur des zones entre les quantités non-adsorbées des premier et deuxième gaz précurseurs.
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-**13.** ",0.03337612323491656,"
-une deuxième zone précurseur (16, 116, 316) espacée de la première, le deuxième gaz précurseur étant différent du premier ; guidage d'un substrat flexible (12, 112, 312) selon un mouvement de navette entre les première 5 et deuxième zones précurseurs, en passant par une série de passages d'étranglement (54, 56, 154, 156, 354, 356) d'une zone d'isolation (20, 120, 320) interposée entre les première et deuxième zones précurseurs, de façon à ce que 10 le substrat traverse les première et deuxième zones précurseurs plusieurs fois, qu'une monocouche du premier gaz précurseur adsorbe à la surface du substrat pendant le transit du substrat dans la première zone précurseur et que, 15 pendant un transit ultérieur du substrat dans la deuxième zone précurseur, le deuxième gaz précurseur réagisse avec le premier précurseur adsorbé à la surface du substrat afin de déposer un film mince sur le substrat ; 20 introduction d'un gaz inerte dans la zone d'isolation ; et création d'un premier différentiel de pression entre la zone d'isolation et la première zone précurseur et d'un deuxième différentiel de pres- 25 sion entre la zone d'isolation et la deuxième zone précurseur, les différentiels de pression étant suffisants pour empêcher la migration des premier et deuxième gaz précurseurs hors des première et deuxième zones précurseurs respecti- 30 ves et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empêche les réactions à l'intérieur des zones entre les quantités non-adsorbées des premier et deuxième gaz précurseurs. 3",0.03080872913992298,"
-une deuxième zone précurseur (16, 116, 316) espacée de la première, le deuxième gaz précurseur étant différent du premier ; guidage d’un substrat flexible (12, 112, 312) selon un mouvement de navette entre les première et deuxième zones précurseurs, en passant par une série de passages d’étranglement (54, 56, 154, 156, 354, 356) d’une zone d’isolation (20, 120, 320) interposée entre les première et deuxième zones précurseurs, de façon à ce que le substrat traverse les première et deuxième zones précurseurs plusieurs fois, qu’une monocouche du premier gaz précurseur adsorbe à la surface du substrat pendant le transit du substrat dans la première zone précurseur et que, pendant un transit ultérieur du substrat dans la deuxième zone précurseur, le deuxième gaz précurseur réagisse avec le premier précurseur adsorbé à la surface du substrat afin de déposer un film mince sur le substrat ; introduction d’un gaz inerte dans la zone d’isolation ; et
-
-création d’un premier différentiel de pression entre la zone d’isolation et la première zone précurseur et d’un deuxième différentiel de pression entre la zone d’isolation et la deuxième zone précurseur, les différentiels de pression étant suffisants pour empêcher la migration des premier et deuxième gaz précurseurs hors des première et deuxième zones précurseurs respectives et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empêche les réactions à l’intérieur des zones entre les quantités non-adsorbées des premier et deuxième gaz précurseurs.
-
-1. **13.** Le proc",0.1405648267008986,"une deuxième zone précurseur (16, 116, 316) espacée de la première, le deuxième gaz précurseur étant différent du premier ;
-
-guidage d'un substrat flexible (12, 112, 312) selon un mouvement de navette entre les première et deuxième zones précurseurs, en passant par une série de passages d'étranglement (54, 56, 154, 156, 354, 356) d'une zone d'isolation (20, 120, 320) interposée entre les première deuxième zones précurseurs, de façon à ce que le substrat traverse les première et deuxième zones précurseurs plusieurs fois, qu'une monocouche du premier gaz précurseur adsorbe à la surface du substrat pendant le transit du substrat dans la première zone précurseur et que, pendant un transit ultérieur du substrat dans la deuxième zone précurseur, le deuxième gaz précurseur réagisse avec le premier précurseur adsorbé à la surface du substrat afin de déposer un film mince sur le substrat ;
-
-5
-
-et
-
-10
-
-15
-
-20
-
-introduction d'un gaz inerte dans la d'isolation ; et création d'un premier différentiel de pression entre la zone d'isolation et la première zone précurseur et d'un deuxième différentiel de pression entre la zone d'isolation et la deuxième zone précurseur, les différentiels de pression étant suffisants pour empêcher la migration des premier et deuxième gaz précurseurs hors des première et deuxième zones précurseurs respectives et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empêche les réactions à l'intérieur des zones en",0.1405648267008986,"une deuxième zone précurseur (16, 116, 316) espacée de la première, le deuxième gaz précurseur étant différent du premier ;
-
-guidage d'un substrat flexible (12, 112, 312) selon un mouvement de navette entre les première et deuxième zones précurseurs, en passant par une série de passages d'étranglement (54, 56, 154, 156, 354, 356) d'une zone d'isolation (20, 120, 320) interposée entre les première deuxième zones précurseurs, de façon à ce que le substrat traverse les première et deuxième zones précurseurs plusieurs fois, qu'une monocouche du premier gaz précurseur adsorbe à la surface du substrat pendant le transit du substrat dans la première zone précurseur et que, pendant un transit ultérieur du substrat dans la deuxième zone précurseur, le deuxième gaz précurseur réagisse avec le premier précurseur adsorbé à la surface du substrat afin de déposer un film mince sur le substrat ;
-
-5
-
-et
-
-10
-
-15
-
-20
-
-introduction d'un gaz inerte dans la d'isolation ; et création d'un premier différentiel de pression entre la zone d'isolation et la première zone précurseur et d'un deuxième différentiel de pression entre la zone d'isolation et la deuxième zone précurseur, les différentiels de pression étant suffisants pour empêcher la migration des premier et deuxième gaz précurseurs hors des première et deuxième zones précurseurs respectives et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empêche les réactions à l'intérieur des zones en",123,patents
-123,1,"13. Le procédé de la revendication 12, qui suppose éga- lement de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz pré- curseur différent du deuxième est introduit.",False,0.02912621359223301,"13. Le procédé de la revendication 12, qui suppose également de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz précurseur différent du deuxième est introduit.
-
-",0.038834951456310676,"
-
-13. Le procédé de la revendication 12, qui suppose également de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz précurseur différent du deuxième est introduit.
-
-",0.038834951456310676,"13.** Le procédé de la revendication 12, qui suppose également de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz précurseur différent du deuxième est introduit.
-
-",0.038834951456310676,"*13.** Le procédé de la revendication 12, qui suppose également de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz précurseur différent du deuxième est introduit. ",0.038834951456310676,"13.** Le procédé de la revendication 12, qui suppose également de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz précurseur différent du deuxième est introduit.
-",0.1941747572815534,"e la revendication 12, qui suppose également de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz précurseur différent du deuxième est introduit",0.1941747572815534,"e la revendication 12, qui suppose également de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz précurseur différent du deuxième est introduit",123,patents
-123,2,"14. Le procédé de n’importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d’injecter le gaz inerte dans les passages.",False,0.0,"14. Le procédé de n’importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d’injecter le gaz inerte dans les passages.",0.011695906432748537,"14. Le procédé de n'importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d'injecter le gaz inerte dans les passages.",0.023391812865497075,"14.** Le procédé de n’importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d’injecter le gaz inerte dans les passage",0.03508771929824561,"4.** Le procédé de n'importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d'injecter le gaz inerte dans les passages",0.023391812865497075,"4.** Le procédé de n’importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d’injecter le gaz inerte dans les passages",0.16374269005847952,"rocédé de n'importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d'injecter le gaz inerte dans les pass",0.16374269005847952,"rocédé de n'importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d'injecter le gaz inerte dans les pass",123,patents
-123,3,"15. Le procédé de n’importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en na- vette entre les première et deuxième zones précur- seurs suppose de faire avancer continuellement le substrat sur un trajet de transport ondulé.",False,0.02390438247011952,"
-
-15. Le procédé de n’importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en navette entre les première et deuxième zones précurseurs suppose de faire avancer continuellement le substrat sur un trajet de transport ondulé.",0.035856573705179286,"
-
-15. Le procédé de n'importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en navette entre les première et deuxième zones précurseurs suppose de faire avancer continuellement le substrat sur un trajet de transport ondulé.
-
-",0.03187250996015936,"15.** Le procédé de n’importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en navette entre les première et deuxième zones précurseurs suppose de faire avancer continuellement le substrat sur un trajet de transport ondulé.
-
-",0.043824701195219126,"5.** Le procédé de n'importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en navette entre les première et deuxième zones précurseurs suppose de faire avancer continuellement le 50 substrat sur un trajet de transport ondulé.",0.03187250996015936,"15.** Le procédé de n’importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en navette entre les première et deuxième zones précurseurs suppose de faire avancer continuellement le substrat sur un trajet de transport ondulé.
-",0.05179282868525897,"5. Le procédé de n'importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en navette entre les première et deuxième zones précurseurs suppose de faire avancer continuellement le substrat sur un trajet de transport ondulé",0.05179282868525897,"5. Le procédé de n'importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en navette entre les première et deuxième zones précurseurs suppose de faire avancer continuellement le substrat sur un trajet de transport ondulé",123,patents
-123,4,"16. Le procédé de n’importe laquelle des revendications 12 à 15, qui suppose également d’ajuster une lon- gueur d’au moins certains des transits dans la pre- mière zone précurseur.",False,0.03333333333333333,"
-
-16. Le procédé de n’importe laquelle des revendications 12 à 15, qui suppose également d’ajuster une longueur d’au moins certains des transits dans la première zone précurseur.",0.06111111111111111,".
-
-16. Le procédé de n'importe laquelle des revendications 12 à 15, qui suppose également d'ajuster une longueur d'au moins certains des transits dans la première zone précurseur.
-",0.044444444444444446,"*16.** Le procédé de n’importe laquelle des revendications 12 à 15, qui suppose également d’ajuster une longueur d’au moins certains des transits dans la première zone précurseur.
-",0.07222222222222222," Le procédé de n'importe laquelle des revendications 12 à 15, qui suppose également d'ajuster une longueur d'au moins certains des transits dans la pre- 55 mière zone précurseur.
-
-",0.044444444444444446,"*16.** Le procédé de n’importe laquelle des revendications 12 à 15, qui suppose également d’ajuster une longueur d’au moins certains des transits dans la première zone précurseur. ",0.08333333333333333,"6. Le procédé de n'importe laquelle des revendications 12 à 15, qui suppose également d'ajuster une longueur d'au moins certains des transits dans la première zone précurseur",0.08333333333333333,"6. Le procédé de n'importe laquelle des revendications 12 à 15, qui suppose également d'ajuster une longueur d'au moins certains des transits dans la première zone précurseur",123,patents
-123,5,17. Le procédé de n’importe laquelle des revendications,False,0.0,17. Le procédé de n’importe laquelle des revendications,0.01818181818181818,17. Le procédé de n'importe laquelle des revendications,0.05454545454545454,.** Le procédé de n’importe laquelle des revendications,0.07272727272727272,.** Le procédé de n'importe laquelle des revendications,0.05454545454545454,.** Le procédé de n’importe laquelle des revendications,0.2, procédé de n'importe laquelle des revendications,0.2, procédé de n'importe laquelle des revendications,123,patents
-123,6,EP 2 000 008 B1,False,0.0,EP 2 000 008 B1,0.8666666666666667," (20, 120, 320)",0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.8,"tion (20, 120, ",0.8,"tion (20, 120, ",123,patents
-125,0,"US 7,851,130 B2",False,0.0,"US 7,851,130 B2",0.8666666666666667,om 5 to 30 mol ,0.0,"US 7,851,130 B2",0.0,"US 7,851,130 B2",0.0,"US 7,851,130 B2",0.8666666666666667,rom 5 to 30 mo!,0.8666666666666667,rom 5 to 30 mo!,125,patents
-125,1,"In formula (F2), Rx represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exempli- fied. Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond. Fb represents a monocyclic or polycyclic hydrocarbon group. Fe represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group. F 1 represents a group represented by formula (F 1). P1 represents from 1 to 3. As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbomyl group is preferred. The specific examples of the repeating units having the structure represented by formula (Fl) are shown below.",False,0.03864168618266979,"formula (F2), Rx represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exemplified.
-
-Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
-
-Fb represents a monocyclic or polycyclic hydrocarbon
-group.
-
-Fc represents a single bond or a straight chain or branched 20
-
-alkylene group, and preferably a single bond or a methylene group.
-
-F₁ represents a group represented by formula (F1).
-
-P1 represents from 1 to 3.
-
-As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbomyl group is preferred.
-
-The specific examples of the repeating units having the structure represented by formula (Fl) are shown b",0.07962529274004684,"rmula (F2), Rx represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exemplified.
-
-Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
-
-Fb represents a monocyclic or polycyclic hydrocarbon group.
-
-Fc represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group.
-
-F1 represents a group represented by formula (F1).
-
-P1 represents from 1 to 3.
-
-As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbornyl group is preferred.
-
-The specific examples of the repeating units having the structure represented by formula ",0.06791569086651054," represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by $Rx$ may have, a hydroxyl group and a halogen atom are exemplified.
-
-$Fa$ represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
-
-$Fb$ represents a monocyclic or polycyclic hydrocarbon group.
-
-$Fc$ represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group.
-
-$F_1$ represents a group represented by formula (F1).
-
-$p_1$ represents from 1 to 3.
-
-As the cyclic hydrocarbon group represented by $Fb$, a cyclopentyl group, a cyclohexyl group, or a norbornyl group is preferred.
-
-The specific examples of the repeating units having the structure represented by formula (F1) are shown below",0.03044496487119438,"In formula (F2), Rx represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exemplified.
-
-Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
-
-Fb represents a monocyclic or polycyclic hydrocarbon group.
-
-Fc represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group.
-
-F1 represents a group represented by formula (F1).
-
-P1 represents from 1 to 3.
-
-As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbornyl group is preferred.
-
-The specific examples of the repeating units having the structure represented by formula (F1) are shown be",0.03747072599531616,"rmula (F2), Rx represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exemplified.
-
-Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
-
-> Fb represents a monocyclic or polycyclic hydrocarbon group.
-
-Fe represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group.
-
-F 1 represents a group represented by formula (F 1).
-
-P1 represents from 1 to 3.
-
-As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbomyl group is preferred.
-
-The specific examples of the repeating units having the structure represented by formula (Fl) are sho",0.07494145199063232,"x represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exempli› fied.
-
-Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
-
-Fb represents a monocyclic or polycyclic hydrocarbon group.
-
-Fe represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group.
-
-F 1 represents a group represented by formula (F 1).
-
-P1 represents from 1 to 3.
-
-As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbomyl group is preferred.
-
-The specific examples of the repeating units having the structure represented by formula (Fl) are sh",0.07494145199063232,"x represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exempli› fied.
-
-Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
-
-Fb represents a monocyclic or polycyclic hydrocarbon group.
-
-Fe represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group.
-
-F 1 represents a group represented by formula (F 1).
-
-P1 represents from 1 to 3.
-
-As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbomyl group is preferred.
-
-The specific examples of the repeating units having the structure represented by formula (Fl) are sh",125,patents
-125,2,"The alicyclic hydrocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating struc- tural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity. As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto. By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hydro-",False,0.174931129476584,"drocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating structural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity.
-
-As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto.
-
-By containing such various repeating structural units, fine adjustment of ",0.008264462809917356,"The alicyclic hydrocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating structural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity.
-
-As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto.
-
-By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hydro-",0.011019283746556474,"
-The alicyclic hydrocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating structural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity.
-
-As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto.
-
-By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hydro",0.008264462809917356,"The alicyclic hydrocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating structural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity.
-
-As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto.
-
-By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hydro-",0.005509641873278237,"The alicyclic hydrocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating structural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity.
-
-As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto. By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hydro-",0.045454545454545456,"c hydrocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating struc› tural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity.
-
-As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto.
-
-By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hyd",0.045454545454545456,"c hydrocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating struc› tural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity.
-
-As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto.
-
-By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hyd",125,patents
-126,0,c12) United States Patent Kawanishi et al.,False,0.19047619047619047," United States Patent
-
-# Kawanishi et al.
-",0.2857142857142857,"United States Patent**
-**Kawanishi et al",0.11904761904761904,"12) United States Patent
-**Kawanishi et al",0.23809523809523808,"*United States Patent**
-**Kawanishi et al.",0.38095238095238093,"nited States Patent**
-
-# **Kawanishi et a",0.07142857142857142,"12) United States Patent
-
-Kawanishi et al.",0.07142857142857142,"12) United States Patent
-
-Kawanishi et al.",126,patents
-126,2,"(IO) Patent No.: US 7,851,130 B2",False,0.25,"(IO) Patent No.:
-
-# US 7,851,13",0.3125,"Patent No.:** **US 7,851,130 B2*",0.1875,") Patent No.:** US 7,851,130 B2 ",0.21875," **Patent No.: US 7,851,130 B2**",0.125,"O) **Patent No.: US 7,851,130 B2",0.09375,"(IO) Patent No.:
-
-US 7,851,130 B",0.09375,"(IO) Patent No.:
-
-US 7,851,130 B",126,patents
-126,3,"(45) Date of Patent: *Dec. 14, 2010",False,0.22857142857142856," Date of Patent:
-
-# *Dec. 14, 2010
-",0.2857142857142857,"Date of Patent:** **\*Dec. 14, 2010",0.11428571428571428,"(45) Date of Patent:** *Dec. 14, 20",0.14285714285714285,"s> **Date of Patent: *Dec. 14, 2010",0.11428571428571428,"(45) **Date of Patent: *Dec. 14, 20",0.08571428571428572,"45) Date of Patent:
-
-*Dec. 14, 2010",0.08571428571428572,"45) Date of Patent:
-
-*Dec. 14, 2010",126,patents
-126,4,"(54) PHOTOSENSITIVE COMPOSITION, COMPOUND FOR USE IN THE PHOTOSENSITIVE COMPOSITION, AND PATTERN-FORMING METHOD USING THE PHOTOSENSITIVE COMPOSITION",False,0.04054054054054054,"(54) PHOTOSENSITIVE COMPOSITION,
-COMPOUND FOR USE IN THE
-PHOTOSENSITIVE COMPOSITION, AND
-PATTERN-FORMING METHOD USING THE
-PHOTOSENSITIVE COMPOSITIO",0.32432432432432434,"TIVE COMPOSITION,**
-**COMPOUND FOR USE IN THE**
-**PHOTOSENSITIVE COMPOSITION, AND**
-**PATTERN-FORMING METHOD USING THE**
-**PHOTOSENSITIVE CO",0.0,"(54) PHOTOSENSITIVE COMPOSITION, COMPOUND FOR USE IN THE PHOTOSENSITIVE COMPOSITION, AND PATTERN-FORMING METHOD USING THE PHOTOSENSITIVE COMPOSITION",0.02702702702702703,"(54) **PHOTOSENSITIVE COMPOSITION, COMPOUND FOR USE IN THE PHOTOSENSITIVE COMPOSITION, AND PATTERN-FORMING METHOD USING THE PHOTOSENSITIVE COMPOSITI",0.02702702702702703,"54) **PHOTOSENSITIVE COMPOSITION, COMPOUND FOR USE IN THE PHOTOSENSITIVE COMPOSITION, AND PATTERN-FORMING METHOD USING THE PHOTOSENSITIVE COMPOSITIO",0.08108108108108109,") PHOTOSENSITIVE COMPOSITION,
-
-COMPOUND FOR USE IN THE
-
-PHOTOSENSITIVE COMPOSITION, AND
-
-PATTERN-FORMING METHOD USING THE
-
-PHOTOSENSITIVE COMPOSITIO",0.08108108108108109,") PHOTOSENSITIVE COMPOSITION,
-
-COMPOUND FOR USE IN THE
-
-PHOTOSENSITIVE COMPOSITION, AND
-
-PATTERN-FORMING METHOD USING THE
-
-PHOTOSENSITIVE COMPOSITIO",126,patents
-126,5,"(75) Inventors: Yasutomo Kawanishi, Ashigarakami-gun (JP); Kenji Wada, Haibara-gun (JP)",False,0.022988505747126436,"(75) Inventors: Yasutomo Kawanishi,
-Ashigarakami-gun (JP); Kenji Wada,
-Haibara-gun (JP)",0.3218390804597701,"(75) **Inventors:** **Yasutomo Kawanishi,**
-**Ashigarakami-gun (JP); Kenji Wada,**
-",0.04597701149425287,"5) Inventors:** Yasutomo Kawanishi, Ashigarakami-gun (JP); Kenji Wada, Haibara-gun (JP)",0.04597701149425287,"5) **Inventors: Yasutomo Kawanishi, Ashigarakami-gun (JP); Kenji Wada, Haibara-gun (JP)",0.1839080459770115,") Inventors: **Yasutomo Kawanishi,** Ashigarakami-gun (JP); **Kenji Wada,** Haibara-gun",0.1724137931034483," ( *) Notice:
-
-Yasutomo Kawanishi,
-
-Ashigarakami-gun (JP); Kenji Wada, Haibara-gun (JP)",0.1724137931034483," ( *) Notice:
-
-Yasutomo Kawanishi,
-
-Ashigarakami-gun (JP); Kenji Wada, Haibara-gun (JP)",126,patents
-126,6,"(73) Assignee: FUJIFILM Corporation, Tokyo (JP)",False,0.0,"(73) Assignee: FUJIFILM Corporation, Tokyo (JP)",0.19148936170212766,"*Assignee:** **FUJIFILM Corporation, Tokyo (JP)",0.0851063829787234,"(73) Assignee:** FUJIFILM Corporation, Tokyo (J",0.0851063829787234,"(73) **Assignee: FUJIFILM Corporation, Tokyo (J",0.1702127659574468,") Assignee: **FUJIFILM Corporation,** Tokyo (JP",0.3404255319148936,"ara-gun (JP)
-
-FUJIFILM Corporation, Tokyo (JP)
-",0.3404255319148936,"ara-gun (JP)
-
-FUJIFILM Corporation, Tokyo (JP)
-",126,patents
-126,7,"(21) Appl. No.: 11/857,645",False,0.0,"(21) Appl. No.: 11/857,645",0.34615384615384615,"*Appl. No.:** **11/857,645",0.15384615384615385,"1) Appl. No.:** 11/857,645",0.15384615384615385,"1) **Appl. No.: 11/857,645",0.15384615384615385,"(21) Appl. No.: **11/857,6",0.0,"(21) Appl. No.: 11/857,645",0.0,"(21) Appl. No.: 11/857,645",126,patents
-126,8,G03F 71038 (2006.01) G03F 71039 (2006.01) G03F 7120 (2006.01),False,0.4918032786885246,"G03F 7/038 | (2006.01) |
-|-|-|
-| G03F 7/039 | (2006.01)",0.39344262295081966," (2006.01)
-
-**G03F 7/039** (2006.01)
-
-**G03F 7/20** (2006.01)",0.4262295081967213,"(2006.01)
-- **G03F 7/039** (2006.01)
-- **G03F 7/20** (2006.01",0.2459016393442623,"F 7/038* (2006.01)
-*G03F 7/039* (2006.01)
-*G03F 7/20* (2006.0",0.8688524590163934,"No.: **11/857,645**
-
-- (22) Filed: **Sep.19,2007**
-
-## (65)",0.2459016393442623,"03F 71038
-
-(2006.01)
-
-G03F 71039
-
-(2006.01)
-
-G03F 7120
-
-(2006",0.2459016393442623,"03F 71038
-
-(2006.01)
-
-G03F 71039
-
-(2006.01)
-
-G03F 7120
-
-(2006",126,patents
-126,9,"References Cited U.S. PATENT DOCUMENTS 6,680,157 Bl 1/2004 Fedynyshyn 2006/0210919 Al * 9/2006 Mizutani et al. ......... 430/270.1 2007/0072117 Al* 3/2007 Mizutani et al. ......... 430/270.1",False,0.5631578947368421," | B1 | 1/2004 | Fedynyshyn | |
-|-|-|-|-|-|
-| 2006/0210919 | A1* | 9/2006 | Mizutani et al. | 430/270.1 |
-| 2007/0072117 | A1* | 3/2007 | Mizutani et al. | 430/270.",0.16842105263157894,"eferences Cited**
-
-**U.S. PATENT DOCUMENTS**
-
-6,680,157 B1 1/2004 Fedynyshyn
-2006/0210919 A1\* 9/2006 Mizutani et al. ........ 430/270.1
-2007/0072117 A1\* 3/2007 Mizutani et al. ........",0.4421052631578947,"- | :--- | :--- | :--- |
-| 6,680,157 B1 | 1/2004 | Fedynyshyn | |
-| 2006/0210919 A1* | 9/2006 | Mizutani et al. | 430/270.1 |
-| 2007/0072117 A1* | 3/2007 | Mizutani et al. | 430/270.1 |
-
-**F",0.47368421052631576,"- | -------------------------- | --------- |
-| 2006/0210919 A1 \* | 9/2006 | Mizutani et al. .......... | 430/270.1 |
-| 2007/0072117 A1 \* | 3/2007 | Mizutani et al. .......... | 430/270.1 |",0.8368421052631579,"
-
-## (56) **References Cited**
-
-## U.S. PATENT DOCUMENTS
-
-**==> picture [217 x 57] intentionally omitted <==**
-
-**==> picture [141 x 116] intentionally omitted <==**
-
-## OTHER PUBLICATION",0.47368421052631576,"erences Cited
-
-## U.S. PATENT DOCUMENTS
-
-6,680,157 Bl
-
-2006/0210919 Al *
-
-2007/0072117 Al*
-
-1/2004 Fedynyshyn
-
-9/2006
-
-Mizutani et al. ......... 430/270.1
-
-3/2007 Mizutani et al. .......",0.47368421052631576,"erences Cited
-
-## U.S. PATENT DOCUMENTS
-
-6,680,157 Bl
-
-2006/0210919 Al *
-
-2007/0072117 Al*
-
-1/2004 Fedynyshyn
-
-9/2006
-
-Mizutani et al. ......... 430/270.1
-
-3/2007 Mizutani et al. .......",126,patents
-126,10,FOREIGN PATENT DOCUMENTS EP 1480078 Al 5/2004 EP 1 693 705 A2 * 8/2006 EP 1 703 326 A2 * 9/2006 EP 1 767 991 A2 * 3/2007,False,0.575,"## FOREIGN PATENT DOCUMENTS
-
-| EP | 1480078 | Al | 5/2004 |
-|-|-|-|-|
-
-| EP | 1 693 705 | A2 | * | 8/200",0.19166666666666668,"FOREIGN PATENT DOCUMENTS**
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-EP 1480078 A1 5/2004
-
-EP 1 693 705 A2 \* 8/2006
-EP 1 703 326 A2 \* 9/2006
-EP 1 767 991 A",0.38333333333333336,"- |
-| EP 1 480 078 A1 | 5/2004 |
-| EP 1 693 705 A2* | 8/2006 |
-| EP 1 703 326 A2* | 9/2006 |
-| EP 1 767 991 A2* | 3/2007",0.575,"OREIGN PATENT DOCUMENTS**
-
-| EP | 1480078 A1 | 5/2004 |
-| -- | ---------- | ------ |
-
-
-| EP | 1 693 705 A2 \* | 8/2006 ",0.85,S. Cl.** .................... **430/270.1;** 430/922; 430/325; 430/326; 430/942; 430/966; 549/26; 549/16; 549/17; 549/20,0.5333333333333333,"of Patent:
-
-*Dec. 14, 2010
-
-EP
-
-1 693 705 A2 *
-
-8/2006
-
-EP
-
-1 703 326 A2 *
-
-9/2006
-
-EP
-
-1 767 991 A2 *
-
-3/2007
-
-JP",0.5333333333333333,"of Patent:
-
-*Dec. 14, 2010
-
-EP
-
-1 693 705 A2 *
-
-8/2006
-
-EP
-
-1 703 326 A2 *
-
-9/2006
-
-EP
-
-1 767 991 A2 *
-
-3/2007
-
-JP",126,patents
-126,11,"OTHER PUBLICATIONS Machine-assisted English translation of JP2006-276759 provided by JPO.* * cited by examiner Primary Examiner-Sin J. Lee (74) Attorney, Agent, or Firm-Sughrue Mion, PLLC",False,0.06951871657754011,"HER PUBLICATIONS
-
-Machine-assisted English translation of JP2006-276759 provided by
-JPO.*
-
-* cited by examiner
-
-Primary Examiner-Sin J. Lee
-
-(74)Attorney, Agent, or Firm-Sughrue Mion, PLL",0.18181818181818182,"PUBLICATIONS**
-
-Machine-assisted English translation of JP2006-276759 provided by JPO.\*
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-\* cited by examiner
-
-**Primary Examiner—Sin J. Lee**
-
-(74) **Attorney, Agent, or Firm—Sughrue Mi",0.21390374331550802,"OTHER PUBLICATIONS**
-
-- Machine-assisted English translation of JP2006-276759 provided by JPO.*
-
-\* cited by examiner
-
-**Primary Examiner** — Sin J. Lee
-**(74) Attorney, Agent, or Firm*",0.13903743315508021,"OTHER PUBLICATIONS**
-
-Machine-assisted English translation of JP2006-276759 provided by JPO.*
-
-\* cited by examiner
-
-*Primary Examiner*—Sin J. Lee
-(74) *Attorney, Agent, or Firm*—Sughrue ",0.11764705882352941,"OTHER PUBLICATIONS
-
-Machine-assisted English translation of JP2006-276759 provided by JPO.*
-
-* cited by examiner
-
-_Primary Examiner-Sin_ J. Lee
-
-(74) _Attorney, Agent, or Firm-Sughrue",0.11229946524064172," PUBLICATIONS
-
-Machine-assisted English translation of JP2006-276759 provided by JPO.*
-
-## * cited by examiner
-
-Primary Examiner-Sin J. Lee
-
-(74) Attorney, Agent, or Firm-Sughrue Mion, ",0.11229946524064172," PUBLICATIONS
-
-Machine-assisted English translation of JP2006-276759 provided by JPO.*
-
-## * cited by examiner
-
-Primary Examiner-Sin J. Lee
-
-(74) Attorney, Agent, or Firm-Sughrue Mion, ",126,patents
-126,12,"(57) ABSTRACT A photosensitive composition includes (A) a compound rep- resented by the following formula (I): wherein R 1 to R 13 each independently represents a hydrogen atom or a substituent, Z represents a single bond or a divalent linking group, and x- represents an anion containing a proton acceptor functional group.",False,0.36728395061728397," a proton acceptor functional group.
-
-wherein R 1 to R 13 each independently represents a hydrogen atom or a substituent, Z represents a single bond or a divalent linking group, and x- represents an anion containing a proton acceptor functional group.
-
-16 Claims, 1 Drawing Sheet",0.36728395061728397,"ects the two rings. An anion X^- is shown attached to the right ring.]()
-
-(I)
-
-wherein R1 to R13 each independently represents a hydrogen atom or a substituent, Z represents a single bond or a divalent linking group, and X- represents an anion containing a proton acceptor functional group.
-",0.4228395061728395," An associated anion is denoted as $X^-$.
-
-wherein $R^1$ to $R^{13}$ each independently represents a hydrogen atom or a substituent, $Z$ represents a single bond or a divalent linking group, and $X^-$ represents an anion containing a proton acceptor functional group.
-
-**16 Claims, 1 Drawing Sheet**",0.36419753086419754," R13), benzene rings, and X- counter ion - Formula (I)]
-
-wherein R1 to R13 each independently represents a hydrogen atom or a substituent, Z represents a single bond or a divalent linking group, and X- represents an anion containing a proton acceptor functional group.
-",0.3765432098765432,"on includes (A) a compound represented by the following formula (I):
-
-**==> picture [144 x 16] intentionally omitted <==**
-
-wherein R[1 ] to R[13 ] each independently represents a hydrogen atom or a substituent, Z represents a single bond or a divalent linking group, and x- represents an anion containing a proton acceptor",0.11419753086419752,"photosensitive composition includes (A) a compound rep› resented by the following formula (I):
-
-
-
-wherein R 1 to R 13 each independently represents a hydrogen atom or a substituent, Z represents a single bond or a divalent linking group, and x- represents an anion containing a proton acceptor functional grou",0.11419753086419752,"photosensitive composition includes (A) a compound rep› resented by the following formula (I):
-
-
-
-wherein R 1 to R 13 each independently represents a hydrogen atom or a substituent, Z represents a single bond or a divalent linking group, and x- represents an anion containing a proton acceptor functional grou",126,patents
-126,13,"16 Claims, 1 Drawing Sheet",False,0.0,"16 Claims, 1 Drawing Sheet",0.0,"16 Claims, 1 Drawing Sheet",0.0,"16 Claims, 1 Drawing Sheet",0.0,"16 Claims, 1 Drawing Sheet",0.0,"16 Claims, 1 Drawing Sheet",0.0,"16 Claims, 1 Drawing Sheet",0.0,"16 Claims, 1 Drawing Sheet",126,patents
-127,0,-continued,False,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,127,patents
-127,1,US 2020/0050106 Al,False,0.0,US 2020/0050106 Al,0.7777777777777778,"1 to 20.
-
-[0296] F",0.05555555555555555,US 2020/0050106 A1,0.05555555555555555,US 2020/0050106 A1,0.0,US 2020/0050106 Al,0.8333333333333334," R201 , R202 , a",0.8333333333333334," R201 , R202 , a",127,patents
-127,2,"Feb. 13, 2020",False,0.0,"Feb. 13, 2020",0.6923076923076923,ably 1 to 20.,0.0,"Feb. 13, 2020",0.0,"Feb. 13, 2020",0.0,"Feb. 13, 2020",0.6153846153846154,"R 201 , R202 ",0.6153846153846154,"R 201 , R202 ",127,patents
-127,3,"[0293] In General Formula (ZI), [0294] R201 , R202, and R203 each independently represent an organic group. [0295] The number of carbon atoms of the organic group as each of R201 , R202, and R203 is preferably 1 to 30, and",False,0.02702702702702703,"[0293] In General Formula (ZI),
-
-[0294] R201 , R202, and R203 each independently represent an organic group.
-
-[0295] The number of carbon atoms of the organic group as each of R201 , R202, and R203 is preferably 1to 30, an",0.4099099099099099,"[0293] In General Formula (ZI),
-
-[0294] $\text{R}_{201}$ , $\text{R}_{202}$ , and $\text{R}_{203}$ each independently represent an organic group.
-
-[0295] The number of carbon atoms of the organic group as each of $\te",0.26126126126126126,"[0293] In General Formula (ZI),
-
-[0294] $R_{201}$, $R_{202}$, and $R_{203}$ each independently represent an organic group.
-
-[0295] The number of carbon atoms of the organic group as each of $R_{201}$, $R_{202}$, and $R_{20",0.34684684684684686,"0293] In General Formula (ZI),
-[0294] R201, R202, and R203 each independently represent an organic group.
-[0295] The number of carbon atoms of the organic group as each of R201, ",0.16216216216216217," In General Formula **(ZI),**
-
-**[0294]** R201 , R202 , and R203 each independently represent an organic group.
-
-**[0295]** The number of carbon atoms of the organic group as each of R201 , R202 , and R203 is preferably ",0.10810810810810811,"0293] In General Formula (ZI),
-
-[0294] R201 , R202 , and R 203 each independently represent an organic group.
-
-[0295] The number of carbon atoms of the organic group as each of R 201 , R202 , and R203 is preferably 1 ",0.10810810810810811,"0293] In General Formula (ZI),
-
-[0294] R201 , R202 , and R 203 each independently represent an organic group.
-
-[0295] The number of carbon atoms of the organic group as each of R 201 , R202 , and R203 is preferably 1 ",127,patents
-127,4,350A3,False,0.2,250A3,0.2,350A<,0.4, 350A,0.4, 350A,0.4,50A[3,0.8,[0293,0.8,[0293,127,patents
-127,5,"[0301] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxy- carbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1 to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxy- sulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having 10 to 20 carbon atoms), an alkyloxyalkyloxy group (preferably hav- ing 5 to 20 carbon atoms), and a cycloalkylalkyloxyalkyloxy group (preferably having 8 to 20 carbon atoms).",False,0.005809128630705394,"[0301] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxycarbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxysulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having 10 to 20 carbon atoms), an alkyloxyalkyloxy group (preferably having 5 to 20 carbon atoms), and a cycloalkylalkyloxyalkyloxy group (preferably having 8 to 20 carbon atoms).",0.010788381742738589,"[0301] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as a fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxy-carbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxy carbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1 to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxsulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxsulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxsulfonyl group (preferably having 10 to 20 carbon atoms), an alkoxyalkyloxy group (preferably having 5 to 20 carbon atoms), and a cycloalkylalkyloxyalkyloxy group (preferably having 8 to 20 carbon atoms).",0.004979253112033195,"[0301] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxycarbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1 to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxysulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having 10 to 20 carbon atoms), an alkyloxyalkyloxy group (preferably having 5 to 20 carbon atoms), and a cycloalkylalkyloxyalkyloxy group (preferably having 8 to 20 carbon atoms).",0.00995850622406639,"oup.
-[0301] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxycarbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1 to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxysulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having 10 to 20 carbon atoms), an alkyloxyalkyloxy group (preferably having 5 to 20 carbon atoms), and a cycloalkylalkyloxyalkyloxy group (preferably having 8 to 20 carbon atoms).
-",0.03983402489626556,"cific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having **1** to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to **14** carbon atoms), an alkoxycarbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having **1** to 15 carbon atoms), an alkylsulfonyl group (preferably having **1** to 15 carbon atoms), an alkyliminosulfonyl group (preferably having **1** to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxysulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having **10** to 20 carbon atoms), an alkyloxyalkyloxy group (preferably having 5 to 20 carbon atoms), and a cycloalkylalkyloxyalkyloxy group (preferably having 8 to 20 carbon",0.0954356846473029,"01] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxy› carbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1 to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxy› sulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having 10 to 20 carbon atoms), an alkyloxyalkyloxy group (preferably hav› ing 5 to 20 carbon atoms), and a cycloalkylalkyloxyalk",0.0954356846473029,"01] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxy› carbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1 to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxy› sulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having 10 to 20 carbon atoms), an alkyloxyalkyloxy group (preferably hav› ing 5 to 20 carbon atoms), and a cycloalkylalkyloxyalk",127,patents
diff --git a/benchmark_filtered.csv b/benchmark_filtered.csv
deleted file mode 100644
index f8ed65b..0000000
--- a/benchmark_filtered.csv
+++ /dev/null
@@ -1,7395 +0,0 @@
-page_number,needle_index,needle,OCR,reducto,reducto_best_match,datalab,datalab_best_match,gemini,gemini_best_match,llama_parse,llama_parse_best_match,pymupdflayout,pymupdflayout_best_match,docling_pipeline_ocr,docling_pipeline_ocr_best_match,docling_pipeline_wocr,docling_pipeline_wocr_best_match,Page,Folder
-1,0,"where sn,k,l = un,k,l(p0)f(p0) . Thus, the problem can be solved by extending the single condensation method presented in [14] for multi-cell scenario. The details of centralized scheme A are presented in Algorithm 2. Centralized Scheme A: Complexity Analysis The initial allocation phase has a complexity of O(KN2) which is the same as Algorithm 1. Next, we perform a one dimensional search for the user in cell l with maximum incremental throughput at subcarrier n. The process is repeated for each subcarrier and cell. Thus, the com- putational complexity of this step is O(KNL). Since, the process continues until convergence, (i.e., M iterations), the complexity of this step can be written as O(KNLM). Finally, the total complexity of subcarrier allocation phase is O(KN2 + NKLM). The complexity of Phase II is difficult to determine, however, it can be measured in terms of the degree of difficulty (DoD) that in turn relies on the number of constraints and variables associated with the GP [15]. Since we are dealing with LK power constraints and LKN power variables, the total computational complexity of centralized scheme A is O(KN2 + NKLM) + DoD(LKN). Apparently it seems that implementing centralized GP/successive GP based schemes may not",False,0.0424,"n,k,l (PO) Thus, the problem can be solved by extending the single condensation f(po) method presented in [14] for multi-cell scenario. The details of centralized scheme A are presented in Algorithm 2.
-
-B. Centralized Scheme A: Complexity Analysis
-
-The initial allocation phase has a complexity of O(KN 2 ) which is the same as Algorithm 1. Next, we perform a one dimensional search for the user in cell l with maximum incremental throughput at subcarrier n. The process is repeated for each subcarrier and cell. Thus, the com putational complexity of this step is O(KNL ). Since, the process continues until convergence, (i.e., M iterations), the complexity of this step can be written as O(KNLM ). Finally, the total complexity of subcarrier allocation phase is O(KN 2 + NKLM ).
-
-The complexity of Phase II is difficult to determine, however, it can be measured in terms of the degree of difficulty (DoD) that in turn relies on the number of constraints and variables associated with the GP [15]. Since we are dealing with LK power constraints and LKN power variables, the total computational complexity of centralized scheme A is O(KN 2 + NKLM ) + DoD(LKN ). Apparently it seems that implementing centralized GP/successive GP based schemes may no",0.1,"an be solved by extending the single condensation method presented in [14] for multi-cell scenario. The details of centralized scheme A are presented in Algorithm 2.
-
-## B. Centralized Scheme A: Complexity Analysis
-
-The initial allocation phase has a complexity of $O(KN^2)$ which is the same as Algorithm 1. Next, we perform a one dimensional search for the user in cell $l$ with maximum incremental throughput at subcarrier $n$ . The process is repeated for each subcarrier and cell. Thus, the computational complexity of this step is $O(KNL)$ . Since, the process continues until convergence, (i.e., $M$ iterations), the complexity of this step can be written as $O(KNLM)$ . Finally, the total complexity of subcarrier allocation phase is $O(KN^2+NKLM)$ .
-
-The complexity of Phase II is difficult to determine, however, it can be measured in terms of the degree of difficulty (DoD) that in turn relies on the number of constraints and variables associated with the GP [15]. Since we are dealing with $LK$ power constraints and $LKN$ power variables, the total computational complexity of centralized scheme A is $O(KN^2+NKLM)+\text{DoD}(LKN)$ . Apparently it seems that implementing centralized GP/successive GP based schemes may no",0.0576,". Thus, the problem can be solved by extending the single condensation method presented in [14] for multi-cell scenario. The details of centralized scheme A are presented in Algorithm 2.
-
-## B. Centralized Scheme A: Complexity Analysis
-
-The initial allocation phase has a complexity of $O(KN^2)$ which is the same as Algorithm 1. Next, we perform a one dimensional search for the user in cell $l$ with maximum incremental throughput at subcarrier $n$. The process is repeated for each subcarrier and cell. Thus, the computational complexity of this step is $O(KNL)$. Since, the process continues until convergence, (i.e., $M$ iterations), the complexity of this step can be written as $O(KNLM)$. Finally, the total complexity of subcarrier allocation phase is $O(KN^2 + NKLM)$.
-
-The complexity of Phase II is difficult to determine, however, it can be measured in terms of the degree of difficulty (DoD) that in turn relies on the number of constraints and variables associated with the GP [15]. Since we are dealing with $LK$ power constraints and $LKN$ power variables, the total computational complexity of centralized scheme A is $O(KN^2 + NKLM) + DoD(LKN)$. Apparently it seems that implementing centralized GP/successive GP based schemes may no",0.168," problem can be solved by extending the single condensation method presented in [14] for multi-cell scenario. The details of centralized scheme A are presented in Algorithm 2.
-
-*B. Centralized Scheme A: Complexity Analysis*
-
-The initial allocation phase has a complexity of $$\mathcal{O}(KN^2)$$ which is the same as Algorithm 1. Next, we perform a one dimensional search for the user in cell $$l$$ with maximum incremental throughput at subcarrier $$n$$. The process is repeated for each subcarrier and cell. Thus, the computational complexity of this step is $$\mathcal{O}(KNL)$$. Since, the process continues until convergence, (i.e., $$M$$ iterations), the complexity of this step can be written as $$\mathcal{O}(KNLM)$$. Finally, the total complexity of subcarrier allocation phase is $$\mathcal{O}(KN^2 + NKLM)$$.
-
-The complexity of Phase II is difficult to determine, however, it can be measured in terms of the degree of difficulty (DoD) that in turn relies on the number of constraints and variables associated with the GP [15]. Since we are dealing with $$LK$$ power constraints and $$LKN$$ power variables, the total computational complexity of centralized scheme A is $$\mathcal{O}(KN^2 + NKLM) + DoD(LKN)$$. Apparently it seems that impl",0.0456," )[0][)][. Thus, the problem can be solved by extending the single condensation] method presented in [14] for multi-cell scenario. The details of centralized scheme A are presented in Algorithm 2.
-
-## _B. Centralized Scheme A: Complexity Analysis_
-
-The initial allocation phase has a complexity of O(KN[2] ) which is the same as Algorithm 1. Next, we perform a one dimensional search for the user in cell l with maximum incremental throughput at subcarrier n. The process is repeated for each subcarrier and cell. Thus, the computational complexity of this step is O(KNL). Since, the process continues until convergence, (i.e., M iterations), the complexity of this step can be written as O(KNLM). Finally, the total complexity of subcarrier allocation phase is O(KN[2] + NKLM).
-
-The complexity of Phase II is difficult to determine, however, it can be measured in terms of the degree of difficulty (DoD) that in turn relies on the number of constraints and variables associated with the GP [15]. Since we are dealing with LK power constraints and LKN power variables, the total computational complexity of centralized scheme A is O(KN[2] + NKLM) + DoD(LKN). Apparently it seems that implementing centralized GP/successive GP based schemes may not",0.0624,"hus, the problem can be solved by extending the single condensation method presented in [14] for multi-cell scenario. The details of centralized scheme A are presented in Algorithm 2.
-
-## B. Centralized Scheme A: Complexity Analysis
-
-The initial allocation phase has a complexity of O ( KN 2 ) which is the same as Algorithm 1. Next, we perform a one dimensional search for the user in cell l with maximum incremental throughput at subcarrier n . The process is repeated for each subcarrier and cell. Thus, the computational complexity of this step is O ( KNL ) . Since, the process continues until convergence, (i.e., M iterations), the complexity of this step can be written as O ( KNLM ) . Finally, the total complexity of subcarrier allocation phase is O ( KN 2 + NKLM ) .
-
-The complexity of Phase II is difficult to determine, however, it can be measured in terms of the degree of difficulty (DoD) that in turn relies on the number of constraints and variables associated with the GP [15]. Since we are dealing with LK power constraints and LKN power variables, the total computational complexity of centralized scheme A is O ( KN 2 + NKLM ) + DoD ( LKN ) . Apparently it seems that implementing centralized GP/successive GP based schemes may no",0.0624,"hus, the problem can be solved by extending the single condensation method presented in [14] for multi-cell scenario. The details of centralized scheme A are presented in Algorithm 2.
-
-## B. Centralized Scheme A: Complexity Analysis
-
-The initial allocation phase has a complexity of O ( KN 2 ) which is the same as Algorithm 1. Next, we perform a one dimensional search for the user in cell l with maximum incremental throughput at subcarrier n . The process is repeated for each subcarrier and cell. Thus, the computational complexity of this step is O ( KNL ) . Since, the process continues until convergence, (i.e., M iterations), the complexity of this step can be written as O ( KNLM ) . Finally, the total complexity of subcarrier allocation phase is O ( KN 2 + NKLM ) .
-
-The complexity of Phase II is difficult to determine, however, it can be measured in terms of the degree of difficulty (DoD) that in turn relies on the number of constraints and variables associated with the GP [15]. Since we are dealing with LK power constraints and LKN power variables, the total computational complexity of centralized scheme A is O ( KN 2 + NKLM ) + DoD ( LKN ) . Apparently it seems that implementing centralized GP/successive GP based schemes may no",1,science_sample
-2,0,"Substantial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and im- purities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-offcurrent ratio is 105, the on-current level is around 10 µA and the estimated hole mobility is larger than 2 cm2/vs. The present results are demonstrated by optical absorption, Raman and electrical measurements.",False,0.01954022988505747,"tantial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 105 , the on-current level is around 10 µA and the estimated hole mobility is larger than 2 cm2/vs. The present results are demonstrated by optical absorption, Raman and electrical measurements",0.10114942528735632,"ield effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is $10^5$ , the on-current level is around $10 \mu\text{A}$ and the estimated hole mobility is larger than $2 \text{ cm}^2/\text{vs}$ . The present results are demonstrated by optical absorption, Raman and electrical measuremen",0.09540229885057472,"ield effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is $10^5$, the on-current level is around $10 \, \mu\text{A}$ and the estimated hole mobility is larger than $2 \text{ cm}^2/\text{Vs}$. The present results are demonstrated by optical absorption, Raman and electrical measurements.",0.067816091954023,"ubstantial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 105, the on-current level is around 10 μA and the estimated hole mobility is larger than 2 cm2/vs. The present results are demonstrated by optical absorption, Raman and ",0.029885057471264367,"antial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 10[5] , the on-current level is around 10 µA and the estimated hole mobility is larger than 2 cm[2] /vs. The present results are demonstrated by optical absorption, Raman and electrical measureme",0.027586206896551724,"ntial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 10 5 , the on-current level is around 10 µ A and the estimated hole mobility is larger than 2 cm 2 /vs. The present results are demonstrated by optical absorption, Raman and electrical measurement",0.027586206896551724,"ntial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 10 5 , the on-current level is around 10 µ A and the estimated hole mobility is larger than 2 cm 2 /vs. The present results are demonstrated by optical absorption, Raman and electrical measurement",2,science_sample
-2,1,"Novel semiconductors materials for field effect tran- sistor FET and thin-film transistors TFT are highly demanded.1 In particular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-offcurrent ratio, high electron/hole mobil- ity, to carry high current density and to operate at high frequencies.2–5 Several groups have demonstrated excellent transfer characteristics using individual s- SWNTs,2–5 but generally poor ones using ensemble (net- work and thin film) of SWNTs due to traces of metal- lic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles).6–8 Therefore, very efficient meth- ods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still re- quired. In recent years, several approaches to extract s- SWNTs from nanotube powders were explored using for instance chemical functionalization,9–11 DNA and polymers wrapping,12,13 and density gradient ultra- centrifugation techniques.6 The latter efficiently sepa- rates s-SWNTs and m-SWNTs, but traces of surfactant and density gradient materials limit the performances of the FET. Very recently, two groups have reported on the selective extraction of near-armchair s-SWNTs from nanotube powders using polyfluorene as extracting agent.14,15 According to Nish et al.,14 the sample shows no detectable traces of m-SWNTs based only on optical spectroscopy. However, neither the electrical properties nor the fabrication of FET devices were addressed. In this letter, we report on the electronic properties of FET consisting of semiconducting-enriched single wall carbon nanotubes, without detectable traces of metallic nanotubes and impurities, with in our detection limits. This unprecedented achievement is made possible by ul- tracentrifugation (250,000g), sonication and filtration of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Evidences are gathered by optical absorption, Raman and electrical measure- ments (see Fig.1). We shall demonstrate that such s- SWNTs realize high-performances FET devices compare to networks/thin films of SWNTs and solution process- able polymers/organic materials.1,6,16 S-SWNTs solutions were prepared as follow. First, SWNTs powders (as-prepared HiPco, Carbon Nanotech- nologies Inc.), PFO (Poly-9,9-di-n-octyl-fluorenyl-2,7- diyl, Sigma-Aldrich) and toluene were mixed in the fol- lowing ratio SWNT (5 mg): PFO (5 mg): toluene (30 ml)",False,0.16733386709367493,"ers:
-
-Novel semiconductors materials for field effect transistor FET and thin-film transistors TFT are highly demanded.1 In particular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-off current ratio, high electron/hole mobility, to carry high current density and to operate at high frequencies.2–5 Several groups have demonstrated excellent transfer characteristics using individual sSWNTs, 2–5 but generally poor ones using ensemble (network and thin film) of SWNTs due to traces of metallic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles).6–8 Therefore, very efficient methods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still required.
-
-In recent years, several approaches to extract sSWNTs from nanotube powders were explored using for instance chemical functionalization,9–11 DNA and polymers wrapping,12,13 and density gradient ultracentrifugation techniques.6 The latter efficiently separates s-SWNTs and m-SWNTs, but traces of surfactant and density gradient materials limit the performances of the FET. Very recently, two groups have reported on the selective extraction of near-armchair s-SWNTs from nanotube powders using polyfluorene as extracting agent.14,15 According to Nish et al., 14 the sample shows no detectable traces of m-SWNTs based only on optical spectroscopy. However, neither the electrical properties nor the fabrication of FET devices were addressed.
-
-In this letter, we report on the electronic properties of FET consisting of semiconducting-enriched single wall carbon nanotubes, without detectable traces of metallic nanotubes and impurities, with in our detection limits. This unprecedented achievement is made possible by ultracentrifugation (250,000g), sonication and filtration of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Evidences are gathered by optical absorption, Raman and electrical measurements (see Fig.1). We shall demonstrate that such s
-
-(a) Legend
-| Sample | Color |
-|---:|:---|
-| L | black |
-| M | blue |
-| S | red |
-
-(b) Panel (a) — Optical absorption (Wavelength range 400–1600 nm; Absorbance 0.00–0.20)
-| Sample | Major absorption bands / assignments | Approx. peak positions (nm) | Approx. peak absorbance |
-|---:|:---|:---:|:---:|
-| L (black) | S11, S22, M11 present (strongest S11) | S11 peaks ≈ 1150–1350; S22 ≈ 600–900; M11 ≈",0.19375500400320256,"Novel semiconductors materials for field effect transistor FET and thin-film transistors TFT are highly demanded.1 In particular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-off current ratio, high electron/hole mobility, to carry high current density and to operate at high frequencies.2-5 Several groups have demonstrated excellent transfer characteristics using individual s-SWNTs,2-5 but generally poor ones using ensemble (network and thin film) of SWNTs due to traces of metallic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles).6-8 Therefore, very efficient methods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still required.
-
-In recent years, several approaches to extract s-SWNTs from nanotube powders were explored using for instance chemical functionalization,9-11 DNA and polymers wrapping,12,13 and density gradient ultracentrifugation techniques.6 The latter efficiently separates s-SWNTs and m-SWNTs, but traces of surfactant and density gradient materials limit the performances of the FET. Very recently, two groups have reported on the selective extraction of near-armchair s-SWNTs from nanotube powders using polyfluorene as extracting agent.14,15 According to Nish *et al.*,14 the sample shows no detectable traces of m-SWNTs based only on optical spectroscopy. However, neither the electrical properties nor the fabrication of FET devices were addressed.
-
-In this letter, we report on the electronic properties of FET consisting of *semiconducting-enriched single wall carbon nanotubes, without detectable traces of metallic nanotubes and impurities*, with in our detection limits. This unprecedented achievement is made possible by ultracentrifugation (250,000g), sonication and filtration of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Evidences are gathered by optical absorption, Raman and electrical measurements (see Fig.1). We shall demonstrate that such s-
-
-![Figure 1: (a) Optical absorption spectra showing Absorbance vs Wavelength (nm) for L, M, and S samples. (b) Raman spectra showing Normalized Intensity vs Wavenumber (cm^-1) for s-SWNT, m-SWNT, L, M, and S samples. (c) Transfer characteristic showing Drain Current (I_D) vs Gate Voltage (V_G) for M and S sample",0.13050440352281825,"Novel semiconductors materials for field effect transistor FET and thin-film transistors TFT are highly demanded [1]. In particular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-off current ratio, high electron/hole mobility, to carry high current density and to operate at high frequencies [2–5]. Several groups have demonstrated excellent transfer characteristics using individual s-SWNTs [2–5], but generally poor ones using ensemble (network and thin film) of SWNTs due to traces of metallic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles) [6–8]. Therefore, very efficient methods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still required.
-
-In recent years, several approaches to extract s-SWNTs from nanotube powders were explored using for instance chemical functionalization [9–11], DNA and polymers wrapping [12, 13], and density gradient ultracentrifugation techniques [6]. The latter efficiently separates s-SWNTs and m-SWNTs, but traces of surfactant and density gradient materials limit the performances of the FET. Very recently, two groups have reported on the selective extraction of near-armchair s-SWNTs from nanotube powders using polyfluorene as extracting agent [14, 15]. According to Nish *et al.* [14], the sample shows no detectable traces of m-SWNTs based only on optical spectroscopy. However, neither the electrical properties nor the fabrication of FET devices were addressed.
-
-In this letter, we report on the electronic properties of FET consisting of *semiconducting-enriched single wall carbon nanotubes, without detectable traces of metallic nanotubes and impurities*, within our detection limits. This unprecedented achievement is made possible by ultracentrifugation (250,000g), sonication and filtration of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Evidences are gathered by optical absorption, Raman and electrical measurements (see Fig. 1). We shall demonstrate that such s-SWNTs realize high-performances FET devices compare to networks/thin films of SWNTs and solution processable polymers/organic materials [1, 6, 16].
-
-
-
-**FIG. 1: (Color online):** (a) shows the optical absorption spectra and (b) the Raman spectra at 514.5 nm of L, M and S samples. (c) displays the transfer ",0.2189751801441153,"nts.
-
-PACS numbers:
-
-Novel semiconductors materials for field effect transistor FET and thin-film transistors TFT are highly demanded.1 In particular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-off current ratio, high electron/hole mobility, to carry high current density and to operate at high frequencies.2–5 Several groups have demonstrated excellent transfer characteristics using individual s-SWNTs,2–5 but generally poor ones using ensemble (network and thin film) of SWNTs due to traces of metallic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles).6–8 Therefore, very efficient methods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still required.
-
-In recent years, several approaches to extract s-SWNTs from nanotube powders were explored using for instance chemical functionalization,9–11 DNA and polymers wrapping,12,13 and density gradient ultracentrifugation techniques.6 The latter efficiently separates s-SWNTs and m-SWNTs, but traces of surfactant and density gradient materials limit the performances of the FET. Very recently, two groups have reported on the selective extraction of near-armchair s-SWNTs from nanotube powders using polyfluorene as extracting agent.14,15 According to Nish *et al.*,14 the sample shows no detectable traces of m-SWNTs based only on optical spectroscopy. However, neither the electrical properties nor the fabrication of FET devices were addressed.
-
-In this letter, we report on the electronic properties of FET consisting of *semiconducting-enriched single wall carbon nanotubes, without detectable traces of metallic nanotubes and impurities*, with in our detection limits. This unprecedented achievement is made possible by ultracentrifugation (250,000g), sonication and filtration of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Evidences are gathered by optical absorption, Raman and electrical measurements (see Fig.1). We shall demonstrate that such s-
-
-| \*\*(a)\*\*Wavelength (nm) M Absorbance S Absorbance L Absorbance600 \~0.05 \~0.02 \~0.02
650 \~0.08 \~0.03 \~0.03
700 \~0.11 \~0.04 \~0.04
750 \~0.09 \~0.05 \~0.05
800 \~0.07 \~0.06 \~0.06
850 \~0.06 \~0.07 \~0.07
900 \~0.05 \~0.08 \~0.08
950 \~0.05 \~0.09 \~0",0.16533226581265012,":
-
-Novel semiconductors materials for field effect transistor FET and thin-film transistors TFT are highly demanded.[1] In particular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-off current ratio, high electron/hole mobility, to carry high current density and to operate at high frequencies.[2–5] Several groups have demonstrated excellent transfer characteristics using individual s- SWNTs,[2–5] but generally poor ones using ensemble (network and thin film) of SWNTs due to traces of metallic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles).[6–8] Therefore, very efficient methods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still required.
-
-In recent years, several approaches to extract s- SWNTs from nanotube powders were explored using for instance chemical functionalization,[9–11] DNA and polymers wrapping,[12,13] and density gradient ultracentrifugation techniques.[6] The latter efficiently separates s-SWNTs and m-SWNTs, but traces of surfactant and density gradient materials limit the performances of the FET. Very recently, two groups have reported on the selective extraction of near-armchair s-SWNTs from nanotube powders using polyfluorene as extracting agent.[14,15] According to Nish et al.,[14] the sample shows no detectable traces of m-SWNTs based only on optical spectroscopy. However, neither the electrical properties nor the fabrication of FET devices were addressed.
-
-In this letter, we report on the electronic properties of FET consisting of semiconducting-enriched single wall carbon nanotubes, without detectable traces of metallic nanotubes and impurities, with in our detection limits. This unprecedented achievement is made possible by ultracentrifugation (250,000g), sonication and filtration of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Evidences are gathered by optical absorption, Raman and electrical measurements (see Fig.1). We shall demonstrate that such s-
-
-**==> picture [355 x 284] intentionally omitted <==**
-
-FIG. 1: (Color online): (a) shows the optical absorption spectra and (b) the Raman spectra at 514.5 nm of L, M and S samples . (c) displays the transfer characteristic, ID vs VG for VDS=-14V of FET devices made of sample M and S.
-
-SWNTs realize high-performances FET devices compare to networks/thin films of SWNTs and solution proc",0.2277822257806245,"icular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-off current ratio, high electron/hole mobility, to carry high current density and to operate at high frequencies. 2-5 Several groups have demonstrated excellent transfer characteristics using individual sSWNTs, 2-5 but generally poor ones using ensemble (network and thin film) of SWNTs due to traces of metallic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles). 6-8 Therefore, very efficient methods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still required.
-
-In recent years, several approaches to extract sSWNTs from nanotube powders were explored using for instance chemical functionalization, 9-11 DNA and polymers wrapping, 12,13 and density gradient ultracentrifugation techniques. 6 The latter efficiently separates s-SWNTs and m-SWNTs, but traces of surfactant and density gradient materials limit the performances of the FET. Very recently, two groups have reported on the selective extraction of near-armchair s-SWNTs from nanotube powders using polyfluorene as extracting agent. 14,15 According to Nish et al. , 14 the sample shows no detectable traces of m-SWNTs based only on optical spectroscopy. However, neither the electrical properties nor the fabrication of FET devices were addressed.
-
-In this letter, we report on the electronic properties of FET consisting of semiconducting-enriched single wall carbon nanotubes, without detectable traces of metallic nanotubes and impurities , with in our detection limits. This unprecedented achievement is made possible by ultracentrifugation (250,000g), sonication and filtration of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Evidences are gathered by optical absorption, Raman and electrical measurements (see Fig.1). We shall demonstrate that such s-
-
-FIG. 1: (Color online): (a) shows the optical absorption spectra and (b) the Raman spectra at 514.5 nm of L, M and S samples . (c) displays the transfer characteristic, I D vs V G for V DS =-14V of FET devices made of sample M and S.
-
-
-
-SWNTs realize high-performances FET devices compare to networks/thin films of SWNTs and solution processable polymers/organic materials. 1,6,16
-
-S-SWNTs solutions were prepared as follow. First, SWNTs powders (as-prepared HiPco, Carbon Nanotechnologies Inc.), PFO (Poly-9,9-di-n",0.2277822257806245,"icular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-off current ratio, high electron/hole mobility, to carry high current density and to operate at high frequencies. 2-5 Several groups have demonstrated excellent transfer characteristics using individual sSWNTs, 2-5 but generally poor ones using ensemble (network and thin film) of SWNTs due to traces of metallic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles). 6-8 Therefore, very efficient methods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still required.
-
-In recent years, several approaches to extract sSWNTs from nanotube powders were explored using for instance chemical functionalization, 9-11 DNA and polymers wrapping, 12,13 and density gradient ultracentrifugation techniques. 6 The latter efficiently separates s-SWNTs and m-SWNTs, but traces of surfactant and density gradient materials limit the performances of the FET. Very recently, two groups have reported on the selective extraction of near-armchair s-SWNTs from nanotube powders using polyfluorene as extracting agent. 14,15 According to Nish et al. , 14 the sample shows no detectable traces of m-SWNTs based only on optical spectroscopy. However, neither the electrical properties nor the fabrication of FET devices were addressed.
-
-In this letter, we report on the electronic properties of FET consisting of semiconducting-enriched single wall carbon nanotubes, without detectable traces of metallic nanotubes and impurities , with in our detection limits. This unprecedented achievement is made possible by ultracentrifugation (250,000g), sonication and filtration of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Evidences are gathered by optical absorption, Raman and electrical measurements (see Fig.1). We shall demonstrate that such s-
-
-FIG. 1: (Color online): (a) shows the optical absorption spectra and (b) the Raman spectra at 514.5 nm of L, M and S samples . (c) displays the transfer characteristic, I D vs V G for V DS =-14V of FET devices made of sample M and S.
-
-
-
-SWNTs realize high-performances FET devices compare to networks/thin films of SWNTs and solution processable polymers/organic materials. 1,6,16
-
-S-SWNTs solutions were prepared as follow. First, SWNTs powders (as-prepared HiPco, Carbon Nanotechnologies Inc.), PFO (Poly-9,9-di-n",2,science_sample
-3,0,"Random Effects Model In the random effects model (Table 1), automated blocking generates an MCMC algorithm identical to the Informed Blocking algorithm (blocking each αi, βi pair), which produces a tenfold improve- ment in Efficiency over the most efficient static algorithm – for this model, All Scalar sampling. The cut height h = 0.1 indicates that only the αi, βi pairs exhibit posterior correlations above 0.9. The Informed Cross-Level algorithm requires a substantially longer Runtime and produces a high ESS, which results in nearly identical Efficiency as the efficiently blocked Auto Blocking algorithm. Auto-Regressive Model In the auto-regressive model (Table 1), an AR process value exhibited the slowest mixing under All Scalar sampling. When all 24 model parameters (AR process values, fixed effects, and one hyper-parameter) are blocked, the algorithm Runtime is nearly halved. This decrease in Runtime is largely due to the dependency structure inherent to the AR process. Scalar sampling of AR process values requires nearly a three-fold increase in density evaluations of the process values (since it’s a",False,0.03963963963963964,"cts Model
-
-In the random effects model (Table 1), automated blocking generates an MCMC algorithm identical to the Informed Blocking algorithm (blocking each αi, βi pair), which produces a tenfold improve ment in Efficiency over the most efficient static algorithm – for this model, All Scalar sampling. The cut height h = 0.1 indicates that only the αi, βi pairs exhibit posterior correlations above 0.9. The Informed Cross-Level algorithm requires a substantially longer Runtime and produces a high ESS, which results in nearly identical Efficiency as the efficiently blocked Auto Blocking algorithm.
-
-## Auto-Regressive Model
-
-In the auto-regressive model (Table 1), an AR process value exhibited the slowest mixing under All Scalar sampling. When all 24 model parameters (AR process values, fixed effects, and one hyper-parameter) are blocked, the algorithm Runtime is nearly halved. This decrease in Runtime is largely due to the dependency structure inherent to the AR process. Scalar sampling of AR process values requires nearly a three-fold increase in density evaluations of the process values (since",0.11081081081081082," 1), automated blocking generates an MCMC algorithm identical to the Informed Blocking algorithm (blocking each $\alpha_i$ , $\beta_i$ pair), which produces a tenfold improvement in Efficiency over the most efficient static algorithm – for this model, All Scalar sampling. The cut height $h = 0.1$ indicates that only the $\alpha_i$ , $\beta_i$ pairs exhibit posterior correlations above 0.9. The Informed Cross-Level algorithm requires a substantially longer Runtime and produces a high ESS, which results in nearly identical Efficiency as the efficiently blocked Auto Blocking algorithm.
-
-# Auto-Regressive Model
-
-In the auto-regressive model (Table 1), an AR process value exhibited the slowest mixing under All Scalar sampling. When all 24 model parameters (AR process values, fixed effects, and one hyper-parameter) are blocked, the algorithm Runtime is nearly halved. This decrease in Runtime is largely due to the dependency structure inherent to the AR process. Scalar sampling of AR process values requires nearly a three-fold increase in density evaluations of the process values (since it’s ",0.0963963963963964,"l (Table 1), automated blocking generates an MCMC algorithm identical to the Informed Blocking algorithm (blocking each $\alpha_i$, $\beta_i$ pair), which produces a tenfold improvement in Efficiency over the most efficient static algorithm – for this model, All Scalar sampling. The cut height $h = 0.1$ indicates that only the $\alpha_i$, $\beta_i$ pairs exhibit posterior correlations above 0.9. The Informed Cross-Level algorithm requires a substantially longer Runtime and produces a high ESS, which results in nearly identical Efficiency as the efficiently blocked Auto Blocking algorithm.
-
-### Auto-Regressive Model
-
-In the auto-regressive model (Table 1), an AR process value exhibited the slowest mixing under All Scalar sampling. When all 24 model parameters (AR process values, fixed effects, and one hyper-parameter) are blocked, the algorithm Runtime is nearly halved. This decrease in Runtime is largely due to the dependency structure inherent to the AR process. Scalar sampling of AR process values requires nearly a three-fold increase in density evaluations of the process values (since it’s ",0.11261261261261261,"odel (Table 1), automated blocking generates an MCMC algorithm identical to the Informed Blocking algorithm (blocking each αi, βi pair), which produces a tenfold improvement in Efficiency over the most efficient static algorithm – for this model, All Scalar sampling. The cut height h = 0.1 indicates that only the αi, βi pairs exhibit posterior correlations above 0.9. The Informed Cross-Level algorithm requires a substantially longer Runtime and produces a high ESS, which results in nearly identical Efficiency as the efficiently blocked Auto Blocking algorithm.
-
-## Auto-Regressive Model
-
-In the auto-regressive model (Table 1), an AR process value exhibited the slowest mixing under All Scalar sampling. When all 24 model parameters (AR process values, fixed effects, and one hyper-parameter) are blocked, the algorithm Runtime is nearly halved. This decrease in Runtime is largely due to the dependency structure inherent to the AR process. Scalar sampling of AR process values requires nearly a three-fold increase in density evaluations of the process value",0.07297297297297298,"fects model (Table 1), automated blocking generates an MCMC algorithm identical to the Informed Blocking algorithm (blocking each _αi_ , _βi_ pair), which produces a tenfold improvement in Efficiency over the most efficient static algorithm – for this model, All Scalar sampling. The cut height _h_ = 0 _._ 1 indicates that only the _αi_ , _βi_ pairs exhibit posterior correlations above 0.9. The Informed Cross-Level algorithm requires a substantially longer Runtime and produces a high ESS, which results in nearly identical Efficiency as the efficiently blocked Auto Blocking algorithm.
-
-## **Auto-Regressive Model**
-
-In the auto-regressive model (Table 1), an AR process value exhibited the slowest mixing under All Scalar sampling. When all 24 model parameters (AR process values, fixed effects, and one hyper-parameter) are blocked, the algorithm Runtime is nearly halved. This decrease in Runtime is largely due to the dependency structure inherent to the AR process. Scalar sampling of AR process values requires nearly a three-fold increase in density evaluations of the process values (since it’s a",0.05225225225225225,"n the random effects model (Table 1), automated blocking generates an MCMC algorithm identical to the Informed Blocking algorithm (blocking each α i , β i pair), which produces a tenfold improvement in Efficiency over the most efficient static algorithm - for this model, All Scalar sampling. The cut height h = 0 . 1 indicates that only the α i , β i pairs exhibit posterior correlations above 0.9. The Informed Cross-Level algorithm requires a substantially longer Runtime and produces a high ESS, which results in nearly identical Efficiency as the efficiently blocked Auto Blocking algorithm.
-
-## Auto-Regressive Model
-
-In the auto-regressive model (Table 1), an AR process value exhibited the slowest mixing under All Scalar sampling. When all 24 model parameters (AR process values, fixed effects, and one hyper-parameter) are blocked, the algorithm Runtime is nearly halved. This decrease in Runtime is largely due to the dependency structure inherent to the AR process. Scalar sampling of AR process values requires nearly a three-fold increase in density evaluations of the process values (since it's ",0.05225225225225225,"n the random effects model (Table 1), automated blocking generates an MCMC algorithm identical to the Informed Blocking algorithm (blocking each α i , β i pair), which produces a tenfold improvement in Efficiency over the most efficient static algorithm - for this model, All Scalar sampling. The cut height h = 0 . 1 indicates that only the α i , β i pairs exhibit posterior correlations above 0.9. The Informed Cross-Level algorithm requires a substantially longer Runtime and produces a high ESS, which results in nearly identical Efficiency as the efficiently blocked Auto Blocking algorithm.
-
-## Auto-Regressive Model
-
-In the auto-regressive model (Table 1), an AR process value exhibited the slowest mixing under All Scalar sampling. When all 24 model parameters (AR process values, fixed effects, and one hyper-parameter) are blocked, the algorithm Runtime is nearly halved. This decrease in Runtime is largely due to the dependency structure inherent to the AR process. Scalar sampling of AR process values requires nearly a three-fold increase in density evaluations of the process values (since it's ",3,science_sample
-4,0,"Physicists have used billiards to understand and explore both classical and quantum chaos. Re- cently, in 2001, a group at the University of Texas introduced an experimental set up for modeling the wedge billiard geometry called optical billiard in two dimensions. It is worth mentioning that this experiment is more closely related with classical rather than quantum chaos. The motivation for the present work was born from the idea of laying the foundations of a quantum treatment for optical billiards, named “The Escape Problem”, by presenting the concept of a Transparent Boundary Condition. We consider a “gas of particles” initially confined to a one dimensional box of length L, that are permitted to escape. We find the solution of a Quantum Initial Value Problem using a numerical method developed and entirely checked with an exact, analytic method. The numerical method introduces a novel way to solve a Diffusion Type Equation by implementing Discrete Transparent Boundary Conditions recently developed by mathematicians.",False,0.009699321047526674,"hysicists have used billiards to understand and explore both classical and quantum chaos. Re cently, in 2001, a group at the University of Texas introduced an experimental set up for modeling the wedge billiard geometry called optical billiard in two dimensions. It is worth mentioning that this experiment is more closely related with classical rather than quantum chaos. The motivation for the present work was born from the idea of laying the foundations of a quantum treatment for optical billiards, named “The Escape Problem”, by presenting the concept of a Transparent Boundary Condition. We consider a “gas of particles” initially confined to a one dimensional box of length L, that are permitted to escape. We find the solution of a Quantum Initial Value Problem using a numerical method developed and entirely checked with an exact, analytic method. The numerical method introduces a novel way to solve a Diffusion Type Equation by implementing Discrete Transparent Boundary Conditions recently developed by mathematician",0.020368574199806012,"sicists have used billiards to understand and explore both classical and quantum chaos. Recently, in 2001, a group at the University of Texas introduced an experimental set up for modeling the wedge billiard geometry called optical billiard in two dimensions. It is worth mentioning that this experiment is more closely related with classical rather than quantum chaos. The motivation for the present work was born from the idea of laying the foundations of a quantum treatment for optical billiards, named ""The Escape Problem"", by presenting the concept of a Transparent Boundary Condition. We consider a ""gas of particles"" initially confined to a one dimensional box of length $L$ , that are permitted to escape. We find the solution of a Quantum Initial Value Problem using a numerical method developed and entirely checked with an exact, analytic method. The numerical method introduces a novel way to solve a Diffusion Type Equation by implementing Discrete Transparent Boundary Conditions recently developed by mathematician",0.012609117361784675,"ysicists have used billiards to understand and explore both classical and quantum chaos. Recently, in 2001, a group at the University of Texas introduced an experimental set up for modeling the wedge billiard geometry called optical billiard in two dimensions. It is worth mentioning that this experiment is more closely related with classical rather than quantum chaos. The motivation for the present work was born from the idea of laying the foundations of a quantum treatment for optical billiards, named “The Escape Problem”, by presenting the concept of a Transparent Boundary Condition. We consider a “gas of particles” initially confined to a one dimensional box of length $L$, that are permitted to escape. We find the solution of a Quantum Initial Value Problem using a numerical method developed and entirely checked with an exact, analytic method. The numerical method introduces a novel way to solve a Diffusion Type Equation by implementing Discrete Transparent Boundary Conditions recently developed by mathematicians",0.012609117361784675,"hysicists have used billiards to understand and explore both classical and quantum chaos. Recently, in 2001, a group at the University of Texas introduced an experimental set up for modeling the wedge billiard geometry called optical billiard in two dimensions. It is worth mentioning that this experiment is more closely related with classical rather than quantum chaos. The motivation for the present work was born from the idea of laying the foundations of a quantum treatment for optical billiards, named ""The Escape Problem"", by presenting the concept of a Transparent Boundary Condition. We consider a ""gas of particles"" initially confined to a one dimensional box of length L, that are permitted to escape. We find the solution of a Quantum Initial Value Problem using a numerical method developed and entirely checked with an exact, analytic method. The numerical method introduces a novel way to solve a Diffusion Type Equation by implementing Discrete Transparent Boundary Conditions recently developed by mathematicians.",0.008729388942774006,"hysicists have used billiards to understand and explore both classical and quantum chaos. Recently, in 2001, a group at the University of Texas introduced an experimental set up for modeling the wedge billiard geometry called optical billiard in two dimensions. It is worth mentioning that this experiment is more closely related with classical rather than quantum chaos. The motivation for the present work was born from the idea of laying the foundations of a quantum treatment for optical billiards, named “The Escape Problem”, by presenting the concept of a Transparent Boundary Condition. We consider a “gas of particles” initially confined to a one dimensional box of length L, that are permitted to escape. We find the solution of a Quantum Initial Value Problem using a numerical method developed and entirely checked with an exact, analytic method. The numerical method introduces a novel way to solve a Diffusion Type Equation by implementing Discrete Transparent Boundary Conditions recently developed by mathematicians.",0.014548981571290009,"hysicists have used billiards to understand and explore both classical and quantum chaos. Recently, in 2001, a group at the University of Texas introduced an experimental set up for modeling the wedge billiard geometry called optical billiard in two dimensions. It is worth mentioning that this experiment is more closely related with classical rather than quantum chaos. The motivation for the present work was born from the idea of laying the foundations of a quantum treatment for optical billiards, named 'The Escape Problem', by presenting the concept of a Transparent Boundary Condition. We consider a 'gas of particles' initially confined to a one dimensional box of length L , that are permitted to escape. We find the solution of a Quantum Initial Value Problem using a numerical method developed and entirely checked with an exact, analytic method. The numerical method introduces a novel way to solve a Diffusion Type Equation by implementing Discrete Transparent Boundary Conditions recently developed by mathematicians",0.014548981571290009,"hysicists have used billiards to understand and explore both classical and quantum chaos. Recently, in 2001, a group at the University of Texas introduced an experimental set up for modeling the wedge billiard geometry called optical billiard in two dimensions. It is worth mentioning that this experiment is more closely related with classical rather than quantum chaos. The motivation for the present work was born from the idea of laying the foundations of a quantum treatment for optical billiards, named 'The Escape Problem', by presenting the concept of a Transparent Boundary Condition. We consider a 'gas of particles' initially confined to a one dimensional box of length L , that are permitted to escape. We find the solution of a Quantum Initial Value Problem using a numerical method developed and entirely checked with an exact, analytic method. The numerical method introduces a novel way to solve a Diffusion Type Equation by implementing Discrete Transparent Boundary Conditions recently developed by mathematicians",4,science_sample
-5,0,"Queue Prioritization Experiment We tested our method for prioritizing the crawling queue using Bengali language Twitter users. In order to properly compare the various methods we first collected a data set of 10,785 Twitter users. (5,684 users came from our search queries and an additional 5,103 came from those users’ social connections.) The way the queue ranking works is to first download a small set of users and use that as training data to learn a ranking for the rest of the download queue. We randomly selected 300 users for our training set. The ranking methods were used to order the remaining 10,000+ users in the simulated download queue. In Figure 2, we show the cumulative in-vocabulary tokens obtained as an additional 500 users are processed from the download queue for each of the three prioritization strategies. The predictive ranking provides three times as many in- vocabulary tokens as either the edge count ranking or the random baseline. Figure 3 is similar but shows the cumulative vocabulary coverage (types) where the vocabulary is taken from a held-out dev set different from the text used to produce the Twitter queries. The horizontal line represents the type coverage of the in-domain training data. The predictive ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the dev- set are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially out- performing the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy. The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and aver- age sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @BarackObama followed by @BillGates.) We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the edge",False,0.010657734470158343,"ritization Experiment
-
-We tested our method for prioritizing the crawling queue using Bengali language Twitter users. In order to properly compare the various methods we first collected a data set of 10,785 Twitter users. (5,684 users came from our search queries and an additional 5,103 came from those users' social connections.) The way the queue ranking works is to first download a small set of users and use that as training data to learn a ranking for the rest of the download queue. We randomly selected 300 users for our training set. The ranking methods were used to order the remaining 10,000+ users in the simulated download queue.
-
-In Figure 2, we show the cumulative in-vocabulary tokens obtained as an additional 500 users are processed from the download queue for each of the three prioritization strategies. The predictive ranking provides three times as many in- vocabulary tokens as either the edge count ranking or the random baseline. Figure 3 is similar but shows the cumulative vocabulary coverage (types) where the vocabulary is taken from a held-out dev set different from the text used to produce the Twitter queries. The horizontal line represents the type coverage of the in-domain training data. The predictive
-
-ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the dev set are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially out performing the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
-
-The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and aver- age sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @Barack Obama followed by @BillGates.)
-
-We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the edg",0.009135200974421437,"e Prioritization Experiment
-
-We tested our method for prioritizing the crawling queue using Bengali language Twitter users. In order to properly compare the various methods we first collected a data set of 10,785 Twitter users. (5,684 users came from our search queries and an additional 5,103 came from those users’ social connections.) The way the queue ranking works is to first download a small set of users and use that as training data to learn a ranking for the rest of the download queue. We randomly selected 300 users for our training set. The ranking methods were used to order the remaining 10,000+ users in the simulated download queue.
-
-In Figure 2, we show the cumulative in-vocabulary tokens obtained as an additional 500 users are processed from the download queue for each of the three prioritization strategies. The predictive ranking provides three times as many in-vocabulary tokens as either the edge count ranking or the random baseline. Figure 3 is similar but shows the cumulative vocabulary coverage (types) where the vocabulary is taken from a held-out dev set different from the text used to produce the Twitter queries. The horizontal line represents the type coverage of the in-domain training data. The predictive
-
-ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the dev-set are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially out-performing the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
-
-The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and average sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @BarackObama followed by @BillGates.)
-
-We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the edg",0.008830694275274055,"ue Prioritization Experiment*
-
-We tested our method for prioritizing the crawling queue using Bengali language Twitter users. In order to properly compare the various methods we first collected a data set of 10,785 Twitter users. (5,684 users came from our search queries and an additional 5,103 came from those users’ social connections.) The way the queue ranking works is to first download a small set of users and use that as training data to learn a ranking for the rest of the download queue. We randomly selected 300 users for our training set. The ranking methods were used to order the remaining 10,000+ users in the simulated download queue.
-
-In Figure 2, we show the cumulative in-vocabulary tokens obtained as an additional 500 users are processed from the download queue for each of the three prioritization strategies. The predictive ranking provides three times as many in-vocabulary tokens as either the edge count ranking or the random baseline. Figure 3 is similar but shows the cumulative vocabulary coverage (types) where the vocabulary is taken from a held-out dev set different from the text used to produce the Twitter queries. The horizontal line represents the type coverage of the in-domain training data. The predictive ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the dev-set are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially outperforming the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
-
-The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and average sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @BarackObama followed by @BillGates.)
-
-We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the edg",0.009135200974421437," Prioritization Experiment*
-
-We tested our method for prioritizing the crawling queue using Bengali language Twitter users. In order to properly compare the various methods we first collected a data set of 10,785 Twitter users. (5,684 users came from our search queries and an additional 5,103 came from those users' social connections.) The way the queue ranking works is to first download a small set of users and use that as training data to learn a ranking for the rest of the download queue. We randomly selected 300 users for our training set. The ranking methods were used to order the remaining 10,000+ users in the simulated download queue.
-
-In Figure 2, we show the cumulative in-vocabulary tokens obtained as an additional 500 users are processed from the download queue for each of the three prioritization strategies. The predictive ranking provides three times as many in-vocabulary tokens as either the edge count ranking or the random baseline. Figure 3 is similar but shows the cumulative vocabulary coverage (types) where the vocabulary is taken from a held-out dev set different from the text used to produce the Twitter queries. The horizontal line represents the type coverage of the in-domain training data. The predictive ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the dev-set are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially out-performing the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
-
-The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and aver-age sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @BarackObama followed by @BillGates.)
-
-We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the edg",0.011266747868453105,"eue Prioritization Experiment_
-
-We tested our method for prioritizing the crawling queue using Bengali language Twitter users. In order to properly compare the various methods we first collected a data set of 10,785 Twitter users. (5,684 users came from our search queries and an additional 5,103 came from those users’ social connections.) The way the queue ranking works is to first download a small set of users and use that as training data to learn a ranking for the rest of the download queue. We randomly selected 300 users for our training set. The ranking methods were used to order the remaining 10,000+ users in the simulated download queue.
-
-In Figure 2, we show the cumulative in-vocabulary tokens obtained as an additional 500 users are processed from the download queue for each of the three prioritization strategies. The predictive ranking provides three times as many invocabulary tokens as either the edge count ranking or the random baseline. Figure 3 is similar but shows the cumulative vocabulary coverage (types) where the vocabulary is taken from a held-out dev set different from the text used to produce the Twitter queries. The horizontal line represents the type coverage of the in-domain training data. The predictive
-
-ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the devset are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially outperforming the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
-
-The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and average sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @BarackObama followed by @BillGates.)
-
-We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than th",0.008526187576126675,"Queue Prioritization Experiment
-
-We tested our method for prioritizing the crawling queue using Bengali language Twitter users. In order to properly compare the various methods we first collected a data set of 10,785 Twitter users. (5,684 users came from our search queries and an additional 5,103 came from those users' social connections.) The way the queue ranking works is to first download a small set of users and use that as training data to learn a ranking for the rest of the download queue. We randomly selected 300 users for our training set. The ranking methods were used to order the remaining 10,000+ users in the simulated download queue.
-
-In Figure 2, we show the cumulative in-vocabulary tokens obtained as an additional 500 users are processed from the download queue for each of the three prioritization strategies. The predictive ranking provides three times as many invocabulary tokens as either the edge count ranking or the random baseline. Figure 3 is similar but shows the cumulative vocabulary coverage (types) where the vocabulary is taken from a held-out dev set different from the text used to produce the Twitter queries. The horizontal line represents the type coverage of the in-domain training data. The predictive ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the devset are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially outperforming the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
-
-The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and average sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @BarackObama followed by @BillGates.)
-
-We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the edg",0.008526187576126675,"Queue Prioritization Experiment
-
-We tested our method for prioritizing the crawling queue using Bengali language Twitter users. In order to properly compare the various methods we first collected a data set of 10,785 Twitter users. (5,684 users came from our search queries and an additional 5,103 came from those users' social connections.) The way the queue ranking works is to first download a small set of users and use that as training data to learn a ranking for the rest of the download queue. We randomly selected 300 users for our training set. The ranking methods were used to order the remaining 10,000+ users in the simulated download queue.
-
-In Figure 2, we show the cumulative in-vocabulary tokens obtained as an additional 500 users are processed from the download queue for each of the three prioritization strategies. The predictive ranking provides three times as many invocabulary tokens as either the edge count ranking or the random baseline. Figure 3 is similar but shows the cumulative vocabulary coverage (types) where the vocabulary is taken from a held-out dev set different from the text used to produce the Twitter queries. The horizontal line represents the type coverage of the in-domain training data. The predictive ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the devset are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially outperforming the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
-
-The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and average sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @BarackObama followed by @BillGates.)
-
-We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the edg",5,science_sample
-6,0,"F0 and F1 over the support causes more triangles having positive probability lower bounds, which leads the improvement of my new lower bound. On the other hand, the Makarov lower bound gets no such informational gain because it uses only one triangle while my new lower bound takes advantage of multiple triangles. Application to the Distribution of Effects of Smoking on Birth Weight In this section, I apply the results presented in Section 3 to an empirical analysis of the distribution of smoking effects on infant birth weight. Smoking not only has a direct impact on infant birth weight, but is also associated with unobservable factors that affect infant birth weight. I identify marginal distributions of potential infant birth weight with and without smoking by making use of a state cigarette tax hike in Massachusetts (MA) in January 1993 as a source of exogenous variation. I focus on pregnant women who change their smoking behavior from smoking to nonsmoking in response to the tax increase. To identify the distribution of smoking effects, I impose a MTR restriction that smoking has nonpositive effects on infant birth weight with probability one. I propose an estimation procedure and report estimates of the DTE",False,0.024509803921568627,"0 and F1 over the support causes more triangles having positive probability lower bounds, which leads the improvement of my new lower bound. On the other hand, the Makarov lower bound gets no such informational gain because it uses only one triangle while my new lower bound takes advantage of multiple triangles.
-
-## 5 Application to the Distribution of Effects of Smoking on Birth Weight
-
-In this section, I apply the results presented in Section 3 to an empirical analysis of the distribution of smoking effects on infant birth weight. Smoking not only has a direct impact on infant birth weight, but is also associated with unobservable factors that affect infant birth weight. I identify marginal distributions of potential infant birth weight with and without smoking by making use of a state cigarette tax hike in Massachusetts (MA) in January 1993 as a source of exogenous variation. I focus on pregnant women who change their smoking behavior from smoking to nonsmoking in response to the tax increase. To identify the distribution of smoking effects, I impose a MTR restriction that smoking has nonpositive effects on infant birth weight with probability one. I propose an estimation procedure and report estimates",0.026143790849673203,"er the support causes more triangles having positive probability lower bounds, which leads the improvement of my new lower bound. On the other hand, the Makarov lower bound gets no such informational gain because it uses only one triangle while my new lower bound takes advantage of *multiple* triangles.
-
-# 5 Application to the Distribution of Effects of Smoking on Birth Weight
-
-In this section, I apply the results presented in Section 3 to an empirical analysis of the distribution of smoking effects on infant birth weight. Smoking not only has a direct impact on infant birth weight, but is also associated with unobservable factors that affect infant birth weight. I identify marginal distributions of potential infant birth weight with and without smoking by making use of a state cigarette tax hike in Massachusetts (MA) in January 1993 as a source of exogenous variation. I focus on pregnant women who change their smoking behavior from smoking to nonsmoking in response to the tax increase. To identify the distribution of smoking effects, I impose a MTR restriction that smoking has nonpositive effects on infant birth weight with probability one. I propose an estimation procedure and report estimates of the DT",0.027777777777777776,"r the support causes more triangles having positive probability lower bounds, which leads the improvement of my new lower bound. On the other hand, the Makarov lower bound gets no such informational gain because it uses only one triangle while my new lower bound takes advantage of *multiple triangles*.
-
-## 5 Application to the Distribution of Effects of Smoking on Birth Weight
-
-In this section, I apply the results presented in Section 3 to an empirical analysis of the distribution of smoking effects on infant birth weight. Smoking not only has a direct impact on infant birth weight, but is also associated with unobservable factors that affect infant birth weight. I identify marginal distributions of potential infant birth weight with and without smoking by making use of a state cigarette tax hike in Massachusetts (MA) in January 1993 as a source of exogenous variation. I focus on pregnant women who change their smoking behavior from smoking to nonsmoking in response to the tax increase. To identify the distribution of smoking effects, I impose a MTR restriction that smoking has nonpositive effects on infant birth weight with probability one. I propose an estimation procedure and report estimates of the DT",0.026143790849673203,"er the support causes more triangles having positive probability lower bounds, which leads the improvement of my new lower bound. On the other hand, the Makarov lower bound gets no such informational gain because it uses only one triangle while my new lower bound takes advantage of *multiple* triangles.
-
-# 5 Application to the Distribution of Effects of Smoking on Birth Weight
-
-In this section, I apply the results presented in Section 3 to an empirical analysis of the distribution of smoking effects on infant birth weight. Smoking not only has a direct impact on infant birth weight, but is also associated with unobservable factors that affect infant birth weight. I identify marginal distributions of potential infant birth weight with and without smoking by making use of a state cigarette tax hike in Massachusetts (MA) in January 1993 as a source of exogenous variation. I focus on pregnant women who change their smoking behavior from smoking to nonsmoking in response to the tax increase. To identify the distribution of smoking effects, I impose a MTR restriction that smoking has nonpositive effects on infant birth weight with probability one. I propose an estimation procedure and report estimates of the DT",0.03676470588235294,"over the support causes more triangles having positive probability lower bounds, which leads the improvement of my new lower bound. On the other hand, the Makarov lower bound gets no such informational gain because it uses only one triangle while my new lower bound takes advantage of _multiple_ triangles.
-
-## **5 Application to the Distribution of Effects of Smoking on Birth Weight**
-
-In this section, I apply the results presented in Section 3 to an empirical analysis of the distribution of smoking effects on infant birth weight. Smoking not only has a direct impact on infant birth weight, but is also associated with unobservable factors that affect infant birth weight. I identify marginal distributions of potential infant birth weight with and without smoking by making use of a state cigarette tax hike in Massachusetts (MA) in January 1993 as a source of exogenous variation. I focus on pregnant women who change their smoking behavior from smoking to nonsmoking in response to the tax increase. To identify the distribution of smoking effects, I impose a MTR restriction that smoking has nonpositive effects on infant birth weight with probability one. I propose an estimation procedure and report estimates ",0.024509803921568627,"ver the support causes more triangles having positive probability lower bounds, which leads the improvement of my new lower bound. On the other hand, the Makarov lower bound gets no such informational gain because it uses only one triangle while my new lower bound takes advantage of multiple triangles.
-
-## 5 Application to the Distribution of Effects of Smoking on Birth Weight
-
-In this section, I apply the results presented in Section 3 to an empirical analysis of the distribution of smoking effects on infant birth weight. Smoking not only has a direct impact on infant birth weight, but is also associated with unobservable factors that affect infant birth weight. I identify marginal distributions of potential infant birth weight with and without smoking by making use of a state cigarette tax hike in Massachusetts (MA) in January 1993 as a source of exogenous variation. I focus on pregnant women who change their smoking behavior from smoking to nonsmoking in response to the tax increase. To identify the distribution of smoking effects, I impose a MTR restriction that smoking has nonpositive effects on infant birth weight with probability one. I propose an estimation procedure and report estimates of the DT",0.024509803921568627,"ver the support causes more triangles having positive probability lower bounds, which leads the improvement of my new lower bound. On the other hand, the Makarov lower bound gets no such informational gain because it uses only one triangle while my new lower bound takes advantage of multiple triangles.
-
-## 5 Application to the Distribution of Effects of Smoking on Birth Weight
-
-In this section, I apply the results presented in Section 3 to an empirical analysis of the distribution of smoking effects on infant birth weight. Smoking not only has a direct impact on infant birth weight, but is also associated with unobservable factors that affect infant birth weight. I identify marginal distributions of potential infant birth weight with and without smoking by making use of a state cigarette tax hike in Massachusetts (MA) in January 1993 as a source of exogenous variation. I focus on pregnant women who change their smoking behavior from smoking to nonsmoking in response to the tax increase. To identify the distribution of smoking effects, I impose a MTR restriction that smoking has nonpositive effects on infant birth weight with probability one. I propose an estimation procedure and report estimates of the DT",6,science_sample
-7,0,"It is apparent form Eq. (A12) that the leading singularity originates from the first term, (A −1)BC ≈A −1 ≈ −2d(y1 −0)(y3 −y2). Introducing new variables as in the Sec. III and integrating over xis we obtain",False,0.09223300970873786,"is apparent form Eq. (A12) that the leading singularity originates from the first term, (A − 1)BC ≈ A − 1 ≈ −2d( y1 − 0)(y3 − y2). Introducing new variables as in the Sec. III and integrating over x i s we ",0.23300970873786409,"t is apparent from Eq. (A12) that the leading singularity originates from the first term, $(A-1)BC\approx A-1\approx-2d(y_1-0)(y_3-y_2)$ . Introducing new variables as in the Sec. III and integrating over ",0.27184466019417475,"It is apparent from Eq. (A12) that the leading singularity originates from the first term, $(A - 1)BC \approx A - 1 \approx -2d(y_1 - 0)(y_3 - y_2)$. Introducing new variables as in Sec. III and integrating",0.2621359223300971,"s apparent form Eq. (A12) that the leading singularity originates from the first term, $(A - 1)BC \approx A - 1 \approx -2d(y_1 - 0)(y_3 - y_2)$. Introducing new variables as in the Sec. III and integrating",0.06310679611650485,"apparent form Eq. (A12) that the leading singularity originates from the first term, (A − 1)BC ≈ A − 1 ≈ −2d(y1 − 0)(y3 − y2). Introducing new variables as in the Sec. III and integrating over xis we obtain",0.14563106796116504," is apparent form Eq. (A12) that the leading singularity originates from the first term, ( A -1) BC ≈ A -1 ≈ -2 d ( y 1 -0)( y 3 -y 2 ). Introducing new variables as in the Sec. III and integrating over x i",0.14563106796116504," is apparent form Eq. (A12) that the leading singularity originates from the first term, ( A -1) BC ≈ A -1 ≈ -2 d ( y 1 -0)( y 3 -y 2 ). Introducing new variables as in the Sec. III and integrating over x i",7,science_sample
-7,1,"Here again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity,",False,0.013157894736842105,"ere again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity,",0.09649122807017543,"gain, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable $\alpha$ introduced in Eq. (14) in order to isolate the leading logarithmic singular",0.07894736842105263,"again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable $\alpha$ introduced in Eq. (14) in order to isolate the leading logarithmic singulari",0.07894736842105263,"again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable $\alpha$ introduced in Eq. (14) in order to isolate the leading logarithmic singulari",0.013157894736842105,"Here again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity",0.013157894736842105,"Here again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity",0.013157894736842105,"Here again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity",7,science_sample
-7,2,"The remaining integrals are easily evaluated. The sub- sequent integration over α restores the singularity in the self energy correction,",False,0.19708029197080293,"
-The remaining integrals are easily evaluated. The subsequent integration over α restores the singularity in the
-
-(6)=2d- -i(Jad)6(1 – 2",0.16058394160583941," remaining integrals are easily evaluated. The subsequent integration over $\alpha$ restores the singularity in the
-
-self energy correc",0.10948905109489052,e remaining integrals are easily evaluated. The subsequent integration over $\alpha$ restores the singularity in the self energy correcti,0.13138686131386862,"emaining integrals are easily evaluated. The subsequent integration over $\alpha$ restores the singularity in the
-
-self energy correction",0.029197080291970802,"The remaining integrals are easily evaluated. The subsequent integration over α restores the singularity in the
-
-self energy correction,",0.2116788321167883,"d -->
-
-The remaining integrals are easily evaluated. The subsequent integration over α restores the singularity in the
-
-- [1] Ar. Abanov,",0.2116788321167883,"d -->
-
-The remaining integrals are easily evaluated. The subsequent integration over α restores the singularity in the
-
-- [1] Ar. Abanov,",7,science_sample
-7,3,"In this appendix we evaluate the singular contributions to the Green function at the shadow mass shell, ω ∼ky to fourth order in the coupling constant. We start with the expression (A1) introduced in App. A 1. In contrast to the discussion in App. A 1 we anticipate the singular- ity at ω = ky to come from the region y2 ≫x2, and introduce new variables accordingly, x2 = ξy2, y1 = ηy2. Performing integration over y2 we obtain",False,0.02107728337236534,"In this appendix we evaluate the singular contributions to the Green function at the shadow mass shell, ω ∼ ky to fourth order in the coupling constant. We start with the expression (A1) introduced in App. A 1. In contrast to the discussion in App. A 1 we anticipate the singularity at ω = ky to come from the region y2 ≫ x2 , and introduce new variables accordingly, x 2 = ξy2, y1 = ηy2. Performing integration over y2 we obt",0.2154566744730679,"In this appendix we evaluate the singular contributions to the Green function at the shadow mass shell, $\omega\sim k_y$ to fourth order in the coupling constant. We start with the expression (A1) introduced in App. A1. In contrast to the discussion in App. A1 we anticipate the singularity at $\omega=k_y$ to come from the region $y_2\gg x_2$ , and introduce new variables accordingly, $x_2=\xi y_2$ , $y_1=\eta y_2$ . ",0.1873536299765808,"In this appendix we evaluate the singular contributions to the Green function at the shadow mass shell, $\omega \sim k_y$ to fourth order in the coupling constant. We start with the expression (A1) introduced in App. A 1. In contrast to the discussion in App. A 1 we anticipate the singularity at $\omega = k_y$ to come from the region $y_2 \gg x_2$, and introduce new variables accordingly, $x_2 = \xi y_2$, $y_1 = \eta y_2$. ",0.20374707259953162,"In this appendix we evaluate the singular contributions to the Green function at the shadow mass shell, $\omega \sim k_y$ to fourth order in the coupling constant. We start with the expression (A1) introduced in App. A 1. In contrast to the discussion in App. A 1 we anticipate the singularity at $\omega \equiv k_y$ to come from the region $y_2 \gg x_2$, and introduce new variables accordingly, $x_2 = \xi y_2$, $y_1 = \eta y",0.00936768149882904,"In this appendix we evaluate the singular contributions to the Green function at the shadow mass shell, ω ∼ ky to fourth order in the coupling constant. We start with the expression (A1) introduced in App. A 1. In contrast to the discussion in App. A 1 we anticipate the singularity at ω = ky to come from the region y2 ≫ x2, and introduce new variables accordingly, x2 = ξy2, y1 = ηy2. Performing integration over y2 we obtain",0.11475409836065574,"ppendix we evaluate the singular contributions to the Green function at the shadow mass shell, ω ∼ k y to fourth order in the coupling constant. We start with the expression (A1) introduced in App. A 1. In contrast to the discussion in App. A 1 we anticipate the singularity at ω = k y to come from the region y 2 /greatermuch x 2 , and introduce new variables accordingly, x 2 = ξy 2 , y 1 = ηy 2 . Performing integration over",0.11475409836065574,"ppendix we evaluate the singular contributions to the Green function at the shadow mass shell, ω ∼ k y to fourth order in the coupling constant. We start with the expression (A1) introduced in App. A 1. In contrast to the discussion in App. A 1 we anticipate the singularity at ω = k y to come from the region y 2 /greatermuch x 2 , and introduce new variables accordingly, x 2 = ξy 2 , y 1 = ηy 2 . Performing integration over",7,science_sample
-7,4,We notice that the singularity at ω ∼ky comes from the region of small ξ. Therefore we keep only the first term in the square brackets in Eq. (B1). After performing remaining integrations over ξis we obtain,False,0.024390243902439025,We notice that the singularity at ω ∼ ky comes from the region of small ξ. Therefore we keep only the first term in the square brackets in Eq. (B1). After performing remaining integrations over ξis we obta,0.21951219512195122,We notice that the singularity at $\omega\sim k_y$ comes from the region of small $\xi$ . Therefore we keep only the first term in the square brackets in Eq. (B1). After performing remaining integration,0.18536585365853658, notice that the singularity at $\omega \sim k_y$ comes from the region of small $\xi$. Therefore we keep only the first term in the square brackets in Eq. (B1). After performing remaining integrations ove,0.2146341463414634,tice that the singularity at $\omega \approx k_y$ comes from the region of small $\xi$. Therefore we keep only the first term in the square brackets in Eq. (B1). After performing remaining integrations ove,0.024390243902439025,We notice that the singularity at ω ∼ ky comes from the region of small ξ. Therefore we keep only the first term in the square brackets in Eq. (B1). After performing remaining integrations over ξis we obta,0.06341463414634146,notice that the singularity at ω ∼ k y comes from the region of small ξ . Therefore we keep only the first term in the square brackets in Eq. (B1). After performing remaining integrations over ξ i s we obt,0.06341463414634146,notice that the singularity at ω ∼ k y comes from the region of small ξ . Therefore we keep only the first term in the square brackets in Eq. (B1). After performing remaining integrations over ξ i s we obt,7,science_sample
-7,5,"We stress that contrary to the mass shell singularities discussed in App. A, where it was important to compute the self-energy, at the shadow mass shell it is enough to consider the Green function itself.",False,0.0,"We stress that contrary to the mass shell singularities discussed in App. A, where it was important to compute the self-energy, at the shadow mass shell it is enough to consider the Green function itself.",0.0,"We stress that contrary to the mass shell singularities discussed in App. A, where it was important to compute the self-energy, at the shadow mass shell it is enough to consider the Green function itself.",0.0,"We stress that contrary to the mass shell singularities discussed in App. A, where it was important to compute the self-energy, at the shadow mass shell it is enough to consider the Green function itself.",0.0,"We stress that contrary to the mass shell singularities discussed in App. A, where it was important to compute the self-energy, at the shadow mass shell it is enough to consider the Green function itself.",0.0,"We stress that contrary to the mass shell singularities discussed in App. A, where it was important to compute the self-energy, at the shadow mass shell it is enough to consider the Green function itself.",0.0,"We stress that contrary to the mass shell singularities discussed in App. A, where it was important to compute the self-energy, at the shadow mass shell it is enough to consider the Green function itself.",0.0,"We stress that contrary to the mass shell singularities discussed in App. A, where it was important to compute the self-energy, at the shadow mass shell it is enough to consider the Green function itself.",7,science_sample
-8,0,"where U and V are orthogonal matrices that span the range and the null space of Cij and Dkl = λ2δkl, a diag- onal matrix with singular values along the diagonal. In doing the SVD, we select the dominant pmodes to con- tribute to the χ2 by requiring that λ2 > 2/Njk. In Figure 4, we rank the eigenvalues (λi) for the in- creasing eigenmodes and see a “kink” in the distribu- tion which we interpret as indicating a transition in the signal–to–noise of the eigenmodes, i.e., only the first ten modes contain most of the signal, while higher-ordered modes are dominated by noise. We therefore remove eigenmodes beyond this kink (with λi < 0.01) where the eigenvalues start to flatten out. Statistical determination of large scale flow As discussed in the Introduction, there is recent evi- dence for excessive bulk flow motions compared to the WMAP5-normalised ΛCDM model [18] and therefore, it is important to confirm these results as it may indicate evidence for an alternative explanation for the observed cosmic acceleration such as modified gravity. In this pa- per, we provide a first demonstration of our new param- eterization using clusters of galaxies from the SDSS. In detail, we attempt to model the “squashing” of the 2- D correlation function of the C4 cluster sample seen in Figure 5 using the formalism presented herein. We do however caution the reader that we expect the limited size of the DR3 sample to leads to large statistical er- rors, due to a significant shot–noise contribution because of their low number density. However, future cluster and galaxy samples (e.g., LRGs) should provide stronger con- straints and provide a more robust test of these high bulk flow measurements in the literature. In Figure 5, we provide the best fit parameters b and vp for the C4 correlation function presented in Figure 3 and there is as expected a clear anti-correlation be- tween these two parameters because the anisotropic am- plitude is generated by cross-correlations in the density and peculiar velocity fields. The best fit value from Fig- ure 5 is vp = 270+433 km/s (at the 1σ level marginalised with other parameters including b) and is consistent with vp = 0. We do not quote the negative bound of the error on vp as it is below zero and thus has no physical mean- ing. Instead, we quote the upper bound on vp and note that our result is consistent with zero. Our measurement of vp is close to the predicted value of 203 km/s for a WMAP5–normalised ΛCDM model. We propose above that vp is a complementary param- eter for reporting such peculiar velocity measurements. The parameter gΘ, which is equivalent to fσ8, is not de- termined precisely without the prior information of AS. But when we report our measurement with vp, there is no uncertainty due to other cosmological parameters which are not determined accurately, as it is equivalent to g∗Θ determined statistically from redshift space distortion. The observed value vp at a given redshift is not only in- dependent of bias but also independent of normalisation. B. Reconstruction of matter density field from vp We convert vp measurement into gΘ using As from WMAP5 (gΘ: coherent growth factor of peculiar veloc- ity, and it is equivalent to fσ8 in other parameteriza- tions). With the evolution of gΘ known, dynamics of per- turbations are reconstructed to provide the history of Ψ through the Euler equation. In most theoretical models, the time variation of vp is minimal at these low redshifts discussed here for the C4 sample (z ≃0.1), which allows us to ignore the time-derivative part in Eq. 9. Therefore, it is straightforward to transform the coherent evolution of Θ into the coherent evolution of Ψ. If we assume no anisotropic stress, then it is easy to convert to the coher- ent evolution of Φ, gΦ. We are able to determine matter density fluctuations through the Poisson equation. We calculate the coher- ent growth of δm, gδ = 0.7, which is related to gΦ as",False,0.034798069596139194,"gonal matrices that span the range and the null space of Ci; and Dkɩ = X²8kɩ, a diag- onal matrix with singular values along the diagonal. In doing the SVD, we select the dominant modes to con- tribute to the x² by requiring that λ² > √2/Njk.
-
-In Figure 4, we rank the eigenvalues (λi) for the increasing eigenmodes and see a “kink” in the distribution which we interpret as indicating a transition in the signal–to–noise of the eigenmodes, i.e., only the first ten modes contain most of the signal, while higher-ordered modes are dominated by noise. We therefore remove eigenmodes beyond this kink (with λ i < 0.01) where the eigenvalues start to flatten out.
-
-## A. Statistical determination of large scale flow
-
-As discussed in the Introduction, there is recent evidence for excessive bulk flow motions compared to the WMAP5-normalised ΛCDM model [18] and therefore, it is important to confirm these results as it may indicate
-
-evidence for an alternative explanation for the observed cosmic acceleration such as modified gravity. In this paper, we provide a first demonstration of our new parameterization using clusters of galaxies from the SDSS. In detail, we attempt to model the “squashing” of the 2- D correlation function of the C4 cluster sample seen in Figure 5 using the formalism presented herein. We do however caution the reader that we expect the limited size of the DR3 sample to leads to large statistical errors, due to a significant shot–noise contribution because of their low number density. However, future cluster and galaxy samples (e.g., LRGs) should provide stronger constraints and provide a more robust test of these high bulk flow measurements in the literature.
-
-In Figure 5, we provide the best fit parameters b and v p for the C4 correlation function presented in Figure 3 and there is as expected a clear anti-correlation between these two parameters because the anisotropic amplitude is generated by cross-correlations in the density and peculiar velocity fields. The best fit value from Figure 5 is vp = 270+433 km/s (at the 1σ level marginalised with other parameters including b) and is consistent with v p = 0. We do not quote the negative bound of the error on v p as it is below zero and thus has no physical meaning. Instead, we quote the upper bound on vp and note that our result is consistent with zero. Our measurement of vp is close to the predicted value of 203 km/s for a WMAP5–normalised ΛCDM model.
-
-We propose above that vp is a complementary parameter for reporting such peculiar velocity measurements. The parameter gΘ, which is equivalent to fσ8, is not determined precisely without the prior information of AS . But when we report our measurement with vp , there is no uncertainty due to other cosmological parameters which are not determined accurately, as it is equivalent to g ∗ Θ determined statistically from redshift space distortion. The observed value vp at a given redshift is not only independent of bias but also independent of normalisation.
-
-## B. Reconstruction of matter density field from vp
-
-We convert vp measurement into gΘ using As from WMAP5 ( gΘ: coherent growth factor of peculiar velocity, and it is equivalent to fσ8 in other parameterizations). With the evolution of gΘ known, dynamics of perturbations are reconstructed to provide the history of Ψ through the Euler equation. In most theoretical models, the time variation of vp is minimal at these low redshifts discussed here for the C4 sample (z ≃ 0.1), which allows us to ignore the time-derivative part in Eq. 9. Therefore, it is straightforward to transform the coherent evolution of Θ into the coherent evolution of Ψ. If we assume no anisotropic stress, then it is easy to convert to the coherent evolution of Φ, gΦ .
-
-We are able to determine matter density fluctuations through the Poisson equation. We calculate the coherent growth of δm, gδ = 0.7, which is related to gΦ a",0.1615443230886462,"delta_{kl}$ , a diagonal matrix with singular values along the diagonal. In doing the SVD, we select the dominant modes to contribute to the $\chi^2$ by requiring that $\lambda^2>\sqrt{2/N_{jk}}$ .
-
-In Figure 4, we rank the eigenvalues ( $\lambda_i$ ) for the increasing eigenmodes and see a ""kink"" in the distribution which we interpret as indicating a transition in the signal-to-noise of the eigenmodes, i.e., only the first ten modes contain most of the signal, while higher-ordered modes are dominated by noise. We therefore remove eigenmodes beyond this kink (with $\lambda_i<0.01$ ) where the eigenvalues start to flatten out.
-
-# A. Statistical determination of large scale flow
-
-As discussed in the Introduction, there is recent evidence for excessive bulk flow motions compared to the WMAP5-normalised $\Lambda$ CDM model [18] and therefore, it is important to confirm these results as it may indicate
-
-evidence for an alternative explanation for the observed cosmic acceleration such as modified gravity. In this paper, we provide a first demonstration of our new parameterization using clusters of galaxies from the SDSS. In detail, we attempt to model the ""squashing"" of the 2-D correlation function of the C4 cluster sample seen in Figure 5 using the formalism presented herein. We do however caution the reader that we expect the limited size of the DR3 sample to leads to large statistical errors, due to a significant shot-noise contribution because of their low number density. However, future cluster and galaxy samples (e.g., LRGs) should provide stronger constraints and provide a more robust test of these high bulk flow measurements in the literature.
-
-In Figure 5, we provide the best fit parameters $b$ and $v_p$ for the C4 correlation function presented in Figure 3 and there is as expected a clear anti-correlation between these two parameters because the anisotropic amplitude is generated by cross-correlations in the density and peculiar velocity fields. The best fit value from Figure 5 is $v_p=270^{+433}$ km/s (at the $1\sigma$ level marginalised with other parameters including $b$ ) and is consistent with $v_p=0$ . We do not quote the negative bound of the error on $v_p$ as it is below zero and thus has no physical meaning. Instead, we quote the upper bound on $v_p$ and note that our result is consistent with zero. Our measurement of $v_p$ is close to the predicted value of 203 km/s for a WMAP5-normalised $\Lambda$ CDM model.
-
-We propose above that $v_p$ is a complementary parameter for reporting such peculiar velocity measurements. The parameter $g_\Theta$ , which is equivalent to $f\sigma_8$ , is not determined precisely without the prior information of $A_S$ . But when we report our measurement with $v_p$ , there is no uncertainty due to other cosmological parameters which are not determined accurately, as it is equivalent to $g_\Theta^*$ determined statistically from redshift space distortion. The observed value $v_p$ at a given redshift is not only independent of bias but also independent of normalisation.
-
-# B. Reconstruction of matter density field from $v_p$
-
-We convert $v_p$ measurement into $g_\Theta$ using $A_S$ from WMAP5 ( $g_\Theta$ : coherent growth factor of peculiar velocity, and it is equivalent to $f\sigma_8$ in other parameterizations). With the evolution of $g_\Theta$ known, dynamics of perturbations are reconstructed to provide the history of $\Psi$ through the Euler equation. In most theoretical models, the time variation of $v_p$ is minimal at these low redshifts discussed here for the C4 sample ( $z\simeq 0.1$ ), which allows us to ignore the time-derivative part in Eq. 9. Therefore, it is straightforward to transform the coherent evolution of $\Theta$ into the coherent evolution of $\Psi$ . If we assume no anisotropic stress, then it is easy to convert to the coherent evolution of $\Phi$ , $g",0.1330962661925324," along the diagonal. In doing the SVD, we select the dominant modes to contribute to the $\chi^2$ by requiring that $\lambda^2 > \sqrt{2/N_{jk}}$.
-
-In Figure 4, we rank the eigenvalues ($\lambda_i$) for the increasing eigenmodes and see a ""kink"" in the distribution which we interpret as indicating a transition in the signal–to–noise of the eigenmodes, i.e., only the first ten modes contain most of the signal, while higher-ordered modes are dominated by noise. We therefore remove eigenmodes beyond this kink (with $\lambda_i < 0.01$) where the eigenvalues start to flatten out.
-
-## A. Statistical determination of large scale flow
-
-As discussed in the Introduction, there is recent evidence for excessive bulk flow motions compared to the WMAP5-normalised $\Lambda$CDM model [18] and therefore, it is important to confirm these results as it may indicate evidence for an alternative explanation for the observed cosmic acceleration such as modified gravity. In this paper, we provide a first demonstration of our new parameterization using clusters of galaxies from the SDSS. In detail, we attempt to model the ""squashing"" of the 2-D correlation function of the C4 cluster sample seen in Figure 5 using the formalism presented herein. We do however caution the reader that we expect the limited size of the DR3 sample to leads to large statistical errors, due to a significant shot–noise contribution because of their low number density. However, future cluster and galaxy samples (e.g., LRGs) should provide stronger constraints and provide a more robust test of these high bulk flow measurements in the literature.
-
-In Figure 5, we provide the best fit parameters $b$ and $v_p$ for the C4 correlation function presented in Figure 3 and there is as expected a clear anti-correlation between these two parameters because the anisotropic amplitude is generated by cross-correlations in the density and peculiar velocity fields. The best fit value from Figure 5 is $v_p = 270^{+433}$ km/s (at the $1\sigma$ level marginalised with other parameters including $b$) and is consistent with $v_p = 0$. We do not quote the negative bound of the error on $v_p$ as it is below zero and thus has no physical meaning. Instead, we quote the upper bound on $v_p$ and note that our result is consistent with zero. Our measurement of $v_p$ is close to the predicted value of 203 km/s for a WMAP5–normalised $\Lambda$CDM model.
-
-We propose above that $v_p$ is a complementary parameter for reporting such peculiar velocity measurements. The parameter $g_\Theta$, which is equivalent to $f\sigma_8$, is not determined precisely without the prior information of $A_S$. But when we report our measurement with $v_p$, there is no uncertainty due to other cosmological parameters which are not determined accurately, as it is equivalent to $g^*_\Theta$ determined statistically from redshift space distortion. The observed value $v_p$ at a given redshift is not only independent of bias but also independent of normalisation.
-
-## B. Reconstruction of matter density field from $v_p$
-
-We convert $v_p$ measurement into $g_\Theta$ using $A_S$ from WMAP5 ($g_\Theta$: coherent growth factor of peculiar velocity, and it is equivalent to $f\sigma_8$ in other parameterizations). With the evolution of $g_\Theta$ known, dynamics of perturbations are reconstructed to provide the history of $\Psi$ through the Euler equation. In most theoretical models, the time variation of $v_p$ is minimal at these low redshifts discussed here for the C4 sample ($z \simeq 0.1$), which allows us to ignore the time-derivative part in Eq. 9. Therefore, it is straightforward to transform the coherent evolution of $\Theta$ into the coherent evolution of $\Psi$. If we assume no anisotropic stress, then it is easy to convert to the coherent evolution of $\Phi$, $g_\Phi$.
-
-We are able to determine matter density fluctuations through the Poisson equation. We calculate the co",0.1348742697485395,". In doing the SVD, we select the dominant modes to contribute to the $\chi^2$ by requiring that $\lambda^2 > \sqrt{2/N_{jk}}$.
-
-In Figure 4, we rank the eigenvalues ($\lambda_i$) for the increasing eigenmodes and see a ""kink"" in the distribution which we interpret as indicating a transition in the signal–to–noise of the eigenmodes, i.e., only the first ten modes contain most of the signal, while higher-ordered modes are dominated by noise. We therefore remove eigenmodes beyond this kink (with $\lambda_i < 0.01$) where the eigenvalues start to flatten out.
-
-## A. Statistical determination of large scale flow
-
-As discussed in the Introduction, there is recent evidence for excessive bulk flow motions compared to the WMAP5-normalised ΛCDM model [18] and therefore, it is important to confirm these results as it may indicate evidence for an alternative explanation for the observed cosmic acceleration such as modified gravity. In this paper, we provide a first demonstration of our new parameterization using clusters of galaxies from the SDSS. In detail, we attempt to model the ""squashing"" of the 2-D correlation function of the C4 cluster sample seen in Figure 5 using the formalism presented herein. We do however caution the reader that we expect the limited size of the DR3 sample to leads to large statistical errors, due to a significant shot–noise contribution because of their low number density. However, future cluster and galaxy samples (e.g., LRGs) should provide stronger constraints and provide a more robust test of these high bulk flow measurements in the literature.
-
-In Figure 5, we provide the best fit parameters $b$ and $v_p$ for the C4 correlation function presented in Figure 3 and there is as expected a clear anti-correlation between these two parameters because the anisotropic amplitude is generated by cross-correlations in the density and peculiar velocity fields. The best fit value from Figure 5 is $v_p = 270^{+433}$ km/s (at the $1\sigma$ level marginalised with other parameters including $b$) and is consistent with $v_p = 0$. We do not quote the negative bound of the error on $v_p$ as it is below zero and thus has no physical meaning. Instead, we quote the upper bound on $v_p$ and note that our result is consistent with zero. Our measurement of $v_p$ is close to the predicted value of 203 km/s for a WMAP5–normalised ΛCDM model.
-
-We propose above that $v_p$ is a complementary parameter for reporting such peculiar velocity measurements. The parameter $g_{\Theta}$, which is equivalent to $f\sigma_8$, is not determined precisely without the prior information of $A_S$. But when we report our measurement with $v_p$, there is no uncertainty due to other cosmological parameters which are not determined accurately, as it is equivalent to $g_{\Theta}^*$ determined statistically from redshift space distortion. The observed value $v_p$ at a given redshift is not only independent of bias but also independent of normalisation.
-
-## B. Reconstruction of matter density field from vp
-
-We convert $v_p$ measurement into $g_{\Theta}$ using $A_s$ from WMAP5 ($g_{\Theta}$: coherent growth factor of peculiar velocity, and it is equivalent to $f\sigma_8$ in other parameterizations). With the evolution of $g_{\Theta}$ known, dynamics of perturbations are reconstructed to provide the history of $\Psi$ through the Euler equation. In most theoretical models, the time variation of $v_p$ is minimal at these low redshifts discussed here for the C4 sample ($z \approx 0.1$), which allows us to ignore the time-derivative part in Eq. 9. Therefore, it is straightforward to transform the coherent evolution of $\Theta$ into the coherent evolution of $\Psi$. If we assume no anisotropic stress, then it is easy to convert to the coherent evolution of $\Phi$, $g_{\Phi}$.
-
-We are able to determine matter density fluctuations through the Poisson equation. We calculate the coherent growth ",0.030734061468122936,"re U and V are orthogonal matrices that span the range and the null space of Cij and Dkl = λ[2] δkl, a diagonal matrix with singular values along the diagonal. In doing the SVD, we select the dominant modes to contribute to the χ[2] by requiring that λ[2] > �2/Njk.
-
-In Figure 4, we rank the eigenvalues (λi) for the increasing eigenmodes and see a “kink” in the distribution which we interpret as indicating a transition in the signal–to–noise of the eigenmodes, i.e., only the first ten modes contain most of the signal, while higher-ordered modes are dominated by noise. We therefore remove eigenmodes beyond this kink (with λi < 0.01) where the eigenvalues start to flatten out.
-
-## A. Statistical determination of large scale flow
-
-As discussed in the Introduction, there is recent evidence for excessive bulk flow motions compared to the WMAP5-normalised ΛCDM model [18] and therefore, it is important to confirm these results as it may indicate
-
-evidence for an alternative explanation for the observed cosmic acceleration such as modified gravity. In this paper, we provide a first demonstration of our new parameterization using clusters of galaxies from the SDSS. In detail, we attempt to model the “squashing” of the 2- D correlation function of the C4 cluster sample seen in Figure 5 using the formalism presented herein. We do however caution the reader that we expect the limited size of the DR3 sample to leads to large statistical errors, due to a significant shot–noise contribution because of their low number density. However, future cluster and galaxy samples (e.g., LRGs) should provide stronger constraints and provide a more robust test of these high bulk flow measurements in the literature.
-
-In Figure 5, we provide the best fit parameters b and vp for the C4 correlation function presented in Figure 3 and there is as expected a clear anti-correlation between these two parameters because the anisotropic amplitude is generated by cross-correlations in the density and peculiar velocity fields. The best fit value from Figure 5 is vp = 270[+433] km/s (at the 1σ level marginalised with other parameters including b) and is consistent with vp = 0. We do not quote the negative bound of the error on vp as it is below zero and thus has no physical meaning. Instead, we quote the upper bound on vp and note that our result is consistent with zero. Our measurement of vp is close to the predicted value of 203 km/s for a WMAP5–normalised ΛCDM model.
-
-We propose above that vp is a complementary parameter for reporting such peculiar velocity measurements. The parameter gΘ, which is equivalent to fσ8, is not determined precisely without the prior information of AS. But when we report our measurement with vp, there is no uncertainty due to other cosmological parameters which are not determined accurately, as it is equivalent to gΘ[∗] determined statistically from redshift space distortion. The observed value vp at a given redshift is not only independent of bias but also independent of normalisation.
-
-- B. Reconstruction of matter density field from vp
-
-We convert vp measurement into gΘ using As from WMAP5 (gΘ: coherent growth factor of peculiar velocity, and it is equivalent to fσ8 in other parameterizations). With the evolution of gΘ known, dynamics of perturbations are reconstructed to provide the history of Ψ through the Euler equation. In most theoretical models, the time variation of vp is minimal at these low redshifts discussed here for the C4 sample (z ≃ 0.1), which allows us to ignore the time-derivative part in Eq. 9. Therefore, it is straightforward to transform the coherent evolution of Θ into the coherent evolution of Ψ. If we assume no anisotropic stress, then it is easy to convert to the coherent evolution of Φ, gΦ.
-
-We are able to determine matter density fluctuations through the Poisson equation. We calculate the coherent growth of δm, gδ = 0.7, which is related t",0.06096012192024384,"re orthogonal matrices that span the range and the null space of C ij and D kl = λ 2 δ kl , a diagonal matrix with singular values along the diagonal. In doing the SVD, we select the dominant modes to contribute to the χ 2 by requiring that λ 2 > 2 /N jk .
-
-√ In Figure 4, we rank the eigenvalues ( λ i ) for the increasing eigenmodes and see a 'kink' in the distribution which we interpret as indicating a transition in the signal-to-noise of the eigenmodes, i.e., only the first ten modes contain most of the signal, while higher-ordered modes are dominated by noise. We therefore remove eigenmodes beyond this kink (with λ i < 0 . 01) where the eigenvalues start to flatten out.
-
-## A. Statistical determination of large scale flow
-
-As discussed in the Introduction, there is recent evidence for excessive bulk flow motions compared to the WMAP5-normalised ΛCDM model [18] and therefore, it is important to confirm these results as it may indicate evidence for an alternative explanation for the observed cosmic acceleration such as modified gravity. In this paper, we provide a first demonstration of our new parameterization using clusters of galaxies from the SDSS. In detail, we attempt to model the 'squashing' of the 2D correlation function of the C4 cluster sample seen in Figure 5 using the formalism presented herein. We do however caution the reader that we expect the limited size of the DR3 sample to leads to large statistical errors, due to a significant shot-noise contribution because of their low number density. However, future cluster and galaxy samples (e.g., LRGs) should provide stronger constraints and provide a more robust test of these high bulk flow measurements in the literature.
-
-In Figure 5, we provide the best fit parameters b and v p for the C4 correlation function presented in Figure 3 and there is as expected a clear anti-correlation between these two parameters because the anisotropic amplitude is generated by cross-correlations in the density and peculiar velocity fields. The best fit value from Figure 5 is v p = 270 +433 km/s (at the 1 σ level marginalised with other parameters including b ) and is consistent with v p = 0. We do not quote the negative bound of the error on v p as it is below zero and thus has no physical meaning. Instead, we quote the upper bound on v p and note that our result is consistent with zero. Our measurement of v p is close to the predicted value of 203 km/s for a WMAP5-normalised ΛCDM model.
-
-We propose above that v p is a complementary parameter for reporting such peculiar velocity measurements. The parameter g Θ , which is equivalent to fσ 8 , is not determined precisely without the prior information of A S . But when we report our measurement with v p , there is no uncertainty due to other cosmological parameters which are not determined accurately, as it is equivalent to g ∗ Θ determined statistically from redshift space distortion. The observed value v p at a given redshift is not only independent of bias but also independent of normalisation.
-
-## B. Reconstruction of matter density field from v p
-
-We convert v p measurement into g Θ using A s from WMAP5 ( g Θ : coherent growth factor of peculiar velocity, and it is equivalent to fσ 8 in other parameterizations). With the evolution of g Θ known, dynamics of perturbations are reconstructed to provide the history of Ψ through the Euler equation. In most theoretical models, the time variation of v p is minimal at these low redshifts discussed here for the C4 sample ( z /similarequal 0 . 1), which allows us to ignore the time-derivative part in Eq. 9. Therefore, it is straightforward to transform the coherent evolution of Θ into the coherent evolution of Ψ. If we assume no anisotropic stress, then it is easy to convert to the coherent evolution of Φ, g Φ .
-
-We are able to determine matter density fluctuations through the Poisson equation. We calculate the coherent grow",0.06096012192024384,"re orthogonal matrices that span the range and the null space of C ij and D kl = λ 2 δ kl , a diagonal matrix with singular values along the diagonal. In doing the SVD, we select the dominant modes to contribute to the χ 2 by requiring that λ 2 > 2 /N jk .
-
-√ In Figure 4, we rank the eigenvalues ( λ i ) for the increasing eigenmodes and see a 'kink' in the distribution which we interpret as indicating a transition in the signal-to-noise of the eigenmodes, i.e., only the first ten modes contain most of the signal, while higher-ordered modes are dominated by noise. We therefore remove eigenmodes beyond this kink (with λ i < 0 . 01) where the eigenvalues start to flatten out.
-
-## A. Statistical determination of large scale flow
-
-As discussed in the Introduction, there is recent evidence for excessive bulk flow motions compared to the WMAP5-normalised ΛCDM model [18] and therefore, it is important to confirm these results as it may indicate evidence for an alternative explanation for the observed cosmic acceleration such as modified gravity. In this paper, we provide a first demonstration of our new parameterization using clusters of galaxies from the SDSS. In detail, we attempt to model the 'squashing' of the 2D correlation function of the C4 cluster sample seen in Figure 5 using the formalism presented herein. We do however caution the reader that we expect the limited size of the DR3 sample to leads to large statistical errors, due to a significant shot-noise contribution because of their low number density. However, future cluster and galaxy samples (e.g., LRGs) should provide stronger constraints and provide a more robust test of these high bulk flow measurements in the literature.
-
-In Figure 5, we provide the best fit parameters b and v p for the C4 correlation function presented in Figure 3 and there is as expected a clear anti-correlation between these two parameters because the anisotropic amplitude is generated by cross-correlations in the density and peculiar velocity fields. The best fit value from Figure 5 is v p = 270 +433 km/s (at the 1 σ level marginalised with other parameters including b ) and is consistent with v p = 0. We do not quote the negative bound of the error on v p as it is below zero and thus has no physical meaning. Instead, we quote the upper bound on v p and note that our result is consistent with zero. Our measurement of v p is close to the predicted value of 203 km/s for a WMAP5-normalised ΛCDM model.
-
-We propose above that v p is a complementary parameter for reporting such peculiar velocity measurements. The parameter g Θ , which is equivalent to fσ 8 , is not determined precisely without the prior information of A S . But when we report our measurement with v p , there is no uncertainty due to other cosmological parameters which are not determined accurately, as it is equivalent to g ∗ Θ determined statistically from redshift space distortion. The observed value v p at a given redshift is not only independent of bias but also independent of normalisation.
-
-## B. Reconstruction of matter density field from v p
-
-We convert v p measurement into g Θ using A s from WMAP5 ( g Θ : coherent growth factor of peculiar velocity, and it is equivalent to fσ 8 in other parameterizations). With the evolution of g Θ known, dynamics of perturbations are reconstructed to provide the history of Ψ through the Euler equation. In most theoretical models, the time variation of v p is minimal at these low redshifts discussed here for the C4 sample ( z /similarequal 0 . 1), which allows us to ignore the time-derivative part in Eq. 9. Therefore, it is straightforward to transform the coherent evolution of Θ into the coherent evolution of Ψ. If we assume no anisotropic stress, then it is easy to convert to the coherent evolution of Φ, g Φ .
-
-We are able to determine matter density fluctuations through the Poisson equation. We calculate the coherent grow",8,science_sample
-9,0,"At first, we divide the whole region of redshift into 4 bins (i.e., m = 3), the divided points and boundaries are (0, z1, z2, 1.8, ∞), where z1 and z2 are left as free parameters of the model, and 0 < z1 < z2 < 1.8. In the fourth bin we set wL = −1. It means that we divide the region with z ∈(0, 1.8) into 3 bins and seek for two possible turning points of wde(z) in this region. The reconstructed wde of the best-fitted model is shown in Fig. 1,",False,0.020224719101123594,"rst, we divide the whole region of redshift into 4 bins (i.e., m = 3), the divided points and boundaries are (0, z1, z2, 1.8, ∞), where z1 and z2 are left as free parameters of the model, and 0 < z 1 < z 2 < 1.8. In the fourth bin we set wL = −1. It means that we divide the region with z ∈ (0, 1.8) into 3 bins and seek for two possible turning points of wde(z) in this region. The reconstructed wde of the best-fitted model is shown in Fig. 1,",0.23370786516853934,"rst, we divide the whole region of redshift into 4 bins (i.e., $m=3$ ), the divided points and boundaries are $(0, z_1, z_2, 1.8, \infty)$ , where $z_1$ and $z_2$ are left as free parameters of the model, and $0 < z_1 < z_2 < 1.8$ . In the fourth bin we set $w_L = -1$ . It means that we divide the region with $z \in (0, 1.8)$ into 3 bins and seek for two possible turning points of $w_{de}(z)$ in this region. The reconstructed $w",0.18202247191011237," we divide the whole region of redshift into 4 bins (i.e., $m = 3$), the divided points and boundaries are $(0, z_1, z_2, 1.8, \infty)$, where $z_1$ and $z_2$ are left as free parameters of the model, and $0 < z_1 < z_2 < 1.8$. In the fourth bin we set $w_L = -1$. It means that we divide the region with $z \in (0, 1.8)$ into 3 bins and seek for two possible turning points of $w_{de}(z)$ in this region. The reconstructed $w_{de}$ of the best-",0.36629213483146067,"
-At first, we divide the whole region of redshift into 4 bins (i.e., m = 3), the divided points and boundaries are (0, z1, z2, 1.8, ∞), where z1 and z2 are left as free parameters of the model, and 0 < z1 < z2 < 1.8. In the fourth bin we set wL = −1. It means that we divide the region with z ∈ (0, 1.8) into 3 bins and seek for two possible turning points of wde",0.017977528089887642,"At first, we divide the whole region of redshift into 4 bins (i.e., m = 3), the divided points and boundaries are (0, z1, z2, 1.8, ∞), where z1 and z2 are left as free parameters of the model, and 0 < z1 < z2 < 1.8. In the fourth bin we set wL = −1. It means that we divide the region with z ∈ (0, 1.8) into 3 bins and seek for two possible turning points of wde(z) in this region. The reconstructed wde of the best-fitted model is shown in Fig.",0.16404494382022472,"irst, we divide the whole region of redshift into 4 bins (i.e., m = 3), the divided points and boundaries are (0 , z 1 , z 2 , 1 . 8 , ∞ ), where z 1 and z 2 are left as free parameters of the model, and 0 < z 1 < z 2 < 1 . 8. In the fourth bin we set w L = -1. It means that we divide the region with z ∈ (0 , 1 . 8) into 3 bins and seek for two possible turning points of w de ( z ) in this region. The reconstructed w de of the best-",0.16404494382022472,"irst, we divide the whole region of redshift into 4 bins (i.e., m = 3), the divided points and boundaries are (0 , z 1 , z 2 , 1 . 8 , ∞ ), where z 1 and z 2 are left as free parameters of the model, and 0 < z 1 < z 2 < 1 . 8. In the fourth bin we set w L = -1. It means that we divide the region with z ∈ (0 , 1 . 8) into 3 bins and seek for two possible turning points of w de ( z ) in this region. The reconstructed w de of the best-",9,science_sample
-10,0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,False,0.0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,0.0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,0.0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,0.0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,0.0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,0.0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,0.0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,10,science_sample
-11,0,"Proof. We prove the lemma for the case of the CQ trade- offcurve. The proof for the CE trade-offcurve is similar. Let (C(t), Q(t)) for 0 ≤t ≤1 be a parametrization of the trade-offcurve with C(0) equal to the classical capacity and Q(1) equal to the quantum capacity. The function C (t) is monotonically decreasing and the function Q (t) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotonically decreasing.",False,0.05232558139534884,". We prove the lemma for the case of the CQ tradeoff curve. The proof for the CE trade-off curve is similar. Let (C (t), Q(t)) for 0 ≤ t ≤ 1 be a parametrization of the trade-off curve with C (0) equal to the classical capacity and Q(1) equal to the quantum capacity. The function C (t) is monotonically decreasing and the function Q (t) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotonically decrea",0.1511627906976744,"ve the lemma for the case of the CQ trade-off curve. The proof for the CE trade-off curve is similar. Let $(C(t), Q(t))$ for $0\le t\le 1$ be a parametrization of the trade-off curve with $C(0)$ equal to the classical capacity and $Q(1)$ equal to the quantum capacity. The function $C(t)$ is monotonically decreasing and the function $Q(t)$ is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monoto",0.10852713178294573,"ve the lemma for the case of the CQ trade-off curve. The proof for the CE trade-off curve is similar. Let $(C(t), Q(t))$ for $0 \le t \le 1$ be a parametrization of the trade-off curve with $C(0)$ equal to the classical capacity and $Q(1)$ equal to the quantum capacity. The function $C(t)$ is monotonically decreasing and the function $Q(t)$ is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotonically de",0.16279069767441862," lemma for the case of the CQ trade-off curve. The proof for the CE trade-off curve is similar. Let $$(C(t), Q(t))$$ for $$0 \leq t \leq 1$$ be a parametrization of the trade-off curve with $$C(0)$$ equal to the classical capacity and $$Q(1)$$ equal to the quantum capacity. The function $$C(t)$$ is monotonically decreasing and the function $$Q(t)$$ is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotoni",0.18023255813953487," of the CQ tradeoff curve. The proof for the CE trade-off curve is similar. Let ( _C_ ( _t_ ) _, Q_ ( _t_ )) for 0 _≤ t ≤_ 1 be a parametrization of the trade-off curve with _C_ (0) equal to the classical capacity and _Q_ (1) equal to the quantum capacity. The function _C_ ( _t_ ) is monotonically decreasing and the function _Q_ ( _t_ ) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotonically decrea",0.09496124031007752,"oof. We prove the lemma for the case of the CQ tradeoff curve. The proof for the CE trade-off curve is similar. Let ( C ( t ) , Q ( t )) for 0 ≤ t ≤ 1 be a parametrization of the trade-off curve with C (0) equal to the classical capacity and Q (1) equal to the quantum capacity. The function C ( t ) is monotonically decreasing and the function Q ( t ) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monoto",0.09496124031007752,"oof. We prove the lemma for the case of the CQ tradeoff curve. The proof for the CE trade-off curve is similar. Let ( C ( t ) , Q ( t )) for 0 ≤ t ≤ 1 be a parametrization of the trade-off curve with C (0) equal to the classical capacity and Q (1) equal to the quantum capacity. The function C ( t ) is monotonically decreasing and the function Q ( t ) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monoto",11,science_sample
-11,1,"If (C(t), Q(t)) is a point on the graph at which the deriva- tive is not constant, then setting −λ to be the slope of the graph will lead to Eq. (C1) being satisfied. If the graph is not differentiable at (C(t), Q(t)), then the slope must drop discontinuously at that point. Setting −λ to any value in the gap will again lead to the condition being satisfied. At points where the graph is differentiable but the slope is constant, λ might not be a good parameter. These points, however, are in the convex hull of the points that λ does parametrize. Appendix D: Form of the CQ Trade-offCurve for Qubit Dephasing Channels We first prove two important lemmas and then prove a theorem that gives the exact form of the CQ trade-off curve. Lemma 12 Let N be a generalized dephasing channel. In the optimization task for the CQ trade-offcurve, it suffices to consider a classical-quantum state with diag- onal conditional density operators, in the sense that the following inequality holds:",False,0.05858170606372045,"s a point on the graph at which the derivative is not constant, then setting −λ to be the slope of the graph will lead to Eq. (C1) being satisfied. If the graph is not differentiable at (C (t), Q(t)), then the slope must drop discontinuously at that point. Setting −λ to any value in the gap will again lead to the condition being satisfied.
-
-At points where the graph is differentiable but the slope is constant, λ might not be a good parameter. These points, however, are in the convex hull of the points that λ does parametrize.
-
-## Appendix D: Form of the CQ Trade-off Curve for Qubit Dephasing Channels
-
-We first prove two important lemmas and then prove a theorem that gives the exact form of the CQ trade-off curve.
-
-Lemma 12 Let N be a generalized dephasing channel. In the optimization task for the CQ trade-off curve, it
-
-suffices to consider a classical-quantum state with diagonal conditional density operators, in the sense that the following inequality hold",0.19527235354573483,"graph at which the derivative is not constant, then setting $-\lambda$ to be the slope of the graph will lead to Eq. (C1) being satisfied. If the graph is not differentiable at $(C(t), Q(t))$ , then the slope must drop discontinuously at that point. Setting $-\lambda$ to any value in the gap will again lead to the condition being satisfied. ■
-
-At points where the graph is differentiable but the slope is constant, $\lambda$ might not be a good parameter. These points, however, are in the convex hull of the points that $\lambda$ does parametrize.
-
-# Appendix D: Form of the CQ Trade-off Curve for Qubit Dephasing Channels
-
-We first prove two important lemmas and then prove a theorem that gives the exact form of the CQ trade-off curve.
-
-**Lemma 12** *Let $\mathcal{N}$ be a generalized dephasing channel. In the optimization task for the CQ trade-off curve, it*
-
-*suffices to consider a classical-quantum state with diagonal conditional density operators, i",0.19013360739979446,"tive is not constant, then setting $-\lambda$ to be the slope of the graph will lead to Eq. (C1) being satisfied. If the graph is not differentiable at $(C(t), Q(t))$, then the slope must drop discontinuously at that point. Setting $-\lambda$ to any value in the gap will again lead to the condition being satisfied. $\blacksquare$
-
-At points where the graph is differentiable but the slope is constant, $\lambda$ might not be a good parameter. These points, however, are in the convex hull of the points that $\lambda$ does parametrize.
-
-## Appendix D: Form of the CQ Trade-off Curve for Qubit Dephasing Channels
-
-We first prove two important lemmas and then prove a theorem that gives the exact form of the CQ trade-off curve.
-
-**Lemma 12** Let $\mathcal{N}$ be a generalized dephasing channel. In the optimization task for the CQ trade-off curve, it suffices to consider a classical-quantum state with diagonal conditional density operators, in the sense that the follow",0.1880781089414183," derivative is not constant, then setting $$-\lambda$$ to be the slope of the graph will lead to Eq. (C1) being satisfied. If the graph is not differentiable at $$(C(t), Q(t))$$, then the slope must drop discontinuously at that point. Setting $$-\lambda$$ to any value in the gap will again lead to the condition being satisfied. ■
-
-At points where the graph is differentiable but the slope is constant, $$\lambda$$ might not be a good parameter. These points, however, are in the convex hull of the points that $$\lambda$$ does parametrize.
-
-## Appendix D: Form of the CQ Trade-off Curve for Qubit Dephasing Channels
-
-We first prove two important lemmas and then prove a theorem that gives the exact form of the CQ trade-off curve.
-
-**Lemma 12** Let $$\mathcal{N}$$ be a generalized dephasing channel. In the optimization task for the CQ trade-off curve, it suffices to consider a classical-quantum state with diagonal conditional density operators, in the sense that the ",0.13257965056526208,"e graph at which the derivative is not constant, then setting _−λ_ to be the slope of the graph will lead to Eq. (C1) being satisfied. If the graph is not differentiable at ( _C_ ( _t_ ) _, Q_ ( _t_ )), then the slope must drop discontinuously at that point. Setting _−λ_ to any value in the gap will again lead to the condition being satisfied.
-
-At points where the graph is differentiable but the slope is constant, _λ_ might not be a good parameter. These points, however, are in the convex hull of the points that _λ_ does parametrize.
-
-## **Appendix D: Form of the CQ Trade-off Curve for Qubit Dephasing Channels**
-
-We first prove two important lemmas and then prove a theorem that gives the exact form of the CQ trade-off curve.
-
-**Lemma 12** _Let N be a generalized dephasing channel. In the optimization task for the CQ trade-off curve, it_
-
-_suffices to consider a classical-quantum state with diagonal conditional density operators, in the sense that the fol",0.0698869475847893,")) is a point on the graph at which the derivative is not constant, then setting -λ to be the slope of the graph will lead to Eq. (C1) being satisfied. If the graph is not differentiable at ( C ( t ) , Q ( t )), then the slope must drop discontinuously at that point. Setting -λ to any value in the gap will again lead to the condition being satisfied.
-
-At points where the graph is differentiable but the slope is constant, λ might not be a good parameter. These points, however, are in the convex hull of the points that λ does parametrize.
-
-## Appendix D: Form of the CQ Trade-off Curve for Qubit Dephasing Channels
-
-We first prove two important lemmas and then prove a theorem that gives the exact form of the CQ trade-off curve.
-
-Lemma 12 Let N be a generalized dephasing channel. In the optimization task for the CQ trade-off curve, it suffices to consider a classical-quantum state with diagonal conditional density operators, in the sense that the following inequal",0.0698869475847893,")) is a point on the graph at which the derivative is not constant, then setting -λ to be the slope of the graph will lead to Eq. (C1) being satisfied. If the graph is not differentiable at ( C ( t ) , Q ( t )), then the slope must drop discontinuously at that point. Setting -λ to any value in the gap will again lead to the condition being satisfied.
-
-At points where the graph is differentiable but the slope is constant, λ might not be a good parameter. These points, however, are in the convex hull of the points that λ does parametrize.
-
-## Appendix D: Form of the CQ Trade-off Curve for Qubit Dephasing Channels
-
-We first prove two important lemmas and then prove a theorem that gives the exact form of the CQ trade-off curve.
-
-Lemma 12 Let N be a generalized dephasing channel. In the optimization task for the CQ trade-off curve, it suffices to consider a classical-quantum state with diagonal conditional density operators, in the sense that the following inequal",11,science_sample
-12,0,"Figure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlations.",False,0.005807200929152149,"igure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlations",0.005807200929152149,"igure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlations",0.010452961672473868,"igure 5: Partition degeneracy and correlation with excursion count.** (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlatio",0.010452961672473868,"re 5: Partition degeneracy and correlation with excursion count.** (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlations.",0.005807200929152149,"Figure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlation",0.005807200929152149,"Figure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlation",0.005807200929152149,"Figure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlation",12,science_sample
-12,1,"Figure 6: Default mode network dissociates during mass-excursions. A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during non- excursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN.",False,0.005194805194805195,"Figure 6: Default mode network dissociates during mass-excursions. A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during nonexcursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN.",0.011688311688311689,"Figure 6: Default mode network dissociates during mass-excursions. A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during non-excursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B to identify regions that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN.",0.016883116883116882,"Figure 6: Default mode network dissociates during mass-excursions.** A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during non-excursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN.
-
-4",0.00909090909090909,"igure 6: Default mode network dissociates during mass-excursions.** A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during non-excursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN",0.006493506493506494,"Figure 6: Default mode network dissociates during mass-excursions. A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during nonexcursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN. ",0.006493506493506494,"Figure 6: Default mode network dissociates during mass-excursions. A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during nonexcursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN.
-",0.006493506493506494,"Figure 6: Default mode network dissociates during mass-excursions. A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during nonexcursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN.
-",12,science_sample
-14,0,"information between adjacent tokens in the data. This corre- sponds to maximizing the likelihood of the data assuming a bigram model. The benefit of using word classes is that the resulting language model can have fewer parameters than a word-based n-gram model. In our case, the in-domain training text is so small that it can be a real advantage to have fewer parameters to learn in the language model. The problem is that if the data is too small to reliably estimate word transition probabilities (p(wi|wi−1)), then it will also be difficult to learn a good partitioning of the words into classes. Our hypothesis is that the advantage in learning the word class assignments on the Twitter data, which solves the data sparsity problem, outweighs any performance penalty that is incurred due to domain mis-match. This differs from the traditional approach where the class assignments (wi ∈cj) are learned from the same training text which is used to estimate the class transition probabilities (p(ci|ci−1)) and the word probabilities (p(wi|cj)). Twitter data, in these experiments, refers to the concatenation of the text downloaded from Twitter with our in-domain data for the reasons described above. The experiments in Section IV-C will compare learning the class assignments on out-of-domain data (hybrid method) to the traditional approach (baseline). IV. EXPERIMENTS A. Experimental Data The in-domain data used in the experiments in this paper comes from the IARPA Babel program.1 This program focuses on keyword search for low-resource languages. The languages are low resource in the sense that they have fewer native speakers than the languages receiving the most attention from researchers and also in the sense that the provided training data is small in comparison to what is typically used. We exclusively focused on the so-called limited language pack, which consists of only ten hours of recorded telephone conver- sations. Our experiments were conducted using the Bengali, Tamil, Turkish and Zulu languages. The languages that we selected for our experiments have the largest vocabulary sizes (See Table I) of the languages in the Babel program and thus suffer the most from the data sparsity problem. As a point of comparison, Tagalog, which was not used in our experiments, has one third as many vocabulary items as Tamil.",False,0.01794105083297736,"tion between adjacent tokens in the data. This corre sponds to maximizing the likelihood of the data assuming a bigram model.
-
-The benefit of using word classes is that the resulting language model can have fewer parameters than a word-based n-gram model. In our case, the in-domain training text is so small that it can be a real advantage to have fewer parameters to learn in the language model. The problem is that if the data is too small to reliably estimate word transition probabilities (p(wi|wi-1)), then it will also be difficult to learn a good partitioning of the words into classes.
-
-Our hypothesis is that the advantage in learning the word class assignments on the Twitter data, which solves the data sparsity problem, outweighs any performance penalty that is incurred due to domain mis-match. This differs from the traditional approach where the class assignments (wi ∈ cj ) are learned from the same training text which is used to estimate the class transition probabilities (p(ci|ci−1)) and the word probabilities (p(wi|cj )). Twitter data, in these experiments, refers to the concatenation of the text downloaded from Twitter with our in-domain data for the reasons described above. The experiments in Section IV-C will compare learning the class assignments on out-of-domain data (hybrid method) to the traditional approach (baseline).
-
-## IV. EXPERIMENTS
-
-## A. Experimental Data
-
-The in-domain data used in the experiments in this paper comes from the IARPA Babel program. This program focuses on keyword search for low-resource languages. The languages are low resource in the sense that they have fewer native speakers than the languages receiving the most attention from researchers and also in the sense that the provided training data is small in comparison to what is typically used. We
-
-exclusively focused on the so-called limited language pack, which consists of only ten hours of recorded telephone conver- sations. Our experiments were conducted using the Bengali, Tamil, Turkish and Zulu languages. The languages that we selected for our experiments have the largest vocabulary sizes (See Table I) of the languages in the Babel program and thus suffer the most from the data sparsity problem. As a point of comparison, Tagalog, which was not used in our experiments, has one third as many vocabulary items ",0.11020931225971807,"hood of the data assuming a bigram model.
-
-The benefit of using word classes is that the resulting language model can have fewer parameters than a word-based n-gram model. In our case, the in-domain training text is so small that it can be a real advantage to have fewer parameters to learn in the language model. The problem is that if the data is too small to reliably estimate word transition probabilities ( $p(w_i|w_{i-1})$ ), then it will also be difficult to learn a good partitioning of the words into classes.
-
-Our hypothesis is that the advantage in learning the word class assignments on the Twitter data, which solves the data sparsity problem, outweighs any performance penalty that is incurred due to domain mis-match. This differs from the traditional approach where the class assignments ( $w_i\in c_j$ ) are learned from the same training text which is used to estimate the class transition probabilities ( $p(c_i|c_{i-1})$ ) and the word probabilities ( $p(w_i|c_j)$ ). Twitter data, in these experiments, refers to the concatenation of the text downloaded from Twitter with our in-domain data for the reasons described above. The experiments in Section IV-C will compare learning the class assignments on out-of-domain data (hybrid method) to the traditional approach (baseline).
-
-# IV. EXPERIMENTS
-
-## A. Experimental Data
-
-The in-domain data used in the experiments in this paper comes from the IARPA Babel program.1 This program focuses on keyword search for low-resource languages. The languages are low resource in the sense that they have fewer native speakers than the languages receiving the most attention from researchers and also in the sense that the provided training data is small in comparison to what is typically used. We
-
-1
-
-exclusively focused on the so-called limited language pack, which consists of only ten hours of recorded telephone conversations. Our experiments were conducted using the Bengali, Tamil, Turkish and Zulu languages. The languages that we selected for our experiments have the largest vocabulary sizes (See Table I) of the languages in the Babel program and thus suffer the most from the data sparsity problem. As a point of comparison, Tagalog, which was not used in our experiments, has one third as m",0.037590773173857325,"information between adjacent tokens in the data. This corresponds to maximizing the likelihood of the data assuming a bigram model.
-
-The benefit of using word classes is that the resulting language model can have fewer parameters than a word-based n-gram model. In our case, the in-domain training text is so small that it can be a real advantage to have fewer parameters to learn in the language model. The problem is that if the data is too small to reliably estimate word transition probabilities ($p(w_i|w_{i-1})$), then it will also be difficult to learn a good partitioning of the words into classes.
-
-Our hypothesis is that the advantage in learning the word class assignments on the Twitter data, which solves the data sparsity problem, outweighs any performance penalty that is incurred due to domain mis-match. This differs from the traditional approach where the class assignments ($w_i \in c_j$) are learned from the same training text which is used to estimate the class transition probabilities ($p(c_i|c_{i-1})$) and the word probabilities ($p(w_i|c_j)$). Twitter data, in these experiments, refers to the concatenation of the text downloaded from Twitter with our in-domain data for the reasons described above. The experiments in Section IV-C will compare learning the class assignments on out-of-domain data (hybrid method) to the traditional approach (baseline).
-
-## IV. EXPERIMENTS
-
-### A. Experimental Data
-
-The in-domain data used in the experiments in this paper comes from the IARPA Babel program.[^1] This program focuses on keyword search for low-resource languages. The languages are low resource in the sense that they have fewer native speakers than the languages receiving the most attention from researchers and also in the sense that the provided training data is small in comparison to what is typically used. We exclusively focused on the so-called limited language pack, which consists of only ten hours of recorded telephone conversations. Our experiments were conducted using the Bengali, Tamil, Turkish and Zulu languages. The languages that we selected for our experiments have the largest vocabulary sizes (See Table I) of the languages in the Babel program and thus suffer the most from the data sparsity problem. As a point of comparison, Tagalog, which was not used in our experiments, has one thir",0.05126014523707817,"is corresponds to maximizing the likelihood of the data assuming a bigram model.
-
-The benefit of using word classes is that the resulting language model can have fewer parameters than a word-based n-gram model. In our case, the in-domain training text is so small that it can be a real advantage to have fewer parameters to learn in the language model. The problem is that if the data is too small to reliably estimate word transition probabilities ($$p(w_i|w_{i-1})$$), then it will also be difficult to learn a good partitioning of the words into classes.
-
-Our hypothesis is that the advantage in learning the word class assignments on the Twitter data, which solves the data sparsity problem, outweighs any performance penalty that is incurred due to domain mis-match. This differs from the traditional approach where the class assignments ($$w_i \in c_j$$) are learned from the same training text which is used to estimate the class transition probabilities ($$p(c_i|c_{i-1})$$) and the word probabilities ($$p(w_i|c_j)$$). Twitter data, in these experiments, refers to the concatenation of the text downloaded from Twitter with our in-domain data for the reasons described above. The experiments in Section IV-C will compare learning the class assignments on out-of-domain data (hybrid method) to the traditional approach (baseline).
-
-## IV. EXPERIMENTS
-
-### A. Experimental Data
-
-The in-domain data used in the experiments in this paper comes from the IARPA Babel program.1 This program focuses on keyword search for low-resource languages. The languages are low resource in the sense that they have fewer native speakers than the languages receiving the most attention from researchers and also in the sense that the provided training data is small in comparison to what is typically used. We exclusively focused on the so-called limited language pack, which consists of only ten hours of recorded telephone conversations. Our experiments were conducted using the Bengali, Tamil, Turkish and Zulu languages. The languages that we selected for our experiments have the largest vocabulary sizes (See Table I) of the languages in the Babel program and thus suffer the most from the data sparsity problem. As a point of comparison, Tagalog, which was not used in our experiments, has one third as many vocabulary items as Tamil",0.09568560444254592,"kelihood of the data assuming a bigram model.
-
-The benefit of using word classes is that the resulting language model can have fewer parameters than a word-based n-gram model. In our case, the in-domain training text is so small that it can be a real advantage to have fewer parameters to learn in the language model. The problem is that if the data is too small to reliably estimate word transition probabilities ( _p_ ( _wi|wi−_ 1)), then it will also be difficult to learn a good partitioning of the words into classes.
-
-Our hypothesis is that the advantage in learning the word class assignments on the Twitter data, which solves the data sparsity problem, outweighs any performance penalty that is incurred due to domain mis-match. This differs from the traditional approach where the class assignments ( _wi ∈ cj_ ) are learned from the same training text which is used to estimate the class transition probabilities ( _p_ ( _ci|ci−_ 1)) and the word probabilities ( _p_ ( _wi|cj_ )). Twitter data, in these experiments, refers to the concatenation of the text downloaded from Twitter with our in-domain data for the reasons described above. The experiments in Section IV-C will compare learning the class assignments on out-of-domain data (hybrid method) to the traditional approach (baseline).
-
-## IV. EXPERIMENTS
-
-## _A. Experimental Data_
-
-The in-domain data used in the experiments in this paper comes from the IARPA Babel program.[1] This program focuses on keyword search for low-resource languages. The languages are low resource in the sense that they have fewer native speakers than the languages receiving the most attention from researchers and also in the sense that the provided training data is small in comparison to what is typically used. We
-
-1http://www.iarpa.gov/index.php/research-programs/babel
-
-exclusively focused on the so-called limited language pack, which consists of only ten hours of recorded telephone conversations. Our experiments were conducted using the Bengali, Tamil, Turkish and Zulu languages. The languages that we selected for our experiments have the largest vocabulary sizes (See Table I) of the languages in the Babel program and thus suffer the most from the data sparsity problem. As a point of comparison, Tagalog, which was not used in our experiments, has one third as many vocab",0.09440410081161897,"information between adjacent tokens in the data. This corresponds to maximizing the likelihood of the data assuming a bigram model.
-
-The benefit of using word classes is that the resulting language model can have fewer parameters than a word-based n-gram model. In our case, the in-domain training text is so small that it can be a real advantage to have fewer parameters to learn in the language model. The problem is that if the data is too small to reliably estimate word transition probabilities ( p ( w i | w i -1 ) ), then it will also be difficult to learn a good partitioning of the words into classes.
-
-Our hypothesis is that the advantage in learning the word class assignments on the Twitter data, which solves the data sparsity problem, outweighs any performance penalty that is incurred due to domain mis-match. This differs from the traditional approach where the class assignments ( w i ∈ c j ) are learned from the same training text which is used to estimate the class transition probabilities ( p ( c i | c i -1 ) ) and the word probabilities ( p ( w i | c j ) ). Twitter data, in these experiments, refers to the concatenation of the text downloaded from Twitter with our in-domain data for the reasons described above. The experiments in Section IV-C will compare learning the class assignments on out-of-domain data (hybrid method) to the traditional approach (baseline).
-
-## IV. EXPERIMENTS
-
-## A. Experimental Data
-
-The in-domain data used in the experiments in this paper comes from the IARPA Babel program. 1 This program focuses on keyword search for low-resource languages. The languages are low resource in the sense that they have fewer native speakers than the languages receiving the most attention from researchers and also in the sense that the provided training data is small in comparison to what is typically used. We
-
-1 http://www.iarpa.gov/index.php/research-programs/babel
-
-exclusively focused on the so-called limited language pack, which consists of only ten hours of recorded telephone conversations. Our experiments were conducted using the Bengali, Tamil, Turkish and Zulu languages. The languages that we selected for our experiments have the largest vocabulary sizes (See Table I) of the languages in the Babel program and thus suffer the most from the data sparsity problem. As a point of compa",0.09440410081161897,"information between adjacent tokens in the data. This corresponds to maximizing the likelihood of the data assuming a bigram model.
-
-The benefit of using word classes is that the resulting language model can have fewer parameters than a word-based n-gram model. In our case, the in-domain training text is so small that it can be a real advantage to have fewer parameters to learn in the language model. The problem is that if the data is too small to reliably estimate word transition probabilities ( p ( w i | w i -1 ) ), then it will also be difficult to learn a good partitioning of the words into classes.
-
-Our hypothesis is that the advantage in learning the word class assignments on the Twitter data, which solves the data sparsity problem, outweighs any performance penalty that is incurred due to domain mis-match. This differs from the traditional approach where the class assignments ( w i ∈ c j ) are learned from the same training text which is used to estimate the class transition probabilities ( p ( c i | c i -1 ) ) and the word probabilities ( p ( w i | c j ) ). Twitter data, in these experiments, refers to the concatenation of the text downloaded from Twitter with our in-domain data for the reasons described above. The experiments in Section IV-C will compare learning the class assignments on out-of-domain data (hybrid method) to the traditional approach (baseline).
-
-## IV. EXPERIMENTS
-
-## A. Experimental Data
-
-The in-domain data used in the experiments in this paper comes from the IARPA Babel program. 1 This program focuses on keyword search for low-resource languages. The languages are low resource in the sense that they have fewer native speakers than the languages receiving the most attention from researchers and also in the sense that the provided training data is small in comparison to what is typically used. We
-
-1 http://www.iarpa.gov/index.php/research-programs/babel
-
-exclusively focused on the so-called limited language pack, which consists of only ten hours of recorded telephone conversations. Our experiments were conducted using the Bengali, Tamil, Turkish and Zulu languages. The languages that we selected for our experiments have the largest vocabulary sizes (See Table I) of the languages in the Babel program and thus suffer the most from the data sparsity problem. As a point of compa",14,science_sample
-14,1,"We performed data collection and language model train- ing experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.",False,0.002242152466367713,"We performed data collection and language model train ing experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.",0.008968609865470852,"
-We performed data collection and language model training experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.
-",0.008968609865470852,"
-We performed data collection and language model training experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.
-",0.008968609865470852,"
-
-We performed data collection and language model training experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.",0.008968609865470852,"
-
-We performed data collection and language model training experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.",0.008968609865470852,"
-We performed data collection and language model training experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.
-",0.008968609865470852,"
-We performed data collection and language model training experiments on the Bengali, Tamil, Turkish and Zulu languages. We were able to collect useful data for each of the four languages as seen in Table II. The data collection experiment was especially successful for Turkish and Bengali. For both of those languages the interpolation weight given to the Twitter LM was over 20% and the corresponding reduction in perplexity was more than 12%.
-",14,science_sample
-14,2,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",False,0.0,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",0.0,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",0.0,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",0.0,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",0.0,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",0.0,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",0.0,"A large amount of data was also collected for Zulu and Tamil although the perplexity reduction was not as large as it was for Bengali and Turkish. There are a few possible explanations for this outcome. Both Zulu and Tamil have larger vocabularies (See Table I) than the other languages, which",14,science_sample
-15,0,"web text sources for conversational speech language modeling using class-dependent mixtures,” in Proc. HLT/NAACL, 2003, pp. 7–9. [5] S. Schwarm, I. Bulyko, and M. Ostendorf, “Adaptive language modeling with varied sources to cover new vocabulary items,” IEEE Trans. Speech and Audio, vol. 12, no. 3, pp. 334–342, 2004. [6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, “Web resources for language modeling in conversational speech recognition,” ACM Transactions on Speech and Language Processing, vol. 5, no. 1, pp. 1–xx, 2007. [7] A. Sethy, P. Georgiou, and S. Narayanan, “Building topic-specific language models from webdata using competitive models,” in Proc. Interspeech, 2005, pp. 1293–1296. [8] R. Sarikaya, A. Gravano, and Y. Gao, “Rapid language model develop- ment using external resources for new spoken dialog domains,” in Proc. ICASSP, vol. I, 2005, pp. 573–576. [9] K. Yoshino, S. Mori, and T. Kawahara, “Incorporating semantic infor- mation to selection of web texts for language model of spoken dialogue system,” in Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on, May 2013, pp. 8252–8256. [10] R. Moore and W. Lewis, “Intelligent selection of language model training,” in Proc. ACL, 2010. [11] A. Axelrod, X. He, and J. Gao, “Domain adaptation via pseudo in- domain data selection,” in Proc. EMNLP, 2011. [12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, “Supervised and unsupervised web-based language model domain adaptation,” in Proc. Interspeech, 2012. [13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, “Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,” in Proc. Interspeech, 2013. [14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mer- cer, “Class-based n-gram models of natural language,” Computational Linguistics, vol. 18, no. 4, pp. 467–479, 1992. [15] R. Iyer and M. Ostendorf, “Transforming out-of-domain estimates to improve in-domain language models,” in Proc. Eurospeech, vol. 4, 1997, pp. 1975–1978. [16] A. Stolcke, “SRILM – an extensible language modeling toolkit,” in Proc. ICSLP, 2002, pp. 901–904. [17] P. Liang, “Semi-supervised learning for natural language,” Ph.D. disser- tation, Massachusetts Institute of Technology, 2005. [18] I. H. Witten and T. Bell, “The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,” Information Theory, IEEE Transactions on, vol. 37, no. 4, pp. 1085–1094, 1991. [19] J. Cho, H. Garcia-Molina, and L. Page, “Efficient crawling through url ordering,” Comput. Netw. ISDN Syst., vol. 30, no. 1-7, pp. 161–172, 1998. [Online]. Available: http://dx.doi.org/10.1016/S0169-7552(98) 00108-1 [20] A. Liaw and M. Wiener, “Classification and regression by randomforest,” R News, vol. 2, no. 3, pp. 18–22, 2002. [Online]. Available: http://CRAN.R-project.org/doc/Rnews/",False,0.021283899759697907,"or conversational speech language modeling using class-dependent mixtures,” in Proc. HLT/NAACL, 2003, pp. 7–9.
-
-[5] S. Schwarm, I. Bulyko, and M. Ostendorf, “Adaptive language modeling with varied sources to cover new vocabulary items,” IEEE Trans. Speech and Audio, vol. 12, no. 3, pp. 334–342, 2004.
-
-[6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, “Web resources for language modeling in conversational speech recognition,” ACM Transactions on Speech and Language Processing, vol. 5, no. 1, pp. 1–xx, 2007.
-
-[7] A. Sethy, P. Georgiou, and S. Narayanan, “Building topic-specific language models from webdata using competitive models,” in Proc. Interspeech, 2005, pp. 1293–1296.
-
-[8] R. Sarikaya, A. Gravano, and Y. Gao, “Rapid language model develop ment using external resources for new spoken dialog domains,” in Proc. ICASSP, vol. I, 2005, pp. 573–576.
-
-[9] K. Yoshino, S. Mori, and T. Kawahara, “Incorporating semantic infor mation to selection of web texts for language model of spoken dialogue system,” in Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on, May 2013, pp. 8252–8256.
-
-[10] R. Moore and W. Lewis, “Intelligent selection of language model training,” in Proc. ACL, 2010.
-
-[11] A. Axelrod, X. He, and J. Gao, “Domain adaptation via pseudo in domain data selection,” in Proc. EMNLP, 2011.
-
-[12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, “Supervised and unsupervised web-based language model domain adaptation,” in Proc. Interspeech, 2012.
-
-[13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, “Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,” in Proc. Interspeech, 2013.
-
-[14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mer cer, “Class-based n-gram models of natural language,” Computational Linguistics, vol. 18, no. 4, pp. 467–479, 1992.
-
-[15] R. Iyer and M. Ostendorf, “Transforming out-of-domain estimates to improve in-domain language models,” in Proc. Eurospeech, vol. 4, 1997, pp. 1975–1978.
-
-[16] A. Stolcke, “SRILM – an extensible language modeling toolkit,” in Proc. ICSLP, 2002, pp. 901–904.
-
-[17] P. Liang, “Semi-supervised learning for natural language,” Ph.D. disser tation, Massachusetts Institute of Technology, 2005.
-
-[18] I. H. Witten and T. Bell, “The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,” Information Theory, IEEE Transactions on, vol. 37, no. 4, pp. 1085–1094, 1991.
-
-[19] J. Cho, H. Garcia-Molina, and L. Page, “Efficient crawling through url ordering,” Comput. Netw. ISDN Syst., vol. 30, no. 1-7, pp. 161–172, 1998. [Online]. Available: http://dx.doi.org/10.1016/S0169-7552(98) 00108-1
-
-[20] A. Liaw and M. Wiener, “Classification and regression by randomforest,” R News, vol. 2, no. 3, pp. 18–22, 2002. [Online]. Available: http://CRAN.R-project.org/doc/Rnews",0.07689667009955373,"eb text sources for conversational speech language modeling using class-dependent mixtures,” in *Proc. HLT/NAACL*, 2003, pp. 7–9.
-
-[5] S. Schwarm, I. Bulyko, and M. Ostendorf, “Adaptive language modeling with varied sources to cover new vocabulary items,” *IEEE Trans. Speech and Audio*, vol. 12, no. 3, pp. 334–342, 2004.
-
-[6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, “Web resources for language modeling in conversational speech recognition,” *ACM Transactions on Speech and Language Processing*, vol. 5, no. 1, pp. 1–xx, 2007.
-
-[7] A. Sethy, P. Georgiou, and S. Narayanan, “Building topic-specific language models from webdata using competitive models,” in *Proc. Interspeech*, 2005, pp. 1293–1296.
-
-[8] R. Sarikaya, A. Gravano, and Y. Gao, “Rapid language model development using external resources for new spoken dialog domains,” in *Proc. ICASSP*, vol. I, 2005, pp. 573–576.
-
-[9] K. Yoshino, S. Mori, and T. Kawahara, “Incorporating semantic information to selection of web texts for language model of spoken dialogue system,” in *Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on*, May 2013, pp. 8252–8256.
-
-[10] R. Moore and W. Lewis, “Intelligent selection of language model training,” in *Proc. ACL*, 2010.
-
-[11] A. Axelrod, X. He, and J. Gao, “Domain adaptation via pseudo in-domain data selection,” in *Proc. EMNLP*, 2011.
-
-[12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, “Supervised and unsupervised web-based language model domain adaptation,” in *Proc. Interspeech*, 2012.
-
-[13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, “Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,” in *Proc. Interspeech*, 2013.
-
-[14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mercer, “Class-based n-gram models of natural language,” *Computational Linguistics*, vol. 18, no. 4, pp. 467–479, 1992.
-
-[15] R. Iyer and M. Ostendorf, “Transforming out-of-domain estimates to improve in-domain language models,” in *Proc. Eurospeech*, vol. 4, 1997, pp. 1975–1978.
-
-[16] A. Stolcke, “SRILM – an extensible language modeling toolkit,” in *Proc. ICSLP*, 2002, pp. 901–904.
-
-[17] P. Liang, “Semi-supervised learning for natural language,” Ph.D. dissertation, Massachusetts Institute of Technology, 2005.
-
-[18] I. H. Witten and T. Bell, “The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,” *Information Theory, IEEE Transactions on*, vol. 37, no. 4, pp. 1085–1094, 1991.
-
-[19] J. Cho, H. Garcia-Molina, and L. Page, “Efficient crawling through url ordering,” *Comput. Netw. ISDN Syst.*, vol. 30, no. 1-7, pp. 161–172, 1998. [Online]. Available: [http://dx.doi.org/10.1016/S0169-7552\(98\)00108-1](http://dx.doi.org/10.1016/S0169-7552(98)00108-1)
-
-[20] A. Liaw and M. Wiener, “Classification and regression by randomforest,” *R New",0.05149330587023687,"web text sources for conversational speech language modeling using class-dependent mixtures,” in *Proc. HLT/NAACL*, 2003, pp. 7–9.
-
-## References
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-[6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, “Web resources for language modeling in conversational speech recognition,” *ACM Transactions on Speech and Language Processing*, vol. 5, no. 1, pp. 1–xx, 2007.
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-[7] A. Sethy, P. Georgiou, and S. Narayanan, “Building topic-specific language models from webdata using competitive models,” in *Proc. Interspeech*, 2005, pp. 1293–1296.
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-[8] R. Sarikaya, A. Gravano, and Y. Gao, “Rapid language model development using external resources for new spoken dialog domains,” in *Proc. ICASSP*, vol. I, 2005, pp. 573–576.
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-[9] K. Yoshino, S. Mori, and T. Kawahara, “Incorporating semantic information to selection of web texts for language model of spoken dialogue system,” in *Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on*, May 2013, pp. 8252–8256.
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-[10] R. Moore and W. Lewis, “Intelligent selection of language model training,” in *Proc. ACL*, 2010.
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-[11] A. Axelrod, X. He, and J. Gao, “Domain adaptation via pseudo in-domain data selection,” in *Proc. EMNLP*, 2011.
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-[14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mercer, “Class-based n-gram models of natural language,” *Computational Linguistics*, vol. 18, no. 4, pp. 467–479, 1992.
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-[15] R. Iyer and M. Ostendorf, “Transforming out-of-domain estimates to improve in-domain language models,” in *Proc. Eurospeech*, vol. 4, 1997, pp. 1975–1978.
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-[16] A. Stolcke, “SRILM – an extensible language modeling toolkit,” in *Proc. ICSLP*, 2002, pp. 901–904.
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-[17] P. Liang, “Semi-supervised learning for natural language,” Ph.D. dissertation, Massachusetts Institute of Technology, 2005.
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-[18] I. H. Witten and T. Bell, “The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,” *Information Theory, IEEE Transactions on*, vol. 37, no. 4, pp. 1085–1094, 1991.
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-[19] J. Cho, H. Garcia-Molina, and L. Page, “Efficient crawling through url ordering,” *Comput. Netw. ISDN Syst.*, vol. 30, no. 1-7, pp. 161–172, 1998. [Online]. Available: http://dx.doi.org/10.1016/S0169-7552(98)00108-1
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-[20] A. Liaw and M. Wiener, “Classification and regression by randomforest,” *R News*, vol. 2, no. 3, pp. 18–22, 2002. [",0.05286646069344319,"ch language modeling using class-dependent mixtures,"" in *Proc. HLT/NAACL*, 2003, pp. 7–9.
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-[5] S. Schwarm, I. Bulyko, and M. Ostendorf, ""Adaptive language modeling with varied sources to cover new vocabulary items,"" *IEEE Trans. Speech and Audio*, vol. 12, no. 3, pp. 334–342, 2004.
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-[6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, ""Web resources for language modeling in conversational speech recognition,"" *ACM Transactions on Speech and Language Processing*, vol. 5, no. 1, pp. 1–xx, 2007.
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-[7] A. Sethy, P. Georgiou, and S. Narayanan, ""Building topic-specific language models from webdata using competitive models,"" in *Proc. Interspeech*, 2005, pp. 1293–1296.
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-[8] R. Sarikaya, A. Gravano, and Y. Gao, ""Rapid language model development using external resources for new spoken dialog domains,"" in *Proc. ICASSP*, vol. I, 2005, pp. 573–576.
-
-[9] K. Yoshino, S. Mori, and T. Kawahara, ""Incorporating semantic information to selection of web texts for language model of spoken dialogue system,"" in *Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on*, May 2013, pp. 8252–8256.
-
-[10] R. Moore and W. Lewis, ""Intelligent selection of language model training,"" in *Proc. ACL*, 2010.
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-[11] A. Axelrod, X. He, and J. Gao, ""Domain adaptation via pseudo in-domain data selection,"" in *Proc. EMNLP*, 2011.
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-[12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, ""Supervised and unsupervised web-based language model domain adaptation,"" in *Proc. Interspeech*, 2012.
-
-[13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, ""Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,"" in *Proc. Interspeech*, 2013.
-
-[14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mercer, ""Class-based n-gram models of natural language,"" *Computational Linguistics*, vol. 18, no. 4, pp. 467–479, 1992.
-
-[15] R. Iyer and M. Ostendorf, ""Transforming out-of-domain estimates to improve in-domain language models,"" in *Proc. Eurospeech*, vol. 4, 1997, pp. 1975–1978.
-
-[16] A. Stolcke, ""SRILM – an extensible language modeling toolkit,"" in *Proc. ICSLP*, 2002, pp. 901–904.
-
-[17] P. Liang, ""Semi-supervised learning for natural language,"" Ph.D. dissertation, Massachusetts Institute of Technology, 2005.
-
-[18] I. H. Witten and T. Bell, ""The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,"" *Information Theory, IEEE Transactions on*, vol. 37, no. 4, pp. 1085–1094, 1991.
-
-[19] J. Cho, H. Garcia-Molina, and L. Page, ""Efficient crawling through url ordering,"" *Comput. Netw. ISDN Syst.*, vol. 30, no. 1-7, pp. 161–172, 1998. [Online]. Available: http://dx.doi.org/10.1016/S0169-7552(98)00108-1
-
-[20] A. Liaw and M. Wiener, ""Classification and regression by randomforest,"" *R News*, vol. 2, no. 3, pp. 18–22, 2002. [Online]. Available: http://CRAN.R-project.org/doc/Rnews",0.08753861997940268,"xt sources for conversational speech language modeling using class-dependent mixtures,” in _Proc. HLT/NAACL_ , 2003, pp. 7–9.
-
-- [5] S. Schwarm, I. Bulyko, and M. Ostendorf, “Adaptive language modeling with varied sources to cover new vocabulary items,” _IEEE Trans. Speech and Audio_ , vol. 12, no. 3, pp. 334–342, 2004.
-
-- [6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, “Web resources for language modeling in conversational speech recognition,”
-
- - _ACM Transactions on Speech and Language Processing_ , vol. 5, no. 1, pp. 1–xx, 2007.
-
-- [7] A. Sethy, P. Georgiou, and S. Narayanan, “Building topic-specific language models from webdata using competitive models,” in _Proc. Interspeech_ , 2005, pp. 1293–1296.
-
-- [8] R. Sarikaya, A. Gravano, and Y. Gao, “Rapid language model development using external resources for new spoken dialog domains,” in _Proc. ICASSP_ , vol. I, 2005, pp. 573–576.
-
-- [9] K. Yoshino, S. Mori, and T. Kawahara, “Incorporating semantic information to selection of web texts for language model of spoken dialogue system,” in _Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on_ , May 2013, pp. 8252–8256.
-
-- [10] R. Moore and W. Lewis, “Intelligent selection of language model training,” in _Proc. ACL_ , 2010.
-
-- [11] A. Axelrod, X. He, and J. Gao, “Domain adaptation via pseudo indomain data selection,” in _Proc. EMNLP_ , 2011.
-
-- [12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, “Supervised and unsupervised web-based language model domain adaptation,” in _Proc. Interspeech_ , 2012.
-
-- [13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, “Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,” in _Proc. Interspeech_ , 2013.
-
-- [14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mercer, “Class-based n-gram models of natural language,” _Computational Linguistics_ , vol. 18, no. 4, pp. 467–479, 1992.
-
-- [15] R. Iyer and M. Ostendorf, “Transforming out-of-domain estimates to improve in-domain language models,” in _Proc. Eurospeech_ , vol. 4, 1997,
-
- - pp. 1975–1978.
-
-- [16] A. Stolcke, “SRILM – an extensible language modeling toolkit,” in _Proc. ICSLP_ , 2002, pp. 901–904.
-
-- [17] P. Liang, “Semi-supervised learning for natural language,” Ph.D. dissertation, Massachusetts Institute of Technology, 2005.
-
-- [18] I. H. Witten and T. Bell, “The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,” _Information Theory, IEEE Transactions on_ , vol. 37, no. 4, pp. 1085–1094, 1991.
-
-- [19] J. Cho, H. Garcia-Molina, and L. Page, “Efficient crawling through url ordering,” _Comput. Netw. ISDN Syst._ , vol. 30, no. 1-7, pp. 161–172, 1998. [Online]. Available: http://dx.doi.org/10.1016/S0169-7552(98) 00108-1
-
-- [20] A. Liaw and M. Wiener, “Classification and regression by ra",0.051836594576038446,"ch language modeling using class-dependent mixtures,' in Proc. HLT/NAACL , 2003, pp. 7-9.
-- [5] S. Schwarm, I. Bulyko, and M. Ostendorf, 'Adaptive language modeling with varied sources to cover new vocabulary items,' IEEE Trans. Speech and Audio , vol. 12, no. 3, pp. 334-342, 2004.
-- [6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, 'Web resources for language modeling in conversational speech recognition,' ACM Transactions on Speech and Language Processing , vol. 5, no. 1, pp. 1-xx, 2007.
-- [7] A. Sethy, P. Georgiou, and S. Narayanan, 'Building topic-specific language models from webdata using competitive models,' in Proc. Interspeech , 2005, pp. 1293-1296.
-- [8] R. Sarikaya, A. Gravano, and Y. Gao, 'Rapid language model development using external resources for new spoken dialog domains,' in Proc. ICASSP , vol. I, 2005, pp. 573-576.
-- [9] K. Yoshino, S. Mori, and T. Kawahara, 'Incorporating semantic information to selection of web texts for language model of spoken dialogue system,' in Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on , May 2013, pp. 8252-8256.
-- [10] R. Moore and W. Lewis, 'Intelligent selection of language model training,' in Proc. ACL , 2010.
-- [11] A. Axelrod, X. He, and J. Gao, 'Domain adaptation via pseudo indomain data selection,' in Proc. EMNLP , 2011.
-- [12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, 'Supervised and unsupervised web-based language model domain adaptation,' in Proc. Interspeech , 2012.
-- [13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, 'Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,' in Proc. Interspeech , 2013.
-- [14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mercer, 'Class-based n-gram models of natural language,' Computational Linguistics , vol. 18, no. 4, pp. 467-479, 1992.
-- [15] R. Iyer and M. Ostendorf, 'Transforming out-of-domain estimates to improve in-domain language models,' in Proc. Eurospeech , vol. 4, 1997, pp. 1975-1978.
-- [16] A. Stolcke, 'SRILM - an extensible language modeling toolkit,' in Proc. ICSLP , 2002, pp. 901-904.
-- [17] P. Liang, 'Semi-supervised learning for natural language,' Ph.D. dissertation, Massachusetts Institute of Technology, 2005.
-- [18] I. H. Witten and T. Bell, 'The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,' Information Theory, IEEE Transactions on , vol. 37, no. 4, pp. 1085-1094, 1991.
-- [19] J. Cho, H. Garcia-Molina, and L. Page, 'Efficient crawling through url ordering,' Comput. Netw. ISDN Syst. , vol. 30, no. 1-7, pp. 161-172, 1998. [Online]. Available: http://dx.doi.org/10.1016/S0169-7552(98) 00108-1
-- [20] A. Liaw and M. Wiener, 'Classification and regression by randomforest,' R News , vol. 2, no. 3, pp. 18-22, 2002. [Online]. Available: http://CRAN.R-project.org/doc/Rnews",0.051836594576038446,"ch language modeling using class-dependent mixtures,' in Proc. HLT/NAACL , 2003, pp. 7-9.
-- [5] S. Schwarm, I. Bulyko, and M. Ostendorf, 'Adaptive language modeling with varied sources to cover new vocabulary items,' IEEE Trans. Speech and Audio , vol. 12, no. 3, pp. 334-342, 2004.
-- [6] I. Bulyko, M. Ostendorf, M. Siu, T. Ng, A. Stocke, and C. Ozgur, 'Web resources for language modeling in conversational speech recognition,' ACM Transactions on Speech and Language Processing , vol. 5, no. 1, pp. 1-xx, 2007.
-- [7] A. Sethy, P. Georgiou, and S. Narayanan, 'Building topic-specific language models from webdata using competitive models,' in Proc. Interspeech , 2005, pp. 1293-1296.
-- [8] R. Sarikaya, A. Gravano, and Y. Gao, 'Rapid language model development using external resources for new spoken dialog domains,' in Proc. ICASSP , vol. I, 2005, pp. 573-576.
-- [9] K. Yoshino, S. Mori, and T. Kawahara, 'Incorporating semantic information to selection of web texts for language model of spoken dialogue system,' in Acoustics, Speech and Signal Processing (ICASSP), 2013 IEEE International Conference on , May 2013, pp. 8252-8256.
-- [10] R. Moore and W. Lewis, 'Intelligent selection of language model training,' in Proc. ACL , 2010.
-- [11] A. Axelrod, X. He, and J. Gao, 'Domain adaptation via pseudo indomain data selection,' in Proc. EMNLP , 2011.
-- [12] G. Lecorve, J. Dines, T. Hain, and P. Motlicek, 'Supervised and unsupervised web-based language model domain adaptation,' in Proc. Interspeech , 2012.
-- [13] T. Schlippe, L. Gren, N. T. Vu, and T. Schultz, 'Unsupervised language model adaptation for automatic speech recognition of broadcast news using web 2.0,' in Proc. Interspeech , 2013.
-- [14] P. F. Brown, V. J. D. Pietra, P. V. deSouza, J. C. Lai, and R. L. Mercer, 'Class-based n-gram models of natural language,' Computational Linguistics , vol. 18, no. 4, pp. 467-479, 1992.
-- [15] R. Iyer and M. Ostendorf, 'Transforming out-of-domain estimates to improve in-domain language models,' in Proc. Eurospeech , vol. 4, 1997, pp. 1975-1978.
-- [16] A. Stolcke, 'SRILM - an extensible language modeling toolkit,' in Proc. ICSLP , 2002, pp. 901-904.
-- [17] P. Liang, 'Semi-supervised learning for natural language,' Ph.D. dissertation, Massachusetts Institute of Technology, 2005.
-- [18] I. H. Witten and T. Bell, 'The zero-frequency problem: Estimating the probabilities of novel events in adaptive text compression,' Information Theory, IEEE Transactions on , vol. 37, no. 4, pp. 1085-1094, 1991.
-- [19] J. Cho, H. Garcia-Molina, and L. Page, 'Efficient crawling through url ordering,' Comput. Netw. ISDN Syst. , vol. 30, no. 1-7, pp. 161-172, 1998. [Online]. Available: http://dx.doi.org/10.1016/S0169-7552(98) 00108-1
-- [20] A. Liaw and M. Wiener, 'Classification and regression by randomforest,' R News , vol. 2, no. 3, pp. 18-22, 2002. [Online]. Available: http://CRAN.R-project.org/doc/Rnews",15,science_sample
-16,0,"Figure 7: The red arcs are the trajectory of the system (5.60) with initial value (0, 1.2) and the blue arcs are the orbit with initial value (0, 1.5). Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time increases.",False,0.00749063670411985,"Figure 7: The red arcs are the trajectory of the system (5.60) with initial value (0, 1.2) and the blue arcs are the orbit with initial value (0, 1.5) . Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time increases",0.0599250936329588,"gure 7: The red arcs are the trajectory of the system (5.60) with initial value $(0, 1.2)$ and the blue arcs are the orbit with initial value $(0, 1.5)$ . Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time incr",0.0449438202247191,"e 7:** The red arcs are the trajectory of the system (5.60) with initial value $(0, 1.2)$ and the blue arcs are the orbit with initial value $(0, 1.5)$. Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time increases",0.0,"Figure 7: The red arcs are the trajectory of the system (5.60) with initial value (0, 1.2) and the blue arcs are the orbit with initial value (0, 1.5). Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time increases.",0.0,"Figure 7: The red arcs are the trajectory of the system (5.60) with initial value (0, 1.2) and the blue arcs are the orbit with initial value (0, 1.5). Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time increases.",0.052434456928838954,"Figure 7: The red arcs are the trajectory of the system (5.60) with initial value (0 , 1 . 2) and the blue arcs are the orbit with initial value (0 , 1 . 5) . Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time inc",0.052434456928838954,"Figure 7: The red arcs are the trajectory of the system (5.60) with initial value (0 , 1 . 2) and the blue arcs are the orbit with initial value (0 , 1 . 5) . Through simulation, we observe that the trajectories approach to the periodic solution of (5.60) as time inc",16,science_sample
-16,1,"Let us start with the linearization of system (5.71) around the periodic solution Ψ0(t). Consider a near solution y(t) = y(t, 0, y∗+∆y), where ∆y = (∆y1, ∆y2), to the periodic solution Ψ0(t). Assume that",False,0.06403940886699508,"t us start with the linearization of system (5.71) around the periodic solution Yo(t). Consider a near solution y(t) = y(t, 0, y* + Ay), where Ay = (Ay1, Ay2), to the periodic solution Vo(t). Assume that",0.35960591133004927,"Let us start with the linearization of system (5.71) around the periodic solution $\Psi_0(t)$ . Consider a near solution $y(t) = y(t, 0, y^* + \Delta y)$ , where $\Delta y = (\Delta y_1, \Delta y_2)$ ",0.4039408866995074,"e linearization of system (5.71) around the periodic solution $\Psi_0(t)$. Consider a near solution $y(t) = y(t, 0, y^* +\Delta y)$, where $\Delta y = (\Delta y_1, \Delta y_2)$, to the periodic solution ",0.3645320197044335,"
-
-Let us start with the linearization of system (5.71) around the periodic solution $$\Psi_0(t)$$. Consider a near solution $$y(t) = y(t, 0, y^* + \Delta y)$$, where $$\Delta y = (\Delta y_1, \Delta y_2)",0.029556650246305417,"et us start with the linearization of system (5.71) around the periodic solution Ψ0(t). Consider a near solution y(t) = y(t, 0, y[∗] +∆y), where ∆y = (∆y1, ∆y2), to the periodic solution Ψ0(t). Assume th",0.23645320197044334,"tart with the linearization of system (5.71) around the periodic solution Ψ 0 ( t ) . Consider a near solution y ( t ) = y ( t, 0 , y ∗ +∆ y ) , where ∆ y = (∆ y 1 , ∆ y 2 ) , to the periodic solution Ψ ",0.23645320197044334,"tart with the linearization of system (5.71) around the periodic solution Ψ 0 ( t ) . Consider a near solution y ( t ) = y ( t, 0 , y ∗ +∆ y ) , where ∆ y = (∆ y 1 , ∆ y 2 ) , to the periodic solution Ψ ",16,science_sample
-16,2,"near solution y(t) = y(t, 0, y∗+∆y), where ∆y = (∆y1, ∆y2), to the periodic solution Ψ0(t). Assume that y(t) satisfies condition (N1), and it meets the surface of discontinuity Γ at the moment t = ξ and at the point ¯y = y(ξ, 0, y∗+ ∆y). Considering the formula (3.10) for the transversal point ¯y = (¯y1, ¯y2), the first ∂τ(¯y) ∂τ(¯y) component can be evaluated as = . From the last equality, the singularity is seen at the ∂y0 ∂y0 −1¯y",False,0.13793103448275862,"r a near solution y(t) = y(t, 0, y* + Ay), where Ay = (Ay1, Ay2), to the periodic solution Vo(t). Assume that y(t) satisfies condition (N1), and it meets the surface of discontinuity I at the moment t = { and at the point y = y(§, 0, y* + Ay). Considering the formula (3.10) for the transversal point y (1,2), the first дт(у) aT(y) 1 component ду can be evaluated as მყი Y2 From the last equality, the singularity is seen at the дт(у) ",0.4942528735632184,"ear solution $y(t) = y(t, 0, y^* + \Delta y)$ , where $\Delta y = (\Delta y_1, \Delta y_2)$ , to the periodic solution $\Psi_0(t)$ . Assume that $y(t)$ satisfies condition (N1), and it meets the surface of discontinuity $\Gamma$ at the moment $t = \xi$ and at the point $\bar{y} = y(\xi, 0, y^* + \Delta y)$ . Considering the formula (3.10) for the transversal point $\bar{y} = (\bar{y}_1, \bar{y}_2)$ , the first component ",0.4666666666666667,"a near solution $y(t) = y(t, 0, y^* +\Delta y)$, where $\Delta y = (\Delta y_1, \Delta y_2)$, to the periodic solution $\Psi_0(t)$. Assume that $y(t)$ satisfies condition (N1), and it meets the surface of discontinuity $\Gamma$ at the moment $t = \xi$ and at the point $\bar{y} = y(\xi, 0, y^* + \Delta y)$. Considering the formula (3.10) for the transversal point $\bar{y} = (\bar{y}_1, \bar{y}_2)$, the first component $\frac{\partia",0.49885057471264366,"ear solution $$y(t) = y(t, 0, y^* + \Delta y)$$, where $$\Delta y = (\Delta y_1, \Delta y_2)$$, to the periodic solution $$\Psi_0(t)$$. Assume that $$y(t)$$ satisfies condition (N1), and it meets the surface of discontinuity $$\Gamma$$ at the moment $$t = \xi$$ and at the point $$\bar{y} = y(\xi, 0, y^* + \Delta y)$$. Considering the formula (3.10) for the transversal point $$\bar{y} = (\bar{y}_1, \bar{y}_2)$$, the first component ",0.19540229885057472,"ution y(t) = y(t, 0, y[∗] +∆y), where ∆y = (∆y1, ∆y2), to the periodic solution Ψ0(t). Assume that y(t) satisfies condition (N 1), and it meets the surface of discontinuity Γ at the moment t = ξ and at the point ¯y = y(ξ, 0, y[∗] + ∆y). Considering the formula (3.10) for the transversal point ¯y = (¯y1, ¯y2), the first component[∂τ][(¯][y][)] can be evaluated as[∂τ][(¯][y][)] = − ¯[1] . From the last equality, the singularity is se",0.3057471264367816," near solution y ( t ) = y ( t, 0 , y ∗ +∆ y ) , where ∆ y = (∆ y 1 , ∆ y 2 ) , to the periodic solution Ψ 0 ( t ) . Assume that y ( t ) satisfies condition ( N 1) , and it meets the surface of discontinuity Γ at the moment t = ξ and at the point ¯ y = y ( ξ, 0 , y ∗ +∆ y ) . Considering the formula (3.10) for the transversal point ¯ y = (¯ y 1 , ¯ y 2 ) , the first component ∂τ (¯ y ) ∂y 0 1 can be evaluated as ∂τ (¯ y ) ∂y 0 1 = ",0.3057471264367816," near solution y ( t ) = y ( t, 0 , y ∗ +∆ y ) , where ∆ y = (∆ y 1 , ∆ y 2 ) , to the periodic solution Ψ 0 ( t ) . Assume that y ( t ) satisfies condition ( N 1) , and it meets the surface of discontinuity Γ at the moment t = ξ and at the point ¯ y = y ( ξ, 0 , y ∗ +∆ y ) . Considering the formula (3.10) for the transversal point ¯ y = (¯ y 1 , ¯ y 2 ) , the first component ∂τ (¯ y ) ∂y 0 1 can be evaluated as ∂τ (¯ y ) ∂y 0 1 = ",16,science_sample
-17,0,"Y0−W ≥Y1−Y0and Pr , Y1 ≥Y0 ≥W = 1, respectively, where td is a level of input for each treatment t1−t0 t0−tW status d ∈{0, 1} while tW is a level of input without the treatment and tW < t0 < t1. Given W = w, concavity and convexity of the treatment response function restrict the support of (Y0, Y1) to the region below the straight line Y1 = t1−tWt0−tW Y0 − t0−tWt1−t0 w and above the straight line Y1 = Y0, and to the region above two",False,0.1834862385321101," Y₁ ≥ Y ≥ W) = 1 to-tw and Pr (Yo-WY-Yo, Y₁ ≥ Yo≥ W) = 1, respectively, where ta is a level of input for each treatment to-tw status d = {0,1} while tw is a level of input without the treatment and tw < to < t₁. Given W = w, concavity and convexity of the treatment response function restrict the support of (Yo, Y₁) to the region below the straight line Y₁ t₁-tw Yo₁-tow and above the straight line Y₁ = Yo, and to the region above two",0.3440366972477064,"ctively, where $t_d$ is a level of input for each treatment status $d\in\{0,1\}$ while $t_W$ is a level of input without the treatment and $t_W < t_0 < t_1$ . Given $W=w$ , concavity and convexity of the treatment response function restrict the support of $(Y_0, Y_1)$ to the region below the straight line $Y_1=\frac{t_1-t_W}{t_0-t_W}Y_0-\frac{t_1-t_0}{t_0-t_W}w$ and above the straight line $Y_1=Y_0$ , and to the region ",0.2889908256880734,", respectively, where $t_d$ is a level of input for each treatment status $d \in \{0, 1\}$ while $t_W$ is a level of input without the treatment and $t_W < t_0 < t_1$. Given $W = w$, concavity and convexity of the treatment response function restrict the support of $(Y_0, Y_1)$ to the region below the straight line $Y_1 = \frac{t_1-t_W}{t_0-t_W} Y_0 - \frac{t_1-t_0}{t_0-t_W} w$ and above the straight line $Y_1 = Y_0$, and to the reg",0.4197247706422018,"respectively, where* $$t_d$$ *is a level of input for each treatment status* $$d \in \{0,1\}$$ *while* $$t_W$$ *is a level of input without the treatment and* $$t_W \leq t_0 \leq t_1$$*.* *Given* $$W = w$$*, concavity and convexity of the treatment response function restrict the support of* $$(Y_0, Y_1)$$ *to the region below the straight line* $$Y_1 = \frac{t_1-t_W}{t_0-t_W}Y_0 - \frac{t_1-t_0}{t_0-t_W}w$$ *and above the straight l",0.3256880733944954,"W]_ � = 1 _, respectively, where td is a level of input for each treatment status d ∈{_ 0 _,_ 1 _} while tW is a level of input without the treatment and tW < t_ 0 _< t_ 1 _. Given W_ = _w, concavity and convexity of the treatment response function restrict the support of_ ( _Y_ 0 _, Y_ 1) _to the region below the straight line Y_ 1 = _[t] t_[1] 0 _[−] −[t] t[W] W[Y]_[0] _[ −] tt_ 01 _−−ttW_ 0 _[w][ and above the straight line][ Y]_",0.20871559633027523," ) = 1 , respectively, where t d is a level of input for each treatment status d ∈ { 0 , 1 } while t W is a level of input without the treatment and t W < t 0 < t 1 . Given W = w, concavity and convexity of the treatment response function restrict the support of ( Y 0 , Y 1 ) to the region below the straight line Y 1 = t 1 -t W t 0 -t W Y 0 -t 1 -t 0 t 0 -t W w and above the straight line Y 1 = Y 0 , and to the region above tw",0.20871559633027523," ) = 1 , respectively, where t d is a level of input for each treatment status d ∈ { 0 , 1 } while t W is a level of input without the treatment and t W < t 0 < t 1 . Given W = w, concavity and convexity of the treatment response function restrict the support of ( Y 0 , Y 1 ) to the region below the straight line Y 1 = t 1 -t W t 0 -t W Y 0 -t 1 -t 0 t 0 -t W w and above the straight line Y 1 = Y 0 , and to the region above tw",17,science_sample
-17,1,"Example 3 (Roy Model) In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equation:",False,0.010169491525423728,"xample 3 (Roy Model) In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equation:",0.023728813559322035,"Example 3 (Roy Model)** In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equati",0.030508474576271188,"ple 3 (Roy Model)*** In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equation:",0.030508474576271188,"ple 3** *(Roy Model) In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equation:",0.030508474576271188,"ample 3** _(Roy Model) In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equatio",0.010169491525423728,"xample 3 (Roy Model) In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equation:",0.010169491525423728,"xample 3 (Roy Model) In the Roy model, individuals self-select into treatment when their benefits from the treatment are greater than nonpecuniary costs for treatment participation. The extended Roy model assumes that the nonpecuniary cost is deterministic with the following selection equation:",17,science_sample
-17,2,"where µC (Z) represents nonpecuniary costs with a vector of observables Z. Then treated (D = 1) and untreated people (D = 0) are the observed groups satisfying support restrictions {Y1 −Y0 ≥µC (Z)} and {Y1 −Y0 < µC (Z)}, respectively. Example 4 (DTE conditional on Potential Outcomes) The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain set C is written as",False,0.05012531328320802,"where μc (Z) represents nonpecuniary costs with a vector of observables Z. Then treated (D = 1) and untreated people (D = 0) are the observed groups satisfying support restrictions {Y₁ = Y ≥ µc (Z)} and {Y₁ Yoμc (Z)}, respectively.
-
-Example 4 (DTE conditional on Potential Outcomes) The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain set C is written as
-
-",0.21553884711779447,"represents nonpecuniary costs with a vector of observables $Z$ . Then treated ( $D=1$ ) and untreated people ( $D=0$ ) are the observed groups satisfying support restrictions $\{Y_1=Y_0\ge\mu_C(Z)\}$ and $\{Y_1=Y_0<\mu_C(Z)\}$ , respectively.
-
-**Example 4 (DTE conditional on Potential Outcomes)** The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain se",0.20050125313283207,"represents nonpecuniary costs with a vector of observables $Z$. Then treated ($D = 1$) and untreated people ($D = 0$) are the observed groups satisfying support restrictions $\{Y_1 - Y_0 \geq \mu_C (Z)\}$ and $\{Y_1 - Y_0 < \mu_C (Z)\}$, respectively.
-
-***Example 4 (DTE conditional on Potential Outcomes)*** The conditional DTE for the unobservable subgroup whose potential outcomes belong to a cer",0.3082706766917293,"ts with a vector of observables* $$Z$$*.* *Then treated* $$(D = 1)$$ *and untreated people* $$(D = 0)$$ *are the observed groups satisfying support restrictions* $$\{Y_1 - Y_0 \geq \mu_C(Z)\}$$ *and* $$\{Y_1 - Y_0 < \mu_C(Z)\}$$*, respectively.*
-
-**Example 4** *(DTE conditional on Potential Outcomes) The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain se",0.23558897243107768,"y costs with a vector of observables Z. Then treated_ ( _D_ = 1) _and untreated people_ ( _D_ = 0) _are the observed groups satisfying support restrictions {Y_ 1 _− Y_ 0 _≥ µC_ ( _Z_ ) _} and {Y_ 1 _− Y_ 0 _< µC_ ( _Z_ ) _}, respectively._
-
-**Example 4** _(DTE conditional on Potential Outcomes) The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain set C i",0.12531328320802004,"represents nonpecuniary costs with a vector of observables Z . Then treated ( D = 1) and untreated people ( D = 0) are the observed groups satisfying support restrictions { Y 1 -Y 0 ≥ µ C ( Z ) } and { Y 1 -Y 0 < µ C ( Z ) } , respectively.
-
-Example 4 (DTE conditional on Potential Outcomes) The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain set C is ",0.12531328320802004,"represents nonpecuniary costs with a vector of observables Z . Then treated ( D = 1) and untreated people ( D = 0) are the observed groups satisfying support restrictions { Y 1 -Y 0 ≥ µ C ( Z ) } and { Y 1 -Y 0 < µ C ( Z ) } , respectively.
-
-Example 4 (DTE conditional on Potential Outcomes) The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain set C is ",17,science_sample
-20,0,"Note that ǫ1,2,3 are all proportional to X which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio (g/¯g5)2 originates from the presence of brane localized kinetic terms. The ǫ parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters α, GF and mZ in terms of the model parameters. For convenience we rewrite the results:",False,0.027950310559006212,"t ǫ 1 ,2 ,3 are all proportional to X which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio (g/g ¯ 5) 2 originates from the presence of brane localized kinetic terms.
-
-The ǫ parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters α, GF and mZ in terms of the model parameters. For convenience we rewrite the results:",0.14130434782608695," which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio $(g/\bar{g}_5)^2$ originates from the presence of brane localized kinetic terms.
-
-The $\epsilon$ parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters $\alpha$ , $G_F$ and $m_Z$ in terms of the model parameters. For convenience we rewrite the result",0.11801242236024845,"rline{X}$ which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio $(g/\bar{g}_5)^2$ originates from the presence of brane localized kinetic terms.
-
-The $\epsilon$ parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters $\alpha$, $G_F$ and $m_Z$ in terms of the model parameters. For convenience we rewrite the results:",0.14130434782608695," which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio $$(g/\bar{g}_5)^2$$ originates from the presence of brane localized kinetic terms.
-
-The $$\epsilon$$ parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters $$\alpha$$, $$G_F$$ and $$m_Z$$ in terms of the model parameters. For convenience we rewrite the results",0.023291925465838508,"Note that ǫ1,2,3 are all proportional to X which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW ¯ precision tests. In the five dimensional formulation of this model the ratio (g/g5)[2] originates from the presence of brane localized kinetic terms.
-
-The ǫ parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters α, GF and mZ in terms of the model parameters. For convenience we rewrite the re",0.06366459627329192,"3 are all proportional to X which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio ( g/ ¯ g 5 ) 2 originates from the presence of brane localized kinetic terms.
-
-The /epsilon1 parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters α , G F and m Z in terms of the model parameters. For convenience we rewrite the resu",0.06366459627329192,"3 are all proportional to X which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio ( g/ ¯ g 5 ) 2 originates from the presence of brane localized kinetic terms.
-
-The /epsilon1 parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters α , G F and m Z in terms of the model parameters. For convenience we rewrite the resu",20,science_sample
-20,1,"In section VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b(y) ≡1 (flat extra dimension) and b(y) = e−2ky (a slice of AdS5). To this aim we need to invert (73), (74) and (75),",False,0.03571428571428571,"ection VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b(y ) ≡ 1 (flat extra dimension) and b (y) = e−2ky (a slice of AdS5). To this aim we need to invert (73), (74) and (75),",0.24603174603174602,"section VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, $b(y)\equiv 1$ (flat extra dimension) and $b(y)=e^{-2ky}$ (a slice of $\text{AdS}_5$ ). To this aim we need to inv",0.20238095238095238,"VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, $b(y) \equiv 1$ (flat extra dimension) and $b(y) = e^{-2ky}$ (a slice of $\text{AdS}_5$). To this aim we need to invert (73), (",0.25,"tion VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, $$b(y) \equiv 1$$ (flat extra dimension) and $$b(y) = e^{-2ky}$$ (a slice of $$\text{AdS}_5$$). To this aim we need to inv",0.06746031746031746,"ection VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b(y) ≡ 1 (flat extra dimension) and b(y) = e[−][2][ky] (a slice of AdS5). To this aim we need to invert (73), (74) and (",0.10317460317460317,"ection VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b ( y ) ≡ 1 (flat extra dimension) and b ( y ) = e -2 ky (a slice of AdS 5 ). To this aim we need to invert (73), (74) a",0.10317460317460317,"ection VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b ( y ) ≡ 1 (flat extra dimension) and b ( y ) = e -2 ky (a slice of AdS 5 ). To this aim we need to invert (73), (74) a",20,science_sample
-21,0,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where ak+1 −ak = δ for each integer k at the optimum. In this case, the lower bound reduces to",False,0.008403361344537815,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where ak+1 − ak = δ for each integer k at the optimum. In this case, the lower bound reduces t",0.15966386554621848,"t the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where $a_{k+1} - a_k = \delta$ for each integer $k$ at the optimum. In this case, the lower bound redu",0.12605042016806722,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where $a_{k+1} - a_k = \delta$ for each integer $k$ at the optimum. In this case, the lower bo",0.20588235294117646,"sent the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where $$a_{k+1} = a_k \equiv \delta$$ for each integer $$k$$ at the optimum. In this case, the lower bo",0.08403361344537816,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where _ak_ +1 _− ak_ = _δ_ for each integer _k_ at the optimum. In this case, the lower bound ",0.029411764705882353,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where a k +1 -a k = δ for each integer k at the optimum. In this case, the lower bound reduces",0.029411764705882353,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where a k +1 -a k = δ for each integer k at the optimum. In this case, the lower bound reduces",21,science_sample
-21,1,and computation of (B.1) poses a simple one-dimensional optimization problem.,False,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,21,science_sample
-21,2,"It is not straightforward to solve the problem (B.2) numerically in Step 3; the function max{x, 0} is non- differentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicated",False,0.018604651162790697,"It is not straightforward to solve the problem (B.2) numerically in Step 3; the function max{x, 0} is non differentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicate",0.07906976744186046,"t is not straightforward to solve the problem (B.2) numerically in Step 3; the function $\max\{x,0\}$ is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complic",0.06046511627906977,"It is not straightforward to solve the problem (B.2) numerically in Step 3; the function $\max\{x, 0\}$ is non-differentiable. Furthermore in practice, marginal distribution functions are often estimated in a compli",0.07906976744186046,"t is not straightforward to solve the problem (B.2) numerically in Step 3; the function $$\max\{x, 0\}$$ is non-differentiable. Furthermore in practice, marginal distribution functions are often estimated in a compl",0.06976744186046512,"s not straightforward to solve the problem (B.2) numerically in Step 3; the function max _{x,_ 0 _}_ is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicate",0.04186046511627907," is not straightforward to solve the problem (B.2) numerically in Step 3; the function max { x, 0 } is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicated",0.04186046511627907," is not straightforward to solve the problem (B.2) numerically in Step 3; the function max { x, 0 } is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicated",21,science_sample
-22,0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",False,0.0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",0.01990049751243781,"LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput $C$ taking the worst case ICI into account can be written as follow",0.05970149253731343,"e optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput $\mathcal{C}$ taking the worst case ICI into account can be written as follows",0.05970149253731343," optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput $\mathcal{C}$ taking the worst case ICI into account can be written as follows:",0.0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",0.0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",0.0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",22,science_sample
-22,1,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Qn,k,l where:",False,0.0,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Qn,k,l where:",0.08870967741935484,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes $Q_{n,k,l}$ ",0.08064516129032258,"tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes $Q_{n,k,l}$ whe",0.08064516129032258,"ighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes $Q_{n,k,l}$ wher",0.0,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Qn,k,l where:",0.016129032258064516,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Q n,k,l where",0.016129032258064516,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Q n,k,l where",22,science_sample
-22,2,"Thus, Qn,k,l is an SINR term for each user k at each subcarrier n in each cell l assuming worst case interference. We collect these SINR terms into a vector qn,l = [qn,1,l, qn,2,l...., qn,K,l] and then stack all the vectors in a matrix Ql ∈RN×K. The resulting allocations based on this criteria are then used to compute the LB network throughput using (1). Note that if ξn,l = 0, than Qn,k,l becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner. B. Upper Bound on the Optimal Network Throughput Establishing an UB is significantly important in order to calibrate the performance of sub- optimal resource allocation schemes with respect to the optimal solution. The UB can be derived",False,0.0330812854442344,",l is an SINR term for each user k at each subcarrier n in each cell l assuming worst case interference. We collect these SINR terms into a vector qn,l = [qn,1,l, qn,2,l...., qn,K,l] and then stack all the vectors in a matrix Ql ∈ R N ×K . The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
-
-Note that if ξn,l = 0, than Qn,k,l becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner.
-
-## B. Upper Bound on the Optimal Network Throughput
-
-Establishing an UB is significantly important in order to calibrate the performance of sub optimal resource allocation schemes with respect to the optimal solution. The UB can be der",0.1833648393194707,"g worst case interference. We collect these SINR terms into a vector $\mathbf{q}_{n,l} = [q_{n,1,l}, q_{n,2,l}, \dots, q_{n,K,l}]$ and then stack all the vectors in a matrix $\mathbf{Q}_l \in \mathbb{R}^{N \times K}$ . The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
-
-Note that if $\xi_{n,l} = 0$ , then $Q_{n,k,l}$ becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner.
-
-## B. Upper Bound on the Optimal Network Throughput
-
-Establishing an UB is significantly important in order to calibrate the performance of sub-optimal resource allocation schemes with respect to the optimal solution. The UB can be derive",0.16918714555765596," assuming worst case interference. We collect these SINR terms into a vector $\mathbf{q}_{n,l} = [q_{n,1,l}, q_{n,2,l}, \dots, q_{n,K,l}]$ and then stack all the vectors in a matrix $\mathbf{Q}_l \in \mathbb{R}^{N \times K}$. The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
-
-Note that if $\xi_{n,l} = 0$, than $Q_{n,k,l}$ becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner.
-
-### B. Upper Bound on the Optimal Network Throughput
-
-Establishing an UB is significantly important in order to calibrate the performance of sub-optimal resource allocation schemes with respect to the optimal solution. The UB can be deriv",0.166351606805293,"assuming worst case interference. We collect these SINR terms into a vector $\mathbf{q}_{n,l} = [q_{n,1,l}, q_{n,2,l}, ..., q_{n,K,l}]$ and then stack all the vectors in a matrix $\mathbf{Q}_l \in \mathbb{R}^{N \times K}$. The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
-
-Note that if $\xi_{n,l} = 0$, than $Q_{n,k,l}$ becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner.
-
-### *B. Upper Bound on the Optimal Network Throughput*
-
-Establishing an UB is significantly important in order to calibrate the performance of sub-optimal resource allocation schemes with respect to the optimal solution. The UB can be derive",0.052930056710775046,"is an SINR term for each user k at each subcarrier n in each cell l assuming worst case interference. We collect these SINR terms into a vector qn,l = [qn,1,l, qn,2,l...., qn,K,l] and then stack all the vectors in a matrix Ql ∈ R[N][×][K] . The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
-
-̸ Note that if ξn,l = 0, than Qn,k,l becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner.
-
-̸ _B. Upper Bound on the Optimal Network Throughput_
-
-̸ Establishing an UB is significantly important in order to calibrate the performance of suboptimal resource allocation schemes with respect to the optimal solution. The UB can",0.06427221172022685," for each user k at each subcarrier n in each cell l assuming worst case interference. We collect these SINR terms into a vector q n,l = [ q n, 1 ,l , q n, 2 ,l ...., q n,K,l ] and then stack all the vectors in a matrix Q l ∈ R N × K . The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
-
-Note that if ξ n,l = 0 , than Q n,k,l becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner.
-
-## B. Upper Bound on the Optimal Network Throughput
-
-Establishing an UB is significantly important in order to calibrate the performance of suboptimal resource allocation schemes with respect to the optimal solution. The UB can be derive",0.06427221172022685," for each user k at each subcarrier n in each cell l assuming worst case interference. We collect these SINR terms into a vector q n,l = [ q n, 1 ,l , q n, 2 ,l ...., q n,K,l ] and then stack all the vectors in a matrix Q l ∈ R N × K . The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
-
-Note that if ξ n,l = 0 , than Q n,k,l becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner.
-
-## B. Upper Bound on the Optimal Network Throughput
-
-Establishing an UB is significantly important in order to calibrate the performance of suboptimal resource allocation schemes with respect to the optimal solution. The UB can be derive",22,science_sample
-23,0,Let us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E(k) and spectral coupling v(k),False,0.022222222222222223,Let us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E(k) and spectral coupling v(k,0.08148148148148149,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion $E(k)$ and spectral coupling ,0.06666666666666667, us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion $E(k)$ and spectral coupling $v(k,0.08148148148148149,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion $$E(k)$$ and spectral coupling ,0.022222222222222223,Let us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E(k) and spectral coupling v(k,0.06666666666666667,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E ( k ) and spectral coupling v,0.06666666666666667,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E ( k ) and spectral coupling v,23,science_sample
-23,1,"The condition for the non-Hermitian Hamiltonian to pos- sess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the contin- uum) is derived in Appendix B. Precisely, let ξ1,2 be the two roots of the second-order algebraic equation",False,0.02181818181818182,"The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let ξ1,2 be the two roots of the second-order algebraic equation
-
-",0.06909090909090909,"The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let $\xi_{1,2}$ be the two roots of the second-order algebraic equ",0.05454545454545454," condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let $\xi_{1,2}$ be the two roots of the second-order algebraic equation",0.06909090909090909,"The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let $$\xi_{1,2}$$ be the two roots of the second-order algebraic equ",0.02909090909090909,"
-
-The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let ξ1,2 be the two roots of the second-order algebraic equation
-",0.02909090909090909,"
-The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let ξ 1 , 2 be the two roots of the second-order algebraic equation",0.02909090909090909,"
-The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let ξ 1 , 2 be the two roots of the second-order algebraic equation",23,science_sample
-24,0,"Figure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static func- tional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text.",False,0.025157232704402517,"Figure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main",0.02389937106918239,"gure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main te",0.028930817610062894," S1:** We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text",0.02389937106918239,"re S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text",0.02389937106918239,"e S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text.",0.02389937106918239,"Figure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main ",0.02389937106918239,"Figure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main ",24,science_sample
-24,1,Figure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coeffi- cients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile ma- trix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity.,False,0.03428571428571429,Figure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connecti,0.06857142857142857,omparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is $r \approx 1$ . (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity,0.06095238095238095, Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is $r \approx 1$. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity,0.02857142857142857,gure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity,0.03619047619047619,re S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is _r ≈_ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity,0.02857142857142857,Figure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivi,0.02857142857142857,Figure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivi,24,science_sample
-25,0,"(vi) Kinetic energy weapons (excluding firearms) or projectiles, or parts thereof (vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof (viii) Military vessels, their hulls or accessories, or parts thereof (ix) Military aircraft, their accessories, or parts thereof (x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping (xi) Armor plates, military helmets, body armors, or parts thereof (xii) Military searchlights or control equipment therefor (xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof (xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials (xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof (xv) Equipment and devices used in the production or testing of military propellants, or parts thereof (xvi) Equipment specially designed for the production of weapons, test devices, or parts or accessories therefor (xvii) Military satellites, or parts thereof",False,0.1793103448275862,"ii) Military vehicles, their accessories, bridges
specially designed for military use, or parts thereof
(viii) Military vessels, their hulls or accessories, or
parts thereof
(ix) Military aircraft, their accessories, or parts thereof
(x) Antisubmarine nets, anti-torpedo nets, or buoyant
electric power cables for magnetic mine sweeping
(xi) Armor plates, military helmets, body armors, or
parts thereof
(xii) Military searchlights or control equipment therefor
(xiii) Military bacterial agents, chemical warfare (CW)
agents, radioactive materials, or equipment or parts for
the dissemination, protection, decontamination,
detection, or identification thereof
(xiii)-2 Chemical mixtures specially formulated for the
decontamination of military bacterial agents, CW
agents, or radioactive materials
(xiv) Biopolymers for the detection or identification of
CW agents, culture of cells used for the production of
such biopolymers, biocatalysts for the decontamination
or degradation of CW agents, or expression vectors,
viruses, or cultures of cells that contain genetic codes
required for production thereof
(xv) Equipment and devices used in the production or
testing of military propellants, or parts thereof
(xvi) Equipment specially designed for the production of
weapons, test devices, or parts or accessories therefo",0.10620689655172413,"nergy weapons (excluding firearms) or projectiles, or parts thereof (vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof
(viii) Military vessels, their hulls or accessories, or parts thereof
(ix) Military aircraft, their accessories, or parts thereof
(x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping
(xi) Armor plates, military helmets, body armors, or parts thereof
(xii) Military searchlights or control equipment therefor
(xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof
(xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials
(xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof
(xv) Equipment and devices used in the production or testing of military propellants, or parts thereof
(xvi) Equipment specially designed for the production of weapons, test devices, or parts or ac",0.11379310344827587,"inetic energy weapons (excluding firearms) or projectiles, or parts thereof
(vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof
(viii) Military vessels, their hulls or accessories, or parts thereof
(ix) Military aircraft, their accessories, or parts thereof
(x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping
(xi) Armor plates, military helmets, body armors, or parts thereof
(xii) Military searchlights or control equipment therefor
(xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof
(xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials
(xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof
(xv) Equipment and devices used in the production or testing of military propellants, or parts thereof
(xvi) Equipment specially designed for the production of weapons, test devices, or par",0.06896551724137931,"(vi) Kinetic energy weapons (excluding firearms) or projectiles, or parts thereof
(vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof
(viii) Military vessels, their hulls or accessories, or parts thereof
(ix) Military aircraft, their accessories, or parts thereof
(x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping
(xi) Armor plates, military helmets, body armors, or parts thereof
(xii) Military searchlights or control equipment therefor
(xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof
(xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials
(xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof
(xv) Equipment and devices used in the production or testing of military propellants, or parts thereof
(xvi) Equipment specially designed for the production of weapons, test devices, or parts or accessories therefor<",0.1310344827586207,">(vii) Military vehicles, their accessories, bridges
specially designed for military use, or parts thereof
(viii) Military vessels, their hulls or accessories, or
parts thereof
(ix) Military aircraft, their accessories, or parts thereof
(x) Antisubmarine nets, anti-torpedo nets, or buoyant
electric power cables for magnetic mine sweeping
(xi) Armor plates, military helmets, body armors, or
parts thereof
(xii) Military searchlights or control equipment therefor
(xiii) Military bacterial agents, chemical warfare (CW)
agents, radioactive materials, or equipment or parts for
the dissemination, protection, decontamination,
detection, or identification thereof
(xiii)-2 Chemical mixtures specially formulated for the
decontamination of military bacterial agents, CW
agents, or radioactive materials
(xiv) Biopolymers for the detection or identification of
CW agents, culture of cells used for the production of
such biopolymers, biocatalysts for the decontamination
or degradation of CW agents, or expression vectors,
viruses, or cultures of cells that contain genetic codes
required for production thereof
(xv) Equipment and devices used in the production or
testing of military propellants, or parts thereof
(xvi) Equipment specially designed for the production of
weapons, test devices, or parts or accessories therefor
(xvii) Military satellites, or parts thereof",0.04,"pons (excluding firearms) or projectiles, or parts thereof (vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof (viii) Military vessels, their hulls or accessories, or parts thereof (ix) Military aircraft, their accessories, or parts thereof (x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping (xi) Armor plates, military helmets, body armors, or parts thereof (xii) Military searchlights or control equipment therefor (xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof (xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials (xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof (xv) Equipment and devices used in the production or testing of military propellants, or parts thereof (xvi) Equipment specially designed for the production of weapons, test devices, or parts or accessories therefor (xvii) Military satellites, or parts t",0.04,"pons (excluding firearms) or projectiles, or parts thereof (vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof (viii) Military vessels, their hulls or accessories, or parts thereof (ix) Military aircraft, their accessories, or parts thereof (x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping (xi) Armor plates, military helmets, body armors, or parts thereof (xii) Military searchlights or control equipment therefor (xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof (xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials (xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof (xv) Equipment and devices used in the production or testing of military propellants, or parts thereof (xvi) Equipment specially designed for the production of weapons, test devices, or parts or accessories therefor (xvii) Military satellites, or parts t",25,laws_sample
-25,1,"Goods listed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry (i) Nuclear fuel materials or nuclear source materials (ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reactors",False,0.16556291390728478,"e specifications comply with
Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries
therefor, or power-generating or propulsion equipment
specially designed for nuclear reacto",0.09271523178807947,"listed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear ",0.09933774834437085,"ed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reac",0.059602649006622516,"s listed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reac",0.11589403973509933,"oods listed below whose specifications comply with
Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries
therefor, or power-generating or propulsion equipment
specially designed for nu",0.11920529801324503,"elow whose specifications comply with Order of the Ministry of Economy, Trade and Industry All regions (i) Nuclear fuel materials or nuclear source materials (ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reac",0.11920529801324503,"elow whose specifications comply with Order of the Ministry of Economy, Trade and Industry All regions (i) Nuclear fuel materials or nuclear source materials (ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reac",25,laws_sample
-26,0,"Shadow NAVAID boxes indicate Flight Service Station (FSS) loca- tions. Frequencies 122.2 and 255.4 (Conterminous U.S.); 121.5, 122.2, 243.0 and 255.4 (Alaska); and 121.5, 126.7, and 243.0 (Canada) are available at many FSSs and are not shown. All other frequencies are shown above the box. Certain FSSs provide Local Airport Advisory (LAA) on 123.6. Frequencies transmit and receive except those followed by R and q T: R - Receive Only T - Transmit Only",False,0.6026490066225165,"chedule printed) | Operating times printed next to label (part‑time availability) |
-| Shadowed NAVAID box (Canadian) | Stand-alone FSS within Canadian airspace | VICTORIA HARBOUR — 122.2 | May show availability window (e.g., ""FSS AVAILABLE 1345-0530Z#"") |
-| Legend text (FSS) | Other notes | — | Certain FSSs provide Local Airport Advisory (LAA) on 123.6. Frequencies transmit and receive except those followed by R (receive only) or T (transmit only). ",0.026490066225165563,"Shadow NAVAID boxes indicate Flight Service Station (FSS) locations. Frequencies 122.2 and 255.4 (Conterminous U.S.); 121.5, 122.2, 243.0 and 255.4 (Alaska); and 121.5, 126.7, and 243.0 (Canada) are available at many FSSs and are not shown. All other frequencies are shown above the box.
-
-Certain FSSs provide Local Airport Advisory (LAA) on 123.6.
-
-Frequencies transmit and receive except those followed by R and T:
-
-R - Receive Only
-
-T - Transmit Only",0.06622516556291391,"dow NAVAID boxes indicate Flight Service Station (FSS) locations. Frequencies 122.2 and 255.4 (Conterminous U.S.); 121.5, 122.2, 243.0 and 255.4 (Alaska); and 121.5, 126.7, and 243.0 (Canada) are available at many FSSs and are not shown. All other frequencies are shown above the box.
-
-Certain FSSs provide Local Airport Advisory (LAA) on 123.6.
-
-Frequencies transmit and receive except those followed by R and T:
-- **R** - Receive Only
-- **T** - Transm",0.026490066225165563,"
-Shadow NAVAID boxes indicate Flight Service Station (FSS) locations. Frequencies 122.2 and 255.4 (Conterminous U.S.); 121.5, 122.2, 243.0 and 255.4 (Alaska); and 121.5, 126.7, and 243.0 (Canada) are available at many FSSs and are not shown. All other frequencies are shown above the box.
-
-Certain FSSs provide Local Airport Advisory (LAA) on 123.6.
-
-Frequencies transmit and receive except those followed by R and T:
-R - Receive Only
-T - Transmit Only
-",0.82560706401766,"## **RADIO AIDS TO NAVIGATION (Continued)**
-
-## **Stand Alone Flight Services and Communication Outlets**
-
-**==> picture [566 x 545] intentionally omitted <==**
-
-**==> picture [121 x 40] intentionally omitted <==**
-
-**==> picture [117 x 38] intentionally omitted <==**
-
-74
-
-",0.8675496688741722,"## RADIO AIDS TO NAVIGATION (Continued)
-
-## Stand Alone Flight Services and Communication Outlets
-
-",0.8675496688741722,"## RADIO AIDS TO NAVIGATION (Continued)
-
-## Stand Alone Flight Services and Communication Outlets
-
-",26,laws_sample
-26,1,"Thin line NAVAID boxes without frequencies and controlling FSS name indicate no FSS frequencies available. Frequencies posi- tioned above the thin line boxes are remoted to the NAVAID sites. Other frequencies at the controlling FSS named are available, however altitude and terrain may determine their reception. In Canada, a “D” after the frequency indicates a dial-up remote communications outlet.",False,0.7343358395989975,"ed by R (receive only) or T (transmit only). |
-| Thin-line NAVAID box (no frequencies) | Remote Communications Outlet (RCO) with no local FSS frequencies shown | (general) — frequencies positioned above thin line boxes are remoted to the controlling FSS | In Canada, a ""D"" after a frequency indicates a dial‑up remote communications outlet. |
-
-| RCO / AWOS-ASOS Example | Meaning | Shown frequency(i",0.017543859649122806,"
-Thin line NAVAID boxes without frequencies and controlling FSS name indicate no FSS frequencies available. Frequencies positioned above the thin line boxes are remoted to the NAVAID sites. Other frequencies at the controlling FSS named are available, however altitude and terrain may determine their reception.
-
-In Canada, a ""D"" after the frequency indicates a dial-up remote communications outlet.",0.017543859649122806,"Thin line NAVAID boxes without frequencies and controlling FSS name indicate no FSS frequencies available. Frequencies positioned above the thin line boxes are remoted to the NAVAID sites. Other frequencies at the controlling FSS named are available, however altitude and terrain may determine their reception.
-
-In Canada, a ""D"" after the frequency indicates a dial-up remote communications outlet.
-",0.022556390977443608,"Thin line NAVAID boxes without frequencies and controlling FSS name indicate no FSS frequencies available. Frequencies positioned above the thin line boxes are remoted to the NAVAID sites. Other frequencies at the controlling FSS named are available, however altitude and terrain may determine their reception.*
-
-*In Canada, a ""D"" after the frequency indicates a dial-up remote communications outlet",0.7969924812030075,"## **RADIO AIDS TO NAVIGATION (Continued)**
-
-## **Stand Alone Flight Services and Communication Outlets**
-
-**==> picture [566 x 545] intentionally omitted <==**
-
-**==> picture [121 x 40] intentionally omitted <==**
-
-**==> picture [117 x 38] intentionally omitted <==**
-
-74
-
-",0.8546365914786967,"## RADIO AIDS TO NAVIGATION (Continued)
-
-## Stand Alone Flight Services and Communication Outlets
-
-",0.8546365914786967,"## RADIO AIDS TO NAVIGATION (Continued)
-
-## Stand Alone Flight Services and Communication Outlets
-
-",26,laws_sample
-27,0,"The Secretary of State for Health and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006(a). Citation, interpretation and commencement 1.—(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020. (2) In this Order “coronavirus” has the meaning described in section 1(1) of the Coronavirus Act 2020(b) (meaning of “coronavirus” and related terminology). (3) This Order comes into force on 17th April 2020. Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity 2.—(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity. (2) Paragraph (1) applies to testing carried out by the following persons — (a) members of Her Majesty’s Forces; (b) employees of The Boots Company plc, company number 00027657; and",False,0.03327338129496403,"tary of State for Health and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006(a).
-
-## Citation, interpretation and commencement
-
-1.—(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.
-
-(2) In this Order “coronavirus” has the meaning described in section 1(1) of the Coronavirus Act 2020(b) (meaning of “coronavirus” and related terminology).
-
-(3) This Order comes into force on 17th April 2020.
-
-## Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity
-
-2.—(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity.
-
-(2) Paragraph (1) applies to testing carried out by the following persons —
-
-(a) members of Her Majesty’s Forces;
-
-(b) employees of The Boots Company plc, company number 0002765",0.053057553956834536,"e Secretary of State for Health and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006(a).
-
-### **Citation, interpretation and commencement**
-
-1.—(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.
-
-(2) In this Order “coronavirus” has the meaning described in section 1(1) of the Coronavirus Act 2020(b) (meaning of “coronavirus” and related terminology).
-
-(3) This Order comes into force on 17th April 2020.
-
-### **Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity**
-
-2.—(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity.
-
-(2) Paragraph (1) applies to testing carried out by the following persons —
-
-(a) members of Her Majesty's Forces;
-(b) employees of The Boots Company plc, comp",0.06205035971223022,"y of State for Health and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006[^a].
-
-### Citation, interpretation and commencement
-
-**1.**—(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.
-
-(2) In this Order “coronavirus” has the meaning described in section 1(1) of the Coronavirus Act 2020[^b] (meaning of “coronavirus” and related terminology).
-
-(3) This Order comes into force on 17th April 2020.
-
-### Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity
-
-**2.**—(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity.
-
-(2) Paragraph (1) applies to testing carried out by the following persons —
-
-* (a) members of Her Majesty’s Forces;
-* (b) employees of The Boots Company plc, company nu",0.05755395683453238,"r Health and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006(a).
-
-**Citation, interpretation and commencement**
-
-**1.**—(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.
-
-(2) In this Order ""coronavirus"" has the meaning described in section 1(1) of the Coronavirus Act 2020(b) (meaning of ""coronavirus"" and related terminology).
-
-(3) This Order comes into force on 17th April 2020.
-
-**Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity**
-
-**2.**—(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity.
-
-(2) Paragraph (1) applies to testing carried out by the following persons —
-
-(a) members of Her Majesty's Forces;
-
-(b) employees of The Boots Company plc, company number 00027657; and",0.10431654676258993," and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006( **a** ).
-
-## **Citation, interpretation and commencement**
-
-**1.** —(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.
-
-(2) In this Order “coronavirus” has the meaning described in section 1(1) of the Coronavirus Act 2020( **b** ) (meaning of “coronavirus” and related terminology).
-
-- (3) This Order comes into force on 17th April 2020.
-
-## **Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity**
-
-**2.** —(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity.
-
-(2) Paragraph (1) applies to testing carried out by the following persons —
-
-- (a) members of Her Majesty’s Forces;
-
-(b) employees of The Boots Company plc, com",0.05485611510791367," Secretary of State for Health and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006( a ).
-
-## Citation, interpretation and commencement
-
-1. -(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.
-
-(2) In this Order 'coronavirus' has the meaning described in section 1(1) of the Coronavirus Act 2020( b ) (meaning of 'coronavirus' and related terminology).
-
-(3) This Order comes into force on 17th April 2020.
-
-## Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity
-
-2. -(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity.
-
-(2) Paragraph (1) applies to testing carried out by the following persons -
-
-- (a) members of Her Majesty's Forces;
-- (b) employees of The Boots Company plc, company",0.05485611510791367," Secretary of State for Health and Social Care makes the following Order in exercise of the powers conferred by section 61(5) of, and paragraphs 6 and 9 of Schedule 4 to, the Safeguarding Vulnerable Groups Act 2006( a ).
-
-## Citation, interpretation and commencement
-
-1. -(1) This Order may be cited as the Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.
-
-(2) In this Order 'coronavirus' has the meaning described in section 1(1) of the Coronavirus Act 2020( b ) (meaning of 'coronavirus' and related terminology).
-
-(3) This Order comes into force on 17th April 2020.
-
-## Removing saliva or mucus for the purpose of testing for coronavirus is not to be treated as a regulated activity
-
-2. -(1) Removing saliva or mucus from the mouth or nose of an individual where that is being done for the purpose of testing the presence of coronavirus in that individual, is not to be treated as a regulated activity.
-
-(2) Paragraph (1) applies to testing carried out by the following persons -
-
-- (a) members of Her Majesty's Forces;
-- (b) employees of The Boots Company plc, company",27,laws_sample
-27,1,The Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020,False,0.02197802197802198,he Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020.,0.0,The Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020,0.0,The Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020,0.0,The Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020,0.0,The Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020,0.0,The Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020,0.0,The Safeguarding Vulnerable Groups Act 2006 (Regulated Activities) (Coronavirus) Order 2020,27,laws_sample
-28,0,"due to thc~ low combustion pressure and values of c, from 2.0 to 4.0 are typical with aftet- burner operation. p The turbojet engine usually has a strong preference fot high RPM to produce low specif- ic fuel consumption. Since the normal rated thrust condition is a particular design point for the engine, the minimum value of c, will occur at or near this range of RPM. The illustration of figure 2.10 shows a typical vati- ation of c, with percent maximum RPM where values of RPM less than 80 to 85 percent pro- duce a specific fuel consumption much greater than the minimum obtainable. This pref- erence for high.RPM to obtain low values of C, is very pronounced in the fixed geometry engine. Turbojet engines with multispool compressors tend to be less sensitive in this respect and are more flexible in their operating characteristics. Whenever low values of cI ate necessary to obtain range or endurance, the preference of the turboiet engine for the design operating RPM can be a factor of great influence. Altitude is one factor which strongly affects the performance of the turbojet engine. An increase in altitude produces a decrease in density and pressure and, if below the tropo- pause, a decrease in temperature. If a typical nonaftcrbutning turbojet engine is operated at a constant RPM and true airspeed, the vatia- tion of thtust and specific fuel consumption with altitude can be approximated from figure 221. The variation of density in the standard atmosphere is shown by the values of density ratio at vatious altitudes. Typical values of the density ratio at specific altitudes are as follows:",False,0.05012376237623763,"to thc~low combustion pressure and values of c, from 2.0 to 4.0 are typical with aftetburner operation.
-
-The turbojet engine usually has a strong
-
-preference fot high RPM to produce low specific fuel consumption. Since the normal rated
-
-thrust condition is a particular design point
-for the engine, the minimum value of c, will
-occur at or near this range of RPM. The
-
-illustration of figure 2.10 shows a typical vatiation of c, with percent maximum RPM where
-
-values of RPM less than 80 to 85 percent produce a specific fuel consumption much greater
-
-than the minimum obtainable. This preference for high.RPM to obtain low values of
-
-C, is very pronounced in the fixed geometry
-engine. Turbojet engines with multispool [ ]
-compressors tend to be less sensitive in this
-respect and are more flexible in their operating
-characteristics. Whenever low values of cI ate
-necessary to obtain range or endurance, the
-preference of the turboiet engine for the design
-operating RPM can be a factor of great
-influence.
-
-Altitude is one factor which strongly affects
-the performance of the turbojet engine. An [ ]
-increase in altitude produces a decrease in
-
-density and pressure and, if below the tropopause, a decrease in temperature. If a typical
-
-nonaftcrbutning turbojet engine is operated at
-
-a constant RPM and true airspeed, the vatiation of thtust and specific fuel consumption
-
-with altitude can be approximated from figure
-221. The variation of density in the standard [ ]
-atmosphere is shown by the values of density
-ratio at vatious altitudes. Typical values of
-the density ratio at specific altitudes are ",0.04641089108910891,"e low combustion pressure and values of $c_i$ from 2.0 to 4.0 are typical with afterburner operation.
-
-The turbojet engine usually has a strong preference for high RPM to produce low specific fuel consumption. Since the normal rated thrust condition is a particular design point for the engine, the minimum value of $c_i$ will occur at or near this range of RPM. The illustration of figure 2.10 shows a typical variation of $c_i$ with percent maximum RPM where values of RPM less than 80 to 85 percent produce a specific fuel consumption much greater than the minimum obtainable. This preference for high RPM to obtain low values of $c_i$ is very pronounced in the fixed geometry engine. Turbojet engines with multispool compressors tend to be less sensitive in this respect and are more flexible in their operating characteristics. Whenever low values of $c_i$ are necessary to obtain range or endurance, the preference of the turbojet engine for the design operating RPM can be a factor of great influence.
-
-Altitude is one factor which strongly affects the performance of the turbojet engine. An increase in altitude produces a decrease in density and pressure and, if below the tropopause, a decrease in temperature. If a typical nonafterburning turbojet engine is operated at a constant RPM and true airspeed, the variation of thrust and specific fuel consumption with altitude can be approximated from figure 2.11. The variation of density in the standard atmosphere is shown by the values of density ratio at various altitudes. Typical values of the density ratio at specific altitudes are as follow",0.034653465346534656,"ue to the low combustion pressure and values of $c_t$ from 2.0 to 4.0 are typical with afterburner operation.
-
-The turbojet engine usually has a strong preference for high RPM to produce low specific fuel consumption. Since the normal rated thrust condition is a particular design point for the engine, the minimum value of $c_t$ will occur at or near this range of RPM. The illustration of figure 2.10 shows a typical variation of $c_t$ with percent maximum RPM where values of RPM less than 80 to 85 percent produce a specific fuel consumption much greater than the minimum obtainable. This preference for high RPM to obtain low values of $c_t$ is very pronounced in the fixed geometry engine. Turbojet engines with multispool compressors tend to be less sensitive in this respect and are more flexible in their operating characteristics. Whenever low values of $c_t$ are necessary to obtain range or endurance, the preference of the turbojet engine for the design operating RPM can be a factor of great influence.
-
-Altitude is one factor which strongly affects the performance of the turbojet engine. An increase in altitude produces a decrease in density and pressure and, if below the tropopause, a decrease in temperature. If a typical nonafterburning turbojet engine is operated at a constant RPM and true airspeed, the variation of thrust and specific fuel consumption with altitude can be approximated from figure 2.11. The variation of density in the standard atmosphere is shown by the values of density ratio at various altitudes. Typical values of the density ratio at specific altitudes are as follows:",0.0823019801980198,"
-due to the low combustion pressure and values of ct from 2.0 to 4.0 are typical with afterburner operation.
-
-The turbojet engine usually has a strong preference for high RPM to produce low specific fuel consumption. Since the normal rated thrust condition is a particular design point for the engine, the minimum value of ct will occur at or near this range of RPM. The variation of ct with percent maximum RPM where values of RPM less than 80 to 85 percent produce a specific fuel consumption much greater than the minimum obtainable. This preference for high RPM to obtain low values of ct is very pronounced in the fixed geometry engine. Turbojet engines with multispool compressors tend to be less sensitive in this respect and are more flexible in their operating characteristics. Whenever low values of ct are necessary to obtain range or endurance, the preference of the turbojet engine for the design operating RPM can be a factor of great influence.
-
-Altitude is one factor which strongly affects the performance of the turbojet engine. An increase in altitude produces a decrease in density and pressure and, if below the tropopause, a decrease in temperature. If a typical nonafterburning turbojet engine is operated at a constant RPM and true airspeed, the variation of thrust and specific fuel consumption with altitude can be approximated from figure 2.11. The variation of density in the standard atmosphere is shown by the values of density ratio at various altitudes. Typical values of the density ratio at specific altitudes are as follows:
-
-",0.011138613861386138,"due to thc~ low combustion pressure and values of c, from 2.0 to 4.0 are typical with aftetburner operation.
-
-The turbojet engine usually has a strong preference fot high RPM to produce low specific fuel consumption. Since the normal rated thrust condition is a particular design point for the engine, the minimum value of c, will occur at or near this range of RPM. The illustration of figure 2.10 shows a typical vatiation of c, with percent maximum RPM where values of RPM less than 80 to 85 percent produce a specific fuel consumption much greater than the minimum obtainable. This preference for high.RPM to obtain low values of C, is very pronounced in the fixed geometry engine. Turbojet engines with multispool compressors tend to be less sensitive in this respect and are more flexible in their operating characteristics. Whenever low values of cI ate necessary to obtain range or endurance, the preference of the turboiet engine for the design operating RPM can be a factor of great influence.
-
-Altitude is one factor which strongly affects the performance of the turbojet engine. An increase in altitude produces a decrease in density and pressure and, if below the tropopause, a decrease in temperature. If a typical nonaftcrbutning turbojet engine is operated at a constant RPM and true airspeed, the vatiation of thtust and specific fuel consumption with altitude can be approximated from figure 221. The variation of density in the standard atmosphere is shown by the values of density ratio at vatious altitudes. Typical values of the density ratio at specific altitudes are as follows:",0.11757425742574257," are typical with aftetburner operation.
-
-The turbojet engine usually has a strong preference fot high RPM to produce low specific fuel consumption. Since the normal rated thrust condition is a particular design point for the engine, the minimum value of c, will occur at or near this range of RPM. The illustration of figure 2.10 shows a typical vatiation of c, with percent maximum RPM where values of RPM less than 80 to 85 percent produce a specific fuel consumption much greater than the minimum obtainable. This preference for high.RPM to obtain low values of C, is very pronounced in the fixed geometry engine. Turbojet engines with multispool compressors tend to be less sensitive in this respect and are more flexible in their operating characteristics. Whenever low values of cI ate necessary to obtain range or endurance, the preference of the turboiet engine for the design operating RPM can be a factor of great influence.
-
-Altitude is one factor which strongly affects the performance of the turbojet engine. An increase in altitude produces a decrease in density and pressure and, if below the tropopause, a decrease in temperature. If a typical nonaftcrbutning turbojet engine is operated at a constant RPM and true airspeed, the vatiation of thtust and specific fuel consumption with altitude can be approximated from figure 221. The variation of density in the standard atmosphere is shown by the values of density ratio at vatious altitudes. Typical values of the density ratio at specific altitudes are ",0.11757425742574257," are typical with aftetburner operation.
-
-The turbojet engine usually has a strong preference fot high RPM to produce low specific fuel consumption. Since the normal rated thrust condition is a particular design point for the engine, the minimum value of c, will occur at or near this range of RPM. The illustration of figure 2.10 shows a typical vatiation of c, with percent maximum RPM where values of RPM less than 80 to 85 percent produce a specific fuel consumption much greater than the minimum obtainable. This preference for high.RPM to obtain low values of C, is very pronounced in the fixed geometry engine. Turbojet engines with multispool compressors tend to be less sensitive in this respect and are more flexible in their operating characteristics. Whenever low values of cI ate necessary to obtain range or endurance, the preference of the turboiet engine for the design operating RPM can be a factor of great influence.
-
-Altitude is one factor which strongly affects the performance of the turbojet engine. An increase in altitude produces a decrease in density and pressure and, if below the tropopause, a decrease in temperature. If a typical nonaftcrbutning turbojet engine is operated at a constant RPM and true airspeed, the vatiation of thtust and specific fuel consumption with altitude can be approximated from figure 221. The variation of density in the standard atmosphere is shown by the values of density ratio at vatious altitudes. Typical values of the density ratio at specific altitudes are ",28,laws_sample
-28,1,"If the fixed geometry engine is operated at a constant V (TAS) in subsonic flight and con- stant N (RPM) the inlet velocity, inlet ram, and compressor pressure ratio are essentially constant with altitude. An increase in alti- tude then causes the engine air mass flow to decrease in a manner very nearly identical to the altitude density ratio. Of coutsc, this de- crease in mass flow will produce a significant e&ct on the output thrust of the engine. Actually, the variation of thrust with altitude is not quite as severe as the density variation because favorable decreases in temperature occut. The decrease in inlet air temperature will provide a relatively greater combustion gas &ergy and allow a greater jet velocity. The increase in jet velocity somewhat offsets the decrease in mass flow. Of course, an in- crease in altitude provides lower temperatures below the tropopause. Above the tropopause, no further favorable decrease in temperature takes place so a more rapid variation of thrust will take place. The approximate variation of thrust with altitude is represented by figure 2.11 and some typical values at specific alti- tudes ate as follows :",False,0.043852106620808254,"he fixed geometry engine is operated at a
-
-constant V (TAS) in subsonic flight and con-
- stant N (RPM) the inlet velocity, inlet ram,
-
-and compressor pressure ratio are essentially
-
-constant with altitude. An increase in altitude then causes the engine air mass flow to
-
-decrease in a manner very nearly identical to
-
-the altitude density ratio. Of coutsc, this decrease in mass flow will produce a significant
-
-e&ct on the output thrust of the engine.
-Actually, the variation of thrust with altitude
-is not quite as severe as the density variation
-because favorable decreases in temperature
-occut. The decrease in inlet air temperature [ ]
-will provide a relatively greater combustion
-gas &ergy and allow a greater jet velocity.
-The increase in jet velocity somewhat offsets
-
-the decrease in mass flow. Of course, an increase in altitude provides lower temperatures
-
-below the tropopause. Above the tropopause,
-no further favorable decrease in temperature
-takes place so a more rapid variation of thrust
-will take place. The approximate variation
-of thrust with altitude is represented by figure
-
-2.11 and some typical values at specific altitudes ate as fol",0.02407566638005159,"If the fixed geometry engine is operated at a constant $V$ (TAS) in subsonic flight and constant $N$ (RPM) the inlet velocity, inlet ram, and compressor pressure ratio are essentially constant with altitude. An increase in altitude then causes the engine air mass flow to decrease in a manner very nearly identical to the altitude density ratio. Of course, this decrease in mass flow will produce a significant effect on the output thrust of the engine. Actually, the variation of thrust with altitude is not quite as severe as the density variation because favorable decreases in temperature occur. The decrease in inlet air temperature will provide a relatively greater combustion gas energy and allow a greater jet velocity. The increase in jet velocity somewhat offsets the decrease in mass flow. Of course, an increase in altitude provides lower temperatures below the tropopause. Above the tropopause, no further favorable decrease in temperature takes place so a more rapid variation of thrust will take place. The approximate variation of thrust with altitude is represented by figure 2.11 and some typical values at specific altitudes are as follows:",0.02407566638005159," |
-
-If the fixed geometry engine is operated at a constant $V$ (TAS) in subsonic flight and constant $N$ (RPM) the inlet velocity, inlet ram, and compressor pressure ratio are essentially constant with altitude. An increase in altitude then causes the engine air mass flow to decrease in a manner very nearly identical to the altitude density ratio. Of course, this decrease in mass flow will produce a significant effect on the output thrust of the engine. Actually, the variation of thrust with altitude is not quite as severe as the density variation because favorable decreases in temperature occur. The decrease in inlet air temperature will provide a relatively greater combustion gas energy and allow a greater jet velocity. The increase in jet velocity somewhat offsets the decrease in mass flow. Of course, an increase in altitude provides lower temperatures below the tropopause. Above the tropopause, no further favorable decrease in temperature takes place so a more rapid variation of thrust will take place. The approximate variation of thrust with altitude is represented by figure 2.11 and some typical values at specific altitudes are as follows:",0.023215821152192607,"If the fixed geometry engine is operated at a constant V (TAS) in subsonic flight and constant N (RPM) the inlet velocity, inlet ram, and compressor pressure ratio are essentially constant with altitude. An increase in altitude then causes the engine air mass flow to decrease in a manner very nearly identical to the altitude density ratio. Of course, this decrease in mass flow will produce a significant effect on the output thrust of the engine. Actually, the variation of thrust with altitude is not quite as severe as the density variation because favorable decreases in temperature occur. The decrease in inlet air temperature will provide a relatively greater combustion gas energy and allow a greater jet velocity. The increase in jet velocity somewhat offsets the decrease in mass flow. Of course, an increase in altitude provides lower temperatures below the tropopause. Above the tropopause, no further favorable decrease in temperature takes place so a more rapid variation of thrust will take place. The approximate variation of thrust with altitude is represented by figure 2.11 and some typical values at specific altitudes are as follows:
-
-| Alti",0.017196904557179708,"If the fixed geometry engine is operated at a constant V (TAS) in subsonic flight and constant N (RPM) the inlet velocity, inlet ram, and compressor pressure ratio are essentially constant with altitude. An increase in altitude then causes the engine air mass flow to decrease in a manner very nearly identical to the altitude density ratio. Of coutsc, this decrease in mass flow will produce a significant e&ct on the output thrust of the engine. Actually, the variation of thrust with altitude is not quite as severe as the density variation because favorable decreases in temperature occut. The decrease in inlet air temperature will provide a relatively greater combustion gas &ergy and allow a greater jet velocity. The increase in jet velocity somewhat offsets the decrease in mass flow. Of course, an increase in altitude provides lower temperatures below the tropopause. Above the tropopause, no further favorable decrease in temperature takes place so a more rapid variation of thrust will take place. The approximate variation of thrust with altitude is represented by figure 2.11 and some typical values at specific altitudes ate as follows :
-
-|RIrio ",0.12725709372312985,"constant V (TAS) in subsonic flight and constant N (RPM) the inlet velocity, inlet ram, and compressor pressure ratio are essentially constant with altitude. An increase in altitude then causes the engine air mass flow to decrease in a manner very nearly identical to the altitude density ratio. Of coutsc, this decrease in mass flow will produce a significant e&ct on the output thrust of the engine. Actually, the variation of thrust with altitude is not quite as severe as the density variation because favorable decreases in temperature occut. The decrease in inlet air temperature will provide a relatively greater combustion gas &ergy and allow a greater jet velocity. The increase in jet velocity somewhat offsets the decrease in mass flow. Of course, an increase in altitude provides lower temperatures below the tropopause. Above the tropopause, no further favorable decrease in temperature takes place so a more rapid variation of thrust will take place. The approximate variation of thrust with altitude is represented by figure 2.11 and some typical values at specific altitude",0.12725709372312985,"constant V (TAS) in subsonic flight and constant N (RPM) the inlet velocity, inlet ram, and compressor pressure ratio are essentially constant with altitude. An increase in altitude then causes the engine air mass flow to decrease in a manner very nearly identical to the altitude density ratio. Of coutsc, this decrease in mass flow will produce a significant e&ct on the output thrust of the engine. Actually, the variation of thrust with altitude is not quite as severe as the density variation because favorable decreases in temperature occut. The decrease in inlet air temperature will provide a relatively greater combustion gas &ergy and allow a greater jet velocity. The increase in jet velocity somewhat offsets the decrease in mass flow. Of course, an increase in altitude provides lower temperatures below the tropopause. Above the tropopause, no further favorable decrease in temperature takes place so a more rapid variation of thrust will take place. The approximate variation of thrust with altitude is represented by figure 2.11 and some typical values at specific altitude",28,laws_sample
-28,2,"Since the change in density with altitude is quite rapid at low altitude turbojet takeoff pet- formance wil1 Abegreatly affected at high alti- tude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value. The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 per- cent at high altitude.",False,0.02028397565922921,"
-Since the change in density with altitude is quite rapid at low altitude turbojet takeoff petformance wil1 Abe greatly affected at high altitude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value.
-
-The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 percent at high altitude.",0.02434077079107505,"Since the change in density with altitude is quite rapid at low altitude turbojet takeoff performance will be greatly affected at high altitude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value.
-
-The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 percent at high altitude.",0.034482758620689655," |
-
-Since the change in density with altitude is quite rapid at low altitude turbojet takeoff performance will be greatly affected at high altitude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value.
-
-The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 percent at high altitude.
-",0.034482758620689655,"Since the change in density with altitude is quite rapid at low altitude turbojet takeoff performance will be greatly affected at high altitude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value.
-
-The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 percent at high altitude.
-
-119",0.02434077079107505,"
-
-
-Since the change in density with altitude is quite rapid at low altitude turbojet takeoff petformance wil1 Abe greatly affected at high altitude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value.
-
-The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 percent at high altitude.",0.1359026369168357,"hange in density with altitude is quite rapid at low altitude turbojet takeoff petformance wil1 Abe greatly affected at high altitude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value.
-
-The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 percent ",0.1359026369168357,"hange in density with altitude is quite rapid at low altitude turbojet takeoff petformance wil1 Abe greatly affected at high altitude. Also note that the thrust at 35,000 ft. is approximately 39 percent of the sea level value.
-
-The thrust added by the afterburner of a turbojet engine is not affected so greatly by altitude as the basic engine thrust. The use of afterburner may provide a thrust increase of 50 percent at low altitude or as much as 100 percent ",28,laws_sample
-29,0,"Abkommen für T‑DAB Wiesbaden 1995 und Maastricht 2002 und für DVB‑T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). b fü di j il f bhä i i d f ld ä k i d fü l d gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU‑R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKW- Tonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T‑DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position „Medianwert der Mindestfeldstärke“) und Angaben für den Betrieb eines DVB‑T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position „Medianwert für die minimale äquivalente Feldstärke“). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt. f d i d b b i k i d fü i S d f k l i Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt. Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",False,0.20122365737593473,"Ein Service des Bundesministeriums der Justiz und für Verbraucherschutz
-
-sowie des Bundesamts für Justiz ‒ www.gesetze-im-internet.de
-
-Abkommen für T‑DAB Wiesbaden 1995 und Maastricht 2002 und für DVB‑T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992).
-
-Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU‑R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKWTonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T‑DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position „Medianwert der Mindestfeldstärke“) und Angaben für den Betrieb eines DVB‑T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position „Medianwert für die minimale äquivalente Feldstärke“). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt.
-
-Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",0.1617946974847043,"
-
-Abkommen für T-DAB Wiesbaden 1995 und Maastricht 2002 und für DVB-T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU-R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKW-Tonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T-DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position „Medianwert der Mindestfeldstärke“) und Angaben für den Betrieb eines DVB-T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position „Medianwert für die minimale äquivalente Feldstärke“). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt. Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",0.22365737593473828,"Ein Service des Bundesministeriums der Justiz und für Verbraucherschutz sowie des Bundesamts für Justiz ‒ [www.gesetze-im-internet.de](http://www.gesetze-im-internet.de)
-
----
-
-Abkommen für T‑DAB Wiesbaden 1995 und Maastricht 2002 und für DVB‑T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992).
-
-Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU‑R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKW-Tonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T‑DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position „Medianwert der Mindestfeldstärke“) und Angaben für den Betrieb eines DVB‑T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position „Medianwert für die minimale äquivalente Feldstärke“). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt.
-
-Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung $r$ vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement $A$ berechnet werden:",0.20394289598912305,"
-
-Ein Service des Bundesministeriums der Justiz und für Verbraucherschutz
-sowie des Bundesamts für Justiz – www.gesetze-im-internet.de
-
-Abkommen für T-DAB Wiesbaden 1995 und Maastricht 2002 und für DVB-T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992).
-
-Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU-R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKW-Tonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T-DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position „Medianwert der Mindestfeldstärke"") und Angaben für den Betrieb eines DVB-T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position „Medianwert für die minimale äquivalente Feldstärke""). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt.
-
-Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",0.19850441876274644,"Ein Service des Bundesministeriums der Justiz und für Verbraucherschutz sowie des Bundesamts für Justiz ‒ www.gesetze-im-internet.de
-
-Abkommen für T‑DAB Wiesbaden 1995 und Maastricht 2002 und für DVB‑T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU‑R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKWTonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T‑DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position „Medianwert der Mindestfeldstärke“) und Angaben für den Betrieb eines DVB‑T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position „Medianwert für die minimale äquivalente Feldstärke“). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt.
-
-Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",0.16383412644459552,"Abkommen für T-DAB Wiesbaden 1995 und Maastricht 2002 und für DVB-T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU-R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKWTonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T-DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position 'Medianwert der Mindestfeldstärke') und Angaben für den Betrieb eines DVB-T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position 'Medianwert für die minimale äquivalente Feldstärke'). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt. Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",0.16383412644459552,"Abkommen für T-DAB Wiesbaden 1995 und Maastricht 2002 und für DVB-T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU-R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKWTonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T-DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position 'Medianwert der Mindestfeldstärke') und Angaben für den Betrieb eines DVB-T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position 'Medianwert für die minimale äquivalente Feldstärke'). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt. Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",29,laws_sample
-30,0,"Chapter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph; (b) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph, a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless- (i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembly; and",False,0.025714285714285714,"ter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
-
- (b) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph,
-
-## a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless-
-
- (i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembly;",0.015714285714285715,"hapter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
-(b) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph;
-
-a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless-
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-(i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembly; ",0.012857142857142857,"pter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
-
-(b) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph,
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-a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless-
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-(i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembly; and",0.012857142857142857,"apter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
-
-(b) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph,
-
-a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless-
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-(i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembly; an",0.06285714285714286,"s 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
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- - ( _b_ ) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph,
-
-- a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless-
-
- - (i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembly; ",0.024285714285714285,"apter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
-- ( b ) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph,
-
-a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless-
-
-- (i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembl",0.024285714285714285,"apter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
-- ( b ) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph,
-
-a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless-
-
-- (i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembl",30,laws_sample
-31,0,"(1) The seat of an Elected Member or a Specially Elected Member of the National Assembly shall become vacant- (a) upon the dissolution of Parliament; (b) if he or she is absent from the sittings of the Assembly for such period and in such circumstances as may be prescribed in the rules of procedure of the Assembly; (c) subject to the provisions of subsections (2) to (3) of this section, if any circumstances arise that, if he or she were not a Member of the Assembly, would cause him or her to be disqualified for election thereto. (2) If circumstances such as are referred to in paragraph (c) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a period of 30 days",False,0.015012510425354461,"1) The seat of an Elected Member or a Specially Elected Member of the National Assembly shall become vacant-
-
- (a) upon the dissolution of Parliament;
-
- (b) if he or she is absent from the sittings of the Assembly for such period and in such circumstances as may be prescribed in the rules of procedure of the Assembly;
-
- (c) subject to the provisions of subsections (2) to (3) of this section, if any circumstances arise that, if he or she were not a Member of the Assembly, would cause him or her to be disqualified for election thereto.
-
-(2) If circumstances such as are referred to in paragraph (c) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a period of 3",0.012510425354462052,"
-(1) The seat of an Elected Member or a Specially Elected Member of the National Assembly shall become vacant-
-
-1. upon the dissolution of Parliament;
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-3. subject to the provisions of subsections (2) to (3) of this section, if any circumstances arise that, if he or she were not a Member of the Assembly, would cause him or her to be disqualified for election thereto.
-
-(2) If circumstances such as are referred to in paragraph (c) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a period of 30 days",0.011676396997497914,"1) The seat of an Elected Member or a Specially Elected Member of the National Assembly shall become vacant-
-
-(a) upon the dissolution of Parliament;
-(b) if he or she is absent from the sittings of the Assembly for such period and in such circumstances as may be prescribed in the rules of procedure of the Assembly;
-(c) subject to the provisions of subsections (2) to (3) of this section, if any circumstances arise that, if he or she were not a Member of the Assembly, would cause him or her to be disqualified for election thereto.
-
-(2) If circumstances such as are referred to in paragraph (c) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a period of 30",0.014178482068390326,"The seat of an Elected Member or a Specially Elected Member of the National Assembly shall become vacant-
-
-* (a) upon the dissolution of Parliament;
-* (b) if he or she is absent from the sittings of the Assembly for such period and in such circumstances as may be prescribed in the rules of procedure of the Assembly;
-* (c) subject to the provisions of subsections (2) to (3) of this section, if any circumstances arise that, if he or she were not a Member of the Assembly, would cause him or her to be disqualified for election thereto.
-
-(2) If circumstances such as are referred to in paragraph (c) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a period of 30 ",0.0567139282735613,"lected Member or a Specially Elected Member of the National Assembly shall become vacant-
-
-- ( _a_ ) upon the dissolution of Parliament;
-
-- ( _b_ ) if he or she is absent from the sittings of the Assembly for such period and in such
-
-- circumstances as may be prescribed in the rules of procedure of the Assembly;
-
-- ( _c_ ) subject to the provisions of subsections (2) to (3) of this section, if any circumstances arise that, if he or she were not a Member of the Assembly, would cause him or her to be disqualified for election thereto.
-
-(2) If circumstances such as are referred to in paragraph ( _c_ ) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a per",0.027522935779816515,"(1) The seat of an Elected Member or a Specially Elected Member of the National Assembly shall become vacant-
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-- ( a ) upon the dissolution of Parliament;
-- ( b ) if he or she is absent from the sittings of the Assembly for such period and in such circumstances as may be prescribed in the rules of procedure of the Assembly;
-- ( c ) subject to the provisions of subsections (2) to (3) of this section, if any circumstances arise that, if he or she were not a Member of the Assembly, would cause him or her to be disqualified for election thereto.
-
-(2) If circumstances such as are referred to in paragraph ( c ) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a p",0.027522935779816515,"(1) The seat of an Elected Member or a Specially Elected Member of the National Assembly shall become vacant-
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-- ( a ) upon the dissolution of Parliament;
-- ( b ) if he or she is absent from the sittings of the Assembly for such period and in such circumstances as may be prescribed in the rules of procedure of the Assembly;
-- ( c ) subject to the provisions of subsections (2) to (3) of this section, if any circumstances arise that, if he or she were not a Member of the Assembly, would cause him or her to be disqualified for election thereto.
-
-(2) If circumstances such as are referred to in paragraph ( c ) of the preceding subsection arise in relation to a Member of the Assembly by virtue of the fact that he or she is declared insolvent, adjudged to be of unsound mind, sentenced to death or imprisonment, or convicted of an election offence and it is open to the Member to appeal against the decision (either with the leave of the court or other authority or without such leave), he or she shall forthwith cease to perform his or her functions as a Member of the Assembly but, subject to the next following subsection, he or she shall not vacate his or her seat until the expiration of a p",31,laws_sample
-32,0,"invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment. p p p q p (3) Operating Limitatiom. The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident. p y (4) Flight Characteristics. While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot. (5) Operating Data. The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and elnccate the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane. p Great time and effort are expended in the 1 preparation of the flight handbook to provide the most exact information, data, and pro- cedures. Diligent study and continuous UC of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.",False,0.02601156069364162,"NG
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-invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment.
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-(3) Operating Limitatiom. The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
-
-(4) Flight Characteristics. While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot.
-
-(5) Operating Data. The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and elnccate the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane.
-
-Great time and effort are expended in the 1 preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent study and continuous UC of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.
-
-A fight",0.03540462427745665,"FLYING
-
-invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment.
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-(3) *Operating Limitations.* The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
-
-(4) *Flight Characteristics.* While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot.
-
-(5) *Operating Data.* The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and execute the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane.
-
-Great time and effort are expended in the preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent study and continuous use of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.
-",0.03540462427745665,"
-invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment.
-
-(3) *Operating Limitations*. The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
-
-(4) *Flight Characteristics*. While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot.
-
-(5) *Operating Data*. The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and execute the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane.
-
-Great time and effort are expended in the preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent *study* and continuous *use* of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.
-
-![",0.03540462427745665,"*
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-invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment.
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-(3) *Operating Limitations.* The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
-
-(4) *Flight Characteristics.* While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot.
-
-(5) *Operating Data.* The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and execute the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane.
-
-Great time and effort are expended in the preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent *study* and continuous *use* of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.
-
-",0.023121387283236993,"NG
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-invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment. (3) Operating Limitatiom. The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
-
-(4) Flight Characteristics. While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot.
-
-(5) Operating Data. The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and elnccate the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane.
-
-Great time and effort are expended in the 1 preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent study and continuous UC of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.
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-**==",0.08164739884393063,"invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment.
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-(3) Operating Limitatiom. The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
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-(4) Flight Characteristics. While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot.
-
-(5) Operating Data. The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and elnccate the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane.
-
-Great time and effort are expended in the preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent study and continuous UC of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the ",0.08164739884393063,"invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment.
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-(3) Operating Limitatiom. The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
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-(4) Flight Characteristics. While all aircraft will have certain minimum requirements for flying qualities, the actual peculiarities and special features of specific airplanes will differ. These particular flight characteristics must be well known and understood by the pilot.
-
-(5) Operating Data. The performance of each specific airplane defines its application to various uses and missions. The handbook operating data must be available at all times to properly plan and elnccate the flight of an aircraft. Constant reference to the operating data will insure safe and effective operation of the airplane.
-
-Great time and effort are expended in the preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent study and continuous UC of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the ",32,laws_sample
-33,0,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right. Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24.",False,0.006437768240343348,"unway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24.",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.008583690987124463,"unway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",33,laws_sample
-34,0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",False,0.0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",0.0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",0.0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",0.0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",0.0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",0.0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",0.0,"The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.",34,laws_sample
-35,0,"As illustrated, at high gross weights above the basic configuration weight, the limit and ulti- mate load factors may be seriously reduced. For the airplane shown, a 5-g maneuver im- mediately after a high gross weight takeoff could be very near the “disaster regime,” especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience great- ly increased limit and ultimate load factors. Operation in this region of high load factors at .low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncom- mon to have a modern airplane configuration with more than SO percent of its gross weight as fuel. GUST LOAD FACTORS. Gusts are asso- ciated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vec- torial addition of the gust velocity to the air- plane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The incre- ment change in load factor due to the vertical gust can be determined from the following equation:",False,0.04236200256739409," illustrated, at high gross weights above the
-
-basic configuration weight, the limit and ultimate load factors may be seriously reduced.
-
-For the airplane shown, a 5-g maneuver immediately after a high gross weight takeoff
-
-could be very near the “disaster regime,”
-especially if turbulence is associated with the
-maneuver. In the same sense, this airplane [ ]
-at very low operating weights below that of
-
-the basic configuration would experience greatly increased limit and ultimate load factors.
-
-Operation in this region of high load factors at .low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncommon to have a modern airplane configuration with more than SO percent of its gross weight as fuel.
-
-GUST LOAD FACTORS. Gusts are associated with the vertical and horizontal velocity
-
-gradients in the atmosphere. A horizontal [ ]
-gust produces a change in dynamic pressure on
-the airplane but causes relatively small and
-unimportant changes in flight load factor.
-The more important gusts are the vertical gusts
-which cause changes in angle of attack. This
-
-process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of
-
-attack and change in lift. The change in angle
-of attack at some flight condition causes a
-
-change in the flight load factor. The increment change in load factor due to the vertical
-
-gust can be determined from the following",0.025673940949935817,"
-
-As illustrated, at high gross weights above the basic configuration weight, the limit and ultimate load factors may be seriously reduced. For the airplane shown, a 5-g maneuver immediately after a high gross weight takeoff could be very near the ""disaster regime,"" especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience greatly increased limit and ultimate load factors.
-
-Operation in this region of high load factors at low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncommon to have a modern airplane configuration with more than 50 percent of its gross weight as fuel.
-
-**GUST LOAD FACTORS.** Gusts are associated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The increment change in load factor due to the vertical gust can be determined from the following equation:
-
-$$\Delt",0.02631578947368421,"12.60 |
-
-As illustrated, at high gross weights above the basic configuration weight, the limit and ultimate load factors may be seriously reduced. For the airplane shown, a 5-g maneuver immediately after a high gross weight takeoff could be very near the ""disaster regime,"" especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience greatly increased limit and ultimate load factors.
-
-Operation in this region of high load factors at low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncommon to have a modern airplane configuration with more than 50 percent of its gross weight as fuel.
-
-### GUST LOAD FACTORS
-
-Gusts are associated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The increment change in load factor due to the vertical gust can be determined from the following equation:
-
-",0.025673940949935817," |
-
-
-As illustrated, at high gross weights above the basic configuration weight, the limit and ultimate load factors may be seriously reduced. For the airplane shown, a 5-*g* maneuver immediately after a high gross weight takeoff could be very near the ""disaster regime,"" especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience greatly increased limit and ultimate load factors.
-
-Operation in this region of high load factors at low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncommon to have a modern airplane configuration with more than 50 percent of its gross weight as fuel.
-
-GUST LOAD FACTORS. Gusts are associated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The increment change in load factor due to the vertical gust can be determined from the following equation:
-
-$$\Del",0.02053915275994865,"
-
-
-As illustrated, at high gross weights above the basic configuration weight, the limit and ultimate load factors may be seriously reduced. For the airplane shown, a 5-g maneuver immediately after a high gross weight takeoff could be very near the “disaster regime,” especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience greatly increased limit and ultimate load factors.
-
-Operation in this region of high load factors at .low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncommon to have a modern airplane configuration with more than SO percent of its gross weight as fuel.
-
-GUST LOAD FACTORS. Gusts are associated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The increment change in load factor due to the vertical gust can be determined from the following equation:
-
-where ",0.11874197689345314," at high gross weights above the basic configuration weight, the limit and ultimate load factors may be seriously reduced. For the airplane shown, a 5-g maneuver immediately after a high gross weight takeoff could be very near the ' disaster regime,' especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience greatly increased limit and ultimate load factors.
-
-Operation in this region of high load factors at .low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncommon to have a modern airplane configuration with more than SO percent of its gross weight as fuel.
-
-GUST LOAD FACTORS. Gusts are associated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The increment change in load factor due to th",0.11938382541720154,"d, at high gross weights above the basic configuration weight, the limit and ultimate load factors may be seriously reduced. For the airplane shown, a 5-g maneuver immediately after a high gross weight takeoff could be very near the ' disaster regime,' especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience greatly increased limit and ultimate load factors.
-
-Operation in this region of high load factors at .low gross weight may create the impression that the airplane has great excess strength capability. This effect must be understood and intelligently appreciated since it is not uncommon to have a modern airplane configuration with more than SO percent of its gross weight as fuel.
-
-GUST LOAD FACTORS. Gusts are associated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The increment change in load factor due to ",35,laws_sample
-36,0,第五条 国家采取措施，监测、防御、处置来源于中华人民共和国境内外的网络安 全风险和威胁，保护关键信息基础设施免受攻击、侵入、干扰和破坏，依法惩治网络违法 犯罪活动，维护网络空间安全和秩序。 第六条 国家倡导诚实守信、健康文明的网络行为，推动传播社会主义核心价值观， 采取措施提高全社会的网络安全意识和水平，形成全社会共同参与促进网络安全的良好环 境。 第七条 国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯 罪等方面的国际交流与合作，推动构建和平、安全、开放、合作的网络空间，建立多边、 民主、透明的网络治理体系。,False,0.12406015037593984,"第五条 国家采取措施,监测、防御、处置来源于中华人民共和国境内外的网络安
-
-全风险和威胁,保护关键信息基础设施免受攻击、侵入、干扰和破坏,依法惩治网络违法
-
-犯罪活动,维护网络空间安全和秩序。
-
-第六条 国家倡导诚实守信、健康文明的网络行为,推动传播社会主义核心价值观,
-
-采取措施提高全社会的网络安全意识和水平,形成全社会共同参与促进网络安全的良好环
-
-境。
-
-第七条 国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯
-
-罪等方面的国际交流与合作,推动构建和平、安全、开放、合作的网络空间,建立多边、
-
-民主、透明",0.08270676691729323,"国家采取措施，监测、防御、处置来源于中华人民共和国境内外的网络安全风险和威胁，保护关键信息基础设施免受攻击、侵入、干扰和破坏，依法惩治网络违法犯罪活动，维护网络空间安全和秩序。
-
-**第六条** 国家倡导诚实守信、健康文明的网络行为，推动传播社会主义核心价值观，采取措施提高全社会的网络安全意识和水平，形成全社会共同参与促进网络安全的良好环境。
-
-**第七条** 国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯罪等方面的国际交流与合作，推动构建和平、安全、开放、合作的网络空间，建立多边、民主、透明的网络治理体系。",0.08270676691729323," 国家采取措施，监测、防御、处置来源于中华人民共和国境内外的网络安全风险和威胁，保护关键信息基础设施免受攻击、侵入、干扰和破坏，依法惩治网络违法犯罪活动，维护网络空间安全和秩序。
-
-**第六条** 国家倡导诚实守信、健康文明的网络行为，推动传播社会主义核心价值观，采取措施提高全社会的网络安全意识和水平，形成全社会共同参与促进网络安全的良好环境。
-
-**第七条** 国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯罪等方面的国际交流与合作，推动构建和平、安全、开放、合作的网络空间，建立多边、民主、透明的网络治理体系",0.08270676691729323,"国家采取措施，监测、防御、处置来源于中华人民共和国境内外的网络安全风险和威胁，保护关键信息基础设施免受攻击、侵入、干扰和破坏，依法惩治网络违法犯罪活动，维护网络空间安全和秩序。
-
-## 第六条
-
-国家倡导诚实守信、健康文明的网络行为，推动传播社会主义核心价值观，采取措施提高全社会的网络安全意识和水平，形成全社会共同参与促进网络安全的良好环境。
-
-## 第七条
-
-国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯罪等方面的国际交流与合作，推动构建和平、安全、开放、合作的网络空间，建立多边、民主、透明的网络治理体系。",0.03007518796992481,"第五条 国家采取措施，监测、防御、处置来源于中华人民共和国境内外的网络安 全风险和威胁，保护关键信息基础设施免受攻击、侵入、干扰和破坏，依法惩治网络违法 犯罪活动，维护网络空间安全和秩序。
-
-第六条 国家倡导诚实守信、健康文明的网络行为，推动传播社会主义核心价值观， 采取措施提高全社会的网络安全意识和水平，形成全社会共同参与促进网络安全的良好环 境。
-
-第七条 国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯 罪等方面的国际交流与合作，推动构建和平、安全、开放、合作的网络空间，建立多边、 民主、透明的网络治",0.03007518796992481,"条 国家采取措施，监测、防御、处置来源于中华人民共和国境内外的网络安 全风险和威胁，保护关键信息基础设施免受攻击、侵入、干扰和破坏，依法惩治网络违法 犯罪活动，维护网络空间安全和秩序。
-- 第六条 国家倡导诚实守信、健康文明的网络行为，推动传播社会主义核心价值观， 采取措施提高全社会的网络安全意识和水平，形成全社会共同参与促进网络安全的良好环 境。
-- 第七条 国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯 罪等方面的国际交流与合作，推动构建和平、安全、开放、合作的网络空间，建立多边、 民主、透明的网络治理体",0.03007518796992481,"条 国家采取措施，监测、防御、处置来源于中华人民共和国境内外的网络安 全风险和威胁，保护关键信息基础设施免受攻击、侵入、干扰和破坏，依法惩治网络违法 犯罪活动，维护网络空间安全和秩序。
-- 第六条 国家倡导诚实守信、健康文明的网络行为，推动传播社会主义核心价值观， 采取措施提高全社会的网络安全意识和水平，形成全社会共同参与促进网络安全的良好环 境。
-- 第七条 国家积极开展网络空间治理、网络技术研发和标准制定、打击网络违法犯 罪等方面的国际交流与合作，推动构建和平、安全、开放、合作的网络空间，建立多边、 民主、透明的网络治理体",36,laws_sample
-37,0,MCA for aircraft traveling West along V520 to cross JAC at 15200’ MCA for aircraft traveling West along V330 to cross JAC at 13400’ MTA for aircraft crossing over and turning at JAC: Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000’ or higher,False,0.018575851393188854,"CA for aircraft traveling West along V520 to cross JAC at 15200’ MCA for aircraft traveling West along V330 to cross JAC at 13400’
-
-MTA for aircraft crossing over and turning at JAC:
-
-Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000’ or highe",0.04024767801857585,"MCA for aircraft traveling West along V520 to cross JAC at 15200'
-MCA for aircraft traveling West along V330 to cross JAC at 13400'
-
-MTA for aircraft crossing over and turning at JAC:
-
-Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000' or hi",0.09287925696594428,"raft traveling West along V520 to cross JAC at 15200’**
-**MCA for aircraft traveling West along V330 to cross JAC at 13400’**
-
-**MTA for aircraft crossing over and turning at JAC:**
-
-- Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000’ or high",0.030959752321981424,"CA for aircraft traveling West along V520 to cross JAC at 15200'
-MCA for aircraft traveling West along V330 to cross JAC at 13400'
-
-MTA for aircraft crossing over and turning at JAC:
-
-Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000' or highe",0.02476780185758514,"A for aircraft traveling West along V520 to cross JAC at 15200’ MCA for aircraft traveling West along V330 to cross JAC at 13400’
-
-MTA for aircraft crossing over and turning at JAC:
-
-Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000’ or high",0.02786377708978328,"CA for aircraft traveling West along V520 to cross JAC at 15200' MCA for aircraft traveling West along V330 to cross JAC at 13400'
-
-MTA for aircraft crossing over and turning at JAC:
-
-Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000' or highe",0.02786377708978328,"CA for aircraft traveling West along V520 to cross JAC at 15200' MCA for aircraft traveling West along V330 to cross JAC at 13400'
-
-MTA for aircraft crossing over and turning at JAC:
-
-Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000' or highe",37,laws_sample
-39,0,"(3) In this section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description. (4) Subsection (1) of this section shall not apply to any law so far as that law makes provision-",False,0.013311148086522463,") In this section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description.
-
-## (4) Subsection (1) of this section shall not apply to any law so far as that law makes provisio",0.004991680532445923,"(3) In this section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description.
-
-(4) Subsection (1) of this section shall not apply to any law so far as that law makes provision",0.004991680532445923,"(3) In this section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description.
-
-(4) Subsection (1) of this section shall not apply to any law so far as that law makes provision",0.04159733777038269,"his section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description.
-
-(4) Subsection (1) of this section shall not apply to any law so far as that law makes provis",0.013311148086522463,"In this section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description.
-
-(4) Subsection (1) of this section shall not apply to any law so far as that law makes
-
-provision-",0.013311148086522463,") In this section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description.
-
-## (4) Subsection (1) of this section shall not apply to any law so far as that law makes provisio",0.013311148086522463,") In this section, the expression ""discriminatory"" means affording different treatment to different persons, attributable wholly or mainly to their respective descriptions by race, tribe, place of origin, political opinions, colour, creed or sex whereby persons of one such description are subjected to disabilities or restrictions to which persons of another such description are not made subject or are accorded privileges or advantages which are not accorded to persons of another such description.
-
-## (4) Subsection (1) of this section shall not apply to any law so far as that law makes provisio",39,laws_sample
-40,0,"MISSED APPROACH: Climb to 13000 on RIL VOR/DME R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in- hold to 13000.",False,0.1437125748502994,"MISSED APPROACH: Climb to 13000 on RIL VOR/DME
R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME
R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in-
R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME
R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in-
hold to ",0.03592814371257485,"ISSED APPROACH: Climb to 13000 on RIL VOR/DME R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in- hold to 1300",0.03592814371257485,"ISSED APPROACH: Climb to 13000 on RIL VOR/DME R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in- hold to 1300",40,laws_sample
-40,1,"MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",False,0.0970873786407767,"ISSED APPROACH: Climbing left turn to 8000 via SVC
R-128, then reverse course to SVC VOR/DME and h",0.019417475728155338,"MISSSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold",0.0,"MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",0.0,"MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",0.06796116504854369,"ISSED APPROACH: Climbing left turn to 8000 via SVC
R-128, then reverse course to SVC VOR/DME and hol",0.019417475728155338,"ISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",0.019417475728155338,"ISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",40,laws_sample
-40,2,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",False,0.11363636363636363,"ED APPROACH: Climb to 9000 on track 112° to JETRY,
cross JETRY at or above 6700, and on track 112° to PAKPE,
right turn to WULKU, and on track 289° to JNC VOR/DME and",0.011363636363636364,"MISSSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold",0.0,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",0.0,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",0.07386363636363637,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY,
cross JETRY at or above 6700, and on track 112° to PAKPE,
ight turn to WULKU, and on track 289° to JNC VOR/DME and<",0.03409090909090909,"ISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hol",0.03409090909090909,"ISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hol",40,laws_sample
-41,0,"3.—(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E. (2) Paragraph (1) does not apply to any aircraft—",False,0.008108108108108109,".—(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
-
-(2) Paragraph (1) does not apply to any aircraft—",0.008108108108108109,"3.—(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
-
-(2) Paragraph (1) does not apply to any aircraft",0.010810810810810811,"*—(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
-
-(2) Paragraph (1) does not apply to any aircraft—",0.02972972972972973,"(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.~~
-
-~~(2) Paragraph (1) does not apply to any aircraf",0.03783783783783784,"(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
-
- - (2) Paragraph (1) does not apply to any aircr",0.016216216216216217,"3. -(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
-
-(2) Paragraph (1) does not apply to any aircraf",0.016216216216216217,"3. -(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
-
-(2) Paragraph (1) does not apply to any aircraf",41,laws_sample
-41,1,"(a) S.I. 2016/765, to which there are amendments not relevant to these Regulations. (b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST).",False,0.029940119760479042,"a) S.I. 2016/765, to which there are amendments not relevant to these Regulations.
-
-( b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.017964071856287425,"(a) S.I. 2016/765, to which there are amendments not relevant to these Regulations.
-
-(b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.0718562874251497,".I. 2016/765, to which there are amendments not relevant to these Regulations.
-[^b]: (b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.017964071856287425,"(a) S.I. 2016/765, to which there are amendments not relevant to these Regulations.
-
-(b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.11976047904191617,".I. 2016/765, to which there are amendments not relevant to these Regulations.
-
-> ( **b** ) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (",0.041916167664670656,") S.I. 2016/765, to which there are amendments not relevant to these Regulations.
-
-( b ) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.041916167664670656,") S.I. 2016/765, to which there are amendments not relevant to these Regulations.
-
-( b ) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",41,laws_sample
-42,0,"That airspace from 18,000’ MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airspace less than 1,500’ AGL.",False,0.15544041450777202,"L to and including FL 600,
including the airspace overflying the waters within 12 NM
of the coast of the contiguous United States and Alaska
and designated offshore areas, excluding Santa Barbara
Island, Farallon Island, the airspace south of latitude
25° 04’00” N, the Alaska peninsula west of longitude
160°00’00” W, and the airspace less than 1,500’ AGL",0.02072538860103627,"That airspace from 18,000' MSL to and including FL 600, including the airspace overlying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00"" N, the Alaska peninsula west of longitude 160°00'00"" W, and the airspace less than 1,500' AGL. ",0.0,"That airspace from 18,000’ MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airspace less than 1,500’ AGL.",0.015544041450777202,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00"" N, the Alaska peninsula west of longitude 160°00'00"" W, and the airspace less than 1,500' AGL.",0.12435233160621761,"airspace from 18,000’ MSL to and including FL 600, including the airspace overflying the waters within 12 NM _Controlled_ of the coast of the contiguous United States and Alaska _Airspace_ and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airspace le",0.015544041450777202,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00' N, the Alaska peninsula west of longitude 160°00'00' W, and the airspace less than 1,500' AGL.",0.015544041450777202,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00' N, the Alaska peninsula west of longitude 160°00'00' W, and the airspace less than 1,500' AGL.",42,laws_sample
-42,1,"That airspace from 18,000’ MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00’00” W, and designated offshore areas.",False,0.1595744680851064,"t airspace from 18,000’ MSL to and including FL
450, including Santa Barbara Island, Farallon Island, the
Alaska peninsula west of longitude 160°00’00” W, and
designated off",0.015957446808510637,"That airspace from 18,000' MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00'00"" W, and designated offshore areas.",0.0,"That airspace from 18,000’ MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00’00” W, and designated offshore areas.",0.015957446808510637,"That airspace from 18,000' MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00'00"" W, and designated offshore areas.",0.6063829787234043,"d designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airs",0.015957446808510637,"That airspace from 18,000' MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00'00' W, and designated offshore areas.",0.015957446808510637,"That airspace from 18,000' MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00'00' W, and designated offshore areas.",42,laws_sample
-42,2,"That airspace from the surface to 10,000’ MSL (unless otherwise designated) surrounding the nation’s busi- est airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.",False,0.013215859030837005,"
-That airspace from the surface to 10,000’ MSL (unless otherwise designated) surrounding the nation’s busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.",0.02643171806167401,"
-That airspace from the surface to 10,000' MSL (unless otherwise designated) surrounding the nation's busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.
-",0.01762114537444934,"That airspace from the surface to 10,000’ MSL (unless otherwise designated) surrounding the nation’s busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.
-
-",0.02643171806167401,"That airspace from the surface to 10,000' MSL (unless otherwise designated) surrounding the nation's busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.
-
-",0.01762114537444934,"
-
-That airspace from the surface to 10,000’ MSL (unless otherwise designated) surrounding the nation’s busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.",0.7048458149779736,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Is",0.7048458149779736,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Is",42,laws_sample
-42,3,That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215),False,0.5235294117647059," | Class B airspace and within 10 NM of designated airports. | See Chart example above. |
-| Controlled | Mode-C transponder equipment is required. (See FAR ",0.0,That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215),0.0,That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215),0.0,That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215),0.15294117647058825, airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. _Controlled_ Mode-C transponder equipment is required. (See FA,0.0,That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215),0.0,That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215),42,laws_sample
-43,0,"On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is , g ( avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names q y g q y ( ) and identification boxes (shown in blue) take precedence. Only ( ) p y those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.",False,0.32595325953259535,"## RADIO AIDS TO NAVIGATION
-
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is
-
-avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only
-
-| Element | Example / Meaning |
-|---|---|
-| Crosshatch | Indicates s",0.06888068880688807,"GATION
-
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.
-
-![Diagram illustra",0.06888068880688807,"# RADIO AIDS TO NAVIGATION
-
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.",0.06888068880688807,"ATION
-
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.
-
-| Crosshatch indica",0.06888068880688807,"ATION**
-
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.
-
-A NAVAID that i",0.05781057810578106,"N
-
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only
-
-
-
-those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.
-
-A NAVA",0.05781057810578106,"N
-
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only
-
-
-
-those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.
-
-A NAVA",43,laws_sample
-43,1,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,False,0.0,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,0.0,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,0.0,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,0.0,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,0.0,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,0.0,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,0.0,A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.,43,laws_sample
-43,2,Hard-surfaced runways greater than 8069’ or some multiple runways less than 8069’ Hard-surfaced runways 1500’ to 8069’ Other than hard-surfaced runways Seaplane bases,False,0.1566265060240964,"faced runways greater than 8069’ or some multiple runways less than 8069’
-
-
-
-Hard-surfaced runways 1500’ to 8069’
-
-[ ]
-
-Other than hard-surfaced runways
-
-
-
-Seaplane b",0.0963855421686747,"urfaced runways greater than 8069' or some multiple runways less than 8069'
-- Hard-surfaced runways 1500' to 8069'
-- Other than hard-surfaced runways
-- Seaplane bases",0.3795180722891566,"ard-surfaced runways greater than 8069’ or some multiple runways less than 8069’
-* **[Icon: Magenta circle with white X]** Hard-surfaced runways 1500’ to 8069’
-* ",0.39759036144578314,"Hard-surfaced runways greater than 8069' or some multiple runways less than 8069'
-
-[Purple circle with airplane symbol] Hard-surfaced runways 1500' to 8069'
-
-[Purple ",0.07228915662650602,"rd-surfaced runways greater than 8069’ or some multiple runways less than 8069’
-
-Hard-surfaced runways 1500’ to 8069’
-
-Other than hard-surfaced runways
-
-Seaplane b",0.0963855421686747,"Hard-surfaced runways greater than 8069' or some multiple runways less than 8069'
-- Hard-surfaced runways 1500' to 8069'
-- Other than hard-surfaced runways
-- Seaplane",0.0963855421686747,"Hard-surfaced runways greater than 8069' or some multiple runways less than 8069'
-- Hard-surfaced runways 1500' to 8069'
-- Other than hard-surfaced runways
-- Seaplane",43,laws_sample
-44,0,"member of a Delimitation Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly. (6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such. (7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission: Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of the Commission.",False,0.0069821567106283944,"ber of a Delimitation Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly.
-
-(6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such.
-
-(7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission:
-
-Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of the Commission.",0.0069821567106283944,"ember of a Delimitation Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly.
-
-(6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such.
-
-(7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission:
-
-Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of the Commissio",0.0069821567106283944,"member of a Delimitation Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly.
-
-(6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such.
-
-(7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission:
-
-Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of the Commissi",0.05818463925523662,"n Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly.
-
-(6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such.
-
-(7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission:
-
-Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of th",0.009309542280837859,"ber of a Delimitation Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly.
-
-(6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such.
-
-(7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission:
-
-Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of the Commissi",0.0069821567106283944,"ber of a Delimitation Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly.
-
-(6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such.
-
-(7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission:
-
-Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of the Commission.",0.0069821567106283944,"ber of a Delimitation Commission by reason only of the fact that he or she has been the Speaker of the National Assembly if he or she was elected to that office from amongst persons who were not Members of the National Assembly.
-
-(6) The office of Chairman or other member of the Delimitation Commission shall become vacant if circumstances arise that, were he or she not Chairman or member of the Delimitation Commission, would disqualify him or her for appointment as such.
-
-(7) If, after the appointment of the Delimitation Commission and before the Commission has submitted its report under section 65, the office of Chairman or any other member of the Commission falls vacant or the holder of the office becomes unable for any reason to discharge his or her functions as a member of the Commission, the Judicial Service Commission may, subject to the provisions of subsections (3) to (5) of this section, appoint another person to be a member of the Commission:
-
-Provided that a member appointed under this section because of the inability of some other member to discharge his or her functions shall cease to be a member of the Commission when, in the opinion of the Judicial Service Commission, that other member is able to resume his or her functions as a member of the Commission.",44,laws_sample
-45,0,"(3) For the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine. (4) A Member of the Ntlo ya Dikgosi shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the Ntlo ya Dikgosi shall not bar any person from being such a Member.",False,0.005136986301369863,"(3) For the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
-
-(4) A Member of the Ntlo ya Dikgosi shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the Ntlo ya Dikgosi shall not bar any person from being such a Member",0.018835616438356163,"or the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
-
-(4) A Member of the *Ntlo ya Dikgosi* shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the *Ntlo ya Dikgosi* shall not bar any person from being such a Member.",0.018835616438356163,"For the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
-
-(4) A Member of the *Ntlo ya Dikgosi* shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the *Ntlo ya Dikgosi* shall not bar any person from being such a Member",0.05650684931506849," the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
-
-(4) A Member of the *Ntlo ya Dikgosi* shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the *Ntlo ya Dikgosi* shall not bar any person from being such ",0.07534246575342465,"he purposes of this section, two or more terms of imprisonment that are required to
-
-be served consecutively shall be regarded as a single term of imprisonment for the aggregate
-
-period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
-
- - (4) A Member of the _Ntlo ya Dikgosi_ shall not, while he or she is such a Member,
-
-- participate in party politics, but active participation in politics prior to being a Member of the _Ntlo ya Dikgosi_ shall not bar any person from being s",0.005136986301369863,"3) For the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
-
-(4) A Member of the Ntlo ya Dikgosi shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the Ntlo ya Dikgosi shall not bar any person from being such a Member.",0.005136986301369863,"3) For the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
-
-(4) A Member of the Ntlo ya Dikgosi shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the Ntlo ya Dikgosi shall not bar any person from being such a Member.",45,laws_sample
-46,0,"Where a physical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to them.",False,0.0,"Where a physical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to them.",0.0297723292469352,"a **physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the 'Terms of Reference'. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to the",0.05253940455341506,"physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the **'Terms of Reference'**. The **access of third parties (for example subcontractors)** is prohibited. Attendees will not be permitted to take copies in any form of the data made available to",0.028021015761821366,"e a **physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to t",0.028021015761821366,"Where a **physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available ",0.05604203152364273,"hysical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available t",0.05604203152364273,"hysical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available t",46,govt tenders
-47,0,"not use confidential information or documents for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party; (b) ensure the protection of such confidential information or documents with the same level of protection as its own confidential information or documents, and in any case with due diligence;",False,0.01366120218579235,"ot use confidential information or documents for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
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- (b) ensure the protection of such confidential information or documents with the same level of protection as its own confidential information or documents, and in any case with due diligence",0.030054644808743168," use *confidential information or documents* for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
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-(b) ensure the protection of such *confidential information or documents* with the same level of protection as its own confidential information or documents, and in any case with due diligenc",0.03278688524590164," use *confidential information or documents* for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
-- (b) ensure the protection of such *confidential information or documents* with the same level of protection as its own confidential information or documents, and in any case with due diligen",0.030054644808743168,"se *confidential information or documents* for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
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-(b) ensure the protection of such *confidential information or documents* with the same level of protection as its own confidential information or documents, and in any case with due diligence;",0.0546448087431694,"nfidential information or documents_ for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
-
- - (b) ensure the protection of such _confidential information or documents_ with the same level of protection as its own confidential information or documents, and in any case with due diligence;",0.12021857923497267," information or documents for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
-- (b) ensure the protection of such confidential information or documents with the same level of protection as its own confidential information or documents, and in any case with due diligen",0.12021857923497267," information or documents for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
-- (b) ensure the protection of such confidential information or documents with the same level of protection as its own confidential information or documents, and in any case with due diligen",47,govt tenders
-48,0,"Le pouvoir adjudicateur est soumis au protocole nº 7 sur les privilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant. Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur. La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtemps.",False,0.003929273084479371,"e pouvoir adjudicateur est soumis au protocole nº 7 sur les privilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant.
-
-Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur.
-
-La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtemps",0.0045841519318926,"Le pouvoir adjudicateur est soumis au protocole n° 7 sur les privilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant.
-
-Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur.
-
-La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtemp",0.003929273084479371,"Le pouvoir adjudicateur est soumis au protocole nº 7 sur les privilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant.
-
-Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur.
-
-La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtemp",0.003929273084479371," pouvoir adjudicateur est soumis au protocole nº 7 sur les privilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant.
-
-Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur.
-
-La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtemps.",0.005239030779305829,"pouvoir adjudicateur est soumis au protocole nº 7 sur les privilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant.
-
-Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur.
-
-La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtemps",0.09037328094302555,"ilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant.
-
-Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur.
-
-La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtem",0.09037328094302555,"ilèges et immunités de l'Union européenne figurant dans le traité sur le fonctionnement de l'Union européenne, notamment en ce qui concerne l'inviolabilité des archives (y compris la localisation physique des données et des services comme prévu à l'article I.9.2) et la sécurité des données, ce qui comprend les données à caractère personnel détenues pour le compte du pouvoir adjudicateur dans les locaux du contractant ou du sous-traitant.
-
-Le contractant informe sans délai le pouvoir adjudicateur de toute demande juridiquement contraignante de divulgation des données à caractère personnel traitées pour le compte du pouvoir adjudicateur qui lui est adressée par une autorité publique nationale, y compris une autorité d'un pays tiers. Le contractant n'est pas autorisé à accorder cet accès sans l'autorisation écrite préalable du pouvoir adjudicateur.
-
-La durée du traitement des données à caractère personnel par le contractant n'excédera pas la période indiquée à l'article II.22.2. À l'issue de cette période, le contractant doit, selon le choix du responsable du traitement, restituer dans les meilleurs délais et dans un format arrêté d'un commun accord toutes les données à caractère personnel traitées pour le compte du responsable du traitement, ainsi que les copies de ces données, ou détruire de manière effective toutes les données à caractère personnel à moins que le droit de l'Union ou le droit national n'exige de les conserver plus longtem",48,govt tenders
-49,0,"Avant de procéder au recouvrement, le pouvoir adjudicateur doit notifier formellement au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification. Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en notifiant formellement une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit. Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus: a) par compensation avec des sommes que l'Union doit au contractant; b) par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur; c) par une action en justice.",False,0.013501350135013501,"t de procéder au recouvrement, le pouvoir adjudicateur doit notifier formellement au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification.
-
-Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en notifiant formellement une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit.
-
-Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus:
-
-a) par compensation avec des sommes que l'Union doit au contractant;
-
-b) par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur;
-
-c) par une action en justice",0.022502250225022502,"nt de procéder au recouvrement, le pouvoir adjudicateur doit *notifier formellement* au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification.
-
-Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en *notifiant formellement* une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit.
-
-Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus:
-
-1. par compensation avec des sommes que l'Union doit au contractant;
-2. par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur;
-3. par une action en just",0.041404140414041404,"t de procéder au recouvrement, le pouvoir adjudicateur doit *notifier formellement* au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification.
-
-Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en *notifiant formellement* une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit.
-
-Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus :
-
-* a) par compensation avec des sommes que l'Union doit au contractant ;
-* b) par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur ;
-* c) par une ",0.020702070207020702,"t de procéder au recouvrement, le pouvoir adjudicateur doit *notifier formellement* au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification.
-
-Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en *notifiant formellement* une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit.
-
-Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus:
-
-a) par compensation avec des sommes que l'Union doit au contractant;
-
-b) par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur;
-
-c) par une action en jus",0.036003600360036005,"vant de procéder au recouvrement, le pouvoir adjudicateur doit _notifier formellement_ au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification.
-
-Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en _notifiant formellement_ une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit.
-
-Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus:
-
-- a) par compensation avec des sommes que l'Union doit au contractant;
-
-- b) par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur;
-
-- c) par une",0.1188118811881188,"oit notifier formellement au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification.
-
-Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en notifiant formellement une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit.
-
-Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus:
-
-- a) par compensation avec des sommes que l'Union doit au contractant;
-- b) par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur;
-- c) par une action en jus",0.1188118811881188,"oit notifier formellement au contractant son intention de recouvrer le montant concerné, en précisant le montant dû et les motifs du recouvrement et en invitant le contractant à faire part de ses observations dans un délai de 30 jours à compter de la réception de la notification.
-
-Si aucune observation n'a été présentée ou si, malgré les observations présentées, le pouvoir adjudicateur décide de poursuivre la procédure de recouvrement, il doit confirmer ce recouvrement en notifiant formellement une note de débit au contractant, précisant la date de paiement. Le contractant doit payer le montant conformément aux dispositions de la note de débit.
-
-Si le contractant n'a toujours pas effectué le paiement à la date d'échéance, le pouvoir adjudicateur peut, après en avoir informé le contractant par écrit, recouvrer les montants dus:
-
-- a) par compensation avec des sommes que l'Union doit au contractant;
-- b) par mobilisation de la garantie financière si le contractant a remis une telle garantie au pouvoir adjudicateur;
-- c) par une action en jus",49,govt tenders
-50,0,European Union Agency for Cybersecurity Vasilissis Sofias Str 1 151 24 Maroussi | Attiki | Greece Tel: +30 28 14 40 9711 Email: procurement@enisa.europa.eu www.enisa.europa.eu,False,0.08571428571428572,"pean Union Agency for Cybersecurity
-
-Vasilissis Sofias Str 1
-
-151 24 Maroussi | Attiki | Greece
-
-Tel: +30 28 14 40 9711
-
-Email: procurement@enisa.europa.eu
-
-www.enisa.europa.e",0.68,"European Union Agency for Cybersecurity (ENISA) referred to below as *the contracting authority*, is planning to award the contract(s) resulting from the above procurement pro",0.13714285714285715,"Union Agency for Cybersecurity**
-Vasilissis Sofias Str 1
-151 24 Maroussi | Attiki | Greece
-Tel: +30 28 14 40 9711
-Email: procurement@enisa.europa.eu
-www.enisa.europa",0.02857142857142857,"European Union Agency for Cybersecurity
-Vasilissis Sofias Str 1
-151 24 Maroussi | Attiki | Greece
-Tel: +30 28 14 40 9711
-Email: procurement@enisa.europa.eu
-www.enisa.europa.eu",0.0,European Union Agency for Cybersecurity Vasilissis Sofias Str 1 151 24 Maroussi | Attiki | Greece Tel: +30 28 14 40 9711 Email: procurement@enisa.europa.eu www.enisa.europa.eu,0.06857142857142857,"opean Union Agency for Cybersecurity
-
-Vasilissis Sofias Str 1
-
-151 24 Maroussi | Attiki | Greece
-
-Tel: +30 28 14 40 9711
-
-Email: procurement@enisa.europa.eu www.enisa.europa.e",0.06857142857142857,"opean Union Agency for Cybersecurity
-
-Vasilissis Sofias Str 1
-
-151 24 Maroussi | Attiki | Greece
-
-Tel: +30 28 14 40 9711
-
-Email: procurement@enisa.europa.eu www.enisa.europa.e",50,govt tenders
-51,0," Relying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded. 2.5. Tender submission: how many tenders may an economic operator submit? Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is missing.",False,0.01282051282051282,"elying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
-
-## 2.5. Tender submission: how many tenders may an economic operator submit?
-
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is missin",0.01282051282051282,"lying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
-
-## 2.5. Tender submission: how many tenders may an economic operator submit?
-
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is missing",0.01282051282051282,"Relying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
-
-## 2.5. Tender submission: how many tenders may an economic operator submit?
-
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is missi",0.022144522144522144,"lying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
-
-## **2.5. Tender submission: how many tenders may an economic operator submit?**
-
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is mis",0.018648018648018648,"elying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
-
-**2.5. Tender submission: how many tenders may an economic operator submit?**
-
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is mis",0.05944055944055944,"ies of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
-
-## 2.5. Tender submission: how many tenders may an economic operator submit?
-
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is missing",0.05944055944055944,"ies of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
-
-## 2.5. Tender submission: how many tenders may an economic operator submit?
-
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is missing",51,govt tenders
-52,0,"When making use of the results, the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority’s official position. The contracting authority may waive this obligation in writing or provide the text of the disclaimer.",False,0.0,"When making use of the results, the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority’s official position. The contracting authority may waive this obligation in writing or provide the text of the disclaimer.",0.014084507042253521,"When making use of the *results*, the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority's official position. The contracting authority may waive this obligation in writing or provide the text of the disclaime",0.011267605633802818,"hen making use of the *results*, the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority’s official position. The contracting authority may waive this obligation in writing or provide the text of the disclaimer",0.014084507042253521,"hen making use of the *results*, the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority's official position. The contracting authority may waive this obligation in writing or provide the text of the disclaimer",0.016901408450704224,"When making use of the _results_ , the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority’s official position. The contracting authority may waive this obligation in writing or provide the text of the disclaim",0.014084507042253521,"hen making use of the results , the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority's official position. The contracting authority may waive this obligation in writing or provide the text of the disclaimer",0.014084507042253521,"hen making use of the results , the contractor must declare that they have been produced under a contract with the Union and that the opinions expressed are those of the contractor only and do not represent the contracting authority's official position. The contracting authority may waive this obligation in writing or provide the text of the disclaimer",52,govt tenders
-53,0,"2) Copies of the profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity. If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the Contracting Authority considers appropriate. The contracting authority must at least be notified of the reason and its justification. The Contracting Authority reserves the right to request any other document enabling it to verify the economic operator’s economic and financial capacity. → All of the above specified evidence of economic and financial capacity must be provided with the tender. 3.2.3. Technical and professional capacity Tenderers must comply with the following selection criteria in order to prove that they have the necessary technical and professional capacity to perform the contract.",False,0.5261472785485592,"s of the profit and loss accounts, it may prove its economic
and financial capacity by any other document, which the Contracting
Authority considers appropriate. The contracting authority must at
least be notified of the reason and its justification. |
-| | The Contracting Authority reserves the right to request any other
document enabling it to verify the economic operator’s economic and
financial capacity. |
-
-→ All of the above specified evidence of economic and financial capacity must be provided with the tender.
-
-## 3.2.3. Technical and professional capacity
-
-Tenderers must comply with the following selection criteria in order to prove that they have the necessary technical and professional ",0.4311632870864461,"alid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the Contracting Authority considers appropriate. The contracting authority must at least be notified of the reason and its justification. |
-| The Contracting Authority reserves the right to request any other document enabling it to verify the economic operator's economic and financial capacity. |
-
-→ All of the above specified evidence of economic and financial capacity must be provided with the tender.
-
-### 3.2.3. Technical and professional capacity
-
-Tenderers must comply with the following selection criteria in order to prove that they have the necessary technical ",0.051227321237993596,"e profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity.
->
-> If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the *Contracting Authority* considers appropriate. The contracting authority must at least be notified of the reason and its justification.
->
-> The *Contracting Authority* reserves the right to request any other document enabling it to verify the economic operator’s economic and financial capacity.
-
-→ **All of the above specified evidence of economic and financial capacity must be provided with the tender.**
-
-### 3.2.3. Technical and professional capacity
-
-Tenderers must comply with the following selection criteria in order to prove that they have the necessary technical and professional capacity to perform the c",0.08751334044823907,"ccounts for the last two years for which accounts have been closed from each concerned involved entity. |
-| | |
-| | If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the *Contracting Authority* considers appropriate. The contracting authority must at least be notified of the reason and its justification. |
-| | |
-| | The *Contracting Authority* reserves the right to request any other document enabling it to verify the economic operator's economic and financial capacity. |
-
-→ **All of the above specified evidence of economic and financial capacity must be provided with the tender.**
-
-## 3.2.3. Technical and professional capacity
-
-Tenderers must comply with the following selection criteria in order to prove that they have the necessary technical and professional capacity to perform the con",0.16008537886872998,"e profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity. If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the _Contracting Authority_ considers appropriate. The contracting authority must at least be notified of the reason and its justification. The _Contracting Authority_ reserves the right to request any other document enabling it to verify the economic operator’s economic and financial capacity.
-
-**==> picture [96 x 164] intentionally omitted <==**
-
-**→ All of the above specified evidence of economic and financial capacity must be provided with the tender.**
-
-## **3.2.3. Technical and professional capacity**
-
-Tenderers must comply with the following selection criteria in order to prove that they have the necessary ",0.39167556029882605,"
-
-| 2) Copies of the profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity. If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the Contracting Authority considers appropriate. The contracting authority must at least be notified of the reason and its justification. The Contracting Authority reserves the right to request any other document enabling it to verify the economic operator's economic and financial capacity. ",0.39167556029882605,"
-
-| 2) Copies of the profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity. If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the Contracting Authority considers appropriate. The contracting authority must at least be notified of the reason and its justification. The Contracting Authority reserves the right to request any other document enabling it to verify the economic operator's economic and financial capacity. ",53,govt tenders
-53,1,The tenderers must have worked on at least 10 contracts15 with at least 3 different clients over the last 4 years (i.e. 23/11/2016 – 08/01/2021). 2. The 10 contract references must cover the provision of Transformation services in the following domains: - Information systems consultancy and/or studies – minimum 6 references; - Information systems development and support – minimum 4 references; 3. Minimum volumes for each referenced contract for Information systems consultancy and/or studies: a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-days.,False,0.18968133535660092,s must have worked on at least 10 contracts 15 with
at least 3 different clients over the last 4 years (i.e. 23/11/2016
- 08/01/2021).
2. The 10 contract references must cover the provision of
Transformation services in the following domains:
- Information systems consultancy and/or studies - minimum
6 references;
■ Information systems development and support – minimum 4
references;
3. Minimum volumes for each referenced contract for Information
systems consultancy and/or studies:
a. Engagement of IT experts corresponding to the relevant IT
profiles listed in Annex 11 of the Technical Specifi,0.23823975720789076,"h at least 3 different clients over the last 4 years (i.e. 23/11/2016 – 08/01/2021). - The 10 contract references must cover the provision of Transformation services in the following domains:
- Information systems consultancy and/or studies – minimum 6 references;
- Information systems development and support – minimum 4 references;
- Minimum volumes for each referenced contract for Information systems consultancy and/or studies:
- Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 p",0.38088012139605465,3/11/2016 – 08/01/2021**).
2. The **10** contract references **must** cover the provision of **Transformation services** in the following domains:
- **Information systems consultancy and/or studies – minimum 6 references;**
- **Information systems development and support – minimum 4 references;**
3. **Minimum volumes for each referenced contract for Information systems consultancy and/or studies:**
a. **Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-day,0.4597875569044006,"he 10 contract references must cover the provision of Transformation services in the following domains:- Information systems consultancy and/or studies – minimum 6 references;
-- Information systems development and support – minimum 4 references; |
-| | 3. | Minimum volumes for each referenced contract for Information systems **consultancy and/or studies:**- a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-days.",0.11684370257966616,10 contracts[15]** with **level of** at least **3 different clients** over the **last 4 years** (i.e. 23/11/2016 **capacity – 08/01/2021)** . 2. The 10 contract references must cover the provision of Transformation services in the following domains: - Information systems consultancy and/or studies – minimum 6 references; - Information systems development and support – minimum 4 references; 3. Minimum volumes for each referenced contract for Information systems **consultancy and/or studies:** a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-days.,0.16084977238239756,ts 15 with at least 3 different clients over the last 4 years (i.e. 23/11/2016 - 08/01/2021) . 2. The 10 contract references must cover the provision of Transformation services in the following domains: - Information systems consultancy and/or studies - minimum 6 references; - Information systems development and support - minimum 4 references; 3. Minimum volumes for each referenced contract for Information systems consultancy and/or studies: a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-days.,0.16084977238239756,ts 15 with at least 3 different clients over the last 4 years (i.e. 23/11/2016 - 08/01/2021) . 2. The 10 contract references must cover the provision of Transformation services in the following domains: - Information systems consultancy and/or studies - minimum 6 references; - Information systems development and support - minimum 4 references; 3. Minimum volumes for each referenced contract for Information systems consultancy and/or studies: a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-days.,53,govt tenders
-53,2,Minimum level of capacity,False,0.52, />level of
capacity,0.0,Minimum level of capacity,0.0,Minimum level of capacity,0.0,Minimum level of capacity,0.56, Minimum volumes for each,0.16,inimum level of capacit,0.16,inimum level of capacit,53,govt tenders
-54,0,"The joint tender must clearly indicate the role and tasks of each member and of the Group Leader who will act as the Contracting Authority's contact point for the contract's administrative or financial aspects and operational management. The Group Leader will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the Contracting Authority shall sign the contract with the Group Leader, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in Annex 04 “Power of Attorney”.",False,0.0032733224222585926,"he joint tender must clearly indicate the role and tasks of each member and of the Group Leader who will act as the Contracting Authority's contact point for the contract's administrative or financial aspects and operational management. The Group Leader will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the Contracting Authority shall sign the contract with the Group Leader, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in Annex 04 “Power of Attorney” .",0.04091653027823241," tender must clearly indicate the role and tasks of each member and of the *Group Leader* who will act as the *Contracting Authority's* contact point for the contract's administrative or financial aspects and operational management. The *Group Leader* will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the *Contracting Authority* shall sign the contract with the *Group Leader*, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in **Annex 04 ""Power of Attorne",0.03927986906710311," joint tender must clearly indicate the role and tasks of each member and of the *Group Leader* who will act as the *Contracting Authority's* contact point for the contract's administrative or financial aspects and operational management. The *Group Leader* will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the *Contracting Authority* shall sign the contract with the *Group Leader*, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in **Annex 04 “Power of A",0.03436988543371522,"oint tender must clearly indicate the role and tasks of each member and of the *Group Leader* who will act as the *Contracting Authority*'s contact point for the contract's administrative or financial aspects and operational management. The *Group Leader* will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the *Contracting Authority* shall sign the contract with the Group Leader, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in **Annex 04 ""Power of Attor",0.03927986906710311,"he joint tender must clearly indicate the role and tasks of each member and of the _Group Leader_ who will act as the _Contracting Authority_ 's contact point for the contract's administrative or financial aspects and operational management. The _Group Leader_ will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the _Contracting Authority_ shall sign the contract with the Group Leader, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in **Annex 04 “Power of",0.04091653027823241,"nt tender must clearly indicate the role and tasks of each member and of the Group Leader who will act as the Contracting Authority 's contact point for the contract's administrative or financial aspects and operational management. The Group Leader will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the Contracting Authority shall sign the contract with the Group Leader, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in Annex 04 'Power of Attor",0.04091653027823241,"nt tender must clearly indicate the role and tasks of each member and of the Group Leader who will act as the Contracting Authority 's contact point for the contract's administrative or financial aspects and operational management. The Group Leader will have full authority to bind the group and each of its members during contract execution. If the joint tender is successful, the Contracting Authority shall sign the contract with the Group Leader, authorized by the other members to sign the contract on their behalf via power of attorney drawn up in the model attached in Annex 04 'Power of Attor",54,govt tenders
-54,1,9 References to tenderer or tenderers in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tender.,False,0.012048192771084338,"
-9 References to tenderer ortenderers in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tender.",0.04819277108433735,eferences to *tenderer* or *tenderers* in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tender,0.04819277108433735,eferences to *tenderer* or *tenderers* in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tender,0.04819277108433735,References to *tenderer* or *tenderers* in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tende,0.04819277108433735,References to _tenderer_ or _tenderers_ in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tende,0.006024096385542169, References to tenderer or tenderers in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tender.,0.006024096385542169, References to tenderer or tenderers in this document shall be understood as covering both sole tenderers and groups of economic operators submitting a joint tender.,54,govt tenders
-55,0,Renewed pre-financing payments and interim payments,False,0.19607843137254902,ed pre-financing payments and interim
payments,0.0,Renewed pre-financing payments and interim payments,0.0,Renewed pre-financing payments and interim payments,0.0,Renewed pre-financing payments and interim payments,0.27450980392156865,Renewed**|** pre-financing payments and interim**|*,0.0392156862745098,Renewed pre-financing payments and interim payment,0.0392156862745098,Renewed pre-financing payments and interim payment,55,govt tenders
-55,1,Forecast balance,False,0.0,Forecast balance,0.0,Forecast balance,0.0,Forecast balance,0.0,Forecast balance,0.0,Forecast balance,0.0,Forecast balance,0.0,Forecast balance,55,govt tenders
-56,0,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send such communication within a specified deadline.",False,0.0,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send such communication within a specified deadline.",0.0,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send such communication within a specified deadline.",0.0,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send such communication within a specified deadline.",0.0,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send such communication within a specified deadline.",0.0,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send such communication within a specified deadline.",0.16544117647058823,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send su",0.16544117647058823,"E-mail is deemed to have been received by the receiving party on the day of dispatch of that e-mail, provided that it is sent to the e-mail address indicated in Article I.8. The sending party must be able to prove the date of dispatch. In the event that the sending party receives a non-delivery report, it must make every effort to ensure that the other party actually receives the communication by email or mail. In such a case, the sending party is not held in breach of its obligation to send su",56,govt tenders
-57,0,"The contractor shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority.",False,0.0,"The contractor shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority.",0.0,"The contractor shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority.",0.0,"The contractor shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority.",0.0,"The contractor shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority.",0.0,"The contractor shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority.",0.06631299734748011,"or shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority",0.06631299734748011,"or shall notify the contracting authority without delay of any legally binding request for disclosure of the personal data processed on behalf of the contracting authority made by any national public authority, including an authority from a third country. The contractor may not give such access without the prior written authorisation of the contracting authority",57,govt tenders
-58,0,"Each delivery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or to its carrier.",False,0.0,"Each delivery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or to its carrier.",0.0,"Each delivery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or to its carrier.",0.0,"Each delivery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or to its carrier.",0.0,"Each delivery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or to its carrier.",0.0,"Each delivery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or to its carrier.",0.1580547112462006,"ery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or",0.1580547112462006,"ery must be accompanied by a consignment note in duplicate, duly signed and dated by the contractor or its carrier, giving the contract number and particulars of the supplies delivered. One copy of the consignment note must be countersigned by the contracting authority and returned to the contractor or",58,govt tenders
-59,0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",False,0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",0.023809523809523808,"rès l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité.
->
-> Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice ",0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",59,govt tenders
-60,0,"Payments must be made to the contractor’s (or leader’s in the case of a joint tender) bank account denominated in euro, identified as follows:",False,0.0,"Payments must be made to the contractor’s (or leader’s in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",0.0,"Payments must be made to the contractor’s (or leader’s in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",60,govt tenders
-61,0,"Le contractant doit satisfaire aux exigences minimales prévues dans le cahier des charges. Cela comprend le respect des obligations applicables en vertu de la législation environnementale et sociale et de la législation du travail établies par le droit de l'Union, le droit national et les conventions collectives ou par les dispositions législatives internationales dans le domaine environnemental et social et dans le domaine du travail énumérées à l'annexe X de la directive 2014/24/UE4, ainsi que le respect des obligations en matière de protection des données découlant des règlements (UE) 2016/6795 et (UE) 2018/17256.",False,0.0,"Le contractant doit satisfaire aux exigences minimales prévues dans le cahier des charges. Cela comprend le respect des obligations applicables en vertu de la législation environnementale et sociale et de la législation du travail établies par le droit de l'Union, le droit national et les conventions collectives ou par les dispositions législatives internationales dans le domaine environnemental et social et dans le domaine du travail énumérées à l'annexe X de la directive 2014/24/UE4, ainsi que le respect des obligations en matière de protection des données découlant des règlements (UE) 2016/6795 et (UE) 2018/17256.",0.05128205128205128," Le contractant doit satisfaire aux exigences minimales prévues dans le cahier des charges. Cela comprend le respect des obligations applicables en vertu de la législation environnementale et sociale et de la législation du travail établies par le droit de l'Union, le droit national et les conventions collectives ou par les dispositions législatives internationales dans le domaine environnemental et social et dans le domaine du travail énumérées à l'annexe X de la directive 2014/24/UE4, ainsi que le respect des obligations en matière de protection des données découlant des règlements (UE) 2016/67954, ainsi que le respect des obligations en matière de protection des données découlant des règlements (UE) 2016/6795reference the use of the templates provided in Annex 09 to this
document is mandatory. Only references submitted on these forms will
be considered.
Tenderers who fail to provide a description, or who only provide generic
content, which does not specifically describe the relevance of the
contract reference with regard to the minimum level of capacity
detailed above, will be considered as not having the technical and
professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments,
divisions, directorates, and other entities of a same body (including the
same EU Institution) will be regarded as the same client. Each EU
Institution (including an EU agency) is considered a different client.
Under a framework contract (or framework contracts) with different
specific contracts, a specific contract (alone or in combination with
other specific contracts) can be used only once (i.e. it will be considered
as a single reference). In case of a joint tender, the same reference
contract cannot be submitted as a separate contract reference by
different economic operators for the same tender.
The Contracting Authority may request statements issued by the
clients, public or private, as supporting documents for each contract
reference. These documents should be ready to be provided within five
working days of the Contracting Authority’s request. The contact
persons for the customers indicated in the contract reference form may
be contacted in the context of this call for tenders to crosscheck the
validity of the information pro",0.0439621591541458,"(and in any case no more than 20) contract references. Evidence must be provided in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in Annex 09 to this document is mandatory. Only references submitted on these forms will be considered. Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client. Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender.
The Contracting Authority may request statements issued by the clients, public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority's request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as evid",0.04006677796327212,"imum 10 (and in any case no more than 20) contract references**. Evidence must be provided in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in **Annex 09** to this document is mandatory. Only references submitted on these forms will be considered.
Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client.
Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender.
The Contracting Authority may request **statements issued by the clients**, public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority’s request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as e",0.03672787979966611,"minimum 10 (and in any case no more than 20) contract references**. Evidence must be provided in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in **Annex 09** to this document is mandatory. Only references submitted on these forms will be considered.
Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client. Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender.
The Contracting Authority may request **statements issued by the clients**, public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority's request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as e",0.11352253756260434,". Evidence must be provided in the
form of a filled-in contract reference per project. For each contract
reference the use of the templates provided in**Annex 09** to this
document is mandatory. Only references submitted on these forms will
be considered.
Tenderers who fail to provide a description, or who only provide generic
content, which does not specifically describe the relevance of the
contract reference with regard to the minimum level of capacity
detailed above, will be considered as not having the technical and
professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments,
divisions, directorates, and other entities of a same body (including the
same EU Institution) will be regarded as the same client. Each EU
Institution (including an EU agency) is considered a different client.
Under a framework contract (or framework contracts) with different
specific contracts, a specific contract (alone or in combination with
other specific contracts) can be used only once (i.e. it will be considered
as a single reference). In case of a joint tender, the same reference
contract cannot be submitted as a separate contract reference by
different economic operators for the same tender.
The Contracting Authority may request**statements issued by the**
**clients**, public or private, as supporting documents for each contract
reference. These documents should be ready to be provided within five
working days of the Contracting Authority’s request. The contact
persons for the customers indicated in the contract reference form may
be contacted in the context of this call for tenders to crosscheck the
validity of the information provided as evidence",0.12632164718976072," in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in Annex 09 to this document is mandatory. Only references submitted on these forms will be considered. Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract. The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client. Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender. The Contracting Authority may request statements issued by the clients , public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority 's request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as eviden",0.12632164718976072," in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in Annex 09 to this document is mandatory. Only references submitted on these forms will be considered. Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract. The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client. Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender. The Contracting Authority may request statements issued by the clients , public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority 's request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as eviden",64,govt tenders
-64,1,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",False,0.09216589861751152," consolidated assessment of the tenderer as a whole (including, if
applicable, all members of a joint tender and/or other entities on which
the tenderer relies to fulfil this selection criterion) will be car",0.0,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",0.0,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",0.0,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",0.06451612903225806,"nsolidated assessment of the tenderer as a whole (including, if
applicable, all members of a joint tender and/or other entities on which
the tenderer relies to fulfilthis selection criterion) willbe carried out.",0.018433179723502304,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried ou",0.018433179723502304,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried ou",64,govt tenders
-64,2,Capacity to deliver within a quality and security framework in compliance with relevant ISO standards,False,0.09900990099009901,ity to deliver within a quality and security framework in compliance with
relevant ISO standards,0.0,Capacity to deliver within a quality and security framework in compliance with relevant ISO standards,0.0,Capacity to deliver within a quality and security framework in compliance with relevant ISO standards,0.0,Capacity to deliver within a quality and security framework in compliance with relevant ISO standards,0.0,Capacity to deliver within a quality and security framework in compliance with relevant ISO standards,0.019801980198019802,Capacity to deliver within a quality and security framework in compliance with relevant ISO standard,0.019801980198019802,Capacity to deliver within a quality and security framework in compliance with relevant ISO standard,64,govt tenders
-64,3,The tenderer must be certified in the following ISO standards in the areas covered by this call for tenders: • T 2.1: ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that will be used by,False,0.17647058823529413, must be certified in the following ISO standards in the
areas covered by this call for tenders:
• T 2.1: ISO 9001:2015 or equivalent (specify): for all the parts
of the organisation(s) and all location(s) that will b,0.15126050420168066,er must be certified in the following ISO standards in the areas covered by this call for tenders:
- T 2.1: ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that will be ,0.12184873949579832, tenderer must be certified in the following ISO standards in the areas covered by this call for tenders:
- **T 2.1: ISO 9001:2015** or equivalent (specify): for all the parts of the organisation(s) and all location(s) that will ,0.1134453781512605,enderer must be certified in the following ISO standards in the areas covered by this call for tenders:
• **T 2.1**: ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that will be,0.29411764705882354," certified in the following ISO standards in the **level of** areas covered by this call for tenders:
-
-**capacity**
-
-• **T 2.1** : ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that ",0.05042016806722689,nderer must be certified in the following ISO standards in the areas covered by this call for tenders: • T 2.1 : ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that will be used by,0.05042016806722689,nderer must be certified in the following ISO standards in the areas covered by this call for tenders: • T 2.1 : ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that will be used by,64,govt tenders
-65,1," The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption. For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.",False,0.006640106241699867,"The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.
-",0.00398406374501992," The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.",0.010624169986719787,"e European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
->
-> For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.",0.010624169986719787," The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
->
-> For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from V",0.005312084993359893,"The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.",0.1049136786188579,"opean Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the Euro",0.1049136786188579,"opean Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the Euro",65,govt tenders
-66,0,"There are two objectives. The lower magnification objective has a greater depth of field and view. p In order to observe the specimen easily use the lower magnification objective first. Then, by rotating the case, the magnification can be changed. CHANGING THE INTERPUPILLARY DISTANCE The distance between the observer's pupils is the interpupillary distance. p p p p y To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece. FOCUSING Remove the lens protective cover. p 2. Place the specimen on the working stage. g 3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp. g pp p 4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear. CHANGING THE BULB 1. Disconnect the power cord. p 2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap. g p 3. Replace with a new halogen bulb. p g 4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.",False,0.12984670874661858,"re are two objectives. The lower magnification objective has a greater depth of field and view.
-
-2. In order to observe the specimen
-easily use the lower magnification
-objective first. Then, by rotating the
-case, the magnification can be
- changed.
-
-## CHANGING THE INTERPUPILLARY
-DISTANCE
-
-1. The distance between the observer's pupils is the interpupillary distance.
-
-2. To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece.
-
-## FOCUSING
-
-1. Remove the lens protective cover.
-
-2. Place the specimen on the working
- stage.
-
-3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp.
-
-4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-## CHANGING THE BULB
-
-1. Disconnect the power cord.
-
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-
-3. Replace with a new halogen bulb.
-
-3. Make sure that both the images in
-
-4. Open the window in the base plate and
-replace the halogen lamp or
-fluor",0.061316501352569885,". There are two objectives. The lower magnification objective has a greater depth of field and view.
-2. In order to observe the specimen easily use the lower magnification objective first. Then, by rotating the case, the magnification can be changed.
-
-### CHANGING THE INTERPUPILLARY DISTANCE
-
-1. The distance between the observer's pupils is the interpupillary distance.
-2. To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece.
-
-### FOCUSING
-
-1. Remove the lens protective cover.
-2. Place the specimen on the working stage.
-3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp.
-4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-### CHANGING THE BULB
-
-1. Disconnect the power cord.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-",0.061316501352569885,"1. There are two objectives. The lower magnification objective has a greater depth of field and view.
-2. In order to observe the specimen easily use the lower magnification objective first. Then, by rotating the case, the magnification can be changed.
-
-### CHANGING THE INTERPUPILLARY DISTANCE
-1. The distance between the observer's pupils is the interpupillary distance.
-2. To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece.
-
-### FOCUSING
-1. Remove the lens protective cover.
-2. Place the specimen on the working stage.
-3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp.
-4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-### CHANGING THE BULB
-1. Disconnect the power cord.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
--",0.061316501352569885,"
-1. There are two objectives. The lower magnification objective has a greater depth of field and view.
-2. In order to observe the specimen easily use the lower magnification objective first. Then, by rotating the case, the magnification can be changed.
-
-### CHANGING THE INTERPUPILLARY DISTANCE
-1. The distance between the observer's pupils is the interpupillary distance.
-2. To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece.
-
-### FOCUSING
-1. Remove the lens protective cover.
-2. Place the specimen on the working stage.
-3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp.
-4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-### CHANGING THE BULB
-1. Disconnect the power cord.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
-",0.7114517583408476,"that you focus at the lowest
-
-- 1. The distance between the observer's
-
- - magnification, then move to a higher magnification and re-focus as
-
-- pupils is the interpupillary distance.
-
-- 2. To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece.
-
-- necessary.
-
-- 3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment.
-
-at the same time, the diopter ring may
-
-## **FOCUSING**
-
-## **DIOPTER RING ADJUSTMENT**
-
-- 1. Remove the lens protective cover.
-
- - 1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
-
-- 2. Place the specimen on the working stage.
-
-- 3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp. 4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-- a. Observe an image through the left eyepiece and bring a specific point
-
-- into focus using the focus knob.",0.061316501352569885,"
-1. There are two objectives. The lower magnification objective has a greater depth of field and view.
-2. In order to observe the specimen easily use the lower magnification objective first. Then, by rotating the case, the magnification can be changed.
-
-## CHANGING THE INTERPUPILLARY DISTANCE
-
-1. The distance between the observer's pupils is the interpupillary distance.
-2. To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece.
-
-## FOCUSING
-
-1. Remove the lens protective cover.
-2. Place the specimen on the working stage.
-3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp.
-4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-## CHANGING THE BULB
-
-1. Disconnect the power cord.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
-",0.061316501352569885,"
-1. There are two objectives. The lower magnification objective has a greater depth of field and view.
-2. In order to observe the specimen easily use the lower magnification objective first. Then, by rotating the case, the magnification can be changed.
-
-## CHANGING THE INTERPUPILLARY DISTANCE
-
-1. The distance between the observer's pupils is the interpupillary distance.
-2. To adjust the interpupillary distance rotate the prism caps until both eyes coincide with the image in the eyepiece.
-
-## FOCUSING
-
-1. Remove the lens protective cover.
-2. Place the specimen on the working stage.
-3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp.
-4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-## CHANGING THE BULB
-
-1. Disconnect the power cord.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
-",66,manuals_sample
-66,1,"1. Turn the focusing knob away or toward you until a clear image is viewed. y g 2. If the image is unclear, adjust the height of the elevator up or down, then turn the focusing knob again. ZOOM MAGNIFICATION 1. Turn the zoom magnification knob to the desired magnification and field of view. 2. In most situations, it is recommended that you focus at the lowest magnification, then move to a higher magnification and re-focus as necessary. y 3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment. DIOPTER RING ADJUSTMENT 1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps: p a. Observe an image through the left eyepiece and bring a specific point into focus using the focus knob. g b. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp focus. c.Then bring the same point into focus through the right eyepiece by turning the right diopter ring. y g g p g d.With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that setting.",False,0.042984590429845905,"1. Turn the focusing knob away or toward you until a clear image is viewed.
-
-2. If the image is unclear, adjust the height of the elevator up or down, then turn the focusing knob again.
-
-## ZOOM MAGNIFICATION
-
-1. Turn the zoom magnification knob to
-the desired magnification and field of
- view.
-
-2. In most situations, it is recommended
-that you focus at the lowest
-magnification, then move to a higher
-magnification and re-focus as
- necessary.
-
-3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment.
-
-## DIOPTER RING ADJUSTMENT
-
-1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
-
-a. Observe an image through the left eyepiece and bring a specific point into focus using the focus knob.
-
-b. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp
-
-focus.
-
-- c.Then bring the same point into focus through the right eyepiece by turning the right diopter ring.
-
-- d.With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that sett",0.039740470397404706,"rn the focusing knob away or toward you until a clear image is viewed.
-2. If the image is unclear, adjust the height of the elevator up or down, then turn the focusing knob again.
-
-### ZOOM MAGNIFICATION
-
-1. Turn the zoom magnification knob to the desired magnification and field of view.
-2. In most situations, it is recommended that you focus at the lowest magnification, then move to a higher magnification and re-focus as necessary.
-3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment.
-
-### DIOPTER RING ADJUSTMENT
-
-1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
- 1. Observe an image through the left eyepiece and bring a specific point into focus using the focus knob.
- 2. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp focus.
- 3. Then bring the same point into focus through the right eyepiece by turning the right diopter ring.
- 4. With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that setting",0.038929440389294405,"Turn the focusing knob away or toward you until a clear image is viewed.
-2. If the image is unclear, adjust the height of the elevator up or down, then turn the focusing knob again.
-
-### ZOOM MAGNIFICATION
-1. Turn the zoom magnification knob to the desired magnification and field of view.
-2. In most situations, it is recommended that you focus at the lowest magnification, then move to a higher magnification and re-focus as necessary.
-3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment.
-
-### DIOPTER RING ADJUSTMENT
-1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
- a. Observe an image through the left eyepiece and bring a specific point into focus using the focus knob.
- b. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp focus.
- c. Then bring the same point into focus through the right eyepiece by turning the right diopter ring.
- d. With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that set",0.0340632603406326," Turn the focusing knob away or toward you until a clear image is viewed.
-2. If the image is unclear, adjust the height of the elevator up or down, then turn the focusing knob again.
-
-### ZOOM MAGNIFICATION
-1. Turn the zoom magnification knob to the desired magnification and field of view.
-2. In most situations, it is recommended that you focus at the lowest magnification, then move to a higher magnification and re-focus as necessary.
-3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment.
-
-### DIOPTER RING ADJUSTMENT
-1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
- a. Observe an image through the left eyepiece and bring a specific point into focus using the focus knob.
- b. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp focus.
- c. Then bring the same point into focus through the right eyepiece by turning the right diopter ring.
- d. With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that settin",0.537712895377129,"e time, the diopter ring may need adjustment.
-
-at the same time, the diopter ring may
-
-## **FOCUSING**
-
-## **DIOPTER RING ADJUSTMENT**
-
-- 1. Remove the lens protective cover.
-
- - 1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
-
-- 2. Place the specimen on the working stage.
-
-- 3. Focus the specimen with the left eye first while turning the focus knob until the image appears clear and sharp. 4. Rotate the right eyepiece ring until the images in each eyepiece coincide and are sharp and clear.
-
-- a. Observe an image through the left eyepiece and bring a specific point
-
-- into focus using the focus knob.
-
-- b. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp focus.
-
-## **CHANGING THE BULB**
-
-- 1. Disconnect the power cord.
-
-- 2. When the bulb is cool, remove the
-
- - c.Then bring the same point into focus through the right eyepiece by turning the right diopter ring. d.With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that setting. ",0.030819140308191405,"1. Turn the focusing knob away or toward you until a clear image is viewed.
-2. If the image is unclear, adjust the height of the elevator up or down, then turn the focusing knob again.
-
-## ZOOM MAGNIFICATION
-
-1. Turn the zoom magnification knob to the desired magnification and field of view.
-2. In most situations, it is recommended that you focus at the lowest magnification, then move to a higher magnification and re-focus as necessary.
-3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment.
-
-## DIOPTER RING ADJUSTMENT
-
-1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
-- a. Observe an image through the left eyepiece and bring a specific point into focus using the focus knob.
-- b. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp focus.
-4. c.Then bring the same point into focus through the right eyepiece by turning the right diopter ring.
-5. d.With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that setting.",0.030819140308191405,"1. Turn the focusing knob away or toward you until a clear image is viewed.
-2. If the image is unclear, adjust the height of the elevator up or down, then turn the focusing knob again.
-
-## ZOOM MAGNIFICATION
-
-1. Turn the zoom magnification knob to the desired magnification and field of view.
-2. In most situations, it is recommended that you focus at the lowest magnification, then move to a higher magnification and re-focus as necessary.
-3. If the image is not clear to both eyes at the same time, the diopter ring may need adjustment.
-
-## DIOPTER RING ADJUSTMENT
-
-1. To adjust the eyepiece for viewing with or without eyeglasses and for differences in acuity between the right and left eyes, follow the following steps:
-- a. Observe an image through the left eyepiece and bring a specific point into focus using the focus knob.
-- b. By turning the diopter ring adjustment for the left eyepiece, bring the same point into sharp focus.
-4. c.Then bring the same point into focus through the right eyepiece by turning the right diopter ring.
-5. d.With more than one viewer, each viewer should note their own diopter ring position for the left and right eyepieces, then before viewing set the diopter ring adjustments to that setting.",66,manuals_sample
-66,2,"USING THE VERTICAL TUBE - MODELS AY11230/11234 1. The vertical tube can be used for instructional viewing or to photograph the image with a digital camera or a micro TV unit 2. Loosen the retention screw, then rotate the adjustment ring to change the length of the vertical tube. 3. Make sure that both the images in",False,0.13291139240506328,"
-## USING THE VERTICAL TUBE -
-MODELS AY11230/11234
-
-1. The vertical tube can be used for instructional viewing or to photograph the image with a digital camera or a micro TV unit
-
-2. Loosen the retention screw, then rotate the adjustment ring to change the length of the vertical tube.
-
-## Model AY11234
-
-## FOCUSING",0.015822784810126583,"SING THE VERTICAL TUBE - MODELS AY11230/11234
-
-1. The vertical tube can be used for instructional viewing or to photograph the image with a digital camera or a micro TV unit
-2. Loosen the retention screw, then rotate the adjustment ring to change the length of the vertical tube.
-3. Make sure that both the images in",0.022151898734177215,"SING THE VERTICAL TUBE - MODELS AY11230/11234
-
-1. The vertical tube can be used for instructional viewing or to photograph the image with a digital camera or a micro TV unit.
-2. Loosen the retention screw, then rotate the adjustment ring to change the length of the vertical tube.
-3. Make sure that both the images i",0.00949367088607595,"USING THE VERTICAL TUBE - MODELS AY11230/11234
-1. The vertical tube can be used for instructional viewing or to photograph the image with a digital camera or a micro TV unit
-2. Loosen the retention screw, then rotate the adjustment ring to change the length of the vertical tube.
-3. Make sure that both the images in",0.509493670886076,"l outlet.
-
-- 1. The vertical tube can be used for instructional viewing or to photograph
-
-- the image with a digital camera or a micro TV unit
-
-- 2. When the bulb is cool, remove the
-
-- oblique illuminator cap and remove the halogen bulb with cap.
-
-2. Loosen the retention screw, then rotate the adjustment ring",0.022151898734177215,"USING THE VERTICAL TUBE MODELS AY11230/11234
-
-1. The vertical tube can be used for instructional viewing or to photograph the image with a digital camera or a micro TV unit
-2. Loosen the retention screw, then rotate the adjustment ring to change the length of the vertical tube.
-3. Make sure that both the images in
-",0.022151898734177215,"USING THE VERTICAL TUBE MODELS AY11230/11234
-
-1. The vertical tube can be used for instructional viewing or to photograph the image with a digital camera or a micro TV unit
-2. Loosen the retention screw, then rotate the adjustment ring to change the length of the vertical tube.
-3. Make sure that both the images in
-",66,manuals_sample
-66,3,"CHANGING THE BULB 1. Disconnect the power cord from the electrical outlet. 2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap. g p 3. Replace with a new halogen bulb. p g 4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.",False,0.0634441087613293,"CHANGING THE BULB
-
-1. Disconnect the power cord from the
-electrical outlet.
-
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-
-3. Replace with a new halogen bulb.
-
-4. Open the window in the base plate
-and replace the halogen lamp or
-fluorescent lamp of transmitted
- illuminator.
-
-1",0.06042296072507553,".
-
-### CHANGING THE BULB
-
-1. Disconnect the power cord from the electrical outlet.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.",0.06042296072507553," CHANGING THE BULB
-1. Disconnect the power cord from the electrical outlet.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
----
-
-",0.06042296072507553,"
-
-### CHANGING THE BULB
-1. Disconnect the power cord from the electrical outlet.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
-",0.3081570996978852,"for the left and right eyepieces, then before viewing set the diopter ring adjustments to that setting.
-
-- oblique illuminator cap and remove the halogen bulb with cap.
-
-- 3. Replace with a new halogen bulb.
-
-- 4. Open the window in the base plate and
-
-- replace the halogen lamp or fluorescent lamp of transmitted illuminator.",0.06042296072507553,"
-## CHANGING THE BULB
-
-1. Disconnect the power cord from the electrical outlet.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
-<",0.06042296072507553,"
-## CHANGING THE BULB
-
-1. Disconnect the power cord from the electrical outlet.
-2. When the bulb is cool, remove the oblique illuminator cap and remove the halogen bulb with cap.
-3. Replace with a new halogen bulb.
-4. Open the window in the base plate and replace the halogen lamp or fluorescent lamp of transmitted illuminator.
-
-<",66,manuals_sample
-66,4,MICROSCOPE USAGE BARSKA Model AY11236 is a powerful fixed power compound microscope designed for biological studies such as specimen examination. It can also be used for examining bacteria and for general clinical and medical studies and other scientific uses.,False,0.011538461538461539,"MICROSCOPE USAGE
-
-BARSKA Model AY11236 is a powerful fixed power compound microscope designed for biological studies such as specimen examination. It can also be used for examining bacteria and for general clinical and medical studies and other scientific uses",0.011538461538461539,"ICROSCOPE USAGE
-
-BARSKA Model AY11236 is a powerful fixed power compound microscope designed for biological studies such as specimen examination. It can also be used for examining bacteria and for general clinical and medical studies and other scientific uses.",0.011538461538461539,"MICROSCOPE USAGE
-
-BARSKA Model AY11236 is a powerful fixed power compound microscope designed for biological studies such as specimen examination. It can also be used for examining bacteria and for general clinical and medical studies and other scientific uses",0.011538461538461539,"MICROSCOPE USAGE
-
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-BARSKA Model AY11236 is a powerful fixed power compound microscope designed for biological studies such as specimen examination. It can also be used for examining bacteria and for general clinical and medical studies and other scientific uses",66,manuals_sample
-66,5,"CONSTRUCTION BARSKA Model AY11236 is a fixed power compound microscope. It is constructed with two optical paths at the same angle. It is equipped with transmitted illumination. By using this instrument, the user can observe specimens at magnification from 40x to 1000x by selecting the desired objective lens. Coarse and fine focus adjustments provide accuracy and image detail. The rotating head allows the user to position the eyepieces for maximum viewing comfort and easy access to all adjustment knobs.",False,0.005905511811023622,"ONSTRUCTION
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-BARSKA Model AY11236 is a fixed power compound microscope. It is constructed with two optical paths at the same angle. It is equipped with transmitted illumination. By using this instrument, the user can observe specimens at magnification from 40x to 1000x by selecting the desired objective lens. Coarse and fine focus adjustments provide accuracy and image detail. The rotating head allows the user to position the eyepieces for maximum viewing comfort and easy access to all adjustment knobs.",0.005905511811023622,"CONSTRUCTION
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-BARSKA Model AY11236 is a fixed power compound microscope. It is constructed with two optical paths at the same angle. It is equipped with transmitted illumination. By using this instrument, the user can observe specimens at magnification from 40x to 1000x by selecting the desired objective lens. Coarse and fine focus adjustments provide accuracy and image detail. The rotating head allows the user to position the eyepieces for maximum viewing comfort and easy access to all adjustment knobs",0.005905511811023622,"CONSTRUCTION
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-BARSKA Model AY11236 is a fixed power compound microscope. It is constructed with two optical paths at the same angle. It is equipped with transmitted illumination. By using this instrument, the user can observe specimens at magnification from 40x to 1000x by selecting the desired objective lens. Coarse and fine focus adjustments provide accuracy and image detail. The rotating head allows the user to position the eyepieces for maximum viewing comfort and easy access to all adjustment knobs",0.005905511811023622,"CONSTRUCTION
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-BARSKA Model AY11236 is a fixed power compound microscope. It is constructed with two optical paths at the same angle. It is equipped with transmitted illumination. By using this instrument, the user can observe specimens at magnification from 40x to 1000x by selecting the desired objective lens. Coarse and fine focus adjustments provide accuracy and image detail. The rotating head allows the user to position the eyepieces for maximum viewing comfort and easy access to all adjustment knobs",0.015748031496062992,"ONSTRUCTION**
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-BARSKA Model AY11236 is a fixed power compound microscope. It is constructed with two optical paths at the same angle. It is equipped with transmitted illumination. By using this instrument, the user can observe specimens at magnification from 40x to 1000x by selecting the desired objective lens. Coarse and fine focus adjustments provide accuracy and image detail. The rotating head allows the user to position the eyepieces for maximum viewing comfort and easy access to all adjustment kno",0.005905511811023622,"CONSTRUCTION
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-BARSKA Model AY11236 is a fixed power compound microscope. It is constructed with two optical paths at the same angle. It is equipped with transmitted illumination. By using this instrument, the user can observe specimens at magnification from 40x to 1000x by selecting the desired objective lens. Coarse and fine focus adjustments provide accuracy and image detail. The rotating head allows the user to position the eyepieces for maximum viewing comfort and easy access to all adjustment knobs",0.005905511811023622,"CONSTRUCTION
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-BARSKA Model AY11236 is a fixed power compound microscope. It is constructed with two optical paths at the same angle. It is equipped with transmitted illumination. By using this instrument, the user can observe specimens at magnification from 40x to 1000x by selecting the desired objective lens. Coarse and fine focus adjustments provide accuracy and image detail. The rotating head allows the user to position the eyepieces for maximum viewing comfort and easy access to all adjustment knobs",66,manuals_sample
-67,0,"Each paragraph should contain one main thought or idea, and there should be a logical link between each paragraph and the next. Make sure that you focus on answering the question – only include relevant information, and remember to present logical arguments in support of your answer.",False,0.02112676056338028,"Each paragraph should contain one main thought or idea, and there should be a logical link between each paragraph and the next.
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-67,4,"TYPES OF QUESTIONS THAT YOU WILL FREQUENTLY COME ACROSS IN ASSIGNMENTS In your assignments, you will often be asked to write short paragraphs or longer essays in which you have to “explain” a particular concept, “iden- tify” certain features, or “prove” a certain point. It’s sometimes difficult to figure out exactly what these questions mean -- which is why we are providing you with the following explanations:",False,0.01694915254237288,"TYPES OF QUESTIONS THAT YOU WILL FREQUENTLY COME ACROSS IN ASSIGNMENTS
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-In your assignments, you will often be asked to write short paragraphs or longer essays in which you have to 'explain' a particular concept, 'identify' certain features, or 'prove' a certain point.
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-68,1,A copy of your ID Proof of your highest grade passed Proof of any other relevant qualifications you have obtained,False,0.07964601769911504,"A copy of your ID
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-70,0,"environment. The Master, Infrastructure and Compute Roles are deployed to a single node (Figure 6-1).",False,0.0,"environment. The Master, Infrastructure and Compute Roles are deployed to a single node (Figure 6-1).",0.0,"environment. The Master, Infrastructure and Compute Roles are deployed to a single node (Figure 6-1).",0.0,"environment. The Master, Infrastructure and Compute Roles are deployed to a single node (Figure 6-1).",0.0,"environment. The Master, Infrastructure and Compute Roles are deployed to a single node (Figure 6-1).",0.0,"environment. The Master, Infrastructure and Compute Roles are deployed to a single node (Figure 6-1).",0.6039603960396039,"le and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the ",0.6039603960396039,"le and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the ",70,manuals_sample
-70,1,"Seven nodes deployment is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2).",False,0.0,"Seven nodes deployment is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2).",0.015748031496062992,"Seven nodes deployment** is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2",0.015748031496062992,"even nodes deployment** is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2)",0.015748031496062992,"Seven nodes deployment** is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2",0.015748031496062992,"even nodes deployment** is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2)",0.0,"Seven nodes deployment is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2).",0.0,"Seven nodes deployment is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2).",70,manuals_sample
-71,0,"By right-clicking and selecting Properties, you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure 5-30.",False,0.0,"By right-clicking and selecting Properties, you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure 5-30.",0.04419889502762431,"right-clicking and selecting **Properties**, you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure 5-30",0.04419889502762431,"By right-clicking and selecting **Properties**, you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure 5",0.04419889502762431,"ight-clicking and selecting **Properties**, you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure 5-30.",0.055248618784530384,"By right-clicking and selecting **Properties** , you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure ",0.011049723756906077,"By right-clicking and selecting Properties , you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure 5-30",0.011049723756906077,"By right-clicking and selecting Properties , you see detailed technical parameters, such as ID, state (online or offline), drive capacity, and the drive use, as shown in Figure 5-30",71,manuals_sample
-71,1,"In an environment with multiple IBM Storwize V7000 clusters, you can easily direct the onsite personnel or technician to the correct device by enabling the identification LED on the front pane. Click Turn Identify On in the menu that is shown in Figure 5-31. Wait for confirmation from the technician that the device in the data center was correctly identified. In the GUI, you see a flashing light, which indicates that the Identify LED was turned on.",False,0.35176991150442477,"ion
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-
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-72,0,Approve/Approve of To “approve” something is to give consent. E.g. The director approved the budget. To “approve of” something is to express a favourable opinion about it. E.g. The mother did not approve of the way her daughter was dressed for the school dance.,False,0.034482758620689655,"Approve/Approve of
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-To ""borrow"" something is to take it with the intention of giving it back.
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-To “borrow” something is to take it with the intention of giving it back. E.g. He borrowed the book from his colleague.
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-To 'borrow' something is to take it with the intention of giving it back. E.g. He borrowed the book from his colleague.
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-To 'lend' something is to give it to someone with the expectation that they will give it back. E.g. She is lending the car to him so that he can drive to work today",72,manuals_sample
-72,2,Compliment/Complement You “compliment” someone when you make a favourable comment about them. E.g. He complimented her by telling her that she was a good writer. You “complement” something (or someone) when you add something else to it that suits or fits it well. E.g.That scarf complements her dress.,False,0.046511627906976744,"iment/Complement
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-You “compliment” someone when you make a favourable comment about them.
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-You “compliment” someone when you make a favourable comment about them.
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-E.g. He complimented her by telling her that she was a good writer.
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-E.g. That scarf complements her dre",0.053156146179401995,"mpliment/Complement
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-You “compliment” someone when you make a favourable comment about them.
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-You “complement” something (or someone) when you add something else to it that suits or fits it well.
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-You ""compliment"" someone when you make a favourable comment about them.
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-You ""complement"" something (or someone) when you add something else to it that suits or fits it well.
-E.g. That scarf complements her dress.",0.059800664451827246,"ent/Complement**
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-You “compliment” someone when you make a favourable comment about them.
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-You 'complement' something (or someone) when you add something else to it that suits or fits it well. E.g. That scarf complements her dress.",0.03986710963455149,"pliment/Complement
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-You 'compliment' someone when you make a favourable comment about them. E.g. He complimented her by telling her that she was a good writer.
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-You 'complement' something (or someone) when you add something else to it that suits or fits it well. E.g. That scarf complements her dress.",72,manuals_sample
-73,0,STEP 4 – PAY YOUR REGISTRATION FEE AND SEND IN OU YOUR FORM,False,0.1016949152542373,"# STEP 4 – PAY YOUR REGISTRATION FEE AND SEND IN YOUR FORM
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-73,1,"Different courses have different registration fees. Please check the course fees list (www.oxbridgeacademy.co.za/Documents/ Price-list-2015.pdf) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment. If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees.",False,0.003911342894393742,"Different courses have different registration fees. Please check the course fees list (www.oxbridgeacademy.co.za/Documents/ Price-list-2015.pdf) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees",0.10430247718383312,"he course fees list ([www.oxbridgeacademy.co.za/Documents/Price-list-2015.pdf](http://www.oxbridgeacademy.co.za/Documents/Price-list-2015.pdf)) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees.",0.003911342894393742,"ifferent courses have different registration fees. Please check the course fees list (www.oxbridgeacademy.co.za/Documents/ Price-list-2015.pdf) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees.",0.003911342894393742,"Different courses have different registration fees. Please check the course fees list (www.oxbridgeacademy.co.za/Documents/ Price-list-2015.pdf) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees",0.007822685788787484,"ferent courses have different registration fees. Please check the course fees list (www.oxbridgeacademy.co.za/Documents/ Price-list-2015.pdf) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees.",0.00651890482398957,"fferent courses have different registration fees. Please check the course fees list (www.oxbridgeacademy.co.za/Documents/ Price-list-2015.pdf) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees.",0.00651890482398957,"fferent courses have different registration fees. Please check the course fees list (www.oxbridgeacademy.co.za/Documents/ Price-list-2015.pdf) to find out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration with Oxbridge Academy, and that they do not have any objections. If you are unemployed, you will need a guarantor to sign this section of the form. Your parent or guarantor will be held responsible if you miss any of your payments in relation to your course fees.",73,manuals_sample
-73,2,"Registration fee payable upon registration either by cheque, postal order, bank deposit, electronic transfer or ATM deposit. Enclose the registration fee when submitting this form and we will send you a Welcome Pack that includes your 1st Study Unit, Success Study Guide and Student card. International students will be required to pay a deposit of R2400.",True,0.0,"Registration fee payable upon registration either by cheque, postal order, bank deposit, electronic transfer or ATM deposit. Enclose the registration fee when submitting this form and we will send you a Welcome Pack that includes your 1st Study Unit, Success Study Guide and Student card. International students will be required to pay a deposit of R2400.",0.0,"Registration fee payable upon registration either by cheque, postal order, bank deposit, electronic transfer or ATM deposit. Enclose the registration fee when submitting this form and we will send you a Welcome Pack that includes your 1st Study Unit, Success Study Guide and Student card. International students will be required to pay a deposit of R2400.",0.0,"Registration fee payable upon registration either by cheque, postal order, bank deposit, electronic transfer or ATM deposit. Enclose the registration fee when submitting this form and we will send you a Welcome Pack that includes your 1st Study Unit, Success Study Guide and Student card. International students will be required to pay a deposit of R2400.",0.0,"Registration fee payable upon registration either by cheque, postal order, bank deposit, electronic transfer or ATM deposit. Enclose the registration fee when submitting this form and we will send you a Welcome Pack that includes your 1st Study Unit, Success Study Guide and Student card. International students will be required to pay a deposit of R2400.",0.7549295774647887,"out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-If you are under the age of 18, your parent or guardian will need to sign this section of the form to state that they are aware of your registration wi",0.3352112676056338,"## STEP 4 - PAY YOUR REGISTRATION FEE AND SEND IN YOUR FORM
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-## STEP4-RegistrationFee
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-Enclose the registration fee when submitting this form and we will send you a Welcome Pack thatincludesyourIstStudy Unit, Success Study Guide and Student card. Intemational students will be requined to pay a deposit of R2400.",0.7577464788732394," out how much you need to pay to register for your chosen course, and pay this amount using the banking details provided at the bottom of the registration form. Remember to attach your proof of payment.
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-73,3,"If you need help with your studies, read our blog post:",True,0.03636363636363636,"If you need help
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-74,1,"4. Synchronize to system C, and ensure that A → C is established: – A → B, A → C, A → D, B → C, B → D, and C → D – A → B, A → C, and B → C Figure 11-84 shows an example of a triangle topology (A → B, A → C, and B → C). Figure 11-84 Triangle topology",False,0.3132530120481928,"ip).
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-4. Synchronize to system C, and ensure that A → C is established: A-BA-C, A. & D. B → C, B D, and C and B → C
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-Figure 11-84 shows an example of a triangle topology (A → B, A → C, and B →C).
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-The image shows a triangle topology with nodes A, B,",0.5261044176706827,". Synchronize to system C, and ensure that $A \to C$ is established:
-
-$A \to B$ , $A \to C$ , $A \to D$ , $B \to C$ , $B \to D$ , and $C \to D$
- $A \to B$ , $A \to C$ , and $B \to C$
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-Figure 11-84 shows an example of a triangle topology ",0.10441767068273092,"ronize to system C, and ensure that A → C is established:
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- - A → B, A → C, and B → C
-
-Figure 11-84 shows an example of a triangle topology (A → B, A → C, and B → C).
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-
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-Monday-Friday 8:30AM-5:30PM PST
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-**NOTE:** This warranty is valid to U.S.A. customers who have purchased this product from an authorized BARSKA dealer in the ",0.025108493490390578,"nts your microscope to be free from defects in materials and workmanship for one (1) year. BARSKA will repair or replace such product or part thereof which, upon inspection by BARSKA, is found to be defective in materials or workmanship. As a condition to the obligation of BARSKA to repair or replace such product, the product must be returned to BARSKA together with proof-of-purchase satisfactory to BARSKA.
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-The Proper Return Merchandise Authorization Number (RMA) must be obtained from BARSKA in advance of return. Call BARSKA at (909) 445-8168 to receive the number to be displayed on the outside of your shipping container.
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-
-The customer shall be responsible for all costs of transportation and insurance, both to and from BARSKA, and shall be required to prepay such costs.
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-BARSKA shall use reasonable efforts to repair or replace any microscope covered by this warranty within thirty days of receipt. In the event repair or replacement shall require more than thirty days, BARSKA shall notify the customer accordingly. BARSKA reserves the right to replace any product which has been discontinued from its product line with a new product of comparable value and function.
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-This warranty shall be void and of no force of effect in the event a covered product has been modified in design or function, or subjected to abuse, misuse, mishandling or unauthorized repair. Further, product malfunction or deterioration due to normal wear is not covered by this warranty.
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-> BARSKA DISCLAIMS ANY WARRANTIES, EXPRESS OR IMPLIED, WHETHER OF MERCHANTABILITY OF FITNESS FOR A PARTICULAR USE, EXCEPT AS EXPRESSLY SET FORTH HEREIN. THE SOLE OBLIGATION OF BARSKA UNDER THIS LIMITED WARRANTY SHALL BE TO REPAIR OR REPLACE THE COVERED PRODUCT, IN ACCORDANCE WITH THE TERMS SET FORTH HEREIN. BARSKA EXPRESSLY DISCLAIMS ANY LOST PROFITS, GENERAL, SPECIAL, INDIRECT OR CONSEQUENTIAL DAMAGES WHICH MAY RESULT FROM BREACH OF ANY WARRANTY, OR ARISING OUT OF THE USE OR INABILITY TO USE ANY BARSKA PRODUCT. ANY WARRANTIES WHICH ARE IMPLIED AND WHICH CANNOT BE DISCLAIMED SHALL BE LIMITED IN DURATION TO A TERM OF ONE YEAR FROM THE DATE OF ORIGINAL RETAIL PURCHASE.
-
-Some states do not allow the exclusion or limitation of incidental or consequential damages or limitation on how long an implied warranty lasts, so the above limitations and exclusions may not apply to you.
-
-This warranty gives you specific legal rights, and you may also have other rights which vary from state to state.
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-BARSKA reserves the right to modify or discontinue, without prior notice to you, any model or style microscope.
-
-If warranty problems arise, or if you need assistance in using your microscope contact:
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-Customer Service Department
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-Fax. (909) 445-8169
-e-mail: service@barska.com
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-**Monday-Friday 8:30AM-5:30PM PST**
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-**NOTE:** This warranty is valid to U.S.A. customers who have purchased this product from an authorized BARSKA dealer in t",0.014879107253564786,"RANTY
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-The Proper Return Merchandise Authorization Number (RMA) must be obtained from BARSKA in advance of return. Call BARSKA at (909) 445-8168 to receive the number to be displayed on the outside of your shipping container.
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-
-The customer shall be responsible for all costs of transportation and insurance, both to and from BARSKA, and shall be required to prepay such costs.
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-BARSKA shall use reasonable efforts to repair or replace any microscope covered by this warranty within thirty days of receipt. In the event repair or replacement shall require more than thirty days, BARSKA shall notify the customer accordingly. BARSKA reserves the right to replace any product which has been discontinued from its product line with a new product of comparable value and function.
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-BARSKA DISCLAIMS ANY WARRANTIES, EXPRESS OR IMPLIED, WHETHER OF MERCHANTABILITY OF FITNESS FOR A PARTICULAR USE, EXCEPT AS EXPRESSLY SET FORTH HEREIN. THE SOLE OBLIGATION OF BARSKA UNDER THIS LIMITED WARRANTY SHALL BE TO REPAIR OR REPLACE THE COVERED PRODUCT, IN ACCORDANCE WITH THE TERMS SET FORTH HEREIN. BARSKA EXPRESSLY DISCLAIMS ANY LOST PROFITS, GENERAL, SPECIAL, INDIRECT OR CONSEQUENTIAL DAMAGES WHICH MAY RESULT FROM BREACH OF ANY WARRANTY, OR ARISING OUT OF THE USE OR INABILITY TO USE ANY BARSKA PRODUCT. ANY WARRANTIES WHICH ARE IMPLIED AND WHICH CANNOT BE DISCLAIMED SHALL BE LIMITED IN DURATION TO A TERM OF ONE YEAR FROM THE DATE OF ORIGINAL RETAIL PURCHASE.
-
-Some states do not allow the exclusion or limitation of incidental or consequential damages or limitation on how long an implied warranty lasts, so the above limitations and exclusions may not apply to you.
-
-This warranty gives you specific legal rights, and you may also have other rights which vary from state to state.
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-BARSKA reserves the right to modify or discontinue, without prior notice to you, any model or style microscope.
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-
-The customer shall be responsible for all costs of transportation and insurance, both to and from BARSKA, and shall be required to prepay such costs.
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-BARSKA shall use reasonable efforts to repair or replace any microscope covered by this warranty within thirty days of receipt. In the event repair or replacement shall require more than thirty days, BARSKA shall notify the customer accordingly. BARSKA reserves the right to replace any product which has been discontinued from its product line with a new product of comparable value and function.
-
-This warranty shall be void and of no force of effect in the event a covered product has been modified in design or function, or subjected to abuse, misuse, mishandling or unauthorized repair. Further, product malfunction or deterioration due to normal wear is not covered by this warranty.
-
-BARSKA DISCLAIMS ANY WARRANTIES, EXPRESS OR IMPLIED, WHETHER OF MERCHANTABILITY OF FITNESS FOR A PARTICULAR USE, EXCEPT AS EXPRESSLY SET FORTH HEREIN. THE SOLE OBLIGATION OF BARSKA UNDER THIS LIMITED WARRANTY SHALL BE TO REPAIR OR REPLACE THE COVERED PRODUCT, IN ACCORDANCE WITH THE TERMS SET FORTH HEREIN. BARSKA EXPRESSLY DISCLAIMS ANY LOST PROFITS, GENERAL, SPECIAL, INDIRECT OR CONSEQUENTIAL DAMAGES WHICH MAY RESULT FROM BREACH OF ANY WARRANTY, OR ARISING OUT OF THE USE OR INABILITY TO USE ANY BARSKA PRODUCT. ANY WARRANTIES WHICH ARE IMPLIED AND WHICH CANNOT BE DISCLAIMED SHALL BE LIMITED IN DURATION TO A TERM OF ONE YEAR FROM THE DATE OF ORIGINAL RETAIL PURCHASE.
-
-Some states do not allow the exclusion or limitation of incidental or consequential damages or limitation on how long an implied warranty lasts, so the above limitations and exclusions may not apply to you.
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-This warranty gives you specific legal rights, and you may also have other rights which vary from state to state.
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-BARSKA reserves the right to modify or discontinue, without prior notice to you, any model or style microscope.
-
-If warranty problems arise, or if you need assistance in using your microscope contact:
-
-BARSKA Customer Service Department Tel. (909) 445-8168 Fax. (909) 445-8169 e-mail: service@barska.com Monday-Friday 8:30AM-5:30PM PST
-
-NOTE: This warranty is valid to U.S.A. customers who have purchased this product from an authorized BARSKA dealer in the",0.0712957222566646," one (1) year. BARSKA will repair or replace such product or part thereof which, upon inspection by BARSKA, is found to be defective in materials or workmanship. As a condition to the obligation of BARSKA to repair or replace such product, the product must be returned to BARSKA together with proof-of-purchase satisfactory to BARSKA.
-
-The Proper Return Merchandise Authorization Number (RMA) must be obtained from BARSKA in advance of return. Call BARSKA at (909) 445-8168 to receive the number to be displayed on the outside of your shipping container.
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-The customer shall be responsible for all costs of transportation and insurance, both to and from BARSKA, and shall be required to prepay such costs.
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-BARSKA shall use reasonable efforts to repair or replace any microscope covered by this warranty within thirty days of receipt. In the event repair or replacement shall require more than thirty days, BARSKA shall notify the customer accordingly. BARSKA reserves the right to replace any product which has been discontinued from its product line with a new product of comparable value and function.
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-This warranty shall be void and of no force of effect in the event a covered product has been modified in design or function, or subjected to abuse, misuse, mishandling or unauthorized repair. Further, product malfunction or deterioration due to normal wear is not covered by this warranty.
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-BARSKA DISCLAIMS ANY WARRANTIES, EXPRESS OR IMPLIED, WHETHER OF MERCHANTABILITY OF FITNESS FOR A PARTICULAR USE, EXCEPT AS EXPRESSLY SET FORTH HEREIN. THE SOLE OBLIGATION OF BARSKA UNDER THIS LIMITED WARRANTY SHALL BE TO REPAIR OR REPLACE THE COVERED PRODUCT, IN ACCORDANCE WITH THE TERMS SET FORTH HEREIN. BARSKA EXPRESSLY DISCLAIMS ANY LOST PROFITS, GENERAL, SPECIAL, INDIRECT OR CONSEQUENTIAL DAMAGES WHICH MAY RESULT FROM BREACH OF ANY WARRANTY, OR ARISING OUT OF THE USE OR INABILITY TO USE ANY BARSKA PRODUCT. ANY WARRANTIES WHICH ARE IMPLIED AND WHICH CANNOT BE DISCLAIMED SHALL BE LIMITED IN DURATION TO A TERM OF ONE YEAR FROM THE DATE OF ORIGINAL RETAIL PURCHASE.
-
-Some states do not allow the exclusion or limitation of incidental or consequential damages or limitation on how long an implied warranty lasts, so the above limitations and exclusions may not apply to you.
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-This warranty gives you specific legal rights, and you may also have other rights which vary from state to state.
-
-BARSKA reserves the right to modify or discontinue, without prior notice to you, any model or style microscope.
-
-If warranty problems arise, or if you need assistance in using your microscope contact:
-
-## BARSKA
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-Customer Service Department
-
-Tel. (909) 445-8168 Fax. (909) 445-8169 e-mail: service@barska.com
-
-Monday-Friday 8:30AM-5:30PM PST
-
-NOTE: This warranty is valid to U.S.A. customers who have purchased this product from an authorized BARSKA dealer in the U",0.0712957222566646," one (1) year. BARSKA will repair or replace such product or part thereof which, upon inspection by BARSKA, is found to be defective in materials or workmanship. As a condition to the obligation of BARSKA to repair or replace such product, the product must be returned to BARSKA together with proof-of-purchase satisfactory to BARSKA.
-
-The Proper Return Merchandise Authorization Number (RMA) must be obtained from BARSKA in advance of return. Call BARSKA at (909) 445-8168 to receive the number to be displayed on the outside of your shipping container.
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-All returns must be accompanied by a written statement setting forth the name, address, and daytime telephone number of the owner, together with a brief description of any claimed defects. Parts or product for which replacement is made shall become the property of BARSKA.
-
-The customer shall be responsible for all costs of transportation and insurance, both to and from BARSKA, and shall be required to prepay such costs.
-
-BARSKA shall use reasonable efforts to repair or replace any microscope covered by this warranty within thirty days of receipt. In the event repair or replacement shall require more than thirty days, BARSKA shall notify the customer accordingly. BARSKA reserves the right to replace any product which has been discontinued from its product line with a new product of comparable value and function.
-
-This warranty shall be void and of no force of effect in the event a covered product has been modified in design or function, or subjected to abuse, misuse, mishandling or unauthorized repair. Further, product malfunction or deterioration due to normal wear is not covered by this warranty.
-
-BARSKA DISCLAIMS ANY WARRANTIES, EXPRESS OR IMPLIED, WHETHER OF MERCHANTABILITY OF FITNESS FOR A PARTICULAR USE, EXCEPT AS EXPRESSLY SET FORTH HEREIN. THE SOLE OBLIGATION OF BARSKA UNDER THIS LIMITED WARRANTY SHALL BE TO REPAIR OR REPLACE THE COVERED PRODUCT, IN ACCORDANCE WITH THE TERMS SET FORTH HEREIN. BARSKA EXPRESSLY DISCLAIMS ANY LOST PROFITS, GENERAL, SPECIAL, INDIRECT OR CONSEQUENTIAL DAMAGES WHICH MAY RESULT FROM BREACH OF ANY WARRANTY, OR ARISING OUT OF THE USE OR INABILITY TO USE ANY BARSKA PRODUCT. ANY WARRANTIES WHICH ARE IMPLIED AND WHICH CANNOT BE DISCLAIMED SHALL BE LIMITED IN DURATION TO A TERM OF ONE YEAR FROM THE DATE OF ORIGINAL RETAIL PURCHASE.
-
-Some states do not allow the exclusion or limitation of incidental or consequential damages or limitation on how long an implied warranty lasts, so the above limitations and exclusions may not apply to you.
-
-This warranty gives you specific legal rights, and you may also have other rights which vary from state to state.
-
-BARSKA reserves the right to modify or discontinue, without prior notice to you, any model or style microscope.
-
-If warranty problems arise, or if you need assistance in using your microscope contact:
-
-## BARSKA
-
-Customer Service Department
-
-Tel. (909) 445-8168 Fax. (909) 445-8169 e-mail: service@barska.com
-
-Monday-Friday 8:30AM-5:30PM PST
-
-NOTE: This warranty is valid to U.S.A. customers who have purchased this product from an authorized BARSKA dealer in the U",75,manuals_sample
-75,1,"855 Towne Center Drive Pomona, CA 91767 , Tel: 888-666-6769 Fax: 909.445.8169 www.barska.com",False,0.06521739130434782,"
-855 Towne Center Drive Pomona, CA 91767
-Tel: 888-666-6769 Fax: 909.445.8169
-www.barska.com
-",0.08695652173913043,"55 Towne Center Drive Pomona, CA 91767
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-[www.barska.c",0.08695652173913043," Towne Center Drive Pomona, CA 91767
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-[www.barska.com",0.4673913043478261,"5 Towne Center Drive Pomona, CA 91767
-©2015 BARSKA Optics Tel: 888-666-6769 Fax: 909.445.",0.043478260869565216,"855 Towne Center Drive Pomona, CA 91767 Tel: 888-666-6769 Fax: 909.445.8169 **www.barska.com",0.043478260869565216,"
-
-855 Towne Center Drive Pomona, CA 91767 Tel: 888-666-6769 Fax: 909.445.8169 www.barska.com",0.043478260869565216,"
-
-855 Towne Center Drive Pomona, CA 91767 Tel: 888-666-6769 Fax: 909.445.8169 www.barska.com",75,manuals_sample
-75,2,MICROSCOPE USER MANUAL,False,0.045454545454545456,"MICROSCOPE
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-75,3,"MODEL AY11240 40X,100X,400X , , COMPOUND MONOCULAR",False,0.2,"A
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-<",75,manuals_sample
-76,0,Figure 6-4 Create Pool dialog box,False,0.0,Figure 6-4 Create Pool dialog box,0.0,Figure 6-4 Create Pool dialog box,0.06060606060606061,Figure 6-4: Create Pool dialog bo,0.18181818181818182,gure 6-4** *Create Pool dialog bo,0.12121212121212122,gure 6-4 Create Pool dialog box,0.12121212121212122,Figure 6-4 Create Pool dialog b,0.12121212121212122,Figure 6-4 Create Pool dialog b,76,manuals_sample
-76,1,"Mark the Data Reduction check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool. A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later. If you want to specify a different extent size, you can enable this option by clicking Settings → GUI Preferences → General and checking Advanced pool settings, as shown in Figure 6-5. Figure 6-5 Advanced pool settings",False,0.06140350877192982,"
-Mark the Data Reduction check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool.
-
-A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this option by clicking Settings → GUI Preferences → General and checking Advanced pool settings, as shown in Figure 6-5.
-
-Key details from the GUI scre",0.09649122807017543,"Mark the **Data Reduction** check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool.
-
-A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this option by clicking **Settings** → **GUI Preferences** → **General** and checking **Advanced pool settings**, as shown in Figure 6-5.
-
-![Screensh",0.08596491228070176," check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool.
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-A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this option by clicking **Settings** → **GUI Preferences** → **General** and checking **Advanced pool settings**, as shown in Figure 6-5.
-
-![Figure 6-5: Advanced pool settings]",0.1,"
-Mark the **Data Reduction** check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool.
-
-A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this option by clicking **Settings** ⇒ **GUI Preferences** ⇒ **General** and checking **Advanced pool settings**, as shown in Figure 6-5.
-
-[Screensh",0.1,"rk the **Data Reduction** check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool.
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-A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this option by clicking **Settings** → **GUI Preferences** → **General** and checking **Advanced pool settings** , as shown in Figure 6-5.
-
-**==> pi",0.02631578947368421,"Mark the Data Reduction check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool.
-
-A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this option by clicking Settings → GUI Preferences → General and checking Advanced pool settings , as shown in Figure 6-5.
-
-Figure 6-5 Advanced pool se",0.02631578947368421,"Mark the Data Reduction check box to create the Data Reduction Pool. Leaving it unmarked creates a standard storage pool.
-
-A standard storage pool that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
-
-If you want to specify a different extent size, you can enable this option by clicking Settings → GUI Preferences → General and checking Advanced pool settings , as shown in Figure 6-5.
-
-Figure 6-5 Advanced pool se",76,manuals_sample
-76,2,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",False,0.0,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",0.0,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",0.0,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",0.0,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",0.0,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",0.0,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",0.0,"When advanced pool settings are enabled, you can additionally select an extent size at creation time, as shown in Figure 6-6 on page 195.",76,manuals_sample
-76,3,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,False,0.0,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,0.8450704225352113,"pg)
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-Screenshot of the 'Settings' menu, showing the 'General' tab selec",0.8028169014084507,summary):** The Settings menu is shown with the General tab selected. T,0.0,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,0.0,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,0.8873239436619719,ction check box to create the Data Reduction Pool. Leaving it unmarked ,0.8873239436619719,ction check box to create the Data Reduction Pool. Leaving it unmarked ,76,manuals_sample
-76,4,"If the physical capacity usage of a data reduction pool exceeds more than 85%, I/O performance can be affected. The system needs 15% of physical capacity available in data reduction pools to ensure that capacity reclamation can be performed efficiently.",True,0.5731225296442688," if the physical capacity usage of a data reduction pool exceeds 85%. The system needs 15% of physical capacity available.
-* **Buttons:** Cancel, Create
-
-Figure 6-4 Create Pool dialog box
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-Mark the Data Reduction check box to create the Data Reduction",0.0,"If the physical capacity usage of a data reduction pool exceeds more than 85%, I/O performance can be affected. The system needs 15% of physical capacity available in data reduction pools to ensure that capacity reclamation can be performed efficiently.",0.0,"If the physical capacity usage of a data reduction pool exceeds more than 85%, I/O performance can be affected. The system needs 15% of physical capacity available in data reduction pools to ensure that capacity reclamation can be performed efficiently.",0.0,"If the physical capacity usage of a data reduction pool exceeds more than 85%, I/O performance can be affected. The system needs 15% of physical capacity available in data reduction pools to ensure that capacity reclamation can be performed efficiently.",0.7470355731225297,"g the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
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-If you want to specify a different extent size, you can enable this ",0.766798418972332,"l that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
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-If you want to specify a different extent si",0.766798418972332,"l that is created by using the GUI has a default extent size of 1 GB. Data Reduction Pools have a default extent size of 4 GB. The size of the extent is selected at creation time and cannot be changed later.
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-If you want to specify a different extent si",76,manuals_sample
-77,0,Insert PivotTable Click here to summarize data using a PivotTable or to insert a PivotChart. PivotTables make it easy to arrange and summarize complicated data and drill down on details.,True,0.7526881720430108,"ion of Pivot Table as New Sheet or Existing Sheet.
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-The image shows the ""Create PivotTable"" dialog box in Excel.
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-Key information:
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-* **Data Source:** Select a table or range. The tabl",0.10752688172043011,tip explains: 'Click here to summarize data using a PivotTable or to insert a PivotChart. PivotTables make it easy to arrange and summarize complicated data and drill down on details.'](,0.7795698924731183,"enshot of the ""Create PivotTable"" dialog box. A red box highlights the section ""Choose where you want the PivotTable report to be placed"", showing two radio button options:
-- **New Works",0.08602150537634409,"text explaining ""Click here to summarize data using a PivotTable or to insert a PivotChart. PivotTables make it easy to arrange and summarize complicated data and drill down on details.""",0.8118279569892473,"se Pi **v** ot Table wi **z** ard in the **D** ata menu. **E** xcel a **s** ow choose ks for the **d** ata source **a** nd suggest **s** Click OK.
-
-**==> picture [60 x 580] intentionall",0.8118279569892473,"e table a o add data in as many ro Rather than A $500. understand t as shown in n the future, ows as you A1:D50, you the data ran n above Slid , set the data think you u ma",0.8118279569892473,"e table a o add data in as many ro Rather than A $500. understand t as shown in n the future, ows as you A1:D50, you the data ran n above Slid , set the data think you u ma",77,manuals_sample
-77,1,"Here, we need to understand the data range. Excel suggests the table as shown in above Slide. If you expect to add data in the future, set the data range to include as many rows as you think you will ever need. Rather than A1:D50, you may want to specify $A$1:$D$500.",True,0.02247191011235955,"Here, we need understand the data range. Excel suggests the table as shown in above Slide. If you expect to add data in the future, set the data range to include as many rows as you think you will ever need. Rather than A1:D50, you may want to specify $A$1:$D$500.
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-O",0.0299625468164794,"re, we need to understand the data range. Excel suggests the table as shown in above Slide. If you expect to add data in the future, set the data range to include as many rows as you think you will ever need. Rather than A1:D50, you may want to specify \$A\$1:\$D\$50",0.0,"Here, we need to understand the data range. Excel suggests the table as shown in above Slide. If you expect to add data in the future, set the data range to include as many rows as you think you will ever need. Rather than A1:D50, you may want to specify $A$1:$D$500.",0.0,"Here, we need to understand the data range. Excel suggests the table as shown in above Slide. If you expect to add data in the future, set the data range to include as many rows as you think you will ever need. Rather than A1:D50, you may want to specify $A$1:$D$500.",0.48314606741573035,"Here, w **e** need to **u** nderstand **t** he data ra **n** suggests the table **a** s shown i **n** above Sli **d** expect t **o** add data i **n** the future **,** set the dat **a** include **a** s many r **o** will ever need. **R** ather than **A** ws as you 1:D5",0.7153558052434457,"e need to u the table a o add data in as many ro Rather than A $500. understand t as shown in n the future, ows as you A1:D50, you the data ran n above Slid , set the data think you u may want nge. Excel de. If you a range to will ever to specify",0.7153558052434457,"e need to u the table a o add data in as many ro Rather than A $500. understand t as shown in n the future, ows as you A1:D50, you the data ran n above Slid , set the data think you u may want nge. Excel de. If you a range to will ever to specify",77,manuals_sample
-78,0,"2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host ITSO-VMHOST-01 and click Import. Figure 8-39 import volume mappings source host selection",False,0.1885245901639344,"2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host ITSO-VMHOST-01 and click Import.
-
-The image shows ",0.2336065573770492,"
-
-2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host **ITSO-VMHOST-01** and click **Import**.
-
-![Screenshot o",0.10245901639344263,"2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host **ITSO-VMHOST-01** and click **Import**.
-
-![Figure 8-39: import volume mappings source ho",0.23770491803278687,"ize V8.2.1
-
-2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host `ITSO-VMHOST-01` and click **Import**.
-
-```
-Import Mappings ",0.19672131147540983,"- 2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host ITSO-VMHOST-01 and click **Import** .
-
-**==> picture [397 x 248] intention",0.18032786885245902,"2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host ITSO-VMHOST-01 and click Import .
-3. After the task complet",0.18032786885245902,"2. The import mappings window opens. Select the source host from which you want to import the volume mappings. As shown in Figure 8-39, we select the host ITSO-VMHOST-01 and click Import .
-3. After the task complet",78,manuals_sample
-78,1,"3. After the task completes, verify that the mappings are as expected from the Hosts menu (see Figure 8-26 on page 346), right-click the target host, and select Properties. Then, click the Mapped Volumes tab and verify that the required volumes were mapped to the new host (see Figure 8-37 on page 353).",False,0.006600660066006601,"3. After the task completes, verify that the mappings are as expected from the Hostsmenu (see Figure 8-26 on page 346), right-click the target host, and select Properties . Then, click the Mapped Volumes tab and verify that the required volumes were mapped to the new host (see Figure 8-37 on page 353).",0.07920792079207921,"3. After the task completes, verify that the mappings are as expected from the **Hosts** menu (see Figure 8-26 on page 346), right-click the target host, and select **Properties**. Then, click the **Mapped Volumes** tab and verify that the required volumes were mapped to the new host (see Figure 8-37 o",0.07920792079207921,"ter the task completes, verify that the mappings are as expected from the **Hosts** menu (see Figure 8-26 on page 346), right-click the target host, and select **Properties**. Then, click the **Mapped Volumes** tab and verify that the required volumes were mapped to the new host (see Figure 8-37 on pag",0.07920792079207921,"After the task completes, verify that the mappings are as expected from the **Hosts** menu (see Figure 8-26 on page 346), right-click the target host, and select **Properties**. Then, click the **Mapped Volumes** tab and verify that the required volumes were mapped to the new host (see Figure 8-37 on p",0.0858085808580858,"After the task completes, verify that the mappings are as expected from the **Hosts** menu (see Figure 8-26 on page 346), right-click the target host, and select **Properties** . Then, click the **Mapped Volumes** tab and verify that the required volumes were mapped to the new host (see Figure 8-37 on ",0.006600660066006601,". After the task completes, verify that the mappings are as expected from the Hosts menu (see Figure 8-26 on page 346), right-click the target host, and select Properties . Then, click the Mapped Volumes tab and verify that the required volumes were mapped to the new host (see Figure 8-37 on page 353).",0.006600660066006601,". After the task completes, verify that the mappings are as expected from the Hosts menu (see Figure 8-26 on page 346), right-click the target host, and select Properties . Then, click the Mapped Volumes tab and verify that the required volumes were mapped to the new host (see Figure 8-37 on page 353).",78,manuals_sample
-78,2,"Renaming a host To rename a host, complete the following steps: 1. Select the host, and then right-click and select Rename (see Figure 8-40). Figure 8-40 Rename a host",False,0.17964071856287425,"
-## Renaming a host
-
-To rename a host, complete the following steps:
-
-1. Select the host, and then right-click and select Rename (see Figure 8-40).
-
-| Name ",0.19760479041916168,"
-
-# Renaming a host
-
-To rename a host, complete the following steps:
-
-1. Select the host, and then right-click and select **Rename** (see Figure 8-40).
-
-![Screenshot s",0.1377245508982036,"g a host
-
-To rename a host, complete the following steps:
-
-1. Select the host, and then right-click and select **Rename** (see Figure 8-40).
-
-![Figure 8-40: Rename a h",0.17964071856287425,"Renaming a host
-
-To rename a host, complete the following steps:
-
-1. Select the host, and then right-click and select **Rename** (see Figure 8-40).
-
-```
-⊕ Add Host ",0.2155688622754491,"Renaming a host**
-
-To rename a host, complete the following steps:
-
-- 1. Select the host, and then right-click and select **Rename** (see Figure 8-40).
-
-**==> pictu",0.07784431137724551,"enaming a host
-
-To rename a host, complete the following steps:
-
-1. Select the host, and then right-click and select Rename (see Figure 8-40).
-
-Figure 8-40 Rename a ",0.07784431137724551,"enaming a host
-
-To rename a host, complete the following steps:
-
-1. Select the host, and then right-click and select Rename (see Figure 8-40).
-
-Figure 8-40 Rename a ",78,manuals_sample
-78,3,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,False,0.0,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,0.8591549295774648,eenshot showing the context menu for a host (ITSO-VMHOST-01) in the Hos,0.8450704225352113,lect the source host from which you want to import the volume mappings.,0.0,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,0.0,Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,0.8169014084507042,"omplete the following steps:
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-1. Select the host, and then right-click ",0.8169014084507042,"omplete the following steps:
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-1. Select the host, and then right-click ",78,manuals_sample
-79,0,"Draft Document for Review December 11, 2019 1:55 pm",False,0.0,"Draft Document for Review December 11, 2019 1:55 pm",0.803921568627451,"rtunities for revenue growth, Deliver better (more ",0.0,"Draft Document for Review December 11, 2019 1:55 pm",0.0,"Draft Document for Review December 11, 2019 1:55 pm",0.0,"Draft Document for Review December 11, 2019 1:55 pm",0.803921568627451,"reat customer experiences at scale.
-- /SM590000 Int",0.803921568627451,"reat customer experiences at scale.
-- /SM590000 Int",79,manuals_sample
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-79,3,"IBM Cloud Pak for Automation is a containerized automation software platform with pre-integrated automation capabilities such as workflow and decision automation, content management, document processing, and operational intelligence (Figure 3-7 on page 43). This enables organizations to digitize all styles of work with AI-infused business-oriented tools and built-in operational analytics for visibility and governance. This offering empowers business users to rapidly deliver applications and services at enterprise scale for greater cost savings and operational efficiencies. The IBM Cloud Pak for Automation can run anywhere (on-premises, on private and public clouds, and in pre-integrated systems) and is Red Hat OpenShift certified. Figure 3-7 IBM Cloud Pak for Automation",False,0.05897435897435897,".1 Features
-
-IBM Cloud Pak for Automation is a containerized automation software platform with pre-integrated automation capabilities such as workflow and decision automation, content management, document processing, and operational intelligence (Figure 3-7 on page 43). This enables organizations to digitize all styles of work with AI-infused business-oriented tools and built-in operational analytics for visibility and governance. This offering empowers business users to rapidly deliver applications and services at enterprise scale for greater cost savings and operational efficiencies. The IBM Cloud Pak for Automation can run anywhere (on-premises, on private and public clouds, and in pre-integrated systems) and is Red Hat OpenShift certified.
-
-| Layer | Contents / Labe",0.05128205128205128,"res
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-IBM Cloud Pak for Automation is a containerized automation software platform with pre-integrated automation capabilities such as workflow and decision automation, content management, document processing, and operational intelligence (Figure 3-7 on page 43). This enables organizations to digitize all styles of work with AI-infused business-oriented tools and built-in operational analytics for visibility and governance. This offering empowers business users to rapidly deliver applications and services at enterprise scale for greater cost savings and operational efficiencies. The IBM Cloud Pak for Automation can run anywhere (on-premises, on private and public clouds, and in pre-integrated systems) and is Red Hat OpenShift certified.
-
-![Diagram showing IBM containeriz",0.011538461538461539," Cloud Pak for Automation is a containerized automation software platform with pre-integrated automation capabilities such as workflow and decision automation, content management, document processing, and operational intelligence (Figure 3-7 on page 43). This enables organizations to digitize all styles of work with AI-infused business-oriented tools and built-in operational analytics for visibility and governance. This offering empowers business users to rapidly deliver applications and services at enterprise scale for greater cost savings and operational efficiencies. The IBM Cloud Pak for Automation can run anywhere (on-premises, on private and public clouds, and in pre-integrated systems) and is Red Hat OpenShift certified.
-
-![Figure 3-7: IBM Cloud Pak for Automatio",0.05128205128205128,"
-IBM Cloud Pak for Automation is a containerized automation software platform with pre-integrated automation capabilities such as workflow and decision automation, content management, document processing, and operational intelligence (Figure 3-7 on page 43). This enables organizations to digitize all styles of work with AI-infused business-oriented tools and built-in operational analytics for visibility and governance. This offering empowers business users to rapidly deliver applications and services at enterprise scale for greater cost savings and operational efficiencies. The IBM Cloud Pak for Automation can run anywhere (on-premises, on private and public clouds, and in pre-integrated systems) and is Red Hat OpenShift certified.
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-Figure 3-8 IBM Cloud Pak for Automation benefits
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-- Drive scale, speed, and assist with complex knowledge work.
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-- Automate complex and less-structured business processes and optimize lighter customer experiences for task efficiency.
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-- Drive growth with enhanced customer experiences and new business models.",0.2629558541266795,"op-line': New business models, Find new opportunities for revenue growth, Deliver better (more personalized, more relevant...) products and services.
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-Figure 3-8 IBM Cloud Pak for Automation benefits
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-Additional features of the IBM Cloud Pak for Automation are:
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-- Drive scale, speed, and assist with complex knowledge work.
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-* Automate complex and less-structured business processes and optimize lighter customer experiences for task efficiency.
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-* ",0.46641074856046066,"----------------------------------------------------------------------- |
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-*Figure 3-8 IBM Cloud Pak for Automation benefits*
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-Additional features of the IBM Cloud Pak for Automation are:
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-* Drive scale, speed, and assist with complex knowledge work.
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-**==> picture [412 x 120] intentionally omitted <==**
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-_Figure 3-8 IBM Cloud Pak for Automation benefits_
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-Additional features of the IBM Cloud Pak for Automation are:
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-- � Automate complex and less-structured business processes and optimize lighter customer
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- - experiences for task eff",0.22072936660268713,"ses look for modernizing their business operations with intelligent automation lowering costs and increasing revenue as shown in Figure 3-8.
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-Figure 3-8 IBM Cloud Pak for Automation benefits
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-
-
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-- /SM590000 Drive scale, speed, and assist with complex knowledge work.
-- /SM590000 Automate complex and less-structured business processes and optimize lighter customer experiences for task efficiency.
-- /SM590000 Drive growth with enhanced custome",0.22072936660268713,"ses look for modernizing their business operations with intelligent automation lowering costs and increasing revenue as shown in Figure 3-8.
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-Figure 3-8 IBM Cloud Pak for Automation benefits
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-
-
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-- /SM590000 Drive scale, speed, and assist with complex knowledge work.
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-80,1,"1.3.4 ENJOY POWERFUL AND IMPROVED TABLE FEATURES Create, filter, format and expand multiple tables with a set of formulas since Microsoft excel has improved features for tables. For instance, if you want to view data in an extended table, Office Excel keeps table headers in view as you scroll.",False,0.01020408163265306,"1.3.4 ENJOY POWERFUL AND IMPROVED TABLE FEATURES
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-80,2,"1.3.5 SHARE SPREADSHEETS Use Microsoft Excel to share multiple spreadsheets with co-workers. Other parties may also access the data online as it renders the spreadsheets as HTML. Additionally, you can navigate, filter, sort and input parameters, all within the Web browser. Besides its numerous benefits, Microsoft Excel also has its share of shortcoming as well. Many users claim that Office Excel is not easily shared compared to other office applications.",False,0.013100436681222707,".3.5 SHARE SPREADSHEETS
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-Besides its numerous benefits, Microsoft Excel also has its share of shortcoming as well. Many users claim that Office Excel is not easily shared compared to other office applications.",0.008733624454148471,".3.5 SHARE SPREADSHEETS
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-Besides its numerous benefits, Microsoft Excel also has its share of shortcoming as well. Many users claim that Office Excel is not easily shared compared to other office applications.",0.013100436681222707,".3.5 SHARE SPREADSHEETS
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-Besides its numerous benefits, Microsoft Excel also has its share of shortcoming as well. Many users claim that Office Excel is not easily shared compared to other office applications",0.026200873362445413,".3.5 SHARE SPREADSHEETS**
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-80,3,"2. ERROR MESSAGES (CELL REFERENCE) If you get an error message in Excel you might not get much help from the program in finding out the cause. The articles listed here cover the cause and cures for a number of common error messages in Excel, such as #REF!, #NULL!, and #####.",False,0.01090909090909091,". ERROR MESSAGES (CELL REFERENCE)
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-80,5,"In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.",False,0.0,"In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.",0.0,"In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.",0.030418250950570342,"above example, if you click on the cell that contains the `#REF!` error, you will see that the cell reference within the cell has been replaced with `#REF!`. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula",0.0,"In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.",0.0,"In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.",0.0,"In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.",0.0,"In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.",80,manuals_sample
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-81,0,INDEX Maintenance............................................ 1 Model AY11240/Model AY11238.................. 2-5 Model AY11228/Model AY11232.................. 6-9 Model AY11230/Model AY11234.................. 10-13 Model AY11236........................................ 14-18 Warranty Information................................ Back Cover,False,0.5339233038348082,"## INDEX
-
-| Maintenance... | |
-|-|-|
-| Model AY11240/Model AY11238. | 2-5 |
-| Model AY11228/Model AY11232. | 6-9 |
-| Model AY11230/Model AY11234. | 10-13 |
-| Model AY11236.. | 14-18 |
-| Warranty Information..... | Back Cover",0.6696165191740413,"
-
-# INDEX
-
-| Maintenance | 1 |
-|-----------------------------|------------|
-| Model AY11240/Model AY11238 | 2-5 |
-| Model AY11228/Model AY11232 | 6-9 |
-| Model AY11230/Model AY11234 | 10-13 |
-| Model AY11236 | 14-18 |
-| Warranty Information | Back Cover",0.7551622418879056,"---
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----
-
-# INDEX
-
-| Section | Page |
-| :--- | :--- |
-| Maintenance | 1 |
-| Model AY11240/Model AY11238 | 2-5 |
-| Model AY11228/Model AY11232 | 6-9 |
-| Model AY11230/Model AY11234 | 10-13 |
-| Model AY11236 | 14-18 |
-| Warranty Information | Back Cover",0.05014749262536873,"Maintenance............................................ 1
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-Model AY11240/Model AY11238.................. 2-5
-
-Model AY11228/Model AY11232.................. 6-9
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-Model AY11230/Model AY11234.................. 10-13
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-Model AY11236........................................ 14-18
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-Warranty Information................................ Back Cover
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-
-Maintenance............................................ 1 Model AY11240/Model AY11238.................. 2-5 Model AY11228/Model AY11232.................. 6-9 Model AY11230/Model AY11234.................. 10-13 Model AY11236........................................ 14-18 Warranty Information................................
-
-Back Cover",0.0943952802359882,"## INDEX
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-| Maintenance............................................ Model AY11240/Model AY11238.................. Model AY11228/Model AY11232.................. Model AY11230/Model AY11234.................. Model AY11236........................................ Warranty Information................................ ",0.0943952802359882,"## INDEX
-
-| Maintenance............................................ Model AY11240/Model AY11238.................. Model AY11228/Model AY11232.................. Model AY11230/Model AY11234.................. Model AY11236........................................ Warranty Information................................ ",81,manuals_sample
-81,1,"IMPORTANT NOTES Congratulations on your purchase of this high quality BARSKA microscope. With proper care, this microscope will provide many years of use. Please read the following instructions before operating this instrument. 1. Do not attempt to disassemble the instrument. This product has been carefully assembled at the factory and should only be examined by a factory-trained technician. 2. This instrument should only be used in an environment with an indoor temperature range of 32oF to 104oF. 3. Do not use this instrument in an environment with a lot of dust. Cover the instrument when not in use. 4. Do not subject the instrument to shock.",False,0.02304147465437788,"ORTANT NOTES
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-81,2,"MAINTENANCE Proper care and storage of this instrument is essential. Please read the following guidelines: 1. Keep the instrument in a dry and moisture-free location. 2. Do not expose to acid, alkali fumes or moisture. 3. Keep optical parts clean and free of dust. To clean optical parts gently wipe with lens cleaning tissue and a mixture of alcohol and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios: Wet weather: 1:2 Dry Weather: 1:1 4. After use, cover the instrument with the plastic dust cover. 5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof container.",False,0.03488372093023256,"ENANCE
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-the following guidelines:
-
-1. Keep the instrument in a dry and moisture-free location.
-
-2. Do not expose to acid, alkali fumes or moisture.
-
-3. Keep optical parts clean and free of dust. To clean optical parts gently wipe with lens cleaning tissue and a mixture of alcohol and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios: Wet weather: 1:2
-
-Dry Weather: 1:1
-
-4. After use, cover the instrument with the plastic dust cover.
-
-5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof contain",0.0436046511627907,"Proper care and storage of this instrument is essential. Please read the following guidelines:
-
-1. Keep the instrument in a dry and moisture-free location.
-2. Do not expose to acid, alkali fumes or moisture.
-3. Keep optical parts clean and free of dust. To clean optical parts gently wipe with lens cleaning tissue and a mixture of alcohol and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios:
- Wet weather: 1:2
- Dry weather: 1:1
-4. After use, cover the instrument with the plastic dust cover.
-5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof container.
-",0.056686046511627904,"per care and storage of this instrument is essential. Please read the following guidelines:
-
-1. Keep the instrument in a dry and moisture-free location.
-2. Do not expose to acid, alkali fumes or moisture.
-3. Keep optical parts clean and free of dust. To clean optical parts gently wipe with lens cleaning tissue and a mixture of alcohol and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios:
- * Wet weather: 1:2
- * Dry Weather: 1:1
-4. After use, cover the instrument with the plastic dust cover.
-5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof containe",0.04505813953488372,"Proper care and storage of this instrument is essential. Please read the following guidelines:
-
-1. Keep the instrument in a dry and moisture-free location.
-
-2. Do not expose to acid, alkali fumes or moisture.
-
-3. Keep optical parts clean and free of dust. To clean optical parts gently wipe with lens cleaning tissue and a mixture of alcohol and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios:
-
- Wet weather: 1:2
-
- Dry Weather: 1:1
-
-4. After use, cover the instrument with the plastic dust cover.
-
-5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof container",0.10465116279069768,"and storage of this instrument is essential. Please read the following guidelines:
-
-- 1. Keep the instrument in a dry and moisture-free location.
-
-- 2. Do not expose to acid, alkali fumes or moisture.
-
-- 3. Keep optical parts clean and free of dust. To clean optical parts
-
-- gently wipe with lens cleaning tissue and a mixture of alcohol
-
-- and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios:
-
-- Wet weather: 1:2
-
-- Dry Weather: 1:1
-
-- 4. After use, cover the instrument with the plastic dust cover.
-
-- 5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proo",0.10755813953488372,"hock.
-
-## MAINTENANCE
-
-Proper care and storage of this instrument is essential. Please read the following guidelines:
-
-1. Keep the instrument in a dry and moisture-free location.
-2. Do not expose to acid, alkali fumes or moisture.
-3. Keep optical parts clean and free of dust. To clean optical parts gently wipe with lens cleaning tissue and a mixture of alcohol and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios:
-4. After use, cover the instrument with the plastic dust cover.
-5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof container.
-
-Wet weather: 1:2
-
-Dr",0.10755813953488372,"hock.
-
-## MAINTENANCE
-
-Proper care and storage of this instrument is essential. Please read the following guidelines:
-
-1. Keep the instrument in a dry and moisture-free location.
-2. Do not expose to acid, alkali fumes or moisture.
-3. Keep optical parts clean and free of dust. To clean optical parts gently wipe with lens cleaning tissue and a mixture of alcohol and diethyl ether. Depending on weather conditions, the following are the recommended mixture ratios:
-4. After use, cover the instrument with the plastic dust cover.
-5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof container.
-
-Wet weather: 1:2
-
-Dr",81,manuals_sample
-81,3,MODEL AY11240/AY11238,False,0.0,MODEL AY11240/AY11238,0.0,MODEL AY11240/AY11238,0.0,MODEL AY11240/AY11238,0.0,MODEL AY11240/AY11238,0.0,MODEL AY11240/AY11238,0.0,MODEL AY11240/AY11238,0.0,MODEL AY11240/AY11238,81,manuals_sample
-81,4,MICROSCOPE USAGE BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction.,False,0.010380622837370242,"ICROSCOPE USAGE
-
-BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction.",0.010380622837370242,"MICROSCOPE USAGE
-
-BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction",0.010380622837370242,"MICROSCOPE USAGE
-
-BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction",0.010380622837370242,"MICROSCOPE USAGE
-
-BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction",0.02768166089965398,"MICROSCOPE USAGE**
-
-BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruct",0.010380622837370242,"MICROSCOPE USAGE
-
-BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction",0.010380622837370242,"MICROSCOPE USAGE
-
-BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction",81,manuals_sample
-81,5,"CONSTRUCTION BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90o vertical to 45o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45o angle. The head rotates 360o. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.",False,0.006060606060606061,"ONSTRUCTION
-
-BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90o vertical to 45o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45o angle. The head rotates 360o. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.",0.014141414141414142,"CONSTRUCTION
-
-BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90° vertical to 45° level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45° angle. The head rotates 360°. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube",0.12727272727272726,"11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from $90^\circ$ vertical to $45^\circ$ level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen.
-
-BARSKA Model AY11238 features a monocular tube that is slanted at a $45^\circ$ angle. The head rotates $360^\circ$. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube",0.17777777777777778," fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90o vertical to 45o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45o angle. The head rotates 360o. The Eyepiece Set Screw prevents the eyepiece from falling out of the",0.044444444444444446,"*
-
-BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90[o] vertical to 45[o] level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45[o] angle. The head rotates 360[o] . The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.",0.030303030303030304,"NSTRUCTION
-
-BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90 o vertical to 45 o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45 o angle. The head rotates 360 o . The Eyepiece Set Screw prevents the eyepiece from falling out of the ",0.030303030303030304,"NSTRUCTION
-
-BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90 o vertical to 45 o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45 o angle. The head rotates 360 o . The Eyepiece Set Screw prevents the eyepiece from falling out of the ",81,manuals_sample
-82,0,"15.Click Finish to end the storage migration wizard, as shown in Figure 9-14.",False,0.012987012987012988,"15.ClickFinish to end the storage migration wizard, as shown in Figure 9-14.",0.1038961038961039,"5.Click **Finish** to end the storage migration wizard, as shown in Figure 9-",0.1038961038961039,"Click **Finish** to end the storage migration wizard, as shown in Figure 9-14",0.1038961038961039,"lick **Finish** to end the storage migration wizard, as shown in Figure 9-14.",0.1038961038961039,"lick **Finish** to end the storage migration wizard, as shown in Figure 9-14.",0.0,"15.Click Finish to end the storage migration wizard, as shown in Figure 9-14.",0.0,"15.Click Finish to end the storage migration wizard, as shown in Figure 9-14.",82,manuals_sample
-82,1,Figure 9-14 Migration is started,False,0.0,Figure 9-14 Migration is started,0.0,Figure 9-14 Migration is started,0.0625,Figure 9-14: Migration is starte,0.1875,gure 9-14 Migration is starte,0.125,Figure 9-14 Migration is start,0.125,gure 9-14 Migration is started,0.125,gure 9-14 Migration is started,82,manuals_sample
-82,2,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",False,0.0,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",0.0,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",0.0,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",0.0,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",0.0,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",0.0,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",0.0,"The end of the wizard is not the end of the migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displayed there.",82,manuals_sample
-82,3,Figure 9-15 The ongoing Migration is listed in the Storage Migration window,False,0.0,Figure 9-15 The ongoing Migration is listed in the Storage Migration window,0.0,Figure 9-15 The ongoing Migration is listed in the Storage Migration window,0.02666666666666667,igure 9-15: The ongoing Migration is listed in the Storage Migration window,0.08,igure 9-15 The ongoing Migration is listed in the Storage Migration wind,0.05333333333333334,gure 9-15 The ongoing Migration is listed in the Storage Migration window,0.05333333333333334,Figure 9-15 The ongoing Migration is listed in the Storage Migration wind,0.05333333333333334,Figure 9-15 The ongoing Migration is listed in the Storage Migration wind,82,manuals_sample
-82,4,"16.If you want to check the progress by using the CLI, run the lsvdisksyncprogress command because the process is essentially a volume copy, as shown in Figure 9-16.",False,0.0,"16.If you want to check the progress by using the CLI, run the lsvdisksyncprogress command because the process is essentially a volume copy, as shown in Figure 9-16.",0.048484848484848485,".If you want to check the progress by using the CLI, run the **lsvdisksyncprogress** command because the process is essentially a volume copy, as shown in Figure 9-1",0.03636363636363636,". If you want to check the progress by using the CLI, run the `lsvdisksyncprogress` command because the process is essentially a volume copy, as shown in Figure 9-16",0.030303030303030304," If you want to check the progress by using the CLI, run the `lsvdisksyncprogress` command because the process is essentially a volume copy, as shown in Figure 9-16.",0.048484848484848485,".If you want to check the progress by using the CLI, run the **lsvdisksyncprogress** command because the process is essentially a volume copy, as shown in Figure 9-1",0.0,"16.If you want to check the progress by using the CLI, run the lsvdisksyncprogress command because the process is essentially a volume copy, as shown in Figure 9-16.",0.0,"16.If you want to check the progress by using the CLI, run the lsvdisksyncprogress command because the process is essentially a volume copy, as shown in Figure 9-16.",82,manuals_sample
-82,5,Figure 9-16 Checking migration progress by using CLI,False,0.0,Figure 9-16 Checking migration progress by using CLI,0.0,Figure 9-16 Checking migration progress by using CLI,0.038461538461538464,Figure 9-16: Checking migration progress by using CL,0.11538461538461539,gure 9-16 Checking migration progress by using CL,0.07692307692307693,igure 9-16 Checking migration progress by using CL,0.07692307692307693,igure 9-16 Checking migration progress by using CL,0.07692307692307693,igure 9-16 Checking migration progress by using CL,82,manuals_sample
-82,6,"17.When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click Finalize, as shown in Figure 9-17 on page 400.",False,0.0,"17.When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click Finalize, as shown in Figure 9-17 on page 400.",0.046511627906976744,"When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click **Finalize**, as shown in Figure 9-17 on page 400",0.046511627906976744,"When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click **Finalize**, as shown in Figure 9-17 on page 400",0.046511627906976744,"When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click **Finalize**, as shown in Figure 9-17 on page 400",0.05813953488372093,".When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click **Finalize** , as shown in Figure 9-17 on page 4",0.011627906976744186,"17.When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click Finalize , as shown in Figure 9-17 on page 400",0.011627906976744186,"17.When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click Finalize , as shown in Figure 9-17 on page 400",82,manuals_sample
-82,7,The data migration has begun. After it is completed use the finalize action in the Migration panel of the management GUI to remove the image-mode volume copies. Then unzone and remove the original storage system.,True,0.49528301886792453,"le:** Storage Migration Wizard.
-* **SAN:** Data is being migrated to SAN.
-* **Action:** User should finalize action in management GUI to remove image-mode volume copies. Unzone/remove original storage system.",0.7075471698113207,"he migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displaye",0.0,The data migration has begun. After it is completed use the finalize action in the Migration panel of the management GUI to remove the image-mode volume copies. Then unzone and remove the original storage system.,0.0,The data migration has begun. After it is completed use the finalize action in the Migration panel of the management GUI to remove the image-mode volume copies. Then unzone and remove the original storage system.,0.7075471698113207,"he migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displaye",0.7075471698113207,"he migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displaye",0.7075471698113207,"he migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displaye",82,manuals_sample
-83,0,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save (see Figure 5-80).",False,0.0031645569620253164,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save(see Figure 5-80).",0.02531645569620253,"e content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-80",0.02531645569620253,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-",0.02531645569620253,"content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-80).",0.02531645569620253,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-",0.0,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save (see Figure 5-80).",0.0,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save (see Figure 5-80).",83,manuals_sample
-83,1,Figure 5-80 Enabling login message,False,0.0,Figure 5-80 Enabling login message,0.0,Figure 5-80 Enabling login message,0.058823529411764705,Figure 5-80: Enabling login messag,0.11764705882352941,igure 5-80 Enabling login messag,0.11764705882352941,Figure 5-80 Enabling login messa,0.11764705882352941,gure 5-80 Enabling login message,0.11764705882352941,gure 5-80 Enabling login message,83,manuals_sample
-83,2,The resulting log-in screen is shown in Figure 5-81.,False,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,83,manuals_sample
-83,3,Figure 5-81 Welcome message in GUI,False,0.0,Figure 5-81 Welcome message in GUI,0.0,Figure 5-81 Welcome message in GUI,0.058823529411764705,Figure 5-81: Welcome message in GU,0.11764705882352941,igure 5-81 Welcome message in GU,0.11764705882352941,gure 5-81 Welcome message in GUI,0.11764705882352941,Figure 5-81 Welcome message in G,0.11764705882352941,Figure 5-81 Welcome message in G,83,manuals_sample
-83,4,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",False,0.0,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",0.0,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",0.0,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",0.0,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",0.0,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",0.0,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",0.0,"The banner message also appears in the CLI login prompt window, as shown in Figure 5-82.",83,manuals_sample
-83,5,Figure 5-82 Banner message in CLI,False,0.0,Figure 5-82 Banner message in CLI,0.0,Figure 5-82 Banner message in CLI,0.06060606060606061,igure 5-82: Banner message in CLI,0.12121212121212122,gure 5-82 Banner message in CLI,0.12121212121212122,igure 5-82 Banner message in CL,0.12121212121212122,gure 5-82 Banner message in CLI,0.12121212121212122,gure 5-82 Banner message in CLI,83,manuals_sample
-83,6,182 Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,False,0.0,182 Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1,0.7733333333333333,-81 shows the Storwize V7000 Storage Management login screen (ITSO\_V7000G2,0.72, A screenshot of the Storwize V7000 login screen. The standard Username and,0.05333333333333334," Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.1
-",0.05333333333333334,82** Implementing the IBM Storwize V7000 with IBM Spectrum Virtualize V8.2.,0.7866666666666666," message by using the GUI, edit the text area with the message content and ",0.7866666666666666," message by using the GUI, edit the text area with the message content and ",83,manuals_sample
-83,7,This is an ITSO-managed system. Unauthorized access is restricted.,True,0.0,This is an ITSO-managed system. Unauthorized access is restricted.,0.0,This is an ITSO-managed system. Unauthorized access is restricted.,0.0,This is an ITSO-managed system. Unauthorized access is restricted.,0.0,This is an ITSO-managed system. Unauthorized access is restricted.,0.7878787878787878,"out some important information about the system, such as security ",0.7878787878787878,"bout some important information about the system, such as security",0.7878787878787878,"bout some important information about the system, such as security",83,manuals_sample
-84,0,12.3.3 Start activation process on a running system,False,0.0,12.3.3 Start activation process on a running system,0.0,12.3.3 Start activation process on a running system,0.0,12.3.3 Start activation process on a running system,0.0,12.3.3 Start activation process on a running system,0.0392156862745098,2.3.3 Start activation process on a running system,0.0392156862745098,12.3.3 Start activation process on a running syste,0.0392156862745098,12.3.3 Start activation process on a running syste,84,manuals_sample
-84,1,"To activate encryption on a running system, complete the following steps: 1. Click Settings → System → Licensed Functions. 2. Click Encryption Licenses, as shown in Figure 12-9.",False,0.03389830508474576,"To activate encryption on a running system, complete the following steps:
-
-1. Click Settings →System → Licensed Functions.
-
-2. Click Encryption Licenses, as shown in Figure 12-9",0.2033898305084746,"encryption on a running system, complete the following steps:
-
-1. Click **Settings** → **System** → **Licensed Functions**.
-2. Click **Encryption Licenses**, as shown in Figure ",0.2033898305084746,"encryption on a running system, complete the following steps:
-
-1. Click **Settings** → **System** → **Licensed Functions**.
-2. Click **Encryption Licenses**, as shown in Figure ",0.22598870056497175,"activate encryption on a running system, complete the following steps:
-
-1. Click **Settings** ⇒ **System** ⇒ **Licensed Functions**.
-
-2. Click **Encryption Licenses**, as shown ",0.2711864406779661,"To activate encryption on a running system, complete the following steps:
-
-- 1. Click **Settings** → **System** → **Licensed Functions** .
-
-- 2. Click **Encryption Licenses** ",0.04519774011299435,"o activate encryption on a running system, complete the following steps:
-
-1. Click Settings → System → Licensed Functions .
-2. Click Encryption Licenses , as shown in Figure 12-",0.04519774011299435,"o activate encryption on a running system, complete the following steps:
-
-1. Click Settings → System → Licensed Functions .
-2. Click Encryption Licenses , as shown in Figure 12-",84,manuals_sample
-84,2,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window,False,0.0,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window,0.0,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window,0.024390243902439025,Figure 12-9: Expanding Encryption Licenses section on the Licensed Functions windo,0.0,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window,0.04878048780487805,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions wind,0.04878048780487805,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions wind,0.04878048780487805,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions wind,84,manuals_sample
-84,3,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (Activate License Automatically and Activate License Manually), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on page 617.",False,0.0032102728731942215,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options ( Activate License Automaticallyand Activate License Manually), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on page 617.",0.025682182985553772,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate License Manually**), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on p",0.025682182985553772,". The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate License Manually**), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on pa",0.03210272873194221,"The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate License Manually**), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, ""Activate the license automatically"" on page 614. For more information about how to complete a manual activation process, see 12.3.5, ""Activate the license manually"" on page",0.7367576243980738,"## **12.3.3 Start activation process on a running system**
-
-To activate encryption on a running system, complete the following steps:
-
-- 1. Click **Settings** → **System** → **Licensed Functions** .
-
-- 2. Click **Encryption Licenses** , as shown in Figure 12-9.
-
-**==> picture [397 x 226] intentionally omitted <==**
-
-_Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window_
-
-**==> picture [412 x 96] intentionally omitted <==**
-
-**==> picture [397 x 139] intentionally omitted ",0.012841091492776886,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options ( Activate License Automatically and Activate License Manually ), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, 'Activate the license automatically' on page 614. For more information about how to complete a manual activation process, see 12.3.5, 'Activate the license manually' on page 61",0.012841091492776886,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options ( Activate License Automatically and Activate License Manually ), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, 'Activate the license automatically' on page 614. For more information about how to complete a manual activation process, see 12.3.5, 'Activate the license manually' on page 61",84,manuals_sample
-84,4,Figure 12-10 Select the Control Enclosure on which you want to enable the encryption,False,0.0,Figure 12-10 Select the Control Enclosure on which you want to enable the encryption,0.0,Figure 12-10 Select the Control Enclosure on which you want to enable the encryption,0.023809523809523808,igure 12-10: Select the Control Enclosure on which you want to enable the encryption,0.5,ures. Right-click the enclosure on which you want to install an encryption license. ,0.047619047619047616,Figure 12-10 Select the Control Enclosure on which you want to enable the encrypti,0.047619047619047616,igure 12-10 Select the Control Enclosure on which you want to enable the encryptio,0.047619047619047616,igure 12-10 Select the Control Enclosure on which you want to enable the encryptio,84,manuals_sample
-84,5,Chapter 12. Encryption 613,False,0.0,Chapter 12. Encryption 613,0.5384615384615384,he encryption,0.6153846153846154,"tline.
-
-3. The Encryption ",0.5769230769230769," There is an ""Encryption L",0.15384615384615385,hapter 12. Encryption **61,0.6153846153846154,"e 12-9.
-3. The Encryption ",0.6153846153846154,"e 12-9.
-3. The Encryption ",84,manuals_sample
-85,0,SPECIFICATIONS 1. Length of mechanical tube: 160mm 2. Conjugate distance between object and image: 195mm 3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion) 4. Illumination: Input 110V or 200V; Output: 20W 5. Fine adjustment range: .002mm 6. Coarse Adjustment Range: 20mm 7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm 8. Condenser Elevation Range: 15mm 9. Iris diaphragm aperture: 2mm-30mm,False,0.5510688836104513,"e: 195mm |
-| 3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion) |
-| 4. Illumination: Input 110V or 200V; Output: 20W |
-| 5. Fine adjustment range: .002mm |
-| 6. Coarse Adjustment Range: 20mm |
-| 7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm |
-| 8. Condenser Elevation Range: 15mm ",0.026128266033254157,"SPECIFICATIONS
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-1. Length of mechanical tube: 160mm
-2. Conjugate distance between object and image: 195mm
-3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion)
-4. Illumination: Input 110V or 200V; Output: 20W
-5. Fine adjustment range: .002mm
-6. Coarse Adjustment Range: 20mm
-7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm
-8. Condenser Elevation Range: 15mm
-9. Iris diaphragm aperture: 2mm-30m",0.026128266033254157,"SPECIFICATIONS
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-1. Length of mechanical tube: 160mm
-2. Conjugate distance between object and image: 195mm
-3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion)
-4. Illumination: Input 110V or 200V; Output: 20W
-5. Fine adjustment range: .002mm
-6. Coarse Adjustment Range: 20mm
-7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm
-8. Condenser Elevation Range: 15mm
-9. Iris diaphragm aperture: 2mm-30m",0.026128266033254157,"SPECIFICATIONS
-
-1. Length of mechanical tube: 160mm
-2. Conjugate distance between object and image: 195mm
-3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion)
-4. Illumination: Input 110V or 200V; Output: 20W
-5. Fine adjustment range: .002mm
-6. Coarse Adjustment Range: 20mm
-7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm
-8. Condenser Elevation Range: 15mm
-9. Iris diaphragm aperture: 2mm-30m",0.15201900237529692,"h of mechanical tube: 160mm
-
-- 2. Conjugate distance between object and image: 195mm
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-- 3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion)
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-- 4. Illumination: Input 110V or 200V; Output: 20W
-
-- 5. Fine adjustment range: .002mm
-
-- 6. Coarse Adjustment Range: 20mm
-
-- 7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm
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-- 8. Condenser Elevation Range: 15mm
-
-- 9. Iris diaphragm aperture:",0.06413301662707839,"ATIONS
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-1. Length of mechanical tube: 160mm
-
-2. Conjugate distance between object and image: 195mm
-
-3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion)
-
-4. Illumination: Input 110V or 200V; Output: 20W
-
-5. Fine adjustment range: .002mm
-
-6. Coarse Adjustment Range: 20mm
-
-7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm
-
-8. Condenser Elevation Range: 15mm
-
-9. Iris diaphragm aperture: 2mm-30m",0.06413301662707839,"ATIONS
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-1. Length of mechanical tube: 160mm
-
-2. Conjugate distance between object and image: 195mm
-
-3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion)
-
-4. Illumination: Input 110V or 200V; Output: 20W
-
-5. Fine adjustment range: .002mm
-
-6. Coarse Adjustment Range: 20mm
-
-7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm
-
-8. Condenser Elevation Range: 15mm
-
-9. Iris diaphragm aperture: 2mm-30m",85,manuals_sample
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-86,0,Basic English Language Skills,False,0.0,Basic English Language Skills,0.8275862068965517," B
-
-Screenshot of an email co",0.0,Basic English Language Skills,0.0,Basic English Language Skills,0.0,Basic English Language Skills,0.896551724137931,"s:
-
-## Example A
-
-
-
-## Example B
-
-",0.8484848484848485,"## Compare the following examples:
-
-## Example A
-
-
-
-## Example B
-
-",86,manuals_sample
-86,3,"Hello Mr Smith Could you please help me with question 2 of the Safety Management 101 assignment? The question refers to a newspaper article, but the article has not been included in my study material. Do you perhaps know where I could find a copy of the article? Kind regards [Name] [Student Number]",True,0.020066889632107024,"Hello Mr Smith
-Could you please help me with question 2 of the Safety Management 101 assignment? The question refers to a newspaper article, but the article has not been included in my study material. Do you perhaps know where I could find a copy of the article?
-
-Kind regards
-[Name]
-[Student Number",0.046822742474916385," Mr Smith
-
-Could you please help me with question 2 of the Safety Management 101 assignment? The question refers to a newspaper article, but the article has not been included in my study material. Do you perhaps know where I could find a copy of the article?
-
-Kind regards
-[Name]
-[Student Number",0.08695652173913043," Could you please help me with question 2 of the Safety Management 101 assignment? The question refers to a newspaper article, but the article has not been included in my study material. Do you perhaps know where I could find a copy of the article?
->
-> Kind regards
-> [Name]
-> [Student Number]",0.026755852842809364,"ello Mr Smith
-
-Could you please help me with question 2 of the Safety Management 101 assignment? The question refers to a newspaper article, but the article has not been included in my study material. Do you perhaps know where I could find a copy of the article?
-
-Kind regards
-[Name]
-[Student Number",0.7892976588628763,"Basic English Language Skills
-
-Compare the following examples:
-
-## Example A
-
-**==> picture [472 x 256] intentionally omitted <==**
-
-## Example B
-
-**==> picture [472 x 255] intentionally omitted <==**
-
-",0.862876254180602,"## Compare the following examples:
-
-## Example A
-
-
-
-## Example B
-
-",0.862876254180602,"## Compare the following examples:
-
-## Example A
-
-
-
-## Example B
-
-",86,manuals_sample
-87,0,"Direct operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hardware. Direct operating costs also include a $657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were:",False,0.0282574568288854,"erating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1",0.01020408163265306,"t operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to \$24.4 million for the year ended December 31, 2000 from \$21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled \$3.5 million and \$2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of \$1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hardware. Direct operating costs also include a \$657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were",0.0,"Direct operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hardware. Direct operating costs also include a $657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were:",0.0007849293563579278,"Direct operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hardware. Direct operating costs also include a $657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were:",0.0282574568288854,"ating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 199",0.06828885400313972,"osts in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended Decembe",0.06828885400313972,"osts in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended Decembe",87,finance_samples
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-88,0,"The project consists of three well-defined miner- alised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimberos and Teterita. Arqueros was previously mined on a limited scale by under- ground methods and Chimberos was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60)1.",False,0.011741682974559686,"The project consists of three well-defined mineralised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimberos and Teterita. Arqueros was previously mined on a limited scale by underground methods and Chimberos was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60)1 .
-",0.025440313111545987,"The project consists of three well-defined mineralised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimeros and Teterita. Arqueros was previously mined on a limited scale by underground methods and Chimeros was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60)11",0.015655577299412915,"
-The project consists of three well-defined mineralised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimberos and Teterita. Arqueros was previously mined on a limited scale by underground methods and Chimberos was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60)[1] .",0.015655577299412915,"
-
-The project consists of three well-defined mineralised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimberos and Teterita. Arqueros was previously mined on a limited scale by underground methods and Chimberos was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60) 1 .",0.015655577299412915,"
-
-The project consists of three well-defined mineralised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimberos and Teterita. Arqueros was previously mined on a limited scale by underground methods and Chimberos was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60) 1 .",88,finance_samples
-88,1,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",False,0.0,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.004901960784313725," Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.004901960784313725," Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0196078431372549,"Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content *divided* by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0196078431372549,"Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content _divided_ by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",88,finance_samples
-89,0,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone’s directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",False,0.0,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone’s directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.0015873015873015873,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone's directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.0,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone’s directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.0015873015873015873,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone's directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.012698412698412698,"goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone’s directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.014285714285714285,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone's directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone custom",0.014285714285714285,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone's directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone custom",89,finance_samples
-89,1,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",False,0.0,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",0.0,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",0.0,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",0.0,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",0.0038684719535783366,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits",0.0038684719535783366,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits",0.0038684719535783366,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits",89,finance_samples
-89,2,"Through ShentelPages, businesses have a new way of reaching thousands more potential customers within the six- county area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walking.",False,0.008797653958944282,"
-Through ShentelPages, businesses have a new way of reaching thousands more potential customers within the sixcounty area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walking.",0.005865102639296188,"Through ShentelPages, businesses have a new way of reaching thousands more potential customers within the six-county area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walking.
-",0.005865102639296188,"
-Through ShentelPages, businesses have a new way of reaching thousands more potential customers within the six-county area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walking.",0.005865102639296188," Through ShentelPages, businesses have a new way of reaching thousands more potential customers within the six-county area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walking.",0.011730205278592375,"
-Through ShentelPages, businesses have a new way of reaching thousands more potential customers within the sixcounty area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walking.",0.17008797653958943,"inesses have a new way of reaching thousands more potential customers within the sixcounty area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walkin",0.17008797653958943,"inesses have a new way of reaching thousands more potential customers within the sixcounty area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walkin",89,finance_samples
-89,3,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",False,0.0,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",0.0,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",0.0,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",0.0,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",0.0,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",0.0,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",0.0,"Just like our first book in 1906, the 2004 ShentelPages provides area residents with a quick and easy way to stay in touch.",89,finance_samples
-90,0,Net profit / (loss) after income tax (‘000s),False,0.11363636363636363,Net profit/(loss) after income tax ('000s) |,0.022727272727272728,Net profit / (loss) after income tax ('000s),0.022727272727272728,Net profit / (loss) after income tax ('000s),0.022727272727272728,Net profit / (loss) after income tax ('000s),0.8181818181818182,es the performance of the Group over the las,0.022727272727272728,Net profit / (loss) after income tax ('000s),0.022727272727272728,Net profit / (loss) after income tax ('000s),90,finance_samples
-90,1,"32,522",False,0.0,"32,522",0.0,"32,522",0.0,"32,522",0.0,"32,522",0.6666666666666666,**52,0.0,"32,522",0.0,"32,522",90,finance_samples
-90,2,"73,066",False,0.0,"73,066",0.0,"73,066",0.0,"73,066",0.0,"73,066",0.8333333333333334,370] i,0.0,"73,066",0.0,"73,066",90,finance_samples
-90,3,"20,879",False,0.0,"20,879",0.0,"20,879",0.0,"20,879",0.0,"20,879",0.6666666666666666,"2012, ",0.0,"20,879",0.0,"20,879",90,finance_samples
-90,4,"75,006",False,0.0,"75,006",0.0,"75,006",0.0,"75,006",0.0,"75,006",0.8333333333333334, [505 ,0.0,"75,006",0.0,"75,006",90,finance_samples
-90,5,"(323,726)",False,0.0,"(323,726)",0.0,"(323,726)",0.0,"(323,726)",0.0,"(323,726)",1.0,"2, the Gr",0.0,"(323,726)",0.0,"(323,726)",90,finance_samples
-90,7,"Threshold – Represents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure. p y Managing Director / CEO – up to 15% of TFR, COO & CFO – up to 12.5% of TFR, Other Key Management Personnel – up to 10% of TFR. Target – Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives. y g q p j Managing Director / CEO – up to 30% of TFR, COO & CFO – up to 25% of TFR, Other Key Management Personnel – up to 20% of TFR. Stretch (Maximum) – Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement. Managing Director / CEO – up to 60% of TFR, COO & CFO – up to 50% of TFR, Other Key Management Personnel – up to 40% of TFR. (TFR - Total Fixed Remuneration)",False,0.708029197080292," |
-| How much can the
executives earn under
the STI Plan? | Stretch (Maximum) – Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement.
Managing Director / CEO – up to 60% of TFR, COO & CFO – up to 50% of TFR, Other Key Management Personnel – up to 40% of TFR.
(TFR - Total Fixed Remuneration) ",0.0667361835245047,"resents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure.
Managing Director / CEO – up to 15% of TFR, COO & CFO – up to 12.5% of TFR, Other Key Management Personnel – up to 10% of TFR.
Target – Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives.
Managing Director / CEO – up to 30% of TFR, COO & CFO – up to 25% of TFR, Other Key Management Personnel – up to 20% of TFR.
Stretch (Maximum) – Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement.
Managing Director / CEO – up to 60% of TFR, COO & CFO – up to 50% of TFR, Other Key Management Personnel – up to 40% of TFR.
(TFR - Total Fixed Remunerati",0.08133472367049009,"epresents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure.
Managing Director / CEO – up to 15% of TFR, COO & CFO – up to 12.5% of TFR, Other Key Management Personnel – up to 10% of TFR.
**Target** – Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives.
Managing Director / CEO – up to 30% of TFR, COO & CFO – up to 25% of TFR, Other Key Management Personnel – up to 20% of TFR.
**Stretch (Maximum)** – Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement.
Managing Director / CEO – up to 60% of TFR, COO & CFO – up to 50% of TFR, Other Key Management Personnel – up to 40% of TFR.
*(TFR - Total Fixed R",0.047966631908237745,"old – Represents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure.
Managing Director / CEO – up to 15% of TFR, COO & CFO – up to 12.5% of TFR, Other Key Management Personnel – up to 10% of TFR.
Target – Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives.
Managing Director / CEO – up to 30% of TFR, COO & CFO – up to 25% of TFR, Other Key Management Personnel – up to 20% of TFR.
Stretch (Maximum) – Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement.
Managing Director / CEO – up to 60% of TFR, COO & CFO – up to 50% of TFR, Other Key Management Personnel – up to 40% of TFR.
(TFR - Total Fixed Remunerat",0.7528675703858185,"**52**
-
-Directors’ Report
-
-The following summarises the performance of the Group over the last five years:
-
-**==> picture [505 x 98] intentionally omitted <==**
-
-## Short-Term Incentives
-
-Effective from 1 July 2012, the Group implemented an STI Plan. The objectives of the STI Plan are to link the remuneration of certain executives to their performance and the performance of the Group. The Board set key performance measures and indicators for individual executives on an annual basis that reinforce the Group’s business plan and targets for the year.
-
-Key features of the STI Plan are outlined in the following table.
-
-**==> picture [505 x 370] intentionally omitted <==**
-
-www.kingsgate.com.au
-
-",0.06047966631908238,"ld - Represents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure. Managing Director / CEO - up to 15% of TFR, COO & CFO - up to 12.5% of TFR, Other Key Management Personnel - up to 10% of TFR. Target - Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives. Managing Director / CEO - up to 30% of TFR, COO & CFO - up to 25% of TFR, Other Key Management Personnel - up to 20% of TFR. Stretch (Maximum) - Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement. Managing Director / CEO - up to 60% of TFR, COO & CFO - up to 50% of TFR, Other Key Management Personnel - up to 40% of TFR. (TFR - Total Fixed Remuneratio",0.06047966631908238,"ld - Represents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure. Managing Director / CEO - up to 15% of TFR, COO & CFO - up to 12.5% of TFR, Other Key Management Personnel - up to 10% of TFR. Target - Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives. Managing Director / CEO - up to 30% of TFR, COO & CFO - up to 25% of TFR, Other Key Management Personnel - up to 20% of TFR. Stretch (Maximum) - Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement. Managing Director / CEO - up to 60% of TFR, COO & CFO - up to 50% of TFR, Other Key Management Personnel - up to 40% of TFR. (TFR - Total Fixed Remuneratio",90,finance_samples
-91,0,"— global economic and political conditions, — currency fluctuations, — product demand and industry capacity, — competitive products and pricing,",False,0.08333333333333333,"lobal economic and political conditions,
-
- - currency fluctuations,
-
-— product demand and industry capacity,
-
-— competitive products and pricing",0.05555555555555555," global economic and political conditions,
-- currency fluctuations,
-- product demand and industry capacity,
-- competitive products and pricing,
-",0.05555555555555555," global economic and political conditions,
-- currency fluctuations,
-- product demand and industry capacity,
-- competitive products and pricing,
-",0.020833333333333332,"— global economic and political conditions,
-— currency fluctuations,
-— product demand and industry capacity,
-— competitive products and pricing,",0.16666666666666666," economic and political conditions,
-
-- — currency fluctuations,
-
-- — product demand and industry capacity,
-
-- — competitive products and pric",0.08333333333333333,"global economic and political conditions,
-- -currency fluctuations,
-- -product demand and industry capacity,
-- -competitive products and pricing",0.08333333333333333,"global economic and political conditions,
-- -currency fluctuations,
-- -product demand and industry capacity,
-- -competitive products and pricing",91,finance_samples
-92,0,Creating Opportunities,False,0.0,Creating Opportunities,0.2727272727272727,oration opportunities ,0.0,Creating Opportunities,0.0,Creating Opportunities,0.0,Creating Opportunities,0.2727272727272727,loration opportunities,0.2727272727272727,loration opportunities,92,finance_samples
-92,1,DELIVERING ON THE EXPLORATION STRATEGY,False,0.0,DELIVERING ON THE EXPLORATION STRATEGY,0.0,DELIVERING ON THE EXPLORATION STRATEGY,0.0,DELIVERING ON THE EXPLORATION STRATEGY,0.0,DELIVERING ON THE EXPLORATION STRATEGY,0.0,DELIVERING ON THE EXPLORATION STRATEGY,0.0,DELIVERING ON THE EXPLORATION STRATEGY,0.0,DELIVERING ON THE EXPLORATION STRATEGY,92,finance_samples
-92,2,"Exploration is a key growth driver for Santos and success with the drill bit is vital to adding value for Santos shareholders. During the past four years Santos has been working to build exploration opportunities by: • acquiring new exploration acreage • adding material exploration prospects • drilling wildcat exploration wells. SUCCESS RATE OF 44% IN 2004 Santos’ 2004 exploration effort produced good results, as the Company high graded its exploration acreage and started drilling one of the most exciting portfolios in the industry. Santos discovered hydrocarbons in seven of the sixteen wildcat wells that were drilled, achieving an impressive success rate of 44%. The program added at least 93 million boe (including the pre-drill estimate for Jeruk) of recoverable resources that will be further evaluated by delineation and, in some cases, production history to determine 1P and 2P reserve additions. Importantly, these results were achieved with financial discipline, spending $126 million which was substantially less than forecast. The most significant drilling result for the year was the Jeruk oil discovery in the Sampang PSC offshore East Java, Indonesia. The Jeruk discovery is still under evaluation but its commercial significance appears encouraging. Santos has confirmed an oil column of at least 379 metres with a likely gross recoverable resource in excess of the pre-drill estimate of 170 million barrels. Santos also had further exploration successes in the Cooper Basin in central Australia where four of six wildcat wells were cased and suspended as gas discoveries. There was also success in the offshore Otway Basin with the Martha gas discovery near the Casino field, which is currently being evaluated to determine its commercial significance. Additional drilling is planned to occur nearby in 2005 to follow up this encouraging result. Santos discovered gas in the United States at the Torres 1A onshore well, which was brought onto production only two months after drilling was completed. Other wells in the offshore Otway Basin included the deep water Amrit 1 well, which was plugged and abandoned after failing to intersect economic hydrocarbons, and Callister 1 which was also plugged and abandoned with gas shows.",False,0.03953798311861395,"oration is a key growth driver for Santos and success with the drill bit is vital to adding value for Santos shareholders. During the past four years Santos has been working to build exploration opportunities by:
-
-• acquiring new
-exploration acreage
-
-- adding material
-exploration prospects
-
-• drilling wildcat
-exploration wells.
-
-## SUCCESS RATE OF 44% IN 2004
-
-Santos' 2004 exploration effort
-produced good results, as the
-Company high graded its
-exploration acreage and started
-drilling one of the most exciting
-portfolios in the industry.
-
-Santos discovered hydrocarbons
-in seven of the sixteen wildcat
-wells that were drilled, achieving
-an impressive success rate
-of 44%.
-
-The program added at least
-93 million boe (including the
-pre-drill estimate for Jeruk) of
-recoverable resources that will be
-further evaluated by delineation
-and, in some cases, production
-history to determine 1P and 2P
-reserve additions.
-
-Importantly, these results were
-achieved with financial discipline,
-spending $126 million which was
-substantially less than forecast.
-
-The most significant drilling result for the year was the Jeruk oil discovery in the Sampang PSC offshore East Java, Indonesia. The Jeruk discovery is still under evaluation but its commercial significance appears encouraging. Santos has confirmed an oil column of at least 379 metres with a likely gross recoverable resource in excess of the pre-drill estimate of 170 million barrels.
-
-Santos also had further
-exploration successes in the
-
-Cooper Basin in central Australia
-where four of six wildcat wells
-were cased and suspended as
-gas discoveries.
-
-There was also success in the
-offshore Otway Basin with the
-Martha gas discovery near the
-Casino field, which is currently
-being evaluated to determine
-its commercial significance.
-Additional drilling is planned to
-occur nearby in 2005 to follow
-up this encouraging result.
-
-Santos discovered gas in the United States at the Torres 1A onshore well, which was brought onto production only two months after drilling was completed.
-
-Other wells in the offshore Otway
-Basin included the deep water
-Amrit 1 well, which was plugged
-and abandoned after failing to
-intersect economic hydrocarbons,
-and Callister 1 which was also
-plugged and abandoned wi",0.021768103065304308,"is a key growth driver for Santos and success with the drill bit is vital to adding value for Santos shareholders. During the past four years Santos has been working to build exploration opportunities by:
-
-- acquiring new exploration acreage
-- adding material exploration prospects
-- drilling wildcat exploration wells.
-
-## SUCCESS RATE OF 44% IN 2004
-
-Santos' 2004 exploration effort produced good results, as the Company high graded its exploration acreage and started drilling one of the most exciting portfolios in the industry.
-
-Santos discovered hydrocarbons in seven of the sixteen wildcat wells that were drilled, achieving an impressive success rate of 44%.
-
-The program added at least 93 million boe (including the pre-drill estimate for Jeruk) of recoverable resources that will be further evaluated by delineation and, in some cases, production history to determine 1P and 2P reserve additions.
-
-Importantly, these results were achieved with financial discipline, spending \$126 million which was substantially less than forecast.
-
-The most significant drilling result for the year was the Jeruk oil discovery in the Sampang PSC offshore East Java, Indonesia. The Jeruk discovery is still under evaluation but its commercial significance appears encouraging. Santos has confirmed an oil column of at least 379 metres with a likely gross recoverable resource in excess of the pre-drill estimate of 170 million barrels. Santos also had further exploration successes in the
-
-Cooper Basin in central Australia where four of six wildcat wells were cased and suspended as gas discoveries.
-
-There was also success in the offshore Otway Basin with the Martha gas discovery near the Casino field, which is currently being evaluated to determine its commercial significance.
-
-Additional drilling is planned to occur nearby in 2005 to follow up this encouraging result.
-
-Santos discovered gas in the United States at the Torres 1A onshore well, which was brought onto production only two months after drilling was completed.
-
-Other wells in the offshore Otway Basin included the deep water Amrit 1 well, which was plugged and abandoned after failing to intersect economic hydrocarbons, and Callister 1 which was also plugged and abandoned with gas sh",0.13060861839182586,"cques-gouadain-placeholder.png)
->
-> ‘2004 was a great year for our explorers. We started drilling one of the most exciting portfolios in our industry and our success to date shows that our strategy of basin excellence is delivering.’
->
-> **JACQUES GOUADAIN**
-> Vice President
-> Geoscience and New Ventures
-
-## SUCCESS RATE OF 44% IN 2004
-
-Santos’ 2004 exploration effort produced good results, as the Company high graded its exploration acreage and started drilling one of the most exciting portfolios in the industry.
-
-Santos discovered hydrocarbons in seven of the sixteen wildcat wells that were drilled, achieving an impressive success rate of 44%.
-
-The program added at least 93 million boe (including the pre-drill estimate for Jeruk) of recoverable resources that will be further evaluated by delineation and, in some cases, production history to determine 1P and 2P reserve additions.
-
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-94,0,"The Promise of Emerging Markets Expanding Poland’s Payment Infrastructure Although still under- developed compared to western economies, Poland is one of the most dynamic and promising markets in all of Europe. Since entering Poland in 1995, Euronet Worldwide has become one of the largest transaction processing service providers in the country, establishing a network of over 600 ATMs and providing software to eight major banks. Our agreement for electronic airtime distribution with all three mobile phone operators in the country – ERA GSM, Plus GSM and IDEA Centertel – further confirms that Euronet is embedded in the financial payments fabric in Poland.",False,0.2813918305597579,"ts of Central Europe, the Middle East, Africa, Asia-Pacific, Latin America and the Caribbean.
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-94,2,"While credit is used for electronic transactions in Western Europe and North America, the model is quite different in many ""cash-based"" economies around the world. And that's where Euronet continues to look for new opportunities - particularly in the emerging markets of Central Europe, the Middle East, Africa.",True,0.02572347266881029,"hile credit is used for electronic transactions in Western Europe and North America, the model is quite different in many “cash-based” economies around the world. And that’s where Euronet continues to look for new opportunities – particularly in the emerging
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-95,1,"be working in business operations with a lean and efficient corporate and services group. With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed. As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%. CULTURE CHANGE The need to develop a culture that supports the newly designed business processes was another of the major outcomes of the change program. A Santos-wide culture change program led by employees is currently underway. This long-term program is designed to ensure that the way employees work together enhances Santos’ ability to be successful. One of the first tasks undertaken was a voluntary employee survey to identify the gaps between the existing culture and the desired culture. The outcomes of the survey will assist in the development of programs and activities that will better align work practices with Santos’ strategic goals. TRAINING AND DEVELOPING PEOPLE Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos’ human resources strategy. Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to support culture change initiatives.",False,0.052692530399536766," working in business operations
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-## CULTURE CHANGE
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-PEOPLE
-
-Making sure training and
-development supports current
-and future business requirements,
-and provides opportunities for
-people to develop their skills to
-achieve optimum performance,
-are key aspects of Santos' human
-resources strategy.
-
-Santos has a number of long-term
-projects underway which will
-optimise the substantial
-investment the Company makes
-in training people. Importantly,
-these projects will deliver
-programs that are targeted to
-meet business and individual
-needs and to support culture
-change",0.01910828025477707,"in business operations with a lean and efficient corporate and services group.
-
-With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed. As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%.
-
-# CULTURE CHANGE
-
-The need to develop a culture that supports the newly designed business processes was another of the major outcomes of the change program. A Santos-wide culture change program led by employees is currently underway.
-
-This long-term program is designed to ensure that the way employees work together enhances Santos' ability to be successful.
-
-One of the first tasks undertaken was a voluntary employee survey to identify the gaps between the existing culture and the desired culture. The outcomes of the survey will assist in the development of programs and activities that will better align work practices with Santos' strategic goals.
-
-# TRAINING AND DEVELOPING PEOPLE
-
-Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos' human resources strategy.
-
-Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to support culture change initiatives",0.02374059061957151,"g in business operations with a lean and efficient corporate and services group.
-
-With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed.
-
-As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%.
-
-### CULTURE CHANGE
-
-The need to develop a culture that supports the newly designed business processes was another of the major outcomes of the change program. A Santos-wide culture change program led by employees is currently underway.
-
-This long-term program is designed to ensure that the way employees work together enhances Santos’ ability to be successful.
-
-One of the first tasks undertaken was a voluntary employee survey to identify the gaps between the existing culture and the desired culture. The outcomes of the survey will assist in the development of programs and activities that will better align work practices with Santos’ strategic goals.
-
-### TRAINING AND DEVELOPING PEOPLE
-
-Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos’ human resources strategy.
-
-Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to support culture change init",0.021424435437174292,"rking in business operations with a lean and efficient corporate and services group.
-
-With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed. As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%.
-
-## CULTURE CHANGE
-
-The need to develop a culture that supports the newly designed business processes was another of the major outcomes of the change program. A Santos-wide culture change program led by employees is currently underway.
-
-This long-term program is designed to ensure that the way employees work together enhances Santos' ability to be successful.
-
-One of the first tasks undertaken was a voluntary employee survey to identify the gaps between the existing culture and the desired culture. The outcomes of the survey will assist in the development of programs and activities that will better align work practices with Santos' strategic goals.
-
-## TRAINING AND DEVELOPING PEOPLE
-
-Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos' human resources strategy.
-
-Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to support culture change ini",0.45454545454545453,"ng in business operations with a lean and efficient corporate and services group.
-
-With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed. As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%.
-
-One of the first tasks undertaken was a voluntary employee survey to identify the gaps between the existing culture and the desired culture. The outcomes of the survey will assist in the development of programs and activities that will better align work practices with Santos’ strategic goals.
-
-## **TRAINING AND DEVELOPING PEOPLE**
-
-Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos’ human resources strategy.
-
-## **CULTURE CHANGE**
-
-The need to develop a culture that supports the newly designed business processes was another of the major outcomes of the change program. A Santos-wide culture change program led by employees is currently underway.
-
-across Santos operations. The long-term environmental and financial benefits of using this technology are expected to be considerable.
-
-Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to sup",0.021424435437174292," working in business operations with a lean and efficient corporate and services group.
-
-With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed. As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%.
-
-## CULTURE CHANGE
-
-The need to develop a culture that supports the newly designed business processes was another of the major outcomes of the change program. A Santos-wide culture change program led by employees is currently underway.
-
-This long-term program is designed to ensure that the way employees work together enhances Santos' ability to be successful.
-
-One of the first tasks undertaken was a voluntary employee survey to identify the gaps between the existing culture and the desired culture. The outcomes of the survey will assist in the development of programs and activities that will better align work practices with Santos' strategic goals.
-
-## TRAINING AND DEVELOPING PEOPLE
-
-Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos' human resources strategy.
-
-Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to support culture change ",0.021424435437174292," working in business operations with a lean and efficient corporate and services group.
-
-With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed. As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%.
-
-## CULTURE CHANGE
-
-The need to develop a culture that supports the newly designed business processes was another of the major outcomes of the change program. A Santos-wide culture change program led by employees is currently underway.
-
-This long-term program is designed to ensure that the way employees work together enhances Santos' ability to be successful.
-
-One of the first tasks undertaken was a voluntary employee survey to identify the gaps between the existing culture and the desired culture. The outcomes of the survey will assist in the development of programs and activities that will better align work practices with Santos' strategic goals.
-
-## TRAINING AND DEVELOPING PEOPLE
-
-Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos' human resources strategy.
-
-Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to support culture change ",95,finance_samples
-95,2,"BANKSIA AWARDS Santos was selected in 2004 as a finalist in the Banksia Environmental Awards for the work undertaken in the Company- led initiative to protect the world-renowned Coongie Lakes, resulting in the area being declared a new National Park by the South Australian Government. As a finalist for this award Santos was recognised for its leadership role in bringing together a group of disparate parties to develop a Memorandum of Understanding recommending further protection for the Coongie Lakes. WASTE MANAGEMENT Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement. This technology will be implemented where possible",False,0.05104408352668213,"A AWARDS
-
-Santos was selected in 2004
-as a finalist in the Banksia
-Environmental Awards for the
-work undertaken in the Company-
-led initiative to protect the
-world-renowned Coongie Lakes,
-resulting in the area being
-declared a new National Park by
-the South Australian Government.
-
-As a finalist for this award Santos
-was recognised for its leadership
-role in bringing together a group
-of disparate parties to develop a
-Memorandum of Understanding
-recommending further protection
-for the Coongie Lakes.
-
-## WASTE MANAGEMENT
-
-Santos trialled innovative waste
-management techniques during
-2004 to reduce the volume of
-hydrocarbon waste generated
-from Cooper Basin operations.
-Preliminary results indicate that
-these waste volumes can be
-reduced to 3-5% of their original
-volume, which is a significant
-achievement.
-
-This technology will be
-implemented where possib",0.02088167053364269,"KSIA AWARDS
-
-Santos was selected in 2004 as a finalist in the Banksia Environmental Awards for the work undertaken in the Company-led initiative to protect the world-renowned Coongie Lakes, resulting in the area being declared a new National Park by the South Australian Government.
-
-As a finalist for this award Santos was recognised for its leadership role in bringing together a group of disparate parties to develop a Memorandum of Understanding recommending further protection for the Coongie Lakes.
-
-# WASTE MANAGEMENT
-
-Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement.
-
-This technology will be implemented where possi",0.025522041763341066,"ANKSIA AWARDS
-
-Santos was selected in 2004 as a finalist in the Banksia Environmental Awards for the work undertaken in the Company-led initiative to protect the world-renowned Coongie Lakes, resulting in the area being declared a new National Park by the South Australian Government.
-
-As a finalist for this award Santos was recognised for its leadership role in bringing together a group of disparate parties to develop a Memorandum of Understanding recommending further protection for the Coongie Lakes.
-
-### WASTE MANAGEMENT
-
-Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement.
-
-This technology will be implemented where p",0.02320185614849188,"NKSIA AWARDS
-
-Santos was selected in 2004 as a finalist in the Banksia Environmental Awards for the work undertaken in the Company-led initiative to protect the world-renowned Coongie Lakes, resulting in the area being declared a new National Park by the South Australian Government.
-
-As a finalist for this award Santos was recognised for its leadership role in bringing together a group of disparate parties to develop a Memorandum of Understanding recommending further protection for the Coongie Lakes.
-
-## WASTE MANAGEMENT
-
-Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement.
-
-This technology will be implemented where pos",0.36078886310904873,"onal greenhouse gas teams that have the right skill sets and responsibilities to progress this initiative. These teams will manage Greenhouse Policy and regulation, carbon management and trading opportunities, and energy efficiency. A key internal driver for emissions reduction will be the promotion of energy efficiency.
-
-was recognised for its leadership role in bringing together a group of disparate parties to develop a Memorandum of Understanding recommending further protection for the Coongie Lakes.
-
-## **WASTE MANAGEMENT**
-
-Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement.
-
-Santos is committed to achieving e",0.02320185614849188,"IA AWARDS
-
-Santos was selected in 2004 as a finalist in the Banksia Environmental Awards for the work undertaken in the Companyled initiative to protect the world-renowned Coongie Lakes, resulting in the area being declared a new National Park by the South Australian Government.
-
-As a finalist for this award Santos was recognised for its leadership role in bringing together a group of disparate parties to develop a Memorandum of Understanding recommending further protection for the Coongie Lakes.
-
-## WASTE MANAGEMENT
-
-Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement.
-
-This technology will be implemented where possibl",0.02320185614849188,"IA AWARDS
-
-Santos was selected in 2004 as a finalist in the Banksia Environmental Awards for the work undertaken in the Companyled initiative to protect the world-renowned Coongie Lakes, resulting in the area being declared a new National Park by the South Australian Government.
-
-As a finalist for this award Santos was recognised for its leadership role in bringing together a group of disparate parties to develop a Memorandum of Understanding recommending further protection for the Coongie Lakes.
-
-## WASTE MANAGEMENT
-
-Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement.
-
-This technology will be implemented where possibl",95,finance_samples
-96,0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,False,0.0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,0.0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,0.0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,0.0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,0.0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,0.0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,0.0,The Eagle Ford continues to have one of the highest internal rates of return of any of the US unconventional resource plays.,96,finance_samples
-96,1,"Because of its relatively low operating costs, the Eagle Ford to remains profitable during current oil commodity pricing conditions. Sundance has quickly transformed the Eagle Ford position acquired in its merger with Texon Petroleum Ltd to its most valuable asset in its portfolio through development and growing its drilling inventory. In 2014, the Company brought 35 gross (26.1 net) Eagle Ford wells into production by D&P investments of $244 million. Through $26 million of direct mineral leases and $36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations. Since its entrance into the Eagle Ford in March 2013, the Company has: • increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR); • increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of $449.3 million (an 18x increase)); • increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County); • increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end; • increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)",False,0.24677835051546393," | ~3.7 |
-| JAN-14 | ~35 | ~55 | ~90 | ~2.9 |
-| JAN-15 | ~50 | ~110 | ~160 | ~4.3 |
-
-In 2014, the Company brought 35 gross (26.1 net) Eagle Ford wells into production by D&P investments of $244 million. Through $26 million of direct mineral leases and $36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
-
-Since its entrance into the Eagle Ford in March 2013, the Company has:
-
-PROVED
-
-PROBABLE AND POSSIBLE
-
--DRILLING INVENTORY (YEARS)
-
-• increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR);
-
-• increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of $449.3 million (an 18x increase));
-
-• increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-
-• increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end; • increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)
-
-EAGLE FORD CONSTANT CAS",0.20876288659793815,"SSIBLE | DRILLING INVENTORY (YEARS) |
-|--------|--------|-----------------------|----------------------------|
-| JAN-13 | ~10 | ~100 | ~1.5 |
-| JAN-14 | ~10 | ~80 | ~1.0 |
-| JAN-15 | ~10 | ~150 | ~4.5 |
-
-In 2014, the Company brought 35 gross (26.1 net) Eagle Ford wells into production by D&P investments of \$244 million. Through \$26 million of direct mineral leases and \$36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
-
-Since its entrance into the Eagle Ford in March 2013, the Company has:
-
-- increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR);
-- increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of \$449.3 million (an 18x increase));
-- increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-- increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end;
-- increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)
-",0.026417525773195876,"s relatively low operating costs, the Eagle Ford remains profitable during current oil commodity pricing conditions. Sundance has quickly transformed the Eagle Ford position acquired in its merger with Texon Petroleum Ltd to its most valuable asset in its portfolio through development and growing its drilling inventory.
-
-In 2014, the Company brought 35 gross (26.1 net) Eagle Ford wells into production by D&P investments of \$244 million. Through \$26 million of direct mineral leases and \$36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
-
-Since its entrance into the Eagle Ford in March 2013, the Company has:
-
-* increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR);
-* increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of \$449.3 million (an 18x increase));
-* increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-* increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end;
-* increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing",0.19072164948453607,"| E\&E Capital Invested and Acquisitions | $ 59,903 |
-| Gross producing wells | 77 |
-| Net Producing wells | 53.8 |
-| Gross Wells in Progress | 19 |
-| Net Wells in Progress | 10.6 |
-| Net Acres | 26,160 |
-
-
-In 2014, the Company brought 35 gross (26.1 net) Eagle Ford wells into production by D&P investments of $244 million. Through $26 million of direct mineral leases and $36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
-
-Since its entrance into the Eagle Ford in March 2013, the Company has:
-
-• increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR);
-
-• increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of $449.3 million (an 18x increase));
-
-• increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-
-• increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end;
-
-• increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)",0.4735824742268041," picture [192 x 138] intentionally omitted <==**
-
-production by D&P investments of $244 million. Through $26 million of direct mineral leases and $36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled
-
-3P Reserves locations.
-
-Since its entrance into the Eagle Ford in March 2013, the Company has:
-
-- • increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR);
-
-- • increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of $449.3 million (an 18x increase));
-
-- • increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-
-- • increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end;
-
-**EAGLE FORD CONSTANT CASE RESERVES** _As at and for the Year Ended 31 December 2014_
-
-|1P Reserves (mboe)|18,131.9|
-|---|---|
-|3P Reserves (mboe)|100,404.1|
-|1P Reserves (PV10 ($000s))|$ 449,287.5|
-|3P Reserves (PV10 ($000s))|$ 1,202,313.1|
-|Net 1P Reserves Drilling Locations|42.6|
-|Net 3P Reserves Drilling Locations|153.7|
-
-
-
-• increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)
-",0.2667525773195876,"n Progress 19 Net Wells in Progress 10.6 Net Acres 26,160 |
-|--------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------|
-
-production by D&P investments of $244 million. Through $26 million of direct mineral leases and $36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
-
-Since its entrance into the Eagle Ford in March 2013, the Company has:
-
-- increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR);
-- increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of $449.3 million (an 18x increase));
-- increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-
-· increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end; · increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing",0.2706185567010309,"lls in Progress 19 Net Wells in Progress 10.6 Net Acres 26,160 |
-|--------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------|
-
-production by D&P investments of $244 million. Through $26 million of direct mineral leases and $36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
-
-Since its entrance into the Eagle Ford in March 2013, the Company has:
-
-- increased its production over 10x to a 2014 exit rate of 8,177 BOEPD (a 290 percent CAGR);
-- increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of $449.3 million (an 18x increase));
-- increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-
-· increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end; · increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre sp",96,finance_samples
-97,0,"1) The Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of $3,044 creating deferred tax assets, of which $2,064 were unrecognized.",False,0.0,"1) The Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of $3,044 creating deferred tax assets, of which $2,064 were unrecognized.",0.014388489208633094," The Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of \$3,044 creating deferred tax assets, of which \$2,064 were unrecognized.",0.0035971223021582736,"1. The Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of $3,044 creating deferred tax assets, of which $2,064 were unrecognized.",0.0,"1) The Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of $3,044 creating deferred tax assets, of which $2,064 were unrecognized.",0.07194244604316546," Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant|
-|||portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of $3,044|
-|||creating deferred tax assets, of which $2,064 were unrecogniz",0.007194244604316547,") The Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of $3,044 creating deferred tax assets, of which $2,064 were unrecognized.",0.007194244604316547,") The Oklahoma US state tax jurisdiction computes income taxes on a direct accounting basis. A significant portion of the 2014 impairment related to this jurisdiction resulting in a deferred tax benefit of $3,044 creating deferred tax assets, of which $2,064 were unrecognized.",97,finance_samples
-98,0,ENHANCING THE PORTFOLIO,False,0.0,ENHANCING THE PORTFOLIO,0.0,ENHANCING THE PORTFOLIO,0.0,ENHANCING THE PORTFOLIO,0.0,ENHANCING THE PORTFOLIO,0.0,ENHANCING THE PORTFOLIO,0.0,ENHANCING THE PORTFOLIO,0.0,ENHANCING THE PORTFOLIO,98,finance_samples
-98,1,"In 2004, Santos continued its normal business of actively managing its portfolio through the divestment of non-core assets and the acquisition of assets that fit well with existing Santos assets or can add to the ability of the Company to meet its strategic goals. As a result of this activity, Santos realised an after-tax profit of $47.4 million on oil and gas asset sales and will continue to high-grade its portfolio on an ongoing basis. Santos entered into an agreement with PT Medco during the first half of 2004 to acquire some of Novus Petroleum’s Indonesian and Cooper Basin assets conditional on the success of PT Medco’s takeover offer for Novus, which was ultimately successful. Specifically, Santos announced in September 2004 that it had executed formal agreements to acquire an additional 4.75% of the South Australian Cooper Basin, 18% of the Brantas PSC and 9% of the Kakap PSC from Medco for US$110 million. On 31 December 2004, Santos paid Medco US$98 million for the majority of the assets, with payment for the remaining 2.75% of Kakap PSC expected to be made in the first quarter of 2005. This acquisition was an important piece in the strategic puzzle to tie up access to follow-up potential from the successful exploration at Jeruk and to provide a production base for the newly established Indonesian core area. Also during the first half of 2004, Santos divested its remaining 18.4% shareholding in Magellan Petroleum Australia Ltd, raising approximately $10.6 million. Early in the second half of 2004, Santos concluded the sale of its non-core onshore Otway Basin interests to Origin Energy for $25.75 million. This sale resulted in an after-tax profit of $18 million that was booked in 2004.",False,0.026744186046511628,"04, Santos continued its
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-Santos entered into an agreement with PT Medco during the first half of 2004 to acquire some of Novus Petroleum's Indonesian and Cooper Basin assets conditional on the success of PT Medco's takeover offer for Novus, which was ultimately successful.
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-
-This acquisition was an important
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-Also during the first half of 2004, Santos divested its remaining 18.4% shareholding in Magellan
-
-Petroleum Australia Ltd, raising
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-Early in the second half of 2004,
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-$25.75 million. This sale
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-This acquisition was an important piece in the strategic puzzle to tie up access to follow-up potential from the successful exploration at Jeruk and to provide a production base for the newly established Indonesian core area.
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-This acquisition was an important piece in the strategic puzzle to tie up access to follow-up potential from the successful exploration at Jeruk and to provide a production base for the newly established Indonesian core area.
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-This acquisition was an important piece in the strategic puzzle to tie up access to follow-up potential from the successful exploration at Jeruk and to provide a production base for the newly established Indonesian core area.
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-
-This acquisition was an important piece in the strategic puzzle to tie up access to follow-up potential from the successful exploration at Jeruk and to provide a production base for the newly established Indonesian core area.
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-Petroleum Australia Ltd, raising approximately $10.6 million.
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-This acquisition was an important piece in the strategic puzzle to tie up access to follow-up potential from the successful exploration at Jeruk and to provide a production base for the newly established Indonesian core area.
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-Also during the first half of 2004, Santos divested its remaining 18.4% shareholding in Magellan
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-Petroleum Australia Ltd, raising approximately $10.6 million.
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-As a result of this activity, Santos realised an after-tax profit of $47.4 million on oil and gas asset sales and will continue to high-grade its portfolio on an ongoing basis.
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-Santos entered into an agreement with PT Medco during the first half of 2004 to acquire some of Novus Petroleum's Indonesian and Cooper Basin assets conditional on the success of PT Medco's takeover offer for Novus, which was ultimately successful.
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-Specifically, Santos announced in September 2004 that it had executed formal agreements to acquire an additional 4.75% of the South Australian Cooper Basin, 18% of the Brantas PSC and 9% of the Kakap PSC from Medco for US$110 million. On 31 December 2004, Santos paid Medco US$98 million for the majority of the assets, with payment for the remaining 2.75% of Kakap PSC expected to be made in the first quarter of 2005.
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-This acquisition was an important piece in the strategic puzzle to tie up access to follow-up potential from the successful exploration at Jeruk and to provide a production base for the newly established Indonesian core area.
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-Petroleum Australia Ltd, raising approximately $10.6 million.
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-Early in the second half of 2004, Santos concluded the sale of its non-core onshore Otway Basin interests to Origin Energy for $25.75 million. This sale resulted in an after-tax profit of $18 million that was booked i",98,finance_samples
-99,0,"Chesapeake’s Five-Year and Ten-Year Common Stock Performance The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an invest- ment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.",False,0.005928853754940711,"
-Chesapeake’s Five-Year and Ten-Year Common Stock Performance The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.",0.015810276679841896,"hesapeake's Five-Year and Ten-Year Common Stock Performance
-
-The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of \$100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of \$100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.",0.01383399209486166,"hesapeake’s Five-Year and Ten-Year Common Stock Performance
-
-The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of \$100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of \$100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.",0.011857707509881422,"Chesapeake's Five-Year and Ten-Year Common Stock Performance
-
-The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.
-",0.11067193675889328,"p., Devon Energy Corp., Encana Corp. and EOG Resources, Inc.
-
-The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.",0.037549407114624504,"sapeake's Five-Year and Ten-Year Common Stock Performance
-
-80 The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an invest -ment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each ",0.037549407114624504,"sapeake's Five-Year and Ten-Year Common Stock Performance
-
-80 The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an invest -ment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each ",99,finance_samples
-100,0,"This has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low, there is likely to be a material decline in U.S. production (say 8-9%) over the course of 2016.",False,0.0,"This has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low, there is likely to be a material decline in U.S. production (say 8-9%) over the course of 2016.",0.0,"This has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low, there is likely to be a material decline in U.S. production (say 8-9%) over the course of 2016.",0.0,"This has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low, there is likely to be a material decline in U.S. production (say 8-9%) over the course of 2016.",0.0,"This has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low, there is likely to be a material decline in U.S. production (say 8-9%) over the course of 2016.",0.0106951871657754,"his has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low, there is likely to be a material decline in U.S. production (say 8-9%) over the course of 20",0.013368983957219251,"his has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low , there is likely to be a material decline in U.S. production (say 8-9%) over the course of 2",0.013368983957219251,"his has resulted in an extraordinarily fast reduction in active drilling rigs in the US slowing the pace of growth which will ultimately and unavoidably lead to supply restrictions from the US. While the rig count reduction is encouraging, some of the wells drilled prior to the reduction are still waiting upon completion and the remaining active rigs continue to drill away meaning new wells will continue to come online with high flush production so we are unlikely to see a flattening and ultimate reduction in US supply until late this year. The good news is that high initial production rates fade fast so, as long as prices stay relatively low , there is likely to be a material decline in U.S. production (say 8-9%) over the course of 2",100,finance_samples
-100,1,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,False,0.0,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,0.0,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,0.0,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,0.0,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,0.0,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,0.0,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,0.0,Our shareholders will benefit from our exposure to some of the highest quality US shale acreage and production in the Eagle Ford along with our leading cost structure and strong balance sheet.,100,finance_samples
-101,0,"ADDING MATERIAL PROSPECTS Santos is now in a position that exploration success in 2004 and good acreage management has created future options that will ultimately translate into greater value for the business in 2005 and beyond. This has been achieved by focusing on ‘basin excellence’. This means becoming a technical leader in basins, within our focus areas, entering early where possible to keep entry costs down, balancing the commercial and the technical risks and selecting the right co-venturers. An example of this is the strong position Santos has created in the Kutei Basin, with interests in three neighbouring production sharing contracts: Popodi, Donggala and Papalang. 2004 also marked the year that Santos drilled its first operated deep water wells – a significant achievement for a company that had its beginnings in a desert environment.",False,0.3953216374269006,"ADDING MATERIAL PROSPECTS
-Santos is now in a position that
-exploration success in 2004 and
-good acreage management has
-created future options that will
-ultimately translate into greater
-value for the business in 2005
-and beyond.
-
-This has been achieved by
-focusing on 'basin excellence.
-This means becoming a technical
-leader in basins, within our focus
-areas, entering early where
-possible to keep entry costs
-down, balancing the commercial
-and the technical risks and
-selecting the right co-venturers.
-
-## 2004 EXPLORATION
-
-EXPENDITURE BY CATEGORY
-
-| Category | Amount |
-| ------------------- | ------------- |
-| Drilling | $63.6 million |
-| Geoscience and other| $37.5 million |
-| Seismic | $17.2 million |
-| New ventures | $7.3 million |
-
-
-## 2004 EXPLORATION
-
-EXPENDITURE BY REGION
-
-[x]
-
-Offshore Aust",0.36374269005847953," ADDING MATERIAL PROSPECTS
-
-Santos is now in a position that exploration success in 2004 and good acreage management has created future options that will ultimately translate into greater value for the business in 2005 and beyond.
-
-This has been achieved by focusing on 'basin excellence'. This means becoming a technical leader in basins, within our focus areas, entering early where possible to keep entry costs down, balancing the commercial and the technical risks and selecting the right co-venturers.
-
-## 2004 EXPLORATION EXPENDITURE BY CATEGORY
-
-
-
-Pie chart showing 2004 exploration expenditure by category.
-
-- Drilling \$63.6 million
-- Geoscience and other \$37.5 million
-- Seismic \$17.2 million
-- New ventures \$7.3 million
-
-An example of th",0.021052631578947368,"DING MATERIAL PROSPECTS
-
-Santos is now in a position that exploration success in 2004 and good acreage management has created future options that will ultimately translate into greater value for the business in 2005 and beyond.
-
-This has been achieved by focusing on ‘basin excellence’. This means becoming a technical leader in basins, within our focus areas, entering early where possible to keep entry costs down, balancing the commercial and the technical risks and selecting the right co-venturers.
-
-> An example of this is the strong position Santos has created in the Kutei Basin, with interests in three neighbouring production sharing contracts: Popodi, Donggala and Papalang.
-
-> 2004 also marked the year that Santos drilled its first operated deep water wells – a significant achievement for a company that had its beginnings in a desert enviro",0.37894736842105264,"
-## ADDING MATERIAL PROSPECTS
-
-Santos is now in a position that exploration success in 2004 and good acreage management has created future options that will ultimately translate into greater value for the business in 2005 and beyond.
-
-This has been achieved by focusing on 'basin excellence'. This means becoming a technical leader in basins, within our focus areas, entering early where possible to keep entry costs down, balancing the commercial and the technical risks and selecting the right co-venturers.
-
-## 2004 EXPLORATION EXPENDITURE BY CATEGORY
-
-| Category | Amount |
-| -------------------- | ------------- |
-| Drilling | $63.6 million |
-| Geoscience and other | $37.5 million |
-| Seismic | $17.2 million |
-| New ventures | $7.3 million |
-
-
-## 2004 EXPLORATION EXPENDITURE BY REGION
-
-| Region",0.36374269005847953,"ADDING MATERIAL PROSPECTS** Santos is now in a position that exploration success in 2004 and good acreage management has created future options that will ultimately translate into greater value for the business in 2005 and beyond.
-
-This has been achieved by focusing on ‘basin excellence’. This means becoming a technical leader in basins, within our focus areas, entering early where possible to keep entry costs down, balancing the commercial and the technical risks and selecting the right co-venturers.
-
-**2004 EXPLORATION EXPENDITURE BY CATEGORY**
-
-**2004 EXPLORATION EXPENDITURE BY REGION**
-
-**==> picture [65 x 82] intentionally omitted <==**
-
-- Drilling $63.6 million
-
- - Offshore Australia $32.6 million Onshore Australia $23.4 million South East Asia $41.4 million United States $28.2 million
-
-- Geoscience and other $37.5 million
-
-- Se",0.2573099415204678,"IAL PROSPECTS Santos is now in a position that exploration success in 2004 and good acreage management has created future options that will ultimately translate into greater value for the business in 2005 and beyond.
-
-This has been achieved by focusing on 'basin excellence' . This means becoming a technical leader in basins, within our focus areas, entering early where possible to keep entry costs down, balancing the commercial and the technical risks and selecting the right co-venturers.
-
-## 2004 EXPLORATION EXPENDITURE BY CATEGORY
-
-## 2004 EXPLORATION EXPENDITURE BY REGION
-
-
-
-An example of this is the strong position Santos has created in the Kutei Basin, with interests in three neighbouring production sharing contracts: Popodi, Donggala and Papalang.
-
-2004 also marked the year that Santos drilled its first operated deep water ",0.2573099415204678,"IAL PROSPECTS Santos is now in a position that exploration success in 2004 and good acreage management has created future options that will ultimately translate into greater value for the business in 2005 and beyond.
-
-This has been achieved by focusing on 'basin excellence' . This means becoming a technical leader in basins, within our focus areas, entering early where possible to keep entry costs down, balancing the commercial and the technical risks and selecting the right co-venturers.
-
-## 2004 EXPLORATION EXPENDITURE BY CATEGORY
-
-## 2004 EXPLORATION EXPENDITURE BY REGION
-
-
-
-An example of this is the strong position Santos has created in the Kutei Basin, with interests in three neighbouring production sharing contracts: Popodi, Donggala and Papalang.
-
-2004 also marked the year that Santos drilled its first operated deep water ",101,finance_samples
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-103,0,"(1) Types of Risk to Be Managed At SMFG, we classify risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk catego- ries are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group. (2) Fundamental Principles and Basic Policies for Risk Management SMFG’s Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspec- tives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring con- sistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group companies.",False,0.013015184381778741,"1) Types of Risk to Be Managed
-
-At SMFG, we classify risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk categories are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group.
-
-## (2) Fundamental Principles and Basic Policies for Risk
-Management
-
-SMFG’s Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspectives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring consistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group companie",0.010845986984815618,"(1) Types of Risk to Be Managed
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-At SMFG, we classify risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk categories are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group.
-
-## (2) Fundamental Principles and Basic Policies for Risk Management
-
-SMFG's Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspectives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring consistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group companies.",0.011569052783803326,"1) Types of Risk to Be Managed
-
-At SMFG, we classify risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk categories are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group.
-
-### (2) Fundamental Principles and Basic Policies for Risk Management
-
-SMFG’s Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspectives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring consistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group companies.",0.010845986984815618,"(1) Types of Risk to Be Managed
-
-At SMFG, we classify risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk categories are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group.
-
-## (2) Fundamental Principles and Basic Policies for Risk Management
-
-SMFG's Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspectives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring consistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group companies.",0.023138105567606652," of Risk to Be Managed**
-
-At SMFG, we classify risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk categories are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group.
-
-## **(2) Fundamental Principles and Basic Policies for Risk Management**
-
-SMFG’s Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspectives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring consistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group companies",0.09255242227042661," risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk categories are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group.
-
-## ■ SMFG's Risk Management System
-
-
-
-32
-
-## (2) Fundamental Principles and Basic Policies for Risk Management
-
-SMFG's Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspectives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring consistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group compa",0.09255242227042661," risk into the following categories: (1) credit risk, (2) market risk, (3) liquidity risk and (4) operational risk (including processing risk and system risk). In addition, we provide individually tailored guidance to help Group companies identify categories of risk that need to be addressed. Risk categories are constantly reviewed, and new categories may be added in response to changes in the operating environment. The Corporate Risk Management Department works with the Corporate Planning Department to comprehensively and systematically manage all these categories of risk across the entire Group.
-
-## ■ SMFG's Risk Management System
-
-
-
-32
-
-## (2) Fundamental Principles and Basic Policies for Risk Management
-
-SMFG's Groupwide basic policies for risk management stipulate the fundamental principles for risk management that must be followed, and spell out risk management procedures from various perspectives. These include managing risk on a consolidated accounting basis, managing risk using quantification methods, ensuring consistency with business strategies, setting up a system of checks and balances, contingency planning for emergencies and serious situations, and verifying preparedness to handle all conceivable risk situations. In addition, there are specific operational policies for implementing appropriate management of risk by all Group compa",103,finance_samples
-104,0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",False,0.0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",0.0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",0.0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",0.0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",0.0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",0.0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",0.0,"Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength to continue to deliver long-term growth.",104,finance_samples
-104,1,"LEADER IN CANADIAN COMMUNICATIONS INDUSTRY Canada’s largest wireless carrier and a leading cable television provider, offering a “quadruple play” of wireless, Internet, television and telephony services to consumers and businesses.",False,0.017316017316017316,"EADER IN CANADIAN
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-104,2,MUST-HAVE PRODUCTS AND SERVICES A leading provider of communications and entertainment products and services that are increasingly becoming integrated necessities in today’s world.,False,0.03888888888888889,"UST-HAVE PRODUCTS
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-A leading provider of communications
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-A leading provider of communications and entertainment products and services that are increasingly becoming integrated necessities in today's world.",0.022222222222222223,"UST-HAVE PRODUCTS AND SERVICES
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-A leading provider of communications and entertainment products and services that are increasingly becoming integrated necessities in today's world.",104,finance_samples
-104,3,"CATEGORY-LEADING MEDIA ASSETS Unique and complementary collection of leading broadcast radio and television, specialty TV, sports entertainment, publishing and digital media assets.",False,0.049723756906077346,"ATEGORY-LEADING
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-
-Unique and complementary collection
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-Unique and complementary collection of leading broadcast radio and television, specialty TV, sports entertainment, publishing and digital media assets",0.8011049723756906," CANADIAN COMMUNICATIONS INDUSTRY**
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-Unique and complementary collection of leading broadcast radio and television, specialty TV, sports entertainment, publishing and digital media assets.",0.016574585635359115,"ATEGORY-LEADING MEDIA ASSETS
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-Unique and complementary collection of leading broadcast radio and television, specialty TV, sports entertainment, publishing and digital media assets.",104,finance_samples
-104,4,"SUPERIOR ASSET MIX Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry.",False,0.017857142857142856,"SUPERIOR ASSET MIX
-
-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry",0.017857142857142856,"SUPERIOR ASSET MIX
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-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry",0.005952380952380952,"SUPERIOR ASSET MIX
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-
-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry",0.125," omitted <==**
-
-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry.
-
-",0.017857142857142856,"SUPERIOR ASSET MIX
-
-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry",0.017857142857142856,"SUPERIOR ASSET MIX
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-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry",104,finance_samples
-104,5,"STRONG FRANCHISES AND POWERFUL BRANDS Strong franchises with nationally recognized and highly respected brands that stand solidly in Canada for innovation, choice and value.",False,0.04046242774566474,"TRONG FRANCHISES
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-
-Strong franchises with nationally
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-Strong franchises with nationally recognized and highly respected brands that stand solidly in Canada for innovation, choice and value",0.005780346820809248,"STRONG FRANCHISES AND POWERFUL BRANDS
-Strong franchises with nationally recognized and highly respected brands that stand solidly in Canada for innovation, choice and value.",0.017341040462427744,"STRONG FRANCHISES AND POWERFUL BRANDS
-
-Strong franchises with nationally recognized and highly respected brands that stand solidly in Canada for innovation, choice and value",0.6763005780346821,"## **WHY INVEST** IN ROGERS
-
-**Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven manage",0.017341040462427744,"STRONG FRANCHISES AND POWERFUL BRANDS
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-Strong franchises with nationally recognized and highly respected brands that stand solidly in Canada for innovation, choice and value",0.017341040462427744,"STRONG FRANCHISES AND POWERFUL BRANDS
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-Strong franchises with nationally recognized and highly respected brands that stand solidly in Canada for innovation, choice and value",104,finance_samples
-104,6,"LEADING NETWORKS AND INNOVATIVE PRODUCTS Leading wireless and broadband network platforms that deliver the most innovative communications, information and entertainment services.",False,0.0449438202247191,"EADING NETWORKS
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-
-Leading wireless and broadband
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-Leading wireless and broadband network platforms that deliver the most innovative communications, information and entertainment services",0.7471910112359551," and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry.
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-**==> picture [117 x 21] intentionally omitte",0.016853932584269662,"EADING NETWORKS AND INNOVATIVE PRODUCTS
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-Leading wireless and broadband network platforms that deliver the most innovative communications, information and entertainment services.",0.016853932584269662,"EADING NETWORKS AND INNOVATIVE PRODUCTS
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-Leading wireless and broadband network platforms that deliver the most innovative communications, information and entertainment services.",104,finance_samples
-104,7,"PROVEN LEADERSHIP AND ENGAGED EMPLOYEE BASE Experienced, performance-oriented management and operating teams with solid industry expertise, supported by the spirit of innovation and an entrepreneurial culture.",False,0.03827751196172249,"PROVEN LEADERSHIP AND
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-
-Experienced, performance-oriented
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-**Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long re",0.20095693779904306,"
-
-## FINANCIAL STRENGTH AND FLEXIBILITY
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-Experienced, performance-oriented management and operating teams with solid industry expertise, supported by the spirit of innovation and an entrepreneurial culture.
-
-F",0.20095693779904306,"
-
-## FINANCIAL STRENGTH AND FLEXIBILITY
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-Experienced, performance-oriented management and operating teams with solid industry expertise, supported by the spirit of innovation and an entrepreneurial culture.
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-F",104,finance_samples
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-104,9,"HEALTHY TRADING VOLUME AND GROWING DIVIDENDS RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of $1.83 per share in 2014.",False,0.01694915254237288,"HEALTHY TRADING VOLUME
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-RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of $1.83 per share in 2014",0.0211864406779661,"EALTHY TRADING VOLUME AND GROWING DIVIDENDS
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-RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of $1.83 per share in 2014.",0.8177966101694916,"HY INVEST** IN ROGERS
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-**Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength ",0.012711864406779662,"HEALTHY TRADING VOLUME AND GROWING DIVIDENDS
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-105,6,"DEFINING RESERVES Santos has in place an evaluation and reporting process that is in line with international industry practice and is in general conformity with reserves definitions and resource classification systems published by the Society of Petroleum Engineers (SPE), World Petroleum Congress (WPC) and the American",False,0.0375,"EFINING RESERVES
-
-Santos has in place an evaluation
-and reporting process that is in
-line with international industry
-practice and is in general
-conformity with reserves
-definitions and resource
-classification systems published by
-the Society of Petroleum Engineers
-(SPE), World Petroleum Congress
-(WPC) and the American",0.009375,"EFINING RESERVES
-
-Santos has in place an evaluation and reporting process that is in line with international industry practice and is in general conformity with reserves definitions and resource classification systems published by the Society of Petroleum Engineers (SPE), World Petroleum Congress (WPC) and the American",0.009375,"EFINING RESERVES
-
-Santos has in place an evaluation and reporting process that is in line with international industry practice and is in general conformity with reserves definitions and resource classification systems published by the Society of Petroleum Engineers (SPE), World Petroleum Congress (WPC) and the American",0.0125,"EFINING RESERVES** Santos has in place an evaluation and reporting process that is in line with international industry practice and is in general conformity with reserves definitions and resource classification systems published by the Society of Petroleum Engineers (SPE), World Petroleum Congress (WPC) and the America",0.728125, Santos has in place an evaluation Geologists (AAPG). The definitions and reporting process that is in used are consistent with the line with international industry requirements of the Australian practice and is in general Stock Exchange Ltd (ASX). conformity with reserves Reserves are defined as those definitions and ,0.009375,"DEFINING RESERVES
-
-Santos has in place an evaluation and reporting process that is in line with international industry practice and is in general conformity with reserves definitions and resource classification systems published by the Society of Petroleum Engineers (SPE), World Petroleum Congress (WPC) and the America",0.009375,"DEFINING RESERVES
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-Santos has in place an evaluation and reporting process that is in line with international industry practice and is in general conformity with reserves definitions and resource classification systems published by the Society of Petroleum Engineers (SPE), World Petroleum Congress (WPC) and the America",105,finance_samples
-105,7,"Association of Petroleum Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX). Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules.",False,0.037953795379537955,"ssociation of Petroleum
-Geologists (AAPG). The definitions
-used are consistent with the
-requirements of the Australian
-Stock Exchange Ltd (ASX).
-
-Reserves are defined as those
-quantities of petroleum which are
-anticipated to be commercially
-recovered from known
-accumulations from a given date
-
-forward. Santos reports reserves
-net of the gas required for
-processing and transportation to
-the customer. Reserves reported are
-based on, and accurately reflect,
-information compiled by full-time
-employees of the Company who
-have the requisite qualifications
-and experience prescribed by the
-ASX Listing Rules",0.03135313531353135,"ssociation of Petroleum
-
-Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX).
-
-Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date
-
-### forward. Santos reports reserves
-
-net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing",0.0049504950495049506,"Association of Petroleum Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX).
-
-Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules",0.0,"Association of Petroleum Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX). Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules.",0.3564356435643564,"s are defined as those definitions and resource quantities of petroleum which are classification systems published by anticipated to be commercially the Society of Petroleum Engineers recovered from known (SPE), World Petroleum Congress accumulations from a given date (WPC) and the American
-
-forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules.",0.0049504950495049506,"ssociation of Petroleum Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX).
-
-Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules.",0.0049504950495049506,"ssociation of Petroleum Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX).
-
-Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules.",105,finance_samples
-105,8,"EXTERNALLY REVIEWED BOOKING PROCESS Santos’ reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be ‘appropriate to providing robust estimates of Santos’ reserve position in accordance with international industry practice’.",False,0.05653710247349823,"EXTERNALLY REVIEWED
-
-BOOKING PROCESS
-
-Santos' reserves processes and
-procedures were reviewed by
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-& Associates, and found to be
-'appropriate to providing robust
-estimates of Santos' reserve
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-international industry practice",0.04946996466431095,"XTERNALLY REVIEWED
-
-## BOOKING PROCESS
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-Santos' reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be 'appropriate to providing robust estimates of Santos' reserve position in accordance with international industry practi",0.01060070671378092,"EXTERNALLY REVIEWED BOOKING PROCESS
-
-Santos’ reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be ‘appropriate to providing robust estimates of Santos’ reserve position in accordance with international industry practice’",0.024734982332155476,"EXTERNALLY REVIEWED BOOKING PROCESS** Santos' reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be 'appropriate to providing robust estimates of Santos' reserve position in accordance with international industry practice",0.014134275618374558,"TERNALLY REVIEWED BOOKING PROCESS** Santos’ reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be ‘appropriate to providing robust estimates of Santos’ reserve position in accordance with international industry practice’.",0.04946996466431095,"XTERNALLY REVIEWED BOOKING PROCESS
-
-Santos' reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be 'appropriate to providing robust estimates of Santos' reserve position in accordance with international industry practi",0.04946996466431095,"XTERNALLY REVIEWED BOOKING PROCESS
-
-Santos' reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be 'appropriate to providing robust estimates of Santos' reserve position in accordance with international industry practi",105,finance_samples
-106,0,"2.3 Composition of the Board The composition of the Board is determined in accordance with the Company’s Constitution and the Board Guidelines which, among other things, require that: • the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO); • the Board should comprise a substantial majority of independent, non-executive Directors;",False,0.056,"2.3 Composition of the Board
-The composition of the Board is
-determined in accordance with
-the Company's Constitution and
-the Board Guidelines which,
-among other things, require that:
-
-⚫the Board is to comprise
-a minimum of five and a
-maximum of ten Directors
-(exclusive of the CEO);
-
- - the Board should comprise a
-substantial majority of
-independent, non-executive
-Director",0.02666666666666667,"3 Composition of the Board
-
-The composition of the Board is determined in accordance with the Company's Constitution and the Board Guidelines which, among other things, require that:
-
-- the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
-- the Board should comprise a substantial majority of independent, non-executive Directors;",0.04,"3 Composition of the Board
-
-The composition of the Board is determined in accordance with the Company’s Constitution and the Board Guidelines which, among other things, require that:
-
-* the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
-* the Board should comprise a substantial majority of independent, non-executive Direct",0.058666666666666666,"Composition of the Board
-
-The composition of the Board is determined in accordance with the Company's Constitution and the Board Guidelines which, among other things, require that:
-
-> * the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
->
-> * the Board should comprise a substantial majority of independent, non-executive Direc",0.042666666666666665,"position of the Board** The composition of the Board is determined in accordance with the Company’s Constitution and the Board Guidelines which, among other things, require that:
-
-• the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
-
-- • the Board should comprise a substantial majority of independent, non-executive Directors",0.018666666666666668,"2.3 Composition of the Board The composition of the Board is determined in accordance with the Company's Constitution and the Board Guidelines which, among other things, require that:
-
-- the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
-- the Board should comprise a substantial majority of independent, non-executive Directors",0.018666666666666668,"2.3 Composition of the Board The composition of the Board is determined in accordance with the Company's Constitution and the Board Guidelines which, among other things, require that:
-
-- the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
-- the Board should comprise a substantial majority of independent, non-executive Directors",106,finance_samples
-106,1,"Generally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be perceived to materially interfere with, the Director’s ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors: • a holding of 5% or more of the Company’s voting shares or a direct association with an entity that holds more than 5% of the Company’s voting shares; • an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Company.",False,0.03416856492027335,"nerally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be
-
-perceived to materially interfere
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-act in the best interests of the
-Company. The Board will assess
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-independence on a case by case
-basis and has adopted
-materiality guidelines to assist in
-that assessment. Under these
-guidelines, the following
-interests are regarded as material
-in the absence of any mitigating
-factors:
-
-• a holding of 5% or more of
-the Company's voting shares or
-a direct association with an
-entity that holds more than
-5% of the Company's voting
-shares;
-
-• an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Company",0.01366742596810934,"Generally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be
-
-perceived to materially interfere with, the Director's ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
-
-- a holding of 5% or more of the Company's voting shares or a direct association with an entity that holds more than 5% of the Company's voting shares;
-- an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Compan",0.01366742596810934,"enerally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be perceived to materially interfere with, the Director’s ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
-
-* a holding of 5% or more of the Company’s voting shares or a direct association with an entity that holds more than 5% of the Company’s voting shares;
-* an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Comp",0.02847380410022779,"lly, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be perceived to materially interfere with, the Director's ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
->
-> * a holding of 5% or more of the Company's voting shares or a direct association with an entity that holds more than 5% of the Company's voting shares;
->
-> * an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Comp",0.02733485193621868,"enerally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be
-
-perceived to materially interfere with, the Director’s ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted
-
-materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
-
-- • a holding of 5% or more of the Company’s voting shares or a direct association with an entity that holds more than 5% of the Company’s voting shares;
-
-- • an affiliation with an entity which accounts for 5% or more or the revenue or expense of t",0.010250569476082005,"enerally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be perceived to materially interfere with, the Director's ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
-
-- a holding of 5% or more of the Company's voting shares or a direct association with an entity that holds more than 5% of the Company's voting shares;
-- an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Company.",0.010250569476082005,"enerally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be perceived to materially interfere with, the Director's ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
-
-- a holding of 5% or more of the Company's voting shares or a direct association with an entity that holds more than 5% of the Company's voting shares;
-- an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Company.",106,finance_samples
-106,2,"The names and details of the experience, qualifications, special responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director’s attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report.",False,0.015432098765432098,"he names and details of the
-experience, qualifications, special
-
-responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director's attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report.",0.012345679012345678,"The names and details of the experience, qualifications, special
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-responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director's attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report",0.0,"The names and details of the experience, qualifications, special responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director’s attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report.",0.0030864197530864196,"The names and details of the experience, qualifications, special responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director's attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report.",0.012345679012345678,"The names and details of the experience, qualifications, special
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-responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director’s attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Repor",0.0030864197530864196,"The names and details of the experience, qualifications, special responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director's attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report.",0.0030864197530864196,"The names and details of the experience, qualifications, special responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director's attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report.",106,finance_samples
-107,0,"innovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that’s pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improve- ments have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box.",False,0.0040609137055837565,"innovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their
-
-product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that’s pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improve ments have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box",0.008121827411167513,"nnovate more** Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their
-
-product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that's pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box.",0.02030456852791878,"e more** Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, *Hormel* chili varieties were first in their product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include *SPAM Singles* and *Jennie-O Turkey Store* Oven Ready Turkey, a fool-proof, whole frozen turkey that’s pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our *Hormel* microwave meals by revising packaging to draw attention to the convenient bowl rather than the box",0.02131979695431472,"ovate more** Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, *Hormel* chili varieties were first in their product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include *SPAM* Singles and *Jennie-O Turkey Store* Oven Ready Turkey, a fool-proof, whole frozen turkey that's pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our *Hormel* microwave meals by revising packaging to draw attention to the convenient bowl rather than the",0.02030456852791878,"ovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, _Hormel_ chili varieties were first in their
-
-product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include _SPAM_ Singles and _Jennie-O Turkey Store_ Oven Ready Turkey, a fool-proof, whole frozen turkey that’s pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our _Hormel_ microwave meals by revising packaging to draw attention to the convenient bowl rather than the",0.006091370558375634,"
-innovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their product category to offer Tetra Recart carton packaging - an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that's pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box.
-",0.006091370558375634,"
-innovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their product category to offer Tetra Recart carton packaging - an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that's pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box.
-",107,finance_samples
-108,0,EP 2 000 008 B1,False,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,108,patents
-108,1,EUROPEAN PATENT SPECIFICATION,False,0.0,EUROPEAN PATENT SPECIFICATION,0.0,EUROPEAN PATENT SPECIFICATION,0.0,EUROPEAN PATENT SPECIFICATION,0.0,EUROPEAN PATENT SPECIFICATION,0.0,EUROPEAN PATENT SPECIFICATION,0.0,EUROPEAN PATENT SPECIFICATION,0.0,EUROPEAN PATENT SPECIFICATION,108,patents
-108,2,(45) Date of publication and mention of the grant of the patent: 27.04.2011 Bulletin 2011/17,False,0.0,(45) Date of publication and mention of the grant of the patent: 27.04.2011 Bulletin 2011/17,0.08695652173913043,"45) Date of publication and mention
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-27.04.2011 Bulletin 2011",0.05434782608695652,"(45) Date of publication and mention of the grant of the patent:**
-27.04.2011 Bulletin 2011/",0.06521739130434782,"5) Date of publication and mention
-of the grant of the patent:
-**27.04.2011 Bulletin 2011/17",0.043478260869565216,45) Date of publication and mention of the grant of the patent: **27.04.2011 Bulletin 2011/1,0.03260869565217391,"45) Date of publication and mention of the grant of the patent:
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-27.04.2011 Bulletin 2011/17",0.03260869565217391,"45) Date of publication and mention of the grant of the patent:
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-27.04.2011 Bulletin 2011/17",108,patents
-108,3,(21) Application number: 07759411.7,False,0.0,(21) Application number: 07759411.7,0.0,(21) Application number: 07759411.7,0.14285714285714285,"21) Application number:**
-07759411.",0.11428571428571428,21) Application number: **07759411.,0.11428571428571428,21) Application number: **07759411.,0.0,(21) Application number: 07759411.7,0.0,(21) Application number: 07759411.7,108,patents
-108,4,(22) Date of filing: 26.03.2007,False,0.0,(22) Date of filing: 26.03.2007,0.0,(22) Date of filing: 26.03.2007,0.16129032258064516,"(22) Date of filing:**
-26.03.20",0.12903225806451613,2) Date of filing: **26.03.2007,0.12903225806451613,(22) Date of filing: **26.03.20,0.0,(22) Date of filing: 26.03.2007,0.0,(22) Date of filing: 26.03.2007,108,patents
-108,5,(51) Int Cl.: C23C 16/455(2006.01) C23C 16/54(2006.01) H05B 33/10(2006.01),False,0.3918918918918919,"/17
-
- (51) Int Cl.:
-C23C 16/455 (2006.01)
-C23C 16/54 (2006.01)
-
-(22) Date ",0.5135135135135135,"etin 2011/17
-
-(51) Int Cl.:
-C23C 16/455 (2006.01) H05B 33/10 (2006.01) ",0.47297297297297297,"2007
-
-**(51) Int Cl.:**
-* C23C 16/455 (2006.01)
-* H05B 33/10 (2006.01)",0.527027027027027," 2011/17**
-
-(51) Int Cl.:
-*C23C 16/455 (2006.01) H05B 33/10 (2006.01)*
-*C2",0.8648648648648649," - (86) International application number: **PCT/US2007/064961**
-
-- (21) A",0.16216216216216217,") Int Cl.:
-
-C23C 16/455 (2006.01) C23C 16/54 (2006.01)
-
-H05B 33/10 (2006.0",0.16216216216216217,") Int Cl.:
-
-C23C 16/455 (2006.01) C23C 16/54 (2006.01)
-
-H05B 33/10 (2006.0",108,patents
-108,6,(54) ATOMIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON FLEXIBLEN SUBSTRATEN DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE SUBSTRATS FLEXIBLES,False,0.02766798418972332,"4) ATOMIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES
-
-ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON
-FLEXIBLEN SUBSTRATEN
-
-DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE SUBSTRATS FLEXIBLES",0.07114624505928854,"MIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES**
-
-ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON
-FLEXIBLEN SUBSTRATEN
-
-DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE
-SUBSTRATS FLEXIBLES",0.039525691699604744,"54) ATOMIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES**
-
-ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON FLEXIBLEN SUBSTRATEN
-
-DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE SUBSTRATS FLEXIB",0.05533596837944664,"ATOMIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES**
-
-ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON
-FLEXIBLEN SUBSTRATEN
-
-DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE
-SUBSTRATS FLEXIBLES
-",0.04743083003952569,"TOMIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES** ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON FLEXIBLEN SUBSTRATEN
-
-# DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE SUBSTRATS FLEXIBLES",0.023715415019762844,"4) ATOMIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES
-
-ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON FLEXIBLEN SUBSTRATEN
-
-DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE SUBSTRATS FLEXIBLES",0.023715415019762844,"4) ATOMIC LAYER DEPOSITION SYSTEM AND METHOD FOR COATING FLEXIBLE SUBSTRATES
-
-ATOMLAGENABSCHEIDUNGSSYSTEM UND VERFAHREN ZUR BESCHICHTUNG VON FLEXIBLEN SUBSTRATEN
-
-DISPOSITIF ET PROCEDE DE DEPOT EN COUCHES ATOMIQUES POUR REVETEMENT DE SUBSTRATS FLEXIBLES",108,patents
-108,7,"(72) Inventors: • DICKEY, Eric R. Beaverton, Oregon 97006 (US)",False,0.06451612903225806,"72) Inventors:
-
-• DICKEY, Eric R.
-Beaverton, Oregon 97006 (US)",0.3225806451612903,"ventors:
-
-- **DICKEY, Eric R.**
- Beaverton, Oregon 97006 (U",0.4032258064516129,"ventors:**
-* **DICKEY, Eric R.**
- Beaverton, Oregon 97006",0.11290322580645161,"(72) Inventors:
-* **DICKEY, Eric R.
-Beaverton, Oregon 97006 (U",0.2903225806451613,"(72) Inventors:
-
- - **• DICKEY, Eric R. Beaverton, Oregon 9",0.25806451612903225,"B2- 6 888 172
-
-- DICKEY, Eric R. Beaverton, Oregon 97006 (US)
-",0.25806451612903225,"B2- 6 888 172
-
-- DICKEY, Eric R. Beaverton, Oregon 97006 (US)
-",108,patents
-108,9,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",False,0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.009900990099009901,"te:** Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.007425742574257425,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent
-Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the
-Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been
-paid. (Art. 99(1) European Patent Convention).",0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",108,patents
-109,1,c12) United States Patent,False,0.08,12) United States Patent,0.16,12) **United States Paten,0.08,"12) United States Patent
-",0.04,(12) United States Patent,0.16,12) **United States Paten,0.0,c12) United States Patent,0.0,c12) United States Patent,109,patents
-109,2,Takizawa et al.,False,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,109,patents
-109,3,"(IO) Patent No.: US 9,423,690 B2",False,0.1875,") Patent No.:
-
-# US 9,423,690 B2",0.3125,"Patent No.:** **US 9,423,690 B2*",0.15625,"0) Patent No.:** US 9,423,690 B2",0.0625,"(10) Patent No.: US 9,423,690 B2",0.125,"IO) **Patent No.: US 9,423,690 B",0.25,")
-
-Patent No.:
-
-US 9,423,690 B2",0.25,")
-
-Patent No.:
-
-US 9,423,690 B2",109,patents
-109,4,"(45) Date of Patent: Aug. 23, 2016",False,0.14705882352941177,"45) Date of Patent:
-
-Aug. 23, 201",0.2647058823529412,"*Date of Patent:** **Aug. 23, 2016",0.11764705882352941,"45) Date of Patent:** Aug. 23, 201",0.0,"(45) Date of Patent: Aug. 23, 2016",0.11764705882352941,"5) **Date of Patent: Aug. 23, 2016",0.23529411764705882,"2
-
-Date of Patent:
-
-Aug. 23, 2016
-",0.2647058823529412,"
-
-Date of Patent:
-
-Aug. 23, 2016
-
-",109,patents
-109,5,"(54) PATTERN FORMING METHOD, ELECTRON , BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",False,0.04807692307692308," (54) PATTERN FORMING METHOD, ELECTRON
-BEAM-SENSITIVE OR EXTREME
-ULTRAVIOLET RAY-SENSITIVE RESIN
-COMPOSITION, RESIST FILM, AND
-METHOD FOR MANUFACTURING
-ELECTRONIC DEVICE, AND ELECTRONIC
-DEVICE USING THE SAME",0.019230769230769232,"(54) **PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.019230769230769232,"(54) PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME
-
-",0.019230769230769232,"**(54) PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.019230769230769232,"(54) **PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.019230769230769232," (54) PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME
-",0.019230769230769232," (54) PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME
-",109,patents
-109,6,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP)",False,0.0,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP)",0.20833333333333334,"Applicant:** **FUJIFILM Corporation, Tokyo (JP)*",0.08333333333333333,"71) Applicant:** FUJIFILM Corporation, Tokyo (JP",0.0,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP)",0.16666666666666666," Applicant: **FUJIFILM Corporation,** Tokyo (JP)",0.041666666666666664,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP",0.041666666666666664,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP",109,patents
-109,7,"(72) Inventors: Hiroo Takizawa, Shizuoka (JP); Shuji , ( ) Hirano, Shizuoka (JP); Natsumi Yokokawa, Shizuoka (JP); Wataru Nihashi, Shizuoka (JP)",False,0.0763888888888889,"(72) Inventors: Hiroo Takizawa, Shizuoka (JP); Shuji
-Hirano, Shizuoka (JP); Natsumi
-Yokokawa, Shizuoka (JP); Wataru
-Nihashi, Shizuoka (JP)",0.08333333333333333,"(72) **Inventors:** **Hiroo Takizawa, Shizuoka (JP); Shuji Hirano, Shizuoka (JP); Natsumi Yokokawa, Shizuoka (JP); Wataru Nihashi, Shizuoka (JP)",0.08333333333333333,"
-**(72) Inventors:** Hiroo Takizawa, Shizuoka (JP); Shuji Hirano, Shizuoka (JP); Natsumi Yokokawa, Shizuoka (JP); Wataru Nihashi, Shizuoka (JP)
-",0.08333333333333333,"*(72) Inventors: Hiroo Takizawa, Shizuoka (JP); Shuji Hirano, Shizuoka (JP); Natsumi Yokokawa, Shizuoka (JP); Wataru Nihashi, Shizuoka (JP)**
-
-*",0.2222222222222222,"ventors: **Hiroo Takizawa,** Shizuoka (JP); **Shuji Hirano,** Shizuoka (JP); **Natsumi Yokokawa,** Shizuoka (JP); **Wataru Nihashi,** Shizuoka (",0.08333333333333333,"(72) Inventors: Hiroo Takizawa, Shizuoka (JP); Shuji Hirano, Shizuoka (JP); Natsumi Yokokawa, Shizuoka (JP); Wataru Nihashi, Shizuoka (JP)
-- (73",0.08333333333333333," (72) Inventors: Hiroo Takizawa, Shizuoka (JP); Shuji Hirano, Shizuoka (JP); Natsumi Yokokawa, Shizuoka (JP); Wataru Nihashi, Shizuoka (JP)
-- (7",109,patents
-109,8,"(57) ABSTRACT There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition contain- ing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo!% or more based on a whole repeating units in the resin (A).",False,0.009404388714733543,"(57) ABSTRACT
-
-There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and (c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo!% or more based on a whole repeating units in the resin (A).",0.0219435736677116,") **ABSTRACT**
-
-There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and (c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A).",0.017241379310344827," (57) ABSTRACT
-
-There is provided a pattern forming method, including:
-(a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
-(b) exposing the film by using an electron beam or extreme ultraviolet ray; and
-(c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A).",0.01567398119122257,"(57) ABSTRACT**
-
-There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and (c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A)",0.018808777429467086,") **ABSTRACT**
-
-There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo!% or more based on a whole repeating units in the resin (A)",0.09561128526645768,"ere is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition contain› ing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo!% or more based on a whole repeating units in",0.09561128526645768,"re is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition contain› ing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo!% or more based on a whole repeating units in ",109,patents
-110,0,US 2020/0050106 Al,False,0.0,US 2020/0050106 Al,0.7777777777777778,"a (1):
-
-[0051] As ",0.05555555555555555,US 2020/0050106 A,0.1111111111111111,"
-US 2020/0050106 A",0.0,US 2020/0050106 Al,0.7777777777777778,"a (1):
-
-[0051] As ",0.7777777777777778,"a (1):
-
-[0051] As ",110,patents
-110,1,2,False,0.0,2,0.0,2,0.0,2,0.0,2,0.0,2,0.0,2,0.0,2,110,patents
-110,2,"Feb. 13, 2020",False,0.0,"Feb. 13, 2020",0.7692307692307693,eferably 0.20,0.6153846153846154,US 2020,0.0,"Feb. 13, 2020",0.0,"Feb. 13, 2020",0.7692307692307693,ferably 0.24,0.7692307692307693,ferably 0.24,110,patents
-110,3,DESCRIPTION OF THE PREFERRED EMBODIMENTS,False,0.025,"DESCRIPTION OF THE PREFERRED
-EMBODIMENTS",0.0,DESCRIPTION OF THE PREFERRED EMBODIMENTS,0.0,DESCRIPTION OF THE PREFERRED EMBODIMENTS,0.0,DESCRIPTION OF THE PREFERRED EMBODIMENTS,0.0,DESCRIPTION OF THE PREFERRED EMBODIMENTS,0.0,DESCRIPTION OF THE PREFERRED EMBODIMENTS,0.0,DESCRIPTION OF THE PREFERRED EMBODIMENTS,110,patents
-110,4,"[0039] Hereinafter, an example of embodiments for car- rying out the present invention will be described.",False,0.02857142857142857,"
-[0039] Hereinafter, an example of embodiments for carrying out the present invention will be described.",0.0380952380952381,"
-
-[0039] Hereinafter, an example of embodiments for carrying out the present invention will be described.",0.0380952380952381,"[0039]** Hereinafter, an example of embodiments for carrying out the present invention will be described.",0.0380952380952381,"[0039]** Hereinafter, an example of embodiments for carrying out the present invention will be described.",0.0380952380952381,"[0039]** Hereinafter, an example of embodiments for carrying out the present invention will be described.",0.10476190476190476,"9] Hereinafter, an example of embodiments for car› rying out the present invention will be described",0.10476190476190476,"9] Hereinafter, an example of embodiments for car› rying out the present invention will be described",110,patents
-110,5,"y g p [0040] In the present specification, a numerical range expressed using ""to"" is used in a meaning of a range that includes the preceding and succeeding numerical values of ""to"" as the lower limit value and the upper limit value, respectively.",False,0.04048582995951417,"
-
-[0040] In the present specification, a numerical range expressed using ""to"" is used in a meaning of a range that includes the preceding and succeeding numerical values of ""to"" as the lower limit value and the upper limit value, respectively.
-
-[0",0.05263157894736842,".
-
-[0040] In the present specification, a numerical range expressed using “to” is used in a meaning of a range that includes the preceding and succeeding numerical values of “to” as the lower limit value and the upper limit value, respectively.
-
-[",0.06072874493927125,"*[0040]** In the present specification, a numerical range expressed using “to” is used in a meaning of a range that includes the preceding and succeeding numerical values of “to” as the lower limit value and the upper limit value, respectively.
-
-*",0.044534412955465584,"*[0040]** In the present specification, a numerical range expressed using ""to"" is used in a meaning of a range that includes the preceding and succeeding numerical values of ""to"" as the lower limit value and the upper limit value, respectively.
-
-*",0.03643724696356275,"
-**[0040]** In the present specification, a numerical range expressed using ""to"" is used in a meaning of a range that includes the preceding and succeeding numerical values of ""to"" as the lower limit value and the upper limit value, respectively. ",0.13765182186234817,"he present specification, a numerical range expressed using ""to"" is used in a meaning of a range that includes the preceding and succeeding numerical values of ""to"" as the lower limit value and the upper limit value, respectively.",0.13765182186234817,"he present specification, a numerical range expressed using ""to"" is used in a meaning of a range that includes the preceding and succeeding numerical values of ""to"" as the lower limit value and the upper limit value, respectively.",110,patents
-110,6,g [0050] Condition 1: The A value determined by Formula (1) is 0.14 or more. A~([H]x0.04+[C]x 1.0+[N]x2.1 +[O]x30.6+[F]x50. 6+ [S]x 1.5+[I]x39 .5)/([H]x 1 +[C]x 12+[N]x 14+[O]x 16+[F]x19+[S]x32+[I]x127) Formula (1):,False,0.15813953488372093,". [0050] Condition 1: The A value determined by Formula (1) is 0.14 or more.
-
-A=([H]×0.04+[C]×1.0+[N]×2.1+[O]×30.6+[F]×50.6+
-[S]×1.5+[1]×39.5)/([H]x1+[C]x12+[N]x14+[O]×
-16+[F]×19+[S]x32+[I]×127) Formula (1):
-
-[0051]",0.5534883720930233,"[0050] Condition 1: The A value determined by Formula (1) is 0.14 or more.
-
-$$A=\frac{([H]\times 0.04+[C]\times 1.0+[N]\times 2.1+[O]\times 30.6+[F]\times 50.6+[S]\times 1.5+[I]\times 39.5)}{([H]\times 1+[C]\times 1",0.6139534883720931,"
-**[0050]** Condition 1: The $A$ value determined by Formula (1) is 0.14 or more.
-
-$$
-A = \frac{([\text{H}] \times 0.04 + [\text{C}] \times 1.0 + [\text{N}] \times 2.1 + [\text{O}] \times 30.6 + [\text{F}] \times 50",0.18604651162790697,"o.
-
-**[0050]** Condition 1: The A value determined by Formula (1) is 0.14 or more.
-
-A=([H]×0.04+[C]×1.0+[N]×2.1+[O]×30.6+[F]×50.6+[S]×1.5+[I]×39.5)/([H]×1+[C]×12+[N]×14+[O]×16+[F]×19+[S]×32+[I]×127) Formula (1):",0.037209302325581395,"050]** Condition 1: The A value determined by Formula (1) is 0.14 or more.
-
-A~([H]x0.04+[C]x 1.0+[N]x2.1 +[O]x30.6+[F]x50. 6+ [S]x 1.5+[I]x39 .5)/([H]x 1 +[C]x 12+[N]x 14+[O]x 16+[F]x19+[S]x32+[I]x127) Formula (1):",0.13488372093023257,"ndition 1: The A value determined by Formula (1) is 0.14 or more.
-
-## A~([H]x0.04+[C]x 1.0+[N]x2.1 +[O]x30.6+[F]x50. 6+ [S]x 1.5+[I]x39 .5)/([H]x 1 +[C]x 12+[N]x 14+[O]x 16+[F]x19+[S]x32+[I]x127)
-
-Formula (",0.13488372093023257,"ndition 1: The A value determined by Formula (1) is 0.14 or more.
-
-## A~([H]x0.04+[C]x 1.0+[N]x2.1 +[O]x30.6+[F]x50. 6+ [S]x 1.5+[I]x39 .5)/([H]x 1 +[C]x 12+[N]x 14+[O]x 16+[F]x19+[S]x32+[I]x127)
-
-Formula (",110,patents
-110,7,"[0051] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",False,0.0,"[0051] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",0.0026041666666666665,"[0051] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as “the effect of the present invention is more excellent”), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",0.018229166666666668," As described, the $A$ value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as “the effect of the present invention is more excellent”), the $A$ value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the $A$ value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",0.005208333333333333,"051]** As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",0.005208333333333333,"0051]** As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less",0.10416666666666667,"51] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or l",0.10416666666666667,"51] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or l",110,patents
-111,0,"US 9,423,690 B2",False,0.0,"US 9,423,690 B2",0.8666666666666667," 2561(2002), an",0.0,"US 9,423,690 B2",0.0,"US 9,423,690 B2",0.0,"US 9,423,690 B2",0.9333333333333333,". 2561(2002), ",0.9333333333333333,". 2561(2002), ",111,patents
-111,1,"The polar group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) prefer- ably contain a repeating unit having a cyclic carbonate ester structure. The repeating unit having a cyclic carbonate ester struc- ture is preferably the repeating unit represented by Formula (A-1).",False,0.050666666666666665,"polar group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) prefer- ably contain a repeating unit having a cyclic carbonate ester structure.
-
-15
-
-The repeating unit having a cyclic carbonate ester struc- 20
-
-ture is preferably the repeating unit represented by Formula (",0.024,"]
-
-The polar group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) preferably contain a repeating unit having a cyclic carbonate ester structure.
-
-The repeating unit having a cyclic carbonate ester structure is preferably the repeating unit represented by Formula (A-1).",0.024,"
-
-The polar group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) preferably contain a repeating unit having a cyclic carbonate ester structure.
-
-The repeating unit having a cyclic carbonate ester structure is preferably the repeating unit represented by Formula (A-1).
-",0.024,"
-The polar group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) preferably contain a repeating unit having a cyclic carbonate ester structure.
-
-The repeating unit having a cyclic carbonate ester structure is preferably the repeating unit represented by Formula (A-1).
-
-",0.2906666666666667,"
-
-The polar group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) preferably contain a repeating unit having a cyclic carbonate ester structure.
-
-15 a 5-membered ring (nA=2).
-
-The polycyclic group containing -O----C(=O)-Orepresented by Z may, for example, be a structu",0.088,"oup which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) prefer› ably contain a repeating unit having a cyclic carbonate ester structure.
-
-5
-
-10
-
-15
-
-The repeating unit having a cyclic carbonate ester struc› ture is preferably the repeating unit represented by Formula (A-",0.088,"oup which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) prefer› ably contain a repeating unit having a cyclic carbonate ester structure.
-
-5
-
-10
-
-15
-
-The repeating unit having a cyclic carbonate ester struc› ture is preferably the repeating unit represented by Formula (A-",111,patents
-111,2,"In Formula (A-1 ), RA 1 represents a hydrogen atom or an alkyl group. If n is 2 or more, RA 2's each independently represents a substituent. A represents a single bond or a divalent linking group. Z represents a atomic group forming a monocyclid or polycyclic structure together with a group represented by -O----C(=O)-O- in the formula. n represents an integer of 0 or more. Formula (A-1) will be described in detail. ( ) The alkyl group represented by RA 1 may have a substitu- ent such as a fluorine atom. RA 1 represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group. p y y g p The substituent represented by RA 2 is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxycarbonylamino group. The substituent is preferably an alkyl group having 1 to 5 p y y g p g carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and at-butyl group. An alkyl group g p y g p y g p y g p may have a substituent such as a hydroxyl group. n represents the number of substituents, and is an integer of 0 or more. For example, n is preferably Oto 4, and more preferably 0. Examples of the a divalent linking group represented by p g g p p y A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond, an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, and the like. In one aspect of the present invention, A is preferably a single bond, or an alkylene group.",False,0.26416065911431513," more, R²'s each independently represents a If n is 2 or more, R²'s each independently represents a
-
-40 40
-
-A represents a single bond or a divalent linking group.
-
-65 65
-
-Z represents a atomic group forming a monocyclid or polycyclic structure together with a group represented by -O-C(=O)—0— in the formula.
-
-n represents an integer of 0 or more.
-
-Formula (A-1) will be described in detail.
-
-The alkyl group represented by R may have a substitu- ent such as a fluorine atom. R represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group.
-
-The substituent represented by R ² is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxycarbonylamino group. The substituent is preferably an alkyl group having 1 to 5 The substituent is preferably an alkyl group having 1 to 5 carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and a t-butyl group. An alkyl group group, an isobutyl group and a t-butyl group. An alkyl group may have a substituent such as a hydroxyl group.
-
-n represents the number of substituents, and is an integer of 0 or more. For example, n is preferably 0 to 4, and more preferably 0.
-
-50 50
-
-55 55
-
-104
-
-an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, methylene group, an ethylene group, an propylene group, and the like.
-
-5 5
-
-10
-
-In one aspect of the present invention, A is preferably a single bond, or an alkylene group.",0.09423274974253347," $R_A^1$ represents a hydrogen atom or an alkyl group.
-
-If $n$ is 2 or more, $R_A^2$ 's each independently represents a substituent.
-
-A represents a single bond or a divalent linking group.
-
-Z represents an atomic group forming a monocyclid or polycyclic structure together with a group represented by $\text{O}—\text{C}(=\text{O})—\text{O}—$ in the formula.
-
-$n$ represents an integer of 0 or more.
-
-Formula (A-1) will be described in detail.
-
-The alkyl group represented by $R_A^1$ may have a substituent such as a fluorine atom. $R_A^1$ represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group.
-
-The substituent represented by $R_A^2$ is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxy carbonyl amino group. The substituent is preferably an alkyl group having 1 to 5 carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and a t-butyl group. An alkyl group may have a substituent such as a hydroxyl group.
-
-$n$ represents the number of substituents, and is an integer of 0 or more. For example, $n$ is preferably 0 to 4, and more preferably 0.
-
-Examples of the divalent linking group represented by A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond,
-
-an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, a propylene group, and the like.
-
-In one aspect of the present invention, A is preferably a single bond, or an alkylene group.",0.07363542739443872,"up.
-
-In Formula (A-1), $R_A^1$ represents a hydrogen atom or an alkyl group.
-If $n$ is 2 or more, $R_A^2$'s each independently represents a substituent.
-$A$ represents a single bond or a divalent linking group.
-$Z$ represents a atomic group forming a monocyclid or polycyclic structure together with a group represented by $-\ce{O-C(=O)-O}-$ in the formula.
-$n$ represents an integer of 0 or more.
-
-Formula (A-1) will be described in detail.
-
-The alkyl group represented by $R_A^1$ may have a substituent such as a fluorine atom. $R_A^1$ represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group.
-
-The substituent represented by $R_A^2$ is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxycarbonylamino group. The substituent is preferably an alkyl group having 1 to 5 carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and a t-butyl group. An alkyl group may have a substituent such as a hydroxyl group.
-
-$n$ represents the number of substituents, and is an integer of 0 or more. For example, $n$ is preferably 0 to 4, and more preferably 0.
-
-Examples of the a divalent linking group represented by $A$ may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond,
-
-### 104
-
-an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, and the like.
-
-In one aspect of the present invention, $A$ is preferably a single bond, or an alkylene group.
-
-Th",0.11894953656024716,"s a hydrogen atom or an alkyl group.
-
-If n is 2 or more, R42's each independently represents a substituent.
-
-A represents a single bond or a divalent linking group.
-
-Z represents a atomic group forming a monocyclid or polycyclic structure together with a group represented by —O—C(=O)—O— in the formula.
-
-n represents an integer of 0 or more.
-
-Formula (A-1) will be described in detail.
-
-The alkyl group represented by R41 may have a substituent such as a fluorine atom. R41 represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group.
-
-The substituent represented by R42 is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxycarbonylamino group. The substituent is preferably an alkyl group having 1 to 5 carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and a t-butyl group. An alkyl group may have a substituent such as a hydroxyl group.
-
-n represents the number of substituents, and is an integer of 0 or more. For example, n is preferably 0 to 4, and more preferably 0.
-
-Examples of the a divalent linking group represented by A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond,
-
-## 104
-
-an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, and the like.
-
-In one aspect of the present invention, A is preferably a single bond, or an alkylene",0.46343975283213185," Formula (A-1) may be contained either alone or in a combination of two or more thereof.
-
-A represents a single bond or a divalent linking group. Z represents a atomic group forming a monocyclid or polycyclic structure together with a group represented by -O----C(=O)-O- in the formula.
-
-45
-
-Hereinafter, specific examples of the repeating unit having a cyclic carbonate ester structure are shown below, but the present invention is not limited thereto.
-
-n represents an integer of 0 or more.
-
-Formula (A-1) will be described in detail.
-
-The alkyl group represented by _RA_[1 ] may have a substituent such as a fluorine atom. _RA_[1 ] represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group.
-
-In addition, _RA_[1 ] in the following specific examples has the
-
-50 same meaning as RA[1 ] in Formula (A-1).
-
-The substituent represented by _RA_[2 ] is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxycarbonylamino group. The substituent is preferably an alkyl group having 1 to 5 carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and at-butyl group. An alkyl group An alkyl group alkyl group may have a substituent such as a hydroxyl group.
-
-The substituent is preferably an alkyl group having 1 to 5 55
-
-group, an isobutyl group and at-butyl group. An alkyl group An alkyl group alkyl group 60
-
-n represents the number of substituents, and is an integer of 0 or more. For example, n is preferably Oto 4, and more preferably 0.
-
-Examples of the a divalent linking group represented by 65 A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond,
-",0.14572605561277033,"r more, RA 2 's each independently represents a substituent.
-
-A represents a single bond or a divalent linking group. Z represents a atomic group forming a monocyclid or polycyclic structure together with a group represented by
-
--O----C(=O)-O- in the formula.
-
-n represents an integer of 0 or more.
-
-Formula (A-1) will be described in detail.
-
-The alkyl group represented by RA 1 may have a substitu› ent such as a fluorine atom. RA 1 represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group.
-
-The substituent represented by RA 2 is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxycarbonylamino group. The substituent is preferably an alkyl group having 1 to 5 carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and at-butyl group. An alkyl group may have a substituent such as a hydroxyl group.
-
-40
-
-45
-
-50
-
-55
-
-60
-
-n represents the number of substituents, and is an integer of 0 or more. For example, n is preferably Oto 4, and more preferably 0.
-
-Examples of the a divalent linking group represented by 65 A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond, an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, and the like.
-
-In one aspect of the present invention, A is preferably a single bond, or an alkylene group.",0.14572605561277033,"r more, RA 2 's each independently represents a substituent.
-
-A represents a single bond or a divalent linking group. Z represents a atomic group forming a monocyclid or polycyclic structure together with a group represented by
-
--O----C(=O)-O- in the formula.
-
-n represents an integer of 0 or more.
-
-Formula (A-1) will be described in detail.
-
-The alkyl group represented by RA 1 may have a substitu› ent such as a fluorine atom. RA 1 represents preferably a hydrogen atom, a methyl group or a trifluormethyl group, and more preferably a methyl group.
-
-The substituent represented by RA 2 is, for example, an alkyl group, a cycloalkyl group, a hydroxyl group, an alkoxy group, an amino group and an alkoxycarbonylamino group. The substituent is preferably an alkyl group having 1 to 5 carbon atoms, for example, a straight alkyl group having 1 to 5 carbon atoms such as a methyl group, an ethyl group, a propyl group and a butyl group; and a branched alkyl group having 3 to 5 carbon atoms such as an isopropyl group, an isobutyl group and at-butyl group. An alkyl group may have a substituent such as a hydroxyl group.
-
-40
-
-45
-
-50
-
-55
-
-60
-
-n represents the number of substituents, and is an integer of 0 or more. For example, n is preferably Oto 4, and more preferably 0.
-
-Examples of the a divalent linking group represented by 65 A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond, an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, and the like.
-
-In one aspect of the present invention, A is preferably a single bond, or an alkylene group.",111,patents
-112,0,US 2012/0003590 Al,False,0.0,US 2012/0003590 Al,0.8333333333333334,"m 1,000 to 3,000 r",0.05555555555555555,US 2012/0003590 A,0.05555555555555555,US 2012/0003590 A1,0.0,US 2012/0003590 Al,0.8333333333333334,"om 1,000 to 3,000 ",0.8333333333333334,"om 1,000 to 3,000 ",112,patents
-112,1,100,False,0.0,100,0.6666666666666666,008,0.0,100,0.0,100,0.0,100,0.3333333333333333,101,0.3333333333333333,101,112,patents
-112,2,"Jan. 5, 2012",False,0.0,"Jan. 5, 2012",0.75,0.02 to 0.1 ,0.0,"Jan. 5, 2012",0.0,"Jan. 5, 2012",0.0,"Jan. 5, 2012",0.75,0.1 to 20 ,0.75,0.1 to 20 ,112,patents
-112,3,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",False,0.0,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",0.0,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",0.0,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",0.0,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",0.030534351145038167,"0480]** Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above",0.10687022900763359,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film",0.10687022900763359,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film",112,patents
-112,4,"[0481] The composition of the present invention is typi- cally used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.",False,0.015306122448979591,"
-[0481] The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.",0.02040816326530612,"
-
-[0481] The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.",0.02040816326530612,"[0481] The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.
-
-",0.02040816326530612,"
-
-[0481] The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.",0.02040816326530612,"[0481]** The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.",0.025510204081632654,"0481] The composition of the present invention is typi› cally used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film",0.025510204081632654,"0481] The composition of the present invention is typi› cally used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film",112,patents
-112,5,"[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a sub- strate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.",False,0.014084507042253521,"
-[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.",0.1267605633802817,"0482] The thickness of the film is preferably from 0.02 to 0.1 $\mu\text{m}$ . The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to ",0.018779342723004695,"[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.
-
-",0.018779342723004695,"
-
-[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.",0.018779342723004695,"[0482]** The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.",0.07981220657276995,"The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a sub› strate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm",0.07981220657276995,"The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a sub› strate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm",112,patents
-112,6,"[0483] For example, the composition is coated on such a substrate ( e.g., silicon/silicon dioxide-coated substrate, sili- con nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray- sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antire- flection film may be previously provided by coating.",False,0.034545454545454546,"0483] For example, the composition is coated on such a [ ]
-substrate (e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used
-in the production of a precision integrated circuit device, an
-imprint mold or the like, by using a spinner, a coater or the
-like. Thereafter, the coating is dried to obtain an actinic raysensitive or radiation-sensitive film (hereinafter, sometimes
-
-referred to as a ""resist film""). Incidentally, a known antireflection film may be previously provided by coating",0.02181818181818182,"pm.
-
-[0483] For example, the composition is coated on such a substrate (e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray-sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antireflection film may be previously provided by coating.
-",0.025454545454545455,"rpm.
-
-[0483] For example, the composition is coated on such a substrate (e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray-sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a “resist film”). Incidentally, a known antireflection film may be previously provided by coating.",0.02181818181818182,"[0483] For example, the composition is coated on such a substrate (e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray-sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antireflection film may be previously provided by coating.
-
-[048",0.02181818181818182,"
-**[0483]** For example, the composition is coated on such a substrate ( e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic raysensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antireflection film may be previously provided by coating. ",0.04909090909090909,"483] For example, the composition is coated on such a substrate ( e.g., silicon/silicon dioxide-coated substrate, sili› con nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray› sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antire› flection film may be previously provided b",0.04909090909090909,"483] For example, the composition is coated on such a substrate ( e.g., silicon/silicon dioxide-coated substrate, sili› con nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray› sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antire› flection film may be previously provided b",112,patents
-112,7,"[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008- 162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion•Application Development of Nanoimprint-Sub- strate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan"".",False,0.006185567010309278,"[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008- 162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan"".
-",0.041237113402061855,"0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008-162101, and ""Yoshihiko Hirai (compiler), *Nanoimprint no Kiso to Gijutsu Kaihatsu*•*Oyo Tenkai*-*Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai* (*Basic and Technology Expansion*•*Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion*), Frontier Shu",0.018556701030927835,"
-[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008-162101, and “Yoshihiko Hirai (compiler), *Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai—Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai* (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan”.",0.012371134020618556,".
-
-[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008-162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan"".",0.016494845360824743,"[0491]** Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008162101, and ""Yoshihiko Hirai (compiler), _Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion),_ Frontier Shuppan"".",0.08041237113402062,"an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu·Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion·Application Development of Nanoimprint-Sub› strate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppa",0.08041237113402062,"an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu·Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion·Application Development of Nanoimprint-Sub› strate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppa",112,patents
-112,8,EXAMPLES,False,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,112,patents
-113,0,"US 6,482,565 Bl",False,0.06666666666666667,"US 6,482,565 B",1.0," 250-ml flask, ",0.13333333333333333," US 6,482,565 B",0.13333333333333333,"
-US 6,482,565 B",0.26666666666666666," 6,482,565 **Bl",0.9333333333333333,a 250-ml flas,0.9333333333333333,a 250-ml flas,113,patents
-113,1,7,False,0.0,7,0.0,7,0.0,7,0.0,7,0.0,7,0.0,7,0.0,7,113,patents
-113,2,"Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was p generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure com- pound represented by following Chemical Formula 6a (yield: 45%).",False,0.008547008547008548,"
-Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was 5 generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure compound represented by following Chemical Formula 6a (yield: 45%).",0.01282051282051282,"
-
-Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure compound represented by following Chemical Formula 6a (yield: 45%).",0.017094017094017096,"1
-
-Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure compound represented by following Chemical Formula 6a (yield: 45%).
-",0.017094017094017096,"
-Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure compound represented by following Chemical Formula 6a (yield: 45%).
-
-<",0.017094017094017096,".
-
-Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure compound represented by following Chemical Formula 6a (yield: 45%).",0.17735042735042736,"hus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure com› pound represented by following Chemical",0.17735042735042736,"hus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure com› pound represented by following Chemical",113,patents
-113,3,,False,0.0,,0.0,,0.09523809523809523, Chemical Formula 6a ,0.0,,0.0,,0.19047619047619047,Chemical Formula 6a,0.19047619047619047,Chemical Formula 6a,113,patents
-113,4,"As the reaction catalyst, an acid such as trifluoromethane- sulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",False,0.14705882352941177,"onic acid, hydrochloric acid or boron trifluoride-etherate sulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.
-",0.014705882352941176,"As the reaction catalyst, an acid such as trifluoromethanesulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.
-
-",0.014705882352941176,"
-
-As the reaction catalyst, an acid such as trifluoromethanesulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",0.014705882352941176,"
-
-As the reaction catalyst, an acid such as trifluoromethanesulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",0.014705882352941176,"
-
-As the reaction catalyst, an acid such as trifluoromethanesulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",0.003676470588235294,"As the reaction catalyst, an acid such as trifluoromethane› sulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",0.003676470588235294,"As the reaction catalyst, an acid such as trifluoromethane› sulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",113,patents
-113,5,"EXAMPLE 2 The procedure according to Example I was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%).",False,0.05699481865284974,"AMPLE 2
-
-25
-
-The procedure according to Example I was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45",0.02072538860103627,"EXAMPLE 2
-
-The procedure according to Example 1 was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%)",0.02072538860103627,"XAMPLE 2
-
-The procedure according to Example 1 was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%).",0.02072538860103627,"XAMPLE 2
-
-The procedure according to Example 1 was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%).",0.06735751295336788,"*
-
-> The procedure according to Example I was repeated but
-
-> using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%).",0.05699481865284974,"MPLE 2
-
-The procedure according to Example I was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%",0.05699481865284974,"MPLE 2
-
-The procedure according to Example I was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%",113,patents
-114,0,US 2020/0050106 Al,False,0.0,US 2020/0050106 Al,0.7777777777777778,ly 0.001% to 10% b,0.05555555555555555,US 2020/0050106 A,0.1111111111111111,"
-US 2020/0050106 A",0.0,US 2020/0050106 Al,0.7777777777777778, 0.001 % to 10% by,0.7777777777777778, 0.001 % to 10% by,114,patents
-114,1,40,False,0.0,40,0.0,40,0.0,40,0.0,40,0.0,40,0.0,40,0.0,40,114,patents
-114,2,-continued,False,0.3, contained,0.0,-continued,0.0,-continued,0.0,-continued,0.4,contained ,0.3, contained,0.3, contained,114,patents
-114,3,"Feb. 13, 2020",False,0.0,"Feb. 13, 2020",0.7692307692307693," 5.0 to 200, ",0.0,"Feb. 13, 2020",0.0,"Feb. 13, 2020",0.0,"Feb. 13, 2020",0.8461538461538461,".0 to 200, ",0.8461538461538461,".0 to 200, ",114,patents
-114,4,"[0397] The content of the acid diffusion control agent in the resist composition is preferably 0.001 % to 10% by mass, and more preferably 0.01 % to 5% by mass with respect to the total solid content of the composition.",False,0.0,"[0397] The content of the acid diffusion control agent in the resist composition is preferably 0.001 % to 10% by mass, and more preferably 0.01 % to 5% by mass with respect to the total solid content of the composition.",0.0182648401826484,"[0397]** The content of the acid diffusion control agent in the resist composition is preferably 0.001% to 10% by mass, and more preferably 0.01% to 5% by mass with respect to the total solid content of the composition.",0.0182648401826484,"
-
-[0397] The content of the acid diffusion control agent in the resist composition is preferably 0.001% to 10% by mass, and more preferably 0.01% to 5% by mass with respect to the total solid content of the composition.",0.0182648401826484,"[0397]** The content of the acid diffusion control agent in the resist composition is preferably 0.001% to 10% by mass, and more preferably 0.01% to 5% by mass with respect to the total solid content of the composition.",0.0182648401826484,"0397]** The content of the acid diffusion control agent in the resist composition is preferably 0.001 % to 10% by mass, and more preferably 0.01 % to 5% by mass with respect to the total solid content of the composition",0.0182648401826484,"397] The content of the acid diffusion control agent in the resist composition is preferably 0.001 % to 10% by mass, and more preferably 0.01 % to 5% by mass with respect to the total solid content of the composition.",0.0182648401826484,"397] The content of the acid diffusion control agent in the resist composition is preferably 0.001 % to 10% by mass, and more preferably 0.01 % to 5% by mass with respect to the total solid content of the composition.",114,patents
-114,5,[0398] The acid diffusion control agents may be used alone or in combination of two or more kinds thereof.,False,0.0,[0398] The acid diffusion control agents may be used alone or in combination of two or more kinds thereof.,0.03773584905660377,[0398]** The acid diffusion control agents may be used alone or in combination of two or more kinds thereo,0.0,[0398] The acid diffusion control agents may be used alone or in combination of two or more kinds thereof.,0.03773584905660377,398]** The acid diffusion control agents may be used alone or in combination of two or more kinds thereof.,0.03773584905660377,[0398]** The acid diffusion control agents may be used alone or in combination of two or more kinds thereo,0.1509433962264151,98] The acid diffusion control agents may be used alone or in combination of two or more kinds the,0.1509433962264151,98] The acid diffusion control agents may be used alone or in combination of two or more kinds the,114,patents
-114,6,"[0399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is pref- erably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffu- sion control agent (molar ratio) is more preferably 5 .0 to 200, and still more preferably 7.0 to 150.",False,0.009345794392523364,"[0399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5 .0 to 200, and still more preferably 7.0 to 150.
-
-",0.01557632398753894,"*[0399]** The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5.0 to 200, and still more preferably 7.0 to 150.
-
-",0.01557632398753894,"
-
-[0399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5.0 to 200, and still more preferably 7.0 to 150.
-
-[",0.01557632398753894,"
-**[0399]** The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5.0 to 200, and still more preferably 7.0 to 150.",0.012461059190031152,"**[0399]** The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5 .0 to 200, and still more preferably 7.0 to 150.",0.102803738317757,"399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is pref› erably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffu› sion control agent (molar ratio) is more preferably 5 .0 to 200, and sti",0.102803738317757,"399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is pref› erably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffu› sion control agent (molar ratio) is more preferably 5 .0 to 200, and sti",114,patents
-114,7,"[0400] Examples of the acid diffusion control agent include the compounds (amine compounds, amido group- containing compounds, urea compounds, nitrogen-contain- ing heterocyclic compounds, and the like) described m paragraphs <0140> to <0144> of JP2013-011833A.",False,0.022988505747126436,"
-[0400] Examples of the acid diffusion control agent include the compounds (amine compounds, amido groupcontaining compounds, urea compounds, nitrogen-containing heterocyclic compounds, and the like) described m paragraphs <0140> to <0144> of JP2013-011833A.
-",0.02681992337164751,"[0400]** Examples of the acid diffusion control agent include the compounds (amine compounds, amido group-containing compounds, urea compounds, nitrogen-containing heterocyclic compounds, and the like) described in paragraphs <0140> to <0144> of JP2013-011833A.",0.02681992337164751,"[0400] Examples of the acid diffusion control agent include the compounds (amine compounds, amido group-containing compounds, urea compounds, nitrogen-containing heterocyclic compounds, and the like) described in paragraphs <0140> to <0144> of JP2013-011833A.
-
-",0.02681992337164751,"[0400]** Examples of the acid diffusion control agent include the compounds (amine compounds, amido group-containing compounds, urea compounds, nitrogen-containing heterocyclic compounds, and the like) described in paragraphs <0140> to <0144> of JP2013-011833A.",0.03065134099616858,"**[0400]** Examples of the acid diffusion control agent include the compounds (amine compounds, amido groupcontaining compounds, urea compounds, nitrogen-containing heterocyclic compounds, and the like) described m paragraphs <0140> to <0144> of JP2013-011833A.",0.1724137931034483,"400] Examples of the acid diffusion control agent include the compounds (amine compounds, amido group› containing compounds, urea compounds, nitrogen-contain› ing heterocyclic compounds, and the like) described m paragraphs <0140> to <0144",0.1724137931034483,"400] Examples of the acid diffusion control agent include the compounds (amine compounds, amido group› containing compounds, urea compounds, nitrogen-contain› ing heterocyclic compounds, and the like) described m paragraphs <0140> to <0144",114,patents
-114,8,[0401] <(E) Hydrophobic Resin>,False,0.06666666666666667,0401] <(E) Hydrophobic Resin>,0.13333333333333333,401]** <(E) Hydrophobic Resin>,0.4666666666666667,"# (E) Hydrophobic Resin
-
-[0402",0.13333333333333333,[0401]** <(E) Hydrophobic Resi,0.13333333333333333,[0401]** <(E) Hydrophobic Resi,0.3,01] <(E) Hydrophobic Resin,0.3,01] <(E) Hydrophobic Resin,114,patents
-114,9,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A).",False,0.0,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A).",0.03418803418803419,"[0402]** The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A",0.0,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A).",0.03418803418803419,"402]** The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A).",0.03418803418803419,"0402]** The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A)",0.017094017094017096,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A)",0.017094017094017096,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A)",114,patents
-114,10,"[0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar materials.",False,0.0,"[0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar materials.",0.012084592145015106,"[0403]** Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar material",0.0,"[0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar materials.",0.012084592145015106,"[0403]** Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar material",0.012084592145015106,"[0403]** Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar material",0.10876132930513595,"0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and no",0.10876132930513595,"0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and no",114,patents
-114,11,[0404] Examples of the effect of addition of the hydro- phobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.,False,0.014634146341463415,"
-[0404] Examples of the effect of addition of the hydrophobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.",0.01951219512195122,[0404]** Examples of the effect of addition of the hydrophobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.,0.01951219512195122,"
-[0404] Examples of the effect of addition of the hydrophobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.
-",0.01951219512195122,[0404]** Examples of the effect of addition of the hydrophobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.,0.01951219512195122,[0404]** Examples of the effect of addition of the hydrophobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.,0.07317073170731707,04] Examples of the effect of addition of the hydro› phobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out ,0.07317073170731707,04] Examples of the effect of addition of the hydro› phobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out ,114,patents
-115,0,EP 1 499 943 B1,False,0.0,EP 1 499 943 B1,0.8," 1, wobei das B",0.0,EP 1 499 943 B1,0.0,EP 1 499 943 B1,0.0,EP 1 499 943 B1,0.8,"l (130, 134) ",0.8,"l (130, 134) ",115,patents
-115,1,"der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, wobei das Computersystem eine Energieversorgung auf- weist, die eine Batterie beinhaltet; Bestimmen (404), ob das Ereignis ein vom Be- nutzer eingeleitetes Ereignis oder ein von Soft- ware eingeleitetes Ereignis ist; wenn das Ereignis ein vom Benutzer eingelei- tetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Perfor- mance-Zustand in den dritten Performance-Zu- stand, wenn das Ereignis ein von Software eingeleite- tes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten Performance-Zu- stand in den zweiten Performance-Zustand.",False,0.033566433566433566,"
-
-18
-
-der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, wobei das Computersystem eine Energieversorgung aufweist, die eine Batterie beinhaltet; Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; wenn das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand, wenn das Ereignis ein von Software eingeleitetes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand.
-
-",0.033566433566433566,"
-
-der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, wobei das Computersystem eine Energieversorgung aufweist, die eine Batterie beinhaltet;
-
-Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;
-
-wenn das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand,
-
-wenn das Ereignis ein von Software eingeleitetes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand.",0.04895104895104895,"943 B1 18
-
-der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, wobei das Computersystem eine Energieversorgung aufweist, die eine Batterie beinhaltet;
-Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;
-wenn das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand,
-wenn das Ereignis ein von Software eingeleitetes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand.
-
-2. ",0.04895104895104895," 18
-
-der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, wobei das Computersystem eine Energieversorgung aufweist, die eine Batterie beinhaltet;
-
-Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;
-
-wenn das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand,
-
-wenn das Ereignis ein von Software eingeleitetes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand.
-
-**2.",0.606993006993007," dem ersten Performance-Zustand in ware eingeleitetes Ereignis ist; den zweiten Performance-Zustand auf Basis wenn das Ereignis ein vom Benutzer eingeleides Detektierens, dass das Ereignis ein von tetes Ereignis ist, direktes Versetzen (406) der 10 Software eingeleitetes Ereignis ist. integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zu- **8.** Vorrichtung nach Anspruch 7, ferner umfassend: stand, wenn das Ereignis ein von Software eingeleiteMittel (134) zum Ändern der Betriebsfrequenz tes Ereignis ist, Versetzen (408) der integrierten 15 der integrierten Schaltung (112), um den PerSchaltung aus dem ersten Performance-Zuformance-Zustand der integrierten Schaltung zu stand",0.06433566433566433,"erste Performance- Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, wobei das Computersystem eine Energieversorgung aufweist, die eine Batterie beinhaltet;
-
-Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;
-
-wenn das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand, wenn das Ereignis ein von Software eingeleitetes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten PerformanceZustand in den zweiten Performance-Zustand",0.06433566433566433,"erste Performance- Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, wobei das Computersystem eine Energieversorgung aufweist, die eine Batterie beinhaltet;
-
-Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;
-
-wenn das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand, wenn das Ereignis ein von Software eingeleitetes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten PerformanceZustand in den zweiten Performance-Zustand",115,patents
-115,2,"2. Verfahren nach Anspruch 1, wobei das Benutzerer- eignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrie- ben wird. 3. Verfahren nach Anspruch 1, wobei direktes Verset- zen das Versetzen ohne Verzögerung ist.",False,0.03968253968253968,"
-2. Verfahren nach Anspruch 1, wobei das Benutzerereignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrieben wird.
-
-3. Verfahren nach Anspruch 1, wobei direktes Versetzen das Versetzen ohne Verzögerung ist.
-",0.051587301587301584,"
-2. Verfahren nach Anspruch 1, wobei das Benutzerereignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrieben wird.
-
-3. Verfahren nach Anspruch 1, wobei direktes Versetzen das Versetzen ohne Verzögerung ist.
-
-4.",0.051587301587301584,"
-
-2. Verfahren nach Anspruch 1, wobei das Benutzerereignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrieben wird.
-
-3. Verfahren nach Anspruch 1, wobei direktes Versetzen das Versetzen ohne Verzögerung ist.
-",0.05952380952380952,".** Verfahren nach Anspruch 1, wobei das Benutzerereignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrieben wird.
-
-**3.** Verfahren nach Anspruch 1, wobei direktes Versetzen das Versetzen ohne Verzögerung ist.",0.2896825396825397,"2.** Verfahren nach Anspruch 1, wobei das Benutzerereignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrieben wird.
-
-**9.** Vorrichtung nach Anspruch 7, ferner umfassend: 20
-
-Mittel (130) zum Ändern des Betri",0.07539682539682539,"2. Verfahren nach Anspruch 1, wobei das Benutzerereignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrieben wird.
-3. Verfahren nach Anspruch 1, wobei direktes Versetzen das Versetzen ohne Verzögerung i",0.07539682539682539,"2. Verfahren nach Anspruch 1, wobei das Benutzerereignis durch eine Programmierumgebung definiert ist, innerhalb welcher das Computersystem betrieben wird.
-3. Verfahren nach Anspruch 1, wobei direktes Versetzen das Versetzen ohne Verzögerung i",115,patents
-115,3,"4. Verfahren nach Anspruch 1, ferner umfassend: Betreiben der integrierten Schaltung in einem dritten Performance-Zustand für einen vorher- bestimmten Zeitrum auf Basis von thermischen Überlegungen, um in einem dritten Perfor- mance-Zustand ausfallfrei funktionieren.",False,0.026217228464419477,"
-4. Verfahren nach Anspruch 1, ferner umfassend:
-
-Betreiben der integrierten Schaltung in einem dritten Performance-Zustand für einen vorherbestimmten Zeitrum auf Basis von thermischen Überlegungen, um in einem dritten Performance-Zustand ausfallfrei funktionieren.",0.033707865168539325,"
-4. Verfahren nach Anspruch 1, ferner umfassend:
-
-Betreiben der integrierten Schaltung in einem dritten Performance-Zustand für einen vorherbestimmten Zeitraum auf Basis von thermischen Überlegungen, um in einem dritten Performance-Zustand ausfallfrei funktionieren.
-",0.0449438202247191," Verfahren nach Anspruch 1, ferner umfassend:
- Betreiben der integrierten Schaltung in einem dritten Performance-Zustand für einen vorherbestimmten Zeitraum auf Basis von thermischen Überlegungen, um in einem dritten Performance-Zustand ausfallfrei funktionieren.
-",0.033707865168539325,"4.** Verfahren nach Anspruch 1, ferner umfassend:
-
-Betreiben der integrierten Schaltung in einem dritten Performance-Zustand für einen vorherbestimmten Zeitrum auf Basis von thermischen Überlegungen, um in einem dritten Performance-Zustand ausfallfrei funktionieren.
-",0.5393258426966292,"rfahren nach Anspruch 1, ferner umfassend: fassend: Betreiben der integrierten Schaltung in einem ein computerlesbares Medium; und dritten Performance-Zustand für einen vorher30 ein im computerlesbaren Medium gespeicherbestimmten Zeitrum auf Basis von thermischen tes",0.09737827715355805,"rfahren nach Anspruch 1, ferner umfassend:
-
-30 Betreiben der integrierten Schaltung in einem dritten Performance-Zustand für einen vorherbestimmten Zeitrum auf Basis von thermischen Überlegungen, um in einem dritten Performance-Zustand ausfallfrei funktionie",0.09737827715355805,"rfahren nach Anspruch 1, ferner umfassend:
-
-30 Betreiben der integrierten Schaltung in einem dritten Performance-Zustand für einen vorherbestimmten Zeitrum auf Basis von thermischen Überlegungen, um in einem dritten Performance-Zustand ausfallfrei funktionie",115,patents
-115,4,"5. Verfahren nach Anspruch 4, wobei das Computer- system ein Laptop-Computer ist.",False,0.037037037037037035,"
-5. Verfahren nach Anspruch 4, wobei das Computersystem ein Laptop-Computer ist.",0.04938271604938271,"
-
-5. Verfahren nach Anspruch 4, wobei das Computersystem ein Laptop-Computer ist.",0.04938271604938271,"5. Verfahren nach Anspruch 4, wobei das Computersystem ein Laptop-Computer ist.
-",0.04938271604938271,"5.** Verfahren nach Anspruch 4, wobei das Computersystem ein Laptop-Computer ist.",0.04938271604938271,"5.** Verfahren nach Anspruch 4, wobei das Computersystem ein Laptop-Computer ist.",0.04938271604938271,"
-
-5. Verfahren nach Anspruch 4, wobei das Computersystem ein Laptop-Computer ist.",0.04938271604938271,"
-
-5. Verfahren nach Anspruch 4, wobei das Computersystem ein Laptop-Computer ist.",115,patents
-115,5,"6. Verfahren nach Anspruch 1, wobei das Computer- system ein persönlicher digitaler Assistent ist.",False,0.030612244897959183,"
-6. Verfahren nach Anspruch 1, wobei das Computersystem ein persönlicher digitaler Assistent ist.",0.04081632653061224,"
-
-6. Verfahren nach Anspruch 1, wobei das Computersystem ein persönlicher digitaler Assistent ist.",0.04081632653061224,"
-6. Verfahren nach Anspruch 1, wobei das Computersystem ein persönlicher digitaler Assistent ist.",0.04081632653061224,"6.** Verfahren nach Anspruch 1, wobei das Computersystem ein persönlicher digitaler Assistent ist.",0.04081632653061224,"6.** Verfahren nach Anspruch 1, wobei das Computersystem ein persönlicher digitaler Assistent ist.",0.04081632653061224,"6. Verfahren nach Anspruch 1, wobei das Computersystem ein persönlicher digitaler Assistent ist.
-7",0.04081632653061224,"6. Verfahren nach Anspruch 1, wobei das Computersystem ein persönlicher digitaler Assistent ist.
-7",115,patents
-115,6,"7. Vorrichtung, umfassend: Mittel (136) zum Detektieren eines vom Benut- zer eingeleitetes Ereignisses oder eines von Software eingeleitetes Ereignisses in einem Computersystem; wobei das Computersystem eine integrierte Schaltung (112) mit mehreren Performance-Zu- ständen beinhaltet einschließlich eines ersten Performance-Zustandes, eines zweiten Perfor- mance-Zustands, der höher als der erste Per- formance-Zustand ist, und eines dritten Perfor- mance-Zustandes, der höher als der zweite Per- formance-Zustand ist; Mittel zum Bestimmen, ob ein detektiertes Er- eignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; und Mittel (130, 134) zum direkten Versetzen des integrierten Schaltung aus dem ersten Perfor- mance-Zustand in den dritten Performance-Zu- stand auf Basis des Detektierens, dass das Er- eignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schal- tung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein von Software eingeleitetes Ereignis ist.",False,0.07664562669071236,"Mittel (136) zum Detektieren eines vom Benutzer eingeleitetes Ereignisses oder eines von Software eingeleitetes Ereignisses in einem Computersystem; wobei das Computersystem eine integrierte Schaltung (112) mit mehreren Performance-Zuständen beinhaltet einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist; Mittel zum Bestimmen, ob ein detektiertes Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; und
-
-Mittel (130, 134) zum direkten Versetzen des integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein von Software eingeleitetes Ereignis ist.",0.045987376014427414,"stent ist.
-
-7. Vorrichtung, umfassend:
-
-Mittel (136) zum Detektieren eines vom Benutzer eingeleiteten Ereignisses oder eines von Software eingeleiteten Ereignisses in einem Computersystem;
-
-wobei das Computersystem eine integrierte Schaltung (112) mit mehreren Performance-Zuständen beinhaltet einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist;
-
-Mittel zum Bestimmen, ob ein detektiertes Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; und
-
-Mittel (130, 134) zum direkten Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein von Software eingeleitetes Ereignis ist.
-
-8. V",0.03967538322813345,"st.
-
-7. Vorrichtung, umfassend:
- Mittel (136) zum Detektieren eines vom Benutzer eingeleitetes Ereignisses oder eines von Software eingeleitetes Ereignisses in einem Computersystem;
- wobei das Computersystem eine integrierte Schaltung (112) mit mehreren Performance-Zuständen beinhaltet einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist;
- Mittel zum Bestimmen, ob ein detektiertes Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; und
- Mittel (130, 134) zum direkten Versetzen des integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein von Software eingeleitetes Ereignis ist.",0.04328223624887286,"ist.
-
-**7.** Vorrichtung, umfassend:
-
-Mittel (136) zum Detektieren eines vom Benutzer eingeleitetes Ereignisses oder eines von Software eingeleitetes Ereignisses in einem Computersystem;
-
-wobei das Computersystem eine integrierte Schaltung (112) mit mehreren Performance-Zuständen beinhaltet einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist;
-
-Mittel zum Bestimmen, ob ein detektiertes Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; und
-
-Mittel (130, 134) zum direkten Versetzen des integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein von Software eingeleitetes Ereignis ist.
-
-**8.**",0.4418394950405771,"nce-Zustand auf Basis wenn das Ereignis ein vom Benutzer eingeleides Detektierens, dass das Ereignis ein von tetes Ereignis ist, direktes Versetzen (406) der 10 Software eingeleitetes Ereignis ist. integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zu- **8.** Vorrichtung nach Anspruch 7, ferner umfassend: stand, wenn das Ereignis ein von Software eingeleiteMittel (134) zum Ändern der Betriebsfrequenz tes Ereignis ist, Versetzen (408) der integrierten 15 der integrierten Schaltung (112), um den PerSchaltung aus dem ersten Performance-Zuformance-Zustand der integrierten Schaltung zu stand in den zweiten Performance-Zustand. ändern.
-
-Mittel (130, 134) zum direkten Versetzen des integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein von Software eingeleitetes Ereignis ist.",0.13976555455365194,". Vorrichtung, umfassend:
-
-Mittel (136) zum Detektieren eines vom Benutzer eingeleitetes Ereignisses oder eines von Software eingeleitetes Ereignisses in einem Computersystem;
-
-35
-
-40
-
-45
-
-50
-
-wobei das Computersystem eine integrierte Schaltung (112) mit mehreren Performance-Zuständen beinhaltet einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist;
-
-Mittel zum Bestimmen, ob ein detektiertes Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; und
-
-55
-
-18
-
-Mittel (130, 134) zum direkten Versetzen des integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das",0.13976555455365194,". Vorrichtung, umfassend:
-
-Mittel (136) zum Detektieren eines vom Benutzer eingeleitetes Ereignisses oder eines von Software eingeleitetes Ereignisses in einem Computersystem;
-
-35
-
-40
-
-45
-
-50
-
-wobei das Computersystem eine integrierte Schaltung (112) mit mehreren Performance-Zuständen beinhaltet einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist;
-
-Mittel zum Bestimmen, ob ein detektiertes Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; und
-
-55
-
-18
-
-Mittel (130, 134) zum direkten Versetzen des integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens, dass das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, oder zum Versetzen der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand auf Basis des Detektierens, dass das",115,patents
-115,7,"8. Vorrichtung nach Anspruch 7, ferner umfassend: Mittel (134) zum Ändern der Betriebsfrequenz der integrierten Schaltung (112), um den Per- formance-Zustand der integrierten Schaltung zu ändern.",False,0.14358974358974358,"8. Vorrichtung nach Anspruch 7, ferner umfassend:
-
-20
-
-25
-
-30
-
-Mittel (134) zum Ändern der Betriebsfrequenz der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltun",0.02564102564102564,"
-8. Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (134) zum Ändern der Betriebsfrequenz der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern.",0.041025641025641026," Vorrichtung nach Anspruch 7, ferner umfassend:
- Mittel (134) zum Ändern der Betriebsfrequenz der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern.",0.035897435897435895,"8.** Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (134) zum Ändern der Betriebsfrequenz der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern",0.1641025641025641,"htung nach Anspruch 7, ferner umfassend: 20
-
-Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern",0.15897435897435896,"8. Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (134) zum Ändern der Betriebsfrequenz der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltu",0.15897435897435896,"8. Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (134) zum Ändern der Betriebsfrequenz der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltu",115,patents
-115,8,"9. Vorrichtung nach Anspruch 7, ferner umfassend: Mittel (130) zum Ändern des Betriebsspan- nungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern.",False,0.019801980198019802,"9. Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern.",0.024752475247524754,"9. Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern.
-",0.039603960396039604," Vorrichtung nach Anspruch 7, ferner umfassend:
- Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern.",0.034653465346534656,"9.** Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern",0.04950495049504951," Vorrichtung nach Anspruch 7, ferner umfassend: 20
-
-Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ändern",0.09405940594059406,". Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ä",0.09405940594059406,". Vorrichtung nach Anspruch 7, ferner umfassend:
-
-Mittel (130) zum Ändern des Betriebsspannungspegels der integrierten Schaltung (112), um den Performance-Zustand der integrierten Schaltung zu ä",115,patents
-115,9,"10. Vorrichtung nach einem der Ansprüche 7 bis 9, um- fassend: ein computerlesbares Medium; und ein im computerlesbaren Medium gespeicher- tes Programm zum Managen des Energiever- brauchs innerhalb der integrierten Schaltung, dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten Schaltung (112) aus dem ersten Performance- Zustand in den dritten Performance-Zustand auf Basis des Detektierens eines Benutzerereignis- ses.",False,0.033185840707964605,"
-10. Vorrichtung nach einem der Ansprüche 7 bis 9, umfassend:
-
- - ein computerlesbares Medium; und ein im computerlesbaren Medium gespeichertes Programm zum Managen des Energieverbrauchs innerhalb der integrierten Schaltung, dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten Schaltung (112) aus dem ersten PerformanceZustand in den dritten Performance-Zustand auf Basis des Detektierens eines Benutzerereignisses.",0.0420353982300885,".
-
-10. Vorrichtung nach einem der Ansprüche 7 bis 9, umfassend:
-
-ein computerlesbares Medium; und
-ein im computerlesbaren Medium gespeichertes Programm zum Managen des Energieverbrauchs innerhalb der integrierten Schaltung, dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten Schaltung (112) aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens eines Benutzerereignisses.
-
-1",0.03982300884955752,"
-10. Vorrichtung nach einem der Ansprüche 7 bis 9, umfassend:
- ein computerlesbares Medium; und
- ein im computerlesbaren Medium gespeichertes Programm zum Managen des Energieverbrauchs innerhalb der integrierten Schaltung, dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten Schaltung (112) aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens eines Benutzerereignisses.",0.04424778761061947,"
-**10.** Vorrichtung nach einem der Ansprüche 7 bis 9, umfassend:
-
-ein computerlesbares Medium; und
-
-ein im computerlesbaren Medium gespeichertes Programm zum Managen des Energieverbrauchs innerhalb der integrierten Schaltung, dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten Schaltung (112) aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens eines Benutzerereignisses.
-
-",0.5663716814159292,"gen des EnergieverÜberlegungen, um in einem dritten Perforbrauchs innerhalb der integrierten Schaltung, mance-Zustand ausfallfrei funktionieren. dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten **5.** Verfahren nach Anspruch 4, wobei das Computer35 Schaltung (112) aus dem ersten Performancesystem ein Laptop-Computer ist. Zustand in den dritten Performance-Zustand auf Basis des Detektierens eines Benutzerereignis- ",0.11283185840707964,"10. Vorrichtung nach einem der Ansprüche 7 bis 9, umfassend:
-
-ein computerlesbares Medium; und ein im computerlesbaren Medium gespeichertes Programm zum Managen des Energieverbrauchs innerhalb der integrierten Schaltung, dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten Schaltung (112) aus dem ersten PerformanceZustand in den dritten PerformanceZustand auf Basis des Detektierens eines Benutz",0.11283185840707964,"10. Vorrichtung nach einem der Ansprüche 7 bis 9, umfassend:
-
-ein computerlesbares Medium; und ein im computerlesbaren Medium gespeichertes Programm zum Managen des Energieverbrauchs innerhalb der integrierten Schaltung, dem Programm zugeordnete Anweisungen zum direkten Versetzen der ersten integrierten Schaltung (112) aus dem ersten PerformanceZustand in den dritten PerformanceZustand auf Basis des Detektierens eines Benutz",115,patents
-116,0,"US 9,423,690 B2",False,0.0,"US 9,423,690 B2",0.8,"r. 15, 2013, th",0.0,"US 9,423,690 B2",0.0,"US 9,423,690 B2",0.0,"US 9,423,690 B2",0.8666666666666667,". 15, 2013, t",0.8666666666666667,". 15, 2013, t",116,patents
-116,1,1,False,0.0,1,0.0,1,0.0,1,0.0,1,0.0,1,0.0,1,0.0,1,116,patents
-116,2,"PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",False,0.029850746268656716,"PATTERN FORMING METHOD, ELECTRON
-BEAM-SENSITIVE OR EXTREME
-ULTRAVIOLET RAY-SENSITIVE RESIN
-COMPOSITION, RESIST FILM, AND
-METHOD FOR MANUFACTURING
-ELECTRONIC DEVICE, AND ELECTRONIC
-DEVICE USING THE SAME",0.0,"PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.0,"PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.0,"PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.0,"PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.0,"PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.0,"PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",116,patents
-116,3,"CROSS-REFERENCE TO RELATED APPLICATION This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012- 181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorpo- rated herein by reference.",False,0.014577259475218658,"CROSS-REFERENCE TO RELATED
-APPLICATION
-
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012- 181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorporated herein by reference.",0.02040816326530612,"CROSS-REFERENCE TO RELATED APPLICATION
-
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012-181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorporated herein by reference.
-
-",0.02040816326530612,"CROSS-REFERENCE TO RELATED APPLICATION
-
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012-181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorporated herein by reference.
-
-",0.02040816326530612," CROSS-REFERENCE TO RELATED APPLICATION
-
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012-181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorporated herein by reference.
-",0.14868804664723032,"fine hole patterns are formed.
-
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorporated herein by reference.
-
-> 15 sh",0.13994169096209913,"ELATED APPLICATION
-
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorpo› rated herein by reference",0.13994169096209913,"ELATED APPLICATION
-
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorpo› rated herein by reference",116,patents
-116,4,"TECHNICAL FIELD The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufac- turing an electronic device, and an electronic device using g g the same. More specifically, the present invention relates to",False,0.12181818181818181,"tern forming method using a developer containing an organic solvent, which is using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufac- turing an electronic device, and an electronic device using the same. More specifically, the present invention relates to",0.023636363636363636,"
-
-## TECHNICAL FIELD
-
-The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufacturing an electronic device, and an electronic device using the same. More specifically, the present invention relates to",0.023636363636363636,"
-
-## TECHNICAL FIELD
-
-The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufacturing an electronic device, and an electronic device using the same. More specifically, the present invention relates to",0.023636363636363636,"TECHNICAL FIELD
-
-The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufacturing an electronic device, and an electronic device using the same. More specifically, the present invention relates to a pa",0.02181818181818182," TECHNICAL FIELD
-
-The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufacturing an electronic device, and an electronic device using the same. More specifically, the present invention relates to a ",0.08181818181818182,"e present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufac› turing an electronic device, and an electronic device using the same. More specifically, the present invention relates to",0.08181818181818182,"e present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufac› turing an electronic device, and an electronic device using the same. More specifically, the present invention relates to",116,patents
-116,5,"BACKGROUND ART A micromachining by a lithography using a photoresist composition has been conducted in a conventional manu- facturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, because",False,0.013071895424836602,"BACKGROUND ART
-
-A micromachining by a lithography using a photoresist composition has been conducted in a conventional manufacturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, because",0.016339869281045753,"BACKGROUND ART
-
-A micromachining by a lithography using a photoresist composition has been conducted in a conventional manufacturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, because ",0.016339869281045753," BACKGROUND ART
-
-A micromachining by a lithography using a photoresist composition has been conducted in a conventional manufacturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, because",0.016339869281045753," BACKGROUND ART
-
-A micromachining by a lithography using a photoresist composition has been conducted in a conventional manufacturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, because",0.013071895424836602,"BACKGROUND ART
-
-A micromachining by a lithography using a photoresist composition has been conducted in a conventional manufacturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, because",0.0784313725490196,"CKGROUND ART
-
-A micromachining by a lithography using a photoresist composition has been conducted in a conventional manu› facturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required",0.0784313725490196,"ROUND ART
-
-A micromachining by a lithography using a photoresist composition has been conducted in a conventional manu› facturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, b",116,patents
-116,6,"SUMMARY OF INVENTION The present invention is as follows. [1] A pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition contain- ing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo! % or more based on a whole repeating units in the resin (A):",False,0.08221225710014948,"e present invention is as follows.
-
-[1] A pattern forming method, including:
-
-55 55
-
-(a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
-
-60 60
-
-(b) exposing the film by using an electron beam or extreme ultraviolet ray; and
-
-(c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern,
-
-65 65
-
-wherein a content of the repeating unit represented by Formula (1-0) is 45 mo! % or more based on a whole repeating units in the resin (A)",0.028400597907324365,"MMARY OF INVENTION
-
-The present invention is as follows.
-
-[1] A pattern forming method, including:
-
-(a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
-
-(b) exposing the film by using an electron beam or extreme ultraviolet ray; and
-
-(c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern,
-
-wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A)",0.07324364723467862,"The present invention is as follows.
-
-1. A pattern forming method, including:
- (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
- (b) exposing the film by using an electron beam or extreme ultraviolet ray; and
- (c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern,
-
- wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A):",0.028400597907324365,"MMARY OF INVENTION
-
-The present invention is as follows.
-
-[1] A pattern forming method, including:
-
-(a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
-
-(b) exposing the film by using an electron beam or extreme ultraviolet ray; and
-
-(c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern,
-
-wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A)",0.40059790732436473,"SUMMARY OF INVENTION
-
-The present invention is as follows.
-
-[1] A pattern forming method, including:
-
-(a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
-
-55
-
-These electron beam or X-ray or EUV ray lithography takes a position as a pattern forming technique of the next generation or the next of the next generation, and a resist composition of a high sensitivity and high resolution is desired. Particularly, a high sensitization is a very important problem to be solved for sh",0.17937219730941703,"SUMMARY OF INVENTION
-
-The present invention is as follows.
-
-- [1] A pattern forming method, including:
-2. (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition contain› ing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
-3. (b) exposing the film by using an electron beam or extreme ultraviolet ray; and
-4. ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern,
-
-wherein a content of the repeating unit represented by Formula (1-0) is 45 mo! ",0.17937219730941703,"SUMMARY OF INVENTION
-
-The present invention is as follows.
-
-- [1] A pattern forming method, including:
-2. (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition contain› ing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
-3. (b) exposing the film by using an electron beam or extreme ultraviolet ray; and
-4. ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern,
-
-wherein a content of the repeating unit represented by Formula (1-0) is 45 mo! ",116,patents
-117,0,EP 2 000 008 B1,False,0.0,EP 2 000 008 B1,0.8666666666666667,0020]** FIG. 1 ,0.8,[0020]** FIG. 1,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.8, 20. [0021] In ,0.8, 20. [0021] In ,117,patents
-117,1,"ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many ad- ditional advantages and uses of the systems and meth- ods will become apparent from the following detailed de- scription, which proceeds with reference to the accom- panying drawings.",False,0.033707865168539325,"
-
-ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many additional advantages and uses of the systems and methods will become apparent from the following detailed description, which proceeds with reference to the accompanying drawings.
-
-",0.028089887640449437,"
-
-ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many additional advantages and uses of the systems and methods will become apparent from the following detailed description, which proceeds with reference to the accompanying drawings.",0.02247191011235955,"ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many additional advantages and uses of the systems and methods will become apparent from the following detailed description, which proceeds with reference to the accompanying drawings.",0.033707865168539325,"6
-
-ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many additional advantages and uses of the systems and methods will become apparent from the following detailed de-5 scription, which proceeds with reference to the accompanying drawings.
-
-",0.0449438202247191,"
-
-6
-
-ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many additional advantages and uses of the systems and methods will become apparent from the following detailed description, which proceeds with reference to the accompanying drawings. ",0.05056179775280899,"ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many additional advantages and uses of the systems and methods will become apparent from the following detailed description, which proceeds with reference to the accompanying drawings",0.05056179775280899,"ible substrates, such as on plastic substrates for organic light emitting diode (OLED) displays, and the deposition of conformal coatings on very large substrates. Many additional advantages and uses of the systems and methods will become apparent from the following detailed description, which proceeds with reference to the accompanying drawings",117,patents
-117,2,"[0020] FIG. 1 illustrates a schematic cross-section view of a system 10 according to a first embodiment for the deposition of a thin-film coating onto a flexible sub- strate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an interme- diate isolation zone 20 in which an inert fluid is present. The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen (N2). When in use, reactive first and second pre- cursor gases (Precursor 1 and Precursor 2) are intro- duced into the respective first and second precursor zones 14,16 from first and second precursor delivery sys- tems 24, 26. Precursor delivery systems 24, 26 may in- clude precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may in- clude piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly included for injecting inert gas into isolation zone 20.",False,0.017741935483870968,"
-
-[0020] FIG. 1 illustrates a schematic cross-section view of a system 10 according to a first embodiment for the deposition of a thin-film coating onto a flexible substrate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an intermediate isolation zone 20 in which an inert fluid is present. The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen (N2). When in use, reactive first and second precursor gases (Precursor 1 and Precursor 2) are introduced into the respective first and second precursor zones 14,16 from first and second precursor delivery systems 24, 26. Precursor delivery systems 24, 26 may include precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may include piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly
-
-included for injecting inert gas into isolation zone 20.
-
-[0",0.02258064516129032,"
-**[0020]** FIG. 1 illustrates a schematic cross-section view of a system 10 according to a first embodiment for the deposition of a thin-film coating onto a flexible substrate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an intermediate isolation zone 20 in which an inert fluid is present. The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen ( $N_2$ ). When in use, reactive first and second precursor gases (Precursor 1 and Precursor 2) are introduced into the respective first and second precursor zones 14, 16 from first and second precursor delivery systems 24, 26. Precursor delivery systems 24, 26 may include precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may include piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly included for injecting inert gas into isolation zone 20.
-
-*",0.02258064516129032,"*[0020]** FIG. 1 illustrates a schematic cross-section view of a system 10 according to a first embodiment for the deposition of a thin-film coating onto a flexible substrate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an intermediate isolation zone 20 in which an inert fluid is present. The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen ($\ce{N2}$). When in use, reactive first and second precursor gases (Precursor 1 and Precursor 2) are introduced into the respective first and second precursor zones 14, 16 from first and second precursor delivery systems 24, 26. Precursor delivery systems 24, 26 may include precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may include piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly included for injecting inert gas into isolation zone 20.
-
-*",0.03387096774193549,"IG. 1 illustrates a schematic cross-section view of a system 10 according to a first embodiment for the deposition of a thin-film coating onto a flexible sub-10 strate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an intermediate isolation zone 20 in which an inert fluid is present. 15 The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen (N2). When in use, reactive first and second precursor gases (Precursor 1 and Precursor 2) are introduced into the respective first and second precursor 20 zones 14,16 from first and second precursor delivery systems 24, 26. Precursor delivery systems 24, 26 may include precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may in-25 clude piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly included for injecting inert gas into isolation zone ",0.02258064516129032,"*[0020]** FIG. 1 illustrates a schematic cross-section view of a system 10 according to a first embodiment for the deposition of a thin-film coating onto a flexible substrate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an intermediate isolation zone 20 in which an inert fluid is present. The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen (N2). When in use, reactive first and second precursor gases (Precursor 1 and Precursor 2) are introduced into the respective first and second precursor zones 14,16 from first and second precursor delivery systems 24, 26. Precursor delivery systems 24, 26 may include precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may include piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly included for injecting inert gas into isolation zone 20. **[0021]**",0.11370967741935484,"
-
-20
-
-25
-
-[0020] FIG. 1 illustrates a schematic crossection view of a system 10 according to a first embodiment for the deposition of a thin- film coating onto a flexible substrate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an intermediate isolation zone 20 in which an inert fluid is present. The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen (N 2 ). When in use, reactive first and second precursor gases (Precursor 1 and Precursor 2) are introduced into the respective first and second precursor zones 14,16 from first and second precursor delivery systems 24, 26. Precursor delivery systems 24, 26 may include precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may include piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly
-
-30",0.11370967741935484,"
-
-20
-
-25
-
-[0020] FIG. 1 illustrates a schematic crossection view of a system 10 according to a first embodiment for the deposition of a thin- film coating onto a flexible substrate 12 (shown in profile in FIG. 1), such as a web of plastic film or metal foil, for example. With reference to FIG. 1, system 10 includes first and second precursor zones 14 and 16, respectively, separated by an intermediate isolation zone 20 in which an inert fluid is present. The inert fluid may comprise an inert liquid, but more preferably consists essentially of an inert gas, such as nitrogen (N 2 ). When in use, reactive first and second precursor gases (Precursor 1 and Precursor 2) are introduced into the respective first and second precursor zones 14,16 from first and second precursor delivery systems 24, 26. Precursor delivery systems 24, 26 may include precursor source containers (not shown) located outside or within precursor zones 14, 16. Additionally or alternatively, precursor delivery systems 24, 26 may include piping, pumps, valves, tanks, and other associated equipment for supplying precursor gases into precursor zones 14, 16. An inert gas delivery system 28 is similarly
-
-30",117,patents
-117,3,"[0021] In the embodiment shown, precursor zones 14,16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-cham- bers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Ves- sel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the exter- nal environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described below with reference to FIG. 4. A series of first passage- ways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a cor- responding series of second passageways 56 are pro- vided through second divider 36. The passageways 54, 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14,16 multiple times, and each time through isolation zone 20. For a web substrate, pas- sageways 54, 56 preferably comprise slits having a width (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) ex- tending into the plane of FIG.1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit imperfectly) from the first precursor zone 14 by first di- vider 34 and from second precursor zone 16 by second divider 36.",False,0.01721938775510204,"
-[0021] In the embodiment shown, precursor zones 14,16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-chambers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Vessel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the external environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described below with reference to FIG. 4. A series of first passageways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a corresponding series of second passageways 56 are provided through second divider 36. The passageways 54, 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14,16 multiple times, and each time through isolation zone 20. For a web substrate, passageways 54, 56 preferably comprise slits having a width (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) extending into the plane of FIG.1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit imperfectly) from the first precursor zone 14 by first divider 34 and from second precursor zone 16 by second divider 36.
-
-[0022]",0.02295918367346939,"20.
-
-**[0021]** In the embodiment shown, precursor zones 14, 16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-chambers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Vessel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the external environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described below with reference to FIG. 4. A series of first passageways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a corresponding series of second passageways 56 are provided through second divider 36. The passageways 54, 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14, 16 multiple times, and each time through isolation zone 20. For a web substrate, passageways 54, 56 preferably comprise slits having a width (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) extending into the plane of FIG. 1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit imperfectly) from the first precursor zone 14 by first divider 34 and from second precursor zone 16 by second divider 36.
-
-**[0",0.02295918367346939,"20.
-
-**[0021]** In the embodiment shown, precursor zones 14, 16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-chambers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Vessel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the external environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described below with reference to FIG. 4. A series of first passageways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a corresponding series of second passageways 56 are provided through second divider 36. The passageways 54, 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14, 16 multiple times, and each time through isolation zone 20. For a web substrate, passageways 54, 56 preferably comprise slits having a width (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) extending into the plane of FIG. 1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit imperfectly) from the first precursor zone 14 by first divider 34 and from second precursor zone 16 by second divider 36.
-
-**[0",0.021683673469387755,"[0021] In the embodiment shown, precursor zones 30 14,16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-chambers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Ves-35 sel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the external environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described 40 below with reference to FIG. 4. A series of first passageways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a corresponding series of second passageways 56 are provided through second divider 36. The passageways 54, 45 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14,16 multiple times, and each time through isolation zone 20. For a web substrate, passageways 54, 56 preferably comprise slits having a width 50 (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) extending into the plane of FIG.1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit 55 imperfectly) from the first precursor zone 14 by first divider 34 and from second precursor zone 16 by second divider 36",0.02295918367346939,"one 20. **[0021]** In the embodiment shown, precursor zones 14,16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-chambers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Vessel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the external environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described below with reference to FIG. 4. A series of first passageways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a corresponding series of second passageways 56 are provided through second divider 36. The passageways 54, 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14,16 multiple times, and each time through isolation zone 20. For a web substrate, passageways 54, 56 preferably comprise slits having a width (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) extending into the plane of FIG.1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit imperfectly) from the first precursor zone 14 by first divider 34 and from second precursor zone 16 by second divider 36.
-
-5
-",0.09438775510204081,"16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-chambers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Vessel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the external environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described below with reference to FIG. 4. A series of first passageways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a corresponding series of second passageways 56 are provided through second divider 36. The passageways 54, 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14,16 multiple times, and each time through isolation zone 20. For a web substrate, passageways 54, 56 preferably comprise slits having a width (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) extending into the plane of FIG.1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit imperfectly) from the first precursor zone 14 by first divider 34 and from second precursor zone 16 by second divide",0.09438775510204081,"16 and isolation zone 20 are defined and bordered by an outer reaction chamber housing or vessel 30, divided by first and second dividers 34, 36 into three sub-chambers, namely, a first precursor chamber 44, a second precursor chamber 46 and an inert gas chamber 50. Vessel 30 may comprise a pressure vessel or vacuum vessel substantially isolating the process space from the external environment. In other embodiments, the vessel 30 may have entrance and exit passageways for interfacing with other process modules or equipment, as described below with reference to FIG. 4. A series of first passageways 54 through first divider 34 are spaced apart along a general direction of travel of substrate 12, and a corresponding series of second passageways 56 are provided through second divider 36. The passageways 54, 56 are arranged and configured for substrate 12 to be threaded therethrough back and forth between first and second precursor zones 14,16 multiple times, and each time through isolation zone 20. For a web substrate, passageways 54, 56 preferably comprise slits having a width (exaggerated in FIG. 1) that is slightly greater than the thickness of substrate 12 and a length (not shown) extending into the plane of FIG.1 (i.e., normal to the page) and that is slightly greater than a width of the substrate. Isolation zone 20 is, thus, preferably separated (albeit imperfectly) from the first precursor zone 14 by first divider 34 and from second precursor zone 16 by second divide",117,patents
-117,4,"[0022] To substantially prevent non-ALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Pas- sageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14,16, 20, to avoid or limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and mar- gins may range between microns and millimeters in cer- tain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embod- iments, the passageways 54, 56 include a wiper for fur- ther restricting flow. In one such embodiment, the sub- strate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe against opposing surfaces of the substrate.",False,0.07859078590785908,"bstantially prevent non-ALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Passageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14,16, 20, to avoid or limit diffusion of precursor gases into a common zone. limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and margins may range between microns and millimeters in certain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embodiments, the passageways 54, 56 include a wiper for further restricting flow. In one such embodiment, the substrate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe agains",0.016260162601626018,"
-**[0022]** To substantially prevent non-ALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Passageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14, 16, 20, to avoid or limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and margins may range between microns and millimeters in certain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embodiments, the passageways 54, 56 include a wiper for further restricting flow. In one such embodiment, the substrate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe against opposing surfaces of the substrate.
-
-**[0",0.016260162601626018,"
-**[0022]** To substantially prevent non-ALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Passageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14, 16, 20, to avoid or limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and margins may range between microns and millimeters in certain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embodiments, the passageways 54, 56 include a wiper for further restricting flow. In one such embodiment, the substrate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe against opposing surfaces of the substrate.
-
-**[0",0.016260162601626018,"6.
-
-[0022] To substantially prevent non-ALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Passageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14,16, 20, to avoid or limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and margins may range between microns and millimeters in certain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embodiments, the passageways 54, 56 include a wiper for further restricting flow. In one such embodiment, the substrate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe against opposing surfaces of the substrate.
-
-[0023]",0.016260162601626018,"
-**[0022]** To substantially prevent non-ALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Passageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14,16, 20, to avoid or limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and margins may range between microns and millimeters in certain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embodiments, the passageways 54, 56 include a wiper for further restricting flow. In one such embodiment, the substrate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe against opposing surfaces of the substrate.
-
-**[0",0.0948509485094851," nonALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Passageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14,16, 20, to avoid or limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and margins may range between microns and millimeters in certain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embodiments, the passageways 54, 56 include a wiper for further restricting flow. In one such embodiment, the substrate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe against opposing ",0.0948509485094851," nonALD reactions caused by mixing of nonadsorbed quantities of the first and second precursor gases in one of the chambers 44, 46, 50, it is necessary for the system 10 to inhibit the migration of Precursor 1 from first precursor zone 14 into isolation zone 20 and the migration of Precursor 2 from second precursor zone 16 into isolation zone 20. Passageways 54, 56 are preferably configured to restrict the flow of gases between the zones 14,16, 20, to avoid or limit diffusion of precursor gases into a common zone. Passageways 54, 56 may include slits sized only slightly thicker and wider than the thickness and width of the substrate passing through them, leaving only a very small amount of headroom and margins to allow substrate 12 to pass therethrough without scraping against the sides of the passageways. For example, headroom and margins may range between microns and millimeters in certain embodiments. The passageways 54, 56 may also include elongate tunnels through which the substrate 12 passes, as depicted in FIGS. 1, 2, and 4. Such slits and tunnels are sometimes referred to as slit valves, although no actual moving valve gate is utilized. In some embodiments, the passageways 54, 56 include a wiper for further restricting flow. In one such embodiment, the substrate is threaded through opposing leaves of resilient material, such as a synthetic rubber, which wipe against opposing ",117,patents
-117,5,"[0023] In an alternate embodiment (not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extend- ing completely between precursor zones 14,16. In such an embodiment, no common inert gas chamber 50 con- nects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14,16 to help prevent precursor migra- tion and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would be formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the system as shown in FIG. 1.",False,0.13434452871072589,"nt (not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extending completely between precursor zones 14,16. In such an embodiment, no common inert gas chamber 50 connects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14,16 to help prevent precursor migration and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would be formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the",0.013001083423618635,"*[0023]** In an alternate embodiment (not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extending completely between precursor zones 14, 16. In such an embodiment, no common inert gas chamber 50 connects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14, 16 to help prevent precursor migration and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would be formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the system as shown in FIG. 1.
-",0.013001083423618635,"*[0023]** In an alternate embodiment (not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extending completely between precursor zones 14, 16. In such an embodiment, no common inert gas chamber 50 connects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14, 16 to help prevent precursor migration and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would be formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the system as shown in FIG. 1.
-",0.013001083423618635,"te.
-
-[0023] In an alternate embodiment (not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extending completely between precursor zones 14,16. In such an embodiment, no common inert gas chamber 50 connects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14,16 to help prevent precursor migration and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would be formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the system as shown in FIG. 1.
-",0.013001083423618635,"**[0023]** In an alternate embodiment (not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extending completely between precursor zones 14,16. In such an embodiment, no common inert gas chamber 50 connects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14,16 to help prevent precursor migration and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would be formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the system as shown in FIG. 1.
-",0.09750812567713976,"not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extending completely between precursor zones 14,16. In such an embodiment, no common inert gas chamber 50 connects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14,16 to help prevent precursor migration and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the system as shown in FIG. ",0.09750812567713976,"not shown), the inert gas chamber 50 of isolation zone 20 and dividers 34, 36 are eliminated, so that isolation zone 20 essentially consists of a series of long narrow passageways extending completely between precursor zones 14,16. In such an embodiment, no common inert gas chamber 50 connects the passageways, so inert gas is injected directly into the passageways medially of the first and second precursor zones 14,16 to help prevent precursor migration and mixing. Isolation zone 20 of this embodiment would include a manifold, or a number of manifolds, for routing inert gas lines to nozzles along the sides of the passageways. The manifold or manifolds would formed in the material of the reaction chamber bordering the passageways, and may be connected to an inert gas delivery system along the sides of the system, rather than at an end of the system as shown in FIG. ",117,patents
-117,6,"[0024] To help isolate the first precursor gas from the second precursor gas, pressure differentials are prefer- ably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodi- ment, the pressure differentials may be generated by in- jecting inert gas into isolation zone 20 at a pressure great- er than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the ex- haust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pres- sure differentials may also be generated by pumping from",False,0.023017902813299233,"40
-
-[0024] To help isolate the first precursor gas from the second precursor gas, pressure differentials are preferably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodiment, the pressure differentials may be generated by injecting inert gas into isolation zone 20 at a pressure greater than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the exhaust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pressure differentials may also be generated by pumping from
-
-",0.017902813299232736,"[0024]** To help isolate the first precursor gas from the second precursor gas, pressure differentials are preferably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodiment, the pressure differentials may be generated by injecting inert gas into isolation zone 20 at a pressure greater than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the exhaust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pressure differentials may also be generated by pumping from",0.017902813299232736,"[0024]** To help isolate the first precursor gas from the second precursor gas, pressure differentials are preferably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodiment, the pressure differentials may be generated by injecting inert gas into isolation zone 20 at a pressure greater than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the exhaust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pressure differentials may also be generated by pumping from",0.015345268542199489,"[0024] To help isolate the first precursor gas from the second precursor gas, pressure differentials are preferably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodiment, the pressure differentials may be generated by injecting inert gas into isolation zone 20 at a pressure greater than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the exhaust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pressure differentials may also be generated by pumping from",0.030690537084398978,"[0024]** To help isolate the first precursor gas from the second precursor gas, pressure differentials are preferably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodiment, the pressure differentials may be generated by injecting inert gas into isolation zone 20 at a pressure greater than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the exhaust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pressure differentials may also be generated by pumping from
-
-**4**
-",0.11636828644501279,"0024] To help isolate the first precursor gas from the second precursor gas, pressure differentials are preferably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodiment, the pressure differentials may be generated by injecting inert gas into isolation zone 20 at a pressure greater than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the exhaust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pressure differentials may ",0.11636828644501279,"0024] To help isolate the first precursor gas from the second precursor gas, pressure differentials are preferably established between the isolation zone 20 and the first precursor zone 14 and between the isolation zone 20 and the second precursor zone 16. In one embodiment, the pressure differentials may be generated by injecting inert gas into isolation zone 20 at a pressure greater than the operating pressure of the precursor zones 14, 16, and then passively exhausting gases from the precursor zones 14, 16. In another embodiment, the exhaust from precursor zones 14, 16 could be controlled relative to a passive exhaust from isolation zone 20 or by throttling an exhaust flow from isolation zone 20. Pressure differentials may ",117,patents
-118,0,EP 1 499 943 B1,False,0.0,EP 1 499 943 B1,0.9333333333333333," 15, wobei das ",0.8666666666666667,"
-
- Bestimmen",0.0,EP 1 499 943 B1,0.0,EP 1 499 943 B1,0.8666666666666667," 10, wobei d",0.8666666666666667," 10, wobei d",118,patents
-118,1,"Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfängt.",False,0.01680672268907563,"Betriebsspannung der ersten integrierten
-Schaltung, wobei die Spannungsregelungslogik
-ein Signal vom Programm empfängt.",0.0,"Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfängt.",0.0,"Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfängt.",0.0,"Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfängt.",0.0,"Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfängt.",0.05042016806722689,"Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfän",0.05042016806722689,"Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfän",118,patents
-118,2,"15. Vorrichtung nach Anspruch 10, wobei die Anweisun- gen in einem Basisdatenaustauschsystem (BIOS) residieren.",False,0.02702702702702703,"
-15. Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Basisdatenaustauschsystem (BIOS) residieren.",0.036036036036036036,"
-
-15. Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Basisdatenaustauschsystem (BIOS) residieren.",0.036036036036036036,"
-15. Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Basisdatenaustauschsystem (BIOS) residieren.
-",0.036036036036036036,"15.** Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Basisdatenaustauschsystem (BIOS) residieren.",0.036036036036036036,"15.** Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Basisdatenaustauschsystem (BIOS) residieren.",0.18018018018018017,"Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Basisdatenaustauschsystem (BIOS) residie",0.18018018018018017,"Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Basisdatenaustauschsystem (BIOS) residie",118,patents
-118,3,"16. Vorrichtung nach Anspruch 10, wobei die Anweisun- gen in einem Betriebssystem residieren.",False,0.03225806451612903,"
-16. Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Betriebssystem residieren.",0.043010752688172046,"
-
-16. Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Betriebssystem residieren.",0.043010752688172046,"
-
-16. Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Betriebssystem residieren.",0.043010752688172046,"16.** Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Betriebssystem residieren.",0.043010752688172046,"16.** Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Betriebssystem residieren.",0.12903225806451613,"Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Betriebssystem residieren.",0.12903225806451613,"Vorrichtung nach Anspruch 10, wobei die Anweisungen in einem Betriebssystem residieren.",118,patents
-118,4,"17. Vorrichtung nach Anspruch 10, wobei die Anweisun- gen in Anwendungssoftware residieren.",False,0.03296703296703297,"
-17. Vorrichtung nach Anspruch 10, wobei die Anweisungen in Anwendungssoftware residieren.",0.04395604395604396,"17. Vorrichtung nach Anspruch 10, wobei die Anweisungen in Anwendungssoftware residieren.
-
-",0.04395604395604396,"
-17. Vorrichtung nach Anspruch 10, wobei die Anweisungen in Anwendungssoftware residieren.
-",0.04395604395604396,"17.** Vorrichtung nach Anspruch 10, wobei die Anweisungen in Anwendungssoftware residieren.",0.04395604395604396,"17.** Vorrichtung nach Anspruch 10, wobei die Anweisungen in Anwendungssoftware residieren.",0.13186813186813187," Vorrichtung nach Anspruch 10, wobei die Anweisungen in Anwendungssoftware residieren",0.13186813186813187," Vorrichtung nach Anspruch 10, wobei die Anweisungen in Anwendungssoftware residieren",118,patents
-118,5,"18. Vorrichtung nach Anspruch 10, wobei die erste inte- grierte Schaltung ein Chipset umfasst.",False,0.031914893617021274,"18. Vorrichtung nach Anspruch 10, wobei die erste integrierte Schaltung ein Chipset umfasst.
-",0.0425531914893617,"
-18. Vorrichtung nach Anspruch 10, wobei die erste integrierte Schaltung ein Chipset umfasst.
-",0.0425531914893617,"
-
-18. Vorrichtung nach Anspruch 10, wobei die erste integrierte Schaltung ein Chipset umfasst.",0.0425531914893617,"18.** Vorrichtung nach Anspruch 10, wobei die erste integrierte Schaltung ein Chipset umfasst.",0.0425531914893617,"18.** Vorrichtung nach Anspruch 10, wobei die erste integrierte Schaltung ein Chipset umfasst.",0.0425531914893617,"
-18. Vorrichtung nach Anspruch 10, wobei die erste integrierte Schaltung ein Chipset umfasst.
-",0.0425531914893617,"
-18. Vorrichtung nach Anspruch 10, wobei die erste integrierte Schaltung ein Chipset umfasst.
-",118,patents
-118,6,"23. Maschinenlesbares Medium, das Anweisungen be- reitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durch- führt, umfassend: Detektieren (402) eines Ereignisses, um eine in- tegrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu verset- zen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Be- nutzer eingeleitetes Ereignis oder ein von Soft- ware eingeleitetes Ereignis ist;",False,0.025780189959294438,".
-
-23. Maschinenlesbares Medium, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; w",0.033921302578018994," erhöht.
-
-23. Maschinenlesbares Medium, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustandes, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;",0.032564450474898234,"
-23. Maschinenlesbares Medium, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-
- Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und
-
- Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;
-",0.033921302578018994,"
-
-**23.** Maschinenlesbares Medium, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; wenn",0.032564450474898234,"23.** Maschinenlesbares Medium, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; wenn da",0.16417910447761194,"m, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-
-40
-
-45
-
-50
-
-55
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance- Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance- Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingel",0.16417910447761194,"m, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-
-40
-
-45
-
-50
-
-55
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance- Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance- Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingel",118,patents
-118,7,"Revendications 1. Procédé comportant les étapes consistant à : détecter (402) un événement pour faire passer un circuit intégré d’un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de performan-",False,0.05622489959839357,"evendications
-
-1. Procédé comportant les étapes consistant à :
-
-55
-
-détecter (402) un événement pour faire passer un circuit intégré d’un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de perfo",0.028112449799196786,"evendications
-
-1. Procédé comportant les étapes consistant à :
-
-détecter (402) un événement pour faire passer un circuit intégré d'un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de performan",0.060240963855421686,"dications
-
-1. Procédé comportant les étapes consistant à :
-
- détecter (402) un événement pour faire passer un circuit intégré d’un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de performa",0.060240963855421686,"vendications
-
-**1.** Procédé comportant les étapes consistant à :
-
-détecter (402) un événement pour faire passer un circuit intégré d'un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de perfor",0.08032128514056225,"dications**
-
-**1.** Procédé comportant les étapes consistant à :
-
-détecter (402) un événement pour faire passer un circuit intégré d’un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de perfo",0.12449799196787148,"1. Procédé comportant les étapes consistant à :
-
-détecter (402) un événement pour faire passer un circuit intégré d'un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de performan-",0.12449799196787148,"1. Procédé comportant les étapes consistant à :
-
-détecter (402) un événement pour faire passer un circuit intégré d'un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de performan-",118,patents
-119,0,US 2019/0010119 Al,False,0.0,US 2019/0010119 Al,0.9444444444444444,preferably 10 mol ,0.1111111111111111, US 2019/0010119 A,0.1111111111111111,"
-US 2019/0010119 A",0.0,US 2019/0010119 Al,0.8333333333333334,"e -->
-
-[0144] As t",0.8333333333333334,"e -->
-
-[0144] As t",119,patents
-119,1,40,False,0.0,40,0.5,4],0.0,40,0.0,40,0.0,40,1.0,14,1.0,14,119,patents
-119,2,"Jan. 10, 2019",False,0.0,"Jan. 10, 2019",0.9230769230769231,referably 10 ,0.0,"Jan. 10, 2019",0.0,"Jan. 10, 2019",0.0,"Jan. 10, 2019",0.8461538461538461,eferably 10 m,0.8461538461538461,eferably 10 m,119,patents
-119,3,"[0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!%.",False,0.0,"[0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!%.",0.024691358024691357,"0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mol %, more preferably 10 mol % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mol %, more preferably 60 mol %.",0.037037037037037035,"*[0144]** As the amount of the repeating unit BN2, the lower limit is preferably 5 mol %, more preferably 10 mol % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mol %, more preferably 60 mo",0.024691358024691357,"[0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mol %, more preferably 10 mol % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mol %, more preferably 60 mol %",0.01646090534979424,"[0144]** As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!",0.00823045267489712,"0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!%.",0.00823045267489712,"0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!%.",119,patents
-119,4,"[0145] When the inventive resist composition is a chemi- cally amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.",False,0.00473186119873817,"[0145] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.
-",0.012618296529968454,"[0145] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit B1 in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mol % or more, more preferably 70 mol % or more, and still more preferably 80 mol % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.
-
-",0.012618296529968454,"[0145]** When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit B1 in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mol % or more, more preferably 70 mol % or more, and still more preferably 80 mol % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.",0.012618296529968454,"
-[0145] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit B1 in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mol % or more, more preferably 70 mol % or more, and still more preferably 80 mol % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.
-",0.006309148264984227,"[0145]** When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.",0.06782334384858044,"n the inventive resist composition is a chemi› cally amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist c",0.06782334384858044,"n the inventive resist composition is a chemi› cally amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist c",119,patents
-119,5,"g p [0146] When the inventive resist composition is a chemi- cally amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustra- tive examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesive- ness to a substrate and the solubility without showing acidity.",False,0.0197869101978691,"n.
-
-[0146] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.
-
-T",0.0258751902587519,"on.
-
-[0146] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (b1) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.
-
-(b1",0.030441400304414,"*[0146]** When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (b1) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.
-
-$$
-\t",0.030441400304414,"
-[0146] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (b1) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.
-
-(b1)
-
-[",0.0228310502283105,"on.
-
-**[0146]** When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.",0.1141552511415525,"[0146] When the inventive resist composition is a chemi› cally amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustra› tive examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesive› ness to a substrate and the so",0.1141552511415525,"[0146] When the inventive resist composition is a chemi› cally amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustra› tive examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesive› ness to a substrate and the so",119,patents
-120,0,EP 1 499 943 B1,False,0.0,EP 1 499 943 B1,0.8666666666666667,"s of claim 14, ",0.0,EP 1 499 943 B1,0.0,EP 1 499 943 B1,0.0,EP 1 499 943 B1,0.9333333333333333,"m.
-
-## 14. The ",0.9333333333333333,"m.
-
-## 14. The ",120,patents
-120,1,"13. The apparatus of claim 10, further comprising: frequency regulation logic to change an operat- ing frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the program.",False,0.018691588785046728,"13. The apparatus of claim 10, further comprising:
-
-frequency regulation logic to change an operating frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the program.",0.02336448598130841,"13. The apparatus of claim 10, further comprising:
-
-frequency regulation logic to change an operating frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the program.
-",0.037383177570093455,"3. The apparatus of claim 10, further comprising:
- frequency regulation logic to change an operating frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the program",0.03271028037383177,"13.** The apparatus of claim 10, further comprising:
-
-frequency regulation logic to change an operating frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the program",0.03271028037383177,".** The apparatus of claim 10, further comprising:
-
-frequency regulation logic to change an operating frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the program.",0.07009345794392523,". The apparatus of claim 10, further comprising:
-
-frequency regulation logic to change an operating frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the progr",0.07009345794392523,". The apparatus of claim 10, further comprising:
-
-frequency regulation logic to change an operating frequency of the first integrated circuit, the frequency regulation logic to receive a signal from the progr",120,patents
-120,2,"14. The apparatus of claim 10, further comprising: voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the pro- gram.",False,0.019230769230769232,"14. The apparatus of claim 10, further comprising:
-
-voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the program.",0.02403846153846154,"14. The apparatus of claim 10, further comprising:
-
-voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the program.
-",0.038461538461538464,"4. The apparatus of claim 10, further comprising:
- voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the program",0.03365384615384615,"14.** The apparatus of claim 10, further comprising:
-
-voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the program",0.03365384615384615,".** The apparatus of claim 10, further comprising:
-
-voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the program.",0.02403846153846154,"14. The apparatus of claim 10, further comprising:
-
-voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the program.
-",0.02403846153846154,"14. The apparatus of claim 10, further comprising:
-
-voltage regulation logic to change an operating voltage of the first integrated circuit, the voltage regulation logic to receive a signal from the program.
-",120,patents
-120,3,"15. The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.",False,0.0,"15. The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.",0.0,"15. The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.",0.0,"15. The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.",0.0425531914893617,"5.** The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System",0.031914893617021274,".** The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.",0.0,"15. The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.",0.0,"15. The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.",120,patents
-120,4,"16. The apparatus of claim 10, wherein the instructions reside in an operating system.",False,0.0,"16. The apparatus of claim 10, wherein the instructions reside in an operating system.",0.0,"16. The apparatus of claim 10, wherein the instructions reside in an operating system.",0.0,"16. The apparatus of claim 10, wherein the instructions reside in an operating system.",0.03488372093023256,".** The apparatus of claim 10, wherein the instructions reside in an operating system.",0.046511627906976744,"16.** The apparatus of claim 10, wherein the instructions reside in an operating syste",0.0,"16. The apparatus of claim 10, wherein the instructions reside in an operating system.",0.0,"16. The apparatus of claim 10, wherein the instructions reside in an operating system.",120,patents
-120,5,"Patentansprüche 1. Verfahren, umfassend: Detektieren (402) eines Ereignisses, um eine in- tegrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu verset- zen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als",False,0.07323943661971831,"end: 1. Verfahren, umfassend:
-
-55
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als
-
-9",0.030985915492957747,"Patentansprüche
-
-## 1. Verfahren, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher al",0.036619718309859155,"atentansprüche
-
-1. Verfahren, umfassend:
- Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher al",0.03943661971830986,"atentansprüche
-
-**1.** Verfahren, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher al",0.056338028169014086,"Patentansprüche**
-
-**1.** Verfahren, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höh",0.1267605633802817," 1. Verfahren, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance- Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher ",0.1267605633802817," 1. Verfahren, umfassend:
-
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance- Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher ",120,patents
-121,0,US 2012/0003590 Al,False,0.0,US 2012/0003590 Al,0.9444444444444444,"
-- Monomer: A sulf",0.05555555555555555,US 2012/0003590 A1,0.05555555555555555,US 2012/0003590 A1,0.0,US 2012/0003590 Al,0.8333333333333334,"unit (B).
-
-[0319] ",0.8333333333333334,"unit (B).
-
-[0319] ",121,patents
-121,1,"Jan. 5, 2012",False,0.0,"Jan. 5, 2012",0.8333333333333334,"minus$ ), wh",0.0,"Jan. 5, 2012",0.0,"Jan. 5, 2012",0.0,"Jan. 5, 2012",0.9166666666666666,ation. The p,0.9166666666666666,ation. The p,121,patents
-121,2,60,False,0.0,60,1.0,"
-
-",0.0,60,0.0,60,0.0,60,1.0,0],1.0,0],121,patents
-121,3,-continued,False,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,121,patents
-121,4," [0317] The composition of the present invention may fur- ther contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an anti- oxidant, a solvent and the like. These components are described below. (Photo-Acid Generator)",False,0.04498269896193772,"
-
-[0317] The composition of the present invention may further contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an antioxidant, a solvent and the like. These components are described below.
-
-## (Photo-Acid Generat",0.7820069204152249,"
-
--continued
-
-Chemical structures shown:
-
-- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone gro",0.0726643598615917,"r Components>
-
-**[0317]** The composition of the present invention may further contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an antioxidant, a solvent and the like. These components are described below.
-
-### (Photo-Acid Generator",0.09688581314878893,"ther Components>
-
-[0317] The composition of the present invention may further contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an anti-oxidant, a solvent and the like. These components are described below.
-
-(Photo-Acid Ge",0.05536332179930796,"her Components>
-
-**[0317]** The composition of the present invention may further contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an antioxidant, a solvent and the like. These components are described below.
-
-(Photo-Acid Generator",0.1384083044982699,"[0317] The composition of the present invention may fur› ther contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an anti› oxidant, a solvent and the like. These components are described below.
-
-## (Photo-Acid Generator)",0.1384083044982699,"[0317] The composition of the present invention may fur› ther contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an anti› oxidant, a solvent and the like. These components are described below.
-
-## (Photo-Acid Generator)",121,patents
-121,5,[0318] The composition of the present invention may fur- ther contain a photo-acid generator in addition to the repeat- ing unit (A) and the repeating unit (B).,False,0.0375,"
-[0318] The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B).
-",0.84375,"ted sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated ",0.05,"*[0318]** The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B).
-",0.05,"s>
-
-[0318] The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B).",0.05,*[0318]** The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B). ,0.0125,[0318] The composition of the present invention may fur› ther contain a photo-acid generator in addition to the repeat› ing unit (A) and the repeating unit (B).,0.0125,[0318] The composition of the present invention may fur› ther contain a photo-acid generator in addition to the repeat› ing unit (A) and the repeating unit (B).,121,patents
-121,6,"[0319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-dis- coloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",False,0.004335260115606936,"[0319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).
-",0.8164739884393064,"
-
--continued
-
-Chemical structures shown:
-
-- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\te",0.005780346820809248,"[0319]** The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",0.005780346820809248,"
-
-[0319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",0.005780346820809248,"[0319]** The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",0.01878612716763006,"319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-dis› coloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazometha",0.01878612716763006,"319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-dis› coloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazometha",121,patents
-121,7,"[0320] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII):",False,0.007518796992481203,"[0320] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and(ZIII):",0.849624060150376,"t{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( ",0.03007518796992481,"0320]** Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII)",0.0,"[0320] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII):",0.09022556390977443," Preferred examples of the photo-acid generator include compounds represented by the following formulae **(ZI), (ZII)** and **(ZIII):",0.09022556390977443,"] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII)",0.09022556390977443,"] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII)",121,patents
-121,8,P-55,False,0.5,"
-P-5",1.0,"
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-122,0,EP 3 800 018 A1,False,0.0,EP 3 800 018 A1,0.0,EP 3 800 018 A1,0.0,EP 3 800 018 A1,0.0,EP 3 800 018 A1,0.0,EP 3 800 018 A1,0.0,EP 3 800 018 A1,0.0,EP 3 800 018 A1,122,patents
-122,1,EUROPÄISCHE PATENTANMELDUNG,False,0.0,EUROPÄISCHE PATENTANMELDUNG,0.0,EUROPÄISCHE PATENTANMELDUNG,0.0,EUROPÄISCHE PATENTANMELDUNG,0.0,EUROPÄISCHE PATENTANMELDUNG,0.0,EUROPÄISCHE PATENTANMELDUNG,0.0,EUROPÄISCHE PATENTANMELDUNG,0.0,EUROPÄISCHE PATENTANMELDUNG,122,patents
-122,2,(43) Veröffentlichungstag: 07.04.2021 Patentblatt 2021/14,False,0.017543859649122806,"(43) Veröffentlichungstag:
-07.04.2021 Patentblatt 2021/14",0.05263157894736842,"(43) Veröffentlichungstag:
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-- Veröffentlichungstag: 07.04.2021 Patentblatt 2021",0.10526315789473684,"(43)
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-122,3,(21) Anmeldenummer: 19200966.0,False,0.0,(21) Anmeldenummer: 19200966.0,0.0,(21) Anmeldenummer: 19200966.0,0.13333333333333333,21) Anmeldenummer:** 19200966.,0.13333333333333333,(21) Anmeldenummer: **19200966,0.13333333333333333,21) Anmeldenummer: **19200966.,0.13333333333333333,")
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-122,4,(22) Anmeldetag: 02.10.2019,False,0.0,(22) Anmeldetag: 02.10.2019,0.0,(22) Anmeldetag: 02.10.2019,0.14814814814814814,22) Anmeldetag:** 02.10.201,0.14814814814814814,2) Anmeldetag: **02.10.2019,0.14814814814814814,(22) Anmeldetag: **02.10.20,0.0,(22) Anmeldetag: 02.10.2019,0.0,(22) Anmeldetag: 02.10.2019,122,patents
-122,5,(51) Int Cl.: B26D 1/16 (2006.01) (2006 01),False,0.3953488372093023," Int Cl.: Cl.:
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-122,6,(84) Benannte Vertragsstaaten: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR Benannte Erstreckungsstaaten: BA ME Benannte Validierungsstaaten: KH MA MD TN,False,0.0,(84) Benannte Vertragsstaaten: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR Benannte Erstreckungsstaaten: BA ME Benannte Validierungsstaaten: KH MA MD TN,0.1036036036036036,"nannte Vertragsstaaten:
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-122,7,(71) Anmelder: Dienes Werke für Maschinenteile GmbH & Co. KG 51491 Overath (DE),False,0.05063291139240506,"(71) Anmelder:Dienes Werke für Maschinenteile
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-122,8,"(72) Erfinder: • Thielen, Rolf 50733 Köln (DE)",False,0.15217391304347827,"er: Erfinder:
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-122,9,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,False,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.08888888888888889,4) **SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.08888888888888889,54) **SENSORVORRICHTUNG FÜR EINEN MESSERHALTE,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,122,patents
-122,10,"(57) Die vorliegende Erfindung betrifft eine Sensor- vorrichtung (4) für einen Messerhalter (1), umfassend - einen Grundkörper (6) zur Befestigung der Sensorvor- richtung (4) an einem Messerhalter (1), - mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und - einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) er- fassten Größe.",False,0.021479713603818614,"R
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-(57) Die vorliegende Erfindung betrifft eine Sensorvorrichtung (4) für einen Messerhalter (1), umfassend - einen Grundkörper (6) zur Befestigung der Sensorvorrichtung (4) an einem Messerhalter (1), - mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und - einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) erfassten Größe.",0.028639618138424822,"ER
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-(57) Die vorliegende Erfindung betrifft eine Sensorvorrichtung (4) für einen Messerhalter (1), umfassend - einen Grundkörper (6) zur Befestigung der Sensorvorrichtung (4) an einem Messerhalter (1), - mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und - einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) erfassten Größe.
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-* einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) erfassten Größ",0.03579952267303103,"R**
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-- mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und
-- einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) erfassten Größe.
-",0.028639618138424822,"(57) Die vorliegende Erfindung betrifft eine Sensorvorrichtung (4) für einen Messerhalter (1), umfassend - einen Grundkörper (6) zur Befestigung der Sensorvorrichtung (4) an einem Messerhalter (1),
-
-- mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und - einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) erfassten Größe.
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-- mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und
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-- mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und
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-123,0,"une deuxième zone précurseur (16, 116, 316) espacée de la première, le deuxième gaz pré- curseur étant différent du premier ; guidage d’un substrat flexible (12, 112, 312) se- lon un mouvement de navette entre les première et deuxième zones précurseurs, en passant par une série de passages d’étranglement (54, 56, 154, 156, 354, 356) d’une zone d’isolation (20, 120, 320) interposée entre les première et deuxième zones précurseurs, de façon à ce que le substrat traverse les première et deuxième zones précurseurs plusieurs fois, qu’une mono- couche du premier gaz précurseur adsorbe à la surface du substrat pendant le transit du subs- trat dans la première zone précurseur et que, pendant un transit ultérieur du substrat dans la deuxième zone précurseur, le deuxième gaz précurseur réagisse avec le premier précurseur adsorbé à la surface du substrat afin de déposer un film mince sur le substrat ; introduction d’un gaz inerte dans la zone d’isolation ; et création d’un premier différentiel de pression en- tre la zone d’isolation et la première zone pré- curseur et d’un deuxième différentiel de pres- sion entre la zone d’isolation et la deuxième zo- ne précurseur, les différentiels de pression étant suffisants pour empêcher la migration des pre- mier et deuxième gaz précurseurs hors des pre- mière et deuxième zones précurseurs respecti- ves et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empê- che les réactions à l’intérieur des zones entre les quantités non-adsorbées des premier et deuxième gaz précurseurs.",False,0.023106546854942234,"8 B1
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-28
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-une deuxième zone précurseur (16, 116, 316) espacée de la première, le deuxième gaz précurseur étant différent du premier ; guidage d’un substrat flexible (12, 112, 312) selon un mouvement de navette entre les première et deuxième zones précurseurs, en passant par une série de passages d’étranglement (54, 56, 154, 156, 354, 356) d’une zone d’isolation (20, 120, 320) interposée entre les première et deuxième zones précurseurs, de façon à ce que le substrat traverse les première et deuxième zones précurseurs plusieurs fois, qu’une monocouche du premier gaz précurseur adsorbe à la surface du substrat pendant le transit du substrat dans la première zone précurseur et que, pendant un transit ultérieur du substrat dans la deuxième zone précurseur, le deuxième gaz précurseur réagisse avec le premier précurseur adsorbé à la surface du substrat afin de déposer un film mince sur le substrat ; introduction d’un gaz inerte dans la zone d’isolation ; et création d’un premier différentiel de pression entre la zone d’isolation et la première zone précurseur et d’un deuxième différentiel de pression entre la zone d’isolation et la deuxième zone précurseur, les différentiels de pression étant suffisants pour empêcher la migration des premier et deuxième gaz précurseurs hors des première et deuxième zones précurseurs respectives et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empêche les réactions à l’intérieur des zones entre les quantités non-adsorbées des premier et deuxième gaz précurseurs.
-
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-une deuxième zone précurseur (16, 116, 316) espacée de la première, le deuxième gaz précurseur étant différent du premier ;
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-introduction d'un gaz inerte dans la zone d'isolation ; et
-création d'un premier différentiel de pression entre la zone d'isolation et la première zone précurseur et d'un deuxième différentiel de pression entre la zone d'isolation et la deuxième zone précurseur, les différentiels de pression étant suffisants pour empêcher la migration des premier et deuxième gaz précurseurs hors des première et deuxième zones précurseurs respectives et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empêche les réactions à l'intérieur des zones entre les quantités non-adsorbées des premier et deuxième gaz précurseurs.",0.029525032092426188," B1
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-- une deuxième zone précurseur (16, 116, 316) espacée de la première, le deuxième gaz précurseur étant différent du premier ;
-- guidage d’un substrat flexible (12, 112, 312) selon un mouvement de navette entre les première et deuxième zones précurseurs, en passant par une série de passages d’étranglement (54, 56, 154, 156, 354, 356) d’une zone d’isolation (20, 120, 320) interposée entre les première et deuxième zones précurseurs, de façon à ce que le substrat traverse les première et deuxième zones précurseurs plusieurs fois, qu’une mono-couche du premier gaz précurseur adsorbe à la surface du substrat pendant le transit du substrat dans la première zone précurseur et que, pendant un transit ultérieur du substrat dans la deuxième zone précurseur, le deuxième gaz précurseur réagisse avec le premier précurseur adsorbé à la surface du substrat afin de déposer un film mince sur le substrat ;
-- introduction d’un gaz inerte dans la zone d’isolation ; et
-- création d’un premier différentiel de pression entre la zone d’isolation et la première zone précurseur et d’un deuxième différentiel de pression entre la zone d’isolation et la deuxième zone précurseur, les différentiels de pression étant suffisants pour empêcher la migration des premier et deuxième gaz précurseurs hors des première et deuxième zones précurseurs respectives et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empêche les réactions à l’intérieur des zones entre les quantités non-adsorbées des premier et deuxième gaz précurseurs.
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-**13.** ",0.03337612323491656,"
-une deuxième zone précurseur (16, 116, 316) espacée de la première, le deuxième gaz précurseur étant différent du premier ; guidage d'un substrat flexible (12, 112, 312) selon un mouvement de navette entre les première 5 et deuxième zones précurseurs, en passant par une série de passages d'étranglement (54, 56, 154, 156, 354, 356) d'une zone d'isolation (20, 120, 320) interposée entre les première et deuxième zones précurseurs, de façon à ce que 10 le substrat traverse les première et deuxième zones précurseurs plusieurs fois, qu'une monocouche du premier gaz précurseur adsorbe à la surface du substrat pendant le transit du substrat dans la première zone précurseur et que, 15 pendant un transit ultérieur du substrat dans la deuxième zone précurseur, le deuxième gaz précurseur réagisse avec le premier précurseur adsorbé à la surface du substrat afin de déposer un film mince sur le substrat ; 20 introduction d'un gaz inerte dans la zone d'isolation ; et création d'un premier différentiel de pression entre la zone d'isolation et la première zone précurseur et d'un deuxième différentiel de pres- 25 sion entre la zone d'isolation et la deuxième zone précurseur, les différentiels de pression étant suffisants pour empêcher la migration des premier et deuxième gaz précurseurs hors des première et deuxième zones précurseurs respecti- 30 ves et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empêche les réactions à l'intérieur des zones entre les quantités non-adsorbées des premier et deuxième gaz précurseurs. 3",0.03080872913992298,"
-une deuxième zone précurseur (16, 116, 316) espacée de la première, le deuxième gaz précurseur étant différent du premier ; guidage d’un substrat flexible (12, 112, 312) selon un mouvement de navette entre les première et deuxième zones précurseurs, en passant par une série de passages d’étranglement (54, 56, 154, 156, 354, 356) d’une zone d’isolation (20, 120, 320) interposée entre les première et deuxième zones précurseurs, de façon à ce que le substrat traverse les première et deuxième zones précurseurs plusieurs fois, qu’une monocouche du premier gaz précurseur adsorbe à la surface du substrat pendant le transit du substrat dans la première zone précurseur et que, pendant un transit ultérieur du substrat dans la deuxième zone précurseur, le deuxième gaz précurseur réagisse avec le premier précurseur adsorbé à la surface du substrat afin de déposer un film mince sur le substrat ; introduction d’un gaz inerte dans la zone d’isolation ; et
-
-création d’un premier différentiel de pression entre la zone d’isolation et la première zone précurseur et d’un deuxième différentiel de pression entre la zone d’isolation et la deuxième zone précurseur, les différentiels de pression étant suffisants pour empêcher la migration des premier et deuxième gaz précurseurs hors des première et deuxième zones précurseurs respectives et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empêche les réactions à l’intérieur des zones entre les quantités non-adsorbées des premier et deuxième gaz précurseurs.
-
-1. **13.** Le proc",0.1405648267008986,"une deuxième zone précurseur (16, 116, 316) espacée de la première, le deuxième gaz précurseur étant différent du premier ;
-
-guidage d'un substrat flexible (12, 112, 312) selon un mouvement de navette entre les première et deuxième zones précurseurs, en passant par une série de passages d'étranglement (54, 56, 154, 156, 354, 356) d'une zone d'isolation (20, 120, 320) interposée entre les première deuxième zones précurseurs, de façon à ce que le substrat traverse les première et deuxième zones précurseurs plusieurs fois, qu'une monocouche du premier gaz précurseur adsorbe à la surface du substrat pendant le transit du substrat dans la première zone précurseur et que, pendant un transit ultérieur du substrat dans la deuxième zone précurseur, le deuxième gaz précurseur réagisse avec le premier précurseur adsorbé à la surface du substrat afin de déposer un film mince sur le substrat ;
-
-5
-
-et
-
-10
-
-15
-
-20
-
-introduction d'un gaz inerte dans la d'isolation ; et création d'un premier différentiel de pression entre la zone d'isolation et la première zone précurseur et d'un deuxième différentiel de pression entre la zone d'isolation et la deuxième zone précurseur, les différentiels de pression étant suffisants pour empêcher la migration des premier et deuxième gaz précurseurs hors des première et deuxième zones précurseurs respectives et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empêche les réactions à l'intérieur des zones en",0.1405648267008986,"une deuxième zone précurseur (16, 116, 316) espacée de la première, le deuxième gaz précurseur étant différent du premier ;
-
-guidage d'un substrat flexible (12, 112, 312) selon un mouvement de navette entre les première et deuxième zones précurseurs, en passant par une série de passages d'étranglement (54, 56, 154, 156, 354, 356) d'une zone d'isolation (20, 120, 320) interposée entre les première deuxième zones précurseurs, de façon à ce que le substrat traverse les première et deuxième zones précurseurs plusieurs fois, qu'une monocouche du premier gaz précurseur adsorbe à la surface du substrat pendant le transit du substrat dans la première zone précurseur et que, pendant un transit ultérieur du substrat dans la deuxième zone précurseur, le deuxième gaz précurseur réagisse avec le premier précurseur adsorbé à la surface du substrat afin de déposer un film mince sur le substrat ;
-
-5
-
-et
-
-10
-
-15
-
-20
-
-introduction d'un gaz inerte dans la d'isolation ; et création d'un premier différentiel de pression entre la zone d'isolation et la première zone précurseur et d'un deuxième différentiel de pression entre la zone d'isolation et la deuxième zone précurseur, les différentiels de pression étant suffisants pour empêcher la migration des premier et deuxième gaz précurseurs hors des première et deuxième zones précurseurs respectives et le mélange des premier et deuxième gaz précurseurs dans une des zones, ce qui empêche les réactions à l'intérieur des zones en",123,patents
-123,1,"13. Le procédé de la revendication 12, qui suppose éga- lement de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz pré- curseur différent du deuxième est introduit.",False,0.02912621359223301,"13. Le procédé de la revendication 12, qui suppose également de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz précurseur différent du deuxième est introduit.
-
-",0.038834951456310676,"
-
-13. Le procédé de la revendication 12, qui suppose également de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz précurseur différent du deuxième est introduit.
-
-",0.038834951456310676,"13.** Le procédé de la revendication 12, qui suppose également de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz précurseur différent du deuxième est introduit.
-
-",0.038834951456310676,"*13.** Le procédé de la revendication 12, qui suppose également de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz précurseur différent du deuxième est introduit. ",0.038834951456310676,"13.** Le procédé de la revendication 12, qui suppose également de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz précurseur différent du deuxième est introduit.
-",0.1941747572815534,"e la revendication 12, qui suppose également de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz précurseur différent du deuxième est introduit",0.1941747572815534,"e la revendication 12, qui suppose également de guider le substrat dans une troisième zone précurseur (190) dans laquelle un troisième gaz précurseur différent du deuxième est introduit",123,patents
-123,2,"14. Le procédé de n’importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d’injecter le gaz inerte dans les passages.",False,0.0,"14. Le procédé de n’importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d’injecter le gaz inerte dans les passages.",0.011695906432748537,"14. Le procédé de n'importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d'injecter le gaz inerte dans les passages.",0.023391812865497075,"14.** Le procédé de n’importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d’injecter le gaz inerte dans les passage",0.03508771929824561,"4.** Le procédé de n'importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d'injecter le gaz inerte dans les passages",0.023391812865497075,"4.** Le procédé de n’importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d’injecter le gaz inerte dans les passages",0.16374269005847952,"rocédé de n'importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d'injecter le gaz inerte dans les pass",0.16374269005847952,"rocédé de n'importe laquelle des revendications 12 ou 13, dans lequel la création des différentiels de pression suppose d'injecter le gaz inerte dans les pass",123,patents
-123,3,"15. Le procédé de n’importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en na- vette entre les première et deuxième zones précur- seurs suppose de faire avancer continuellement le substrat sur un trajet de transport ondulé.",False,0.02390438247011952,"
-
-15. Le procédé de n’importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en navette entre les première et deuxième zones précurseurs suppose de faire avancer continuellement le substrat sur un trajet de transport ondulé.",0.035856573705179286,"
-
-15. Le procédé de n'importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en navette entre les première et deuxième zones précurseurs suppose de faire avancer continuellement le substrat sur un trajet de transport ondulé.
-
-",0.03187250996015936,"15.** Le procédé de n’importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en navette entre les première et deuxième zones précurseurs suppose de faire avancer continuellement le substrat sur un trajet de transport ondulé.
-
-",0.043824701195219126,"5.** Le procédé de n'importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en navette entre les première et deuxième zones précurseurs suppose de faire avancer continuellement le 50 substrat sur un trajet de transport ondulé.",0.03187250996015936,"15.** Le procédé de n’importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en navette entre les première et deuxième zones précurseurs suppose de faire avancer continuellement le substrat sur un trajet de transport ondulé.
-",0.05179282868525897,"5. Le procédé de n'importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en navette entre les première et deuxième zones précurseurs suppose de faire avancer continuellement le substrat sur un trajet de transport ondulé",0.05179282868525897,"5. Le procédé de n'importe laquelle des revendications 12 à 14, dans lequel le guidage du substrat en navette entre les première et deuxième zones précurseurs suppose de faire avancer continuellement le substrat sur un trajet de transport ondulé",123,patents
-123,4,"16. Le procédé de n’importe laquelle des revendications 12 à 15, qui suppose également d’ajuster une lon- gueur d’au moins certains des transits dans la pre- mière zone précurseur.",False,0.03333333333333333,"
-
-16. Le procédé de n’importe laquelle des revendications 12 à 15, qui suppose également d’ajuster une longueur d’au moins certains des transits dans la première zone précurseur.",0.06111111111111111,".
-
-16. Le procédé de n'importe laquelle des revendications 12 à 15, qui suppose également d'ajuster une longueur d'au moins certains des transits dans la première zone précurseur.
-",0.044444444444444446,"*16.** Le procédé de n’importe laquelle des revendications 12 à 15, qui suppose également d’ajuster une longueur d’au moins certains des transits dans la première zone précurseur.
-",0.07222222222222222," Le procédé de n'importe laquelle des revendications 12 à 15, qui suppose également d'ajuster une longueur d'au moins certains des transits dans la pre- 55 mière zone précurseur.
-
-",0.044444444444444446,"*16.** Le procédé de n’importe laquelle des revendications 12 à 15, qui suppose également d’ajuster une longueur d’au moins certains des transits dans la première zone précurseur. ",0.08333333333333333,"6. Le procédé de n'importe laquelle des revendications 12 à 15, qui suppose également d'ajuster une longueur d'au moins certains des transits dans la première zone précurseur",0.08333333333333333,"6. Le procédé de n'importe laquelle des revendications 12 à 15, qui suppose également d'ajuster une longueur d'au moins certains des transits dans la première zone précurseur",123,patents
-123,5,17. Le procédé de n’importe laquelle des revendications,False,0.0,17. Le procédé de n’importe laquelle des revendications,0.01818181818181818,17. Le procédé de n'importe laquelle des revendications,0.05454545454545454,.** Le procédé de n’importe laquelle des revendications,0.07272727272727272,.** Le procédé de n'importe laquelle des revendications,0.05454545454545454,.** Le procédé de n’importe laquelle des revendications,0.2, procédé de n'importe laquelle des revendications,0.2, procédé de n'importe laquelle des revendications,123,patents
-123,6,EP 2 000 008 B1,False,0.0,EP 2 000 008 B1,0.8666666666666667," (20, 120, 320)",0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.0,EP 2 000 008 B1,0.8,"tion (20, 120, ",0.8,"tion (20, 120, ",123,patents
-125,0,"US 7,851,130 B2",False,0.0,"US 7,851,130 B2",0.8666666666666667,om 5 to 30 mol ,0.0,"US 7,851,130 B2",0.0,"US 7,851,130 B2",0.0,"US 7,851,130 B2",0.8666666666666667,rom 5 to 30 mo!,0.8666666666666667,rom 5 to 30 mo!,125,patents
-125,1,"In formula (F2), Rx represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exempli- fied. Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond. Fb represents a monocyclic or polycyclic hydrocarbon group. Fe represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group. F 1 represents a group represented by formula (F 1). P1 represents from 1 to 3. As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbomyl group is preferred. The specific examples of the repeating units having the structure represented by formula (Fl) are shown below.",False,0.03864168618266979,"n formula (F2), Rx represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exemplified.
-
-Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
-
-Fb represents a monocyclic or polycyclic hydrocarbon
-group.
-
-Fc represents a single bond or a straight chain or branched 20
-
-alkylene group, and preferably a single bond or a methylene group.
-
-F₁ represents a group represented by formula (F1).
-
-P1 represents from 1 to 3.
-
-As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbomyl group is preferred.
-
-The specific examples of the repeating units having the structure represented by formula (Fl) are shown",0.07962529274004684,"rmula (F2), Rx represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exemplified.
-
-Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
-
-Fb represents a monocyclic or polycyclic hydrocarbon group.
-
-Fc represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group.
-
-F1 represents a group represented by formula (F1).
-
-P1 represents from 1 to 3.
-
-As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbornyl group is preferred.
-
-The specific examples of the repeating units having the structure represented by formula ",0.06791569086651054," represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by $Rx$ may have, a hydroxyl group and a halogen atom are exemplified.
-
-$Fa$ represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
-
-$Fb$ represents a monocyclic or polycyclic hydrocarbon group.
-
-$Fc$ represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group.
-
-$F_1$ represents a group represented by formula (F1).
-
-$p_1$ represents from 1 to 3.
-
-As the cyclic hydrocarbon group represented by $Fb$, a cyclopentyl group, a cyclohexyl group, or a norbornyl group is preferred.
-
-The specific examples of the repeating units having the structure represented by formula (F1) are shown below",0.03044496487119438,"In formula (F2), Rx represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exemplified.
-
-Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
-
-Fb represents a monocyclic or polycyclic hydrocarbon group.
-
-Fc represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group.
-
-F1 represents a group represented by formula (F1).
-
-P1 represents from 1 to 3.
-
-As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbornyl group is preferred.
-
-The specific examples of the repeating units having the structure represented by formula (F1) are shown be",0.03747072599531616,"rmula (F2), Rx represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exemplified.
-
-Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
-
-> Fb represents a monocyclic or polycyclic hydrocarbon group.
-
-Fe represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group.
-
-F 1 represents a group represented by formula (F 1).
-
-P1 represents from 1 to 3.
-
-As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbomyl group is preferred.
-
-The specific examples of the repeating units having the structure represented by formula (Fl) are sho",0.07494145199063232,"x represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exempli› fied.
-
-Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
-
-Fb represents a monocyclic or polycyclic hydrocarbon group.
-
-Fe represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group.
-
-F 1 represents a group represented by formula (F 1).
-
-P1 represents from 1 to 3.
-
-As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbomyl group is preferred.
-
-The specific examples of the repeating units having the structure represented by formula (Fl) are sh",0.07494145199063232,"x represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exempli› fied.
-
-Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
-
-Fb represents a monocyclic or polycyclic hydrocarbon group.
-
-Fe represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group.
-
-F 1 represents a group represented by formula (F 1).
-
-P1 represents from 1 to 3.
-
-As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbomyl group is preferred.
-
-The specific examples of the repeating units having the structure represented by formula (Fl) are sh",125,patents
-125,2,"The alicyclic hydrocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating struc- tural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity. As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto. By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hydro-",False,0.174931129476584,"rbon-based acid-decomposable resin in the invention can contain various kinds of repeating structural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity.
-
-As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto.
-
-By containing such various repeating structural units, fine adjustment of perfo",0.008264462809917356,"The alicyclic hydrocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating structural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity.
-
-As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto.
-
-By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hydro-",0.011019283746556474,"
-The alicyclic hydrocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating structural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity.
-
-As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto.
-
-By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hydro",0.008264462809917356,"The alicyclic hydrocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating structural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity.
-
-As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto.
-
-By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hydro-",0.005509641873278237,"The alicyclic hydrocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating structural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity.
-
-As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto. By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hydro-",0.045454545454545456,"c hydrocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating struc› tural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity.
-
-As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto.
-
-By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hyd",0.045454545454545456,"c hydrocarbon-based acid-decomposable resin in the invention can contain various kinds of repeating struc› tural units, besides the above repeating structural units, for the purpose of the adjustments of dry etching resistance, aptitude for standard developing solutions, adhesion to a substrate, resist profile, and further, general requisite performances of resists, e.g., resolution, heat resistance and sensitivity.
-
-As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto.
-
-By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hyd",125,patents
-126,0,c12) United States Patent Kawanishi et al.,False,0.19047619047619047," United States Patent
-
-# Kawanishi et al.
-",0.2857142857142857,"United States Patent**
-**Kawanishi et al",0.11904761904761904,"12) United States Patent
-**Kawanishi et al",0.23809523809523808,"*United States Patent**
-**Kawanishi et al.",0.38095238095238093,"nited States Patent**
-
-# **Kawanishi et a",0.07142857142857142,"12) United States Patent
-
-Kawanishi et al.",0.07142857142857142,"12) United States Patent
-
-Kawanishi et al.",126,patents
-126,2,"(IO) Patent No.: US 7,851,130 B2",False,0.21875," Patent No.:
-
-# US 7,851,130 B2",0.3125,"Patent No.:** **US 7,851,130 B2*",0.1875,") Patent No.:** US 7,851,130 B2 ",0.21875," **Patent No.: US 7,851,130 B2**",0.125,"O) **Patent No.: US 7,851,130 B2",0.09375,"(IO) Patent No.:
-
-US 7,851,130 B",0.09375,"(IO) Patent No.:
-
-US 7,851,130 B",126,patents
-126,3,"(45) Date of Patent: *Dec. 14, 2010",False,0.22857142857142856,") Date of Patent:
-
-# *Dec. 14, 201",0.2857142857142857,"Date of Patent:** **\*Dec. 14, 2010",0.11428571428571428,"(45) Date of Patent:** *Dec. 14, 20",0.14285714285714285,"s> **Date of Patent: *Dec. 14, 2010",0.11428571428571428,"(45) **Date of Patent: *Dec. 14, 20",0.08571428571428572,"45) Date of Patent:
-
-*Dec. 14, 2010",0.08571428571428572,"45) Date of Patent:
-
-*Dec. 14, 2010",126,patents
-126,4,"(54) PHOTOSENSITIVE COMPOSITION, COMPOUND FOR USE IN THE PHOTOSENSITIVE COMPOSITION, AND PATTERN-FORMING METHOD USING THE PHOTOSENSITIVE COMPOSITION",False,0.04054054054054054,"(54) PHOTOSENSITIVE COMPOSITION,
-COMPOUND FOR USE IN THE
-PHOTOSENSITIVE COMPOSITION, AND
-PATTERN-FORMING METHOD USING THE
-PHOTOSENSITIVE COMPOSITIO",0.32432432432432434,"TIVE COMPOSITION,**
-**COMPOUND FOR USE IN THE**
-**PHOTOSENSITIVE COMPOSITION, AND**
-**PATTERN-FORMING METHOD USING THE**
-**PHOTOSENSITIVE CO",0.0,"(54) PHOTOSENSITIVE COMPOSITION, COMPOUND FOR USE IN THE PHOTOSENSITIVE COMPOSITION, AND PATTERN-FORMING METHOD USING THE PHOTOSENSITIVE COMPOSITION",0.02702702702702703,"(54) **PHOTOSENSITIVE COMPOSITION, COMPOUND FOR USE IN THE PHOTOSENSITIVE COMPOSITION, AND PATTERN-FORMING METHOD USING THE PHOTOSENSITIVE COMPOSITI",0.02702702702702703,"54) **PHOTOSENSITIVE COMPOSITION, COMPOUND FOR USE IN THE PHOTOSENSITIVE COMPOSITION, AND PATTERN-FORMING METHOD USING THE PHOTOSENSITIVE COMPOSITIO",0.08108108108108109,") PHOTOSENSITIVE COMPOSITION,
-
-COMPOUND FOR USE IN THE
-
-PHOTOSENSITIVE COMPOSITION, AND
-
-PATTERN-FORMING METHOD USING THE
-
-PHOTOSENSITIVE COMPOSITIO",0.08108108108108109,") PHOTOSENSITIVE COMPOSITION,
-
-COMPOUND FOR USE IN THE
-
-PHOTOSENSITIVE COMPOSITION, AND
-
-PATTERN-FORMING METHOD USING THE
-
-PHOTOSENSITIVE COMPOSITIO",126,patents
-126,5,"(75) Inventors: Yasutomo Kawanishi, Ashigarakami-gun (JP); Kenji Wada, Haibara-gun (JP)",False,0.022988505747126436,"(75) Inventors: Yasutomo Kawanishi,
-Ashigarakami-gun (JP); Kenji Wada,
-Haibara-gun (JP)",0.3218390804597701,"(75) **Inventors:** **Yasutomo Kawanishi,**
-**Ashigarakami-gun (JP); Kenji Wada,**
-",0.04597701149425287,"5) Inventors:** Yasutomo Kawanishi, Ashigarakami-gun (JP); Kenji Wada, Haibara-gun (JP)",0.04597701149425287,"5) **Inventors: Yasutomo Kawanishi, Ashigarakami-gun (JP); Kenji Wada, Haibara-gun (JP)",0.1839080459770115,") Inventors: **Yasutomo Kawanishi,** Ashigarakami-gun (JP); **Kenji Wada,** Haibara-gun",0.1724137931034483," ( *) Notice:
-
-Yasutomo Kawanishi,
-
-Ashigarakami-gun (JP); Kenji Wada, Haibara-gun (JP)",0.1724137931034483," ( *) Notice:
-
-Yasutomo Kawanishi,
-
-Ashigarakami-gun (JP); Kenji Wada, Haibara-gun (JP)",126,patents
-126,6,"(73) Assignee: FUJIFILM Corporation, Tokyo (JP)",False,0.0,"(73) Assignee: FUJIFILM Corporation, Tokyo (JP)",0.19148936170212766,"*Assignee:** **FUJIFILM Corporation, Tokyo (JP)",0.0851063829787234,"(73) Assignee:** FUJIFILM Corporation, Tokyo (J",0.0851063829787234,"(73) **Assignee: FUJIFILM Corporation, Tokyo (J",0.1702127659574468,") Assignee: **FUJIFILM Corporation,** Tokyo (JP",0.3404255319148936,"ara-gun (JP)
-
-FUJIFILM Corporation, Tokyo (JP)
-",0.3404255319148936,"ara-gun (JP)
-
-FUJIFILM Corporation, Tokyo (JP)
-",126,patents
-126,7,"(21) Appl. No.: 11/857,645",False,0.0,"(21) Appl. No.: 11/857,645",0.34615384615384615,"*Appl. No.:** **11/857,645",0.15384615384615385,"1) Appl. No.:** 11/857,645",0.15384615384615385,"1) **Appl. No.: 11/857,645",0.15384615384615385,"(21) Appl. No.: **11/857,6",0.0,"(21) Appl. No.: 11/857,645",0.0,"(21) Appl. No.: 11/857,645",126,patents
-126,8,G03F 71038 (2006.01) G03F 71039 (2006.01) G03F 7120 (2006.01),False,0.4918032786885246,"G03F 7/038 | (2006.01) |
-|-|-|
-| G03F 7/039 | (2006.01)",0.39344262295081966," (2006.01)
-
-**G03F 7/039** (2006.01)
-
-**G03F 7/20** (2006.01)",0.4262295081967213,"(2006.01)
-- **G03F 7/039** (2006.01)
-- **G03F 7/20** (2006.01",0.2459016393442623,"F 7/038* (2006.01)
-*G03F 7/039* (2006.01)
-*G03F 7/20* (2006.0",0.8688524590163934,"No.: **11/857,645**
-
-- (22) Filed: **Sep.19,2007**
-
-## (65)",0.2459016393442623,"03F 71038
-
-(2006.01)
-
-G03F 71039
-
-(2006.01)
-
-G03F 7120
-
-(2006",0.2459016393442623,"03F 71038
-
-(2006.01)
-
-G03F 71039
-
-(2006.01)
-
-G03F 7120
-
-(2006",126,patents
-126,9,"References Cited U.S. PATENT DOCUMENTS 6,680,157 Bl 1/2004 Fedynyshyn 2006/0210919 Al * 9/2006 Mizutani et al. ......... 430/270.1 2007/0072117 Al* 3/2007 Mizutani et al. ......... 430/270.1",False,0.5631578947368421," | B1 | 1/2004 | Fedynyshyn | |
-|-|-|-|-|-|
-| 2006/0210919 | A1* | 9/2006 | Mizutani et al. | 430/270.1 |
-| 2007/0072117 | A1* | 3/2007 | Mizutani et al. | 430/270.",0.16842105263157894,"eferences Cited**
-
-**U.S. PATENT DOCUMENTS**
-
-6,680,157 B1 1/2004 Fedynyshyn
-2006/0210919 A1\* 9/2006 Mizutani et al. ........ 430/270.1
-2007/0072117 A1\* 3/2007 Mizutani et al. ........",0.4421052631578947,"- | :--- | :--- | :--- |
-| 6,680,157 B1 | 1/2004 | Fedynyshyn | |
-| 2006/0210919 A1* | 9/2006 | Mizutani et al. | 430/270.1 |
-| 2007/0072117 A1* | 3/2007 | Mizutani et al. | 430/270.1 |
-
-**F",0.47368421052631576,"- | -------------------------- | --------- |
-| 2006/0210919 A1 \* | 9/2006 | Mizutani et al. .......... | 430/270.1 |
-| 2007/0072117 A1 \* | 3/2007 | Mizutani et al. .......... | 430/270.1 |",0.8368421052631579,"
-
-## (56) **References Cited**
-
-## U.S. PATENT DOCUMENTS
-
-**==> picture [217 x 57] intentionally omitted <==**
-
-**==> picture [141 x 116] intentionally omitted <==**
-
-## OTHER PUBLICATION",0.47368421052631576,"erences Cited
-
-## U.S. PATENT DOCUMENTS
-
-6,680,157 Bl
-
-2006/0210919 Al *
-
-2007/0072117 Al*
-
-1/2004 Fedynyshyn
-
-9/2006
-
-Mizutani et al. ......... 430/270.1
-
-3/2007 Mizutani et al. .......",0.47368421052631576,"erences Cited
-
-## U.S. PATENT DOCUMENTS
-
-6,680,157 Bl
-
-2006/0210919 Al *
-
-2007/0072117 Al*
-
-1/2004 Fedynyshyn
-
-9/2006
-
-Mizutani et al. ......... 430/270.1
-
-3/2007 Mizutani et al. .......",126,patents
-126,10,FOREIGN PATENT DOCUMENTS EP 1480078 Al 5/2004 EP 1 693 705 A2 * 8/2006 EP 1 703 326 A2 * 9/2006 EP 1 767 991 A2 * 3/2007,False,0.575,"## FOREIGN PATENT DOCUMENTS
-
-| EP | 1480078 | Al | 5/2004 |
-|-|-|-|-|
-
-| EP | 1 693 705 | A2 | * | 8/200",0.19166666666666668,"FOREIGN PATENT DOCUMENTS**
-
-EP 1480078 A1 5/2004
-
-EP 1 693 705 A2 \* 8/2006
-EP 1 703 326 A2 \* 9/2006
-EP 1 767 991 A",0.38333333333333336,"- |
-| EP 1 480 078 A1 | 5/2004 |
-| EP 1 693 705 A2* | 8/2006 |
-| EP 1 703 326 A2* | 9/2006 |
-| EP 1 767 991 A2* | 3/2007",0.575,"OREIGN PATENT DOCUMENTS**
-
-| EP | 1480078 A1 | 5/2004 |
-| -- | ---------- | ------ |
-
-
-| EP | 1 693 705 A2 \* | 8/2006 ",0.85,S. Cl.** .................... **430/270.1;** 430/922; 430/325; 430/326; 430/942; 430/966; 549/26; 549/16; 549/17; 549/20,0.5333333333333333,"of Patent:
-
-*Dec. 14, 2010
-
-EP
-
-1 693 705 A2 *
-
-8/2006
-
-EP
-
-1 703 326 A2 *
-
-9/2006
-
-EP
-
-1 767 991 A2 *
-
-3/2007
-
-JP",0.5333333333333333,"of Patent:
-
-*Dec. 14, 2010
-
-EP
-
-1 693 705 A2 *
-
-8/2006
-
-EP
-
-1 703 326 A2 *
-
-9/2006
-
-EP
-
-1 767 991 A2 *
-
-3/2007
-
-JP",126,patents
-126,11,"OTHER PUBLICATIONS Machine-assisted English translation of JP2006-276759 provided by JPO.* * cited by examiner Primary Examiner-Sin J. Lee (74) Attorney, Agent, or Firm-Sughrue Mion, PLLC",False,0.06951871657754011,"ER PUBLICATIONS
-
-Machine-assisted English translation of JP2006-276759 provided by
-JPO.*
-
-* cited by examiner
-
-Primary Examiner-Sin J. Lee
-
-(74)Attorney, Agent, or Firm-Sughrue Mion, PLLC",0.18181818181818182,"PUBLICATIONS**
-
-Machine-assisted English translation of JP2006-276759 provided by JPO.\*
-
-\* cited by examiner
-
-**Primary Examiner—Sin J. Lee**
-
-(74) **Attorney, Agent, or Firm—Sughrue Mi",0.21390374331550802,"OTHER PUBLICATIONS**
-
-- Machine-assisted English translation of JP2006-276759 provided by JPO.*
-
-\* cited by examiner
-
-**Primary Examiner** — Sin J. Lee
-**(74) Attorney, Agent, or Firm*",0.13903743315508021,"OTHER PUBLICATIONS**
-
-Machine-assisted English translation of JP2006-276759 provided by JPO.*
-
-\* cited by examiner
-
-*Primary Examiner*—Sin J. Lee
-(74) *Attorney, Agent, or Firm*—Sughrue ",0.11764705882352941,"OTHER PUBLICATIONS
-
-Machine-assisted English translation of JP2006-276759 provided by JPO.*
-
-* cited by examiner
-
-_Primary Examiner-Sin_ J. Lee
-
-(74) _Attorney, Agent, or Firm-Sughrue",0.11229946524064172," PUBLICATIONS
-
-Machine-assisted English translation of JP2006-276759 provided by JPO.*
-
-## * cited by examiner
-
-Primary Examiner-Sin J. Lee
-
-(74) Attorney, Agent, or Firm-Sughrue Mion, ",0.11229946524064172," PUBLICATIONS
-
-Machine-assisted English translation of JP2006-276759 provided by JPO.*
-
-## * cited by examiner
-
-Primary Examiner-Sin J. Lee
-
-(74) Attorney, Agent, or Firm-Sughrue Mion, ",126,patents
-126,12,"(57) ABSTRACT A photosensitive composition includes (A) a compound rep- resented by the following formula (I): wherein R 1 to R 13 each independently represents a hydrogen atom or a substituent, Z represents a single bond or a divalent linking group, and x- represents an anion containing a proton acceptor functional group.",False,0.2962962962962963,"ts a single bond or divalent linking group.
-X⁻ represents an anion with a proton acceptor functional group.
-
-wherein R 1 to R 13 each independently represents a hydrogen atom or a substituent, Z represents a single bond or a divalent linking group, and x- represents an anion containing a proton acceptor functional group.
-
-",0.36728395061728397,"ects the two rings. An anion X^- is shown attached to the right ring.]()
-
-(I)
-
-wherein R1 to R13 each independently represents a hydrogen atom or a substituent, Z represents a single bond or a divalent linking group, and X- represents an anion containing a proton acceptor functional group.
-",0.4228395061728395," An associated anion is denoted as $X^-$.
-
-wherein $R^1$ to $R^{13}$ each independently represents a hydrogen atom or a substituent, $Z$ represents a single bond or a divalent linking group, and $X^-$ represents an anion containing a proton acceptor functional group.
-
-**16 Claims, 1 Drawing Sheet**",0.36419753086419754," R13), benzene rings, and X- counter ion - Formula (I)]
-
-wherein R1 to R13 each independently represents a hydrogen atom or a substituent, Z represents a single bond or a divalent linking group, and X- represents an anion containing a proton acceptor functional group.
-",0.3765432098765432,"on includes (A) a compound represented by the following formula (I):
-
-**==> picture [144 x 16] intentionally omitted <==**
-
-wherein R[1 ] to R[13 ] each independently represents a hydrogen atom or a substituent, Z represents a single bond or a divalent linking group, and x- represents an anion containing a proton acceptor",0.11419753086419752,"photosensitive composition includes (A) a compound rep› resented by the following formula (I):
-
-
-
-wherein R 1 to R 13 each independently represents a hydrogen atom or a substituent, Z represents a single bond or a divalent linking group, and x- represents an anion containing a proton acceptor functional grou",0.11419753086419752,"photosensitive composition includes (A) a compound rep› resented by the following formula (I):
-
-
-
-wherein R 1 to R 13 each independently represents a hydrogen atom or a substituent, Z represents a single bond or a divalent linking group, and x- represents an anion containing a proton acceptor functional grou",126,patents
-126,13,"16 Claims, 1 Drawing Sheet",False,0.0,"16 Claims, 1 Drawing Sheet",0.0,"16 Claims, 1 Drawing Sheet",0.0,"16 Claims, 1 Drawing Sheet",0.0,"16 Claims, 1 Drawing Sheet",0.0,"16 Claims, 1 Drawing Sheet",0.0,"16 Claims, 1 Drawing Sheet",0.0,"16 Claims, 1 Drawing Sheet",126,patents
-127,0,-continued,False,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,0.0,-continued,127,patents
-127,1,US 2020/0050106 Al,False,0.0,US 2020/0050106 Al,0.7777777777777778,"1 to 20.
-
-[0296] F",0.05555555555555555,US 2020/0050106 A1,0.05555555555555555,US 2020/0050106 A1,0.0,US 2020/0050106 Al,0.8333333333333334," R201 , R202 , a",0.8333333333333334," R201 , R202 , a",127,patents
-127,2,"Feb. 13, 2020",False,0.0,"Feb. 13, 2020",0.6923076923076923,ably 1 to 20.,0.0,"Feb. 13, 2020",0.0,"Feb. 13, 2020",0.0,"Feb. 13, 2020",0.6153846153846154,"R 201 , R202 ",0.6153846153846154,"R 201 , R202 ",127,patents
-127,3,"[0293] In General Formula (ZI), [0294] R201 , R202, and R203 each independently represent an organic group. [0295] The number of carbon atoms of the organic group as each of R201 , R202, and R203 is preferably 1 to 30, and",False,0.02702702702702703,"[0293] In General Formula (ZI),
-
-[0294] R201 , R202, and R203 each independently represent an organic group.
-
-[0295] The number of carbon atoms of the organic group as each of R201 , R202, and R203 is preferably 1to 30, an",0.4099099099099099,"[0293] In General Formula (ZI),
-
-[0294] $\text{R}_{201}$ , $\text{R}_{202}$ , and $\text{R}_{203}$ each independently represent an organic group.
-
-[0295] The number of carbon atoms of the organic group as each of $\te",0.26126126126126126,"[0293] In General Formula (ZI),
-
-[0294] $R_{201}$, $R_{202}$, and $R_{203}$ each independently represent an organic group.
-
-[0295] The number of carbon atoms of the organic group as each of $R_{201}$, $R_{202}$, and $R_{20",0.34684684684684686,"0293] In General Formula (ZI),
-[0294] R201, R202, and R203 each independently represent an organic group.
-[0295] The number of carbon atoms of the organic group as each of R201, ",0.16216216216216217," In General Formula **(ZI),**
-
-**[0294]** R201 , R202 , and R203 each independently represent an organic group.
-
-**[0295]** The number of carbon atoms of the organic group as each of R201 , R202 , and R203 is preferably ",0.10810810810810811,"0293] In General Formula (ZI),
-
-[0294] R201 , R202 , and R 203 each independently represent an organic group.
-
-[0295] The number of carbon atoms of the organic group as each of R 201 , R202 , and R203 is preferably 1 ",0.10810810810810811,"0293] In General Formula (ZI),
-
-[0294] R201 , R202 , and R 203 each independently represent an organic group.
-
-[0295] The number of carbon atoms of the organic group as each of R 201 , R202 , and R203 is preferably 1 ",127,patents
-127,4,350A3,False,0.2,250A3,0.2,350A<,0.4, 350A,0.4, 350A,0.4,50A[3,0.8,[0293,0.8,[0293,127,patents
-127,5,"[0301] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxy- carbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1 to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxy- sulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having 10 to 20 carbon atoms), an alkyloxyalkyloxy group (preferably hav- ing 5 to 20 carbon atoms), and a cycloalkylalkyloxyalkyloxy group (preferably having 8 to 20 carbon atoms).",False,0.005809128630705394,"[0301] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxycarbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxysulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having 10 to 20 carbon atoms), an alkyloxyalkyloxy group (preferably having 5 to 20 carbon atoms), and a cycloalkylalkyloxyalkyloxy group (preferably having 8 to 20 carbon atoms).",0.010788381742738589,"[0301] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as a fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxy-carbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxy carbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1 to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxsulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxsulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxsulfonyl group (preferably having 10 to 20 carbon atoms), an alkoxyalkyloxy group (preferably having 5 to 20 carbon atoms), and a cycloalkylalkyloxyalkyloxy group (preferably having 8 to 20 carbon atoms).",0.004979253112033195,"[0301] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxycarbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1 to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxysulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having 10 to 20 carbon atoms), an alkyloxyalkyloxy group (preferably having 5 to 20 carbon atoms), and a cycloalkylalkyloxyalkyloxy group (preferably having 8 to 20 carbon atoms).",0.00995850622406639,"oup.
-[0301] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxycarbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1 to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxysulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having 10 to 20 carbon atoms), an alkyloxyalkyloxy group (preferably having 5 to 20 carbon atoms), and a cycloalkylalkyloxyalkyloxy group (preferably having 8 to 20 carbon atoms).
-",0.03983402489626556,"cific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having **1** to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to **14** carbon atoms), an alkoxycarbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having **1** to 15 carbon atoms), an alkylsulfonyl group (preferably having **1** to 15 carbon atoms), an alkyliminosulfonyl group (preferably having **1** to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxysulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having **10** to 20 carbon atoms), an alkyloxyalkyloxy group (preferably having 5 to 20 carbon atoms), and a cycloalkylalkyloxyalkyloxy group (preferably having 8 to 20 carbon",0.0954356846473029,"01] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxy› carbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1 to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxy› sulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having 10 to 20 carbon atoms), an alkyloxyalkyloxy group (preferably hav› ing 5 to 20 carbon atoms), and a cycloalkylalkyloxyalk",0.0954356846473029,"01] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxy› carbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1 to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxy› sulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having 10 to 20 carbon atoms), an alkyloxyalkyloxy group (preferably hav› ing 5 to 20 carbon atoms), and a cycloalkylalkyloxyalk",127,patents
diff --git a/benchmark_granular.csv b/benchmark_granular.csv
index 0cb5fcd..537bf64 100644
--- a/benchmark_granular.csv
+++ b/benchmark_granular.csv
@@ -42,7 +42,7 @@ The complexity of Phase II is difficult to determine, however, it can be measure
The initial allocation phase has a complexity of O ( KN 2 ) which is the same as Algorithm 1. Next, we perform a one dimensional search for the user in cell l with maximum incremental throughput at subcarrier n . The process is repeated for each subcarrier and cell. Thus, the computational complexity of this step is O ( KNL ) . Since, the process continues until convergence, (i.e., M iterations), the complexity of this step can be written as O ( KNLM ) . Finally, the total complexity of subcarrier allocation phase is O ( KN 2 + NKLM ) .
The complexity of Phase II is difficult to determine, however, it can be measured in terms of the degree of difficulty (DoD) that in turn relies on the number of constraints and variables associated with the GP [15]. Since we are dealing with LK power constraints and LKN power variables, the total computational complexity of centralized scheme A is O ( KN 2 + NKLM ) + DoD ( LKN ) . Apparently it seems that implementing centralized GP/successive GP based schemes may no",1,science_sample
-2,0,"Substantial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and im- purities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-offcurrent ratio is 105, the on-current level is around 10 µA and the estimated hole mobility is larger than 2 cm2/vs. The present results are demonstrated by optical absorption, Raman and electrical measurements.",False,0.01954022988505747,"ubstantial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 105 , the on-current level is around 10 µA and the estimated hole mobility is larger than 2 cm2/vs. The present results are demonstrated by optical absorption, Raman and electrical measureme",0.10114942528735632,"ield effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is $10^5$ , the on-current level is around $10 \mu\text{A}$ and the estimated hole mobility is larger than $2 \text{ cm}^2/\text{vs}$ . The present results are demonstrated by optical absorption, Raman and electrical measuremen",0.09540229885057472,"ield effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is $10^5$, the on-current level is around $10 \, \mu\text{A}$ and the estimated hole mobility is larger than $2 \text{ cm}^2/\text{Vs}$. The present results are demonstrated by optical absorption, Raman and electrical measurements.",0.067816091954023,"ubstantial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 105, the on-current level is around 10 μA and the estimated hole mobility is larger than 2 cm2/vs. The present results are demonstrated by optical absorption, Raman and ",0.029885057471264367,"antial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 10[5] , the on-current level is around 10 µA and the estimated hole mobility is larger than 2 cm[2] /vs. The present results are demonstrated by optical absorption, Raman and electrical measureme",0.027586206896551724,"ntial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 10 5 , the on-current level is around 10 µ A and the estimated hole mobility is larger than 2 cm 2 /vs. The present results are demonstrated by optical absorption, Raman and electrical measurement",0.027586206896551724,"ntial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 10 5 , the on-current level is around 10 µ A and the estimated hole mobility is larger than 2 cm 2 /vs. The present results are demonstrated by optical absorption, Raman and electrical measurement",2,science_sample
+2,0,"Substantial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and im- purities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-offcurrent ratio is 105, the on-current level is around 10 µA and the estimated hole mobility is larger than 2 cm2/vs. The present results are demonstrated by optical absorption, Raman and electrical measurements.",False,0.01954022988505747,"ubstantial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 105 , the on-current level is around 10 µA and the estimated hole mobility is larger than 2 cm2/vs. The present results are demonstrated by optical absorption, Raman and electrical measureme",0.1,"ld effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is $10^5$ , the on-current level is around $10 \mu\text{A}$ and the estimated hole mobility is larger than $2 \text{ cm}^2/\text{vs}$ . The present results are demonstrated by optical absorption, Raman and electrical measurements",0.09540229885057472,"ield effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is $10^5$, the on-current level is around $10 \, \mu\text{A}$ and the estimated hole mobility is larger than $2 \text{ cm}^2/\text{Vs}$. The present results are demonstrated by optical absorption, Raman and electrical measurements.",0.067816091954023,"stantial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 105, the on-current level is around 10 μA and the estimated hole mobility is larger than 2 cm2/vs. The present results are demonstrated by optical absorption, Raman and el",0.029885057471264367,"antial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 10[5] , the on-current level is around 10 µA and the estimated hole mobility is larger than 2 cm[2] /vs. The present results are demonstrated by optical absorption, Raman and electrical measureme",0.027586206896551724,"ntial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 10 5 , the on-current level is around 10 µ A and the estimated hole mobility is larger than 2 cm 2 /vs. The present results are demonstrated by optical absorption, Raman and electrical measurement",0.027586206896551724,"ntial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is 10 5 , the on-current level is around 10 µ A and the estimated hole mobility is larger than 2 cm 2 /vs. The present results are demonstrated by optical absorption, Raman and electrical measurement",2,science_sample
2,1,"Novel semiconductors materials for field effect tran- sistor FET and thin-film transistors TFT are highly demanded.1 In particular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-offcurrent ratio, high electron/hole mobil- ity, to carry high current density and to operate at high frequencies.2–5 Several groups have demonstrated excellent transfer characteristics using individual s- SWNTs,2–5 but generally poor ones using ensemble (net- work and thin film) of SWNTs due to traces of metal- lic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles).6–8 Therefore, very efficient meth- ods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still re- quired. In recent years, several approaches to extract s- SWNTs from nanotube powders were explored using for instance chemical functionalization,9–11 DNA and polymers wrapping,12,13 and density gradient ultra- centrifugation techniques.6 The latter efficiently sepa- rates s-SWNTs and m-SWNTs, but traces of surfactant and density gradient materials limit the performances of the FET. Very recently, two groups have reported on the selective extraction of near-armchair s-SWNTs from nanotube powders using polyfluorene as extracting agent.14,15 According to Nish et al.,14 the sample shows no detectable traces of m-SWNTs based only on optical spectroscopy. However, neither the electrical properties nor the fabrication of FET devices were addressed. In this letter, we report on the electronic properties of FET consisting of semiconducting-enriched single wall carbon nanotubes, without detectable traces of metallic nanotubes and impurities, with in our detection limits. This unprecedented achievement is made possible by ul- tracentrifugation (250,000g), sonication and filtration of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Evidences are gathered by optical absorption, Raman and electrical measure- ments (see Fig.1). We shall demonstrate that such s- SWNTs realize high-performances FET devices compare to networks/thin films of SWNTs and solution process- able polymers/organic materials.1,6,16 S-SWNTs solutions were prepared as follow. First, SWNTs powders (as-prepared HiPco, Carbon Nanotech- nologies Inc.), PFO (Poly-9,9-di-n-octyl-fluorenyl-2,7- diyl, Sigma-Aldrich) and toluene were mixed in the fol- lowing ratio SWNT (5 mg): PFO (5 mg): toluene (30 ml)",False,0.16453162530024018,"
Novel semiconductors materials for field effect transistor FET and thin-film transistors TFT are highly demanded.1 In particular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-off current ratio, high electron/hole mobility, to carry high current density and to operate at high frequencies.2–5 Several groups have demonstrated excellent transfer characteristics using individual sSWNTs, 2–5 but generally poor ones using ensemble (network and thin film) of SWNTs due to traces of metallic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles).6–8 Therefore, very efficient methods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still required.
@@ -57,13 +57,14 @@ In this letter, we report on the electronic properties of FET consisting of semi
* **(b)** Raman spectra of L, M and S samples with S-SWNT and M-SWNT labels along Wavenumber.
* **(c)** Transfer characteristic, ID vs VG for VDS =-14V of FET devices made of samples M and S.
-FIG. 1: (Color online): (a) shows the optical absorp",0.19375500400320256,"Novel semiconductors materials for field effect transistor FET and thin-film transistors TFT are highly demanded.1 In particular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-off current ratio, high electron/hole mobility, to carry high current density and to operate at high frequencies.2-5 Several groups have demonstrated excellent transfer characteristics using individual s-SWNTs,2-5 but generally poor ones using ensemble (network and thin film) of SWNTs due to traces of metallic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles).6-8 Therefore, very efficient methods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still required.
+FIG. 1: (Color online): (a) shows the optical absorp",0.1941553242594075,"
+Novel semiconductors materials for field effect transistor FET and thin-film transistors TFT are highly demanded.1 In particular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-off current ratio, high electron/hole mobility, to carry high current density and to operate at high frequencies.2-5 Several groups have demonstrated excellent transfer characteristics using individual s-SWNTs,2-5 but generally poor ones using ensemble (network and thin film) of SWNTs due to traces of metallic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles).6-8 Therefore, very efficient methods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still required.
In recent years, several approaches to extract s-SWNTs from nanotube powders were explored using for instance chemical functionalization,9-11 DNA and polymers wrapping,12,13 and density gradient ultracentrifugation techniques.6 The latter efficiently separates s-SWNTs and m-SWNTs, but traces of surfactant and density gradient materials limit the performances of the FET. Very recently, two groups have reported on the selective extraction of near-armchair s-SWNTs from nanotube powders using polyfluorene as extracting agent.14,15 According to Nish *et al.*,14 the sample shows no detectable traces of m-SWNTs based only on optical spectroscopy. However, neither the electrical properties nor the fabrication of FET devices were addressed.
In this letter, we report on the electronic properties of FET consisting of *semiconducting-enriched single wall carbon nanotubes, without detectable traces of metallic nanotubes and impurities*, with in our detection limits. This unprecedented achievement is made possible by ultracentrifugation (250,000g), sonication and filtration of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Evidences are gathered by optical absorption, Raman and electrical measurements (see Fig.1). We shall demonstrate that such s-
-![Figure 1: (a) Optical absorption spectra showing Absorbance vs Wavelength (nm) for L, M, and S samples. (b) Raman spectra showing Normalized Intensity vs Wavenumber (cm^-1) for s-SWNT, m-SWNT, L, M, and S samples. (c) Transfer characteristic showing Drain Current (I_D) vs Gate Voltage (V_G) for M and S sample",0.13050440352281825,"Novel semiconductors materials for field effect transistor FET and thin-film transistors TFT are highly demanded [1]. In particular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-off current ratio, high electron/hole mobility, to carry high current density and to operate at high frequencies [2–5]. Several groups have demonstrated excellent transfer characteristics using individual s-SWNTs [2–5], but generally poor ones using ensemble (network and thin film) of SWNTs due to traces of metallic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles) [6–8]. Therefore, very efficient methods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still required.
+![Figure 1: (a) Optical absorption spectra showing Absorbance vs Wavelength (nm) for L, M, and S samples. (b) Raman spectra showing Normalized Intensity vs Wavenumber (cm^-1) for s-SWNT, m-SWNT, L, M, and S samples. (c) Transfer characteristic showing Drain Current (I_D) vs Gate Voltage (V_G) for FET devices m",0.13050440352281825,"Novel semiconductors materials for field effect transistor FET and thin-film transistors TFT are highly demanded [1]. In particular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-off current ratio, high electron/hole mobility, to carry high current density and to operate at high frequencies [2–5]. Several groups have demonstrated excellent transfer characteristics using individual s-SWNTs [2–5], but generally poor ones using ensemble (network and thin film) of SWNTs due to traces of metallic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles) [6–8]. Therefore, very efficient methods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still required.
In recent years, several approaches to extract s-SWNTs from nanotube powders were explored using for instance chemical functionalization [9–11], DNA and polymers wrapping [12, 13], and density gradient ultracentrifugation techniques [6]. The latter efficiently separates s-SWNTs and m-SWNTs, but traces of surfactant and density gradient materials limit the performances of the FET. Very recently, two groups have reported on the selective extraction of near-armchair s-SWNTs from nanotube powders using polyfluorene as extracting agent [14, 15]. According to Nish *et al.* [14], the sample shows no detectable traces of m-SWNTs based only on optical spectroscopy. However, neither the electrical properties nor the fabrication of FET devices were addressed.
@@ -71,7 +72,7 @@ In this letter, we report on the electronic properties of FET consisting of *sem
-**FIG. 1: (Color online):** (a) shows the optical absorption spectra and (b) the Raman spectra at 514.5 nm of L, M and S samples. (c) displays the transfer ",0.2189751801441153,"nts.
+**FIG. 1: (Color online):** (a) shows the optical absorption spectra and (b) the Raman spectra at 514.5 nm of L, M and S samples. (c) displays the transfer ",0.2409927942353883,"ed by optical absorption, Raman and electrical measurements.
PACS numbers:
@@ -81,7 +82,7 @@ In recent years, several approaches to extract s-SWNTs from nanotube powders wer
In this letter, we report on the electronic properties of FET consisting of *semiconducting-enriched single wall carbon nanotubes, without detectable traces of metallic nanotubes and impurities*, with in our detection limits. This unprecedented achievement is made possible by ultracentrifugation (250,000g), sonication and filtration of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Evidences are gathered by optical absorption, Raman and electrical measurements (see Fig.1). We shall demonstrate that such s-
-| \*\*(a)\*\*Wavelength (nm) M Absorbance S Absorbance L Absorbance600 \~0.05 \~0.02 \~0.02
650 \~0.08 \~0.03 \~0.03
700 \~0.11 \~0.04 \~0.04
750 \~0.09 \~0.05 \~0.05
800 \~0.07 \~0.06 \~0.06
850 \~0.06 \~0.07 \~0.07
900 \~0.05 \~0.08 \~0.08
950 \~0.05 \~0.09 \~0",0.16533226581265012,":
+| \*\*(a)\*\*Wavelength (nm) M Absorbance S Absorbance L Absorbance600 \~0.10 \~0.05 \~0.08
700 \~0.08 \~0.03 \~0.06
800 \~0.12 \~0.04 \~0.09
900 \~0.10 \~0.03 \~0.07
1000 \~0.08 \~0.02 \~0.05
1100 \~0.10 \~0.03 \~0",0.16533226581265012,":
Novel semiconductors materials for field effect transistor FET and thin-film transistors TFT are highly demanded.[1] In particular, semiconducting single wall carbon nanotubes (s-SWNTs) are very promising, because individual s-SWNTs are known to exhibit high on-off current ratio, high electron/hole mobility, to carry high current density and to operate at high frequencies.[2–5] Several groups have demonstrated excellent transfer characteristics using individual s- SWNTs,[2–5] but generally poor ones using ensemble (network and thin film) of SWNTs due to traces of metallic nanotubes (m-SWNTs) and impurities (catalytic and amorphous particles).[6–8] Therefore, very efficient methods to selectively synthesis s-SWNTs or to selectively extract s-SWNTs from as-grown nanotubes are still required.
@@ -132,11 +133,11 @@ In the auto-regressive model (Table 1), an AR process value exhibited the slowes
### Auto-Regressive Model
-In the auto-regressive model (Table 1), an AR process value exhibited the slowest mixing under All Scalar sampling. When all 24 model parameters (AR process values, fixed effects, and one hyper-parameter) are blocked, the algorithm Runtime is nearly halved. This decrease in Runtime is largely due to the dependency structure inherent to the AR process. Scalar sampling of AR process values requires nearly a three-fold increase in density evaluations of the process values (since it’s ",0.11261261261261261,"odel (Table 1), automated blocking generates an MCMC algorithm identical to the Informed Blocking algorithm (blocking each αi, βi pair), which produces a tenfold improvement in Efficiency over the most efficient static algorithm – for this model, All Scalar sampling. The cut height h = 0.1 indicates that only the αi, βi pairs exhibit posterior correlations above 0.9. The Informed Cross-Level algorithm requires a substantially longer Runtime and produces a high ESS, which results in nearly identical Efficiency as the efficiently blocked Auto Blocking algorithm.
+In the auto-regressive model (Table 1), an AR process value exhibited the slowest mixing under All Scalar sampling. When all 24 model parameters (AR process values, fixed effects, and one hyper-parameter) are blocked, the algorithm Runtime is nearly halved. This decrease in Runtime is largely due to the dependency structure inherent to the AR process. Scalar sampling of AR process values requires nearly a three-fold increase in density evaluations of the process values (since it’s ",0.1918918918918919,"el (Table 1), automated blocking generates an MCMC algorithm identical to the Informed Blocking algorithm (blocking each αi, βi pair), which produces a tenfold improvement in Efficiency over the most efficient static algorithm – for this model, All Scalar sampling. The cut height h = 0.1 indicates that only the αi, βi pairs exhibit posterior correlations above 0.9. The Informed Cross-Level algorithm requires a substantially longer Runtime and produces a high ESS, which results in nearly identical Efficiency as the efficiently blocked Auto Blocking algorithm.
## Auto-Regressive Model
-In the auto-regressive model (Table 1), an AR process value exhibited the slowest mixing under All Scalar sampling. When all 24 model parameters (AR process values, fixed effects, and one hyper-parameter) are blocked, the algorithm Runtime is nearly halved. This decrease in Runtime is largely due to the dependency structure inherent to the AR process. Scalar sampling of AR process values requires nearly a three-fold increase in density evaluations of the process value",0.07297297297297298,"fects model (Table 1), automated blocking generates an MCMC algorithm identical to the Informed Blocking algorithm (blocking each _αi_ , _βi_ pair), which produces a tenfold improvement in Efficiency over the most efficient static algorithm – for this model, All Scalar sampling. The cut height _h_ = 0 _._ 1 indicates that only the _αi_ , _βi_ pairs exhibit posterior correlations above 0.9. The Informed Cross-Level algorithm requires a substantially longer Runtime and produces a high ESS, which results in nearly identical Efficiency as the efficiently blocked Auto Blocking algorithm.
+In the auto-regressive model (Table 1), an AR process value exhibited the slowest mixing under All Scalar sampling. When all 24 model parameters (AR process values, fixed effects, and one hyper-parameter) are blocked, the algorithm Runtime is nearly halved. This decrease in Runtime is largely due to the dependency structure inherent to the AR process. Scalar sampling of AR process values requires nearly a three-fold increase i",0.07297297297297298,"fects model (Table 1), automated blocking generates an MCMC algorithm identical to the Informed Blocking algorithm (blocking each _αi_ , _βi_ pair), which produces a tenfold improvement in Efficiency over the most efficient static algorithm – for this model, All Scalar sampling. The cut height _h_ = 0 _._ 1 indicates that only the _αi_ , _βi_ pairs exhibit posterior correlations above 0.9. The Informed Cross-Level algorithm requires a substantially longer Runtime and produces a high ESS, which results in nearly identical Efficiency as the efficiently blocked Auto Blocking algorithm.
## **Auto-Regressive Model**
@@ -160,13 +161,13 @@ ranking covers an additional 10% of the dev-set vocabulary compared to either of
The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and aver- age sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @Barack Obama followed by @BillGates.)
-We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the edg",0.009135200974421437,"e Prioritization Experiment
+We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the edg",0.009135200974421437,"ue Prioritization Experiment
We tested our method for prioritizing the crawling queue using Bengali language Twitter users. In order to properly compare the various methods we first collected a data set of 10,785 Twitter users. (5,684 users came from our search queries and an additional 5,103 came from those users’ social connections.) The way the queue ranking works is to first download a small set of users and use that as training data to learn a ranking for the rest of the download queue. We randomly selected 300 users for our training set. The ranking methods were used to order the remaining 10,000+ users in the simulated download queue.
In Figure 2, we show the cumulative in-vocabulary tokens obtained as an additional 500 users are processed from the download queue for each of the three prioritization strategies. The predictive ranking provides three times as many in-vocabulary tokens as either the edge count ranking or the random baseline. Figure 3 is similar but shows the cumulative vocabulary coverage (types) where the vocabulary is taken from a held-out dev set different from the text used to produce the Twitter queries. The horizontal line represents the type coverage of the in-domain training data. The predictive
-ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the dev-set are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially out-performing the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
+ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the dev-set are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially outperforming the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and average sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @BarackObama followed by @BillGates.)
@@ -178,15 +179,15 @@ In Figure 2, we show the cumulative in-vocabulary tokens obtained as an addition
The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and average sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @BarackObama followed by @BillGates.)
-We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the edg",0.009135200974421437," Prioritization Experiment*
+We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the edg",0.009135200974421437,"Queue Prioritization Experiment*
We tested our method for prioritizing the crawling queue using Bengali language Twitter users. In order to properly compare the various methods we first collected a data set of 10,785 Twitter users. (5,684 users came from our search queries and an additional 5,103 came from those users' social connections.) The way the queue ranking works is to first download a small set of users and use that as training data to learn a ranking for the rest of the download queue. We randomly selected 300 users for our training set. The ranking methods were used to order the remaining 10,000+ users in the simulated download queue.
-In Figure 2, we show the cumulative in-vocabulary tokens obtained as an additional 500 users are processed from the download queue for each of the three prioritization strategies. The predictive ranking provides three times as many in-vocabulary tokens as either the edge count ranking or the random baseline. Figure 3 is similar but shows the cumulative vocabulary coverage (types) where the vocabulary is taken from a held-out dev set different from the text used to produce the Twitter queries. The horizontal line represents the type coverage of the in-domain training data. The predictive ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the dev-set are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially out-performing the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
+In Figure 2, we show the cumulative in-vocabulary tokens obtained as an additional 500 users are processed from the download queue for each of the three prioritization strategies. The predictive ranking provides three times as many in-vocabulary tokens as either the edge count ranking or the random baseline. Figure 3 is similar but shows the cumulative vocabulary coverage (types) where the vocabulary is taken from a held-out dev set different from the text used to produce the Twitter queries. The horizontal line represents the type coverage of the in-domain training data. The predictive ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the dev-set are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially outperforming the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
-The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and aver-age sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @BarackObama followed by @BillGates.)
+The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and average sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @BarackObama followed by @BillGates.)
-We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the edg",0.011266747868453105,"eue Prioritization Experiment_
+We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the ",0.011266747868453105,"eue Prioritization Experiment_
We tested our method for prioritizing the crawling queue using Bengali language Twitter users. In order to properly compare the various methods we first collected a data set of 10,785 Twitter users. (5,684 users came from our search queries and an additional 5,103 came from those users’ social connections.) The way the queue ranking works is to first download a small set of users and use that as training data to learn a ranking for the rest of the download queue. We randomly selected 300 users for our training set. The ranking methods were used to order the remaining 10,000+ users in the simulated download queue.
@@ -243,7 +244,7 @@ In this section, I apply the results presented in Section 3 to an empirical anal
In this section, I apply the results presented in Section 3 to an empirical analysis of the distribution of smoking effects on infant birth weight. Smoking not only has a direct impact on infant birth weight, but is also associated with unobservable factors that affect infant birth weight. I identify marginal distributions of potential infant birth weight with and without smoking by making use of a state cigarette tax hike in Massachusetts (MA) in January 1993 as a source of exogenous variation. I focus on pregnant women who change their smoking behavior from smoking to nonsmoking in response to the tax increase. To identify the distribution of smoking effects, I impose a MTR restriction that smoking has nonpositive effects on infant birth weight with probability one. I propose an estimation procedure and report estimates of the DT",6,science_sample
7,0,"It is apparent form Eq. (A12) that the leading singularity originates from the first term, (A −1)BC ≈A −1 ≈ −2d(y1 −0)(y3 −y2). Introducing new variables as in the Sec. III and integrating over xis we obtain",False,0.09223300970873786,"is apparent form Eq. (A12) that the leading singularity originates from the first term, (A − 1)BC ≈ A − 1 ≈ −2d( y1 − 0)(y3 − y2). Introducing new variables as in the Sec. III and integrating over x i s we ",0.23300970873786409,"t is apparent from Eq. (A12) that the leading singularity originates from the first term, $(A-1)BC\approx A-1\approx-2d(y_1-0)(y_3-y_2)$ . Introducing new variables as in the Sec. III and integrating over ",0.27184466019417475,"It is apparent from Eq. (A12) that the leading singularity originates from the first term, $(A - 1)BC \approx A - 1 \approx -2d(y_1 - 0)(y_3 - y_2)$. Introducing new variables as in Sec. III and integrating",0.2621359223300971,"s apparent form Eq. (A12) that the leading singularity originates from the first term, $(A - 1)BC \approx A - 1 \approx -2d(y_1 - 0)(y_3 - y_2)$. Introducing new variables as in the Sec. III and integrating",0.06310679611650485,"apparent form Eq. (A12) that the leading singularity originates from the first term, (A − 1)BC ≈ A − 1 ≈ −2d(y1 − 0)(y3 − y2). Introducing new variables as in the Sec. III and integrating over xis we obtain",0.14563106796116504," is apparent form Eq. (A12) that the leading singularity originates from the first term, ( A -1) BC ≈ A -1 ≈ -2 d ( y 1 -0)( y 3 -y 2 ). Introducing new variables as in the Sec. III and integrating over x i",0.14563106796116504," is apparent form Eq. (A12) that the leading singularity originates from the first term, ( A -1) BC ≈ A -1 ≈ -2 d ( y 1 -0)( y 3 -y 2 ). Introducing new variables as in the Sec. III and integrating over x i",7,science_sample
-7,1,"Here again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity,",False,0.013157894736842105,"ere again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity,",0.09649122807017543,"gain, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable $\alpha$ introduced in Eq. (14) in order to isolate the leading logarithmic singular",0.07894736842105263,"again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable $\alpha$ introduced in Eq. (14) in order to isolate the leading logarithmic singulari",0.07894736842105263,"again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable $\alpha$ introduced in Eq. (14) in order to isolate the leading logarithmic singulari",0.013157894736842105,"Here again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity",0.013157894736842105,"Here again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity",0.013157894736842105,"Here again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity",7,science_sample
+7,1,"Here again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity,",False,0.013157894736842105,"ere again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity,",0.09649122807017543,"ain, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable $\alpha$ introduced in Eq. (14) in order to isolate the leading logarithmic singulari",0.07894736842105263,"again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable $\alpha$ introduced in Eq. (14) in order to isolate the leading logarithmic singulari",0.07894736842105263,"again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable $\alpha$ introduced in Eq. (14) in order to isolate the leading logarithmic singulari",0.013157894736842105,"Here again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity",0.013157894736842105,"Here again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity",0.013157894736842105,"Here again, the integrals are divergent on the upper limit. Similarly to the previous section we differentiate it once with respect to the variable α introduced in Eq. (14) in order to isolate the leading logarithmic singularity",7,science_sample
7,2,"The remaining integrals are easily evaluated. The sub- sequent integration over α restores the singularity in the self energy correction,",False,0.19708029197080293,"
The remaining integrals are easily evaluated. The subsequent integration over α restores the singularity in the
@@ -315,23 +316,21 @@ We propose above that $v_p$ is a complementary parameter for reporting such pecu
We convert $v_p$ measurement into $g_\Theta$ using $A_S$ from WMAP5 ($g_\Theta$: coherent growth factor of peculiar velocity, and it is equivalent to $f\sigma_8$ in other parameterizations). With the evolution of $g_\Theta$ known, dynamics of perturbations are reconstructed to provide the history of $\Psi$ through the Euler equation. In most theoretical models, the time variation of $v_p$ is minimal at these low redshifts discussed here for the C4 sample ($z \simeq 0.1$), which allows us to ignore the time-derivative part in Eq. 9. Therefore, it is straightforward to transform the coherent evolution of $\Theta$ into the coherent evolution of $\Psi$. If we assume no anisotropic stress, then it is easy to convert to the coherent evolution of $\Phi$, $g_\Phi$.
-We are able to determine matter density fluctuations through the Poisson equation. We calculate the co",0.1348742697485395,". In doing the SVD, we select the dominant modes to contribute to the $\chi^2$ by requiring that $\lambda^2 > \sqrt{2/N_{jk}}$.
+We are able to determine matter density fluctuations through the Poisson equation. We calculate the co",0.15748031496062992,"^2 \delta_{kl}$$, a diagonal matrix with singular values along the diagonal. In doing the SVD, we select the dominant modes to contribute to the $$\chi^2$$ by requiring that $$\lambda^2 > \sqrt{2/N_{jk}}$$.
-In Figure 4, we rank the eigenvalues ($\lambda_i$) for the increasing eigenmodes and see a ""kink"" in the distribution which we interpret as indicating a transition in the signal–to–noise of the eigenmodes, i.e., only the first ten modes contain most of the signal, while higher-ordered modes are dominated by noise. We therefore remove eigenmodes beyond this kink (with $\lambda_i < 0.01$) where the eigenvalues start to flatten out.
+In Figure 4, we rank the eigenvalues ($$\lambda_i$$) for the increasing eigenmodes and see a ""kink"" in the distribution which we interpret as indicating a transition in the signal–to–noise of the eigenmodes, i.e., only the first ten modes contain most of the signal, while higher-ordered modes are dominated by noise. We therefore remove eigenmodes beyond this kink (with $$\lambda_i < 0.01$$) where the eigenvalues start to flatten out.
## A. Statistical determination of large scale flow
As discussed in the Introduction, there is recent evidence for excessive bulk flow motions compared to the WMAP5-normalised ΛCDM model [18] and therefore, it is important to confirm these results as it may indicate evidence for an alternative explanation for the observed cosmic acceleration such as modified gravity. In this paper, we provide a first demonstration of our new parameterization using clusters of galaxies from the SDSS. In detail, we attempt to model the ""squashing"" of the 2-D correlation function of the C4 cluster sample seen in Figure 5 using the formalism presented herein. We do however caution the reader that we expect the limited size of the DR3 sample to leads to large statistical errors, due to a significant shot–noise contribution because of their low number density. However, future cluster and galaxy samples (e.g., LRGs) should provide stronger constraints and provide a more robust test of these high bulk flow measurements in the literature.
-In Figure 5, we provide the best fit parameters $b$ and $v_p$ for the C4 correlation function presented in Figure 3 and there is as expected a clear anti-correlation between these two parameters because the anisotropic amplitude is generated by cross-correlations in the density and peculiar velocity fields. The best fit value from Figure 5 is $v_p = 270^{+433}$ km/s (at the $1\sigma$ level marginalised with other parameters including $b$) and is consistent with $v_p = 0$. We do not quote the negative bound of the error on $v_p$ as it is below zero and thus has no physical meaning. Instead, we quote the upper bound on $v_p$ and note that our result is consistent with zero. Our measurement of $v_p$ is close to the predicted value of 203 km/s for a WMAP5–normalised ΛCDM model.
-
-We propose above that $v_p$ is a complementary parameter for reporting such peculiar velocity measurements. The parameter $g_{\Theta}$, which is equivalent to $f\sigma_8$, is not determined precisely without the prior information of $A_S$. But when we report our measurement with $v_p$, there is no uncertainty due to other cosmological parameters which are not determined accurately, as it is equivalent to $g_{\Theta}^*$ determined statistically from redshift space distortion. The observed value $v_p$ at a given redshift is not only independent of bias but also independent of normalisation.
+In Figure 5, we provide the best fit parameters $$b$$ and $$v_p$$ for the C4 correlation function presented in Figure 3 and there is as expected a clear anti-correlation between these two parameters because the anisotropic amplitude is generated by cross-correlations in the density and peculiar velocity fields. The best fit value from Figure 5 is $$v_p = 270^{+433}$$ km/s (at the $$1\sigma$$ level marginalised with other parameters including $$b$$) and is consistent with $$v_p = 0$$. We do not quote the negative bound of the error on $$v_p$$ as it is below zero and thus has no physical meaning. Instead, we quote the upper bound on $$v_p$$ and note that our result is consistent with zero. Our measurement of $$v_p$$ is close to the predicted value of 203 km/s for a WMAP5–normalised ΛCDM model.
-## B. Reconstruction of matter density field from vp
+We propose above that $$v_p$$ is a complementary parameter for reporting such peculiar velocity measurements. The parameter $$g_{\Theta}$$, which is equivalent to $$f\sigma_8$$, is not determined precisely without the prior information of $$A_S$$. But when we report our measurement with $$v_p$$, there is no uncertainty due to other cosmological parameters which are not determined accurately, as it is equivalent to $$g_{\Theta}^*$$ determined statistically from redshift space distortion. The observed value $$v_p$$ at a given redshift is not only independent of bias but also independent of normalisation.
-We convert $v_p$ measurement into $g_{\Theta}$ using $A_s$ from WMAP5 ($g_{\Theta}$: coherent growth factor of peculiar velocity, and it is equivalent to $f\sigma_8$ in other parameterizations). With the evolution of $g_{\Theta}$ known, dynamics of perturbations are reconstructed to provide the history of $\Psi$ through the Euler equation. In most theoretical models, the time variation of $v_p$ is minimal at these low redshifts discussed here for the C4 sample ($z \approx 0.1$), which allows us to ignore the time-derivative part in Eq. 9. Therefore, it is straightforward to transform the coherent evolution of $\Theta$ into the coherent evolution of $\Psi$. If we assume no anisotropic stress, then it is easy to convert to the coherent evolution of $\Phi$, $g_{\Phi}$.
+## B. Reconstruction of matter density field from $$v_p$$
-We are able to determine matter density fluctuations through the Poisson equation. We calculate the coherent growth ",0.030734061468122936,"re U and V are orthogonal matrices that span the range and the null space of Cij and Dkl = λ[2] δkl, a diagonal matrix with singular values along the diagonal. In doing the SVD, we select the dominant modes to contribute to the χ[2] by requiring that λ[2] > �2/Njk.
+We convert $$v_p$$ measurement into $$g_{\Theta}$$ using $$A_s$$ from WMAP5 ($$g_{\Theta}$$: coherent growth factor of peculiar velocity, and it is equivalent to $$f\sigma_8$$ in other parameterizations). With the evolution of $$g_{\Theta}$$ known, dynamics of perturbations are reconstructed to provide the history of $$\Psi$$ through the Euler equation. In most theoretical models, the time variation of $$v_p$$ is minimal at these low redshifts discussed here for the C4 sample ($$z \approx 0.1$$), which allows us to ignore the time-derivative part in Eq. 9. Therefore, it is straightforward to transform the coherent evolution of $$\Theta$$ into the coherent evolution of $$\Psi$$. If we assume no anisotropic stress, then it is easy to convert to the coherent evolution of $$\Phi",0.030734061468122936,"re U and V are orthogonal matrices that span the range and the null space of Cij and Dkl = λ[2] δkl, a diagonal matrix with singular values along the diagonal. In doing the SVD, we select the dominant modes to contribute to the χ[2] by requiring that λ[2] > �2/Njk.
In Figure 4, we rank the eigenvalues (λi) for the increasing eigenmodes and see a “kink” in the distribution which we interpret as indicating a transition in the signal–to–noise of the eigenmodes, i.e., only the first ten modes contain most of the signal, while higher-ordered modes are dominated by noise. We therefore remove eigenmodes beyond this kink (with λi < 0.01) where the eigenvalues start to flatten out.
@@ -385,7 +384,7 @@ We are able to determine matter density fluctuations through the Poisson equatio
9,0,"At first, we divide the whole region of redshift into 4 bins (i.e., m = 3), the divided points and boundaries are (0, z1, z2, 1.8, ∞), where z1 and z2 are left as free parameters of the model, and 0 < z1 < z2 < 1.8. In the fourth bin we set wL = −1. It means that we divide the region with z ∈(0, 1.8) into 3 bins and seek for two possible turning points of wde(z) in this region. The reconstructed wde of the best-fitted model is shown in Fig. 1,",False,0.020224719101123594,"rst, we divide the whole region of redshift into 4 bins (i.e., m = 3), the divided points and boundaries are (0, z1, z2, 1.8, ∞), where z1 and z2 are left as free parameters of the model, and 0 < z 1 < z 2 < 1.8. In the fourth bin we set wL = −1. It means that we divide the region with z ∈ (0, 1.8) into 3 bins and seek for two possible turning points of wde(z) in this region. The reconstructed wde of the best-fitted model is shown in Fig. 1,",0.23370786516853934,"rst, we divide the whole region of redshift into 4 bins (i.e., $m=3$ ), the divided points and boundaries are $(0, z_1, z_2, 1.8, \infty)$ , where $z_1$ and $z_2$ are left as free parameters of the model, and $0 < z_1 < z_2 < 1.8$ . In the fourth bin we set $w_L = -1$ . It means that we divide the region with $z \in (0, 1.8)$ into 3 bins and seek for two possible turning points of $w_{de}(z)$ in this region. The reconstructed $w",0.18202247191011237," we divide the whole region of redshift into 4 bins (i.e., $m = 3$), the divided points and boundaries are $(0, z_1, z_2, 1.8, \infty)$, where $z_1$ and $z_2$ are left as free parameters of the model, and $0 < z_1 < z_2 < 1.8$. In the fourth bin we set $w_L = -1$. It means that we divide the region with $z \in (0, 1.8)$ into 3 bins and seek for two possible turning points of $w_{de}(z)$ in this region. The reconstructed $w_{de}$ of the best-",0.36629213483146067,"
At first, we divide the whole region of redshift into 4 bins (i.e., m = 3), the divided points and boundaries are (0, z1, z2, 1.8, ∞), where z1 and z2 are left as free parameters of the model, and 0 < z1 < z2 < 1.8. In the fourth bin we set wL = −1. It means that we divide the region with z ∈ (0, 1.8) into 3 bins and seek for two possible turning points of wde",0.017977528089887642,"At first, we divide the whole region of redshift into 4 bins (i.e., m = 3), the divided points and boundaries are (0, z1, z2, 1.8, ∞), where z1 and z2 are left as free parameters of the model, and 0 < z1 < z2 < 1.8. In the fourth bin we set wL = −1. It means that we divide the region with z ∈ (0, 1.8) into 3 bins and seek for two possible turning points of wde(z) in this region. The reconstructed wde of the best-fitted model is shown in Fig.",0.16404494382022472,"st, we divide the whole region of redshift into 4 bins (i.e., m = 3), the divided points and boundaries are (0 , z 1 , z 2 , 1 . 8 , ∞ ), where z 1 and z 2 are left as free parameters of the model, and 0 < z 1 < z 2 < 1 . 8. In the fourth bin we set w L = -1. It means that we divide the region with z ∈ (0 , 1 . 8) into 3 bins and seek for two possible turning points of w de ( z ) in this region. The reconstructed w de of the best-fi",0.16404494382022472,"st, we divide the whole region of redshift into 4 bins (i.e., m = 3), the divided points and boundaries are (0 , z 1 , z 2 , 1 . 8 , ∞ ), where z 1 and z 2 are left as free parameters of the model, and 0 < z 1 < z 2 < 1 . 8. In the fourth bin we set w L = -1. It means that we divide the region with z ∈ (0 , 1 . 8) into 3 bins and seek for two possible turning points of w de ( z ) in this region. The reconstructed w de of the best-fi",9,science_sample
10,0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,False,0.0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,0.0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,0.0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,0.0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,0.0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,0.0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,0.0,Appendix B presents the procedure used to compute the sharp lower bound under MTR in Section 4 and Section 5. The following lemma is useful for reducing computational costs:,10,science_sample
-11,0,"Proof. We prove the lemma for the case of the CQ trade- offcurve. The proof for the CE trade-offcurve is similar. Let (C(t), Q(t)) for 0 ≤t ≤1 be a parametrization of the trade-offcurve with C(0) equal to the classical capacity and Q(1) equal to the quantum capacity. The function C (t) is monotonically decreasing and the function Q (t) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotonically decreasing.",False,0.05232558139534884,". We prove the lemma for the case of the CQ tradeoff curve. The proof for the CE trade-off curve is similar. Let (C (t), Q(t)) for 0 ≤ t ≤ 1 be a parametrization of the trade-off curve with C (0) equal to the classical capacity and Q(1) equal to the quantum capacity. The function C (t) is monotonically decreasing and the function Q (t) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotonically decrea",0.1511627906976744,"ve the lemma for the case of the CQ trade-off curve. The proof for the CE trade-off curve is similar. Let $(C(t), Q(t))$ for $0\le t\le 1$ be a parametrization of the trade-off curve with $C(0)$ equal to the classical capacity and $Q(1)$ equal to the quantum capacity. The function $C(t)$ is monotonically decreasing and the function $Q(t)$ is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monoto",0.10852713178294573,"ve the lemma for the case of the CQ trade-off curve. The proof for the CE trade-off curve is similar. Let $(C(t), Q(t))$ for $0 \le t \le 1$ be a parametrization of the trade-off curve with $C(0)$ equal to the classical capacity and $Q(1)$ equal to the quantum capacity. The function $C(t)$ is monotonically decreasing and the function $Q(t)$ is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotonically de",0.16279069767441862," lemma for the case of the CQ trade-off curve. The proof for the CE trade-off curve is similar. Let $$(C(t), Q(t))$$ for $$0 \leq t \leq 1$$ be a parametrization of the trade-off curve with $$C(0)$$ equal to the classical capacity and $$Q(1)$$ equal to the quantum capacity. The function $$C(t)$$ is monotonically decreasing and the function $$Q(t)$$ is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotoni",0.18023255813953487," of the CQ tradeoff curve. The proof for the CE trade-off curve is similar. Let ( _C_ ( _t_ ) _, Q_ ( _t_ )) for 0 _≤ t ≤_ 1 be a parametrization of the trade-off curve with _C_ (0) equal to the classical capacity and _Q_ (1) equal to the quantum capacity. The function _C_ ( _t_ ) is monotonically decreasing and the function _Q_ ( _t_ ) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotonically decrea",0.09496124031007752,"oof. We prove the lemma for the case of the CQ tradeoff curve. The proof for the CE trade-off curve is similar. Let ( C ( t ) , Q ( t )) for 0 ≤ t ≤ 1 be a parametrization of the trade-off curve with C (0) equal to the classical capacity and Q (1) equal to the quantum capacity. The function C ( t ) is monotonically decreasing and the function Q ( t ) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monoto",0.09496124031007752,"oof. We prove the lemma for the case of the CQ tradeoff curve. The proof for the CE trade-off curve is similar. Let ( C ( t ) , Q ( t )) for 0 ≤ t ≤ 1 be a parametrization of the trade-off curve with C (0) equal to the classical capacity and Q (1) equal to the quantum capacity. The function C ( t ) is monotonically decreasing and the function Q ( t ) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monoto",11,science_sample
+11,0,"Proof. We prove the lemma for the case of the CQ trade- offcurve. The proof for the CE trade-offcurve is similar. Let (C(t), Q(t)) for 0 ≤t ≤1 be a parametrization of the trade-offcurve with C(0) equal to the classical capacity and Q(1) equal to the quantum capacity. The function C (t) is monotonically decreasing and the function Q (t) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotonically decreasing.",False,0.05232558139534884,". We prove the lemma for the case of the CQ tradeoff curve. The proof for the CE trade-off curve is similar. Let (C (t), Q(t)) for 0 ≤ t ≤ 1 be a parametrization of the trade-off curve with C (0) equal to the classical capacity and Q(1) equal to the quantum capacity. The function C (t) is monotonically decreasing and the function Q (t) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotonically decrea",0.1511627906976744,"ve the lemma for the case of the CQ trade-off curve. The proof for the CE trade-off curve is similar. Let $(C(t), Q(t))$ for $0\le t\le 1$ be a parametrization of the trade-off curve with $C(0)$ equal to the classical capacity and $Q(1)$ equal to the quantum capacity. The function $C(t)$ is monotonically decreasing and the function $Q(t)$ is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monoto",0.10852713178294573,"ve the lemma for the case of the CQ trade-off curve. The proof for the CE trade-off curve is similar. Let $(C(t), Q(t))$ for $0 \le t \le 1$ be a parametrization of the trade-off curve with $C(0)$ equal to the classical capacity and $Q(1)$ equal to the quantum capacity. The function $C(t)$ is monotonically decreasing and the function $Q(t)$ is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotonically de",0.16279069767441862,"emma for the case of the CQ trade-off curve. The proof for the CE trade-off curve is similar. Let $$(C(t), Q(t))$$ for $$0 \leq t \leq 1$$ be a parametrization of the trade-off curve with $$C(0)$$ equal to the classical capacity and $$Q(1)$$ equal to the quantum capacity. The function $$C(t)$$ is monotonically decreasing and the function $$Q(t)$$ is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotonica",0.18023255813953487," of the CQ tradeoff curve. The proof for the CE trade-off curve is similar. Let ( _C_ ( _t_ ) _, Q_ ( _t_ )) for 0 _≤ t ≤_ 1 be a parametrization of the trade-off curve with _C_ (0) equal to the classical capacity and _Q_ (1) equal to the quantum capacity. The function _C_ ( _t_ ) is monotonically decreasing and the function _Q_ ( _t_ ) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monotonically decrea",0.09496124031007752,"oof. We prove the lemma for the case of the CQ tradeoff curve. The proof for the CE trade-off curve is similar. Let ( C ( t ) , Q ( t )) for 0 ≤ t ≤ 1 be a parametrization of the trade-off curve with C (0) equal to the classical capacity and Q (1) equal to the quantum capacity. The function C ( t ) is monotonically decreasing and the function Q ( t ) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monoto",0.09496124031007752,"oof. We prove the lemma for the case of the CQ tradeoff curve. The proof for the CE trade-off curve is similar. Let ( C ( t ) , Q ( t )) for 0 ≤ t ≤ 1 be a parametrization of the trade-off curve with C (0) equal to the classical capacity and Q (1) equal to the quantum capacity. The function C ( t ) is monotonically decreasing and the function Q ( t ) is monotonically increasing. The graph of the trade-off curve is convex and, therefore, has one-sided directional derivatives at all points [70]. It is also monoto",11,science_sample
11,1,"If (C(t), Q(t)) is a point on the graph at which the deriva- tive is not constant, then setting −λ to be the slope of the graph will lead to Eq. (C1) being satisfied. If the graph is not differentiable at (C(t), Q(t)), then the slope must drop discontinuously at that point. Setting −λ to any value in the gap will again lead to the condition being satisfied. At points where the graph is differentiable but the slope is constant, λ might not be a good parameter. These points, however, are in the convex hull of the points that λ does parametrize. Appendix D: Form of the CQ Trade-offCurve for Qubit Dephasing Channels We first prove two important lemmas and then prove a theorem that gives the exact form of the CQ trade-off curve. Lemma 12 Let N be a generalized dephasing channel. In the optimization task for the CQ trade-offcurve, it suffices to consider a classical-quantum state with diag- onal conditional density operators, in the sense that the following inequality holds:",False,0.05858170606372045,"s a point on the graph at which the derivative is not constant, then setting −λ to be the slope of the graph will lead to Eq. (C1) being satisfied. If the graph is not differentiable at (C (t), Q(t)), then the slope must drop discontinuously at that point. Setting −λ to any value in the gap will again lead to the condition being satisfied.
At points where the graph is differentiable but the slope is constant, λ might not be a good parameter. These points, however, are in the convex hull of the points that λ does parametrize.
@@ -414,7 +413,7 @@ At points where the graph is differentiable but the slope is constant, $\lambda$
We first prove two important lemmas and then prove a theorem that gives the exact form of the CQ trade-off curve.
-**Lemma 12** Let $\mathcal{N}$ be a generalized dephasing channel. In the optimization task for the CQ trade-off curve, it suffices to consider a classical-quantum state with diagonal conditional density operators, in the sense that the follow",0.1880781089414183," derivative is not constant, then setting $$-\lambda$$ to be the slope of the graph will lead to Eq. (C1) being satisfied. If the graph is not differentiable at $$(C(t), Q(t))$$, then the slope must drop discontinuously at that point. Setting $$-\lambda$$ to any value in the gap will again lead to the condition being satisfied. ■
+**Lemma 12** Let $\mathcal{N}$ be a generalized dephasing channel. In the optimization task for the CQ trade-off curve, it suffices to consider a classical-quantum state with diagonal conditional density operators, in the sense that the follow",0.1880781089414183," not constant, then setting $$-\lambda$$ to be the slope of the graph will lead to Eq. (C1) being satisfied. If the graph is not differentiable at $$(C(t), Q(t))$$, then the slope must drop discontinuously at that point. Setting $$-\lambda$$ to any value in the gap will again lead to the condition being satisfied. ■
At points where the graph is differentiable but the slope is constant, $$\lambda$$ might not be a good parameter. These points, however, are in the convex hull of the points that $$\lambda$$ does parametrize.
@@ -422,7 +421,7 @@ At points where the graph is differentiable but the slope is constant, $$\lambda
We first prove two important lemmas and then prove a theorem that gives the exact form of the CQ trade-off curve.
-**Lemma 12** Let $$\mathcal{N}$$ be a generalized dephasing channel. In the optimization task for the CQ trade-off curve, it suffices to consider a classical-quantum state with diagonal conditional density operators, in the sense that the ",0.13257965056526208,"e graph at which the derivative is not constant, then setting _−λ_ to be the slope of the graph will lead to Eq. (C1) being satisfied. If the graph is not differentiable at ( _C_ ( _t_ ) _, Q_ ( _t_ )), then the slope must drop discontinuously at that point. Setting _−λ_ to any value in the gap will again lead to the condition being satisfied.
+**Lemma 12** Let $$\mathcal{N}$$ be a generalized dephasing channel. In the optimization task for the CQ trade-off curve, it suffices to consider a classical-quantum state with diagonal conditional density operators, in the sense that the following ineq",0.13257965056526208,"e graph at which the derivative is not constant, then setting _−λ_ to be the slope of the graph will lead to Eq. (C1) being satisfied. If the graph is not differentiable at ( _C_ ( _t_ ) _, Q_ ( _t_ )), then the slope must drop discontinuously at that point. Setting _−λ_ to any value in the gap will again lead to the condition being satisfied.
At points where the graph is differentiable but the slope is constant, _λ_ might not be a good parameter. These points, however, are in the convex hull of the points that _λ_ does parametrize.
@@ -449,7 +448,7 @@ At points where the graph is differentiable but the slope is constant, λ might
We first prove two important lemmas and then prove a theorem that gives the exact form of the CQ trade-off curve.
Lemma 12 Let N be a generalized dephasing channel. In the optimization task for the CQ trade-off curve, it suffices to consider a classical-quantum state with diagonal conditional density operators, in the sense that the following inequal",11,science_sample
-12,0,"Figure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlations.",False,0.005807200929152149,"Figure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlation",0.005807200929152149,"igure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlations",0.010452961672473868,"igure 5: Partition degeneracy and correlation with excursion count.** (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlatio",0.010452961672473868,"re 5: Partition degeneracy and correlation with excursion count.** (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlations.",0.005807200929152149,"Figure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlation",0.005807200929152149,"Figure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlation",0.005807200929152149,"Figure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlation",12,science_sample
+12,0,"Figure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlations.",False,0.005807200929152149,"Figure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlation",0.005807200929152149,"igure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlations",0.010452961672473868,"igure 5: Partition degeneracy and correlation with excursion count.** (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlatio",0.010452961672473868,"ure 5: Partition degeneracy and correlation with excursion count.** (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlations",0.005807200929152149,"Figure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlation",0.005807200929152149,"Figure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlation",0.005807200929152149,"Figure 5: Partition degeneracy and correlation with excursion count. (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlation",12,science_sample
12,1,"Figure 6: Default mode network dissociates during mass-excursions. A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during non- excursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN.",False,0.005194805194805195,"Figure 6: Default mode network dissociates during mass-excursions. A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during nonexcursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN.",0.011688311688311689,"Figure 6: Default mode network dissociates during mass-excursions. A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during non-excursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B to identify regions that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN.",0.016883116883116882,"Figure 6: Default mode network dissociates during mass-excursions.** A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during non-excursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN.
4",0.00909090909090909,"igure 6: Default mode network dissociates during mass-excursions.** A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during non-excursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN",0.006493506493506494,"Figure 6: Default mode network dissociates during mass-excursions. A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during nonexcursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN. ",0.006493506493506494,"Figure 6: Default mode network dissociates during mass-excursions. A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during nonexcursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN.
@@ -781,104 +780,6 @@ Example 4 (DTE conditional on Potential Outcomes) The conditional DTE for the un
Example 4 (DTE conditional on Potential Outcomes) The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain set C is ",0.12531328320802004,"represents nonpecuniary costs with a vector of observables Z . Then treated ( D = 1) and untreated people ( D = 0) are the observed groups satisfying support restrictions { Y 1 -Y 0 ≥ µ C ( Z ) } and { Y 1 -Y 0 < µ C ( Z ) } , respectively.
Example 4 (DTE conditional on Potential Outcomes) The conditional DTE for the unobservable subgroup whose potential outcomes belong to a certain set C is ",17,science_sample
-18,0,"For this purpose, we look at the temperature depen- dence of the rotation angle of the magnetization between NN planes. In Fig. 7, ∆ϕl(T ) for n = 8 and n = 16 (continuous and dashed lines, respectively), is plotted for the outermost planes, l = 1 . . . 4. For both thicknesses, a monotonic trend is observed for all l, but at variance with what happens for the highest thickness, for n = 8 we see, starting from a temperature T ≲TN(8), an abrupt drop of ∆ϕ3 and ∆ϕ4, which rapidly reach an almost con- stant value, only slightly larger than ∆ϕ1. In the tem- perature range TN(8) ≲T < TC(8) we thus substantially observe the same small magnetic phase shifts between all NN layers, testifying an energetically stable quasi-FM configuration giving no contribution to the helical order parameters. The latter point can be made clearer by looking at the the peak position Qz,max of the structure factor S(0, 0, qz). In Fig. 8 the average of Qz,max vs T is reported, again for n = 8 and for different lateral dimen- sions L26. As expected from the previous argument, we see that Qz,max = 0 for TN(8) < T < TC(8), while it be- gins to shift to higher values as soon as the temperature decreases below TN(8), making apparent a progressive fan stabilization with Qz,max ̸= 0 and reaching a value of about 21◦for T = 10 K. In a previous study, where the magnetic properties of Ho thin films were investigated by MC simulations of a Heisenberg model with easy-plane single-ion anisotropy and six out-of-plane coupling constants (as obtained by experimental neutron scattering measurements16) on a HCP lattice14,15, it was found that for thicknesses compa- rable with the helical pitch the phase diagram landscape is quite different from what we find here. Indeed, for n = 9 −16, three different magnetic phases could be sin- gled out, with the high-temperature, paramagnetic phase separated from the low-temperature, long-range ordered one, by an intermediate-temperature block phase where outer ordered 4-layers blocks coexist with some inner dis- ordered ones. Moreover, it was observed that the phase transition of such inner layers turns out to have the sig- natures of a Kosterlitz-Thouless one. The absence of the block phase in the J1 −J2 model here investigated has to be attributed to the different range of interactions, rather than to the different lattice structure. We came to this conclusion by doing some simulations using the same set of interaction constants employed in Refs. 14,15, but using a BCT lattice: the results we obtained for ∆ϕl with n = 12 are reported in Fig. 9. The latter is absolutely similar to Fig.7 of Ref. 15 and clearly displays the footmarks of the block phase (see down-triangle), with two external blocks of ordered layers ( l =1. . . 5 and 8. . . 12 ), where ∆ϕl is roughly 10◦, sep- arated by a block of disordered layers, and with almost",False,0.32472067039106145,"nd ii ).
-
-For this purpose, we look at the temperature depen- dence of the rotation angle of the magnetization between NN planes. In Fig. 7, A₁(T) for n = 8 and n = 16 (continuous and dashed lines, respectively), is plotted for the outermost planes, l = 1...4. For both thicknesses, a monotonic trend is observed for all 1, but at variance with what happens for the highest thickness, for n = 8 we see, starting from a temperature T≤ TN(8), an abrupt drop of A3 and A44, which rapidly reach an almost con- stant value, only slightly larger than A₁. In the tem- perature range T₁(8) ≤ T < Tc (8) we thus substantially observe the same small magnetic phase shifts between all NN layers, testifying an energetically stable quasi-FM configuration giving no contribution to the helical order parameters. The latter point can be made clearer by looking at the the peak position Qz,max of the structure factor S(0,0, qz). In Fig. 8 the average of Qz,max vs T is reported, again for n = 8 and for different lateral dimen- sions L26. As expected from the previous argument, we see that Qz,max = 0 for Tâ(8) < T < Tc(8), while it be- gins to shift to higher values as soon as the temperature decreases below TN(8), making apparent a progressive fan stabilization with Qz,1 z,max = 0 and reaching a value of about 21° for T = 10K.
-
-In a previous study, where the magnetic properties of Ho thin films were investigated by MC simulations of a Heisenberg model with easy-plane single-ion anisotropy and six out-of-plane coupling constants (as obtained by experimental neutron scattering measurements16) on a HCP lattice14,15, it was found that for thicknesses comparable with the helical pitch the phase diagram landscape is quite different from what we find here. Indeed, for n = 9 − 16, three different magnetic phases could be sin
-
-The chart displays Qz, max vs. temperature (T) for thickness n=8. The x-axis is temperature in Kelvin (K), and the y-axis is Qz, max in degrees. Different colored lines (black, blue, green, red) represent different measurements. All lines decrease from around 20 degrees at 20K to near 0 degrees after 60K.
-
-FIG. 8: (color online) Qz, position of the maximum of S(g), vs. temperature for thickness n = 8. Inset: magnetic vector (m, m) profile for some temperatures for L = 64. Colors and symbols as in Fig. 2.
-
-| l | T=100K (○) | T=130K (■) | T=135K (◇) | T=140K (▲) | T=145K (▽) |
-|---:|-----------:|-----------:|-----------:|-----------:|-----------:|
-| 1 | 10 | 12 | 11 | 12 | 9 |
-| 2 | 18 | 20 | 19 | 21 | 12 |
-| 3 | 25 | 27 | 26 | 28 | 17 |
-| 4 | 32 | 34 | 33 | 35 | 26 |
-| 5 | 36 | 37 | 36 | 38 | 32 |
-| 6 | 34 | 38 | 37 | 39 | 80 |
-| 7 | 33 | 36 | 35 | 37 | 32 |
-| 8 | 29 | 31 | 30 | 32 | 20 |
-| 9 | 24 | 26 | 25 | 27 | 12 |
-|10 | 16 | 18 | 17 | 19 | 6 |
-|11 | 10 | 10 | 9 | 11 | 9 |
-
-(Values are approximate, read from the plotted f",0.392108938547486,"
-For this purpose, we look at the temperature dependence of the rotation angle of the magnetization between NN planes. In Fig. 7, $\Delta\varphi_l(T)$ for $n=8$ and $n=16$ (continuous and dashed lines, respectively), is plotted for the outermost planes, $l=1\dots 4$ . For both thicknesses, a monotonic trend is observed for all $l$ , but at variance with what happens for the highest thickness, for $n=8$ we see, starting from a temperature $T\lesssim T_N(8)$ , an abrupt drop of $\Delta\varphi_3$ and $\Delta\varphi_4$ , which rapidly reach an almost constant value, only slightly larger than $\Delta\varphi_1$ . In the temperature range $T_N(8)\lesssim T26. As expected from the previous argument, we see that $Q_{z,\max}=0$ for $T_N(8)16
) on a HCP lattice14,15, it was found that for thicknesses comparable with the helical pitch the phase diagram landscape is quite different from what we find here. Indeed, for $n=9-16$ , three different magnetic phases could be sin
-
-
-
-Figure 8 is a plot showing the peak position of the structure factor $Q_{z,\max}$ (in degrees) versus temperature $T$ (in K) for thickness $n=8$ . The plot shows data for different lateral dimensions $L$ (16, 32, 64, 128). The y-axis ranges from 0 to 30 degrees, and the x-axis ranges from 0 to 100 K. The inset shows the magnetic vector profile $(m_l^x, m_l^y)$ for $L=64$ at various temperatures, illustrating the transition from a paramagnetic phase to a long-range ordered phase.
-
-FIG. 8: (color online) $Q_{z,\max}$ position of the maximum of $S(\vec{q})$ , vs. temperature for thickness $n=8$ . Inset: magnetic vector $(m_l^x, m_l^y)$ profile for some temperatures for $L=64$ . Colors and symbols as in Fig. 2.
-
-
-
-Figure 9 is a plot showing the magnet",0.35998603351955305,"For this purpose, we look at the temperature dependence of the rotation angle of the magnetization between NN planes. In Fig. 7, $\Delta\phi_l(T)$ for $n = 8$ and $n = 16$ (continuous and dashed lines, respectively), is plotted for the outermost planes, $l = 1 \dots 4$. For both thicknesses, a monotonic trend is observed for all $l$, but at variance with what happens for the highest thickness, for $n = 8$ we see, starting from a temperature $T \lesssim T_N(8)$, an abrupt drop of $\Delta\phi_3$ and $\Delta\phi_4$, which rapidly reach an almost constant value, only slightly larger than $\Delta\phi_1$. In the temperature range $T_N(8) \lesssim T < T_C(8)$ we thus substantially observe the same small magnetic phase shifts between all NN layers, testifying an energetically stable quasi-FM configuration giving no contribution to the helical order parameters. The latter point can be made clearer by looking at the the peak position $Q_{z,max}$ of the structure factor $S(0, 0, q_z)$. In Fig. 8 the average of $Q_{z,max}$ vs $T$ is reported, again for $n = 8$ and for different lateral dimensions $L$ [26]. As expected from the previous argument, we see that $Q_{z,max} = 0$ for $T_N(8) < T < T_C(8)$, while it begins to shift to higher values as soon as the temperature decreases below $T_N(8)$, making apparent a progressive fan stabilization with $Q_{z,max} \neq 0$ and reaching a value of about $21^\circ$ for $T = 10 \text{ K}$.
-
-
-
-**FIG. 8:** (color online) $Q_z$, position of the maximum of $S(\vec{q})$, vs. temperature for thickness $n = 8$. Inset: magnetic vector $(m^x_l, m^y_l)$ profile for some temperatures for $L = 64$. Colors and symbols as in Fig. 2.
-
-In a previous study, where the magnetic properties of Ho thin films were investigated by MC simulations of a Heisenberg model with easy-plane single-ion anisotropy and six out-of-plane coupling constants (as obtained by experimental neutron scattering measurements [16]) on a HCP lattice [14, 15], it was found that for thicknesses comparable with the helical pitch the phase diagram landscape is quite different from what we find here. Indeed, for $n = 9 - 16$, three different magnetic phases could be singled out, with the high-temperature, paramagnetic phase separated from the low-temperature, long-range ordered one, by an intermediate-temperature block phase where outer ordered 4-layers blocks coexist with some inner disordered ones. Moreover, it was observed that the phase transition of such inner layers turns out to have the signatures of a Kosterlitz-Thouless one.
-
-
-
-**FIG. 9:** $\Delta\phi_l$ for a BCT lattice and $n = 12$, when the six coupling constants set employed in Ref. 14, 15 (see text) is used. The temperature range has been chosen around $T_C(n)$ (e",0.3620810055865922,"For this purpose, we look at the temperature dependence of the rotation angle of the magnetization between NN planes. In Fig. 7, Δφl(T) for n = 8 and n = 16 (continuous and dashed lines, respectively), is plotted for the outermost planes, l = 1...4. For both thicknesses, a monotonic trend is observed for all l, but at variance with what happens for the highest thickness, for n = 8 we see, starting from a temperature T ≲ TN(8), an abrupt drop of Δφ3 and Δφ4, which rapidly reach an almost constant value, only slightly larger than Δφ1. In the temperature range TN(8) ≲ T < TC(8) we thus substantially observe the same small magnetic phase shifts between all NN layers, testifying an energetically stable *quasi*-FM configuration giving no contribution to the helical order parameters. The latter point can be made clearer by looking at the the peak position Qz,max of the structure factor S(0, 0, qz). In Fig. 8 the average of Qz,max vs T is reported, again for n = 8 and for different lateral dimensions L26. As expected from the previous argument, we see that Qz,max = 0 for TN(8) < T < TC(8), while it begins to shift to higher values as soon as the temperature decreases below TN(8), making apparent a progressive fan stabilization with Qz,max ≠ 0 and reaching a value of about 21° for T = 10 K.
-
-In a previous study, where the magnetic properties of Ho thin films were investigated by MC simulations of a Heisenberg model with easy-plane single-ion anisotropy and six out-of-plane coupling constants (as obtained by experimental neutron scattering measurements16) on a HCP lattice14,15, it was found that for thicknesses comparable with the helical pitch the phase diagram landscape is quite different from what we find here. Indeed, for n = 9 − 16, three different magnetic phases could be sin-
-
-[FIG. 9: Graph showing Δφl vs. layer index l for a BCT lattice with n=12. The x-axis ranges from 0 to 12, y-axis from 0 to 80 degrees. Five temperature curves are shown: T=100K (circles), 130K (filled squares), 135K (diamonds), 140K (triangles), and 145K (inverted triangles). The curves show low values (~10-20°) for l=0-4, peak around l=6-7 (reaching ~80° for 135K), then decrease back to ~10° for l=8-12.]
-
-FIG. 9: Δφl for a BCT lattice and n = 12, when the six coupling constants set employed in Ref. 14,15 (see text) is used. The temperature range has been chosen around TC(n) (error bars lye within point size).
-
-gled out, with the high-temperature, paramagnetic phase separated from the low-temperature, long-range ordered one, by an intermediate-temperature block phase where outer ordered 4-layers blocks coexist with s",0.31110335195530725," purpose, we look at the temperature dependence of the rotation angle of the magnetization between NN planes. In Fig. 7, ∆ϕl(T ) for n = 8 and n = 16 (continuous and dashed lines, respectively), is plotted for the outermost planes, l = 1 . . . 4. For both thicknesses, a monotonic trend is observed for all l, but at variance with what happens for the highest thickness, for n = 8 we see, starting from a temperature T ≲ TN (8), an abrupt drop of ∆ϕ3 and ∆ϕ4, which rapidly reach an almost constant value, only slightly larger than ∆ϕ1. In the temperature range TN (8) ≲ T < TC(8) we thus substantially observe the same small magnetic phase shifts between all NN layers, testifying an energetically stable quasi-FM configuration giving no contribution to the helical order parameters. The latter point can be made clearer by looking at the the peak position Qz,max of the structure factor S(0, 0, qz). In Fig. 8 the average of Qz,max vs T is reported, again for n = 8 and for different lateral dimensions L[26] . As expected from the previous argument, we see that Qz,max = 0 for TN (8) < T < TC(8), while it begins to shift to higher values as soon as the temperature decreases below TN (8), making apparent a progressive fan stabilization with Qz,max ̸= 0 and reaching a value of about 21[◦] for T = 10 K.
-
-In a previous study, where the magnetic properties of Ho thin films were investigated by MC simulations of a Heisenberg model with easy-plane single-ion anisotropy and six out-of-plane coupling constants (as obtained by experimental neutron scattering measurements[16] ) on a HCP lattice[14,15] , it was found that for thicknesses comparable with the helical pitch the phase diagram landscape is quite different from what we find here. Indeed, for n = 9 − 16, three different magnetic phases could be sin-
-
-**==> picture [207 x 148] intentionally omitted <==**
-
-FIG. 8: (color online) Qz, position of the maximum of S(⃗q), vs. temperature for thickness n = 8. Inset: magnetic vector (m[x] l[, m][y] l[) profile for some temperatures for][ L][ = 64. Colors] and symbols as in Fig. 2.
-
-**==> picture [207 x 146] intentionally omitted <==**
-
-FIG. 9: ∆ϕl for a BCT lattice and n = 12, when the six coupling constants set employed in Ref. 14,15 (see text) is used. The temperature range has been chosen around TC(n) (error bars lye within point size).
-
-gled out, with the high-temperature, paramagnetic phase separated from the low-temperature, long-range ordered one, by an intermediate-temperature block phase where outer ordered 4-layers blocks coexist with some inner disordered ones. Moreover, it was observed that the phase transition of such inner layers turns out to have the signatures of a Kosterlitz-Thouless one.
-
-The absence of the block phase in the J1 − J2 model here investigated has to be attributed to the different range of interactions",0.3753491620111732," larger than ∆ ϕ 1 . In the temperature range T N (8) /lessorsimilar T < T C (8) we thus substantially observe the same small magnetic phase shifts between all NN layers, testifying an energetically stable quasi -FM configuration giving no contribution to the helical order parameters. The latter point can be made clearer by looking at the the peak position Q z,max of the structure factor S (0 , 0 , q z ). In Fig. 8 the average of Q z,max vs T is reported, again for n = 8 and for different lateral dimensions L 26 . As expected from the previous argument, we see that Q z,max = 0 for T N (8) < T < T C (8), while it begins to shift to higher values as soon as the temperature decreases below T N (8), making apparent a progressive fan stabilization with Q z,max = 0 and reaching a value of about 21 ◦ for T = 10K.
-
-In a previous study, where the magnetic properties of Ho thin films were investigated by MC simulations of a Heisenberg model with easy-plane single-ion anisotropy and six out-of-plane coupling constants (as obtained by experimental neutron scattering measurements 16 ) on a HCPlattice 14,15 , it was found that for thicknesses comparable with the helical pitch the phase diagram landscape is quite different from what we find here. Indeed, for n = 9 -16, three different magnetic phases could be sin-
-
-FIG. 8: (color online) Q z , position of the maximum of S ( /vector q ), vs. temperature for thickness n = 8. Inset: magnetic vector ( m x l , m y l ) profile for some temperatures for L = 64. Colors and symbols as in Fig. 2.
-
-
-
-FIG. 9: ∆ ϕ l for a BCT lattice and n = 12, when the six coupling constants set employed in Ref. 14,15 (see text) is used. The temperature range has been chosen around T C ( n ) (error bars lye within point size).
-
-
-
-gled out, with the high-temperature, paramagnetic phase separated from the low-temperature, long-range ordered one, by an intermediate-temperature block phase where outer ordered 4-layers blocks coexist with some inner disordered ones. Moreover, it was observed that the phase transition of such inner layers turns out to have the signatures of a Kosterlitz-Thouless one.
-
-The absence of the block phase in the J 1 -J 2 model here investigated has to be attributed to the different range of interactions, rather than to the different lattice structure. We came to this conclusion by doing some simulations using the same set of interaction constants employed in Refs. 14,15, but using a BCT lattice: the results we obtained for ∆ ϕ l with n = 12 are reported in Fig. 9. The latter is absolutely similar to Fig.7 of Ref. 15 and clearly displays the footmarks of the block phase (see down-triangle), with two external blocks of ordered layers ( l =1.. . 5 and 8. . . 12 ), where ∆ ϕ l is roughly 10 ◦ , separated by a block of disordered layers, and with almost",0.3753491620111732," larger than ∆ ϕ 1 . In the temperature range T N (8) /lessorsimilar T < T C (8) we thus substantially observe the same small magnetic phase shifts between all NN layers, testifying an energetically stable quasi -FM configuration giving no contribution to the helical order parameters. The latter point can be made clearer by looking at the the peak position Q z,max of the structure factor S (0 , 0 , q z ). In Fig. 8 the average of Q z,max vs T is reported, again for n = 8 and for different lateral dimensions L 26 . As expected from the previous argument, we see that Q z,max = 0 for T N (8) < T < T C (8), while it begins to shift to higher values as soon as the temperature decreases below T N (8), making apparent a progressive fan stabilization with Q z,max = 0 and reaching a value of about 21 ◦ for T = 10K.
-
-In a previous study, where the magnetic properties of Ho thin films were investigated by MC simulations of a Heisenberg model with easy-plane single-ion anisotropy and six out-of-plane coupling constants (as obtained by experimental neutron scattering measurements 16 ) on a HCPlattice 14,15 , it was found that for thicknesses comparable with the helical pitch the phase diagram landscape is quite different from what we find here. Indeed, for n = 9 -16, three different magnetic phases could be sin-
-
-FIG. 8: (color online) Q z , position of the maximum of S ( /vector q ), vs. temperature for thickness n = 8. Inset: magnetic vector ( m x l , m y l ) profile for some temperatures for L = 64. Colors and symbols as in Fig. 2.
-
-
-
-FIG. 9: ∆ ϕ l for a BCT lattice and n = 12, when the six coupling constants set employed in Ref. 14,15 (see text) is used. The temperature range has been chosen around T C ( n ) (error bars lye within point size).
-
-
-
-gled out, with the high-temperature, paramagnetic phase separated from the low-temperature, long-range ordered one, by an intermediate-temperature block phase where outer ordered 4-layers blocks coexist with some inner disordered ones. Moreover, it was observed that the phase transition of such inner layers turns out to have the signatures of a Kosterlitz-Thouless one.
-
-The absence of the block phase in the J 1 -J 2 model here investigated has to be attributed to the different range of interactions, rather than to the different lattice structure. We came to this conclusion by doing some simulations using the same set of interaction constants employed in Refs. 14,15, but using a BCT lattice: the results we obtained for ∆ ϕ l with n = 12 are reported in Fig. 9. The latter is absolutely similar to Fig.7 of Ref. 15 and clearly displays the footmarks of the block phase (see down-triangle), with two external blocks of ordered layers ( l =1.. . 5 and 8. . . 12 ), where ∆ ϕ l is roughly 10 ◦ , separated by a block of disordered layers, and with almost",18,science_sample
20,0,"Note that ǫ1,2,3 are all proportional to X which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio (g/¯g5)2 originates from the presence of brane localized kinetic terms. The ǫ parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters α, GF and mZ in terms of the model parameters. For convenience we rewrite the results:",False,0.027950310559006212,"t ǫ 1 ,2 ,3 are all proportional to X which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio (g/g ¯ 5) 2 originates from the presence of brane localized kinetic terms.
The ǫ parameters can be tested against the experimental data. To do this, we need to express the model parameters in terms of the physical quantities. Proceeding again as in [60] we get the expressions the standard input parameters α, GF and mZ in terms of the model parameters. For convenience we rewrite the results:",0.14130434782608695," which contains a double suppression factor. This feature was the main ingredient for the compatibility of the D-BESS model with the EW precision tests. In the five dimensional formulation of this model the ratio $(g/\bar{g}_5)^2$ originates from the presence of brane localized kinetic terms.
@@ -897,7 +798,7 @@ The /epsilon1 parameters can be tested against the experimental data. To do this
20,1,"In section VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b(y) ≡1 (flat extra dimension) and b(y) = e−2ky (a slice of AdS5). To this aim we need to invert (73), (74) and (75),",False,0.03571428571428571,"ection VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b(y ) ≡ 1 (flat extra dimension) and b (y) = e−2ky (a slice of AdS5). To this aim we need to invert (73), (74) and (75),",0.24603174603174602,"section VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, $b(y)\equiv 1$ (flat extra dimension) and $b(y)=e^{-2ky}$ (a slice of $\text{AdS}_5$ ). To this aim we need to inv",0.20238095238095238,"VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, $b(y) \equiv 1$ (flat extra dimension) and $b(y) = e^{-2ky}$ (a slice of $\text{AdS}_5$). To this aim we need to invert (73), (",0.25,"tion VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, $$b(y) \equiv 1$$ (flat extra dimension) and $$b(y) = e^{-2ky}$$ (a slice of $$\text{AdS}_5$$). To this aim we need to inv",0.06746031746031746,"ection VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b(y) ≡ 1 (flat extra dimension) and b(y) = e[−][2][ky] (a slice of AdS5). To this aim we need to invert (73), (74) and (",0.10317460317460317,"ection VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b ( y ) ≡ 1 (flat extra dimension) and b ( y ) = e -2 ky (a slice of AdS 5 ). To this aim we need to invert (73), (74) a",0.10317460317460317,"ection VI, we will study the constraints on the model parameter space by EW precision parameter for two choices of the warp factor, b ( y ) ≡ 1 (flat extra dimension) and b ( y ) = e -2 ky (a slice of AdS 5 ). To this aim we need to invert (73), (74) a",20,science_sample
21,0,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where ak+1 −ak = δ for each integer k at the optimum. In this case, the lower bound reduces to",False,0.008403361344537815,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where ak+1 − ak = δ for each integer k at the optimum. In this case, the lower bound reduces t",0.15966386554621848,"t the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where $a_{k+1} - a_k = \delta$ for each integer $k$ at the optimum. In this case, the lower bound redu",0.12605042016806722,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where $a_{k+1} - a_k = \delta$ for each integer $k$ at the optimum. In this case, the lower bo",0.20588235294117646,"sent the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where $$a_{k+1} = a_k \equiv \delta$$ for each integer $$k$$ at the optimum. In this case, the lower bo",0.08403361344537816,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where _ak_ +1 _− ak_ = _δ_ for each integer _k_ at the optimum. In this case, the lower bound ",0.029411764705882353,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where a k +1 -a k = δ for each integer k at the optimum. In this case, the lower bound reduces",0.029411764705882353,"Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where a k +1 -a k = δ for each integer k at the optimum. In this case, the lower bound reduces",21,science_sample
21,1,and computation of (B.1) poses a simple one-dimensional optimization problem.,False,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,0.0,and computation of (B.1) poses a simple one-dimensional optimization problem.,21,science_sample
-21,2,"It is not straightforward to solve the problem (B.2) numerically in Step 3; the function max{x, 0} is non- differentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicated",False,0.018604651162790697,"It is not straightforward to solve the problem (B.2) numerically in Step 3; the function max{x, 0} is non differentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicate",0.07906976744186046,"t is not straightforward to solve the problem (B.2) numerically in Step 3; the function $\max\{x,0\}$ is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complic",0.06046511627906977,"It is not straightforward to solve the problem (B.2) numerically in Step 3; the function $\max\{x, 0\}$ is non-differentiable. Furthermore in practice, marginal distribution functions are often estimated in a compli",0.07906976744186046,"t is not straightforward to solve the problem (B.2) numerically in Step 3; the function $$\max\{x, 0\}$$ is non-differentiable. Furthermore in practice, marginal distribution functions are often estimated in a compl",0.06976744186046512,"s not straightforward to solve the problem (B.2) numerically in Step 3; the function max _{x,_ 0 _}_ is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicate",0.04186046511627907," is not straightforward to solve the problem (B.2) numerically in Step 3; the function max { x, 0 } is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicated",0.04186046511627907," is not straightforward to solve the problem (B.2) numerically in Step 3; the function max { x, 0 } is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicated",21,science_sample
+21,2,"It is not straightforward to solve the problem (B.2) numerically in Step 3; the function max{x, 0} is non- differentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicated",False,0.018604651162790697,"It is not straightforward to solve the problem (B.2) numerically in Step 3; the function max{x, 0} is non differentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicate",0.07906976744186046,"It is not straightforward to solve the problem (B.2) numerically in Step 3; the function $\max\{x,0\}$ is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a compli",0.06046511627906977,"It is not straightforward to solve the problem (B.2) numerically in Step 3; the function $\max\{x, 0\}$ is non-differentiable. Furthermore in practice, marginal distribution functions are often estimated in a compli",0.07906976744186046,"t is not straightforward to solve the problem (B.2) numerically in Step 3; the function $$\max\{x, 0\}$$ is non-differentiable. Furthermore in practice, marginal distribution functions are often estimated in a compl",0.06976744186046512,"s not straightforward to solve the problem (B.2) numerically in Step 3; the function max _{x,_ 0 _}_ is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicate",0.04186046511627907," is not straightforward to solve the problem (B.2) numerically in Step 3; the function max { x, 0 } is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicated",0.04186046511627907," is not straightforward to solve the problem (B.2) numerically in Step 3; the function max { x, 0 } is nondifferentiable. Furthermore in practice, marginal distribution functions are often estimated in a complicated",21,science_sample
22,0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",False,0.0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",0.01990049751243781,"LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput $C$ taking the worst case ICI into account can be written as follow",0.05970149253731343,"e optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput $\mathcal{C}$ taking the worst case ICI into account can be written as follows",0.05970149253731343," optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput $\mathcal{C}$ taking the worst case ICI into account can be written as follows:",0.0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",0.0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",0.0,"A LB for the optimum multi-cell network throughput can be computed by considering worst case ICI. Observing the dependency of ICI on the subcarrier allocation and power allocation variables, we assume that each user in each cell is transmitting on each subcarrier with its maximum power. A simple LB for the average network throughput C taking the worst case ICI into account can be written as follows:",22,science_sample
22,1,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Qn,k,l where:",False,0.0,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Qn,k,l where:",0.08870967741935484,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes $Q_{n,k,l}$ ",0.08064516129032258,"tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes $Q_{n,k,l}$ whe",0.08064516129032258,"ighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes $Q_{n,k,l}$ wher",0.0,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Qn,k,l where:",0.016129032258064516,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Q n,k,l where",0.016129032258064516,"A tighter LB can be derived by using Algorithm 1 where each subcarrier is allocated to the user that maximizes Q n,k,l where",22,science_sample
22,2,"Thus, Qn,k,l is an SINR term for each user k at each subcarrier n in each cell l assuming worst case interference. We collect these SINR terms into a vector qn,l = [qn,1,l, qn,2,l...., qn,K,l] and then stack all the vectors in a matrix Ql ∈RN×K. The resulting allocations based on this criteria are then used to compute the LB network throughput using (1). Note that if ξn,l = 0, than Qn,k,l becomes the marginal rate which is shown to be a near-optimal criterion in single cell network scenarios without ICI [2]. Moreover, equal power allocation has insignificant performance loss in high SINR regime compared to the optimal water-filling solution [2], [4], thus power equalization is implemented in Algorithm 1. For the low SINR regime, we can incorporate water-filling rather than equalization in a straightforward manner. B. Upper Bound on the Optimal Network Throughput Establishing an UB is significantly important in order to calibrate the performance of sub- optimal resource allocation schemes with respect to the optimal solution. The UB can be derived",False,0.0330812854442344,",l is an SINR term for each user k at each subcarrier n in each cell l assuming worst case interference. We collect these SINR terms into a vector qn,l = [qn,1,l, qn,2,l...., qn,K,l] and then stack all the vectors in a matrix Ql ∈ R N ×K . The resulting allocations based on this criteria are then used to compute the LB network throughput using (1).
@@ -943,16 +844,17 @@ Note that if ξ n,l = 0 , than Q n,k,l becomes the marginal rate which is shown
## B. Upper Bound on the Optimal Network Throughput
Establishing an UB is significantly important in order to calibrate the performance of suboptimal resource allocation schemes with respect to the optimal solution. The UB can be derive",22,science_sample
-23,0,Let us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E(k) and spectral coupling v(k),False,0.022222222222222223,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E(k) and spectral coupling v(k),0.08148148148148149,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion $E(k)$ and spectral coupling ,0.06666666666666667, us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion $E(k)$ and spectral coupling $v(k,0.08148148148148149,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion $$E(k)$$ and spectral coupling ,0.022222222222222223,Let us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E(k) and spectral coupling v(k,0.06666666666666667,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E ( k ) and spectral coupling v,0.06666666666666667,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E ( k ) and spectral coupling v,23,science_sample
+23,0,Let us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E(k) and spectral coupling v(k),False,0.022222222222222223,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E(k) and spectral coupling v(k),0.08148148148148149,Let us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion $E(k)$ and spectral coupling,0.06666666666666667, us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion $E(k)$ and spectral coupling $v(k,0.06666666666666667,"
+Let us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion $E(k)$ and spectral coupling ",0.022222222222222223,Let us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E(k) and spectral coupling v(k,0.06666666666666667,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E ( k ) and spectral coupling v,0.06666666666666667,et us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion E ( k ) and spectral coupling v,23,science_sample
23,1,"The condition for the non-Hermitian Hamiltonian to pos- sess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the contin- uum) is derived in Appendix B. Precisely, let ξ1,2 be the two roots of the second-order algebraic equation",False,0.02181818181818182,"The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let ξ1,2 be the two roots of the second-order algebraic equation
-",0.06909090909090909,"The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let $\xi_{1,2}$ be the two roots of the second-order algebraic equ",0.05454545454545454," condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let $\xi_{1,2}$ be the two roots of the second-order algebraic equation",0.06909090909090909,"The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let $$\xi_{1,2}$$ be the two roots of the second-order algebraic equ",0.02909090909090909,"
+",0.06909090909090909,"e condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let $\xi_{1,2}$ be the two roots of the second-order algebraic equat",0.05454545454545454," condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let $\xi_{1,2}$ be the two roots of the second-order algebraic equation",0.05454545454545454,"he condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let $\xi_{1,2}$ be the two roots of the second-order algebraic equati",0.02909090909090909,"
The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let ξ1,2 be the two roots of the second-order algebraic equation
",0.02909090909090909,"
The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let ξ 1 , 2 be the two roots of the second-order algebraic equation",0.02909090909090909,"
The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let ξ 1 , 2 be the two roots of the second-order algebraic equation",23,science_sample
-24,0,"Figure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static func- tional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text.",False,0.025157232704402517,"ure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main te",0.02389937106918239,"gure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main te",0.028930817610062894," S1:** We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text",0.02389937106918239,"re S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text",0.02389937106918239,"e S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text.",0.02389937106918239,"Figure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main ",0.02389937106918239,"Figure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main ",24,science_sample
+24,0,"Figure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static func- tional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text.",False,0.025157232704402517,"ure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main te",0.02389937106918239,"igure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main t",0.028930817610062894," S1:** We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text",0.02389937106918239,"re S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text",0.02389937106918239,"e S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text.",0.02389937106918239,"Figure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main ",0.02389937106918239,"Figure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main ",24,science_sample
24,1,Figure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coeffi- cients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile ma- trix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity.,False,0.03428571428571429,Figure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connecti,0.06857142857142857,omparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is $r \approx 1$ . (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity,0.06095238095238095, Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is $r \approx 1$. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity,0.02857142857142857,gure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity,0.03619047619047619,re S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is _r ≈_ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity,0.02857142857142857,Figure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivi,0.02857142857142857,Figure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is r ≈ 1. (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivi,24,science_sample
25,0,"(vi) Kinetic energy weapons (excluding firearms) or projectiles, or parts thereof (vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof (viii) Military vessels, their hulls or accessories, or parts thereof (ix) Military aircraft, their accessories, or parts thereof (x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping (xi) Armor plates, military helmets, body armors, or parts thereof (xii) Military searchlights or control equipment therefor (xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof (xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials (xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof (xv) Equipment and devices used in the production or testing of military propellants, or parts thereof (xvi) Equipment specially designed for the production of weapons, test devices, or parts or accessories therefor (xvii) Military satellites, or parts thereof",False,0.1793103448275862,"ii) Military vehicles, their accessories, bridges
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weapons, test devices, or parts or accessories therefo",0.10620689655172413,"nergy weapons (excluding firearms) or projectiles, or parts thereof (vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof
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(xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof
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(xvi) Equipment specially designed for the production of weapons, test devices, or par",0.06896551724137931,"(vi) Kinetic energy weapons (excluding firearms) or projectiles, or parts thereof
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(xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof
(xv) Equipment and devices used in the production or testing of military propellants, or parts thereof
(xvi) Equipment specially designed for the production of weapons, test devices, or parts or accessories therefor<",0.1310344827586207,">(vii) Military vehicles, their accessories, bridges
specially designed for military use, or parts thereof
(viii) Military vessels, their hulls or accessories, or
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(x) Antisubmarine nets, anti-torpedo nets, or buoyant
electric power cables for magnetic mine sweeping
(xi) Armor plates, military helmets, body armors, or
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agents, radioactive materials, or equipment or parts for
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agents, or radioactive materials
(xiv) Biopolymers for the detection or identification of
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or degradation of CW agents, or expression vectors,
viruses, or cultures of cells that contain genetic codes
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(xvi) Equipment specially designed for the production of
weapons, test devices, or parts or accessories therefor
(xvii) Military satellites, or parts thereof",0.06482758620689655,"| | (vi) Kinetic energy weapons (excluding firearms) or projectiles, or parts thereof (vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof (viii) Military vessels, their hulls or accessories, or parts thereof (ix) Military aircraft, their accessories, or parts thereof (x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping (xi) Armor plates, military helmets, body armors, or parts thereof (xii) Military searchlights or control equipment therefor (xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof (xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials (xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof (xv) Equipment and devices used in the production or testing of military propellants, or parts thereof (xvi) Equipment specially designed for the production of | ",0.06482758620689655,"| | (vi) Kinetic energy weapons (excluding firearms) or projectiles, or parts thereof (vii) Military vehicles, their accessories, bridges specially designed for military use, or parts thereof (viii) Military vessels, their hulls or accessories, or parts thereof (ix) Military aircraft, their accessories, or parts thereof (x) Antisubmarine nets, anti-torpedo nets, or buoyant electric power cables for magnetic mine sweeping (xi) Armor plates, military helmets, body armors, or parts thereof (xii) Military searchlights or control equipment therefor (xiii) Military bacterial agents, chemical warfare (CW) agents, radioactive materials, or equipment or parts for the dissemination, protection, decontamination, detection, or identification thereof (xiii)-2 Chemical mixtures specially formulated for the decontamination of military bacterial agents, CW agents, or radioactive materials (xiv) Biopolymers for the detection or identification of CW agents, culture of cells used for the production of such biopolymers, biocatalysts for the decontamination or degradation of CW agents, or expression vectors, viruses, or cultures of cells that contain genetic codes required for production thereof (xv) Equipment and devices used in the production or testing of military propellants, or parts thereof (xvi) Equipment specially designed for the production of | ",25,laws_sample
25,1,"Goods listed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry (i) Nuclear fuel materials or nuclear source materials (ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reactors",False,0.16556291390728478,"e specifications comply with
Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries
therefor, or power-generating or propulsion equipment
specially designed for nuclear reacto",0.09271523178807947,"listed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear ",0.09933774834437085,"ed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reac",0.059602649006622516,"s listed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reac",0.11589403973509933,"oods listed below whose specifications comply with
Order of the Ministry of Economy, Trade and Industry
(i) Nuclear fuel materials or nuclear source materials
(ii) Nuclear reactors, components or auxiliaries
therefor, or power-generating or propulsion equipment
specially designed for nu",0.0,"Goods listed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry (i) Nuclear fuel materials or nuclear source materials (ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reactors",0.0,"Goods listed below whose specifications comply with Order of the Ministry of Economy, Trade and Industry (i) Nuclear fuel materials or nuclear source materials (ii) Nuclear reactors, components or auxiliaries therefor, or power-generating or propulsion equipment specially designed for nuclear reactors",25,laws_sample
@@ -1320,71 +1222,6 @@ Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanla
Abkommen für T‑DAB Wiesbaden 1995 und Maastricht 2002 und für DVB‑T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU‑R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKWTonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T‑DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position „Medianwert der Mindestfeldstärke“) und Angaben für den Betrieb eines DVB‑T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position „Medianwert für die minimale äquivalente Feldstärke“). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt.
Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",0.16383412644459552,"Abkommen für T-DAB Wiesbaden 1995 und Maastricht 2002 und für DVB-T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU-R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKWTonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T-DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position 'Medianwert der Mindestfeldstärke') und Angaben für den Betrieb eines DVB-T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position 'Medianwert für die minimale äquivalente Feldstärke'). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt. Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",0.16383412644459552,"Abkommen für T-DAB Wiesbaden 1995 und Maastricht 2002 und für DVB-T Chester 1997, sowie den jeweils gültigen nationalen Richtlinien (zurzeit 176 TR 22 bzw. 5 R 22 vom März 1992). Angaben für die jeweils frequenzabhängige Mindestnutzfeldstärke sind für TV-analog der ITU-R BT.417 zu entnehmen, Angaben für den Betrieb eines Kanals im Band II in analoger Übertragungstechnik (UKWTonrundfunk) sind dem Abkommen Genf 1984 zu entnehmen, Angaben für den Betrieb eines T-DAB-Kanals dem Abkommen Wiesbaden 1995 (Pkt. 2.2.3, Tabelle 1, Position 'Medianwert der Mindestfeldstärke') und Angaben für den Betrieb eines DVB-T-Kanals dem Abkommen Chester 1997 (Tabelle A.1.50, Position 'Medianwert für die minimale äquivalente Feldstärke'). In Gleichwellennetzen werden theoretische Versorgungsflächen verschiedener Sender nicht mehrfach veranschlagt. Auf der Basis der oben genannten Ausbreitungskurven wird für eine Sendefunkanlage eine Mindestnutzfeldstärkekontur gemäß den jeweils gültigen internationalen Abkommen errechnet. Hieraus ergibt sich für jeden 10°-Schritt eine Entfernung r vom Senderstandort bis zu dem Punkt, an dem die Mindestnutzfeldstärke erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:",29,laws_sample
-29,1,"Durch Addition der 36 Flächenelemente ergibt sich die theoretische Versorgungsfläche einer Sendeanlage in Quadratkilometern. i i l d f b i f d b i k fü d b i d f hl Quadratkilometern. Die Ermittlung der Entfernungen basiert auf den Ausbreitungskurven für Landausbreitung der Empfehlung ITU‑R P.370 für 50 % Zeit‑ und 50 % Ortswahrscheinlichkeit. Die Geländerauigkeit beträgt 50 m. Als Parameter sind der Frequenzbereich, in dem die Nutzung stattfindet, der Wert der Mindestnutzfeldstärke sowie die sektoriellen effektiven Antennenhöhen und Leistungen erforderlich. Für Entfernungen r, die kleiner sind als 10 km, werden die Ausbreitungskurven verwendet, die zurzeit auch in den Anlagen 1a und 2a der Richtlinie 176 TR 22 bzw. der Richtlinie 5 R 22 zu finden sind. ü S d di i h i Gl i h ll b i b d i d i l 2a der Richtlinie 176 TR 22 bzw. der Richtlinie 5 R 22 zu finden sind. Für Sender, die im Rahmen eines Gleichwellennetzes betrieben werden, wird mittels Leistungsadditionsverfahren die Summenfeldstärke des Netzes berechnet. Die theoretische Versorgungsfläche entsteht durch Addition von hinreichend kleinen Flächenelementen, in denen die Mindestnutzfeldstärke erreicht wird.",False,0.2866836301950806,"e erreicht ist. Daraus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:
-
-πρ
-A=
-36
-
-## Durch Addition der 36 Flächenelemente ergibt sich die theoretische Versorgungsfläche einer Sendeanlage in Quadratkilometern.
-
-Die Ermittlung der Entfernungen basiert auf den Ausbreitungskurven für Landausbreitung der Empfehlung ITU‑R P.370 für 50 % Zeit‑ und 50 % Ortswahrscheinlichkeit. Die Geländerauigkeit beträgt 50 m. Als Parameter sind der Frequenzbereich, in dem die Nutzung stattfindet, der Wert der Mindestnutzfeldstärke sowie die sektoriellen effektiven Antennenhöhen und Leistungen erforderlich. Für Entfernungen r, die kleiner sind als 10 km, werden die Ausbreitungskurven verwendet, die zurzeit auch in den Anlagen 1a und 2a der Richtlinie 176 TR 22 bzw. der Richtlinie 5 R 22 zu finden sind. Für Sender, die im Rahmen eines Gleichwellennetzes betrieben werden, wird mittels Leistungsadditionsverfahren die Summenfeldstärke des Netzes berechnet. Die theoretische Versorgungsfläche entsteht durch Addition von hinreichend kleinen Flächenelementen, in denen die Mindestnutzfeldstärke erreicht wird.
-
-Frequenznutzungsbeiträge und EMV-Beiträge für das Jahr 20",0.29346904156064463,"n:
-
-$$A = \frac{\pi r^2}{36}$$
-
-Durch Addition der 36 Flächenelemente ergibt sich die theoretische Versorgungsfläche einer Sendeanlage in Quadratkilometern. Die Ermittlung der Entfernungen basiert auf den Ausbreitungskurven für Landausbreitung der Empfehlung ITU-R P.370 für 50 % Zeit- und 50 % Ortswahrscheinlichkeit. Die Geländeraugkeit beträgt 50 m. Als Parameter sind der Frequenzbereich, in dem die Nutzung stattfindet, der Wert der Mindestnutzfeldstärke sowie die sektoriellen effektiven Antennenhöhen und Leistungen erforderlich. Für Entfernungen r, die kleiner sind als 10 km, werden die Ausbreitungskurven verwendet, die zurzeit auch in den Anlagen 1a und 2a der Richtlinie 176 TR 22 bzw. der Richtlinie 5 R 22 zu finden sind. Für Sender, die im Rahmen eines Gleichwellennetzes betrieben werden, wird mittels Leistungsadditionsverfahren die Summenfeldstärke des Netzes berechnet. Die theoretische Versorgungsfläche entsteht durch Addition von hinreichend kleinen Flächenelementen, in denen die Mindestnutzfeldstärke erreicht wird.
-
-# Frequenznutzungsbeiträge und EMV-Beiträge für das Jahr 2013
-
-| Nr. | Funkdienst/
Funkanwendung | Nutzergruppen | Bezugseinheit ",0.2900763358778626,"in Flächenelement $A$ berechnet werden:
-
-$$
-A = \frac{\pi r^2}{36}
-$$
-
-Durch Addition der 36 Flächenelemente ergibt sich die theoretische Versorgungsfläche einer Sendeanlage in Quadratkilometern.
-
-Die Ermittlung der Entfernungen basiert auf den Ausbreitungskurven für Landausbreitung der Empfehlung ITU‑R P.370 für 50 % Zeit‑ und 50 % Ortswahrscheinlichkeit. Die Geländerauigkeit beträgt 50 m. Als Parameter sind der Frequenzbereich, in dem die Nutzung stattfindet, der Wert der Mindestnutzfeldstärke sowie die sektoriellen effektiven Antennenhöhen und Leistungen erforderlich. Für Entfernungen $r$, die kleiner sind als 10 km, werden die Ausbreitungskurven verwendet, die zurzeit auch in den Anlagen 1a und 2a der Richtlinie 176 TR 22 bzw. der Richtlinie 5 R 22 zu finden sind.
-
-Für Sender, die im Rahmen eines Gleichwellennetzes betrieben werden, wird mittels Leistungsadditionsverfahren die Summenfeldstärke des Netzes berechnet. Die theoretische Versorgungsfläche entsteht durch Addition von hinreichend kleinen Flächenelementen, in denen die Mindestnutzfeldstärke erreicht wird.
-
-### Frequenznutzungsbeiträge und EMV-Beiträge für das Jahr 2013
-
-| Nr. | Funkdienst/
Funk",0.2858354537743851,"araus kann für jeden der 36 10°-Schritte ein Flächenelement A berechnet werden:
-
-$$A = \frac{\pi r^2}{36}$$
-
-Durch Addition der 36 Flächenelemente ergibt sich die theoretische Versorgungsfläche einer Sendeanlage in Quadratkilometern.
-
-Die Ermittlung der Entfernungen basiert auf den Ausbreitungskurven für Landausbreitung der Empfehlung ITU-R P.370 für 50 % Zeit- und 50 % Ortswahrscheinlichkeit. Die Geländerauigkeit beträgt 50 m. Als Parameter sind der Frequenzbereich, in dem die Nutzung stattfindet, der Wert der Mindestnutzfeldstärke sowie die sektoriellen effektiven Antennenhöhen und Leistungen erforderlich. Für Entfernungen r, die kleiner sind als 10 km, werden die Ausbreitungskurven verwendet, die zurzeit auch in den Anlagen 1a und 2a der Richtlinie 176 TR 22 bzw. der Richtlinie 5 R 22 zu finden sind.
-
-Für Sender, die im Rahmen eines Gleichwellennetzes betrieben werden, wird mittels Leistungsadditionsverfahren die Summenfeldstärke des Netzes berechnet. Die theoretische Versorgungsfläche entsteht durch Addition von hinreichend kleinen Flächenelementen, in denen die Mindestnutzfeldstärke erreicht wird.
-
-Frequenznutzungsbeiträge und EMV-Beiträge für das Jahr 201",0.2883799830364716,"lement A berechnet werden:
-
-**==> picture [36 x 22] intentionally omitted <==**
-
-Durch Addition der 36 Flächenelemente ergibt sich die theoretische Versorgungsfläche einer Sendeanlage in Quadratkilometern.
-
-Die Ermittlung der Entfernungen basiert auf den Ausbreitungskurven für Landausbreitung der Empfehlung ITU‑R P.370 für 50 % Zeit‑ und 50 % Ortswahrscheinlichkeit. Die Geländerauigkeit beträgt 50 m. Als Parameter sind der Frequenzbereich, in dem die Nutzung stattfindet, der Wert der Mindestnutzfeldstärke sowie die sektoriellen effektiven Antennenhöhen und Leistungen erforderlich. Für Entfernungen r, die kleiner sind als 10 km, werden die Ausbreitungskurven verwendet, die zurzeit auch in den Anlagen 1a und 2a der Richtlinie 176 TR 22 bzw. der Richtlinie 5 R 22 zu finden sind. Für Sender, die im Rahmen eines Gleichwellennetzes betrieben werden, wird mittels Leistungsadditionsverfahren die Summenfeldstärke des Netzes berechnet. Die theoretische Versorgungsfläche entsteht durch Addition von hinreichend kleinen Flächenelementen, in denen die Mindestnutzfeldstärke erreicht wird.
-
-Frequenznutzungsbeiträge und EMV-Beiträge für das Jahr 2013
-
-|Nr.|Funkdienst/
Fu",0.2917726887192536,"A berechnet werden:
-
-Durch Addition der 36 Flächenelemente ergibt sich die theoretische Versorgungsfläche einer Sendeanlage in Quadratkilometern. Die Ermittlung der Entfernungen basiert auf den Ausbreitungskurven für Landausbreitung der Empfehlung ITU-R P.370 für 50 % Zeit- und 50 % Ortswahrscheinlichkeit. Die Geländerauigkeit beträgt 50 m. Als Parameter sind der Frequenzbereich, in dem die Nutzung stattfindet, der Wert der Mindestnutzfeldstärke sowie die sektoriellen effektiven Antennenhöhen und Leistungen erforderlich. Für Entfernungen r, die kleiner sind als 10 km, werden die Ausbreitungskurven verwendet, die zurzeit auch in den Anlagen 1a und 2a der Richtlinie 176 TR 22 bzw. der Richtlinie 5 R 22 zu finden sind. Für Sender, die im Rahmen eines Gleichwellennetzes betrieben werden, wird mittels Leistungsadditionsverfahren die Summenfeldstärke des Netzes berechnet. Die theoretische Versorgungsfläche entsteht durch Addition von hinreichend kleinen Flächenelementen, in denen die Mindestnutzfeldstärke erreicht wird.
-
-## Frequenznutzungsbeiträge und EMV-Beiträge für das Jahr 2013
-
-| Nr. | Nutzergruppen | Bezugseinheit | Jahresbeitrag je Bez",0.2917726887192536,"A berechnet werden:
-
-Durch Addition der 36 Flächenelemente ergibt sich die theoretische Versorgungsfläche einer Sendeanlage in Quadratkilometern. Die Ermittlung der Entfernungen basiert auf den Ausbreitungskurven für Landausbreitung der Empfehlung ITU-R P.370 für 50 % Zeit- und 50 % Ortswahrscheinlichkeit. Die Geländerauigkeit beträgt 50 m. Als Parameter sind der Frequenzbereich, in dem die Nutzung stattfindet, der Wert der Mindestnutzfeldstärke sowie die sektoriellen effektiven Antennenhöhen und Leistungen erforderlich. Für Entfernungen r, die kleiner sind als 10 km, werden die Ausbreitungskurven verwendet, die zurzeit auch in den Anlagen 1a und 2a der Richtlinie 176 TR 22 bzw. der Richtlinie 5 R 22 zu finden sind. Für Sender, die im Rahmen eines Gleichwellennetzes betrieben werden, wird mittels Leistungsadditionsverfahren die Summenfeldstärke des Netzes berechnet. Die theoretische Versorgungsfläche entsteht durch Addition von hinreichend kleinen Flächenelementen, in denen die Mindestnutzfeldstärke erreicht wird.
-
-## Frequenznutzungsbeiträge und EMV-Beiträge für das Jahr 2013
-
-| Nr. | Nutzergruppen | Bezugseinheit | Jahresbeitrag je Bez",29,laws_sample
30,0,"Chapter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph; (b) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph, a Bill for an Act of Parliament under this section shall not be passed by the National Assembly unless- (i) the final voting on the Bill in the Assembly takes place not less than three months after the previous voting thereon in the Assembly; and",False,0.025714285714285714,"ter II; sections 30 to 44 inclusive, 47 to 51 inclusive, and 56; sections 77 to 79 inclusive and section 85; Chapter VII; or sections 117 to 120 inclusive and section 127 in its application to any of the provisions mentioned in this paragraph;
(b) sections 57, 63 to 66 inclusive, 86 to 89 inclusive, 90(2) and (3), 91(2), (3), (4) and (5), and 92; Chapter VI; and section 127 in its application to any of the provisions mentioned in this paragraph,
@@ -1507,7 +1344,7 @@ invitation for trouble of many sorts. The normal and emergency procedures applic
Great time and effort are expended in the preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent *study* and continuous *use* of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.
-![",0.03540462427745665,"*
+![",0.03540462427745665,"
invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment.
@@ -1519,7 +1356,7 @@ invitation for trouble of many sorts. The normal and emergency procedures applic
Great time and effort are expended in the preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent *study* and continuous *use* of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.
-",0.023121387283236993,"NG
+[",0.023121387283236993,"NG
invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment. (3) Operating Limitatiom. The operation of the airplane and powerplant must be conducted within the established limitations. Failure to do so will invite failure or malfunction of the equipment and increase the operating cost or possibly cause an accident.
@@ -1548,13 +1385,13 @@ Great time and effort are expended in the preparation of the flight handbo
Great time and effort are expended in the preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent study and continuous UC of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the ",32,laws_sample
33,0,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right. Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24.",False,0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
+Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"unway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
+Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24.",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
+Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"unway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
-Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.008583690987124463,"unway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
+Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24.",0.008583690987124463,"unway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24",0.006437768240343348,"Runway centerline lights (CL) are installed on some precision approach runways to facilitate landing under adverse visibility conditions. They are located along the runway centerline and are spaced at 50 foot intervals. Runways with CL are shown in a negative dot pattern through the middle of the solid runway as illustrated in the airport sketch to right.
@@ -1611,8 +1448,7 @@ Operation in this region of high load factors at low gross weight may create the
Gusts are associated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The increment change in load factor due to the vertical gust can be determined from the following equation:
-",0.025673940949935817," |
-
+",0.025673940949935817,"
As illustrated, at high gross weights above the basic configuration weight, the limit and ultimate load factors may be seriously reduced. For the airplane shown, a 5-*g* maneuver immediately after a high gross weight takeoff could be very near the ""disaster regime,"" especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience greatly increased limit and ultimate load factors.
@@ -1620,7 +1456,7 @@ Operation in this region of high load factors at low gross weight may create the
GUST LOAD FACTORS. Gusts are associated with the vertical and horizontal velocity gradients in the atmosphere. A horizontal gust produces a change in dynamic pressure on the airplane but causes relatively small and unimportant changes in flight load factor. The more important gusts are the vertical gusts which cause changes in angle of attack. This process is illustrated in figure 5.2. The vectorial addition of the gust velocity to the airplane velocity causes the change in angle of attack and change in lift. The change in angle of attack at some flight condition causes a change in the flight load factor. The increment change in load factor due to the vertical gust can be determined from the following equation:
-$$\Del",0.02053915275994865,"
+$$\Delta ",0.02053915275994865,"
As illustrated, at high gross weights above the basic configuration weight, the limit and ultimate load factors may be seriously reduced. For the airplane shown, a 5-g maneuver immediately after a high gross weight takeoff could be very near the “disaster regime,” especially if turbulence is associated with the maneuver. In the same sense, this airplane at very low operating weights below that of the basic configuration would experience greatly increased limit and ultimate load factors.
@@ -1693,12 +1529,12 @@ Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V
**MTA for aircraft crossing over and turning at JAC:**
-- Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000’ or high",0.030959752321981424,"CA for aircraft traveling West along V520 to cross JAC at 15200'
+- Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000’ or high",0.030959752321981424,"MCA for aircraft traveling West along V520 to cross JAC at 15200'
MCA for aircraft traveling West along V330 to cross JAC at 13400'
MTA for aircraft crossing over and turning at JAC:
-Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000' or highe",0.02476780185758514,"A for aircraft traveling West along V520 to cross JAC at 15200’ MCA for aircraft traveling West along V330 to cross JAC at 13400’
+Aircraft traveling NE on V465 and turning to V330 on a W heading or turning to V520 on a W heading must turn at altitude of 16000' or high",0.02476780185758514,"A for aircraft traveling West along V520 to cross JAC at 15200’ MCA for aircraft traveling West along V330 to cross JAC at 13400’
MTA for aircraft crossing over and turning at JAC:
@@ -1730,16 +1566,16 @@ provision-",0.013311148086522463,") In this section, the expression ""discrimina
## (4) Subsection (1) of this section shall not apply to any law so far as that law makes provisio",39,laws_sample
40,0,"MISSED APPROACH: Climb to 13000 on RIL VOR/DME R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in- hold to 13000.",False,0.1497005988023952," MISSED APPROACH: Climb to 13000 on RIL VOR/DME
R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME
R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in-
R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME
R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in-
hold to ",0.0,"MISSED APPROACH: Climb to 13000 on RIL VOR/DME R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in- hold to 13000.",0.0,"MISSED APPROACH: Climb to 13000 on RIL VOR/DME R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in- hold to 13000.",40,laws_sample
40,1,"MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",False,0.0970873786407767,"SSED APPROACH: Climbing left turn to 8000 via SVC
R-128, then reverse course to SVC VOR/DME and ho",0.019417475728155338,"MISSSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold",0.0,"MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",0.0,"MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",0.06796116504854369,"ISSED APPROACH: Climbing left turn to 8000 via SVC
R-128, then reverse course to SVC VOR/DME and hol",0.0,"MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",0.0,"MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold.",40,laws_sample
-40,2,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",False,0.11363636363636363,"ISSED APPROACH: Climb to 9000 on track 112° to JETRY,
cross JETRY at or above 6700, and on track 112° to PAKPE,
right turn to WULKU, and on track 289° to JNC VOR/DME ",0.011363636363636364,"MISSSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold",0.0,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",0.0,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",0.07386363636363637,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY,
cross JETRY at or above 6700, and on track 112° to PAKPE,
ight turn to WULKU, and on track 289° to JNC VOR/DME and<",0.0,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",0.0,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",40,laws_sample
+40,2,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",False,0.11363636363636363,"ISSED APPROACH: Climb to 9000 on track 112° to JETRY,
cross JETRY at or above 6700, and on track 112° to PAKPE,
right turn to WULKU, and on track 289° to JNC VOR/DME ",0.011363636363636364,"ISSSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",0.0,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",0.0,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",0.07386363636363637,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY,
cross JETRY at or above 6700, and on track 112° to PAKPE,
ight turn to WULKU, and on track 289° to JNC VOR/DME and<",0.0,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",0.0,"MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold.",40,laws_sample
41,0,"3.—(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E. (2) Paragraph (1) does not apply to any aircraft—",False,0.008108108108108109,".—(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
(2) Paragraph (1) does not apply to any aircraft—",0.008108108108108109,"3.—(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
(2) Paragraph (1) does not apply to any aircraft",0.010810810810810811,"*—(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
-(2) Paragraph (1) does not apply to any aircraft—",0.02972972972972973,"(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.~~
+(2) Paragraph (1) does not apply to any aircraft—",0.02972972972972973,"1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.~~
-~~(2) Paragraph (1) does not apply to any aircraf",0.03783783783783784,"(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
+~~(2) Paragraph (1) does not apply to any aircraft",0.03783783783783784,"(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
- (2) Paragraph (1) does not apply to any aircr",0.016216216216216217,"3. -(1) Subject to paragraph (2), between 0400 hours and 2100 hours on each of the nine days beginning on 11th July 2021 and ending on 19th July 2021 no aircraft is to fly below 2,000 feet above mean sea level within the area bounded by a circle having a radius of 1.07 nautical miles whose centre is at 521628N 0012201E.
@@ -1751,24 +1587,24 @@ provision-",0.013311148086522463,") In this section, the expression ""discrimina
( b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.017964071856287425,"(a) S.I. 2016/765, to which there are amendments not relevant to these Regulations.
(b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.0718562874251497,".I. 2016/765, to which there are amendments not relevant to these Regulations.
-[^b]: (b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.017964071856287425,"(a) S.I. 2016/765, to which there are amendments not relevant to these Regulations.
+[^b]: (b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.0658682634730539,"S.I. 2016/765, to which there are amendments not relevant to these Regulations.
-(b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.11976047904191617,".I. 2016/765, to which there are amendments not relevant to these Regulations.
+**(b)** Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.11976047904191617,".I. 2016/765, to which there are amendments not relevant to these Regulations.
> ( **b** ) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (",0.041916167664670656,") S.I. 2016/765, to which there are amendments not relevant to these Regulations.
( b ) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",0.041916167664670656,") S.I. 2016/765, to which there are amendments not relevant to these Regulations.
( b ) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST)",41,laws_sample
-42,0,"That airspace from 18,000’ MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airspace less than 1,500’ AGL.",False,0.15544041450777202,"ce from 18,000’ MSL to and including FL 600,
including the airspace overflying the waters within 12 NM
of the coast of the contiguous United States and Alaska
and designated offshore areas, excluding Santa Barbara
Island, Farallon Island, the airspace south of latitude
25° 04’00” N, the Alaska peninsula west of longitude
160°00’00” W, and the airspace le",0.02072538860103627,"That airspace from 18,000' MSL to and including FL 600, including the airspace overlying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00"" N, the Alaska peninsula west of longitude 160°00'00"" W, and the airspace less than 1,500' AGL. ",0.0,"That airspace from 18,000’ MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airspace less than 1,500’ AGL.",0.015544041450777202,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00"" N, the Alaska peninsula west of longitude 160°00'00"" W, and the airspace less than 1,500' AGL.",0.12435233160621761,"airspace from 18,000’ MSL to and including FL 600, including the airspace overflying the waters within 12 NM _Controlled_ of the coast of the contiguous United States and Alaska _Airspace_ and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airspace le",0.015544041450777202,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00' N, the Alaska peninsula west of longitude 160°00'00' W, and the airspace less than 1,500' AGL.",0.015544041450777202,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00' N, the Alaska peninsula west of longitude 160°00'00' W, and the airspace less than 1,500' AGL.",42,laws_sample
+42,0,"That airspace from 18,000’ MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airspace less than 1,500’ AGL.",False,0.15544041450777202,"ce from 18,000’ MSL to and including FL 600,
including the airspace overflying the waters within 12 NM
of the coast of the contiguous United States and Alaska
and designated offshore areas, excluding Santa Barbara
Island, Farallon Island, the airspace south of latitude
25° 04’00” N, the Alaska peninsula west of longitude
160°00’00” W, and the airspace le",0.02072538860103627," That airspace from 18,000' MSL to and including FL 600, including the airspace overlying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00"" N, the Alaska peninsula west of longitude 160°00'00"" W, and the airspace less than 1,500' AGL.",0.0,"That airspace from 18,000’ MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airspace less than 1,500’ AGL.",0.015544041450777202,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00"" N, the Alaska peninsula west of longitude 160°00'00"" W, and the airspace less than 1,500' AGL.",0.12435233160621761,"airspace from 18,000’ MSL to and including FL 600, including the airspace overflying the waters within 12 NM _Controlled_ of the coast of the contiguous United States and Alaska _Airspace_ and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airspace le",0.015544041450777202,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00' N, the Alaska peninsula west of longitude 160°00'00' W, and the airspace less than 1,500' AGL.",0.015544041450777202,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00' N, the Alaska peninsula west of longitude 160°00'00' W, and the airspace less than 1,500' AGL.",42,laws_sample
42,1,"That airspace from 18,000’ MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00’00” W, and designated offshore areas.",False,0.1595744680851064,"airspace from 18,000’ MSL to and including FL
450, including Santa Barbara Island, Farallon Island, the
Alaska peninsula west of longitude 160°00’00” W, and
designated offsh",0.015957446808510637,"That airspace from 18,000' MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00'00"" W, and designated offshore areas.",0.0,"That airspace from 18,000’ MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00’00” W, and designated offshore areas.",0.015957446808510637,"That airspace from 18,000' MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00'00"" W, and designated offshore areas.",0.6063829787234043,"d designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04’00” N, the Alaska peninsula west of longitude 160°00’00” W, and the airs",0.015957446808510637,"That airspace from 18,000' MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00'00' W, and designated offshore areas.",0.015957446808510637,"That airspace from 18,000' MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00'00' W, and designated offshore areas.",42,laws_sample
42,2,"That airspace from the surface to 10,000’ MSL (unless otherwise designated) surrounding the nation’s busi- est airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.",False,0.013215859030837005,"
That airspace from the surface to 10,000’ MSL (unless otherwise designated) surrounding the nation’s busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.",0.02643171806167401,"
-That airspace from the surface to 10,000' MSL (unless otherwise designated) surrounding the nation's busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.
-",0.01762114537444934,"That airspace from the surface to 10,000’ MSL (unless otherwise designated) surrounding the nation’s busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.
-",0.02643171806167401,"That airspace from the surface to 10,000' MSL (unless otherwise designated) surrounding the nation's busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.
+That airspace from the surface to 10,000' MSL (unless otherwise designated) surrounding the nation's busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.",0.01762114537444934,"That airspace from the surface to 10,000’ MSL (unless otherwise designated) surrounding the nation’s busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.
+",0.02643171806167401,"
+That airspace from the surface to 10,000' MSL (unless otherwise designated) surrounding the nation's busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.
",0.01762114537444934,"
That airspace from the surface to 10,000’ MSL (unless otherwise designated) surrounding the nation’s busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.",0.7048458149779736,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Is",0.7048458149779736,"That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Is",42,laws_sample
@@ -1786,11 +1622,11 @@ On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as
![Diagram illustra",0.06888068880688807,"# RADIO AIDS TO NAVIGATION
-On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.",0.06888068880688807,"ATION
+On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.",0.06888068880688807,"GATION
On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.
-| Crosshatch indica",0.06888068880688807,"ATION**
+| Crosshatch indic",0.06888068880688807,"ATION**
On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.
@@ -1824,16 +1660,14 @@ Other than hard-surfaced runways
-Seaplan",0.0963855421686747,"urfaced runways greater than 8069' or some multiple runways less than 8069'
+Seaplan",0.0963855421686747,"ard-surfaced runways greater than 8069' or some multiple runways less than 8069'
- Hard-surfaced runways 1500' to 8069'
- Other than hard-surfaced runways
-- Seaplane bases",0.3795180722891566,"ard-surfaced runways greater than 8069’ or some multiple runways less than 8069’
+- Seaplane ",0.3795180722891566,"ard-surfaced runways greater than 8069’ or some multiple runways less than 8069’
* **[Icon: Magenta circle with white X]** Hard-surfaced runways 1500’ to 8069’
-* ",0.39759036144578314,"Hard-surfaced runways greater than 8069' or some multiple runways less than 8069'
-
-[Purple circle with airplane symbol] Hard-surfaced runways 1500' to 8069'
+* ",0.39156626506024095,"icon] Hard-surfaced runways greater than 8069' or some multiple runways less than 8069'
-[Purple ",0.07228915662650602,"rd-surfaced runways greater than 8069’ or some multiple runways less than 8069’
+[Airport symbol: Circle with star inside] Hard-surfaced runways 1500' to 8069",0.07228915662650602,"rd-surfaced runways greater than 8069’ or some multiple runways less than 8069’
Hard-surfaced runways 1500’ to 8069’
@@ -1910,12 +1744,13 @@ period of those terms, and no account shall be taken of a sentence of imprisonme
(4) A Member of the Ntlo ya Dikgosi shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the Ntlo ya Dikgosi shall not bar any person from being such a Member.",0.005136986301369863,"3) For the purposes of this section, two or more terms of imprisonment that are required to be served consecutively shall be regarded as a single term of imprisonment for the aggregate period of those terms, and no account shall be taken of a sentence of imprisonment imposed as an alternative to or in default of the payment of a fine.
(4) A Member of the Ntlo ya Dikgosi shall not, while he or she is such a Member, participate in party politics, but active participation in politics prior to being a Member of the Ntlo ya Dikgosi shall not bar any person from being such a Member.",45,laws_sample
-46,0,"Where a physical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to them.",False,0.0,"Where a physical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to them.",0.0297723292469352,"a **physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the 'Terms of Reference'. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to the",0.05253940455341506,"physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the **'Terms of Reference'**. The **access of third parties (for example subcontractors)** is prohibited. Attendees will not be permitted to take copies in any form of the data made available to",0.028021015761821366,"e a **physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to t",0.028021015761821366,"Where a **physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available ",0.05604203152364273,"hysical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available t",0.05604203152364273,"hysical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available t",46,govt tenders
-47,0,"not use confidential information or documents for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party; (b) ensure the protection of such confidential information or documents with the same level of protection as its own confidential information or documents, and in any case with due diligence;",False,0.01366120218579235,"ot use confidential information or documents for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
+46,0,"Where a physical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to them.",False,0.0,"Where a physical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to them.",0.0297723292469352,"a **physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the 'Terms of Reference'. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to the",0.05253940455341506,"physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the **'Terms of Reference'**. The **access of third parties (for example subcontractors)** is prohibited. Attendees will not be permitted to take copies in any form of the data made available to",0.028021015761821366,"physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available to them.
- (b) ensure the protection of such confidential information or documents with the same level of protection as its own confidential information or documents, and in any case with due diligence",0.030054644808743168," use *confidential information or documents* for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
+",0.028021015761821366,"Where a **physical data room** is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in **point 1.2** of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available ",0.05604203152364273,"hysical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available t",0.05604203152364273,"hysical data room is used, it will be made available to Tenderers to facilitate access to information that is not publicly available and that Tenderers may find useful for preparing the technical and financial offer. Depending on the sensitivity of the information provided the access of attendees per Tenderer will be restricted to the number indicated in point 1.2 of the `Terms of Reference`. The access of third parties (for example subcontractors) is prohibited. Attendees will not be permitted to take copies in any form of the data made available t",46,govt tenders
+47,0,"not use confidential information or documents for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party; (b) ensure the protection of such confidential information or documents with the same level of protection as its own confidential information or documents, and in any case with due diligence;",False,0.01366120218579235,"ot use confidential information or documents for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
-(b) ensure the protection of such *confidential information or documents* with the same level of protection as its own confidential information or documents, and in any case with due diligenc",0.03278688524590164," use *confidential information or documents* for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
+ (b) ensure the protection of such confidential information or documents with the same level of protection as its own confidential information or documents, and in any case with due diligence",0.030054644808743168,"t use *confidential information or documents* for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
+2. ensure the protection of such *confidential information or documents* with the same level of protection as its own confidential information or documents, and in any case with due diligence",0.03278688524590164," use *confidential information or documents* for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
- (b) ensure the protection of such *confidential information or documents* with the same level of protection as its own confidential information or documents, and in any case with due diligen",0.030054644808743168,"se *confidential information or documents* for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
(b) ensure the protection of such *confidential information or documents* with the same level of protection as its own confidential information or documents, and in any case with due diligence;",0.0546448087431694,"nfidential information or documents_ for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
@@ -2064,11 +1899,11 @@ Economic operators may submit one tender. In case an economic operator submits m
## 2.5. Tender submission: how many tenders may an economic operator submit?
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is missi",0.022144522144522144,"lying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
+Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is missi",0.022144522144522144,"Relying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
## **2.5. Tender submission: how many tenders may an economic operator submit?**
-Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is mis",0.018648018648018648,"elying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
+Economic operators may submit one tender. In case an economic operator submits more than one tender (as sole tenderer and/or as a joint tenderer in a group of tenderers) without withdrawing any of them, as foreseen in the Invitation to Tender, only the latest tender submitted before the time limit for receipt of tenders will be considered. In case of omissions in the latest submission, tenderers will not be able to refer to earlier submissions and may be rejected if mandatory information is m",0.018648018648018648,"elying on the capacities of other entities is only necessary when the capacity of the tenderer is not sufficient to fulfil the required minimum levels of capacity. Abstract commitments that other entities will put resources at the disposal of the tenderer will be disregarded.
**2.5. Tender submission: how many tenders may an economic operator submit?**
@@ -2089,14 +1924,9 @@ Economic operators may submit one tender. In case an economic operator submits m
## 3.2.3. Technical and professional capacity
-Tenderers must comply with the following selection criteria in order to prove that they have the necessary technical and professional ",0.4311632870864461,"alid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the Contracting Authority considers appropriate. The contracting authority must at least be notified of the reason and its justification. |
-| The Contracting Authority reserves the right to request any other document enabling it to verify the economic operator's economic and financial capacity. |
-
-→ All of the above specified evidence of economic and financial capacity must be provided with the tender.
+Tenderers must comply with the following selection criteria in order to prove that they have the necessary technical and professional ",0.37886872998932764,"
-### 3.2.3. Technical and professional capacity
-
-Tenderers must comply with the following selection criteria in order to prove that they have the necessary technical ",0.051227321237993596,"e profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity.
+| |
2) Copies of the profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity.
If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the Contracting Authority considers appropriate. The contracting authority must at least be notified of the reason and its justification.
The Contracting Authority reserves the right to request any other document enabling it to verify the economic operator's economic and financial capacity.
",0.051227321237993596,"e profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity.
>
> If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the *Contracting Authority* considers appropriate. The contracting authority must at least be notified of the reason and its justification.
>
@@ -2129,7 +1959,7 @@ Tenderers must comply with the following selection criteria in order to prove th
| 2) Copies of the profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity. If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the Contracting Authority considers appropriate. The contracting authority must at least be notified of the reason and its justification. The Contracting Authority reserves the right to request any other document enabling it to verify the economic operator's economic and financial capacity. ",0.35645677694770544,"
| 2) Copies of the profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity. If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the Contracting Authority considers appropriate. The contracting authority must at least be notified of the reason and its justification. The Contracting Authority reserves the right to request any other document enabling it to verify the economic operator's economic and financial capacity. ",53,govt tenders
-53,1,The tenderers must have worked on at least 10 contracts15 with at least 3 different clients over the last 4 years (i.e. 23/11/2016 – 08/01/2021). 2. The 10 contract references must cover the provision of Transformation services in the following domains: - Information systems consultancy and/or studies – minimum 6 references; - Information systems development and support – minimum 4 references; 3. Minimum volumes for each referenced contract for Information systems consultancy and/or studies: a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-days.,False,0.18968133535660092,s must have worked on at least 10 contracts 15 with
at least 3 different clients over the last 4 years (i.e. 23/11/2016
- 08/01/2021).
2. The 10 contract references must cover the provision of
Transformation services in the following domains:
- Information systems consultancy and/or studies - minimum
6 references;
■ Information systems development and support – minimum 4
references;
3. Minimum volumes for each referenced contract for Information
systems consultancy and/or studies:
a. Engagement of IT experts corresponding to the relevant IT
profiles listed in Annex 11 of the Technical Specifi,0.23823975720789076,"h at least 3 different clients over the last 4 years (i.e. 23/11/2016 – 08/01/2021). - The 10 contract references must cover the provision of Transformation services in the following domains:
- Information systems consultancy and/or studies – minimum 6 references;
- Information systems development and support – minimum 4 references;
- Minimum volumes for each referenced contract for Information systems consultancy and/or studies:
- Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 p",0.38088012139605465,3/11/2016 – 08/01/2021**).
2. The **10** contract references **must** cover the provision of **Transformation services** in the following domains:
- **Information systems consultancy and/or studies – minimum 6 references;**
- **Information systems development and support – minimum 4 references;**
3. **Minimum volumes for each referenced contract for Information systems consultancy and/or studies:**
a. **Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-day,0.4597875569044006,"he 10 contract references must cover the provision of Transformation services in the following domains:- Information systems consultancy and/or studies – minimum 6 references;
+53,1,The tenderers must have worked on at least 10 contracts15 with at least 3 different clients over the last 4 years (i.e. 23/11/2016 – 08/01/2021). 2. The 10 contract references must cover the provision of Transformation services in the following domains: - Information systems consultancy and/or studies – minimum 6 references; - Information systems development and support – minimum 4 references; 3. Minimum volumes for each referenced contract for Information systems consultancy and/or studies: a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-days.,False,0.18968133535660092,s must have worked on at least 10 contracts 15 with
at least 3 different clients over the last 4 years (i.e. 23/11/2016
- 08/01/2021).
2. The 10 contract references must cover the provision of
Transformation services in the following domains:
- Information systems consultancy and/or studies - minimum
6 references;
■ Information systems development and support – minimum 4
references;
3. Minimum volumes for each referenced contract for Information
systems consultancy and/or studies:
a. Engagement of IT experts corresponding to the relevant IT
profiles listed in Annex 11 of the Technical Specifi,0.23823975720789076,"th at least 3 different clients over the last 4 years (i.e. 23/11/2016 – 08/01/2021). - The 10 contract references must cover the provision of Transformation services in the following domains:
- Information systems consultancy and/or studies – minimum 6 references;
- Information systems development and support – minimum 4 references;
- Minimum volumes for each referenced contract for Information systems consultancy and/or studies:
- Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 ",0.38088012139605465,3/11/2016 – 08/01/2021**).
2. The **10** contract references **must** cover the provision of **Transformation services** in the following domains:
- **Information systems consultancy and/or studies – minimum 6 references;**
- **Information systems development and support – minimum 4 references;**
3. **Minimum volumes for each referenced contract for Information systems consultancy and/or studies:**
a. **Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-day,0.4597875569044006,"he 10 contract references must cover the provision of Transformation services in the following domains:- Information systems consultancy and/or studies – minimum 6 references;
- Information systems development and support – minimum 4 references; |
| | 3. | Minimum volumes for each referenced contract for Information systems **consultancy and/or studies:**- a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-days.",0.11684370257966616,10 contracts[15]** with **level of** at least **3 different clients** over the **last 4 years** (i.e. 23/11/2016 **capacity – 08/01/2021)** . 2. The 10 contract references must cover the provision of Transformation services in the following domains: - Information systems consultancy and/or studies – minimum 6 references; - Information systems development and support – minimum 4 references; 3. Minimum volumes for each referenced contract for Information systems **consultancy and/or studies:** a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-days.,0.010622154779969651,The tenderers must have worked on at least 10 contracts 15 with at least 3 different clients over the last 4 years (i.e. 23/11/2016 - 08/01/2021) . 2. The 10 contract references must cover the provision of Transformation services in the following domains: - Information systems consultancy and/or studies - minimum 6 references; - Information systems development and support - minimum 4 references; 3. Minimum volumes for each referenced contract for Information systems consultancy and/or studies: a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-day,0.010622154779969651,The tenderers must have worked on at least 10 contracts 15 with at least 3 different clients over the last 4 years (i.e. 23/11/2016 - 08/01/2021) . 2. The 10 contract references must cover the provision of Transformation services in the following domains: - Information systems consultancy and/or studies - minimum 6 references; - Information systems development and support - minimum 4 references; 3. Minimum volumes for each referenced contract for Information systems consultancy and/or studies: a. Engagement of IT experts corresponding to the relevant IT profiles listed in Annex 11 of the Technical Specifications and amounting to minimum 200 person-day,53,govt tenders
53,2,Minimum level of capacity,False,0.52, />level of
capacity,0.0,Minimum level of capacity,0.0,Minimum level of capacity,0.0,Minimum level of capacity,0.56, Minimum volumes for each,0.0,Minimum level of capacity,0.0,Minimum level of capacity,53,govt tenders
@@ -2146,16 +1976,6 @@ Tenderers must comply with the following selection criteria in order to prove th
> Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice ",0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",0.0,"Après l'évacuation, le travail ne peut être repris qu'après que le bâtiment ait été déclaré sûr et que l'accès à celui-ci ait été officiellement autorisé par le service de sécurité. Chaque entreprise veille à ce que tout membre du personnel présent sur le chantier reçoive une copie de la procédure d'évacuation décrite à l'appendice 2.",59,govt tenders
60,0,"Payments must be made to the contractor’s (or leader’s in the case of a joint tender) bank account denominated in euro, identified as follows:",False,0.0,"Payments must be made to the contractor’s (or leader’s in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",0.0,"Payments must be made to the contractor’s (or leader’s in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",0.014084507042253521,"Payments must be made to the contractor's (or leader's in the case of a joint tender) bank account denominated in euro, identified as follows:",60,govt tenders
61,0,"Le contractant doit satisfaire aux exigences minimales prévues dans le cahier des charges. Cela comprend le respect des obligations applicables en vertu de la législation environnementale et sociale et de la législation du travail établies par le droit de l'Union, le droit national et les conventions collectives ou par les dispositions législatives internationales dans le domaine environnemental et social et dans le domaine du travail énumérées à l'annexe X de la directive 2014/24/UE4, ainsi que le respect des obligations en matière de protection des données découlant des règlements (UE) 2016/6795 et (UE) 2018/17256.",False,0.0,"Le contractant doit satisfaire aux exigences minimales prévues dans le cahier des charges. Cela comprend le respect des obligations applicables en vertu de la législation environnementale et sociale et de la législation du travail établies par le droit de l'Union, le droit national et les conventions collectives ou par les dispositions législatives internationales dans le domaine environnemental et social et dans le domaine du travail énumérées à l'annexe X de la directive 2014/24/UE4, ainsi que le respect des obligations en matière de protection des données découlant des règlements (UE) 2016/6795 et (UE) 2018/17256.",0.05128205128205128," Le contractant doit satisfaire aux exigences minimales prévues dans le cahier des charges. Cela comprend le respect des obligations applicables en vertu de la législation environnementale et sociale et de la législation du travail établies par le droit de l'Union, le droit national et les conventions collectives ou par les dispositions législatives internationales dans le domaine environnemental et social et dans le domaine du travail énumérées à l'annexe X de la directive 2014/24/UE4, ainsi que le respect des obligations en matière de protection des données découlant des règlements (UE) 2016/67954, ainsi que le respect des obligations en matière de protection des données découlant des règlements (UE) 2016/6795reference the use of the templates provided in Annex 09 to this
document is mandatory. Only references submitted on these forms will
be considered.
Tenderers who fail to provide a description, or who only provide generic
content, which does not specifically describe the relevance of the
contract reference with regard to the minimum level of capacity
detailed above, will be considered as not having the technical and
professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments,
divisions, directorates, and other entities of a same body (including the
same EU Institution) will be regarded as the same client. Each EU
Institution (including an EU agency) is considered a different client.
Under a framework contract (or framework contracts) with different
specific contracts, a specific contract (alone or in combination with
other specific contracts) can be used only once (i.e. it will be considered
as a single reference). In case of a joint tender, the same reference
contract cannot be submitted as a separate contract reference by
different economic operators for the same tender.
The Contracting Authority may request statements issued by the
clients, public or private, as supporting documents for each contract
reference. These documents should be ready to be provided within five
working days of the Contracting Authority’s request. The contact
persons for the customers indicated in the contract reference form may
be contacted in the context of this call for tenders to crosscheck the
validity of the information pro",0.0439621591541458,"(and in any case no more than 20) contract references. Evidence must be provided in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in Annex 09 to this document is mandatory. Only references submitted on these forms will be considered. Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client. Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender.
The Contracting Authority may request statements issued by the clients, public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority's request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as evid",0.04006677796327212,"imum 10 (and in any case no more than 20) contract references**. Evidence must be provided in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in **Annex 09** to this document is mandatory. Only references submitted on these forms will be considered.
Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client.
Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender.
The Contracting Authority may request **statements issued by the clients**, public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority’s request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as e",0.03672787979966611,"minimum 10 (and in any case no more than 20) contract references**. Evidence must be provided in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in **Annex 09** to this document is mandatory. Only references submitted on these forms will be considered.
Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client. Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender.
The Contracting Authority may request **statements issued by the clients**, public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority's request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as e",0.11352253756260434,". Evidence must be provided in the
form of a filled-in contract reference per project. For each contract
reference the use of the templates provided in**Annex 09** to this
document is mandatory. Only references submitted on these forms will
be considered.
Tenderers who fail to provide a description, or who only provide generic
content, which does not specifically describe the relevance of the
contract reference with regard to the minimum level of capacity
detailed above, will be considered as not having the technical and
professional capacity to perform the contract.
The references must concern at least 3 different clients. Departments,
divisions, directorates, and other entities of a same body (including the
same EU Institution) will be regarded as the same client. Each EU
Institution (including an EU agency) is considered a different client.
Under a framework contract (or framework contracts) with different
specific contracts, a specific contract (alone or in combination with
other specific contracts) can be used only once (i.e. it will be considered
as a single reference). In case of a joint tender, the same reference
contract cannot be submitted as a separate contract reference by
different economic operators for the same tender.
The Contracting Authority may request**statements issued by the**
**clients**, public or private, as supporting documents for each contract
reference. These documents should be ready to be provided within five
working days of the Contracting Authority’s request. The contact
persons for the customers indicated in the contract reference form may
be contacted in the context of this call for tenders to crosscheck the
validity of the information provided as evidence",0.0038953811908736783,"nderers must provide minimum 10 (and in any case no more than 20) contract references . Evidence must be provided in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in Annex 09 to this document is mandatory. Only references submitted on these forms will be considered. Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract. The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client. Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender. The Contracting Authority may request statements issued by the clients , public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority 's request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as evidence",0.0038953811908736783,"nderers must provide minimum 10 (and in any case no more than 20) contract references . Evidence must be provided in the form of a filled-in contract reference per project. For each contract reference the use of the templates provided in Annex 09 to this document is mandatory. Only references submitted on these forms will be considered. Tenderers who fail to provide a description, or who only provide generic content, which does not specifically describe the relevance of the contract reference with regard to the minimum level of capacity detailed above, will be considered as not having the technical and professional capacity to perform the contract. The references must concern at least 3 different clients. Departments, divisions, directorates, and other entities of a same body (including the same EU Institution) will be regarded as the same client. Each EU Institution (including an EU agency) is considered a different client. Under a framework contract (or framework contracts) with different specific contracts, a specific contract (alone or in combination with other specific contracts) can be used only once (i.e. it will be considered as a single reference). In case of a joint tender, the same reference contract cannot be submitted as a separate contract reference by different economic operators for the same tender. The Contracting Authority may request statements issued by the clients , public or private, as supporting documents for each contract reference. These documents should be ready to be provided within five working days of the Contracting Authority 's request. The contact persons for the customers indicated in the contract reference form may be contacted in the context of this call for tenders to crosscheck the validity of the information provided as evidence",64,govt tenders
64,1,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",False,0.09216589861751152," consolidated assessment of the tenderer as a whole (including, if
applicable, all members of a joint tender and/or other entities on which
the tenderer relies to fulfil this selection criterion) will be car",0.0,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",0.0,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",0.0,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",0.06451612903225806,"nsolidated assessment of the tenderer as a whole (including, if
applicable, all members of a joint tender and/or other entities on which
the tenderer relies to fulfilthis selection criterion) willbe carried out.",0.0,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",0.0,"A consolidated assessment of the tenderer as a whole (including, if applicable, all members of a joint tender and/or other entities on which the tenderer relies to fulfil this selection criterion) will be carried out.",64,govt tenders
@@ -2165,66 +1985,6 @@ Tenderers must comply with the following selection criteria in order to prove th
**capacity**
• **T 2.1** : ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that ",0.008403361344537815,The tenderer must be certified in the following ISO standards in the areas covered by this call for tenders: • T 2.1 : ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that will be used b,0.008403361344537815,The tenderer must be certified in the following ISO standards in the areas covered by this call for tenders: • T 2.1 : ISO 9001:2015 or equivalent (specify): for all the parts of the organisation(s) and all location(s) that will be used b,64,govt tenders
-65,0,"It is the responsibility of each tenderer to ensure that the total amount of the tender inserted in the relevant field of the e-Submission application corresponds to the amount indicated in the uploaded financial offer. In case of discrepancies, only the amount indicated in the financial offer will be taken into account. The financial offer shall be: expressed in euro.cents. Tenderers from countries outside the euro zone have to quote their prices in euro as well. The price quoted may not be revised in line with exchange rate movements. It is for the tenderer to bear the risks or the benefits deriving from any variation. quoted free of all duties, taxes and other charges, i.e. also free of VAT. The tenderer may indicate the amount of VAT but it must be shown separately. Inclusive of all costs and expenses directly and indirectly connected with the services to be delivered under the FWC. No further costs will be paid by the contracting authority for travel expenses, missions, trainings, financial costs, or any other costs which the contractor may incur in the process of implementation of any specific contract at the normal places of delivery listed in Section 1.5 above, except if the specific service requirements indicate that any such costs may be invoiced separately, in accordance with Article I.5.3 of the draft FWC. The price structure document as referred to in Section 3.5 may be required by the Contracting Authority. Such price structure document shall explain in detail how tenderers have established their prices for the service. The price structure document should cover at least the following elements:",False,0.37270501835985315,"t be shown separately.
-
-The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.
-
-• Inclusive of all costs and expenses directly and indirectly connected with the services to be delivered under the FWC. No further costs will be paid by the contracting authority for travel expenses, missions, trainings, financial costs, or any other costs which the contractor may incur in the process of implementation of any specific contract at the normal places of delivery listed in Section 1.5 above, except if the specific service requirements indicate that any such costs may be invoiced separately, in accordance with Article I.5.3 of the draft FWC.
-
-The price structure document as referred to in Section 3.5 may be required by the Contracting Authority. Such price structure document shall explain in detail how tenderers have established their prices for the service. The price structure document should cover at least the following elements:",0.37454100367197063,"n separately.
-
-¶ The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.
-
-- Inclusive of all costs and expenses directly and indirectly connected with the services to be delivered under the FWC. No further costs will be paid by the contracting authority for travel expenses, missions, trainings, financial costs, or any other costs which the contractor may incur in the process of implementation of any specific contract at the normal places of delivery listed in Section 1.5 above, except if the specific service requirements indicate that any such costs may be invoiced separately, in accordance with Article I.5.3 of the draft FWC.
-
-The **price structure** document as referred to in Section 3.5 may be required by the Contracting Authority. Such price structure document shall explain in detail how tenderers have established their prices for the service. The price structure document should cover at least the following elements:
-
-1",0.37392900856793143," separately.
-
-> The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
->
-> For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.
-
-- Inclusive of all costs and expenses directly and indirectly connected with the services to be delivered under the FWC. No further costs will be paid by the contracting authority for travel expenses, missions, trainings, financial costs, or any other costs which the contractor may incur in the process of implementation of any specific contract at the normal places of delivery listed in Section 1.5 above, except if the specific service requirements indicate that any such costs may be invoiced separately, in accordance with Article I.5.3 of the draft FWC.
-
-The **price structure** document as referred to in Section 3.5 may be required by the Contracting Authority. Such price structure document shall explain in detail how tenderers have established their prices for the service. The price structure document should cover at least the following elements:
-",0.37392900856793143,"separately.
-
-> ☝ The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
->
-> For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.
-
-* Inclusive of all costs and expenses directly and indirectly connected with the services to be delivered under the FWC. No further costs will be paid by the contracting authority for travel expenses, missions, trainings, financial costs, or any other costs which the contractor may incur in the process of implementation of any specific contract at the normal places of delivery listed in Section 1.5 above, except if the specific service requirements indicate that any such costs may be invoiced separately, in accordance with Article I.5.3 of the draft FWC.
-
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-
- The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.
-
-- • Inclusive of all costs and expenses directly and indirectly connected with the services to be delivered under the FWC. No further costs will be paid by the contracting authority for travel expenses, missions, trainings, financial costs, or any other costs which the contractor may incur in the process of implementation of any specific contract at the normal places of delivery listed in Section 1.5 above, except if the specific service requirements indicate that any such costs may be invoiced separately, in accordance with Article I.5.3 of the draft FWC.
-
-The **price structure** document as referred to in Section 3.5 may be required by the Contracting Authority. Such price structure document shall explain in detail how tenderers have established their prices for the service. The price structure document should cover at least the following elements:
-
--",0.38372093023255816," charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.
-
-- Inclusive of all costs and expenses directly and indirectly connected with the services to be delivered under the FWC. No further costs will be paid by the contracting authority for travel expenses, missions, trainings, financial costs, or any other costs which the contractor may incur in the process of implementation of any specific contract at the normal places of delivery listed in Section 1.5 above, except if the specific service requirements indicate that any such costs may be invoiced separately, in accordance with Article I.5.3 of the draft FWC.
-
-The price structure document as referred to in Section 3.5 may be required by the Contracting Authority. Such price structure document shall explain in detail how tenderers have established their prices for the service. The price structure document should cover at least the following elements:
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-
-For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.
-
-- Inclusive of all costs and expenses directly and indirectly connected with the services to be delivered under the FWC. No further costs will be paid by the contracting authority for travel expenses, missions, trainings, financial costs, or any other costs which the contractor may incur in the process of implementation of any specific contract at the normal places of delivery listed in Section 1.5 above, except if the specific service requirements indicate that any such costs may be invoiced separately, in accordance with Article I.5.3 of the draft FWC.
-
-The price structure document as referred to in Section 3.5 may be required by the Contracting Authority. Such price structure document shall explain in detail how tenderers have established their prices for the service. The price structure document should cover at least the following elements:
-",65,govt tenders
65,1," The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption. For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.",False,0.006640106241699867,"The European Union Institutions are exempt from such charges in the EU under Articles 3 and 4 of the Protocol on the Privileges and Immunities of the European Union of 8 April 1965 annexed to the Treaty on the Functioning of the European Union. Exemption is granted to the Commission by the governments of the Member States, either through refunds upon presentation of documentary evidence or by direct exemption.
For those countries where national legislation provides an exemption by means of a reimbursement, the amount of VAT must be shown separately. In case of doubt about the applicable VAT system, it is the tenderer's responsibility to contact his or her national authorities to clarify the way in which the European Union is exempt from VAT.
@@ -2689,27 +2449,6 @@ BARSKA Model AY11236 is a fixed power compound microscope. It is constructed wit
- • Make sure that you focus on answering the question – only include relevant information, and remember to present logical arguments in support of your answ",0.017605633802816902,"ach paragraph should contain one main thought or idea, and there should be a logical link between each paragraph and the next.
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- Make sure that you focus on answering the question - only include relevant information, and remember to present logical arguments in support of your answer.",67,manuals_sample
-67,1,8. Proofread your assignment before handing it in. 8. Proofread your assignment before handing it in. Tip: read your answers out loud to make sure that they sound logical.,False,0.26900584795321636," logical arguments in support of your answer.
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-9.",0.26900584795321636," logical arguments in support of your answer.
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-**8. Proofread your assignment before handing it in.** Tip: read your answers out loud to make sure that they sound logical.",0.2807017543859649," logical arguments in support of your answer.
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-**8. Proofread your assignment before handing it in.** Tip: read your answers out loud to make sure that they sound logical.",0.25146198830409355,"ent logical arguments in support of your answer.
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-8. Proofread your assignment before handing it in. Tip: read your answers out loud to make sure that they sound logical.",0.2631578947368421,"t logical arguments in support of your answer.
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-8. Proofread your assignment before handing it in. Tip: read your answers out loud to make sure that they sound logical.
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-9",0.2573099415204678,"nt logical arguments in support of your answer.
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-8. Proofread your assignment before handing it in. Tip: read your answers out loud to make sure that they sound logical.
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-",67,manuals_sample
67,2,"9. Always keep a copy or electronic backup of your assignment. This way, you won’t have to start over if your computer crashes, or redo the whole assignment if the original goes missing.",False,0.0,"9. Always keep a copy or electronic backup of your assignment. This way, you won’t have to start over if your computer crashes, or redo the whole assignment if the original goes missing.",0.026881720430107527,"9. Always keep a copy or electronic backup of your assignment.** This way, you won't have to start over if your computer crashes, or redo the whole assignment if the original goes missin",0.06451612903225806,"ways keep a copy or electronic backup of your assignment.**
This way, you won’t have to start over if your computer crashes, or redo the whole assignment if the original goes missing",0.026881720430107527," Always keep a copy or electronic backup of your assignment.** This way, you won't have to start over if your computer crashes, or redo the whole assignment if the original goes missing.",0.010752688172043012,"9. Always keep a copy or electronic backup of your assignment. This way, you won’t have to start over if your computer crashes, or redo the whole assignment if the original goes missing",0.016129032258064516,". Always keep a copy or electronic backup of your assignment. This way, you won't have to start over if your computer crashes, or redo the whole assignment if the original goes missing.",0.016129032258064516,". Always keep a copy or electronic backup of your assignment. This way, you won't have to start over if your computer crashes, or redo the whole assignment if the original goes missing.",67,manuals_sample
67,3,"10. When you get your assignment back from your tutor: Read through the feedback, and learn from your mistakes. This will help you to prepare for your exams (if you have to write them), as well as to help you achieve better marks in future assignments.",False,0.0,"10. When you get your assignment back from your tutor: Read through the feedback, and learn from your mistakes. This will help you to prepare for your exams (if you have to write them), as well as to help you achieve better marks in future assignments.",0.06349206349206349,"0. When you get your assignment back from your tutor:**
@@ -2879,13 +2618,13 @@ To “approve” something is to give consent.
E.g. The director approved the budget.
To “approve of” something is to express a favourable opinion about it.
-E.g. The mother did not approve of the way her daughter was dressed for the school d",0.04597701149425287,"Approve/Approve of
+E.g. The mother did not approve of the way her daughter was dressed for the school d",0.04597701149425287,"pprove/Approve of
To ""approve"" something is to give consent.
E.g. The director approved the budget.
To ""approve of"" something is to express a favourable opinion about it.
-E.g. The mother did not approve of the way her daughter was dressed for the school danc",0.04597701149425287,"e/Approve of**
+E.g. The mother did not approve of the way her daughter was dressed for the school dance",0.04597701149425287,"e/Approve of**
To “approve” something is to give consent. E.g. The director approved the budget.
@@ -2918,13 +2657,13 @@ To “borrow” something is to take it with the intention of giving it back.
E.g. He borrowed the book from his colleague.
To “lend” something is to give it to someone with the expectation that they will give it back.
-E.g. She is lending the car to him so that he can drive to work today.",0.04040404040404041,"orrow/Lend
+E.g. She is lending the car to him so that he can drive to work today.",0.04040404040404041,"rrow/Lend
To ""borrow"" something is to take it with the intention of giving it back.
E.g. He borrowed the book from his colleague.
To ""lend"" something is to give it to someone with the expectation that they will give it back.
-E.g. She is lending the car to him so that he can drive to work today",0.04040404040404041,"orrow/Lend**
+E.g. She is lending the car to him so that he can drive to work today.",0.04040404040404041,"orrow/Lend**
To “borrow” something is to take it with the intention of giving it back. E.g. He borrowed the book from his colleague.
@@ -2959,13 +2698,13 @@ You “compliment” someone when you make a favourable comment about them.
E.g. He complimented her by telling her that she was a good writer.
You “complement” something (or someone) when you add something else to it that suits or fits it well.
-E.g. That scarf complements her d",0.046511627906976744,"pliment/Complement
+E.g. That scarf complements her d",0.046511627906976744,"mpliment/Complement
You ""compliment"" someone when you make a favourable comment about them.
E.g. He complimented her by telling her that she was a good writer.
You ""complement"" something (or someone) when you add something else to it that suits or fits it well.
-E.g. That scarf complements her dress.",0.059800664451827246,"ent/Complement**
+E.g. That scarf complements her dress",0.059800664451827246,"ent/Complement**
You “compliment” someone when you make a favourable comment about them.
@@ -3364,7 +3103,9 @@ If you want to specify a different extent si",76,manuals_sample
77,0,Insert PivotTable Click here to summarize data using a PivotTable or to insert a PivotChart. PivotTables make it easy to arrange and summarize complicated data and drill down on details.,True,0.10752688172043011,"erbatim):
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-- **New Works",0.08602150537634409,"text explaining ""Click here to summarize data using a PivotTable or to insert a PivotChart. PivotTables make it easy to arrange and summarize complicated data and drill down on details.""",0.8118279569892473,"se Pi **v** ot Table wi **z** ard in the **D** ata menu. **E** xcel a **s** ow choose ks for the **d** ata source **a** nd suggest **s** Click OK.
+- **New Works",0.7580645161290323,"se Pivot Table wizard in the Data menu. Excel asks for the data source and suggests this table. Click OK.
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**==> picture [60 x 580] intentionall",0.8118279569892473,"e table a o add data in as many ro Rather than A $500. understand t as shown in n the future, ows as you A1:D50, you the data ran n above Slid , set the data think you u ma",0.8118279569892473,"e table a o add data in as many ro Rather than A $500. understand t as shown in n the future, ows as you A1:D50, you the data ran n above Slid , set the data think you u ma",77,manuals_sample
77,1,"Here, we need to understand the data range. Excel suggests the table as shown in above Slide. If you expect to add data in the future, set the data range to include as many rows as you think you will ever need. Rather than A1:D50, you may want to specify $A$1:$D$500.",True,0.02247191011235955,"
@@ -3442,7 +3183,7 @@ Figure 8-40 Rename a ",78,manuals_sample
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@@ -3480,7 +3221,7 @@ Figure 3-8 IBM Cloud Pak for Automation benefits
- Drive growth with enhanced customer experiences and new business models.
-",0.2629558541266795,"op-line': New business models, Find new opportunities for revenue growth, Deliver better (more personalized, more relevant...) products and services.
+",0.2648752399232246,"op-line: New business models, Find new opportunities for revenue growth, Deliver better (more personalized, more relevant...) products and services.
Figure 3-8 IBM Cloud Pak for Automation benefits
@@ -3489,7 +3230,7 @@ Additional features of the IBM Cloud Pak for Automation are:
- Drive scale, speed, and assist with complex knowledge work.
- Automate complex and less-structured business processes and optimize lighter customer experiences for task efficiency.
- Drive growth with enhanced customer experiences and new business models.
-",0.345489443378119,"mprove top-line** (Up Arrow):
+-",0.345489443378119,"mprove top-line** (Up Arrow):
* New business models
* Find new opportunities for revenue growth
* Deliver better (more personalized, more relevant...) products and services
@@ -3542,16 +3283,16 @@ Additional features of the IBM Cloud Pak for Automation are:
- /SM590000 Drive scale, speed, and assist with complex knowledge work.
- /SM590000 Automate complex and less-structured business processes and optimize lighter customer experiences for task efficiency.
- /SM590000 Drive growth with enhanced custome",79,manuals_sample
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* Make employees more efficient
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@@ -3573,11 +3314,11 @@ Create, filter, format and expand multiple tables with a set of formulas since M
Use Microsoft Excel to share multiple spreadsheets with co-workers. Other parties may also access the data online as it renders the spreadsheets as HTML. Additionally, you can navigate, filter, sort and input parameters, all within the Web browser.
-Besides its numerous benefits, Microsoft Excel also has its share of shortcoming as well. Many users claim that Office Excel is not easily shared compared to other office applications.",0.013100436681222707,"3.5 SHARE SPREADSHEETS
+Besides its numerous benefits, Microsoft Excel also has its share of shortcoming as well. Many users claim that Office Excel is not easily shared compared to other office applications.",0.013100436681222707,".3.5 SHARE SPREADSHEETS
Use Microsoft Excel to share multiple spreadsheets with co-workers. Other parties may also access the data online as it renders the spreadsheets as HTML. Additionally, you can navigate, filter, sort and input parameters, all within the Web browser.
-Besides its numerous benefits, Microsoft Excel also has its share of shortcoming as well. Many users claim that Office Excel is not easily shared compared to other office applications.",0.008733624454148471,".3.5 SHARE SPREADSHEETS
+Besides its numerous benefits, Microsoft Excel also has its share of shortcoming as well. Many users claim that Office Excel is not easily shared compared to other office applications",0.008733624454148471,".3.5 SHARE SPREADSHEETS
Use Microsoft Excel to share multiple spreadsheets with co-workers. Other parties may also access the data online as it renders the spreadsheets as HTML. Additionally, you can navigate, filter, sort and input parameters, all within the Web browser.
Besides its numerous benefits, Microsoft Excel also has its share of shortcoming as well. Many users claim that Office Excel is not easily shared compared to other office applications.",0.013100436681222707,".3.5 SHARE SPREADSHEETS
@@ -3692,29 +3433,30 @@ Congratulations on your purchase of this high quality BARSKA microscope. With pr
3. Do not use this instrument in an environment with a lot of dust. Cover the instrument when not in use.
-4. Do not subject the instrument to shoc",0.029185867895545316,"ANT NOTES
+4. Do not subject the instrument to shoc",0.029185867895545316,"PORTANT NOTES
Congratulations on your purchase of this high quality BARSKA microscope. With proper care, this microscope will provide many years of use. Please read the following instructions before operating this instrument.
1. Do not attempt to disassemble the instrument. This product has been carefully assembled at the factory and should only be examined by a factory-trained technician.
2. This instrument should only be used in an environment with an indoor temperature range of 32°F to 104°F.
3. Do not use this instrument in an environment with a lot of dust. **Cover the instrument when not in use.**
-4. Do not subject the instrument to shock.",0.029185867895545316,"RTANT NOTES
+4. Do not subject the instrument to sh",0.029185867895545316,"RTANT NOTES
Congratulations on your purchase of this high quality BARSKA microscope. With proper care, this microscope will provide many years of use. Please read the following instructions before operating this instrument.
1. Do not attempt to disassemble the instrument. This product has been carefully assembled at the factory and should only be examined by a factory-trained technician.
2. This instrument should only be used in an environment with an indoor temperature range of 32°F to 104°F.
3. Do not use this instrument in an environment with a lot of dust. **Cover the instrument when not in use.**
-4. Do not subject the instrument to shoc",0.11981566820276497,"ngratulations on your purchase of this high quality BARSKA microscope. With proper care, this microscope will provide many years of use. Please read the following instructions before operating this instrument.
+4. Do not subject the instrument to shoc",0.05683563748079877,"
+Congratulations on your purchase of this high quality BARSKA microscope. With proper care, this microscope will provide many years of use. Please read the following instructions before operating this instrument.
1. Do not attempt to disassemble the instrument. This product has been carefully assembled at the factory and should only be examined by a factory-trained technician.
-2. This instrument should only be used in an environment with an indoor temperature range of 32oF to 104oF.
+2. This instrument should only be used in an environment with an indoor temperature range of 32ºF to 104ºF.
3. Do not use this instrument in an environment with a lot of dust. Cover the instrument when not in use.
-4. Do not subject the i",0.09831029185867896,"ratulations on your purchase of this high quality BARSKA microscope. With proper care, this microscope will provide many years of use. Please read the following instructions before operating this instrument.
+4. Do not subject the instrument to shock.",0.09831029185867896,"ratulations on your purchase of this high quality BARSKA microscope. With proper care, this microscope will provide many years of use. Please read the following instructions before operating this instrument.
- 1. Do not attempt to disassemble the instrument. This product has
@@ -3770,7 +3512,7 @@ Dry Weather: 1:1
* Wet weather: 1:2
* Dry Weather: 1:1
4. After use, cover the instrument with the plastic dust cover.
-5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof containe",0.04505813953488372,"Proper care and storage of this instrument is essential. Please read the following guidelines:
+5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof containe",0.04505813953488372,"roper care and storage of this instrument is essential. Please read the following guidelines:
1. Keep the instrument in a dry and moisture-free location.
@@ -3784,7 +3526,7 @@ Dry Weather: 1:1
4. After use, cover the instrument with the plastic dust cover.
-5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof container",0.10465116279069768,"and storage of this instrument is essential. Please read the following guidelines:
+5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof container.",0.10465116279069768,"and storage of this instrument is essential. Please read the following guidelines:
- 1. Keep the instrument in a dry and moisture-free location.
@@ -3849,11 +3591,13 @@ BARSKA Model AY11240 and Model AY11238 are designed for biological studies such
BARSKA Model AY11240 and Model AY11238 are designed for biological studies such as specimen examination. They can also be used for examining bacteria and for general clinical and medical studies. Simple design and use is especially useful for school classroom instruction.",81,manuals_sample
81,5,"CONSTRUCTION BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90o vertical to 45o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45o angle. The head rotates 360o. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.",False,0.006060606060606061,"ONSTRUCTION
-BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90o vertical to 45o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45o angle. The head rotates 360o. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.",0.014141414141414142,"CONSTRUCTION
+BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90o vertical to 45o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45o angle. The head rotates 360o. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.",0.014141414141414142,"ONSTRUCTION
+
+BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90° vertical to 45° level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45° angle. The head rotates 360°. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.",0.12727272727272726,"11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from $90^\circ$ vertical to $45^\circ$ level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen.
-BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90° vertical to 45° level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45° angle. The head rotates 360°. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube",0.12727272727272726,"11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from $90^\circ$ vertical to $45^\circ$ level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen.
+BARSKA Model AY11238 features a monocular tube that is slanted at a $45^\circ$ angle. The head rotates $360^\circ$. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube",0.014141414141414142,"CONSTRUCTION
-BARSKA Model AY11238 features a monocular tube that is slanted at a $45^\circ$ angle. The head rotates $360^\circ$. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube",0.17777777777777778," fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90o vertical to 45o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45o angle. The head rotates 360o. The Eyepiece Set Screw prevents the eyepiece from falling out of the",0.044444444444444446,"*
+BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90º vertical to 45º level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45º angle. The head rotates 360º. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube",0.044444444444444446,"*
BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90[o] vertical to 45[o] level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45[o] angle. The head rotates 360[o] . The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.",0.030303030303030304,"TRUCTION
@@ -3868,7 +3612,7 @@ BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm
82,5,Figure 9-16 Checking migration progress by using CLI,False,0.0,Figure 9-16 Checking migration progress by using CLI,0.0,Figure 9-16 Checking migration progress by using CLI,0.038461538461538464,Figure 9-16: Checking migration progress by using CL,0.11538461538461539,gure 9-16 Checking migration progress by using CL,0.07692307692307693,igure 9-16 Checking migration progress by using CL,0.07692307692307693,igure 9-16 Checking migration progress by using CL,0.07692307692307693,igure 9-16 Checking migration progress by using CL,82,manuals_sample
82,6,"17.When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click Finalize, as shown in Figure 9-17 on page 400.",False,0.0,"17.When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click Finalize, as shown in Figure 9-17 on page 400.",0.046511627906976744,"When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click **Finalize**, as shown in Figure 9-17 on page 400",0.046511627906976744,"When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click **Finalize**, as shown in Figure 9-17 on page 400",0.046511627906976744,"When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click **Finalize**, as shown in Figure 9-17 on page 400",0.05813953488372093,".When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click **Finalize** , as shown in Figure 9-17 on page 4",0.011627906976744186,"17.When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click Finalize , as shown in Figure 9-17 on page 400",0.011627906976744186,"17.When the migration completes, select all of the migrations that you want to finalize, right-click the selection, and click Finalize , as shown in Figure 9-17 on page 400",82,manuals_sample
82,7,The data migration has begun. After it is completed use the finalize action in the Migration panel of the management GUI to remove the image-mode volume copies. Then unzone and remove the original storage system.,True,0.3867924528301887,"age Migration Wizard"" interface. The migration has begun; after completion, use the ""finalize"" action in the Migration panel to remove image-mode volume copies, unzone, and remove the original storage system. The",0.7075471698113207,"he migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displaye",0.0,The data migration has begun. After it is completed use the finalize action in the Migration panel of the management GUI to remove the image-mode volume copies. Then unzone and remove the original storage system.,0.0,The data migration has begun. After it is completed use the finalize action in the Migration panel of the management GUI to remove the image-mode volume copies. Then unzone and remove the original storage system.,0.7075471698113207,"he migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displaye",0.7075471698113207,"he migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displaye",0.7075471698113207,"he migration task. You can find the progress of the migration in the Storage Migration window, as shown in Figure 9-15. The target storage pool and the progress of the volume copy synchronization is also displaye",82,manuals_sample
-83,0,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save (see Figure 5-80).",False,0.0031645569620253164,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save(see Figure 5-80).",0.02531645569620253,"e content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-80",0.02531645569620253,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-",0.02531645569620253,"content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-80).",0.02531645569620253,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-",0.0,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save (see Figure 5-80).",0.0,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save (see Figure 5-80).",83,manuals_sample
+83,0,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save (see Figure 5-80).",False,0.0031645569620253164,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save(see Figure 5-80).",0.02531645569620253," content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-80)",0.02531645569620253,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-",0.02531645569620253,"content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-80).",0.02531645569620253,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-",0.0,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save (see Figure 5-80).",0.0,"The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click Save (see Figure 5-80).",83,manuals_sample
83,1,Figure 5-80 Enabling login message,False,0.0,Figure 5-80 Enabling login message,0.0,Figure 5-80 Enabling login message,0.058823529411764705,Figure 5-80: Enabling login messag,0.11764705882352941,igure 5-80 Enabling login messag,0.11764705882352941,Figure 5-80 Enabling login messa,0.11764705882352941,gure 5-80 Enabling login message,0.11764705882352941,gure 5-80 Enabling login message,83,manuals_sample
83,2,The resulting log-in screen is shown in Figure 5-81.,False,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,0.0,The resulting log-in screen is shown in Figure 5-81.,83,manuals_sample
83,3,Figure 5-81 Welcome message in GUI,False,0.0,Figure 5-81 Welcome message in GUI,0.0,Figure 5-81 Welcome message in GUI,0.058823529411764705,Figure 5-81: Welcome message in GU,0.11764705882352941,igure 5-81 Welcome message in GU,0.11764705882352941,gure 5-81 Welcome message in GUI,0.11764705882352941,Figure 5-81 Welcome message in G,0.11764705882352941,Figure 5-81 Welcome message in G,83,manuals_sample
@@ -3904,7 +3648,7 @@ BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm
1. Click Settings → System → Licensed Functions .
2. Click Encryption Licenses , as shown in Figure 12-",84,manuals_sample
84,2,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window,False,0.0,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window,0.0,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window,0.024390243902439025,Figure 12-9: Expanding Encryption Licenses section on the Licensed Functions windo,0.0,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window,0.04878048780487805,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions wind,0.04878048780487805,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions wind,0.04878048780487805,Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions wind,84,manuals_sample
-84,3,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (Activate License Automatically and Activate License Manually), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on page 617.",False,0.0032102728731942215,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options ( Activate License Automaticallyand Activate License Manually), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on page 617.",0.025682182985553772,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate License Manually**), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on p",0.025682182985553772,". The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate License Manually**), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on pa",0.03210272873194221,"The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate License Manually**), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, ""Activate the license automatically"" on page 614. For more information about how to complete a manual activation process, see 12.3.5, ""Activate the license manually"" on page",0.7367576243980738,"## **12.3.3 Start activation process on a running system**
+84,3,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (Activate License Automatically and Activate License Manually), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on page 617.",False,0.0032102728731942215,"3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options ( Activate License Automaticallyand Activate License Manually), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on page 617.",0.025682182985553772,"e Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate License Manually**), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on page 6",0.025682182985553772,". The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate License Manually**), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on pa",0.03210272873194221,"The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate License Manually**), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, ""Activate the license automatically"" on page 614. For more information about how to complete a manual activation process, see 12.3.5, ""Activate the license manually"" on page",0.7367576243980738,"## **12.3.3 Start activation process on a running system**
To activate encryption on a running system, complete the following steps:
@@ -3925,35 +3669,6 @@ _Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions w
3. The Encryption ",0.5769230769230769," There is an ""Encryption L",0.15384615384615385,hapter 12. Encryption **61,0.6153846153846154,"e 12-9.
3. The Encryption ",0.6153846153846154,"e 12-9.
3. The Encryption ",84,manuals_sample
-84,6,"Licensed Functions Additional licenses are required to use certain system functions. For auditing purposes, retain the license agreement for proof of compliance. Additional licenses are required to use certain system functions. For auditing purposes, retain the license agreement for proof of compliance.",True,0.7236842105263158,"on the Licensed Functions window
-
-3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options ( Activate License Automaticallyand Activate ",0.7203947368421053,"Licensed Functions' and 'Encryption Licenses' highlighted.
-
-Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window
-
-3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption licen",0.7467105263157895,"""Licensed Functions"". In the main pane, under ""Licensed Functions"", a button labeled ""Encryption Licenses"" is highlighted with a red outline.
-
-3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption licens",0.7105263157894737," Licensed Functions window*
-
-3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate",0.7730263157894737,"→ **Licensed Functions** .
-
-- 2. Click **Encryption Licenses** , as shown in Figure 12-9.
-
-**==> picture [397 x 226] intentionally omitted <==**
-
-_Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window_
-
-**==> picture [412 x 96] intentionally omitted <==**
-
-**==> picture",0.7302631578947368,"Licensed Functions .
-2. Click Encryption Licenses , as shown in Figure 12-9.
-3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options ( ",0.7302631578947368,"Licensed Functions .
-2. Click Encryption Licenses , as shown in Figure 12-9.
-3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options ( ",84,manuals_sample
-84,7,Encryption Licenses Add the license keys for the following enclosures,True,0.6521739130434783,yption Licenses window displays information about your control enclos,0.6086956521739131, Encryption Licenses window showing a Control Enclosure entry. A cont,0.6521739130434783," of the ""Encryption Licenses"" table listing control enclosures. A con",0.2898550724637681,"r>
-
Add the license keys for the following enclosures<",0.6376811594202898,"te encryption on a running system, complete the following steps:
-
-- ",0.6521739130434783,yption Licenses window displays information about your control enclos,0.6521739130434783,yption Licenses window displays information about your control enclos,84,manuals_sample
85,0,SPECIFICATIONS 1. Length of mechanical tube: 160mm 2. Conjugate distance between object and image: 195mm 3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion) 4. Illumination: Input 110V or 200V; Output: 20W 5. Fine adjustment range: .002mm 6. Coarse Adjustment Range: 20mm 7. Shift or Mechanical Stage: Longitude - 40mm; Transversal - 70mm 8. Condenser Elevation Range: 15mm 9. Iris diaphragm aperture: 2mm-30mm,False,0.5510688836104513,"e: 195mm |
| 3. Condenser: Abbe; numerical aperture: NA1.25 (oil immersion) |
| 4. Illumination: Input 110V or 200V; Output: 20W |
@@ -4160,7 +3875,7 @@ Compare the following examples:
## Example B
",86,manuals_sample
-87,0,"Direct operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hardware. Direct operating costs also include a $657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were:",False,0.0282574568288854,"erating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1",0.01020408163265306,"t operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to \$24.4 million for the year ended December 31, 2000 from \$21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled \$3.5 million and \$2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of \$1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hardware. Direct operating costs also include a \$657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were",0.0,"Direct operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hardware. Direct operating costs also include a $657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were:",0.0007849293563579278,"Direct operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hardware. Direct operating costs also include a $657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were:",0.0282574568288854,"ating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 199",0.06828885400313972,"e Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000",0.06828885400313972,"e Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000",87,finance_samples
+87,0,"Direct operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hardware. Direct operating costs also include a $657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were:",False,0.0282574568288854,"erating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1",0.01020408163265306,"ect operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to \$24.4 million for the year ended December 31, 2000 from \$21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled \$3.5 million and \$2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of \$1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hardware. Direct operating costs also include a \$657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 we",0.0,"Direct operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hardware. Direct operating costs also include a $657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were:",0.0007849293563579278,"Direct operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hardware. Direct operating costs also include a $657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were:",0.0282574568288854,"ating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company’s liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 199",0.06828885400313972,"e Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000",0.06828885400313972,"e Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to $24.4 million for the year ended December 31, 2000 from $21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, i n t e rcompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled $3.5 million and $2.9 million for the years ended December 31, 2000 and 1999, re s p e c t i v e l y. Direct operating costs for 2000 include a one-time gain of $1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hard w a re. Direct operating costs also include a $657,000 gain realized in 1999 f rom the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000",87,finance_samples
87,1,Transaction processing and ATM monitoring,False,0.0,Transaction processing and ATM monitoring,0.0,Transaction processing and ATM monitoring,0.0,Transaction processing and ATM monitoring,0.0,Transaction processing and ATM monitoring,0.0,Transaction processing and ATM monitoring,0.0,Transaction processing and ATM monitoring,0.0,Transaction processing and ATM monitoring,87,finance_samples
87,2,"5,242",False,0.0,"5,242",0.0,"5,242",0.0,"5,242",0.0,"5,242",0.6,", 4 2",0.0,"5,242",0.0,"5,242",87,finance_samples
87,3,"4,205",False,0.0,"4,205",0.0,"4,205",0.0,"4,205",0.0,"4,205",0.8,", 2 0",0.0,"4,205",0.0,"4,205",87,finance_samples
@@ -4173,7 +3888,7 @@ The project consists of three well-defined mineralised deposits and a number of
The project consists of three well-defined mineralised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimberos and Teterita. Arqueros was previously mined on a limited scale by underground methods and Chimberos was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60) 1 .",0.015655577299412915,"
The project consists of three well-defined mineralised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimberos and Teterita. Arqueros was previously mined on a limited scale by underground methods and Chimberos was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60) 1 .",88,finance_samples
-88,1,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",False,0.0,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.004901960784313725," Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.004901960784313725," Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0196078431372549,"Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content *divided* by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0196078431372549,"Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content _divided_ by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",88,finance_samples
+88,1,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",False,0.0,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.004901960784313725," Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.004901960784313725," Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0196078431372549," Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content *divided* by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60)",0.0196078431372549,"Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content _divided_ by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",0.0,"1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content divided by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).",88,finance_samples
89,0,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone’s directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",False,0.0,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone’s directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.0015873015873015873,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone's directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.0,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone’s directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.0015873015873015873,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone's directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.012698412698412698,"goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone’s directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone customers.",0.014285714285714285,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone's directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone custom",0.014285714285714285,"The goal has always been to provide a useful tool for our customers. The pace of change has quickened in the last few years. In 2000, for the first time, Shenandoah Telephone's directory expanded from telephone listings for only Shenandoah County and Bergton, to include business and residential listings for Rockingham, Frederick, Clarke, and Warren counties. In 2001, Page County listings were added. The name of our directory was changed to ShentelPages in 2002 to reflect the expanded listing area. Although we included additional information in our directory, we continued to only furnish it to our local telephone custom",89,finance_samples
89,1,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",False,0.0,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",0.0,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",0.0,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",0.0,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits.",0.0038684719535783366,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits",0.0038684719535783366,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits",0.0038684719535783366,"In December 2003, Shentel mailed out 120,000 ShentelPages directories to every home and business in Shenandoah, Rockingham, Frederick, Page, Clarke and Warren counties. ShentelPages now has a potential audience that exceeds 300,000 readers. The 2004 directory continues to be an important local resource. In addition to telephone listings, it contains both general and county-specific information - from ZIP codes to area codes, and from international dialing instructions to the listing of regional interstate exits",89,finance_samples
89,2,"Through ShentelPages, businesses have a new way of reaching thousands more potential customers within the six- county area to sell their products and services. ShentelPages is bundled with our electronic version, ShentelPages.com. This service allows area residents to use their computer and the Internet to let their fingers do the walking.",False,0.008797653958944282,"
@@ -4188,13 +3903,6 @@ Through ShentelPages, businesses have a new way of reaching thousands more poten
90,3,"20,879",False,0.0,"20,879",0.0,"20,879",0.0,"20,879",0.0,"20,879",0.6666666666666666,"2012, ",0.0,"20,879",0.0,"20,879",90,finance_samples
90,4,"75,006",False,0.0,"75,006",0.0,"75,006",0.0,"75,006",0.0,"75,006",0.8333333333333334, [505 ,0.0,"75,006",0.0,"75,006",90,finance_samples
90,5,"(323,726)",False,0.0,"(323,726)",0.0,"(323,726)",0.0,"(323,726)",0.0,"(323,726)",1.0,"2, the Gr",0.0,"(323,726)",0.0,"(323,726)",90,finance_samples
-90,6,KMP short term employee benefits How much can the executives earn under the STI Plan?,False,0.611764705882353," |
-| How much can the
executives earn under
the STI Plan? | Target – R",0.4235294117647059,"-----------------------|
-| How much can the executives earn under the STI Plan?executives earn under
the STI Plan? | Stretch (Maximum) – Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement.
Managing Director / CEO – up to 60% of TFR, COO & CFO – up to 50% of TFR, Other Key Management Personnel – up to 40% of TFR.
(TFR - Total Fixed Remuneration) ",0.0667361835245047,"resents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure.
Managing Director / CEO – up to 15% of TFR, COO & CFO – up to 12.5% of TFR, Other Key Management Personnel – up to 10% of TFR.
Target – Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives.
Managing Director / CEO – up to 30% of TFR, COO & CFO – up to 25% of TFR, Other Key Management Personnel – up to 20% of TFR.
Stretch (Maximum) – Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement.
Managing Director / CEO – up to 60% of TFR, COO & CFO – up to 50% of TFR, Other Key Management Personnel – up to 40% of TFR.
(TFR - Total Fixed Remunerati",0.08133472367049009,"epresents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure.
Managing Director / CEO – up to 15% of TFR, COO & CFO – up to 12.5% of TFR, Other Key Management Personnel – up to 10% of TFR.
**Target** – Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives.
Managing Director / CEO – up to 30% of TFR, COO & CFO – up to 25% of TFR, Other Key Management Personnel – up to 20% of TFR.
**Stretch (Maximum)** – Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement.
Managing Director / CEO – up to 60% of TFR, COO & CFO – up to 50% of TFR, Other Key Management Personnel – up to 40% of TFR.
*(TFR - Total Fixed R",0.047966631908237745,"old – Represents the minimum acceptable level of performance that needs to be achieved before any Individual Award would be payable in relation to that Performance Measure.
Managing Director / CEO – up to 15% of TFR, COO & CFO – up to 12.5% of TFR, Other Key Management Personnel – up to 10% of TFR.
Target – Represents a challenging but achievable level of performance relative to past and otherwise expected achievements. It will normally be the budget level for financial and other quantitative performance objectives.
Managing Director / CEO – up to 30% of TFR, COO & CFO – up to 25% of TFR, Other Key Management Personnel – up to 20% of TFR.
Stretch (Maximum) – Represents a clearly outstanding level of performance which is evident to all as a very high level of achievement.
Managing Director / CEO – up to 60% of TFR, COO & CFO – up to 50% of TFR, Other Key Management Personnel – up to 40% of TFR.
(TFR - Total Fixed Remunerat",0.7528675703858185,"**52**
@@ -4221,11 +3929,10 @@ www.kingsgate.com.au
— product demand and industry capacity,
-— competitive products and pricing",0.05555555555555555," global economic and political conditions,
+— competitive products and pricing",0.04861111111111111,"- global economic and political conditions,
- currency fluctuations,
- product demand and industry capacity,
-- competitive products and pricing,
-",0.05555555555555555," global economic and political conditions,
+- competitive products and pricing,",0.05555555555555555," global economic and political conditions,
- currency fluctuations,
- product demand and industry capacity,
- competitive products and pricing,
@@ -4369,7 +4076,7 @@ Santos discovered gas in the United States at the Torres 1A onshore well, which
Other wells in the offshore Otway Basin included the deep water Amrit 1 well, which was plugged and abandoned after failing to intersect economic hydrocarbons, and Callister 1 which was also plugged and abandoned with gas shows.
-![Jack",0.02221235006663705,"loration is a key growth driver for Santos and success with the drill bit is vital to adding value for Santos shareholders. During the past four years Santos has been working to build exploration opportunities by:
+![Jack",0.02221235006663705,"tion is a key growth driver for Santos and success with the drill bit is vital to adding value for Santos shareholders. During the past four years Santos has been working to build exploration opportunities by:
* acquiring new exploration acreage
* adding material exploration prospects
@@ -4395,7 +4102,7 @@ There was also success in the offshore Otway Basin with the Martha gas discovery
Santos discovered gas in the United States at the Torres 1A onshore well, which was brought onto production only two months after drilling was completed.
-Other wells in the offshore Otway Basin included the deep water Amrit 1 well, which was plugged and abandoned after failing to intersect economic hydrocarbons, and Callister 1 which was also plugged and abandoned wi",0.03198578409595735,"oration is a key growth driver for Santos and success with the drill bit is vital to adding value for Santos shareholders. During the past four years Santos has been working to build exploration opportunities by:
+Other wells in the offshore Otway Basin included the deep water Amrit 1 well, which was plugged and abandoned after failing to intersect economic hydrocarbons, and Callister 1 which was also plugged and abandoned with g",0.03198578409595735,"oration is a key growth driver for Santos and success with the drill bit is vital to adding value for Santos shareholders. During the past four years Santos has been working to build exploration opportunities by:
- • acquiring new exploration acreage
@@ -4482,21 +4189,21 @@ our success to date shows that
our strategy of basin excellence
is delivering.
-",0.015228426395939087,"
-'2004 was a great year for our explorers. We started drilling one of the most exciting portfolios in our industry and our success to date shows that our strategy of basin excellence is delivering.",0.0,‘2004 was a great year for our explorers. We started drilling one of the most exciting portfolios in our industry and our success to date shows that our strategy of basin excellence is delivering.’,0.015228426395939087,*'2004 was a great year for our explorers. We started drilling one of the most exciting portfolios in our industry and our success to date shows that our strategy of basin excellence is delivering.,0.0,‘2004 was a great year for our explorers. We started drilling one of the most exciting portfolios in our industry and our success to date shows that our strategy of basin excellence is delivering.’,0.015228426395939087,"
+",0.015228426395939087,"2004 was a great year for our explorers. We started drilling one of the most exciting portfolios in our industry and our success to date shows that our strategy of basin excellence is delivering.'
+",0.0,‘2004 was a great year for our explorers. We started drilling one of the most exciting portfolios in our industry and our success to date shows that our strategy of basin excellence is delivering.’,0.01015228426395939,'2004 was a great year for our explorers. We started drilling one of the most exciting portfolios in our industry and our success to date shows that our strategy of basin excellence is delivering.',0.0,‘2004 was a great year for our explorers. We started drilling one of the most exciting portfolios in our industry and our success to date shows that our strategy of basin excellence is delivering.’,0.015228426395939087,"
'2004 was a great year for our explorers. We started drilling one of the most exciting portfolios in our industry and our success to date shows that our strategy of basin excellence is delivering.",0.015228426395939087,"
'2004 was a great year for our explorers. We started drilling one of the most exciting portfolios in our industry and our success to date shows that our strategy of basin excellence is delivering.",92,finance_samples
92,4,JACQUES GOUADAIN Vice President Geoscience and New Ventures,False,0.06779661016949153,"JACQUES GOUADAIN
Vice President
-Geoscience and New Venture",0.11864406779661017,"QUES GOUADAIN
+Geoscience and New Venture",0.11864406779661017,"CQUES GOUADAIN
Vice President
-Geoscience and New Ventures",0.3389830508474576,"QUES GOUADAIN**
+Geoscience and New Venture",0.3389830508474576,"QUES GOUADAIN**
> Vice President
-> Geoscience and New V",0.1016949152542373,"JACQUES GOUADAIN**
+> Geoscience and New V",0.1016949152542373,"CQUES GOUADAIN**
Vice President
-Geoscience and New Ventur",0.06779661016949153,JACQUES GOUADAIN** Vice President Geoscience and New Ventur,0.0,JACQUES GOUADAIN Vice President Geoscience and New Ventures,0.0,JACQUES GOUADAIN Vice President Geoscience and New Ventures,92,finance_samples
+Geoscience and New Ventures",0.06779661016949153,JACQUES GOUADAIN** Vice President Geoscience and New Ventur,0.0,JACQUES GOUADAIN Vice President Geoscience and New Ventures,0.0,JACQUES GOUADAIN Vice President Geoscience and New Ventures,92,finance_samples
92,5,"Float-off of Jack Bates rig prior to deep water drilling operations, offshore Otway Basin, Victoria.",False,0.0,"Float-off of Jack Bates rig prior to deep water drilling operations, offshore Otway Basin, Victoria.",0.0,"Float-off of Jack Bates rig prior to deep water drilling operations, offshore Otway Basin, Victoria.",0.0,"Float-off of Jack Bates rig prior to deep water drilling operations, offshore Otway Basin, Victoria.",0.0,"Float-off of Jack Bates rig prior to deep water drilling operations, offshore Otway Basin, Victoria.",0.0,"Float-off of Jack Bates rig prior to deep water drilling operations, offshore Otway Basin, Victoria.",0.72,"o production only two months after drilling was completed.
Other wells in the offshore Otway Basin ",0.72,"o production only two months after drilling was completed.
@@ -4505,15 +4212,18 @@ Other wells in the offshore Otway Basin ",92,finance_samples
93,0,"Factors that could cause actual results to differ materially from expected results are described under “Risk Factors” in Item 1A of our 2010 Annual Report on Form 10-K included in this report. We caution you not to place undue reliance on for- ward-looking statements, and we undertake no obligation to update this information. We urge you to carefully review and consider the disclo- sures made in this report and our other filings with the Securities and Exchange Commission (SEC) regarding the risks and factors that may affect our business.",False,0.011029411764705883,"
Factors that could cause actual results to differ materially from expected results are described under “Risk Factors” in Item 1A of our 2010 Annual Report on Form 10-K included in this report. We caution you not to place undue reliance on forward-looking statements, and we undertake no obligation to update this information. We urge you to carefully review and consider the disclosures made in this report and our other filings with the Securities and Exchange Commission (SEC) regarding the risks and factors that may affect our business.
",0.01838235294117647,"
+
Factors that could cause actual results to differ materially from expected results are described under ""Risk Factors"" in Item 1A of our 2010 Annual Report on Form 10-K included in this report. We caution you not to place undue reliance on forward-looking statements, and we undertake no obligation to update this information. We urge you to carefully review and consider the disclosures made in this report and our other filings with the Securities and Exchange Commission (SEC) regarding the risks and factors that may affect our business.
-T",0.014705882352941176,"
+",0.014705882352941176,"
Factors that could cause actual results to differ materially from expected results are described under “Risk Factors” in Item 1A of our 2010 Annual Report on Form 10-K included in this report. We caution you not to place undue reliance on forward-looking statements, and we undertake no obligation to update this information. We urge you to carefully review and consider the disclosures made in this report and our other filings with the Securities and Exchange Commission (SEC) regarding the risks and factors that may affect our business.
-",0.01838235294117647,"s.
+",0.01838235294117647,"
+
+Factors that could cause actual results to differ materially from expected results are described under ""Risk Factors"" in Item 1A of our 2010 Annual Report on Form 10-K included in this report. We caution you not to place undue reliance on forward-looking statements, and we undertake no obligation to update this information. We urge you to carefully review and consider the disclosures made in this report and our other filings with the Securities and Exchange Commission (SEC) regarding the risks and factors that may affect our business.
-Factors that could cause actual results to differ materially from expected results are described under ""Risk Factors"" in Item 1A of our 2010 Annual Report on Form 10-K included in this report. We caution you not to place undue reliance on forward-looking statements, and we undertake no obligation to update this information. We urge you to carefully review and consider the disclosures made in this report and our other filings with the Securities and Exchange Commission (SEC) regarding the risks and factors that may affect our business.",0.014705882352941176,"Factors that could cause actual results to differ materially from expected results are described under “Risk Factors” in Item 1A of our 2010 Annual Report on Form 10-K included in this report. We caution you not to place undue reliance on forward-looking statements, and we undertake no obligation to update this information. We urge you to carefully review and consider the disclosures made in this report and our other filings with the Securities and Exchange Commission (SEC) regarding the risks and factors that may affect our business.
+",0.014705882352941176,"Factors that could cause actual results to differ materially from expected results are described under “Risk Factors” in Item 1A of our 2010 Annual Report on Form 10-K included in this report. We caution you not to place undue reliance on forward-looking statements, and we undertake no obligation to update this information. We urge you to carefully review and consider the disclosures made in this report and our other filings with the Securities and Exchange Commission (SEC) regarding the risks and factors that may affect our business.
T",0.011029411764705883,"Factors that could cause actual results to differ materially from expected results are described under 'Risk Factors' in Item 1A of our 2010 Annual Report on Form 10-K included in this report. We caution you not to place undue reliance on for ward-looking statements, and we undertake no obligation to update this information. We urge you to carefully review and consider the disclo sures made in this report and our other filings with the Securities and Exchange Commission (SEC) regarding the risks and factors that may affect our business.
@@ -4547,7 +4257,7 @@ Although still under-
Since entering Poland in 1995, Euronet Worldwide has become one of the largest transaction processing service providers in the country, establishing a network of over 600 ATMs and providing software to eight major banks. Our agreement for electronic airtime distribution with all three mobile phone operators in the country – ERA GSM, Plus GSM and IDEA Centertel – further confirms that Euronet is embedded in the financial payments fabric in Poland.
-develop",0.02723146747352496,"The Promise of Emerging Markets
+develop",0.02723146747352496," Promise of Emerging Markets
## Expanding Poland's Payment Infrastructure
@@ -4555,7 +4265,7 @@ Although still under-
developed compared to western economies, Poland is one of the most dynamic and promising markets in all of Europe.
-Since entering Poland in 1995, Euronet Worldwide has become one of the largest transaction processing service providers in the country, establishing a network of over 600 ATMs and providing software to eight major banks. Our agreement for electronic airtime distribution with all three mobile phone operators in the country – ERA GSM, Plus GSM and IDEA Centertel – further confirms that Euronet is embedded in the financial payments fabric in ",0.05446293494704992," Expanding Poland’s Payment Infrastructure
+Since entering Poland in 1995, Euronet Worldwide has become one of the largest transaction processing service providers in the country, establishing a network of over 600 ATMs and providing software to eight major banks. Our agreement for electronic airtime distribution with all three mobile phone operators in the country – ERA GSM, Plus GSM and IDEA Centertel – further confirms that Euronet is embedded in the financial payments fabric in Pol",0.05446293494704992," Expanding Poland’s Payment Infrastructure
Although still under-developed compared to western economies, Poland is one of the most dynamic and promising markets in all of Europe.
@@ -4669,7 +4379,7 @@ these projects will deliver
programs that are targeted to
meet business and individual
needs and to support culture
-change init",0.01910828025477707,"in business operations with a lean and efficient corporate and services group.
+change init",0.01910828025477707,"ng in business operations with a lean and efficient corporate and services group.
With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed. As is often the case with transformational change initiatives, not everyone was re-appointed and, as a result, the workforce was reduced by 9%.
@@ -4685,7 +4395,7 @@ One of the first tasks undertaken was a voluntary employee survey to identify th
Making sure training and development supports current and future business requirements, and provides opportunities for people to develop their skills to achieve optimum performance, are key aspects of Santos' human resources strategy.
-Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to support culture change initiatives",0.02374059061957151,"g in business operations with a lean and efficient corporate and services group.
+Santos has a number of long-term projects underway which will optimise the substantial investment the Company makes in training people. Importantly, these projects will deliver programs that are targeted to meet business and individual needs and to support culture change initiati",0.02374059061957151,"g in business operations with a lean and efficient corporate and services group.
With the exception of a small number of project teams, all non-award based positions in the Company were declared vacant and a selection process commenced around a set of criteria designed to ensure that people with the right skills and the ability to successfully grow Santos were appointed.
@@ -4802,7 +4512,7 @@ volume, which is a significant
achievement.
This technology will be
-implemented where pos",0.02088167053364269,"KSIA AWARDS
+implemented where pos",0.02088167053364269,"SIA AWARDS
Santos was selected in 2004 as a finalist in the Banksia Environmental Awards for the work undertaken in the Company-led initiative to protect the world-renowned Coongie Lakes, resulting in the area being declared a new National Park by the South Australian Government.
@@ -4812,7 +4522,7 @@ As a finalist for this award Santos was recognised for its leadership role in br
Santos trialled innovative waste management techniques during 2004 to reduce the volume of hydrocarbon waste generated from Cooper Basin operations. Preliminary results indicate that these waste volumes can be reduced to 3-5% of their original volume, which is a significant achievement.
-This technology will be implemented where possi",0.025522041763341066,"ANKSIA AWARDS
+This technology will be implemented where possib",0.025522041763341066,"ANKSIA AWARDS
Santos was selected in 2004 as a finalist in the Banksia Environmental Awards for the work undertaken in the Company-led initiative to protect the world-renowned Coongie Lakes, resulting in the area being declared a new National Park by the South Australian Government.
@@ -4882,10 +4592,10 @@ PROBABLE AND POSSIBLE
• increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
-• increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end; • increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)",0.20876288659793815,"SSIBLE | DRILLING INVENTORY (YEARS) |
+• increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end; • increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)",0.20554123711340205,"ossible | Drilling Inventory (Years) |
|--------|--------|-----------------------|----------------------------|
| JAN-13 | ~10 | ~100 | ~1.5 |
-| JAN-14 | ~10 | ~80 | ~1.0 |
+| JAN-14 | ~10 | ~80 | ~1.5 |
| JAN-15 | ~10 | ~150 | ~4.5 |
In 2014, the Company brought 35 gross (26.1 net) Eagle Ford wells into production by D&P investments of \$244 million. Through \$26 million of direct mineral leases and \$36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
@@ -4896,8 +4606,7 @@ Since its entrance into the Eagle Ford in March 2013, the Company has:
- increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of \$449.3 million (an 18x increase));
- increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
- increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end;
-- increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)
-",0.026417525773195876,"s relatively low operating costs, the Eagle Ford remains profitable during current oil commodity pricing conditions. Sundance has quickly transformed the Eagle Ford position acquired in its merger with Texon Petroleum Ltd to its most valuable asset in its portfolio through development and growing its drilling inventory.
+- increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)",0.026417525773195876,"s relatively low operating costs, the Eagle Ford remains profitable during current oil commodity pricing conditions. Sundance has quickly transformed the Eagle Ford position acquired in its merger with Texon Petroleum Ltd to its most valuable asset in its portfolio through development and growing its drilling inventory.
In 2014, the Company brought 35 gross (26.1 net) Eagle Ford wells into production by D&P investments of \$244 million. Through \$26 million of direct mineral leases and \$36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
@@ -4907,7 +4616,7 @@ Since its entrance into the Eagle Ford in March 2013, the Company has:
* increased 1P Constant Case Reserves by 10x to 18,132 MBOE (PV10 of \$449.3 million (an 18x increase));
* increased its acreage to approximately 33,000 net acres, primarily in the volatile oil and condensate window of the Eagle Ford (includes 14,180 net acres acquired in January 2015 and excludes 5,418 net acres targeting the Georgetown Formation in neighboring Maverick County);
* increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end;
-* increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing",0.19072164948453607,"| E\&E Capital Invested and Acquisitions | $ 59,903 |
+* increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing",0.19136597938144329," E\&E Capital Invested and Acquisitions | $ 59,903 |
| Gross producing wells | 77 |
| Net Producing wells | 53.8 |
| Gross Wells in Progress | 19 |
@@ -4927,7 +4636,8 @@ Since its entrance into the Eagle Ford in March 2013, the Company has:
• increased its producing well count to 77 gross (53.8 net), with an additional 19 gross (10.6 net) wells in progress at year-end;
-• increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)",0.4735824742268041," picture [192 x 138] intentionally omitted <==**
+• increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)
+",0.4735824742268041," picture [192 x 138] intentionally omitted <==**
production by D&P investments of $244 million. Through $26 million of direct mineral leases and $36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled
@@ -5122,10 +4832,9 @@ Early in the second half of 2004, Santos concluded the sale of its non-core onsh
The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of \$100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of \$100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.",0.01383399209486166,"hesapeake’s Five-Year and Ten-Year Common Stock Performance
-The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of \$100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of \$100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.",0.011857707509881422,"Chesapeake's Five-Year and Ten-Year Common Stock Performance
+The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of \$100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of \$100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.",0.011857707509881422," Chesapeake's Five-Year and Ten-Year Common Stock Performance
-The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.
-",0.11067193675889328,"p., Devon Energy Corp., Encana Corp. and EOG Resources, Inc.
+The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.",0.11067193675889328,"p., Devon Energy Corp., Encana Corp. and EOG Resources, Inc.
The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.",0.037549407114624504,"sapeake's Five-Year and Ten-Year Common Stock Performance
@@ -5327,9 +5036,9 @@ SMFG's Groupwide basic policies for risk management stipulate the fundamental pr
104,1,"LEADER IN CANADIAN COMMUNICATIONS INDUSTRY Canada’s largest wireless carrier and a leading cable television provider, offering a “quadruple play” of wireless, Internet, television and telephony services to consumers and businesses.",False,0.017316017316017316,"EADER IN CANADIAN
COMMUNICATIONS INDUSTRY
-Canada’s largest wireless carrier and a leading cable television provider, offering a “quadruple play” of wireless, Internet, television and telephony services to consumers and businesses.",0.025974025974025976,"EADER IN CANADIAN COMMUNICATIONS INDUSTRY
+Canada’s largest wireless carrier and a leading cable television provider, offering a “quadruple play” of wireless, Internet, television and telephony services to consumers and businesses.",0.025974025974025976,"LEADER IN CANADIAN COMMUNICATIONS INDUSTRY
-Canada's largest wireless carrier and a leading cable television provider, offering a ""quadruple play"" of wireless, Internet, television and telephony services to consumers and businesses.",0.004329004329004329,"LEADER IN CANADIAN COMMUNICATIONS INDUSTRY
+Canada's largest wireless carrier and a leading cable television provider, offering a ""quadruple play"" of wireless, Internet, television and telephony services to consumers and businesses",0.004329004329004329,"LEADER IN CANADIAN COMMUNICATIONS INDUSTRY
Canada’s largest wireless carrier and a leading cable television provider, offering a “quadruple play” of wireless, Internet, television and telephony services to consumers and businesses.",0.025974025974025976,"LEADER IN CANADIAN COMMUNICATIONS INDUSTRY
Canada's largest wireless carrier and a leading cable television provider, offering a ""quadruple play"" of wireless, Internet, television and telephony services to consumers and businesses",0.03463203463203463,"EADER IN CANADIAN COMMUNICATIONS INDUSTRY**
@@ -5381,9 +5090,9 @@ Unique and complementary collection of leading broadcast radio and television, s
Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry",0.017857142857142856,"SUPERIOR ASSET MIX
Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry",0.005952380952380952,"SUPERIOR ASSET MIX
-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry.",0.017857142857142856,"SUPERIOR ASSET MIX
+Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry.",0.017857142857142856,"UPERIOR ASSET MIX
-Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry",0.125," omitted <==**
+Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry.",0.125," omitted <==**
Majority of revenue and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry.
@@ -5417,9 +5126,9 @@ Leading wireless and broadband
network platforms that deliver the
most innovative communications,
information and entertainment
-services",0.016853932584269662,"EADING NETWORKS AND INNOVATIVE PRODUCTS
+services",0.016853932584269662,"LEADING NETWORKS AND INNOVATIVE PRODUCTS
-Leading wireless and broadband network platforms that deliver the most innovative communications, information and entertainment services.",0.0056179775280898875,"LEADING NETWORKS AND INNOVATIVE PRODUCTS
+Leading wireless and broadband network platforms that deliver the most innovative communications, information and entertainment services",0.0056179775280898875,"LEADING NETWORKS AND INNOVATIVE PRODUCTS
Leading wireless and broadband network platforms that deliver the most innovative communications, information and entertainment services.",0.016853932584269662,"LEADING NETWORKS AND INNOVATIVE PRODUCTS
Leading wireless and broadband network platforms that deliver the most innovative communications, information and entertainment services",0.7471910112359551," and cash flow is generated from wireless and broadband services, the fastest growing segments of the telecommunications industry.
@@ -5436,12 +5145,12 @@ Experienced, performance-oriented
management and operating teams
with solid industry expertise,
supported by the spirit of innovation
-and an entrepreneurial culture.",0.014354066985645933,"PROVEN LEADERSHIP AND ENGAGED EMPLOYEE BASE
+and an entrepreneurial culture.",0.014354066985645933,"ROVEN LEADERSHIP AND ENGAGED EMPLOYEE BASE
-Experienced, performance-oriented management and operating teams with solid industry expertise, supported by the spirit of innovation and an entrepreneurial culture",0.004784688995215311,"PROVEN LEADERSHIP AND ENGAGED EMPLOYEE BASE
-Experienced, performance-oriented management and operating teams with solid industry expertise, supported by the spirit of innovation and an entrepreneurial culture.",0.014354066985645933,"PROVEN LEADERSHIP AND ENGAGED EMPLOYEE BASE
+Experienced, performance-oriented management and operating teams with solid industry expertise, supported by the spirit of innovation and an entrepreneurial culture.",0.004784688995215311,"PROVEN LEADERSHIP AND ENGAGED EMPLOYEE BASE
+Experienced, performance-oriented management and operating teams with solid industry expertise, supported by the spirit of innovation and an entrepreneurial culture.",0.014354066985645933,"ROVEN LEADERSHIP AND ENGAGED EMPLOYEE BASE
-Experienced, performance-oriented management and operating teams with solid industry expertise, supported by the spirit of innovation and an entrepreneurial culture",0.7033492822966507,"## **WHY INVEST** IN ROGERS
+Experienced, performance-oriented management and operating teams with solid industry expertise, supported by the spirit of innovation and an entrepreneurial culture.",0.7033492822966507,"## **WHY INVEST** IN ROGERS
**Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long re",0.20095693779904306,"
@@ -5465,9 +5174,9 @@ leverage, and significant available
financial liquidity",0.017857142857142856,"FINANCIAL STRENGTH AND FLEXIBILITY
Financially strong with an investment grade balance sheet, conservative debt leverage, and significant available financial liquidity",0.005952380952380952,"FINANCIAL STRENGTH AND FLEXIBILITY
-Financially strong with an investment grade balance sheet, conservative debt leverage, and significant available financial liquidity.",0.017857142857142856,"FINANCIAL STRENGTH AND FLEXIBILITY
+Financially strong with an investment grade balance sheet, conservative debt leverage, and significant available financial liquidity.",0.017857142857142856,"INANCIAL STRENGTH AND FLEXIBILITY
-Financially strong with an investment grade balance sheet, conservative debt leverage, and significant available financial liquidity",0.8095238095238095,"DIAN COMMUNICATIONS INDUSTRY**
+Financially strong with an investment grade balance sheet, conservative debt leverage, and significant available financial liquidity.",0.8095238095238095,"DIAN COMMUNICATIONS INDUSTRY**
Canada’s largest wireless carrier and a leading cable television provider, offering a “quadruple play” of wireless, Internet, televisio",0.20833333333333334,"n and an entrepreneurial culture.
@@ -5477,12 +5186,12 @@ Financially strong with an investment grade balance sheet, conservative debt lev
104,9,"HEALTHY TRADING VOLUME AND GROWING DIVIDENDS RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of $1.83 per share in 2014.",False,0.01694915254237288,"EALTHY TRADING VOLUME
AND GROWING DIVIDENDS
-RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of $1.83 per share in 2014.",0.0211864406779661,"EALTHY TRADING VOLUME AND GROWING DIVIDENDS
+RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of $1.83 per share in 2014.",0.0211864406779661,"HEALTHY TRADING VOLUME AND GROWING DIVIDENDS
-RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of \$1.83 per share in 2014",0.00423728813559322,"HEALTHY TRADING VOLUME AND GROWING DIVIDENDS
-RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of $1.83 per share in 2014.",0.012711864406779662,"EALTHY TRADING VOLUME AND GROWING DIVIDENDS
+RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of \$1.83 per share in 201",0.00423728813559322,"HEALTHY TRADING VOLUME AND GROWING DIVIDENDS
+RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of $1.83 per share in 2014.",0.012711864406779662,"HEALTHY TRADING VOLUME AND GROWING DIVIDENDS
-RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of $1.83 per share in 2014.",0.8177966101694916,"HY INVEST** IN ROGERS
+RCI common stock actively trades on the TSX and NYSE, with average daily trading volume of approximately 1.6 million shares. Each share pays an annualized dividend of $1.83 per share in 2014",0.8177966101694916,"HY INVEST** IN ROGERS
**Rogers Communications has excellent positions in growing markets, powerful brands that stand for innovation, proven management, a long record of driving growth and shareholder value, and the financial strength ",0.012711864406779662,"HEALTHY TRADING VOLUME AND GROWING DIVIDENDS
@@ -5536,15 +5245,13 @@ information compiled by full-time
employees of the Company who
have the requisite qualifications
and experience prescribed by the
-ASX Listing Rules",0.03135313531353135,"ssociation of Petroleum
+ASX Listing Rules",0.01485148514851485,"sociation of Petroleum
Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX).
Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date
-### forward. Santos reports reserves
-
-net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing",0.0049504950495049506,"Association of Petroleum Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX).
+forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules",0.0049504950495049506,"Association of Petroleum Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX).
Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules",0.0,"Association of Petroleum Geologists (AAPG). The definitions used are consistent with the requirements of the Australian Stock Exchange Ltd (ASX). Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules.",0.3564356435643564,"s are defined as those definitions and resource quantities of petroleum which are classification systems published by anticipated to be commercially the Society of Petroleum Engineers recovered from known (SPE), World Petroleum Congress accumulations from a given date (WPC) and the American
@@ -5564,11 +5271,9 @@ independent expert, Gaffney, Cline
'appropriate to providing robust
estimates of Santos' reserve
position in accordance with
-international industry practice",0.04946996466431095,"XTERNALLY REVIEWED
+international industry practice",0.024734982332155476,"EXTERNALLY REVIEWED BOOKING PROCESS
-## BOOKING PROCESS
-
-Santos' reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be 'appropriate to providing robust estimates of Santos' reserve position in accordance with international industry practi",0.01060070671378092,"EXTERNALLY REVIEWED BOOKING PROCESS
+Santos' reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be 'appropriate to providing robust estimates of Santos' reserve position in accordance with international industry practice'",0.01060070671378092,"EXTERNALLY REVIEWED BOOKING PROCESS
Santos’ reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be ‘appropriate to providing robust estimates of Santos’ reserve position in accordance with international industry practice’",0.024734982332155476,"EXTERNALLY REVIEWED BOOKING PROCESS** Santos' reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be 'appropriate to providing robust estimates of Santos' reserve position in accordance with international industry practice",0.014134275618374558,"TERNALLY REVIEWED BOOKING PROCESS** Santos’ reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be ‘appropriate to providing robust estimates of Santos’ reserve position in accordance with international industry practice’.",0.04946996466431095,"EXTERNALLY REVIEWED BOOKING PROCESS
@@ -5600,13 +5305,13 @@ The composition of the Board is determined in accordance with the Company's Cons
The composition of the Board is determined in accordance with the Company’s Constitution and the Board Guidelines which, among other things, require that:
* the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
-* the Board should comprise a substantial majority of independent, non-executive Direct",0.058666666666666666,"Composition of the Board
+* the Board should comprise a substantial majority of independent, non-executive Direct",0.06666666666666667,"ition of the Board
-The composition of the Board is determined in accordance with the Company's Constitution and the Board Guidelines which, among other things, require that:
+> The composition of the Board is determined in accordance with the Company's Constitution and the Board Guidelines which, among other things, require that:
> * the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
>
-> * the Board should comprise a substantial majority of independent, non-executive Direc",0.042666666666666665,"position of the Board** The composition of the Board is determined in accordance with the Company’s Constitution and the Board Guidelines which, among other things, require that:
+> * the Board should comprise a substantial majority of independent, non-executive Directors",0.042666666666666665,"position of the Board** The composition of the Board is determined in accordance with the Company’s Constitution and the Board Guidelines which, among other things, require that:
• the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
@@ -5649,11 +5354,11 @@ perceived to materially interfere with, the Director's ability to act in the bes
- an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Compan",0.01366742596810934,"enerally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be perceived to materially interfere with, the Director’s ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
* a holding of 5% or more of the Company’s voting shares or a direct association with an entity that holds more than 5% of the Company’s voting shares;
-* an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Comp",0.02847380410022779,"lly, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be perceived to materially interfere with, the Director's ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
+* an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Comp",0.02847380410022779,"nerally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be perceived to materially interfere with, the Director's ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted materiality guidelines to assist in that assessment. Under these guidelines, the following interests are regarded as material in the absence of any mitigating factors:
>
> * a holding of 5% or more of the Company's voting shares or a direct association with an entity that holds more than 5% of the Company's voting shares;
>
-> * an affiliation with an entity which accounts for 5% or more or the revenue or expense of the Comp",0.02733485193621868,"enerally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be
+> * an affiliation with an entity which accounts for 5% or more or the revenue or expense of the ",0.02733485193621868,"enerally, the Board considers a Director to be independent if he or she is not a member of management and is free of any business or other relationship that could materially interfere with, or could reasonably be
perceived to materially interfere with, the Director’s ability to act in the best interests of the Company. The Board will assess the materiality of any given relationship that may affect independence on a case by case basis and has adopted
@@ -5678,9 +5383,9 @@ responsibilities, and term of office of each Director of the Company are set out
responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director’s attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Repor",0.0030864197530864196,"The names and details of the experience, qualifications, special responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director's attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report.",0.0030864197530864196,"The names and details of the experience, qualifications, special responsibilities, and term of office of each Director of the Company are set out on page 41 of this Annual Report. Details of each Director's attendance at Board and Committee Meetings and their shareholdings are also set out on page 47 of this Annual Report.",106,finance_samples
107,0,"innovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that’s pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improve- ments have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box.",False,0.0040609137055837565,"innovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their
-product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that’s pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improve ments have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box",0.008121827411167513,"nnovate more** Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their
+product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that’s pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improve ments have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box",0.008121827411167513,"innovate more** Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their
-product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that's pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box.",0.02030456852791878,"e more** Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, *Hormel* chili varieties were first in their product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include *SPAM Singles* and *Jennie-O Turkey Store* Oven Ready Turkey, a fool-proof, whole frozen turkey that’s pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our *Hormel* microwave meals by revising packaging to draw attention to the convenient bowl rather than the box",0.02131979695431472,"ovate more** Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, *Hormel* chili varieties were first in their product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include *SPAM* Singles and *Jennie-O Turkey Store* Oven Ready Turkey, a fool-proof, whole frozen turkey that's pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our *Hormel* microwave meals by revising packaging to draw attention to the convenient bowl rather than the",0.02030456852791878,"ovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, _Hormel_ chili varieties were first in their
+product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that's pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box",0.02030456852791878,"e more** Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, *Hormel* chili varieties were first in their product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include *SPAM Singles* and *Jennie-O Turkey Store* Oven Ready Turkey, a fool-proof, whole frozen turkey that’s pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our *Hormel* microwave meals by revising packaging to draw attention to the convenient bowl rather than the box",0.02131979695431472,"ovate more** Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, *Hormel* chili varieties were first in their product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include *SPAM* Singles and *Jennie-O Turkey Store* Oven Ready Turkey, a fool-proof, whole frozen turkey that's pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our *Hormel* microwave meals by revising packaging to draw attention to the convenient bowl rather than the",0.02030456852791878,"ovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, _Hormel_ chili varieties were first in their
product category to offer Tetra Recart carton packaging – an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include _SPAM_ Singles and _Jennie-O Turkey Store_ Oven Ready Turkey, a fool-proof, whole frozen turkey that’s pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our _Hormel_ microwave meals by revising packaging to draw attention to the convenient bowl rather than the",0.006091370558375634,"
innovate more Innovation is a top priority for us because it creates competitive advantage and builds brand equity. Fiscal 2004 was a fertile period for new ideas in every aspect of our business. We installed high-volume, high-pressure food processing systems to explore new horizons in food safety. Beginning mid-year, Hormel chili varieties were first in their product category to offer Tetra Recart carton packaging - an innovation that provides consumers with a more convenient package and adds excitement to a long established category. Other new convenience product launches include SPAM Singles and Jennie-O Turkey Store Oven Ready Turkey, a fool-proof, whole frozen turkey that's pre-seasoned, ready to go directly from freezer to oven, and is ready to eat in about three and one-half hours. Less dramatic packaging improvements have significantly boosted sales of our Hormel microwave meals by revising packaging to draw attention to the convenient bowl rather than the box.
@@ -5783,24 +5488,11 @@ Beaverton, Oregon 97006 (U",0.2903225806451613,"(72) Inventors:
- DICKEY, Eric R. Beaverton, Oregon 97006 (US)
",108,patents
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-
-## E",0.6,"00 008 B1
-
-## E",108,patents
108,9,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",False,0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.009900990099009901,"te:** Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.007425742574257425,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent
Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the
Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been
paid. (Art. 99(1) European Patent Convention).",0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",0.0,"Note: Within nine months of the publication of the mention of the grant of the European patent in the European Patent Bulletin, any person may give notice to the European Patent Office of opposition to that patent, in accordance with the Implementing Regulations. Notice of opposition shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).",108,patents
-109,0,1111 1111111111 11111111 US009423690B2,False,0.6578947368421053,US009423690B2,0.7105263157894737,"(10) **Patent No.:** **US 9,423,690 B2",0.7894736842105263,"(10) Patent No.:** US 9,423,690 B2
-*",0.6578947368421053,"
-
-US009423690B2",0.7105263157894737,"onally omitted <==**
-
-US009423690B2
-
-",0.7631578947368421, 141185 (2013.01); C08F 16110 (2013.01,0.7631578947368421, 141185 (2013.01); C08F 16110 (2013.01,109,patents
-109,1,c12) United States Patent,False,0.08,12) United States Patent,0.16,12) **United States Paten,0.08,"12) United States Patent
+109,1,c12) United States Patent,False,0.08,12) United States Patent,0.16,2) **United States Patent,0.08,"12) United States Patent
",0.04,(12) United States Patent,0.16,12) **United States Paten,0.0,c12) United States Patent,0.0,c12) United States Patent,109,patents
109,2,Takizawa et al.,False,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,0.0,Takizawa et al.,109,patents
109,3,"(IO) Patent No.: US 9,423,690 B2",False,0.1875,") Patent No.:
@@ -5816,7 +5508,7 @@ Patent No.:
US 9,423,690 B2",109,patents
109,4,"(45) Date of Patent: Aug. 23, 2016",False,0.14705882352941177,"5) Date of Patent:
-Aug. 23, 2016",0.2647058823529412,"*Date of Patent:** **Aug. 23, 2016",0.11764705882352941,"45) Date of Patent:** Aug. 23, 201",0.0,"(45) Date of Patent: Aug. 23, 2016",0.11764705882352941,"5) **Date of Patent: Aug. 23, 2016",0.3235294117647059,"Date of Patent:
+Aug. 23, 2016",0.29411764705882354,"Date of Patent:** **Aug. 23, 2016*",0.11764705882352941,"45) Date of Patent:** Aug. 23, 201",0.0,"(45) Date of Patent: Aug. 23, 2016",0.11764705882352941,"5) **Date of Patent: Aug. 23, 2016",0.3235294117647059,"Date of Patent:
Aug. 23, 2016
@@ -5834,7 +5526,7 @@ ELECTRONIC DEVICE, AND ELECTRONIC
DEVICE USING THE SAME",0.019230769230769232,"(54) **PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.019230769230769232,"(54) PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME
",0.019230769230769232,"**(54) PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.019230769230769232,"(54) **PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.019230769230769232,"- (54) PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",0.019230769230769232,"- (54) PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME",109,patents
-109,6,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP)",False,0.0,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP)",0.20833333333333334,"Applicant:** **FUJIFILM Corporation, Tokyo (JP)*",0.08333333333333333,"71) Applicant:** FUJIFILM Corporation, Tokyo (JP",0.0,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP)",0.16666666666666666," Applicant: **FUJIFILM Corporation,** Tokyo (JP)",0.041666666666666664,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP",0.041666666666666664,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP",109,patents
+109,6,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP)",False,0.0,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP)",0.1875,"*Applicant:** **FUJIFILM Corporation, Tokyo (JP)",0.08333333333333333,"71) Applicant:** FUJIFILM Corporation, Tokyo (JP",0.0,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP)",0.16666666666666666," Applicant: **FUJIFILM Corporation,** Tokyo (JP)",0.041666666666666664,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP",0.041666666666666664,"(71) Applicant: FUJIFILM Corporation, Tokyo (JP",109,patents
109,7,"(72) Inventors: Hiroo Takizawa, Shizuoka (JP); Shuji , ( ) Hirano, Shizuoka (JP); Natsumi Yokokawa, Shizuoka (JP); Wataru Nihashi, Shizuoka (JP)",False,0.0763888888888889,"(72) Inventors: Hiroo Takizawa, Shizuoka (JP); Shuji
Hirano, Shizuoka (JP); Natsumi
Yokokawa, Shizuoka (JP); Wataru
@@ -5847,9 +5539,9 @@ Nihashi, Shizuoka (JP)",0.08333333333333333,"(72) **Inventors:** **Hiroo Takiza
- (",109,patents
109,8,"(57) ABSTRACT There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition contain- ing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and ( c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo!% or more based on a whole repeating units in the resin (A).",False,0.009404388714733543,"(57) ABSTRACT
-There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and (c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo!% or more based on a whole repeating units in the resin (A).",0.0219435736677116,") **ABSTRACT**
+There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and (c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mo!% or more based on a whole repeating units in the resin (A).",0.0219435736677116,"7) **ABSTRACT**
-There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and (c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A).",0.017241379310344827," (57) ABSTRACT
+There is provided a pattern forming method, including: (a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2); (b) exposing the film by using an electron beam or extreme ultraviolet ray; and (c) developing the exposed film by using a developer containing an organic solvent to form a negative pattern, wherein a content of the repeating unit represented by Formula (1-0) is 45 mol % or more based on a whole repeating units in the resin (A)",0.017241379310344827," (57) ABSTRACT
There is provided a pattern forming method, including:
(a) forming a film by using an electron beam-sensitive or extreme ultraviolet ray-sensitive resin composition containing a resin (A) having a repeating unit represented by Formula (1-0) and a repeating unit represented by Formula (1-2);
@@ -5917,18 +5609,19 @@ Formula (",0.13488372093023257,"ndition 1: The A value determined by Formula (1
Formula (",110,patents
110,7,"[0051] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",False,0.0,"[0051] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",0.0026041666666666665,"[0051] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as “the effect of the present invention is more excellent”), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",0.018229166666666668," As described, the $A$ value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as “the effect of the present invention is more excellent”), the $A$ value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the $A$ value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",0.005208333333333333,"051]** As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less.",0.005208333333333333,"0051]** As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or less, and more preferably 0.22 or less",0.10416666666666667,"51] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or l",0.10416666666666667,"51] As described, the A value is 0.14 or more, but from the viewpoint that at least one of additional improvement of the Z-factor or additional suppression of pattern collapse is achieved (hereinafter also simply referred to as ""the effect of the present invention is more excellent""), the A value is preferably 0.16 or more, more preferably 0.18 or more, and particularly preferably 0.20 or more. The upper limit is not particularly limited, but in a case where the A value is extremely high, the transmittance of EUV light of the resist film is lowered, the optical profile in the resist film is deteriorated, as a result, it is difficult to obtain a good pattern shape, and therefore, the upper limit is preferably 0.24 or l",110,patents
-111,0,"US 9,423,690 B2",False,0.0,"US 9,423,690 B2",0.8666666666666667," 2561(2002), an",0.0,"US 9,423,690 B2",0.0,"US 9,423,690 B2",0.0,"US 9,423,690 B2",0.9333333333333333,". 2561(2002), ",0.9333333333333333,". 2561(2002), ",111,patents
+111,0,"US 9,423,690 B2",False,0.0,"US 9,423,690 B2",0.9333333333333333," p. 2561(2002),",0.0,"US 9,423,690 B2",0.0,"US 9,423,690 B2",0.0,"US 9,423,690 B2",0.9333333333333333,". 2561(2002), ",0.9333333333333333,". 2561(2002), ",111,patents
111,1,"The polar group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) prefer- ably contain a repeating unit having a cyclic carbonate ester structure. The repeating unit having a cyclic carbonate ester struc- ture is preferably the repeating unit represented by Formula (A-1).",False,0.050666666666666665," group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) prefer- ably contain a repeating unit having a cyclic carbonate ester structure.
15
The repeating unit having a cyclic carbonate ester struc- 20
-ture is preferably the repeating unit represented by Formula (A-1).",0.024,"]
-
+ture is preferably the repeating unit represented by Formula (A-1).",0.024,"
The polar group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) preferably contain a repeating unit having a cyclic carbonate ester structure.
-The repeating unit having a cyclic carbonate ester structure is preferably the repeating unit represented by Formula (A-1).",0.024,"
+The repeating unit having a cyclic carbonate ester structure is preferably the repeating unit represented by Formula (A-1).
+
+",0.024,"
The polar group which may be possessed by the repeating unit having a polar group may be a carbonate group such as a cyclic carbonate ester structure, and the resin (A) preferably contain a repeating unit having a cyclic carbonate ester structure.
@@ -5993,7 +5686,7 @@ an urea bond, or combination thereof. Examples of the alkylene group may include
10
-In one aspect of the present invention, A is preferably a single bond, or an alkylene group.",0.09423274974253347," $R_A^1$ represents a hydrogen atom or an alkyl group.
+In one aspect of the present invention, A is preferably a single bond, or an alkylene group.",0.09423274974253347,"A^1$ represents a hydrogen atom or an alkyl group.
If $n$ is 2 or more, $R_A^2$ 's each independently represents a substituent.
@@ -6011,11 +5704,13 @@ The substituent represented by $R_A^2$ is, for example, an alkyl group, a cycl
$n$ represents the number of substituents, and is an integer of 0 or more. For example, $n$ is preferably 0 to 4, and more preferably 0.
-Examples of the divalent linking group represented by A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond,
+Examples of the a divalent linking group represented by A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond,
-an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, a propylene group, and the like.
+an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, and the like.
+
+In one aspect of the present invention, A is preferably a single bond, or an alkylene group.
-In one aspect of the present invention, A is preferably a single bond, or an alkylene group.",0.07363542739443872,"up.
+",0.07363542739443872,"up.
In Formula (A-1), $R_A^1$ represents a hydrogen atom or an alkyl group.
If $n$ is 2 or more, $R_A^2$'s each independently represents a substituent.
@@ -6147,24 +5842,24 @@ n represents the number of substituents, and is an integer of 0 or more. For ex
Examples of the a divalent linking group represented by 65 A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond, an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, and the like.
In one aspect of the present invention, A is preferably a single bond, or an alkylene group.",111,patents
-112,0,US 2012/0003590 Al,False,0.0,US 2012/0003590 Al,0.8333333333333334,"m 1,000 to 3,000 r",0.05555555555555555,US 2012/0003590 A,0.05555555555555555,US 2012/0003590 A1,0.0,US 2012/0003590 Al,0.8333333333333334,"om 1,000 to 3,000 ",0.8333333333333334,"om 1,000 to 3,000 ",112,patents
-112,1,100,False,0.0,100,0.6666666666666666,008,0.0,100,0.0,100,0.0,100,0.3333333333333333,101,0.3333333333333333,101,112,patents
-112,2,"Jan. 5, 2012",False,0.0,"Jan. 5, 2012",0.75,0.02 to 0.1 ,0.0,"Jan. 5, 2012",0.0,"Jan. 5, 2012",0.0,"Jan. 5, 2012",0.75,0.1 to 20 ,0.75,0.1 to 20 ,112,patents
+112,0,US 2012/0003590 Al,False,0.0,US 2012/0003590 Al,0.8333333333333334,"om 1,000 to 3,000 ",0.05555555555555555,US 2012/0003590 A,0.05555555555555555,US 2012/0003590 A1,0.0,US 2012/0003590 Al,0.8333333333333334,"om 1,000 to 3,000 ",0.8333333333333334,"om 1,000 to 3,000 ",112,patents
+112,1,100,False,0.0,100,0.3333333333333333,200,0.0,100,0.0,100,0.0,100,0.3333333333333333,101,0.3333333333333333,101,112,patents
+112,2,"Jan. 5, 2012",False,0.0,"Jan. 5, 2012",0.75,0.1 to 20 ma,0.0,"Jan. 5, 2012",0.0,"Jan. 5, 2012",0.0,"Jan. 5, 2012",0.75,0.1 to 20 ,0.75,0.1 to 20 ,112,patents
112,3,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",False,0.0,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",0.0,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",0.0,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",0.0,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above.",0.030534351145038167,"0480]** Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film above",0.10687022900763359,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film",0.10687022900763359,"[0480] Also, the pattern forming method of the present invention comprises a step of exposing and developing the resist film",112,patents
112,4,"[0481] The composition of the present invention is typi- cally used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.",False,0.015306122448979591,"[0481] The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.
",0.02040816326530612,"
-
-[0481] The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.",0.02040816326530612,"[0481] The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.
+[0481] The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.
+",0.02040816326530612,"[0481] The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.
",0.02040816326530612,"
[0481] The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.",0.02040816326530612,"[0481]** The composition of the present invention is typically used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film.",0.025510204081632654,"0481] The composition of the present invention is typi› cally used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film",0.025510204081632654,"0481] The composition of the present invention is typi› cally used as follows. That is, the composition of the present invention is typically coated on a support such as substrate to form a film",112,patents
112,5,"[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a sub- strate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.",False,0.014084507042253521,"
-[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.",0.1267605633802817,"0482] The thickness of the film is preferably from 0.02 to 0.1 $\mu\text{m}$ . The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to ",0.018779342723004695,"[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.
+[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.",0.1267605633802817," The thickness of the film is preferably from 0.02 to 0.1 $\mu\text{m}$ . The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000",0.018779342723004695,"[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.
",0.018779342723004695,"
-
-[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.",0.018779342723004695,"[0482]** The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.",0.07981220657276995,"The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a sub› strate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm",0.07981220657276995,"The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a sub› strate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm",112,patents
+[0482] The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.
+",0.018779342723004695,"[0482]** The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a substrate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm.",0.07981220657276995,"The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a sub› strate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm",0.07981220657276995,"The thickness of the film is preferably from 0.02 to 0.1 µm. The method for coating the composition on a sub› strate is preferably spin coating, and the spinning speed is preferably from 1,000 to 3,000 rpm",112,patents
112,6,"[0483] For example, the composition is coated on such a substrate ( e.g., silicon/silicon dioxide-coated substrate, sili- con nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray- sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antire- flection film may be previously provided by coating.",False,0.034545454545454546,"0483] For example, the composition is coated on such a [ ]
substrate (e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used
in the production of a precision integrated circuit device, an
@@ -6176,17 +5871,19 @@ referred to as a ""resist film""). Incidentally, a known antireflection film ma
[0483] For example, the composition is coated on such a substrate (e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray-sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antireflection film may be previously provided by coating.
",0.025454545454545455,"rpm.
-[0483] For example, the composition is coated on such a substrate (e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray-sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a “resist film”). Incidentally, a known antireflection film may be previously provided by coating.",0.02181818181818182,"[0483] For example, the composition is coated on such a substrate (e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray-sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antireflection film may be previously provided by coating.
+[0483] For example, the composition is coated on such a substrate (e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray-sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a “resist film”). Incidentally, a known antireflection film may be previously provided by coating.",0.02181818181818182,"
+[0483] For example, the composition is coated on such a substrate (e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray-sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antireflection film may be previously provided by coating.
-[048",0.02181818181818182,"
+[04",0.02181818181818182,"
**[0483]** For example, the composition is coated on such a substrate ( e.g., silicon/silicon dioxide-coated substrate, silicon nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic raysensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antireflection film may be previously provided by coating. ",0.04909090909090909,"483] For example, the composition is coated on such a substrate ( e.g., silicon/silicon dioxide-coated substrate, sili› con nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray› sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antire› flection film may be previously provided b",0.04909090909090909,"483] For example, the composition is coated on such a substrate ( e.g., silicon/silicon dioxide-coated substrate, sili› con nitride and chromium-deposited quartz substrate) as used in the production of a precision integrated circuit device, an imprint mold or the like, by using a spinner, a coater or the like. Thereafter, the coating is dried to obtain an actinic ray› sensitive or radiation-sensitive film (hereinafter, sometimes referred to as a ""resist film""). Incidentally, a known antire› flection film may be previously provided b",112,patents
112,7,"[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008- 162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion•Application Development of Nanoimprint-Sub- strate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan"".",False,0.006185567010309278,"[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008- 162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan"".
-",0.041237113402061855,"0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008-162101, and ""Yoshihiko Hirai (compiler), *Nanoimprint no Kiso to Gijutsu Kaihatsu*•*Oyo Tenkai*-*Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai* (*Basic and Technology Expansion*•*Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion*), Frontier Shu",0.018556701030927835,"
-[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008-162101, and “Yoshihiko Hirai (compiler), *Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai—Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai* (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan”.",0.012371134020618556,".
+",0.016494845360824743,"[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008-162101, and ""Yoshihiko Hirai (compiler), *Nanoimprint no Kiso to Gijutsu Kaihatsu*•*Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai* (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan""",0.018556701030927835,"
+[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008-162101, and “Yoshihiko Hirai (compiler), *Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai—Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai* (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan”.",0.012371134020618556,"
+[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008-162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan"".
-[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008-162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan"".",0.016494845360824743,"[0491]** Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008162101, and ""Yoshihiko Hirai (compiler), _Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion),_ Frontier Shuppan"".",0.08041237113402062,"an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu·Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion·Application Development of Nanoimprint-Sub› strate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppa",0.08041237113402062,"an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu·Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion·Application Development of Nanoimprint-Sub› strate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppa",112,patents
+",0.016494845360824743,"[0491]** Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008162101, and ""Yoshihiko Hirai (compiler), _Nanoimprint no Kiso to Gijutsu Kaihatsu•Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion),_ Frontier Shuppan"".",0.08041237113402062,"an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu·Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion·Application Development of Nanoimprint-Sub› strate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppa",0.08041237113402062,"an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008162101, and ""Yoshihiko Hirai (compiler), Nanoimprint no Kiso to Gijutsu Kaihatsu·Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai (Basic and Technology Expansion·Application Development of Nanoimprint-Sub› strate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppa",112,patents
112,8,EXAMPLES,False,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,0.0,EXAMPLES,112,patents
-113,0,"US 6,482,565 Bl",False,0.06666666666666667,"US 6,482,565 B",1.0," 250-ml flask, ",0.13333333333333333," US 6,482,565 B",0.13333333333333333,"
+113,0,"US 6,482,565 Bl",False,0.06666666666666667,"US 6,482,565 B",0.9333333333333333, a 250-ml flask,0.13333333333333333," US 6,482,565 B",0.13333333333333333,"
US 6,482,565 B",0.26666666666666666," 6,482,565 **Bl",0.9333333333333333,a 250-ml flas,0.9333333333333333,a 250-ml flas,113,patents
113,1,7,False,0.0,7,0.0,7,0.0,7,0.0,7,0.0,7,0.0,7,0.0,7,113,patents
113,2,"Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was p generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure com- pound represented by following Chemical Formula 6a (yield: 45%).",False,0.008547008547008548,"
@@ -6203,22 +5900,22 @@ Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic a
Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure compound represented by following Chemical Formula 6a (yield: 45%).",0.17735042735042736,"hus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure com› pound represented by following Chemical",0.17735042735042736,"hus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure com› pound represented by following Chemical",113,patents
113,3,,False,0.0,,0.0,,0.09523809523809523, Chemical Formula 6a ,0.0,,0.0,,0.19047619047619047,Chemical Formula 6a,0.19047619047619047,Chemical Formula 6a,113,patents
113,4,"As the reaction catalyst, an acid such as trifluoromethane- sulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",False,0.14705882352941177,"onic acid, hydrochloric acid or boron trifluoride-etherate sulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.
-",0.014705882352941176,"As the reaction catalyst, an acid such as trifluoromethanesulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.
-
",0.014705882352941176,"
As the reaction catalyst, an acid such as trifluoromethanesulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",0.014705882352941176,"
As the reaction catalyst, an acid such as trifluoromethanesulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",0.014705882352941176,"
+As the reaction catalyst, an acid such as trifluoromethanesulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",0.014705882352941176,"
+
As the reaction catalyst, an acid such as trifluoromethanesulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",0.003676470588235294,"As the reaction catalyst, an acid such as trifluoromethane› sulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",0.003676470588235294,"As the reaction catalyst, an acid such as trifluoromethane› sulfonic acid, hydrochloric acid or boron trifluoride-etherate may be used instead of toluene-p-sulfonic acid. As a reaction solvent, a non-carbonyl solvent such as tetrahydrofuran may be used instead of benzene.",113,patents
113,5,"EXAMPLE 2 The procedure according to Example I was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%).",False,0.05699481865284974,"AMPLE 2
25
-The procedure according to Example I was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45",0.02072538860103627,"EXAMPLE 2
+The procedure according to Example I was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45",0.02072538860103627,"XAMPLE 2
-The procedure according to Example 1 was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%)",0.02072538860103627,"XAMPLE 2
+The procedure according to Example 1 was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%).",0.02072538860103627,"XAMPLE 2
The procedure according to Example 1 was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%).",0.02072538860103627,"XAMPLE 2
@@ -6248,8 +5945,8 @@ US 2020/0050106 A",0.0,US 2020/0050106 Al,0.7777777777777778, 0.001 % to 10% by,
[0399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5.0 to 200, and still more preferably 7.0 to 150.
-[",0.01557632398753894,"
-**[0399]** The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5.0 to 200, and still more preferably 7.0 to 150.",0.012461059190031152,"**[0399]** The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5 .0 to 200, and still more preferably 7.0 to 150.",0.102803738317757,"399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is pref› erably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffu› sion control agent (molar ratio) is more preferably 5 .0 to 200, and sti",0.102803738317757,"399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is pref› erably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffu› sion control agent (molar ratio) is more preferably 5 .0 to 200, and sti",114,patents
+[",0.01557632398753894,"**[0399]** The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5.0 to 200, and still more preferably 7.0 to 150.
+",0.012461059190031152,"**[0399]** The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is preferably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffusion control agent (molar ratio) is more preferably 5 .0 to 200, and still more preferably 7.0 to 150.",0.102803738317757,"399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is pref› erably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffu› sion control agent (molar ratio) is more preferably 5 .0 to 200, and sti",0.102803738317757,"399] The ratio of the photoacid generator and the acid diffusion control agent in the resist composition, photoacid generator/acid diffusion control agent (molar ratio), is pref› erably 2.5 to 300. From the viewpoints of the sensitivity and the resolution, the molar ratio is preferably 2.5 or more, and from the viewpoint of suppression of reduction in the resolution as the resist pattern is thickened with aging after exposure until the heating treatment, the molar ratio is preferably 300 or less. The photoacid generator/acid diffu› sion control agent (molar ratio) is more preferably 5 .0 to 200, and sti",114,patents
114,7,"[0400] Examples of the acid diffusion control agent include the compounds (amine compounds, amido group- containing compounds, urea compounds, nitrogen-contain- ing heterocyclic compounds, and the like) described m paragraphs <0140> to <0144> of JP2013-011833A.",False,0.022988505747126436,"
[0400] Examples of the acid diffusion control agent include the compounds (amine compounds, amido groupcontaining compounds, urea compounds, nitrogen-containing heterocyclic compounds, and the like) described m paragraphs <0140> to <0144> of JP2013-011833A.
",0.02681992337164751,"[0400]** Examples of the acid diffusion control agent include the compounds (amine compounds, amido group-containing compounds, urea compounds, nitrogen-containing heterocyclic compounds, and the like) described in paragraphs <0140> to <0144> of JP2013-011833A.",0.02681992337164751,"[0400] Examples of the acid diffusion control agent include the compounds (amine compounds, amido group-containing compounds, urea compounds, nitrogen-containing heterocyclic compounds, and the like) described in paragraphs <0140> to <0144> of JP2013-011833A.
@@ -6259,7 +5956,7 @@ US 2020/0050106 A",0.0,US 2020/0050106 Al,0.7777777777777778, 0.001 % to 10% by,
[0402",0.13333333333333333,[0401]** <(E) Hydrophobic Resi,0.13333333333333333,[0401]** <(E) Hydrophobic Resi,0.3,01] <(E) Hydrophobic Resin,0.3,01] <(E) Hydrophobic Resin,114,patents
114,9,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A).",False,0.0,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A).",0.03418803418803419,"[0402]** The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A",0.0,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A).",0.03418803418803419,"402]** The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A).",0.03418803418803419,"0402]** The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A)",0.017094017094017096,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A)",0.017094017094017096,"[0402] The resist composition may include a hydrophobic resin other than the resin (A), in addition to the resin (A)",114,patents
-114,10,"[0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar materials.",False,0.0,"[0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar materials.",0.012084592145015106,"[0403]** Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar material",0.0,"[0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar materials.",0.012084592145015106,"[0403]** Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar material",0.012084592145015106,"[0403]** Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar material",0.10876132930513595,"0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and no",0.10876132930513595,"0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and no",114,patents
+114,10,"[0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar materials.",False,0.0,"[0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar materials.",0.012084592145015106,"[0403]** Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar material",0.0,"[0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar materials.",0.012084592145015106,"0403]** Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar materials",0.012084592145015106,"[0403]** Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and nonpolar material",0.10876132930513595,"0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and no",0.10876132930513595,"0403] Although it is preferable that the hydrophobic resin is designed to be unevenly distributed on a surface of the resist film, it does not necessarily need to have a hydrophilic group in its molecule as different from the surfactant, and does not need to contribute to uniform mixing of polar materials and no",114,patents
114,11,[0404] Examples of the effect of addition of the hydro- phobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.,False,0.014634146341463415,"
[0404] Examples of the effect of addition of the hydrophobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.",0.01951219512195122,[0404]** Examples of the effect of addition of the hydrophobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.,0.01951219512195122,"
[0404] Examples of the effect of addition of the hydrophobic resin include a control of static and dynamic contact angles of a surface of the resist film with respect to water and suppression of out gas.
@@ -6517,10 +6214,9 @@ This is a continuation of International Application No. PCT/JP2013/072485 filed
This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012-181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorporated herein by reference.
-",0.02040816326530612," CROSS-REFERENCE TO RELATED APPLICATION
+",0.02040816326530612,"# CROSS-REFERENCE TO RELATED APPLICATION
-This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012-181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorporated herein by reference.
-",0.14868804664723032,"fine hole patterns are formed.
+This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012-181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorporated herein by reference.",0.14868804664723032,"fine hole patterns are formed.
This is a continuation of International Application No. PCT/JP2013/072485 filed on Aug. 16, 2013, and claims priority from Japanese Patent Application Nos. 2012181892 filed on Aug. 20, 2012, and 2013-054401 filed on Mar. 15, 2013, the entire disclosures of which are incorporated herein by reference.
@@ -6537,9 +6233,9 @@ The present invention relates to a pattern forming method using a developer cont
## TECHNICAL FIELD
-The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufacturing an electronic device, and an electronic device using the same. More specifically, the present invention relates to",0.023636363636363636,"TECHNICAL FIELD
+The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufacturing an electronic device, and an electronic device using the same. More specifically, the present invention relates to",0.023636363636363636,"## TECHNICAL FIELD
-The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufacturing an electronic device, and an electronic device using the same. More specifically, the present invention relates to a pa",0.02181818181818182," TECHNICAL FIELD
+The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufacturing an electronic device, and an electronic device using the same. More specifically, the present invention relates to a",0.02181818181818182," TECHNICAL FIELD
The present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufacturing an electronic device, and an electronic device using the same. More specifically, the present invention relates to a ",0.08181818181818182,"e present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufac› turing an electronic device, and an electronic device using the same. More specifically, the present invention relates to",0.08181818181818182,"e present invention relates to a pattern forming method using a developer containing an organic solvent, which is suitably used in a super micro lithography process such as a manufacturing process of a super LSI or high capacity microchip or other photofabrication processes, an electron beam-sensitive or an extreme ultraviolet ray-sensitive resin composition, and a resist film, and a method for manufac› turing an electronic device, and an electronic device using the same. More specifically, the present invention relates to",116,patents
116,5,"BACKGROUND ART A micromachining by a lithography using a photoresist composition has been conducted in a conventional manu- facturing process of a semiconductor device such as an IC or LSI. Recently, an ultrafine pattern formation of a submicron region or a quarter micron region has been required, because",False,0.013071895424836602,"BACKGROUND ART
@@ -6769,11 +6465,11 @@ Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Compute
Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und
Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist;
-",0.033921302578018994,"
+",0.033921302578018994,"t.
**23.** Maschinenlesbares Medium, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; wenn",0.032564450474898234,"23.** Maschinenlesbares Medium, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
+Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; we",0.032564450474898234,"23.** Maschinenlesbares Medium, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; wenn da",0.16417910447761194,"m, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
@@ -6823,29 +6519,30 @@ détecter (402) un événement pour faire passer un circuit intégré d’un sys
détecter (402) un événement pour faire passer un circuit intégré d'un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de performan-",0.12449799196787148,"1. Procédé comportant les étapes consistant à :
détecter (402) un événement pour faire passer un circuit intégré d'un système informatique à un état de performances plus élevé, le circuit intégré ayant de multiples états de performan-",118,patents
-119,0,US 2019/0010119 Al,False,0.0,US 2019/0010119 Al,0.9444444444444444,preferably 10 mol ,0.1111111111111111, US 2019/0010119 A,0.1111111111111111,"
+119,0,US 2019/0010119 Al,False,0.0,US 2019/0010119 Al,0.9444444444444444,rably 10 mol % bas,0.1111111111111111, US 2019/0010119 A,0.1111111111111111,"
US 2019/0010119 A",0.0,US 2019/0010119 Al,0.8333333333333334,"e -->
[0144] As t",0.8333333333333334,"e -->
[0144] As t",119,patents
-119,1,40,False,0.0,40,0.5,4],0.0,40,0.0,40,0.0,40,1.0,14,1.0,14,119,patents
-119,2,"Jan. 10, 2019",False,0.0,"Jan. 10, 2019",0.9230769230769231,referably 10 ,0.0,"Jan. 10, 2019",0.0,"Jan. 10, 2019",0.0,"Jan. 10, 2019",0.8461538461538461,eferably 10 m,0.8461538461538461,eferably 10 m,119,patents
+119,1,40,False,0.0,40,0.5,80,0.0,40,0.0,40,0.0,40,1.0,14,1.0,14,119,patents
+119,2,"Jan. 10, 2019",False,0.0,"Jan. 10, 2019",0.8461538461538461,"hain.
+- Unit ",0.0,"Jan. 10, 2019",0.0,"Jan. 10, 2019",0.0,"Jan. 10, 2019",0.8461538461538461,eferably 10 m,0.8461538461538461,eferably 10 m,119,patents
119,3,"[0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!%.",False,0.0,"[0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!%.",0.024691358024691357,"0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mol %, more preferably 10 mol % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mol %, more preferably 60 mol %.",0.037037037037037035,"*[0144]** As the amount of the repeating unit BN2, the lower limit is preferably 5 mol %, more preferably 10 mol % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mol %, more preferably 60 mo",0.024691358024691357,"[0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mol %, more preferably 10 mol % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mol %, more preferably 60 mol %",0.01646090534979424,"[0144]** As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!",0.00823045267489712,"0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!%.",0.00823045267489712,"0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mo! %, more preferably 10 mo! % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mo! %, more preferably 60 mo!%.",119,patents
119,4,"[0145] When the inventive resist composition is a chemi- cally amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.",False,0.00473186119873817,"
-[0145] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.",0.012618296529968454,"[0145] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit B1 in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mol % or more, more preferably 70 mol % or more, and still more preferably 80 mol % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.
+[0145] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.",0.012618296529968454,"
-",0.012618296529968454,"[0145]** When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit B1 in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mol % or more, more preferably 70 mol % or more, and still more preferably 80 mol % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.",0.012618296529968454,"
+[0145] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit B1 in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mol % or more, more preferably 70 mol % or more, and still more preferably 80 mol % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.",0.012618296529968454,"[0145]** When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit B1 in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mol % or more, more preferably 70 mol % or more, and still more preferably 80 mol % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.",0.012618296529968454,"
[0145] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit B1 in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mol % or more, more preferably 70 mol % or more, and still more preferably 80 mol % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.
",0.006309148264984227,"[0145]** When the inventive resist composition is a chemically amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist composition.",0.06782334384858044,"n the inventive resist composition is a chemi› cally amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist c",0.06782334384858044,"n the inventive resist composition is a chemi› cally amplified negative resist composition, the component (B) preferably contains the repeating unit BN2, additionally at least one kind of a repeating unit selected from the repeating units B3 to B5 in addition to the repeating unit Bl in view of coexisting high etching durability and resolution. In this case, these repeating units are contained in an amount of 60 mo! % or more, more preferably 70 mo! % or more, and still more preferably 80 mo! % or more in the whole repeating units. This securely gives properties demanded for the inventive negative resist c",119,patents
119,5,"g p [0146] When the inventive resist composition is a chemi- cally amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustra- tive examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesive- ness to a substrate and the solubility without showing acidity.",False,0.0197869101978691,"ion.
[0146] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.
-",0.0258751902587519,"on.
+",0.0319634703196347,"[0146] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (b1) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.
-[0146] When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (b1) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.
+(b1)
-(b1",0.030441400304414,"*[0146]** When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (b1) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.
+Ch",0.030441400304414,"*[0146]** When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (b1) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.
$$
\t",0.030441400304414,"
@@ -6856,7 +6553,7 @@ $$
[",0.0228310502283105,"on.
**[0146]** When the inventive resist composition is a chemically amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustrative examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesiveness to a substrate and the solubility without showing acidity.",0.1141552511415525,"[0146] When the inventive resist composition is a chemi› cally amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustra› tive examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesive› ness to a substrate and the so",0.1141552511415525,"[0146] When the inventive resist composition is a chemi› cally amplified negative resist composition, the component (B) may contain a lactone structure, a (meth)acrylate ester unit having an adhesive group such as a hydroxy group other than the phenolic hydroxy group, and other repeating units in order to fine-tune the properties of a resist film. Illustra› tive examples of the (meth)acrylate ester unit having an adhesive group include the units shown by the following general formulae (bl) to (b3). These units can be used supplementary as a unit to control the unit to give adhesive› ness to a substrate and the so",119,patents
-120,0,EP 1 499 943 B1,False,0.0,EP 1 499 943 B1,0.8666666666666667,"s of claim 14, ",0.0,EP 1 499 943 B1,0.0,EP 1 499 943 B1,0.0,EP 1 499 943 B1,0.9333333333333333,"m.
+120,0,EP 1 499 943 B1,False,0.0,EP 1 499 943 B1,0.9333333333333333,"m of claim 23, ",0.0,EP 1 499 943 B1,0.0,EP 1 499 943 B1,0.0,EP 1 499 943 B1,0.9333333333333333,"m.
## 14. The ",0.9333333333333333,"m.
@@ -6901,7 +6598,7 @@ voltage regulation logic to change an operating voltage of the first integrated
Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als
-9",0.030985915492957747,"Patentansprüche
+9",0.04225352112676056,"tentansprüche**
## 1. Verfahren, umfassend:
@@ -6921,13 +6618,13 @@ Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Compute
Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance- Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher ",0.1267605633802817," 1. Verfahren, umfassend:
Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance- Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher ",120,patents
-121,0,US 2012/0003590 Al,False,0.0,US 2012/0003590 Al,0.9444444444444444,"
-- Monomer: A sulf",0.05555555555555555,US 2012/0003590 A1,0.05555555555555555,US 2012/0003590 A1,0.0,US 2012/0003590 Al,0.8333333333333334,"unit (B).
+121,0,US 2012/0003590 Al,False,0.0,US 2012/0003590 Al,1.0,"3^\ominus$ ).
+
+## (Photo-Acid Generato",0.8477508650519031,"s attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-",0.0726643598615917,"r Components>
**[0317]** The composition of the present invention may further contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an antioxidant, a solvent and the like. These components are described below.
-### (Photo-Acid Generator",0.09688581314878893,"ther Components>
+### (Photo-Acid Generator",0.06228373702422145,"her Components>
[0317] The composition of the present invention may further contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an anti-oxidant, a solvent and the like. These components are described below.
-(Photo-Acid Ge",0.05536332179930796,"her Components>
+(Photo-Acid Generato",0.05536332179930796,"her Components>
**[0317]** The composition of the present invention may further contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an antioxidant, a solvent and the like. These components are described below.
@@ -6961,25 +6653,19 @@ Chemical structures shown:
## (Photo-Acid Generator)",121,patents
121,5,[0318] The composition of the present invention may fur- ther contain a photo-acid generator in addition to the repeat- ing unit (A) and the repeating unit (B).,False,0.0375,"
-[0318] The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B).",0.84375,"ted sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated ",0.05,"*[0318]** The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B).
-",0.05,"s>
+[0318] The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B).",0.78125,"hed to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
+- Repeating unit: ",0.05,"*[0318]** The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B).
+",0.05,"
+[0318] The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B).
-[0318] The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B).",0.05,*[0318]** The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B). ,0.0125,[0318] The composition of the present invention may fur› ther contain a photo-acid generator in addition to the repeat› ing unit (A) and the repeating unit (B).,0.0125,[0318] The composition of the present invention may fur› ther contain a photo-acid generator in addition to the repeat› ing unit (A) and the repeating unit (B).,121,patents
+[",0.05,*[0318]** The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B). ,0.0125,[0318] The composition of the present invention may fur› ther contain a photo-acid generator in addition to the repeat› ing unit (A) and the repeating unit (B).,0.0125,[0318] The composition of the present invention may fur› ther contain a photo-acid generator in addition to the repeat› ing unit (A) and the repeating unit (B).,121,patents
121,6,"[0319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-dis- coloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",False,0.004335260115606936,"
-[0319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",0.8164739884393064,"
-
--continued
-
-Chemical structures shown:
-
-- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\te",0.005780346820809248,"[0319]** The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",0.005780346820809248,"
+[0319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",0.8410404624277457,"{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
+- Repeating unit: $(\text{CH}_2-\text{C})$ attached to a methyl group ( $\text{CH}_3$ ), which is attached to a carbonyl group ( $\text{C}(\text{O})$ ), which is attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\tex",0.005780346820809248,"[0319]** The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",0.005780346820809248,"
[0319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",0.005780346820809248,"[0319]** The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).",0.01878612716763006,"319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-dis› coloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazometha",0.01878612716763006,"319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-dis› coloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazometha",121,patents
-121,7,"[0320] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII):",False,0.007518796992481203,"[0320] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and(ZIII):",0.849624060150376,"t{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( ",0.03007518796992481,"0320]** Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII)",0.0,"[0320] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII):",0.09022556390977443," Preferred examples of the photo-acid generator include compounds represented by the following formulae **(ZI), (ZII)** and **(ZIII):",0.09022556390977443,"] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII)",0.09022556390977443,"] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII)",121,patents
-121,8,P-55,False,0.25,P-54,1.0,"
-
--",0.0,P-55,0.0,P-55,0.75,"
+121,7,"[0320] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII):",False,0.007518796992481203,"[0320] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and(ZIII):",0.8421052631578947,"O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\",0.03007518796992481,"0320]** Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII)",0.0,"[0320] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII):",0.09022556390977443," Preferred examples of the photo-acid generator include compounds represented by the following formulae **(ZI), (ZII)** and **(ZIII):",0.09022556390977443,"] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII)",0.09022556390977443,"] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII)",121,patents
+121,8,P-55,False,0.25,P-54,0.25,P-54,0.0,P-55,0.0,P-55,0.75,"
-co",0.25,P-54,0.25,P-54,121,patents
122,0,EP 3 800 018 A1,False,0.0,EP 3 800 018 A1,0.0,EP 3 800 018 A1,0.0,EP 3 800 018 A1,0.0,EP 3 800 018 A1,0.0,EP 3 800 018 A1,0.0,EP 3 800 018 A1,0.0,EP 3 800 018 A1,122,patents
122,1,EUROPÄISCHE PATENTANMELDUNG,False,0.0,EUROPÄISCHE PATENTANMELDUNG,0.0,EUROPÄISCHE PATENTANMELDUNG,0.0,EUROPÄISCHE PATENTANMELDUNG,0.0,EUROPÄISCHE PATENTANMELDUNG,0.0,EUROPÄISCHE PATENTANMELDUNG,0.0,EUROPÄISCHE PATENTANMELDUNG,0.0,EUROPÄISCHE PATENTANMELDUNG,122,patents
@@ -6987,17 +6673,17 @@ Chemical structures shown:
07.04.2021 Patentblatt 2021/14",0.05263157894736842,"(43) Veröffentlichungstag:
07.04.2021 Patentblatt 2021/1",0.08771929824561403,"43) Veröffentlichungstag:**
-07.04.2021 Patentblatt 2021/1",0.07017543859649122,(43) Veröffentlichungstag: **07.04.2021 Patentblatt 2021/,0.07017543859649122,(43) Veröffentlichungstag: **07.04.2021 Patentblatt 2021/,0.10526315789473684,"(43)
+07.04.2021 Patentblatt 2021/1",0.07017543859649122,43) Veröffentlichungstag: **07.04.2021 Patentblatt 2021/1,0.07017543859649122,(43) Veröffentlichungstag: **07.04.2021 Patentblatt 2021/,0.10526315789473684,"(43)
- Veröffentlichungstag: 07.04.2021 Patentblatt 2021",0.10526315789473684,"(43)
- Veröffentlichungstag: 07.04.2021 Patentblatt 2021",122,patents
-122,3,(21) Anmeldenummer: 19200966.0,False,0.0,(21) Anmeldenummer: 19200966.0,0.0,(21) Anmeldenummer: 19200966.0,0.13333333333333333,21) Anmeldenummer:** 19200966.,0.13333333333333333,(21) Anmeldenummer: **19200966,0.13333333333333333,21) Anmeldenummer: **19200966.,0.13333333333333333,")
+122,3,(21) Anmeldenummer: 19200966.0,False,0.0,(21) Anmeldenummer: 19200966.0,0.0,(21) Anmeldenummer: 19200966.0,0.13333333333333333,21) Anmeldenummer:** 19200966.,0.13333333333333333,21) Anmeldenummer: **19200966.,0.13333333333333333,21) Anmeldenummer: **19200966.,0.13333333333333333,")
- Anmeldenummer: 19200966.0",0.13333333333333333,")
- Anmeldenummer: 19200966.0",122,patents
-122,4,(22) Anmeldetag: 02.10.2019,False,0.0,(22) Anmeldetag: 02.10.2019,0.0,(22) Anmeldetag: 02.10.2019,0.14814814814814814,22) Anmeldetag:** 02.10.201,0.14814814814814814,2) Anmeldetag: **02.10.2019,0.14814814814814814,(22) Anmeldetag: **02.10.20,0.0,(22) Anmeldetag: 02.10.2019,0.0,(22) Anmeldetag: 02.10.2019,122,patents
+122,4,(22) Anmeldetag: 02.10.2019,False,0.0,(22) Anmeldetag: 02.10.2019,0.0,(22) Anmeldetag: 02.10.2019,0.14814814814814814,22) Anmeldetag:** 02.10.201,0.14814814814814814,(22) Anmeldetag: **02.10.20,0.14814814814814814,(22) Anmeldetag: **02.10.20,0.0,(22) Anmeldetag: 02.10.2019,0.0,(22) Anmeldetag: 02.10.2019,122,patents
122,5,(51) Int Cl.: B26D 1/16 (2006.01) (2006 01),False,0.3953488372093023," Int Cl.: Cl.:
B26D 1/16 (2006.01)
B26D 5/0",0.2558139534883721,"
@@ -7007,8 +6693,9 @@ B26D 1/16 (2006.01)
B26D 1",0.23255813953488372,"(51) Int Cl.:**
B26D 1/16 (2006.01)
-B26D 1/",0.20930232558139536,"
-(51) Int Cl.: **B26D 1/16 (2006.01) B26D 1",0.46511627906976744,"(51) Int Cl.:
+B26D 1/",0.23255813953488372,"
+(51) Int Cl.:
+**B26D 1/16 (2006.01) B26D 1",0.46511627906976744,"(51) Int Cl.:
|**_B26D 1/16 _**|**_(2006.",0.20930232558139536,"(51) Int Cl.:
@@ -7033,7 +6720,12 @@ AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT
**Benannte Erstreckungsstaaten:**
BA ME
-**Benannte Validierungsstaaten:**",0.09009009009009009,nte Vertragsstaaten: **AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR** Benannte Erstreckungsstaaten: **BA ME** Benannte Validierungsstaaten: **KH MA MD TN,0.13513513513513514,") Benannte Vertragsstaaten:
+**Benannte Validierungsstaaten:**",0.11261261261261261,"nnte Vertragsstaaten:
+**AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR**
+Benannte Erstreckungsstaaten:
+**BA ME**
+Benannte Validierungsstaaten:
+**KH MA MD T",0.13513513513513514,") Benannte Vertragsstaaten:
- **AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR** Benannte Erstreckungsstaaten: **BA ME** Benannte Validierungsstaaten:",0.06756756756756757,") Benannte Vertragsstaaten:
@@ -7065,7 +6757,8 @@ GmbH & Co. KG
51491 Overath (DE",0.17721518987341772,"1) Anmelder:**
**Dienes Werke für Maschinenteile GmbH & Co. KG**
-51491 Overath ",0.05063291139240506,(71) Anmelder: **Dienes Werke für Maschinenteile GmbH & Co. KG 51491 Overath (D,0.05063291139240506,71) Anmelder: **Dienes Werke für Maschinenteile GmbH & Co. KG 51491 Overath (DE,0.17721518987341772,"Anmelder: Dienes Werke für Maschinenteile
+51491 Overath ",0.06329113924050633,"(71) Anmelder: **Dienes Werke für Maschinenteile GmbH & Co. KG
+51491 Overath (D",0.05063291139240506,71) Anmelder: **Dienes Werke für Maschinenteile GmbH & Co. KG 51491 Overath (DE,0.17721518987341772,"Anmelder: Dienes Werke für Maschinenteile
GmbH & Co. KG
@@ -7079,14 +6772,15 @@ GmbH & Co. KG
• Thielen, Rolf
50733 Köln (DE)
-#",0.13043478260869565,"72) Erfinder:
+#",0.13043478260869565,"(72) Erfinder:
• Thielen, Rolf
-50733 Köln (DE",0.5434782608695652,"finder:**
+50733 Köln (D",0.5434782608695652,"finder:**
* **Thielen, Rolf**
- 50733 Köln",0.13043478260869565,"(72) Erfinder:
-* **Thielen, Rolf 50733 Köln (D",0.08695652173913043,"2) Erfinder: **• Thielen, Rolf 50733 Köln (DE)",0.08695652173913043,"(72) Erfinder:
+ 50733 Köln",0.13043478260869565,"72) Erfinder:
+• **Thielen, Rolf
+50733 Köln (DE",0.08695652173913043,"2) Erfinder: **• Thielen, Rolf 50733 Köln (DE)",0.08695652173913043,"(72) Erfinder:
- Thielen, Rolf 50733 Köln (DE",0.08695652173913043,"(72) Erfinder:
@@ -7094,21 +6788,22 @@ GmbH & Co. KG
122,9,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,False,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.08888888888888889,4) **SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.08888888888888889,54) **SENSORVORRICHTUNG FÜR EINEN MESSERHALTE,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,0.0,(54) SENSORVORRICHTUNG FÜR EINEN MESSERHALTER,122,patents
122,10,"(57) Die vorliegende Erfindung betrifft eine Sensor- vorrichtung (4) für einen Messerhalter (1), umfassend - einen Grundkörper (6) zur Befestigung der Sensorvor- richtung (4) an einem Messerhalter (1), - mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und - einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) er- fassten Größe.",False,0.021479713603818614,"(57) Die vorliegende Erfindung betrifft eine Sensorvorrichtung (4) für einen Messerhalter (1), umfassend - einen Grundkörper (6) zur Befestigung der Sensorvorrichtung (4) an einem Messerhalter (1), - mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und - einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) erfassten Größe.
-T",0.028639618138424822,"ER
+T",0.028639618138424822,"R
(57) Die vorliegende Erfindung betrifft eine Sensorvorrichtung (4) für einen Messerhalter (1), umfassend - einen Grundkörper (6) zur Befestigung der Sensorvorrichtung (4) an einem Messerhalter (1), - mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und - einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) erfassten Größe.
-",0.050119331742243436,"57)** Die vorliegende Erfindung betrifft eine Sensorvorrichtung (4) für einen Messerhalter (1), umfassend
+!",0.050119331742243436,"57)** Die vorliegende Erfindung betrifft eine Sensorvorrichtung (4) für einen Messerhalter (1), umfassend
* einen Grundkörper (6) zur Befestigung der Sensorvorrichtung (4) an einem Messerhalter (1),
* mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und
-* einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) erfassten Größ",0.03579952267303103,"R**
+* einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) erfassten Größ",0.03579952267303103,"*
(57) Die vorliegende Erfindung betrifft eine Sensorvorrichtung (4) für einen Messerhalter (1), umfassend
- einen Grundkörper (6) zur Befestigung der Sensorvorrichtung (4) an einem Messerhalter (1),
- mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und
- einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) erfassten Größe.
-",0.028639618138424822,"(57) Die vorliegende Erfindung betrifft eine Sensorvorrichtung (4) für einen Messerhalter (1), umfassend - einen Grundkörper (6) zur Befestigung der Sensorvorrichtung (4) an einem Messerhalter (1),
+
+[",0.028639618138424822,"(57) Die vorliegende Erfindung betrifft eine Sensorvorrichtung (4) für einen Messerhalter (1), umfassend - einen Grundkörper (6) zur Befestigung der Sensorvorrichtung (4) an einem Messerhalter (1),
- mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und - einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) erfassten Größe.
@@ -7254,7 +6949,7 @@ $p_1$ represents from 1 to 3.
As the cyclic hydrocarbon group represented by $Fb$, a cyclopentyl group, a cyclohexyl group, or a norbornyl group is preferred.
-The specific examples of the repeating units having the structure represented by formula (F1) are shown below",0.03044496487119438,"In formula (F2), Rx represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exemplified.
+The specific examples of the repeating units having the structure represented by formula (F1) are shown below",0.07962529274004684,"mula (F2), Rx represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exemplified.
Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
@@ -7262,13 +6957,13 @@ Fb represents a monocyclic or polycyclic hydrocarbon group.
Fc represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group.
-F1 represents a group represented by formula (F1).
+F1 represents a group represented by formula (F1).
-P1 represents from 1 to 3.
+P1 represents from 1 to 3.
As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbornyl group is preferred.
-The specific examples of the repeating units having the structure represented by formula (F1) are shown be",0.03747072599531616,"rmula (F2), Rx represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exemplified.
+The specific examples of the repeating units having the structure represented by formula (",0.03747072599531616,"rmula (F2), Rx represents a hydrogen atom, a halogen atom, or an alkyl group having from 1 to 4 carbon atoms. As preferred substituents that the alkyl group represented by Rx may have, a hydroxyl group and a halogen atom are exemplified.
Fa represents a single bond or a straight chain or branched alkylene group, and preferably a single bond.
@@ -7339,8 +7034,6 @@ By containing such various repeating structural units, fine adjustment of perfor
As these repeating structural units, the repeating structural units corresponding to the monomers shown below can be exemplified, but the invention is not restricted thereto.
By containing such various repeating structural units, fine adjustment of performances required of the alicyclic hyd",125,patents
-125,3,67 68,False,0.4,## 68,0.8, to 6,0.8,o 60 ,0.6,"# 68
-",0.6,67** ,0.8,o 65 ,0.8,o 65 ,125,patents
126,0,c12) United States Patent Kawanishi et al.,False,0.19047619047619047," United States Patent
# Kawanishi et al.
@@ -7354,30 +7047,6 @@ By containing such various repeating structural units, fine adjustment of perfor
Kawanishi et al.",0.07142857142857142,"12) United States Patent
Kawanishi et al.",126,patents
-126,1,11111 111111111111111 111 US007851130B2,False,0.6666666666666666,US007851130B2,0.7692307692307693,"10) **Patent No.:** **US 7,851,130 B2**",0.7435897435897436,"*
-
-**(10) Patent No.:** US 7,851,130 B2",0.6666666666666666,"
-
-```
-US007851130B2",0.7692307692307693,"onally omitted <==**
-
-US007851130B2
-
-#",0.7435897435897436,"
-1480078 Al
-
-5/2004
-
-US007851130B2
-
-201, R202, and R203 each independently represent an organic group.
-[0295] The number of carbon atoms of the organic group as each of R201, ",0.16216216216216217," In General Formula **(ZI),**
+
+[0295] The number of carbon atoms of the organic group as each of R201(incl. ethane)
PJ | Crude oil
mmbbl | Condensate
mmbbl | LPG
000
tonnes | Total
mmboe |
|----------------------------------|-----------------------------------|--------------------|---------------------|----------------------|----------------|
@@ -11,7 +11,7 @@
| Revisions | 126 | -21 | 3 | -45 | 3 |
| Estimated reserves year end 2004 | 2,873 | 74 | 49 | 3,523 | 643 |
-## PROVEN PLUS PROBABLE RESERVES (SANTOS SHARE) YEAR END 2004 BY AREA (mmboe)
+# PROVEN PLUS PROBABLE RESERVES (SANTOS SHARE) YEAR END 2004 BY AREA (mmboe)
| Area | Sales gas
(incl. ethane)
PJ | Crude oil
mmbbl | Condensate
mmbbl | LPG
000
tonnes | Total
mmboe |
|-----------------------------|-----------------------------------|--------------------|---------------------|----------------------|----------------|
@@ -46,12 +46,8 @@ Geologists (AAPG). The definitions used are consistent with the requirements of
Reserves are defined as those quantities of petroleum which are anticipated to be commercially recovered from known accumulations from a given date
-### forward. Santos reports reserves
+forward. Santos reports reserves net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules.
-net of the gas required for processing and transportation to the customer. Reserves reported are based on, and accurately reflect, information compiled by full-time employees of the Company who have the requisite qualifications and experience prescribed by the ASX Listing Rules.
-
-## EXTERNALLY REVIEWED
-
-## BOOKING PROCESS
+## EXTERNALLY REVIEWED BOOKING PROCESS
Santos' reserves processes and procedures were reviewed by independent expert, Gaffney, Cline & Associates, and found to be 'appropriate to providing robust estimates of Santos' reserve position in accordance with international industry practice'.
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_107.md b/datalab_results/markdowns/page_107.md
index 50b98ff..5c89452 100644
--- a/datalab_results/markdowns/page_107.md
+++ b/datalab_results/markdowns/page_107.md
@@ -16,60 +16,16 @@ To support continued innovation throughout the company, we made significant inve
-Bar chart showing net sales (in Billions \$) from 2000 to 2004. The highest value is \$4.8 in 2004.
-
-| Year | Net Sales (Billions \$) |
-|------|-------------------------|
-| 00 | 3.2 |
-| 01 | 3.5 |
-| 02 | 3.5 |
-| 03 | 3.8 |
-| 04 | 4.8 |
-
-net sales
-(Billions \$) CAGR 8.3%
+Bar chart showing net sales (in Billions \$) from 2000 to 2004. The Y-axis ranges from 0 to 4. The sales figures are: 2000: 3.2, 2001: 3.5, 2002: 3.6, 2003: 3.8, 2004: 4.8. The chart is labeled "net sales (Billions \$) CAGR 8.3%".
-Bar chart showing net earnings (in Millions \$) from 2000 to 2004. The highest value is \$231.7 in 2004.
-
-| Year | Net Earnings (Millions \$) |
-|------|----------------------------|
-| 00 | 160 |
-| 01 | 170 |
-| 02 | 180 |
-| 03 | 170 |
-| 04 | 231.7 |
-
-net earnings
-(Millions \$) CAGR 8.0%
+Bar chart showing net earnings (in Millions \$) from 2000 to 2004. The Y-axis ranges from 0 to 200. The earnings figures are: 2000: 160, 2001: 170, 2002: 180, 2003: 175, 2004: 231.7. The chart is labeled "net earnings (Millions \$) CAGR 8.0%".
-Bar chart showing net earnings per share (in Dollars) from 2000 to 2004. The highest value is \$1.65 in 2004.
-
-| Year | Net Earnings per Share (Dollars) |
-|------|----------------------------------|
-| 00 | 1.05 |
-| 01 | 1.15 |
-| 02 | 1.20 |
-| 03 | 1.15 |
-| 04 | 1.65 |
-
-net earnings per share
-(Dollars) CAGR 8.3%
+Bar chart showing net earnings per share (in Dollars) from 2000 to 2004. The Y-axis ranges from 0.00 to 1.40. The earnings per share figures are: 2000: 1.05, 2001: 1.15, 2002: 1.20, 2003: 1.15, 2004: 1.65. The chart is labeled "net earnings per share (Dollars) CAGR 8.3%".
-Bar chart showing annual dividend (in Dollars) from 2000 to 2004. The highest value is \$0.45 in 2004.
-
-| Year | Annual Dividend (Dollars) |
-|------|---------------------------|
-| 00 | 0.30 |
-| 01 | 0.35 |
-| 02 | 0.40 |
-| 03 | 0.40 |
-| 04 | 0.45 |
-
-annual dividend
-(Dollars) CAGR 6.5%
\ No newline at end of file
+Bar chart showing annual dividend (in Dollars) from 2000 to 2004. The Y-axis ranges from 0.00 to 0.40. The dividend figures are: 2000: 0.30, 2001: 0.35, 2002: 0.35, 2003: 0.40, 2004: 0.45. The chart is labeled "annual dividend (Dollars) CAGR 6.5%".
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_109.md b/datalab_results/markdowns/page_109.md
index 8ac05c9..87fd134 100644
--- a/datalab_results/markdowns/page_109.md
+++ b/datalab_results/markdowns/page_109.md
@@ -6,8 +6,7 @@ Barcode image
US009423690B2
-(12) **United States Patent**
-**Takizawa et al.**
+# (12) **United States Patent** **Takizawa et al.**
(10) **Patent No.:** **US 9,423,690 B2**
(45) **Date of Patent:** **Aug. 23, 2016**
@@ -34,7 +33,7 @@ US 2015/0168834 A1 Jun. 18, 2015
(63) Continuation of application No.
PCT/JP2013/072485, filed on Aug. 16, 2013.
-## **Foreign Application Priority Data**
+### **Foreign Application Priority Data**
Aug. 20, 2012 (JP) .................... 2012-181892
Mar. 15, 2013 (JP) .................... 2013-054401
@@ -75,7 +74,7 @@ See application file for complete search history.
### **U.S. PATENT DOCUMENTS**
8,252,504 B2\* 8/2012 Harada et al. ........ 430/270.1
-8,426,115 B2\* 4/2013 Hatakeyama et al. ....... 430/312
+8,426,115 B2\* 4/2013 Hatakeyama et al. ........ 430/312
(Continued)
@@ -102,10 +101,10 @@ There is provided a pattern forming method, including: (a) forming a film by usi
(1-0)
-$$\begin{array}{c} \text{*} \\ | \\ \text{R}_a \\ | \\ \text{L}_1 \\ | \\ \text{O} \\ | \\ \text{O} \\ | \\ \text{R}_1 \\ | \\ \text{R}_2 \\ | \\ \text{R}_{11} \\ | \\ \text{R}_{12} \\ | \\ \text{R}_{13} \end{array}$$
+$$\begin{array}{c} \text{R}_a \\ \text{C} \\ \text{L}_1 \\ \text{O} \\ \text{C} \\ \text{O} \\ \text{R}_1 \\ \text{R}_2 \\ \text{R}_{11} \\ \text{R}_{12} \\ \text{R}_{13} \end{array}$$
(1-2)
-$$\begin{array}{c} \text{*} \\ | \\ \text{R}_b \\ | \\ \text{L}_2 \\ | \\ \text{C}_6\text{H}_4 \\ | \\ (\text{R}_3\text{R}_2) \\ | \\ (\text{OH})\text{R}_1 \end{array}$$
+$$\begin{array}{c} \text{R}_b \\ \text{C} \\ \text{L}_2 \\ \text{C}_6\text{H}_4 \\ (\text{R}_3\text{R}_2) \\ (\text{OH})\text{R}_1 \end{array}$$
**14 Claims, No Drawings**
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_111.md b/datalab_results/markdowns/page_111.md
index c68f6e8..053afd7 100644
--- a/datalab_results/markdowns/page_111.md
+++ b/datalab_results/markdowns/page_111.md
@@ -12,7 +12,7 @@ The repeating unit having a cyclic carbonate ester structure is preferably the r
$R_A^1$
-[Chemical structure of Formula (A-1): A repeating unit showing a carbonate group attached to a polymer backbone via $R_A^1$ , linked to a cyclic carbonate ester structure (labeled A) via a divalent linking group Z, which is substituted with $(R_A^2)_n$ .]
+[Chemical structure of Formula (A-1): A repeating unit showing a carbonate group attached to a polymer backbone via $R_A^1$ , linked to a cyclic carbonate ester structure (labeled A) via a divalent group Z, which is substituted with $(R_A^2)_n$ .]
(A-1) 25
@@ -34,9 +34,9 @@ The substituent represented by $R_A^2$ is, for example, an alkyl group, a cycl
$n$ represents the number of substituents, and is an integer of 0 or more. For example, $n$ is preferably 0 to 4, and more preferably 0.
-Examples of the divalent linking group represented by A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond,
+Examples of the a divalent linking group represented by A may include an alkylene group, a cycloalkylene group, an ester bond, an amide bond, an ether bond, an urethane bond,
-an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, a propylene group, and the like.
+an urea bond, or combination thereof. Examples of the alkylene group may include preferably an alkylene group having 1 to 10 carbon atoms, more preferably an alkylene group having 1 to 5 carbon atoms, and for example a methylene group, an ethylene group, an propylene group, and the like.
In one aspect of the present invention, A is preferably a single bond, or an alkylene group.
@@ -46,7 +46,7 @@ The polycyclic group containing $\text{O}—\text{C}(=\text{O})—\text{O}—$
(a)
-[Chemical structure of Formula (a): A monocyclic carbonate ester structure, a 5-membered ring containing two oxygen atoms and one carbonyl group, with the carbonyl group double-bonded to one oxygen and single-bonded to the other oxygen, which is also bonded to the ring. The ring is labeled $n_A$ .]
+[Chemical structure of Formula (a): A monocyclic carbonate ester structure, a 5-membered ring containing two oxygen atoms and a carbonyl group, with the ring size indicated by $n_A$ .]
The monomer corresponding to the repeating unit represented by Formula (A-1) may be synthesized by a conventionally known method described in, for example, Tetrahedron Letters, Vol. 27, No. 32 p. 3741(1986), Organic Letters, Vol. 4, No. 15 p. 2561(2002), and the like.
@@ -56,4 +56,4 @@ Hereinafter, specific examples of the repeating unit having a cyclic carbonate e
In addition, $R_A^1$ in the following specific examples has the same meaning as $R_A^1$ in Formula (A-1).
-[Chemical structures showing two specific examples of repeating units having a cyclic carbonate ester structure. Both structures feature a carbonate group attached to a polymer backbone via $R_A^1$ , linked to a cyclic carbonate ester structure (a 5-membered ring containing two oxygen atoms and one carbonyl group). The first example shows the cyclic carbonate ester attached directly to the backbone. The second example shows the cyclic carbonate ester attached via a divalent linking group.]
\ No newline at end of file
+[Chemical structures showing two specific examples of repeating units having a cyclic carbonate ester structure, both featuring a trifluoromethyl group ( $R_A^1$ ) attached to the polymer backbone.]
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_112.md b/datalab_results/markdowns/page_112.md
index a754ed3..5db44e0 100644
--- a/datalab_results/markdowns/page_112.md
+++ b/datalab_results/markdowns/page_112.md
@@ -16,13 +16,13 @@
[0487] In the development step, an alkali developer is usually used.
-[0488] Examples of the alkali developer include an alkaline aqueous solution containing inorganic alkalis such as sodium hydroxide, potassium hydroxide, sodium carbonate, sodium silicate, sodium metasilicate and aqueous ammonia, primary amines such as ethylamine and n-propylamine, secondary amines such as diethylamine and di-n-butylamine, tertiary amines such as triethylamine and methyl-diethylamine, alcohol amines such as dimethylethanamine and triethanolamine, quaternary ammonium salts such as tetramethylammonium hydroxide and tetrabutylammonium hydroxide, or cyclic amines such as pyrrole and piperidine.
+[0488] Examples of the alkali developer include an alkaline aqueous solution containing inorganic alkalis such as sodium hydroxide, potassium hydroxide, sodium carbonate, sodium silicate, sodium metasilicate and aqueous ammonia, primary amines such as ethylamine and n-propylamine, secondary amines such as diethylamine and di-n-butylamine, tertiary amines such as triethylamine and methyl-diethylamine, alcohol amines such as dimethylethanamine and triethanolamine, quaternary ammonium salts such as tetramethylammonium hydroxide and tetraethylammonium hydroxide, or cyclic amines such as pyrrole and piperidine.
[0489] In the alkali developer, alcohols and a surfactant may be added in an appropriate amount.
[0490] The concentration of the alkali developer is usually from 0.1 to 20 mass %. The pH of the alkali developer is usually from 10.0 to 15.0.
-[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008-162101, and "Yoshihiko Hirai (compiler), *Nanoimprint no Kiso to Gijutsu Kaihatsu*•*Oyo Tenkai*-*Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai* (*Basic and Technology Expansion*•*Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion*), Frontier Shuppan".
+[0491] Also, an imprint mold may be produced using the composition of the present invention. For details, please refer to, for example, Japanese Patent 4,109,085, JP-A-2008-162101, and "Yoshihiko Hirai (compiler), *Nanoimprint no Kiso to Gijutsu Kaihatsu*•*Oyo Tenkai-Nanoimprint no Kiban Gijutsu to Saishin no Gijutsu Tenkai* (Basic and Technology Expansion•Application Development of Nanoimprint-Substrate Technology of Nanoimprint and Latest Technology Expansion), Frontier Shuppan".
# EXAMPLES
@@ -40,6 +40,4 @@
Chemical reaction scheme showing the synthesis of Resin P-14:
-Structure (5) (a substituted benzene derivative) reacts to form Structure (6) (a substituted benzene derivative with an OH group). Structure (6) then reacts to form Structure (7) (a substituted benzene derivative with a sulfone group and a sulfonate group). Structure (7) finally reacts to form Structure (8) (a substituted benzene derivative with a sulfone group and a sulfonate group).
-
-Labels (5), (6), (7), and (8) are placed below the corresponding structures.
\ No newline at end of file
+Structure (5) (a substituted benzene derivative) reacts to form Structure (6) (a substituted benzene derivative with an OH group). Structure (6) then reacts to form Structure (7) (a substituted benzene derivative with a sulfone group and a trifluoromethylsulfonate group). Structure (7) finally reacts to form Structure (8) (a substituted benzene derivative with a sulfone group and a sodium trifluoromethylsulfonate group).
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_113.md b/datalab_results/markdowns/page_113.md
index 92319e0..6fb7efe 100644
--- a/datalab_results/markdowns/page_113.md
+++ b/datalab_results/markdowns/page_113.md
@@ -2,7 +2,7 @@
Polyacrolein thus obtained (20 g), ethane-1,2-diol (150 g), toluene-p-sulfonic acid (1 g) and benzene (200 g) were placed in a 1000-ml round-bottomed flask, and the reaction was performed under reflux with a Dean and Stark water separator attached to the flask, until no more water was generated. After the reaction was completed, the product was precipitated from distilled water, to obtain pure compound represented by following Chemical Formula 6a (yield: 45%).
-![Chemical Formula 6a: A polymer segment derived from 2-vinyl-1,3-dioxolane, showing a repeating unit with a vinyl group attached to the dioxolane ring.]()
+![Chemical Formula 6a: A polymer segment showing a repeating unit derived from 2-vinyl-1,3-dioxolane, substituted with a propyl group (a) and a hydroxymethyl group (b).]()
@@ -12,7 +12,7 @@ As the reaction catalyst, an acid such as trifluoromethanesulfonic acid, hydroch
The procedure according to Example 1 was repeated but using propane-1,2-diol (20 g) instead of ethane-1,2-diol, to obtain the compound represented by Chemical Formula 7a (yield: 45%).
-![Chemical Formula 7a: A polymer segment derived from 2-vinyl-1,3-dioxolane, showing a repeating unit with a vinyl group attached to the dioxolane ring.]()
+![Chemical Formula 7a: A polymer segment showing a repeating unit derived from 2-vinyl-1,3-dioxolane, substituted with a propyl group (a) and a hydroxymethyl group (b).]()
@@ -24,7 +24,7 @@ In a 100 ml flask, 2-vinyl-1,3-dioxolane (0.1 mole) of Chemical Formula 1a, acry
-![Chemical Formula 6: A polymer segment derived from 2-vinyl-1,3-dioxolane and acrylic acid, showing a repeating unit with a vinyl group attached to the dioxolane ring and a carboxylic acid group.]()
+![Chemical Formula 6: A polymer segment showing a repeating unit derived from 2-vinyl-1,3-dioxolane, substituted with a propyl group (a) and a hydroxymethyl group (b).]()
@@ -38,7 +38,7 @@ lb instead of 2-vinyl-1,3-dioxolane of Chemical Formula 1a, to obtain the compou
-![Chemical Formula 7: A polymer segment derived from 2-vinyl-1,3-dioxane and acrylic acid, showing a repeating unit with a vinyl group attached to the dioxane ring and a carboxylic acid group.]()
+![Chemical Formula 7: A polymer segment showing a repeating unit derived from 2-vinyl-1,3-dioxane, substituted with a propyl group (a) and a hydroxymethyl group (b).]()
@@ -48,14 +48,22 @@ In a 250-ml flask, 2-vinyl-1,3-dioxolane (0.3 mole) of Chemical Formula 1a, male
As a polymerization initiator, conventional radical polymerization initiators such as lauryl peroxide may be used instead of AIBN (yield: 40%).
-![Chemical Formula 8: A polymer segment derived from 2-vinyl-1,3-dioxolane and maleic anhydride, showing a repeating unit with a vinyl group attached to the dioxolane ring and an anhydride ring.]()
+![Chemical Formula 8: A polymer segment showing a repeating unit derived from 2-vinyl-1,3-dioxolane, substituted with a propyl group (a) and a maleic anhydride group (b).]()
40
+45
+
# EXAMPLE 6
The procedure according to Example 5 was repeated but using 2-vinyl-1,3-dioxane (0.3 mole) of Chemical Formula lb instead of 2-vinyl-1,3-dioxolane of Chemical Formula 1a, to obtain the compound represented by Chemical Formula 9 (yield: 42%).
-![Chemical Formula 9: A polymer segment derived from 2-vinyl-1,3-dioxane and maleic anhydride, showing a repeating unit with a vinyl group attached to the dioxane ring and an anhydride ring.]()
+![Chemical Formula 9: A polymer segment showing a repeating unit derived from 2-vinyl-1,3-dioxane, substituted with a propyl group (a) and a maleic anhydride group (b).]()
+
+
+
+55
+
+60
-
\ No newline at end of file
+65
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_119.md b/datalab_results/markdowns/page_119.md
index bf0befc..f4e818c 100644
--- a/datalab_results/markdowns/page_119.md
+++ b/datalab_results/markdowns/page_119.md
@@ -2,11 +2,22 @@
-continued
-Chemical structures illustrating repeating units (B) and (B1) for the inventive resist composition. The structures show various combinations of a repeating unit (B) and a repeating unit (B1) linked by an ether bond, featuring a phenyl group, a cyclohexyl group, and a hydroxyl group.
+Chemical structures illustrating repeating units (B) and (B'):
+
+- Unit (B): A repeating unit featuring a central carbon atom bonded to a phenyl group, a carboxylic acid group, and a hydroxyl group. The hydroxyl group is attached to a branched alkyl chain.
+- Unit (B'): A repeating unit featuring a central carbon atom bonded to a phenyl group, a carboxylic acid group, and a hydroxyl group. The hydroxyl group is attached to a straight alkyl chain.
+- Unit (B''): A repeating unit featuring a central carbon atom bonded to a phenyl group, a carboxylic acid group, and a hydroxyl group. The hydroxyl group is attached to a branched alkyl chain.
+- Unit (B'''): A repeating unit featuring a central carbon atom bonded to a phenyl group, a carboxylic acid group, and a hydroxyl group. The hydroxyl group is attached to a branched alkyl chain.
+- Unit (B'''''): A repeating unit featuring a central carbon atom bonded to a phenyl group, a carboxylic acid group, and a hydroxyl group. The hydroxyl group is attached to a branched alkyl chain.
+- Unit (B''): A repeating unit featuring a central carbon atom bonded to a phenyl group, a carboxylic acid group, and a hydroxyl group. The hydroxyl group is attached to a branched alkyl chain.
+- Unit (B''): A repeating unit featuring a central carbon atom bonded to a phenyl group, a carboxylic acid group, and a hydroxyl group. The hydroxyl group is attached to a branched alkyl chain.
-continued
-Chemical structures illustrating repeating units (B) and (B1) for the inventive resist composition. The structures show various combinations of a repeating unit (B) and a repeating unit (B1) linked by an ether bond, featuring a phenyl group, a cyclohexyl group, and a hydroxyl group.
+Chemical structures illustrating repeating units (B) and (B'):
+
+- Unit (B): A repeating unit featuring a central carbon atom bonded to a phenyl group, a carboxylic acid group, and a hydroxyl group. The hydroxyl group is attached to a branched alkyl chain.
+- Unit (B'): A repeating unit featuring a central carbon atom bonded to a phenyl group, a carboxylic acid group, and a hydroxyl group. The hydroxyl group is attached to a branched alkyl chain.
[0144] As the amount of the repeating unit BN2, the lower limit is preferably 5 mol %, more preferably 10 mol % based on the whole repeating units constituting the component (B). The upper limit is preferably 70 mol %, more preferably 60 mol %.
@@ -16,8 +27,8 @@ Chemical structures illustrating repeating units (B) and (B1) for the inventive
(b1)
-Chemical structure (b1): A (meth)acrylate ester unit featuring a cyclohexene ring substituted with a hydroxyl group ( $G^1$ ).
+Chemical structure (b1): A repeating unit featuring a central carbon atom bonded to a phenyl group, a carboxylic acid group, and a hydroxyl group. The hydroxyl group is attached to a branched alkyl chain.
(b2)
-Chemical structure (b2): A (meth)acrylate ester unit featuring a substituted cyclohexene ring substituted with a hydroxyl group ( $G^2$ ).
\ No newline at end of file
+Chemical structure (b2): A repeating unit featuring a central carbon atom bonded to a phenyl group, a carboxylic acid group, and a hydroxyl group. The hydroxyl group is attached to a branched alkyl chain.
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_120.md b/datalab_results/markdowns/page_120.md
index 1776ba3..69a547e 100644
--- a/datalab_results/markdowns/page_120.md
+++ b/datalab_results/markdowns/page_120.md
@@ -16,8 +16,6 @@ voltage regulation logic to change an operating voltage of the first integrated
## 15. The apparatus of claim 10, wherein the instructions reside in a Basic Input Output System.
-15
-
## 16. The apparatus of claim 10, wherein the instructions reside in an operating system.
20
@@ -48,8 +46,6 @@ voltage regulation logic to change an operating voltage of the first integrated
detecting (402) an event to transition an integrated circuit of a computing system to a higher state of performance, the integrated circuit having multiple states of performance including a first state of performance, a second state of performance higher than the first state of performance, and a third state of performance higher than the second state of performance; and
-50
-
determining (404) whether the event is a user-initiated event or a software-initiated event; if the event is a user-initiated event directly transitioning (406) the integrated circuit from the first state of performance to the third state of performance based upon detecting the user event, if the event is a software-initiated event transitioning (408) the integrated circuit from the first state of performance to the second state of performance.
## 24. The machine-readable medium of claim 23, further comprising instructions which, when executed by the machine, cause the machine to perform the further operations comprising:
@@ -68,10 +64,8 @@ operating the integrated circuit at the third state of performance for a transie
changing the state of performance of the integrated circuit by changing an amount of processors to manage the processing load.
-# Patentansprüche
+# **Patentansprüche**
## 1. Verfahren, umfassend:
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als
-
-55
\ No newline at end of file
+Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_121.md b/datalab_results/markdowns/page_121.md
index 0f78c52..f71fa85 100644
--- a/datalab_results/markdowns/page_121.md
+++ b/datalab_results/markdowns/page_121.md
@@ -2,82 +2,105 @@
-continued
+P-54
+
Chemical structures shown:
-- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone group ( $\text{O}=\text{S}=\text{O}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
-- Monomer: A sulfone group ( $\text{O}=\text{S}=\text{O}$ ) attached to a benzene ring, which is attached to a sulfone
\ No newline at end of file
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a nitrogen atom ( $\text{N}^\ominus$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
+- Repeating unit: $(\text{CH}_2-\text{C})$ attached to a methyl group ( $\text{CH}_3$ ), which is attached to a carbonyl group ( $\text{C}(\text{O})$ ), which is attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ).
+- Repeating unit: $(\text{CH}_2-\text{C})$ attached to a methyl group ( $\text{CH}_3$ ), which is attached to a carbonyl group ( $\text{C}(\text{O})$ ), which is attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- Repeating unit: $(\text{CH}_2-\text{CH})$ attached to a phenyl group, which is attached to a sulfone group ( $\text{O}=\text{S}(\text{O})_2$ ), which is attached to a fluorinated sulfone group ( $\text{F}-\text{S}(\text{O})_2-\text{F}$ ), which is attached to a sulfonate group ( $\text{SO}_3^\ominus$ ).
+- 7 .................... **G03F 7/004**
+(51) **Int. Cl.**7 **G03F 7/004**
-(52) **U.S. Cl.** .................... **430/270.1; 430/325; 526/266;
+(52) **U.S. Cl.** **430/270.1; 430/325; 526/266;
526/320; 526/271; 549/347; 549/369; 549/430**
-(58) **Field of Search** .................... **430/270.1, 325;
+(58) **Field of Search** **430/270.1, 325;
549/347, 369, 430; 526/266, 320, 271**
-## (56) **References Cited**
+(56) **References Cited**
-### **U.S. PATENT DOCUMENTS**
+# **U.S. PATENT DOCUMENTS**
-3,468,857 A 9/1969 Graver .................... 260/80.3
-5,049,463 A \* 9/1991 Kato et al. .................... 430/49
-5,059,698 A 10/1991 Schulthess et al. .................... 549/375
-5,412,041 A \* 5/1995 Lesko et al. .................... 525/340
-6,060,212 A \* 5/2000 McCulloch et al. .................... 430/270.1
+3,468,857 A 9/1969 Graver 260/80.3
+5,049,463 A \* 9/1991 Kato et al. 430/49
+5,059,698 A 10/1991 Schulthess et al. 549/375
+5,412,041 A \* 5/1995 Lesko et al. 525/340
+6,060,212 A \* 5/2000 McCulloch et al. 430/270.1
-### **FOREIGN PATENT DOCUMENTS**
+# **FOREIGN PATENT DOCUMENTS**
DE 3714276 A1 11/1988
EP 0 347 381 A1 12/1989
@@ -61,7 +66,7 @@ JP 4-5040054 \* 12/1970
JP 5-216294 \* 8/1993
WO WO 99/61497 12/1999
-### **OTHER PUBLICATIONS**
+# **OTHER PUBLICATIONS**
1970:100663 Caplus Abstract.\*
1971:65746 Caplus Abstract.\*
@@ -75,8 +80,8 @@ WO WO 99/61497 12/1999
Kagaku Zasshi, 1970, 73(7), 1717-19.\*
Anionic polymerizabilities of 2-vinyl-1,3-dioxolane and
-2-vinyl-1,3-dioxane, Yamashita, N. et al., *J. Polym.Sci.,
-Polym.Lett.Ed.*, 1979, 17, 521-6.\*
+2-vinyl-1,3-dioxane, Yamashita, N. et al., J. Polym.Sci.,
+Polym.Lett.Ed., 1979, 17, 521-6.\*
1994:496066 Caplus Abstract of JP 5216294, Aug. 1993.\*
@@ -85,7 +90,7 @@ Chemical Abstract No. 131:337017 & JP 11315075.
Chemical Abstract No. 128:295769 & JP 10088419.
Chemical Abstract No. 118:102825 & J. Maslinska-Solich
-et al., *React. Polym.* (1992), 18(2), 159-166.
+et al., React. Polym. (1992), 18(2), 159-166.
J.Maślińska-Solich et al., "Studies on Co(II) and Mn(II)
complex of some maleic anhydride copolymers," *Reactive
@@ -98,11 +103,11 @@ Polymers*, vol. 18, 1992, pp. 159-166.
(74) **Attorney, Agent, or Firm**—Townsend and Townsend
and Crew LLP
-## (57) **ABSTRACT**
+(57) **ABSTRACT**
The present invention relates to a cross-linker for use in a
photoresist which is suitable for a photolithography process
-using KrF (248 nm), ArF (193 nm), E-beam, ion beam or
+using KrF (248 ru), ArF (193 nm), E-beam, ion beam or
EUV light source. According to the present invention, pre-
ferred cross-linkers comprise a copolymer having repeating
units derived from: (i) a compound represented by following
@@ -112,7 +117,7 @@ acrylic acid and maleic anhydride.
-![Chemical Formula 1: A repeating unit structure. It features a central carbon atom bonded to R3, a double-bonded H2C group, and a bridging group R. The bridging group R is bonded to a central carbon atom which is also bonded to two oxygen atoms. These oxygen atoms are bridged by a ring structure containing R1 and R2 groups. The subscript m is shown above the bridging group R, and the subscript n is shown below the ring structure.]()
+![Chemical Formula 1: A repeating unit structure. It shows a central carbon atom double-bonded to H2C and bonded to R3. This central carbon is also bonded to a carbon atom which is bonded to R and a carbon atom which is bonded to R. This central carbon is also bonded to a carbon atom which is bonded to two oxygen atoms, which are bonded to two carbon atoms, which are bonded to R1 and R2 respectively. The structure is enclosed in brackets with subscript n.]()
wherein, R1, R2 and R individually represent straight or
branched C1-10 alkyl, straight or branched C1-10 ester,
diff --git a/datalab_results/markdowns/page_127.md b/datalab_results/markdowns/page_127.md
index d047ef5..e582809 100644
--- a/datalab_results/markdowns/page_127.md
+++ b/datalab_results/markdowns/page_127.md
@@ -2,32 +2,33 @@
-continued
-Chemical structure (350A3): A substituted cyclohexyl group attached to a substituted benzene ring. The benzene ring has a sulfonic acid group ( $\text{HO}_3\text{S}$ ) and an isopropyl group ( $\text{CH}(\text{CH}_3)_2$ ).
+Chemical structure (350A3): A substituted cyclohexyl group attached to a substituted benzene ring. The benzene ring has a sulfonic acid group ( $\text{HO}_3\text{S}$ ) and an isopropyl group. The cyclohexyl group is attached to the benzene ring via a methylene bridge.
350A3
General Formula (ZI):
-$$\text{R}_{201}\text{S}^+\text{R}_{202}\text{Z}^- \quad (\text{ZI})$$
-$$\text{R}_{204}\text{I}^+\text{R}_{205}\text{Z}^- \quad (\text{ZII})$$
+$$\text{R}_{201}\text{S}^+\text{R}_{202}\text{Z}^-$$
-Chemical structure (311A3): A substituted cyclohexyl group attached to a sulfonate group ( $\text{HO}_3\text{S}$ ) via a sulfur atom. The sulfur atom is also bonded to a trifluoromethyl group ( $\text{CF}_3$ ) and a nitrogen atom ( $\text{N}$ ), which is attached to a cyclohexyl group.
+where $\text{R}_{201}$ and $\text{R}_{202}$ are organic groups, and $\text{Z}^-$ is a non-nucleophilic anion.
+
+Chemical structure (311A3): A substituted cyclohexyl group attached to a substituted benzene ring. The benzene ring has a sulfonic acid group ( $\text{HO}_3\text{S}$ ) and a difluoromethyl group ( $\text{CF}_2\text{F}$ ). The cyclohexyl group is attached via a sulfonamide group ( $\text{SO}_2\text{N}$ ).
311A3
-Chemical structure (250A3): A substituted cyclohexyl group attached to a sulfonate group ( $\text{HO}_3\text{S}$ ) via a sulfur atom. The sulfur atom is also bonded to a trifluoromethyl group ( $\text{CF}_3$ ) and a nitrogen atom ( $\text{N}$ ), which is attached to a benzofuran group.
+Chemical structure (250A3): A substituted cyclohexyl group attached to a substituted benzene ring. The benzene ring has a sulfonic acid group ( $\text{HO}_3\text{S}$ ) and a difluoromethyl group ( $\text{CF}_2\text{F}$ ). The cyclohexyl group is attached via a sulfonamide group ( $\text{SO}_2\text{N}$ ).
250A3
-Chemical structure (535A3): A substituted cyclohexyl group attached to a sulfonate group ( $\text{HO}_3\text{S}$ ) via a sulfur atom. The sulfur atom is also bonded to a trifluoromethyl group ( $\text{CF}_3$ ) and a nitrogen atom ( $\text{N}$ ), which is attached to a substituted benzene ring. The benzene ring has a sulfonate group ( $\text{SO}_3$ ) and a cyclohexyl group.
+Chemical structure (535A3): A substituted cyclohexyl group attached to a substituted benzene ring. The benzene ring has a sulfonic acid group ( $\text{HO}_3\text{S}$ ) and a difluoromethyl group ( $\text{CF}_2\text{F}$ ). The cyclohexyl group is attached via a sulfonamide group ( $\text{SO}_2\text{N}$ ).
535A3
-Chemical structure (290A3): A substituted cyclohexyl group attached to a sulfonate group ( $\text{HO}_3\text{S}$ ) via a sulfur atom. The sulfur atom is also bonded to a trifluoromethyl group ( $\text{CF}_3$ ) and an oxygen atom ( $\text{O}$ ), which is attached to a substituted cyclohexyl group.
+Chemical structure (290A3): A substituted cyclohexyl group attached to a substituted benzene ring. The benzene ring has a sulfonic acid group ( $\text{HO}_3\text{S}$ ) and a difluoromethyl group ( $\text{CF}_2\text{F}$ ). The cyclohexyl group is attached via a sulfonamide group ( $\text{SO}_2\text{N}$ ).
290A3
-Chemical structure (315A3): A substituted cyclohexyl group attached to a sulfonate group ( $\text{HO}_3\text{S}$ ) via a sulfur atom. The sulfur atom is also bonded to a trifluoromethyl group ( $\text{CF}_3$ ) and a nitrogen atom ( $\text{N}$ ), which is attached to a substituted cyclohexyl group.
+Chemical structure (315A3): A substituted cyclohexyl group attached to a substituted benzene ring. The benzene ring has a sulfonic acid group ( $\text{HO}_3\text{S}$ ) and a difluoromethyl group ( $\text{CF}_2\text{F}$ ). The cyclohexyl group is attached via a sulfonamide group ( $\text{SO}_2\text{N}$ ).
315A3
@@ -35,6 +36,12 @@ Chemical structure (315A3): A substituted cyclohexyl group attached t
[0292] More specifically, the photoacid generator is preferably a compound represented by General Formula (ZI) or General Formula (ZII).
+General Formula (ZII):
+
+$$\text{R}_{204}\text{I}^+\text{R}_{205}\text{Z}^-$$
+
+where $\text{R}_{204}$ and $\text{R}_{205}$ are organic groups, and $\text{Z}^-$ is a non-nucleophilic anion.
+
[0293] In General Formula (ZI),
[0294] $\text{R}_{201}$ , $\text{R}_{202}$ , and $\text{R}_{203}$ each independently represent an organic group.
diff --git a/datalab_results/markdowns/page_18.md b/datalab_results/markdowns/page_18.md
index 82aab9d..d8508ca 100644
--- a/datalab_results/markdowns/page_18.md
+++ b/datalab_results/markdowns/page_18.md
@@ -2,7 +2,7 @@
-Figure 7 is a plot showing the magnetic phase shift $\Delta\varphi_l(T)$ (in degrees) versus temperature $T$ (in K) for surface planes $l=1$ (triangles), $l=2$ (squares), $l=3$ (diamonds), and $l=4$ (circles). The plot compares results for thicknesses $n=8$ (straight lines and full symbols) and $n=16$ (dashed lines and open symbols). For $n=8$ , the phase shift decreases monotonically with temperature, dropping sharply below the Néel temperature $T_N(8)$ (around 80 K). For $n=16$ , the phase shift is significantly smaller and decreases more gradually. The y-axis ranges from 0 to 30 degrees, and the x-axis ranges from 0 to 140 K.
+Figure 7 is a plot showing the magnetic phase shift $\Delta\varphi_l(T)$ (in degrees) versus temperature $T$ (in K) for surface planes $l=1$ (triangles), $l=2$ (squares), $l=3$ (diamonds), and $l=4$ (circles). The plot compares results for thicknesses $n=8$ (solid lines and filled symbols) and $n=16$ (dashed lines and open symbols). For both thicknesses, $\Delta\varphi_l$ decreases monotonically with temperature. For $n=8$ , there is a sharp drop in $\Delta\varphi_l$ around the Néel temperature $T_N(8)$ (indicated by a vertical line), where $\Delta\varphi_l$ drops to near zero. For $n=16$ , the drop is less abrupt, and $\Delta\varphi_l$ remains slightly above zero below $T_N(8)$ .
FIG. 7: (color online) $\Delta\varphi_l(T)$ vs. temperature for the surface planes, $l=1$ (triangles), $l=2$ (squares), $l=3$ (diamonds), $l=4$ (circles). Straight lines and full symbols: $n=8$ . Dashed lines and open symbols: $n=16$ .
@@ -14,16 +14,16 @@ In a previous study, where the magnetic properties of Ho thin films were investi
-Figure 8 is a plot showing the peak position of the structure factor $Q_{z,\max}$ (in degrees) versus temperature $T$ (in K) for thickness $n=8$ . The plot shows data for different lateral dimensions $L$ (16, 32, 64, 128). The y-axis ranges from 0 to 30 degrees, and the x-axis ranges from 0 to 100 K. The inset shows the magnetic vector profile $(m_l^x, m_l^y)$ for $L=64$ at various temperatures, illustrating the transition from a paramagnetic phase to a long-range ordered phase.
+Figure 8 is a plot showing the peak position of the structure factor $Q_{z,\max}$ (in degrees) versus temperature $T$ (in K) for thickness $n=8$ . The plot shows that $Q_{z,\max}$ is zero for temperatures above the Néel temperature $T_N(8)$ (around 80 K). Below $T_N(8)$ , $Q_{z,\max}$ increases monotonically with decreasing temperature, reaching approximately $21^\circ$ at $T=10$ K. The inset shows the magnetic vector profile $(m_l^x, m_l^y)$ for $L=64$ at various temperatures, illustrating the transition from a paramagnetic phase to an ordered phase.
FIG. 8: (color online) $Q_{z,\max}$ position of the maximum of $S(\vec{q})$ , vs. temperature for thickness $n=8$ . Inset: magnetic vector $(m_l^x, m_l^y)$ profile for some temperatures for $L=64$ . Colors and symbols as in Fig. 2.
-Figure 9 is a plot showing the magnetic phase shift $\Delta\varphi_l$ (in degrees) versus the layer index $l$ (from 1 to 12) for a BCT lattice with thickness $n=12$ . The plot shows results for temperatures $T=100$ K, 130 K, 135 K, 140 K, and 145 K. The y-axis ranges from 0 to 80 degrees. The plot displays a characteristic block phase structure, with two external blocks of ordered layers ( $l=1\dots 5$ and $l=8\dots 12$ ) separated by a block of disordered layers ( $l=6\dots 7$ ), where $\Delta\varphi_l$ is roughly $10^\circ$ .
+Figure 9 is a plot showing the magnetic phase shift $\Delta\varphi_l$ (in degrees) versus the layer index $l$ (from 1 to 12) for a BCT lattice with thickness $n=12$ at various temperatures: 100 K (circles), 130 K (squares), 135 K (diamonds), 140 K (up-triangles), and 145 K (down-triangles). The plot shows a characteristic block phase structure. For $l=1$ to $l=5$ and $l=8$ to $l=12$ , $\Delta\varphi_l$ is low (around $10^\circ$ ), indicating ordered layers. For $l=6$ , $\Delta\varphi_l$ peaks sharply around $80^\circ$ , indicating a block of disordered layers. The temperature range shown (100 K to 145 K) is centered around the critical temperature $T_C(n)$ .
FIG. 9: $\Delta\varphi_l$ for a BCT lattice and $n=12$ , when the six coupling constants set employed in Ref. 14,15 (see text) is used. The temperature range has been chosen around $T_C(n)$ (error bars lie within point size).
gled out, with the high-temperature, paramagnetic phase separated from the low-temperature, long-range ordered one, by an intermediate-temperature block phase where outer ordered 4-layers blocks coexist with some inner disordered ones. Moreover, it was observed that the phase transition of such inner layers turns out to have the signatures of a Kosterlitz-Thouless one.
-The absence of the block phase in the $J_1-J_2$ model here investigated has to be attributed to the different range of interactions, rather than to the different lattice structure. We came to this conclusion by doing some simulations using the same set of interaction constants employed in Refs. 14,15, but using a BCT lattice: the results we obtained for $\Delta\varphi_l$ with $n=12$ are reported in Fig. 9. The latter is absolutely similar to Fig. 7 of Ref. 15 and clearly displays the footmarks of the block phase (see down-triangle), with two external blocks of ordered layers ( $l=1\dots 5$ and $l=8\dots 12$ ), where $\Delta\varphi_l$ is roughly $10^\circ$ , separated by a block of disordered layers, and with almost
\ No newline at end of file
+The absence of the block phase in the $J_1-J_2$ model here investigated has to be attributed to the different range of interactions, rather than to the different lattice structure. We came to this conclusion by doing some simulations using the same set of interaction constants employed in Refs. 14,15, but using a BCT lattice: the results we obtained for $\Delta\varphi_l$ with $n=12$ are reported in Fig. 9. The latter is absolutely similar to Fig. 7 of Ref. 15 and clearly displays the footmarks of the block phase (see down-triangle), with two external blocks of ordered layers ( $l=1\dots 5$ and $8\dots 12$ ), where $\Delta\varphi_l$ is roughly $10^\circ$ , separated by a block of disordered layers, and with almost
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_19.md b/datalab_results/markdowns/page_19.md
index 317f62f..12a3428 100644
--- a/datalab_results/markdowns/page_19.md
+++ b/datalab_results/markdowns/page_19.md
@@ -1,8 +1,8 @@
-
+
-Figure A.5: A graph showing the support under a concave treatment response. The vertical axis is Y\_1 and the horizontal axis is Y\_0. Two intersecting lines are shown. The lower line is labeled Y\_1 = Y\_0. The upper line is labeled Y\_1 = (t\_1 - t\_W)/(t\_0 - t\_W) Y\_0 - (t\_1 - t\_0)/(t\_0 - t\_W) w. The region above the upper line is shaded yellow, representing the support.
+Figure A.5 shows a 2D plot with axes Y\_0 (horizontal) and Y\_1 (vertical). Two intersecting lines are shown. The lower line is labeled Y\_1 = Y\_0. The upper line is labeled Y\_1 = (t\_1 - t\_W)/(t\_0 - t\_W) Y\_0 - (t\_1 - t\_0)/(t\_0 - t\_W) w. The region above the upper line is shaded yellow, representing the support under a concave treatment response.
Figure A.5: Support under concave treatment response
@@ -12,9 +12,9 @@ $$B_k^D = \{y_1 \in \mathbb{R} | \exists y_0 < b_k \text{ s.t. } 0 \le y_1 - y_0
Note that $Y_1 = Y_0 + \delta$ and $Y_1 = \frac{t_1 - t_W}{t_0 - t_W} Y_0 - \frac{t_1 - t_0}{t_0 - t_W} w$ intersect at $\left(\frac{t_0 - t_W}{t_1 - t_0} \delta + y_{-1}, \frac{t_1 - t_W}{t_1 - t_0} \delta + w\right)$ . I consider the following three cases: a) $b_{k+1} \le b_k \le \frac{t_0 - t_W}{t_1 - t_0} \delta + w$ , b) $b_{k+1} \le \frac{t_0 - t_W}{t_1 - t_0} \delta + w \le b_k$ , and c) $\frac{t_0 - t_W}{t_1 - t_0} \delta + w \le b_{k+1} \le b_k$ .
-
+
-Figure A.6: Three graphs illustrating B\_k^D for different cases. The vertical axis is Y\_1 and the horizontal axis is Y\_0. Two intersecting lines are shown. The lower line is labeled Y\_1 = Y\_0 + delta. The upper line is labeled Y\_1 = (t\_1 - t\_W)/(t\_0 - t\_W) Y\_0 - (t\_1 - t\_0)/(t\_0 - t\_W) w. (a) Shows B\_k^D as a purple rectangle defined by Y\_0 = b\_{k+1} and Y\_0 = b\_k. (b) Shows B\_k^D as a purple rectangle defined by Y\_0 = b\_{k+1} and Y\_0 = b\_k. (c) Shows B\_k^D as a green rectangle defined by Y\_0 = b\_{k+1} and Y\_0 = b\_k.
+Figure A.6 illustrates three cases (a), (b), and (c) for the support B\_k^D. The axes are Y\_0 (horizontal) and Y\_1 (vertical). The lines Y\_1 = Y\_0 + \delta and Y\_1 = \frac{t\_1 - t\_W}{t\_0 - t\_W} Y\_0 - \frac{t\_1 - t\_0}{t\_0 - t\_W} w intersect. The region B\_k^D is shaded purple in all cases. (a) shows B\_k^D as a vertical strip between b\_{k+1} and b\_k on the Y\_0 axis. (b) shows B\_k^D as a vertical strip between b\_{k+1} and b\_k on the Y\_0 axis, with the upper boundary being the line Y\_1 = Y\_0 + \delta. (c) shows B\_k^D as a vertical strip between b\_{k+1} and b\_k on the Y\_0 axis, with the upper boundary being the line Y\_1 = Y\_0 + \delta.
Figure. A.6: $B_k^D$ for $B_k = (-\infty, b_k)$ and $B_{k+1} = (-\infty, b_{k+1})$
diff --git a/datalab_results/markdowns/page_2.md b/datalab_results/markdowns/page_2.md
index fef1eae..bd108d3 100644
--- a/datalab_results/markdowns/page_2.md
+++ b/datalab_results/markdowns/page_2.md
@@ -2,7 +2,8 @@
# Semiconducting-enriched single wall carbon nanotube networks applied to field effect transistors
-N. Izard, S. Kazaoui\*, K. Hata, T. Okazaki, T. Saito, S. Iijima, and N. Minami*National Institute of Advanced Industrial Science and Technology (AIST)**1-1-1 Higashi, Tsukuba, Ibaraki, 305-8565 Japan*
+N. Izard, S. Kazaoui\*, K. Hata, T. Okazaki, T. Saito, S. Iijima, and N. Minami*National Institute of Advanced Industrial Science and Technology (AIST)
+1-1-1 Higashi, Tsukuba, Ibaraki, 305-8565 Japan*
Substantial progress are reported on field effect transistors (FET) consisting of semiconducting single wall carbon nanotubes (s-SWNTs) without detectable traces of metallic nanotubes and impurities. This outstanding result was made possible in particular by ultracentrifugation (250,000g) of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Such s-SWNTs processable solutions were applied to realize FET, embodying randomly or preferentially oriented nanotube networks prepared by spin coating or dielectrophoresis. Devices exhibit a stable p-type semiconductor behavior in air with very promising characteristics: the on-off current ratio is $10^5$ , the on-current level is around $10 \mu\text{A}$ and the estimated hole mobility is larger than $2 \text{ cm}^2/\text{vs}$ . The present results are demonstrated by optical absorption, Raman and electrical measurements.
@@ -14,12 +15,12 @@ In recent years, several approaches to extract s-SWNTs from nanotube powders wer
In this letter, we report on the electronic properties of FET consisting of *semiconducting-enriched single wall carbon nanotubes, without detectable traces of metallic nanotubes and impurities*, with in our detection limits. This unprecedented achievement is made possible by ultracentrifugation (250,000g), sonication and filtration of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Evidences are gathered by optical absorption, Raman and electrical measurements (see Fig.1). We shall demonstrate that such s-
-
+
-Figure 1: (a) Optical absorption spectra showing Absorbance vs Wavelength (nm) for L, M, and S samples. (b) Raman spectra showing Normalized Intensity vs Wavenumber (cm^-1) for s-SWNT, m-SWNT, L, M, and S samples. (c) Transfer characteristic showing Drain Current (I\_D) vs Gate Voltage (V\_G) for M and S samples.
+Figure 1: (a) Optical absorption spectra showing Absorbance vs Wavelength (nm) for L, M, and S samples. (b) Raman spectra showing Normalized Intensity vs Wavenumber (cm^-1) for s-SWNT, m-SWNT, L, M, and S samples. (c) Transfer characteristic showing Drain Current (I\_D) vs Gate Voltage (V\_G) for FET devices made of sample M and S.
FIG. 1: (Color online): (a) shows the optical absorption spectra and (b) the Raman spectra at 514.5 nm of L, M and S samples. (c) displays the transfer characteristic, $I_D$ vs $V_G$ for $V_{DS}=-14\text{V}$ of FET devices made of sample M and S.
SWNTs realize high-performances FET devices compare to networks/thin films of SWNTs and solution processable polymers/organic materials.1,6,16
-S-SWNTs solutions were prepared as follow. First, SWNTs powders (as-prepared HiPco, Carbon Nanotechnologies Inc.), PFO (Poly-9,9-di-n-octyl-fluorenyl-2,7-diyl, Sigma-Aldrich) and toluene were mixed in the following ratio SWNT (5 mg): PFO (5 mg): toluene (30 ml)
\ No newline at end of file
+s-SWNTs solutions were prepared as follow. First, SWNTs powders (as-prepared HiPco, Carbon Nanotechnologies Inc.), PFO (Poly-9,9-di-n-octyl-fluorenyl-2,7-diyl, Sigma-Aldrich) and toluene were mixed in the following ratio SWNT (5 mg): PFO (5 mg): toluene (30 ml)
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_21.md b/datalab_results/markdowns/page_21.md
index a77aa12..f63096a 100644
--- a/datalab_results/markdowns/page_21.md
+++ b/datalab_results/markdowns/page_21.md
@@ -2,8 +2,7 @@
Now I present the constrained optimization procedure to compute the sharp lower bound under MTR. I pay particular attention to the special case where $a_{k+1} - a_k = \delta$ for each integer $k$ at the optimum. In this case, the lower bound reduces to
-$$\sup_{0\le y\le\delta}\sum_{k=-\infty}^\infty \max\left(F_1\left(y+(k+1)\delta\right)-F_0\left(y+k\delta\right),0\right),$$
- (B.1)
+$$\sup_{0\le y\le\delta}\sum_{k=-\infty}^\infty \max\left(F_1\left(y+(k+1)\delta\right)-F_0\left(y+k\delta\right),0\right), \tag{B.1}$$
and computation of (B.1) poses a simple one-dimensional optimization problem.
@@ -23,8 +22,7 @@ where $y^*\in \arg\max_{0\le y\le\delta}\sum_{k=-\infty}^\infty \max\left(F_1\l
**Step 3.** For $J=K$ , solve the following optimization problem:
-$$\sup_{\{a_k\}_{k=-J}^J\in\mathcal{S}_\delta^{J,K}(y)}\sum_{k=-J}^J \max\left\{F_1\left(a_{k+1}\right)-F_0\left(a_k\right),0\right\},$$
- (B.2)
+$$\sup_{\{a_k\}_{k=-J}^J\in\mathcal{S}_\delta^{J,K}(y)}\sum_{k=-J}^J \max\left\{F_1\left(a_{k+1}\right)-F_0\left(a_k\right),0\right\}, \tag{B.2}$$
where
diff --git a/datalab_results/markdowns/page_23.md b/datalab_results/markdowns/page_23.md
index b9b421c..96d11d9 100644
--- a/datalab_results/markdowns/page_23.md
+++ b/datalab_results/markdowns/page_23.md
@@ -34,13 +34,13 @@ The condition for the non-Hermitian Hamiltonian to possess a real-valued spectru
$$\xi^2+\frac{E_a}{\kappa_0}\xi+1-(\kappa_a/\kappa_0)^2=0.$$
(52)
-Then the Hamiltonian $H$ has a real-valued energy spectrum if and only if $|\xi_{1,2}|\le 1$ . Figure 2 shows the domain in the plane $(\mathrm{Im}(E_a)/\kappa_0, \kappa_a/\kappa_0)$ where $H$ has a purely continuous energy spectrum for a few increasing values of the ratio $|\mathrm{Re}(E_a)/\kappa_0|$ . The domain lies in the sector
+Then the Hamiltonian $H$ has a real-valued energy spectrum if and only if $|\xi_{1,2}|\le 1$ . Figure 2 shows the domain in the plane $(\mathrm{Im}(E_a)/\kappa_0,\kappa_a/\kappa_0)$ where $H$ has a purely continuous energy spectrum for a few increasing values of the ratio $|\mathrm{Re}(E_a)/\kappa_0|$ . The domain lies in the sector
-
+
-Figure 2 shows four plots illustrating the domains of non-existence of bound states for the Hamiltonian H in the (Im(E\_a)/\kappa\_0, \kappa\_a/\kappa\_0) plane. The shaded regions represent where H has a purely continuous energy spectrum. The plots correspond to increasing values of the ratio |Re(E\_a)/\kappa\_0|: 0, \pm 0.5, \pm 1, and \pm 1.8. The shaded regions shrink as |Re(E\_a)/\kappa\_0| increases, indicating that bound states exist outside these regions.
+Figure 2 shows four plots illustrating the domains of non-existence of bound states for the Hamiltonian H in the (Im(E\_a)/κ\_0, κ\_a/κ\_0) plane. The shaded regions indicate where H has a purely continuous energy spectrum. The plots correspond to increasing values of the ratio |Re(E\_a)/κ\_0|: 0, ±0.5, ±1, and ±1.8. The shaded regions shrink towards the origin as |Re(E\_a)/κ\_0| increases.
-FIG. 2: Domains of non-existence of bound states for the Hamiltonian $H$ in the $(\mathrm{Im}(E_a)/\kappa_0, \kappa_a/\kappa_0)$ plane (shaded regions) for increasing values of the ratio $|\mathrm{Re}(E_a)/\kappa_0|$ . For a non-Hermitian Hamiltonian, i.e. $\mathrm{Im}(E_a)\neq 0$ , in the shaded regions the energy spectrum of $H$ is real-valued and purely continuous. Spectral singularities occur at the boundary of the shaded regions.
+FIG. 2: Domains of non-existence of bound states for the Hamiltonian $H$ in the $(\mathrm{Im}(E_a)/\kappa_0,\kappa_a/\kappa_0)$ plane (shaded regions) for increasing values of the ratio $|\mathrm{Re}(E_a)/\kappa_0|$ . For a non-Hermitian Hamiltonian, i.e. $\mathrm{Im}(E_a)\neq 0$ , in the shaded regions the energy spectrum of $H$ is real-valued and purely continuous. Spectral singularities occur at the boundary of the shaded regions.
$\kappa_a/\kappa_0\le\sqrt{2}$ and shrinks toward $\mathrm{Im}(E_a)/\kappa_0=\kappa_a/\kappa_0=0$ as $|\mathrm{Re}(E_a)/\kappa_0|\rightarrow 2^-$ . For $|\mathrm{Re}(E_a)/\kappa_0|\le 2$ , bound states do exist for any value of $\kappa_a/\kappa_0$ and $\mathrm{Im}(E_a)/\kappa_0$ . The wider domain is attained for $\mathrm{Re}(E_a)=0$ . In particular, for $\mathrm{Re}(E_a)=0$ and $\kappa_a/\kappa_0=\sqrt{2}$ , from Eq.(52) it follows that $H$ has a real-valued energy spectrum provided that
diff --git a/datalab_results/markdowns/page_24.md b/datalab_results/markdowns/page_24.md
index 1910aa1..b98a373 100644
--- a/datalab_results/markdowns/page_24.md
+++ b/datalab_results/markdowns/page_24.md
@@ -2,11 +2,11 @@
-Figure S1 consists of two panels illustrating the effects of Fisher transforming correlation coefficients on dynamic fluctuations.
+Figure S1 consists of two panels illustrating the effects of Fisher transforming correlation coefficients.
-**Panel A:** A plot showing the probability density function (Prob. Density) of Dynamic FC Magnitude (Fisher-transformed) for four levels of static functional connectivity (FC): 0.5 (blue), 1.0 (orange), 1.5 (yellow), and 2.0 (purple). The distributions are centered around 0, 1, 2, and 3 respectively, and show similar variances, indicating that the range of dynamic fluctuations is largely independent of the static FC magnitude.
+Panel A is a plot showing Probability Density (Y-axis) versus Dynamic FC Magnitude (Fisher-transformed) (X-axis). Four overlapping probability density functions (PDFs) are shown, corresponding to static functional connectivity (FC) magnitudes of 0.5 (blue), 1.0 (orange), 1.5 (yellow), and 2.0 (purple). The distributions are centered around 0, 1, 2, and 3, respectively, indicating that the mean dynamic FC magnitude shifts with static FC magnitude. The variances of the distributions appear similar across the range of static FC magnitudes.
-**Panel B:** A scatter plot showing the relationship between Mean dynamic FC (Fisher-transformed) on the x-axis and St. dev. dynamic FC (Fisher-transformed) on the y-axis. The data points are tightly clustered around the origin, suggesting no systematic relationship between the temporal mean and standard deviation of the Fisher-transformed dynamic FC.
+Panel B is a scatter plot showing Standard Deviation of dynamic FC (Fisher-transformed) (Y-axis) versus Mean dynamic FC (Fisher-transformed) (X-axis). The data points are tightly clustered around the origin (0, 0), suggesting no systematic relationship between the temporal mean and standard deviation of the Fisher-transformed dynamic functional connectivity matrix.
Figure S1: We show the effects of Fisher transforming correlation coefficients on the range of dynamic fluctuations in Fisher-transformed coefficients. (A) Given four levels of static functional connectivity, we show the expected range of distribution Fisher-transformed dynamic functional connections. Note that despite the wide range of static connectivity magnitudes, the variances of distributions are similar. Contrast this with Figure 2 in the main text, where static connectivity magnitude played a massive role in shaping the range of dynamic fluctuations. (B) The relationship of the temporal mean and standard deviation for the Fisher-transformed functional connectivity matrix. Note that there is no systematic relationship. Contrast this panel with panel C in Figure 1 from the main text.
@@ -14,8 +14,8 @@ Figure S1: We show the effects of Fisher transforming correlation coefficients o
Figure S2 compares raw Pearson correlation coefficients with Fisher-transformed coefficients.
-**Panel A:** A scatter plot showing Fisher Percentiles (Y-axis) versus Pearson Percentiles (X-axis). The data points closely follow the diagonal line (Y=X), indicating a strong correlation. The calculated correlation coefficient is $r=0.9999$ .
+Panel A is a scatter plot showing Fisher Percentiles (Y-axis) versus Pearson Percentiles (X-axis). The data points form a nearly perfect straight line, indicating a strong correlation. The correlation coefficient is $r=0.9999$ .
-**Panel B:** A scatter plot showing Mean dynamic FC (Y-axis) versus Static FC (X-axis). The data points show a strong positive correlation, indicated by the red line of best fit. The calculated correlation coefficient is $r=0.97$ .
+Panel B is a scatter plot showing Mean dynamic FC (Y-axis) versus Static FC (X-axis). The data points show a strong positive correlation, forming a tight cluster around the line of identity. The correlation coefficient is $r=0.97$ .
Figure S2: Comparison of raw Pearson correlation coefficients with Fisher-transformed coefficients. (A) Because the Fisher transformation is monotonic (preserves rank) it does not change percentiles in any appreciable way. The correlation of the Fisher-transformed percentile matrix with the percentile matrix obtained from raw Pearson correlation coefficients is $r \approx 1$ . (B) We also calculated the correlation of Fisher-transformed static functional connectivity with the mean Fisher-transformed dynamic functional connectivity.
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_26.md b/datalab_results/markdowns/page_26.md
index b577fa3..51f6bf0 100644
--- a/datalab_results/markdowns/page_26.md
+++ b/datalab_results/markdowns/page_26.md
@@ -68,14 +68,11 @@ KENAI FSS
Stand Alone FSS within Canadian Airspace
-122.2
-VICTORIA HARBOUR
-FSS AVAILABLE 1345-0530Z#
-
Stand Alone FSS within Canadian Airspace
122.2
-VICTORIA HARBOUR
+VICTORIA HARBOUR
+FSS AVAILABLE 1345-0530Z†
Stand Alone RCO
diff --git a/datalab_results/markdowns/page_3.md b/datalab_results/markdowns/page_3.md
index 8cf22c2..d7fa8a8 100644
--- a/datalab_results/markdowns/page_3.md
+++ b/datalab_results/markdowns/page_3.md
@@ -2,11 +2,11 @@
-Figure 3 displays two plots comparing the efficiency of three MCMC algorithms (All Blocked, All Scalar, and Auto Blocking) across varying correlation and model size.
+Figure 3 displays two plots comparing the efficiency of three MCMC algorithms (All Blocked, All Scalar, and Auto Blocking) across varying model structures.
The left plot shows Efficiency (effective samples / time) versus Correlation (0.2, 0.5, 0.8). The right plot shows Efficiency (effective samples / time) versus Model size (N) (20, 50, 100).
-In both plots, the Auto Blocking algorithm consistently achieves the highest efficiency, followed by All Blocked, and then All Scalar, which is the lowest.
+In both plots, the Auto Blocking algorithm consistently achieves the highest efficiency, especially as correlation increases or model size grows. The All Scalar algorithm generally performs better than All Blocked sampling.
Figure 3: Efficiency results for two contrived model structures: varying sized blocks of fixed correlation (left), and fixed sized blocks of varying correlation (right).
diff --git a/datalab_results/markdowns/page_33.md b/datalab_results/markdowns/page_33.md
index 6acf039..a57b85d 100644
--- a/datalab_results/markdowns/page_33.md
+++ b/datalab_results/markdowns/page_33.md
@@ -46,19 +46,10 @@ Diagram illustrating components of an airport runway and associated markings.
-Airport sketch diagram showing runways, taxiways, and approach lighting systems. Key features include:
+Airport sketch diagram showing runways (e.g., 7, 16L, 16R, 17R, 26, 34L, 34R, 35L, 35R), taxiways, and approach lighting systems (HIRL, TDZL, TDZ/CL). The diagram includes elevation information (ELEV 5434) and distance information (TDZE 5352, 082° 5 NM from FAF, FAF to MAP 5 NM). A Time/Distance Table is provided below the sketch:
-- ELEV 5434
-- TDZE 5352
-- Runways 7, 16L, 16R, 17R, 26, 34L, 34R, 35L, 35R
-- HIRL All Rwys
-- 082° 5 NM from FAF
-- FAF to MAP 5 NM
-
-Time/Distance Table:
-
-| Knots | 60 | 90 | 120 | 150 | 180 |
-|---------|------|------|------|------|------|
-| Min:Sec | 5:00 | 3:20 | 2:30 | 2:00 | 1:40 |
+| | Knots | 60 | 90 | 120 | 150 | 180 |
+|---------|-------|------|------|------|------|-----|
+| Min:Sec | 5:00 | 3:20 | 2:30 | 2:00 | 1:40 | |
Airport sketch diagram showing runways, taxiways, and approach lighting systems.
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_34.md b/datalab_results/markdowns/page_34.md
index 783e535..221321f 100644
--- a/datalab_results/markdowns/page_34.md
+++ b/datalab_results/markdowns/page_34.md
@@ -14,7 +14,7 @@ Each sector altitude is identified in solid black color by the MSL ceiling and f
**Military Training Routes (MTRs)** are shown on Sectionals and TACs. They are identified by the route designator:
-![Route designator symbol: a dashed line with an arrowhead.]() IR21. Route designators are shown in solid black on the route centerline, positioned along the route for continuity. The designator IR or VR is not repeated when two or more routes are established over the same airspace, e.g., IR201-205-227. Routes numbered 001 to 099 are shown as IR1 or VR99, eliminating the initial zeros. Direction of flight along the route is indicated by small arrowheads adjacent to and in conjunction with each route designator.
+![Route designator symbol: a solid black line with an arrowhead.]() IR21. Route designators are shown in solid black on the route centerline, positioned along the route for continuity. The designator IR or VR is not repeated when two or more routes are established over the same airspace, e.g., IR201-205-227. Routes numbered 001 to 099 are shown as IR1 or VR99, eliminating the initial zeros. Direction of flight along the route is indicated by small arrowheads adjacent to and in conjunction with each route designator.
The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.
diff --git a/datalab_results/markdowns/page_37.md b/datalab_results/markdowns/page_37.md
index 6776265..d097c2d 100644
--- a/datalab_results/markdowns/page_37.md
+++ b/datalab_results/markdowns/page_37.md
@@ -12,7 +12,7 @@
-Diagram showing a segment of a VOR airway (V465) between LUNDI and OLNUE. The airway is labeled with altitudes 15000, 13300G, and \*13300. The MEA (Minimum Enroute Altitude) is 13300'. The MEA GAP is 51. The distance from LUNDI to the MEA point is 35, and the distance from the MEA point to OLNUE is 63. The MEA is indicated by a box labeled 114.
+Diagram showing a segment of a VOR airway (V465) between LUNDI and OLNUE. The airway is labeled with altitudes 15000, 13300G, and \*13300. The MEA (Minimum Enroute Altitude) is 13300'. The MEA GAP is indicated between 35 and 63.
### Description
@@ -29,7 +29,7 @@ MOCA of 13300'
122.05
JACKSON
-115.4 JAC 101 $\text{E}\text{E}\text{E}$
+115.4 JAC 101 $\text{E}^{\text{E}}$
N43°37.26' W110°43.90'
[CASPER]
MCA
diff --git a/datalab_results/markdowns/page_38.md b/datalab_results/markdowns/page_38.md
index 82ad34f..d504a8b 100644
--- a/datalab_results/markdowns/page_38.md
+++ b/datalab_results/markdowns/page_38.md
@@ -4,9 +4,9 @@
## Special Flight Rules Area (SFRA)
-
+
-Diagram showing a Special Flight Rules Area (SFRA) boundary, typically a rectangular area with a dashed line and a hatched interior.
+Diagram showing a Special Flight Rules Area (SFRA) boundary, typically a rectangular area with a dashed line and a hatched border.
SPECIAL FEDERAL AVIATION REGULATIONS (SFAR)
14 CFR Part 93, Subpart U and SFAR 50.2 -
@@ -22,22 +22,22 @@ The type of area shall be spelled out in large areas if space permits.
\* Alert Areas do not extend into Class A, B, C and D airspace, or Class E airport surface areas.
-
+
-Diagram showing a Prohibited, Restricted, or Warning Area (PRWA) boundary, typically a rectangular area with a dashed line and a hatched interior. The area is labeled P-56 OR R-6401 OR W-518.
+Diagram showing a Prohibited, Restricted, or Warning Area (P-56 or R-6401 or W-518) boundary, typically a rectangular area with a dashed line and a hatched border.
PROHIBITED, RESTRICTED
or WARNING AREA
-
+
-Diagram showing an Alert Area boundary, typically a rectangular area with a dashed line and a hatched interior. The area is labeled ALERT AREA A-631 and CONCENTRATED STUDENT HELICOPTER TRAINING.
+Diagram showing an Alert Area (A-631) boundary, typically a rectangular area with a dashed line and a hatched border, labeled CONCENTRATED STUDENT HELICOPTER TRAINING.
ALERT AREA
-
+
-Diagram showing a Military Operations Area (MOA) boundary, typically a rectangular area with a dashed line and a hatched interior. The area is labeled VANCE 2 MOA and VANCE 2 MOA EXCLUDES AIRSPACE 1500' AGL AND BELOW.
+Diagram showing a Military Operations Area (MOA) boundary, typically a rectangular area with a dashed line and a hatched border, labeled VANCE 2 MOA and EXCLUDES AIRSPACE 1500' AGL AND BELOW.
MILITARY OPERATIONS
AREA (MOA)
@@ -48,9 +48,9 @@ Appropriate boxed note as required shown adjacent to area.
Inside the FAR Part 93 boundary area, the cross hatching is at a 45 degree angle. The hypsometric tint shall be masked within the area around the yellow city tint when applicable (should not be confused with white glacier tint).
-
+
-Diagram showing a Special Air Traffic Rules / Airport Patterns (FAR Part 93) area, typically a rectangular area with a dashed line and a hatched interior.
+Diagram showing a Special Air Traffic Rules / Airport Patterns (FAR Part 93) boundary, typically a rectangular area with a dashed line and a hatched border.
SPECIAL NOTICE
Pilots are required to
@@ -59,21 +59,21 @@ prior to entering this area.
## Flight Restricted Zone (FRZ) Relating to National Security
-
+
-Diagram showing a Flight Restricted Zone (FRZ) boundary, typically a curved area with a dashed line and a hatched interior.
+Diagram showing a Flight Restricted Zone (FRZ) boundary, typically a curved area with a dashed line and a hatched border.
-
+
-Diagram showing a Flight Restricted Zone (FRZ) boundary, typically a curved area with a dashed line and a hatched interior. The area is labeled FLIGHT RESTRICTED ZONE.
+Diagram showing a Flight Restricted Zone (FRZ) boundary, typically a curved area with a dashed line and a hatched border, labeled FLIGHT RESTRICTED ZONE.
## National Security Area
Appropriate notes as required may be shown
-
+
-Diagram showing a National Security Area boundary, typically a curved area with a dashed line and a hatched interior. The area is labeled Small Area.
+Diagram showing a National Security Area boundary, typically a curved area with a dashed line and a hatched border, labeled Small Area.
NOTICE
FOR REASONS OF NATIONAL SECURITY
@@ -82,9 +82,9 @@ BELOW 1200' MSL IN THIS AREA
## Special Awareness Training Areas
-
+
-Diagram showing a Special Awareness Training Area boundary, typically a curved area with a dashed line and a hatched interior. The area is labeled DCA-VOR-DME-60-NM.
+Diagram showing a Special Awareness Training Area boundary, typically a curved area with a dashed line and a hatched border, labeled DCA-VOR-DME-60-NM.
NOTICE
Special awareness training required within 60 NM
@@ -94,9 +94,9 @@ of DCA VOR-DME. See description on Flyway.
Appropriate notes as required may be shown.
-
+
-Diagram showing a Mode C (FAR 91.215) boundary, typically a curved area with a dashed line and a hatched interior. The area is labeled MODE C 30 NM.
+Diagram showing a Mode C boundary, typically a curved area with a dashed line and a hatched border, labeled MODE C 30 NM.
## Air Defense Identification Zone (ADIZ)
diff --git a/datalab_results/markdowns/page_40.md b/datalab_results/markdowns/page_40.md
index efbb902..21048b1 100644
--- a/datalab_results/markdowns/page_40.md
+++ b/datalab_results/markdowns/page_40.md
@@ -13,9 +13,9 @@ Missed approach information is shown in 3 locations on the chart:
- The Middle Briefing Strip - The complete textual missed approach instructions are provided at the top of the approach chart in the middle pilot briefing strip.
- The Planview - The missed approach track is drawn using a thin, hash marked line with a directional arrow. If the missed approach fix is off the chart, the missed approach track shall extend to the chart border.
-
+
-Missed Approach icon: A thin, hash marked line with a directional arrow pointing right.
+Missed Approach track symbol: a thin, hash marked line with a directional arrow.
- The Profile Box - Missed Approach Icons will be depicted in the upper left or upper right of the profile box. The Missed Approach Icons are intended to provide quick, at a glance intuitive guidance to the pilot, to supplement the textual missed approach instructions in the briefing strip. Space permitting, all textual missed approach instructions will be graphically depicted in sequence. If space does not permit the depiction of all missed approach icons, only the first four icon boxes will be shown.
diff --git a/datalab_results/markdowns/page_42.md b/datalab_results/markdowns/page_42.md
index bcafce3..b7a9ecb 100644
--- a/datalab_results/markdowns/page_42.md
+++ b/datalab_results/markdowns/page_42.md
@@ -4,42 +4,38 @@
## Airspace - U.S.
-| Class A | Open Area (White) |
-|----------------------------|---------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------|
-| High Chart Only | That airspace from 18,000' MSL to and including FL 600, including the airspace overlying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00" N, the Alaska peninsula west of longitude 160°00'00" W, and the airspace less than 1,500' AGL. |
-| Controlled Airspace | |
+| Class A | Open Area (White) |
+|---------------------|---------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------|
+| High Chart Only | That airspace from 18,000' MSL to and including FL 600, including the airspace overlying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00" N, the Alaska peninsula west of longitude 160°00'00" W, and the airspace less than 1,500' AGL. |
+| Controlled Airspace | |
That airspace from 18,000' MSL to and including FL 450, including Santa Barbara Island, Farallon Island, the Alaska peninsula west of longitude 160°00'00" W, and designated offshore areas.
### Class B
-Low Chart Only
+| Low Chart Only | Screened Blue with a Solid Blue Outline |
+|---------------------|-----------------------------------------|
+| Controlled Airspace | |
-Controlled Airspace
+
-Screened Blue with a Solid Blue Outline
-
-
-
-Diagram illustrating Class B airspace. It shows a large circular area (30 NM radius) centered on Salt Lake City International Airport (SLC) and Salt Lake City South Valley Regional Airport (L42). The area is shaded screened blue with a solid blue outline. The diagram indicates 30 NM MODE C boundaries.
+Diagram illustrating Class B airspace. It shows a large circular area (30 NM radius) centered on Salt Lake City International Airport (SLC) and Salt Lake City South Valley Regional Airport (L42). The area is shaded blue with a solid blue outline. The diagram indicates 30 NM MODE C boundaries.
That airspace from the surface to 10,000' MSL (unless otherwise designated) surrounding the nation's busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.
Example:
-
-
-Example chart showing Class B airspace (screened blue with solid blue outline) centered on Salt Lake City International Airport (SLC). The chart displays various VORs, frequencies, and boundaries, including 30 NM MODE C boundaries.
-
-### Mode C Area
-
-A Solid Blue Outline
+
-Low Chart Only
+Example chart showing Class B airspace (shaded blue) around Salt Lake City (SLC) and surrounding airports. The chart includes various VORs, frequencies, and airport identifiers, illustrating the complex structure of Class B airspace.
-Controlled Airspace
+| Mode C Area | A Solid Blue Outline |
+|-------------|----------------------|
+|-------------|----------------------|
-That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215)
+| Low Chart Only | That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215) |
+|---------------------|----------------------------------------------------------------------------------------------------------------------------------------------------------------------------|
+| Controlled Airspace | |
Example:
diff --git a/datalab_results/markdowns/page_43.md b/datalab_results/markdowns/page_43.md
index 7ef47df..e1736f4 100644
--- a/datalab_results/markdowns/page_43.md
+++ b/datalab_results/markdowns/page_43.md
@@ -4,17 +4,17 @@
On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.
-
+
-Diagram illustrating the components of a NAVAID box. Components labeled include: Crosshatch indicates Shutdown status, Operates less than continuous or on-request, FSS Radio Frequencies (122.1R and 123.6), VORTAC PONTIAC, NDB Frequency (379), Channel (Ch 47 PTK), FSS oper 0600-2200, Operational note (Rancho Murieta FSS other times), ASOS/AWOS, Name, Morse Code, and Identifier.
+Diagram illustrating the components of a NAVAID box. Components labeled include: Crosshatch indicates Shutdown status, Operates less than continuous or on-request, NDB Frequency, Frequency, Channel, Operational note, FSS Radio Frequencies, ASOS/AWOS, Name, Morse Code, and Identifier.
A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.
-The type of NAVAID will be identified by: "VOR," (VHF Omni-Directional Range) "VORTAC" (VOR Tactical Aircraft Control), "VOR-DME," (VOR-Distance Measuring Equipment) or "DME" (Distance Measuring Equipment) positioned on and breaking the top line of the NAVAID box.
+
-
+Diagram showing a VOR/Saleem NAVAID symbol (blue box) located on an airport icon (airplane symbol). The symbol is associated with a compass rose. An open circle is shown near the airport icon, indicating the NAVAID location on the airport. The text below the symbol reads: Open circle symbol shown when NAVAID located on airport. Type of NAVAID shown in top of box.
-Diagram showing a VOR symbol (a circle with a cross inside) located on an airport symbol (a small airplane icon). The VOR box is labeled VOR SALEM 114.3 SVM. An open circle symbol is shown near the airport symbol, indicating the NAVAID location when collocated with an airport.
+The type of NAVAID will be identified by: "VOR," (VHF Omni-Directional Range) "VORTAC" (VOR Tactical Aircraft Control), "VOR-DME," (VOR-Distance Measuring Equipment) or "DME" (Distance Measuring Equipment) positioned on and breaking the top line of the NAVAID box.
DMEs are shown without the compass rose.
diff --git a/datalab_results/markdowns/page_47.md b/datalab_results/markdowns/page_47.md
index 6ec25c0..689da31 100644
--- a/datalab_results/markdowns/page_47.md
+++ b/datalab_results/markdowns/page_47.md
@@ -6,19 +6,15 @@
**II.8.2** Each party must:
-(a) not use *confidential information or documents* for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
-
-(b) ensure the protection of such *confidential information or documents* with the same level of protection as its own confidential information or documents, and in any case with due diligence;
-
-(c) not disclose directly or indirectly *confidential information or documents* to third parties without the prior written agreement of the other party.
+1. not use *confidential information or documents* for any purpose other than to perform its obligations under the contract without the prior written agreement of the other party;
+2. ensure the protection of such *confidential information or documents* with the same level of protection as its own confidential information or documents, and in any case with due diligence;
+3. not disclose directly or indirectly *confidential information or documents* to third parties without the prior written agreement of the other party.
**II.8.3** The confidentiality obligation set out in this Article are binding on the contracting authority and the contractor during the performance of the contract and for as long as the information or documents remain confidential unless:
-(a) the disclosing party agrees to release the receiving party from the confidentiality obligation earlier;
-
-(b) the *confidential information or documents* become public through other means than in breach of the confidentiality obligation
-
-(c) the applicable law requires the disclosure of the *confidential information or documents*.
+1. the disclosing party agrees to release the receiving party from the confidentiality obligation earlier;
+2. the *confidential information or documents* become public through other means than in breach of the confidentiality obligation
+3. the applicable law requires the disclosure of the *confidential information or documents*.
**II.8.4** The contractor must obtain from any natural person with the power to represent it or take decisions on its behalf, as well as from third parties involved in the performance of the contract, a commitment that they will comply with this Article. At the request of the contracting authority, the contractor must provide a document providing evidence of this commitment.
diff --git a/datalab_results/markdowns/page_5.md b/datalab_results/markdowns/page_5.md
index cdf2188..0b8efc1 100644
--- a/datalab_results/markdowns/page_5.md
+++ b/datalab_results/markdowns/page_5.md
@@ -1,8 +1,8 @@
-
+
-Line graph showing Cumulative IV Tokens Found (Millions) versus Additional Users Downloaded (0 to 500). The Predictive Ranking strategy (solid line) significantly outperforms the Random Baseline (dashed line) and Edge Count Ranking (dotted line). The Predictive Ranking curve reaches approximately 1.25 million tokens at 500 users, while the other two strategies reach around 0.45 million tokens.
+Line graph showing Cumulative IV Tokens Found (Millions) versus Additional Users Downloaded (0 to 500). The Predictive Ranking strategy (solid line) shows significantly higher cumulative IV tokens found compared to the Random Baseline (dashed line) and Edge Count Ranking (dotted line). The Predictive Ranking curve reaches approximately 1.25 million tokens at 500 users, while the other two strategies reach around 0.45 million tokens.
Fig. 2. IV Tokens Gathered by Crawling Strategy
@@ -12,7 +12,7 @@ We tested our method for prioritizing the crawling queue using Bengali language
In Figure 2, we show the cumulative in-vocabulary tokens obtained as an additional 500 users are processed from the download queue for each of the three prioritization strategies. The predictive ranking provides three times as many in-vocabulary tokens as either the edge count ranking or the random baseline. Figure 3 is similar but shows the cumulative vocabulary coverage (types) where the vocabulary is taken from a held-out dev set different from the text used to produce the Twitter queries. The horizontal line represents the type coverage of the in-domain training data. The predictive
-ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the dev-set are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially out-performing the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
+ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the dev-set are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially outperforming the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and average sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @BarackObama followed by @BillGates.)
diff --git a/datalab_results/markdowns/page_53.md b/datalab_results/markdowns/page_53.md
index c1ae136..4275ca2 100644
--- a/datalab_results/markdowns/page_53.md
+++ b/datalab_results/markdowns/page_53.md
@@ -1,9 +1,8 @@
-| 2) Copies of the profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity. |
-|------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------|
-| If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the Contracting Authority considers appropriate. The contracting authority must at least be notified of the reason and its justification. |
-| The Contracting Authority reserves the right to request any other document enabling it to verify the economic operator's economic and financial capacity. |
+| |
2) Copies of the profit and loss accounts for the last two years for which accounts have been closed from each concerned involved entity. If, for any valid reason, an economic operator is unable to provide the copies of the profit and loss accounts, it may prove its economic and financial capacity by any other document, which the Contracting Authority considers appropriate. The contracting authority must at least be notified of the reason and its justification. The Contracting Authority reserves the right to request any other document enabling it to verify the economic operator's economic and financial capacity. |
+|--|--------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------|
+|--|--------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------|
→ All of the above specified evidence of economic and financial capacity must be provided with the tender.
diff --git a/datalab_results/markdowns/page_6.md b/datalab_results/markdowns/page_6.md
index f86ece4..86348da 100644
--- a/datalab_results/markdowns/page_6.md
+++ b/datalab_results/markdowns/page_6.md
@@ -2,7 +2,7 @@
-Figure 12 displays nine plots arranged in a 3x3 grid, comparing the True DTE (solid black line), Makarov lower bound (dashed red line), Makarov upper bound (dotted red line), and New lower bound (solid blue line). The x-axis ranges from 0 to 30, and the y-axis ranges from 0 to 1. The plots are labeled with parameters $k_1$ and $k_2$ in the top right corner:
+Figure 12 displays nine plots arranged in a 3x3 grid, comparing the True DTE (solid black line), Makarov lower bound (dashed red line), Makarov upper bound (dotted red line), and New lower bound (solid blue line). The x-axis ranges from 0 to 30, and the y-axis ranges from 0 to 1. The plots are labeled with parameters $k_1$ and $k_2$ in the top right corner of each subplot:
- Row 1: $k_1=1, k_2=1$ ; $k_1=1, k_2=10$ ; $k_1=1, k_2=40$
- Row 2: $k_1=5, k_2=1$ ; $k_1=5, k_2=10$ ; $k_1=5, k_2=40$
diff --git a/datalab_results/markdowns/page_69.md b/datalab_results/markdowns/page_69.md
index 0ddf5fb..0959cd7 100644
--- a/datalab_results/markdowns/page_69.md
+++ b/datalab_results/markdowns/page_69.md
@@ -4,34 +4,6 @@
## FONT NAME
-Helvetica Roman Bold 6pt
-
-Helvetica Roman Bold 7pt
-
-Helvetica Roman Bold 8pt
-
-Helvetica Roman Bold 9pt
-
-Helvetica Roman Bold 10pt
-
-Helvetica Roman Bold 11pt
-
-Helvetica Roman Bold 12pt
-
-Helvetica Roman Bold 14pt
-
-Helvetica Roman Bold 16pt
-
-Helvetica Roman Bold 18pt
-
-Helvetica Roman Bold 20pt
-
-Helvetica Roman Bold 24pt
-
-Helvetica Roman Bold 30pt
-
-Helvetica Roman Bold 36pt
-
| Point Size | Character Set |
|------------|---------------|
| 6 | COH40060 |
@@ -49,60 +21,27 @@ Helvetica Roman Bold 36pt
| 30 | COH400T0 |
| 36 | COH400Z0 |
+Helvetica Roman Bold 6pt
+Helvetica Roman Bold 7pt
+Helvetica Roman Bold 8pt
+Helvetica Roman Bold 9pt
+Helvetica Roman Bold 10pt
+Helvetica Roman Bold 11pt
+Helvetica Roman Bold 12pt
+Helvetica Roman Bold 14pt
+Helvetica Roman Bold 16pt
+Helvetica Roman Bold 18pt
+Helvetica Roman Bold 20pt
+**Helvetica Roman Bold 24pt**
+**Helvetica Roman Bold 30pt**
+**Helvetica Roman Bold 36pt**
+
Figure 52. Helvetica Roman Bold
# Courier
## FONT NAME
-Courier Roman Medium 7pt
-
-Courier Roman Medium 8pt
-
-Courier Roman Medium 10pt
-
-Courier Roman Medium 12pt
-
-Courier Roman Medium 14pt
-
-Courier Roman Medium 20pt
-
-Courier Roman Bold 7pt
-
-Courier Roman Bold 8pt
-
-Courier Roman Bold 10pt
-
-Courier Roman Bold 12pt
-
-Courier Roman Bold 14pt
-
-Courier Roman Bold 20pt
-
-Courier Italic 7pt
-
-Courier Italic 8pt
-
-Courier Italic 10pt
-
-Courier Italic 12pt
-
-Courier Italic 14pt
-
-Courier Italic 20pt
-
-Courier Italic Bold 7pt
-
-Courier Italic Bold 8pt
-
-Courier Italic Bold 10pt
-
-Courier Italic Bold 12pt
-
-Courier Italic Bold 14pt
-
-Courier Italic Bold 20pt
-
| Point Size | Character Set |
|------------|---------------|
| 7 | C0420070 |
@@ -130,4 +69,29 @@ Courier Italic Bold 20pt
| 14 | C04500D0 |
| 20 | C04500J0 |
+Courier Roman Medium 7pt
+Courier Roman Medium 8pt
+Courier Roman Medium 10pt
+Courier Roman Medium 12pt
+Courier Roman Medium 14pt
+**Courier Roman Medium 20pt**
+Courier Roman Bold 7pt
+Courier Roman Bold 8pt
+Courier Roman Bold 10pt
+Courier Roman Bold 12pt
+Courier Roman Bold 14pt
+**Courier Roman Bold 20pt**
+Courier Italic 7pt
+Courier Italic 8pt
+Courier Italic 10pt
+Courier Italic 12pt
+Courier Italic 14pt
+**Courier Italic 20pt**
+Courier Italic Bold 7pt
+Courier Italic Bold 8pt
+Courier Italic Bold 10pt
+Courier Italic Bold 12pt
+Courier Italic Bold 14pt
+**Courier Italic Bold 20pt**
+
Figure 53. Courier Font Samples
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_7.md b/datalab_results/markdowns/page_7.md
index 75d5820..d4c49f0 100644
--- a/datalab_results/markdowns/page_7.md
+++ b/datalab_results/markdowns/page_7.md
@@ -41,7 +41,7 @@ where $C$ is an integration constant. The singular part of Eq. (A15) is given
In this appendix we evaluate the singular contributions to the Green function at the shadow mass shell, $\omega\sim k_y$ to fourth order in the coupling constant. We start with the expression (A1) introduced in App. A1. In contrast to the discussion in App. A1 we anticipate the singularity at $\omega=k_y$ to come from the region $y_2\gg x_2$ , and introduce new variables accordingly, $x_2=\xi y_2$ , $y_1=\eta y_2$ . Performing integration over $y_2$ we obtain
-$$\Sigma^{(4)}=\mathrm{i}(Ja^d)^4\int_0^\infty d\xi\int_0^1d\eta\frac{\Gamma(3-4d)\eta^{-2d}(1-\eta)^{-2d}}{\left[(-\mathrm{i}((\omega-k_y)+(\omega-k_x)\xi)\right]^{3-4d}}\times\left[\frac{|(1-\eta)^2+\xi^2|^d|\eta^2+\xi^2|^d}{|1+\xi^2|^d|\xi|^{2d}}-1\right].$$
+$$\Sigma^{(4)}=\mathrm{i}(Ja^d)^4\int_0^\infty d\xi\int_0^1d\eta\frac{\Gamma(3-4d)\eta^{-2d}(1-\eta)^{-2d}}{\left[(-\mathrm{i}((\omega-k_y)+(\omega-k_x)\xi))\right]^{3-4d}}\times\left[\frac{|(1-\eta)^2+\xi^2|^d|\eta^2+\xi^2|^d}{|1+\xi^2|^d|\xi|^{2d}}-1\right].$$
(B1)
We notice that the singularity at $\omega\sim k_y$ comes from the region of small $\xi$ . Therefore we keep only the first term in the square brackets in Eq. (B1). After performing remaining integrations over $\xi$ we obtain
diff --git a/datalab_results/markdowns/page_79.md b/datalab_results/markdowns/page_79.md
index 24e854f..a45d5a6 100644
--- a/datalab_results/markdowns/page_79.md
+++ b/datalab_results/markdowns/page_79.md
@@ -4,17 +4,17 @@
IBM Cloud Pak for Automation is a containerized automation software platform with pre-integrated automation capabilities such as workflow and decision automation, content management, document processing, and operational intelligence (Figure 3-7 on page 43). This enables organizations to digitize all styles of work with AI-infused business-oriented tools and built-in operational analytics for visibility and governance. This offering empowers business users to rapidly deliver applications and services at enterprise scale for greater cost savings and operational efficiencies. The IBM Cloud Pak for Automation can run anywhere (on-premises, on private and public clouds, and in pre-integrated systems) and is Red Hat OpenShift certified.
-
+
-Diagram showing IBM containerized software components: Tasks, Workflow, Decisions, Content, Capture, and Operational Intelligence. Below this is Operational services (Logging, monitoring, security, identity access management) and Red Hat OpenShift.
+Diagram showing IBM containerized software components: Tasks, Workflow, Decisions, Content, Capture, and Operational Intelligence. Below these is Operational services (Logging, monitoring, security, identity access management) and Red Hat OpenShift.
Figure 3-7 IBM Cloud Pak for Automation
Successful enterprises look for modernizing their business operations with intelligent automation lowering costs and increasing revenue as shown in Figure 3-8.
-
+
-Diagram illustrating the benefits of IBM Cloud Pak for Automation. A vertical arrow points down from 'Improve top-line' to 'Reduce costs'. Under 'Reduce costs': Improve efficiency of their automated systems, Make employees more efficient, Extract information from unstructured data. Under 'Improve top-line': New business models, Find new opportunities for revenue growth, Deliver better (more personalized, more relevant...) products and services.
+Diagram illustrating the benefits of IBM Cloud Pak for Automation. A vertical arrow points down from 'Reduce costs' to 'Improve top-line'. Under Reduce costs: Improve efficiency of their automated systems, Make employees more efficient, Extract information from unstructured data. Under Improve top-line: New business models, Find new opportunities for revenue growth, Deliver better (more personalized, more relevant...) products and services.
Figure 3-8 IBM Cloud Pak for Automation benefits
diff --git a/datalab_results/markdowns/page_80.md b/datalab_results/markdowns/page_80.md
index 29b186d..28a820f 100644
--- a/datalab_results/markdowns/page_80.md
+++ b/datalab_results/markdowns/page_80.md
@@ -18,8 +18,8 @@ If you get an error message in Excel you might not get much help from the progra
An invalid cell reference error message occurs when a spreadsheet formula contains incorrect cell references.
-
+
-Screenshot of an Excel cell showing the formula bar displaying the formula =#REF!+L12. The cell D contains the error message #REF! with a warning icon. A red arrow points to the error message, labeled: #REF! error in an Excel formula.
+Screenshot of an Excel cell showing the formula bar displaying the formula =#REF!+L12. The cell itself displays the error message #REF! with a warning icon. A red arrow points to the error message, labeled: #REF! error in an Excel formula.
In above example, if you click on the cell that contains the #REF! error, you will see that the cell reference within the cell has been replaced with #REF!. Therefore, in order to fix this error, you need to re-enter the correct cell references into your formula.
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_81.md b/datalab_results/markdowns/page_81.md
index 705dd6b..c41242b 100644
--- a/datalab_results/markdowns/page_81.md
+++ b/datalab_results/markdowns/page_81.md
@@ -31,11 +31,15 @@ Proper care and storage of this instrument is essential. Please read the followi
4. After use, cover the instrument with the plastic dust cover.
5. If instrument is to be stored for an extended period of time, remove the eyepiece and oculars and store in a moisture-proof container.
+
+
+BARSKA logo
+
## MODEL AY11240/AY11238
-
+
-Diagrams showing the components of BARSKA Model AY11240 and Model AY11238 microscopes. Model AY11240 components include Eyepiece, Barrel, Revolving Turret, Objectives, Spring Clips, Stage, Concave Mirror, Stand, Coarse Adjustment Knob, Fine Adjustment Knob, and 5-Hole Diaphragm and Condenser. Model AY11238 components include Eyepiece, Monocular Tube, Eyepiece Set Screw, Rotating Head, Revolving Turret, Objectives, Spring Clips, Stage, 5-Hole Diaphragm and Condenser, Stand, Coarse Adjustment Knob, Fine Adjustment Knob, Lamp, Lamp On/Off Switch, and Power Cord.
+Diagrams showing the components of Model AY11240 and Model AY11238 microscopes. Model AY11240 components include: Eyepiece, Barrel, Revolving Turret, Objectives, Spring Clips, Stage, Concave Mirror, 5-Hole Diaphragm and Condenser, Stand, Coarse Adjustment Knob, and Fine Adjustment Knob. Model AY11238 components include: Eyepiece, Monocular Tube, Eyepiece Set Screw, Rotating Head, Revolving Turret, Objectives, Spring Clips, Stage, 5-Hole Diaphragm and Condenser, Stand, Coarse Adjustment Knob, Fine Adjustment Knob, Lamp, Lamp On/Off Switch, and Power Cord.
Model AY11240
@@ -47,4 +51,8 @@ BARSKA Model AY11240 and Model AY11238 are designed for biological studies such
## CONSTRUCTION
-BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90° vertical to 45° level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45° angle. The head rotates 360°. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.
\ No newline at end of file
+BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90° vertical to 45° level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45° angle. The head rotates 360°. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.
+
+
+
+BARSKA logo
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_83.md b/datalab_results/markdowns/page_83.md
index c7ecfc8..35f9100 100644
--- a/datalab_results/markdowns/page_83.md
+++ b/datalab_results/markdowns/page_83.md
@@ -2,7 +2,17 @@
The content of the welcome message is helpful when you need to notify users about some important information about the system, such as security warnings or a location description. To define and enable the welcome message by using the GUI, edit the text area with the message content and click **Save** (see Figure 5-80).
-Figure 5-80 shows the configuration screen for enabling the login message. The screen is divided into sections: Login (with General settings) and Login Message. The Login Message section contains the text: "The login message will be displayed to anyone logging into the GUI or in a CLI session." Below this, the setting "Login message: Enabled" is shown. The message content area contains the text: "This is an ITSO-managed system. Unauthorized access is restricted." Buttons for Save and Reset are visible.
+Figure 5-80 shows the configuration screen for enabling the login message.
+
+The screen is divided into sections: Login (with General) and Login Message.
+
+Under Login Message, the description reads: "The login message will be displayed to anyone logging into the GUI or in a CLI session."
+
+The checkbox for "Login message:" is checked, indicating it is Enabled.
+
+The text area contains the message: "This is an ITSO-managed system. Unauthorized access is restricted."
+
+Buttons visible are Save and Reset.
Figure 5-80 Enabling login message
@@ -10,7 +20,11 @@ The resulting log-in screen is shown in Figure 5-81.
-Figure 5-81 shows the Storwize V7000 Storage Management login screen (ITSO\_V7000G2\_A). It displays input fields for Username and Password, and a Sign In button. Below the input fields, the welcome message is displayed: "This is an ITSO-managed system. Unauthorized access is restricted."
+Figure 5-81 shows the Storwize V7000 Storage Management login screen (ITSO\_V7000G2\_A).
+
+The screen displays input fields for Username and Password, and a Sign In button.
+
+A banner message is displayed below the input fields, highlighted by a red oval: "This is an ITSO-managed system. Unauthorized access is restricted."
Figure 5-81 Welcome message in GUI
@@ -20,7 +34,7 @@ The banner message also appears in the CLI login prompt window, as shown in Figu
10.18.228.64 - PuTTY
login as: ITSO admin
This is an ITSO-managed system. Unauthorized access is restricted. Using keyboard-interactive authentication.
-Password:
+Password: [REDACTED]
```
Figure 5-82 Banner message in CLI
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_84.md b/datalab_results/markdowns/page_84.md
index 61e9252..22cbde7 100644
--- a/datalab_results/markdowns/page_84.md
+++ b/datalab_results/markdowns/page_84.md
@@ -13,7 +13,7 @@ Screenshot showing the navigation path to the Encryption Licenses section. The l
Figure 12-9 Expanding Encryption Licenses section on the Licensed Functions window
-3. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate License Manually**), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on page 617.
+1. The Encryption Licenses window displays information about your control enclosures. Right-click the enclosure on which you want to install an encryption license. This action opens a menu with two license activation options (**Activate License Automatically** and **Activate License Manually**), as shown in Figure 12-10. Use either option to activate encryption. For more information about how to complete an automatic activation process, see 12.3.4, “Activate the license automatically” on page 614. For more information about how to complete a manual activation process, see 12.3.5, “Activate the license manually” on page 617.
diff --git a/datalab_results/markdowns/page_87.md b/datalab_results/markdowns/page_87.md
index 7827200..142aefc 100644
--- a/datalab_results/markdowns/page_87.md
+++ b/datalab_results/markdowns/page_87.md
@@ -10,17 +10,17 @@ The operating expenses for the Other ATM Operations Sub-segment were \$2.4 milli
Direct operating costs in the Network Services Segment consist primarily of: ATM installation costs; ATM site rentals; and costs associated with maintaining ATMs, ATM telecommunications, interest on network cash and cash delivery and security services to ATMs. Such costs increased to \$24.4 million for the year ended December 31, 2000 from \$21.9 million for the year ended December 31, 1999. The increase in direct operating costs is primarily attributable to costs associated with operating the increased number of ATMs in the network during the periods. Also, intercompany allocations were made to charge the ATM operations with transaction switching and bank connection fees associated with the operations central processing center in Budapest. These allocations totalled \$3.5 million and \$2.9 million for the years ended December 31, 2000 and 1999, respectively. Direct operating costs for 2000 include a one-time gain of \$1.2 million due to a change in Hungarian law that eliminates a major portion of the Company's liability for import taxes on ATM hardware. Direct operating costs also include a \$657,000 gain realized in 1999 from the sale of the Croatian network assets. The components of direct operating costs for the years ended December 31, 2000 and 1999 were:
-| (in thousands) | Years ending December 31, | |
-|-----------------------------------------------|---------------------------|-----------|
-| | 2000 | 1999 |
-| ATM communication | \$ 4,183 | \$ 3,982 |
-| ATM cash filling and interest on network cash | 7,426 | 5,900 |
-| ATM maintenance | 3,987 | 2,967 |
-| ATM site rental | 2,258 | 2,421 |
-| ATM installation | 675 | 783 |
-| Transaction processing and ATM monitoring | 5,242 | 4,205 |
-| Other | 600 | 1,663 |
-| Total direct operating expenses | \$ 24,371 | \$ 21,921 |
+| (in thousands) | Years ending December 31, | |
+|--------------------------------------------------|----------------------------|----------------------------|
+| | 2000 | 1999 |
+| ATM communication | \$ 4,183 | \$ 3,982 |
+| ATM cash filling and interest on network cash | 7,426 | 5,900 |
+| ATM maintenance | 3,987 | 2,967 |
+| ATM site rental | 2,258 | 2,421 |
+| ATM installation | 675 | 783 |
+| Transaction processing and ATM monitoring | 5,242 | 4,205 |
+| Other | 600 | 1,663 |
+| Total direct operating expenses | \$ 24,371 | \$ 21,921 |
As a percentage of network revenue, direct operating costs fell from 83% for the year ended December 31, 1999 to 66% for the year ended December 31, 2000. On a per ATM basis the direct operating costs fell from \$12,782 per ATM for the year ended December 31, 1999 to \$9,807 per ATM for the year ended December 31, 2000, an improvement of 23%. On a per transaction basis the direct operating costs fell from \$0.66 per transaction for the year ended December 31, 1999 to \$0.46 per transaction for the year ended December 31, 2000, an improvement of 30%.
diff --git a/datalab_results/markdowns/page_91.md b/datalab_results/markdowns/page_91.md
index 4f35c5a..98a7d06 100644
--- a/datalab_results/markdowns/page_91.md
+++ b/datalab_results/markdowns/page_91.md
@@ -84,6 +84,6 @@ Corning, NY 14831-0001
02BR24601EN
-
+
-Corning logo with the tagline 'Discovering Beyond Imagination'
\ No newline at end of file
+Corning logo featuring a stylized blue and red graphic element above the word CORNING and the tagline Discovering Beyond Imagination.
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_92.md b/datalab_results/markdowns/page_92.md
index 4650d9f..086a822 100644
--- a/datalab_results/markdowns/page_92.md
+++ b/datalab_results/markdowns/page_92.md
@@ -30,9 +30,9 @@ Santos discovered gas in the United States at the Torres 1A onshore well, which
Other wells in the offshore Otway Basin included the deep water Amrit 1 well, which was plugged and abandoned after failing to intersect economic hydrocarbons, and Callister 1 which was also plugged and abandoned with gas shows.
-
+
-Portrait of Jacques Gouadain, Vice President of Geoscience and New Ventures.
+Portrait of Jacques Gouadain, Vice President, Geoscience and New Ventures.
'2004 was a great year for our explorers. We started drilling one of the most exciting portfolios in our industry and our success to date shows that our strategy of basin excellence is delivering.'
@@ -41,8 +41,8 @@ Portrait of Jacques Gouadain, Vice President of Geoscience and New Ventures.
Vice President
Geoscience and New Ventures
-
+
-Image of the float-off of the Jack Bates rig prior to deep water drilling operations offshore Otway Basin, Victoria.
+Image of the float-off of the Jack Bates rig prior to deep water drilling operations, offshore Otway Basin, Victoria.
Float-off of Jack Bates rig prior to deep water drilling operations, offshore Otway Basin, Victoria.
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_93.md b/datalab_results/markdowns/page_93.md
index 0c765c3..b9f8025 100644
--- a/datalab_results/markdowns/page_93.md
+++ b/datalab_results/markdowns/page_93.md
@@ -95,6 +95,6 @@ Aerial view of a large industrial or commercial complex, likely a refinery or pr
![YouTube logo]() [YOUTUBE.COM/CHESAPEAKEENERGY](#)
-
+
-FSC and MIX logos indicating paper from responsible sources. FSC logo includes the text 'www.fsc.org'. MIX logo includes the text 'Paper from responsible sources' and 'FSC® C101537'.
\ No newline at end of file
+FSC and MIX logos indicating paper from responsible sources.
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_94.md b/datalab_results/markdowns/page_94.md
index 61b16af..b818dd4 100644
--- a/datalab_results/markdowns/page_94.md
+++ b/datalab_results/markdowns/page_94.md
@@ -6,9 +6,9 @@
While credit is used for electronic transactions in Western Europe and North America, the model is quite different in many “cash-based” economies around the world. And that’s where Euronet continues to look for new opportunities – particularly in the emerging markets of Central Europe, the Middle East, Africa, Asia-Pacific, Latin America and the Caribbean.
-
+
-Map of Poland showing the country's shape and the word 'POLAND'.
+Map of Poland showing the country's shape and the word POLAND.
## The Promise of Emerging Markets
diff --git a/datalab_results/markdowns/page_95.md b/datalab_results/markdowns/page_95.md
index caa3959..273f263 100644
--- a/datalab_results/markdowns/page_95.md
+++ b/datalab_results/markdowns/page_95.md
@@ -54,6 +54,6 @@ Santos is committed to achieving effective emission reduction targets, to the pu
m3
-
+
-Line graph showing Oil Spill Volumes (m³) from 2001 to 2004. The volume was stable at approximately 500 m³ in 2001 and 2002. In 2003, the volume spiked to approximately 2000 m³, labeled 'Lyttton oil spill effect'. In 2004, the volume dropped back to approximately 50 m³.
\ No newline at end of file
+Line graph showing Oil Spill Volumes (m³) from 2001 to 2004. The volume was stable at approximately 500 m³ in 2001 and 2002. In 2003, the volume spiked to 2000 m³, labeled 'Lyttton oil spill effect'. In 2004, the volume dropped back to approximately 50 m³.
\ No newline at end of file
diff --git a/datalab_results/markdowns/page_96.md b/datalab_results/markdowns/page_96.md
index b0f1d55..7ba09f5 100644
--- a/datalab_results/markdowns/page_96.md
+++ b/datalab_results/markdowns/page_96.md
@@ -14,18 +14,12 @@ Because of its relatively low operating costs, the Eagle Ford remains profitable
-Bar chart showing Net Eagle Ford Drilling Locations (excluding contingent resources) from January 2013 to January 2015. The chart uses a dual Y-axis: the left axis measures the number of locations (0 to 200), and the right axis measures the drilling inventory in years (0 to 5.0).
+Bar chart showing Net Eagle Ford Drilling Locations (excluding contingent resources) from January 2013 to January 2015. The chart includes a line representing Drilling Inventory (Years).
-Legend:
-
-- PROVED (Blue)
-- PROBABLE AND POSSIBLE (Orange)
-- DRILLING INVENTORY (YEARS) (Gray line)
-
-| Period | PROVED | PROBABLE AND POSSIBLE | DRILLING INVENTORY (YEARS) |
+| Year | Proved | Probable and Possible | Drilling Inventory (Years) |
|--------|--------|-----------------------|----------------------------|
| JAN-13 | ~10 | ~100 | ~1.5 |
-| JAN-14 | ~10 | ~80 | ~1.0 |
+| JAN-14 | ~10 | ~80 | ~1.5 |
| JAN-15 | ~10 | ~150 | ~4.5 |
In 2014, the Company brought 35 gross (26.1 net) Eagle Ford wells into production by D&P investments of \$244 million. Through \$26 million of direct mineral leases and \$36 million of acquisitions in 2014, the Company increased its Eagle Ford acreage position to 20,742 net acres, which represents 153.7 net undrilled 3P Reserves locations.
@@ -69,4 +63,4 @@ As at and for the Year Ended 31 December 2014
-Map of Texas showing the Eagle Ford play area, divided into windows: Oil Window, Volatile Oil & Condensate Window, and Dry Gas Window. Key locations include Maverick, Atascosa, Dimmit, Live Oak, and McMullen. The map also indicates the SEA Field Office and SEA Acreage.
\ No newline at end of file
+Map of Texas showing the Eagle Ford Shale play area, divided into windows: Oil Window, Volatile Oil & Condensate Window, and Dry Gas Window. Key locations include Maverick, Atascosa, Dimmit, Live Oak, and McMullen. The map also indicates the SEA Field Office and SEA Acreage.
\ No newline at end of file
diff --git a/datalab_results/results.jsonl b/datalab_results/results.jsonl
index 4a3ffe7..b3abead 100644
--- a/datalab_results/results.jsonl
+++ b/datalab_results/results.jsonl
@@ -1,3 +1,3 @@
version https://git-lfs.github.com/spec/v1
-oid sha256:7a0daaaf495c5fa1466a0cfe68e3589c06b519ae00aa5fcec2361079d8db4068
-size 33969
+oid sha256:a7eaccefdcbab1f23bc8cec6de2e853cdc90d79aef9defb3d2911d51fbc4a859
+size 30904
diff --git a/gemini_results/markdowns/page_1.md b/gemini_results/markdowns/page_1.md
index 4d87c03..ab0bb6e 100644
--- a/gemini_results/markdowns/page_1.md
+++ b/gemini_results/markdowns/page_1.md
@@ -2,17 +2,15 @@ be formulated for the general SINR regime as follows:
$$
\begin{aligned}
-& \underset{p_{n,k,l}}{\text{minimize}}
-& & \log_2 \prod_{l=1}^{L} \prod_{k=1}^{K} \prod_{n=1}^{N} \left( \frac{\sigma^2 + I_{n,l}}{p_{n,k,l}h_{n,k,l} + \sigma^2 + I_{n,l}} \right)^{\alpha_{n,k,l}} \\
-& \text{subject to}
-& & \sum_{n=1}^{N} \alpha_{n,k,l}p_{n,k,l} \leq P_{k,\max}, \quad \forall k, \forall l
+\underset{p_{n,k,l}}{\text{minimize}} \quad & \log_2 \prod_{l=1}^L \prod_{k=1}^K \prod_{n=1}^N \left( \frac{\sigma^2 + I_{n,l}}{p_{n,k,l}h_{n,k,l} + \sigma^2 + I_{n,l}} \right)^{\alpha_{n,k,l}} \\
+\text{subject to} \quad & \sum_{n=1}^N \alpha_{n,k,l}p_{n,k,l} \leq P_{k,\max}, \quad \forall k, \forall l
\end{aligned} \tag{12}
$$
-Note that the numerator and denominator in (12) are posynomials and minimizing a ratio between two posynomials is referred to be a truly non-convex NP hard intractable problem known as complimentary GP. However, this problem can be transformed into GP by letting the denominator $f(p) = p_{n,k,l}h_{n,k,l} + \sigma^2 + I_{n,l} = \sum_{l=1}^{L} \sum_{k=1}^{K} u_{n,k,l}(p)$ and approximating the denominator $f(p)$ with a monomial using the arithmetic/geometric mean inequality as follows:
+Note that the numerator and denominator in (12) are posynomials and minimizing a ratio between two posynomials is referred to be a truly non-convex NP hard intractable problem known as complimentary GP. However, this problem can be transformed into GP by letting the denominator $f(p) = p_{n,k,l}h_{n,k,l} + \sigma^2 + I_{n,l} = \sum_{l=1}^L \sum_{k=1}^K u_{n,k,l}(p)$ and approximating the denominator $f(p)$ with a monomial using the arithmetic/geometric mean inequality as follows:
$$
-\sum_{l=1}^{L} \sum_{k=1}^{K} u_{n,k,l}(p) \geq \prod_{l=1}^{L} \prod_{k=1}^{K} \left( \frac{u_{n,k,l}(p)}{s_{n,k,l}} \right)^{s_{n,k,l}} \tag{13}
+\sum_{l=1}^L \sum_{k=1}^K u_{n,k,l}(p) \geq \prod_{l=1}^L \prod_{k=1}^K \left( \frac{u_{n,k,l}(p)}{s_{n,k,l}} \right)^{s_{n,k,l}} \tag{13}
$$
where $s_{n,k,l} = \frac{u_{n,k,l}(p_0)}{f(p_0)}$. Thus, the problem can be solved by extending the single condensation method presented in [14] for multi-cell scenario. The details of centralized scheme A are presented in Algorithm 2.
diff --git a/gemini_results/results.jsonl b/gemini_results/results.jsonl
index 68fbde9..945a068 100644
--- a/gemini_results/results.jsonl
+++ b/gemini_results/results.jsonl
@@ -1,3 +1,3 @@
version https://git-lfs.github.com/spec/v1
-oid sha256:e552aca38d6d094cd6d04810f126b5fafcfdca4a8f19d0a0bfd5ee926a9bac4a
-size 411972
+oid sha256:44c49f9f53bb886a634dc20df4fe56a362aa0d601c5c1ab206e11a7331c1e005
+size 412276
diff --git a/llama_parse_results/markdowns/page_10.md b/llama_parse_results/markdowns/page_10.md
index 40b7af9..b448c56 100644
--- a/llama_parse_results/markdowns/page_10.md
+++ b/llama_parse_results/markdowns/page_10.md
@@ -8,11 +8,11 @@ $$\sup_{\{B_k\}_{k=-\infty}^{\infty}} \sum_{k=-\infty}^{\infty} \max \{\mu_{0,W}
$$= \sup_{\{b_k\}_{k=-\infty}^{\infty}} \sum_{k=-\infty}^{\infty} \max \left\{ F_{0,W} (b_k|w) - F_{1,W} \left(\frac{t_1 - t_W}{t_0 - t_W} b_{k+1} - \frac{t_1 - t_0}{t_0 - t_W} w|w\right), 0 \right\}$$
-where $$\frac{t_0-t_W}{t_1-t_0}\delta + w \leq b_{k+1} \leq b_k$$. Consequently, the sharp upper bound is written as follows: letting $$F^U_{\Delta,W}(\delta|w)$$ be the sharp upper bound on $$\Pr(Y_1 - Y_0 \leq \delta|W = w)$$,
+where $$\frac{t_0-t_W}{t_1-t_0}\delta + w \leq b_{k+1} \leq b_k$$. Consequently, the sharp upper bound is written as follows: letting $$F_{\Delta,W}^U (\delta|w)$$ be the sharp upper bound on $$\Pr (Y_1 - Y_0 \leq \delta|W = w)$$,
-$$F^U_{\Delta}(\delta)$$
+$$F_{\Delta}^U (\delta)$$
-$$= \int F^U_{\Delta,W}(\delta|w) dF_W(w)$$
+$$= \int F_{\Delta,W}^U (\delta|w) dF_W (w)$$
$$= \int \left\{ 1 - \sup_{\{B_k\}_{k=-\infty}^{\infty}} \sum_{k=-\infty}^{\infty} \max \{\mu_{0,W} (B_k|w) - \mu_{1,W} (B_k^D|w), 0\} \right\} dF_W$$
diff --git a/llama_parse_results/markdowns/page_102.md b/llama_parse_results/markdowns/page_102.md
index 6d73420..0580304 100644
--- a/llama_parse_results/markdowns/page_102.md
+++ b/llama_parse_results/markdowns/page_102.md
@@ -1,7 +1,6 @@
-SELECTED STATISTICS
-(unaudited)
+# SELECTED STATISTICS (unaudited)
| | Three Month Period Ended
Dec. 31,2003 | Three Month Period Ended
Sept. 30,2003 | Three Month Period Ended
Jun. 30,2003 | Three Month Period Ended
Mar. 31,2003 | Three Month Period Ended
Dec. 31,2002 |
| ------------------------------------------------ | ----------------------------------------- | ------------------------------------------ | ----------------------------------------- | ----------------------------------------- | ----------------------------------------- |
@@ -35,7 +34,7 @@ SELECTED STATISTICS
| PCS Cash Cost Per User (CCPU) (4) | $36.31 | $40.05 | $ 44.23 | $45.87 | $53.52 |
-**PLANT FACILITIES AT DEC. 31, 2003**
+## PLANT FACILITIES AT DEC. 31, 2003
| | Telephone | CATV |
| -------------------------------------------------- | --------- | ---- |
diff --git a/llama_parse_results/markdowns/page_103.md b/llama_parse_results/markdowns/page_103.md
index c19409f..ce6b5f0 100644
--- a/llama_parse_results/markdowns/page_103.md
+++ b/llama_parse_results/markdowns/page_103.md
@@ -2,11 +2,13 @@
# Risk Management
+[Logo: Two overlapping diamond shapes in dark green and light green]
+
## Basic Approach
As risks in the financial services increase in diversity and complexity, risk management—identifying, measuring, and controlling risk—has never been more important in the management of a financial holding company.
-SMFG has encapsulated the basic principles to be employed in risk management in the manual entitled Regulations on Risk Management. In the manual, we have specified the basic policies for risk management: 1) Set forth SMFG's Groupwide basic policies for risk management after specifying the categories of risk to which these policies apply; 2) Provide all necessary guidance to Group companies to enable them to follow the basic risk management policies set forth by SMFG and set up their own appropriate risk management systems; and 3) Monitor the implementation of risk management by all Group companies to ensure that their practices meet the relevant standards.
+SMFG has encapsulated the basic principles to be employed in risk management in the manual entitled *Regulations on Risk Management*. In the manual, we have specified the basic policies for risk management: 1) Set forth SMFG's Groupwide basic policies for risk management after specifying the categories of risk to which these policies apply; 2) Provide all necessary guidance to Group companies to enable them to follow the basic risk management policies set forth by SMFG and set up their own appropriate risk management systems; and 3) Monitor the implementation of risk management by all Group companies to ensure that their practices meet the relevant standards.
## (1) Types of Risk to Be Managed
@@ -27,46 +29,42 @@ Top management plays an active role in determining SMFG's Groupwide basic polici
```mermaid
graph TB
SMFG[SMFG]
- BOD[Board of Directors]
- CA[Corporate Auditors]
- MC[Management Committee]
- EA[External Audit]
- DBM[Designated Board Members]
- AD[Audit Dept.]
+ BOD1[Board of Directors]
+ MC1[Management Committee]
+ DBM1[Designated Board Members]
+ CA1[Corporate Auditors]
+ EA1[External Audit]
+ AD1[Audit Dept.]
CRMD[Corporate Risk
Management
Dept.]
- CR[Credit Risk]
- MR[Market Risk]
- LR[Liquidity Risk]
- OR[Operational Risk]
-
- CWRMD[Corporate-wide
Risk Management
Corporate Planning Dept./
Corporate Risk
Management Dept.]
-
+ CR1[Credit Risk]
+ MR1[Market Risk]
+ LR1[Liquidity Risk]
+ OR1[Operational Risk]
GAD[General Affairs Dept.]
- PR[Processing Risk]
- ITPD[IT Planning Dept.]
- SR[System Risk]
-
- SMFG --> BOD
- BOD <--> CA
- BOD <--> MC
- MC <--> EA
- MC <--> DBM
- DBM <--> AD
-
- CRMD --> CR
- CRMD --> MR
- CRMD --> LR
- CRMD --> OR
-
- GAD --> PR
- ITPD --> SR
-
- CWRMD -.Report.-> SMBC_Group
-
- subgraph SMBC_Group[SMBC Group Companies]
+ PR1[Processing Risk]
+ ITPD1[IT Planning Dept.]
+ SR1[System Risk]
+
+ CWRM[Corporate-wide
Risk Management
Corporate Planning Dept./
Corporate Risk
Management Dept.]
+
+ SMFG --> BOD1
+ BOD1 <--> MC1
+ MC1 <--> DBM1
+ BOD1 --> CA1
+ MC1 --> EA1
+ DBM1 --> AD1
+
+ CRMD --> CR1
+ CRMD --> MR1
+ CRMD --> LR1
+ CRMD --> OR1
+ GAD --> PR1
+ ITPD1 --> SR1
+
+ subgraph Companies[SMBC Group Companies]
SMBC[SMBC]
- SMBCNS[SMBC Nikko
Securities]
+ SMBCN[SMBC Nikko
Securities]
SMFGCC[SMFG
Card & Credit]
SMC[Sumitomo
Mitsui Card]
CF[Cedyna
Financial]
@@ -74,69 +72,77 @@ graph TB
JRI[Japan
Research
Institute]
SMBCFS[SMBC
Friend
Securities]
end
+
+ AD1 -.Report.-> Companies
+ CWRM -.Guidance for
drafting of basic
policies
Monitoring.-> Companies
```
```mermaid
graph TB
BOD2[Board of Directors]
- CA2[Corporate Auditors]
SMBC2[SMBC]
+ SMBCN2[SMBC Nikko
Securities]
+ SMFGCC2[SMFG
Card & Credit]
+ SMC2[Sumitomo
Mitsui Card]
+ CF2[Cedyna
Financial]
+ SMFL2[Sumitomo Mitsui
Finance & Leasing]
+ JRI2[Japan
Research
Institute]
+ SMBCFS2[SMBC
Friend
Securities]
+
MC2[Management
Committee]
CRMC[Credit Risk
Management Committee]
MRMC[Market Risk
Management Committee]
- EA2[External Audit]
DBM2[Designated
Board Members]
BMCRMU[Board Member in Charge of Risk Management Unit]
- IAUL[Internal Audit Unit]
CIPD[Credit & Investment
Planning Dept.]
CRD[Credit Risk]
-
- RMU[Risk
Manage-
ment Unit]
- CRMD2[Corporate Risk
Management
Dept.]
MRD[Market Risk]
LRD[Liquidity Risk]
ORD[Operational Risk]
- SRD[Settle-
ment
Risk]
-
- BWRM[Bank-wide
Risk Management
Corporate Planning
Dept./Corporate Risk
Management Dept.]
+ RMU[Risk
Manage-
ment Unit]
+ CRMD2[Corporate Risk
Management
Dept.]
OPD[Operations Planning Dept.]
PRD[Processing Risk]
ITPD2[IT Planning Dept.]
- SRD2[System Risk]
+ SRD[System Risk]
OD[Other Departments]
- ORD2[Other Risks]
+ ORID[Other Risks]
- BOD2 <--> CA2
- BOD2 <--> MC2
- MC2 <--> CRMC
- MC2 <--> MRMC
- CRMC <--> EA2
- MRMC <--> EA2
+ SRD2[Settlement
Risk]
+
+ BWRM[Bank-wide
Risk Management
Corporate Planning
Dept./Corporate Risk
Management Dept.]
+ CA2[Corporate Auditors]
+ EA2[External Audit]
+ IAU[Internal Audit Unit]
+
+ BOD2 <--> MC2
+ MC2 --> CRMC
+ MC2 --> MRMC
MC2 <--> DBM2
- DBM2 <--> BMCRMU
- BMCRMU <--> IAUL
+ DBM2 --> BMCRMU
RMU --> CRMD2
- RMU --> OPD
- RMU --> ITPD2
- RMU --> OD
-
CIPD --> CRD
CRMD2 --> MRD
CRMD2 --> LRD
CRMD2 --> ORD
- CRMD2 --> SRD
-
OPD --> PRD
- ITPD2 --> SRD2
- OD --> ORD2
+ ITPD2 --> SRD
+ OD --> ORID
+
+ MRD --> SRD2
+
+ SRD2 --> BWRM
- IAUL --> BWRM
+ BOD2 --> CA2
+ CA2 --> EA2
+ BMCRMU --> IAU
+ IAU --> BWRM
```
32 SMFG 2011
diff --git a/llama_parse_results/markdowns/page_104.md b/llama_parse_results/markdowns/page_104.md
index 69c801a..8cf55a6 100644
--- a/llama_parse_results/markdowns/page_104.md
+++ b/llama_parse_results/markdowns/page_104.md
@@ -56,13 +56,13 @@ RCI common stock actively trades on the TSX and NYSE, with average daily trading
## ADJUSTED NET INCOME AND EARNINGS PER SHARE
-| Year | Adjusted Net Income ($ in billions) | Adjusted Diluted Earnings Per Share ($) |
-| ---- | ----------------------------------- | --------------------------------------- |
-| 2008 | $1.3 | $1.99 |
-| 2009 | $1.6 | $2.53 |
-| 2010 | $1.7 | $2.94 |
-| 2011 | $1.7 | $3.17 |
-| 2012 | $1.8 | $3.41 |
-| 2013 | $1.8 | $3.42 |
+| Year | Adjusted Net Income ($ billions) | Adjusted Diluted Earnings Per Share ($) |
+| ---- | -------------------------------- | --------------------------------------- |
+| 2008 | $1.3 | $1.99 |
+| 2009 | $1.6 | $2.53 |
+| 2010 | $1.7 | $2.94 |
+| 2011 | $1.7 | $3.17 |
+| 2012 | $1.8 | $3.41 |
+| 2013 | $1.8 | $3.42 |
diff --git a/llama_parse_results/markdowns/page_106.md b/llama_parse_results/markdowns/page_106.md
index 5e55ea7..9aee38e 100644
--- a/llama_parse_results/markdowns/page_106.md
+++ b/llama_parse_results/markdowns/page_106.md
@@ -1,6 +1,6 @@
-30 Annual Report 2004
+30 Santos Annual Report 2004
of, non-executive, independent Directors, except for the Environmental and Safety Committee, which includes the CEO as a member.
@@ -10,7 +10,7 @@ Executive management attend Board and Committee meetings, at which they report t
## 2.3 Composition of the Board
-The composition of the Board is determined in accordance with the Company's Constitution and the Board Guidelines which, among other things, require that:
+> The composition of the Board is determined in accordance with the Company's Constitution and the Board Guidelines which, among other things, require that:
> * the Board is to comprise a minimum of five and a maximum of ten Directors (exclusive of the CEO);
>
diff --git a/llama_parse_results/markdowns/page_107.md b/llama_parse_results/markdowns/page_107.md
index 2a1196e..968e8f1 100644
--- a/llama_parse_results/markdowns/page_107.md
+++ b/llama_parse_results/markdowns/page_107.md
@@ -37,10 +37,10 @@ To support continued innovation throughout the company, we made significant inve
| Year | Net Earnings Per Share (Dollars) |
| ---- | -------------------------------- |
-| 00 | 1.27 |
-| 01 | 1.36 |
-| 02 | 1.34 |
-| 03 | 1.34 |
+| 00 | 1.30 |
+| 01 | 1.39 |
+| 02 | 1.37 |
+| 03 | 1.37 |
| 04 | 1.65 |
diff --git a/llama_parse_results/markdowns/page_11.md b/llama_parse_results/markdowns/page_11.md
index 128decd..42e510a 100644
--- a/llama_parse_results/markdowns/page_11.md
+++ b/llama_parse_results/markdowns/page_11.md
@@ -38,15 +38,15 @@ $$I(X;B)_\rho + \lambda I(A\rangle BX)_\rho \leq I(X;B)_\theta + \lambda I(A\ran
where
-$$\rho^{XABE} \equiv \sum_x p_X(x) |x\rangle\langle x|^X \otimes U_{\mathcal{N}}^{A' \to BE}(\phi_x^{AA'}),$$
+$$\rho^{XABE} \equiv \sum_x p_X(x) |x\rangle\langle x|^X \otimes U_{\mathcal{N}}^{A' \rightarrow BE}(\phi_x^{AA'}),$$
-$$\theta^{XABE} \equiv \sum_x p_X(x) |x\rangle\langle x|^X \otimes U_{\mathcal{N}}^{A' \to BE}(\varphi_x^{AA'}),$$
+$$\theta^{XABE} \equiv \sum_x p_X(x) |x\rangle\langle x|^X \otimes U_{\mathcal{N}}^{A' \rightarrow BE}(\varphi_x^{AA'}),$$
-$$U_{\mathcal{N}}^{A' \to BE}$$ is an isometric extension of $$\mathcal{N}$$, $$\varphi_x^{A'} = \Delta(\varphi_x^{A'}) = \Delta(\phi_x^{A'})$$, and $$\Delta$$ is the completely dephasing channel.
+$$U_{\mathcal{N}}^{A' \rightarrow BE}$$ is an isometric extension of $$\mathcal{N}$$, $$\varphi_x^{A'} = \Delta(\varphi_x^{A'}) = \Delta(\phi_x^{A'})$$, and $$\Delta$$ is the completely dephasing channel.
**Proof.** The proof of this lemma is similar to the proof of Lemma 9 in Ref. [71]. Consider another classical-quantum state $$\sigma$$ in addition to the two presented in the statement of the theorem:
-$$\sigma^{XAYE} \equiv \sum_x p_X(x) |x\rangle\langle x|^X \otimes (\Delta^{B \to Y} \circ U_{\mathcal{N}}^{A' \to BE})(\phi_x^{AA'}).$$
+$$\sigma^{XAYE} \equiv \sum_x p_X(x) |x\rangle\langle x|^X \otimes (\Delta^{B \rightarrow Y} \circ U_{\mathcal{N}}^{A' \rightarrow BE})(\phi_x^{AA'}).$$
Then the following chain of inequalities holds for all $$\lambda \geq 1$$:
@@ -64,8 +64,8 @@ $$\frac{1}{2}|0\rangle\langle 0|^X \otimes \psi_0^{AA'} + \frac{1}{2}|1\rangle\l
where $$\psi_0^{AA'}$$ and $$\psi_1^{AA'}$$ are pure states, defined as follows for $$\mu \in [0, 1/2]$$:
-$$\text{Tr}_A\left\{\psi_0^{AA'}\right\} = \mu |0\rangle\langle 0|^{A'} + (1 - \mu) |1\rangle\langle 1|^{A'}, \qquad (D2)$$
+$$\text{Tr}_A\left\{\psi_0^{AA'}\right\} = \mu |0\rangle\langle 0|^{A'} + (1-\mu) |1\rangle\langle 1|^{A'}, \qquad (D2)$$
-$$\text{Tr}_A\left\{\psi_1^{AA'}\right\} = (1 - \mu) |0\rangle\langle 0|^{A'} + \mu |1\rangle\langle 1|^{A'}. \qquad (D3)$$
+$$\text{Tr}_A\left\{\psi_1^{AA'}\right\} = (1-\mu) |0\rangle\langle 0|^{A'} + \mu |1\rangle\langle 1|^{A'}. \qquad (D3)$$
**Proof.** We assume without loss of generality that the dephasing basis is the computational basis. Consider a
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_112.md b/llama_parse_results/markdowns/page_112.md
index fbaa37d..179b712 100644
--- a/llama_parse_results/markdowns/page_112.md
+++ b/llama_parse_results/markdowns/page_112.md
@@ -40,10 +40,10 @@ Synthesis Example 1
Resin P-14
-[0494] Resin P-14 was synthesized according to the following scheme.
+[0494] Resin P-14 was synthesized according to the following scheme:
-[Chemical synthesis scheme showing transformation of compound (5) to (6) to (7) to (8):
-- Compound (5): 4-vinylphenyl acetate with structure showing vinyl group attached to benzene ring with acetate ester group
-- Compound (6): 4-vinylphenol with structure showing vinyl group attached to benzene ring with hydroxyl group
-- Compound (7): 4-vinylphenyl perfluorobutanesulfonate with structure showing vinyl group attached to benzene ring with O-SO2-C4F9 group
-- Compound (8): Sodium 4-vinylphenyl perfluorobutanesulfonate with structure showing vinyl group attached to benzene ring with O-SO2-C4F8-SO3Na group]
\ No newline at end of file
+[Chemical synthesis scheme showing transformation from compound (5) to (6) to (7) to (8):
+- Compound (5): 4-vinylphenyl acetate
+- Compound (6): 4-vinylphenol (OH group)
+- Compound (7): 4-vinylphenyl perfluorobutanesulfonate (with O=S=O group and three F-F bonds, SO2F end group)
+- Compound (8): 4-vinylphenyl perfluorobutanesulfonate sodium salt (with O=S=O group and three F-F bonds, SO3Na end group)]
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_114.md b/llama_parse_results/markdowns/page_114.md
index 355ddbc..a6fbed5 100644
--- a/llama_parse_results/markdowns/page_114.md
+++ b/llama_parse_results/markdowns/page_114.md
@@ -4,7 +4,7 @@ US 2020/0050106 A1 40
-continued
-[Chemical structure: A triphenyl imidazole compound with three phenyl groups attached to an imidazole ring with an NH group]
+[Chemical structure: A triphenyl imidazole compound with three phenyl groups attached to an imidazole ring with N-H]
[Chemical structure: A long-chain molecule with hydroxyl groups at both ends, containing amine and ether linkages in the middle portion, with multiple branching chains]
@@ -12,7 +12,7 @@ US 2020/0050106 A1 40
[Chemical structure: A zwitterionic compound with a long hydrocarbon chain containing a positively charged nitrogen and a carboxylate group]
-[Chemical structure: A dicyclohexyl carbodiimide-like compound with three cyclohexyl groups attached to a central guanidine structure]
+[Chemical structure: A tricyclohexyl urea derivative with three cyclohexyl groups attached to a central urea moiety]
[Chemical structure: A cyclic ether compound with a cyclohexyl substituent and multiple ether linkages forming a crown-like structure]
diff --git a/llama_parse_results/markdowns/page_116.md b/llama_parse_results/markdowns/page_116.md
index b2f08e5..62054a1 100644
--- a/llama_parse_results/markdowns/page_116.md
+++ b/llama_parse_results/markdowns/page_116.md
@@ -2,7 +2,9 @@
US 9,423,690 B2
-# 1 PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME
+# 1
+
+# PATTERN FORMING METHOD, ELECTRON BEAM-SENSITIVE OR EXTREME ULTRAVIOLET RAY-SENSITIVE RESIN COMPOSITION, RESIST FILM, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND ELECTRONIC DEVICE USING THE SAME
## CROSS-REFERENCE TO RELATED APPLICATION
diff --git a/llama_parse_results/markdowns/page_118.md b/llama_parse_results/markdowns/page_118.md
index efed0cc..94f439b 100644
--- a/llama_parse_results/markdowns/page_118.md
+++ b/llama_parse_results/markdowns/page_118.md
@@ -1,6 +1,6 @@
-19 EP 1 499 943 B1 20
+19 EP 1 499 943 B1 20
Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungslogik ein Signal vom Programm empfängt.
@@ -22,9 +22,7 @@ Betriebsspannung der ersten integrierten Schaltung, wobei die Spannungsregelungs
**23.** Maschinenlesbares Medium, das Anweisungen bereitstellt, die bei Ausführung durch eine Maschine bewirken, dass die Maschine Operationen durchführt, umfassend:
-Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; wenn das Ereignis ein vom Benutzer eingelei-
-
-tetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens des Benutzerereignisses, wenn das Ereignis ein von Software eingeleitetes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand.
+Detektieren (402) eines Ereignisses, um eine integrierte Schaltung eines Computersystems in einen höheren Performance-Zustand zu versetzen, wobei die integrierte Schaltung mehrere Performance-Zustände aufweist einschließlich eines ersten Performance-Zustandes, eines zweiten Performance-Zustands, der höher als der erste Performance-Zustand ist, und eines dritten Performance-Zustandes, der höher als der zweite Performance-Zustand ist, und Bestimmen (404), ob das Ereignis ein vom Benutzer eingeleitetes Ereignis oder ein von Software eingeleitetes Ereignis ist; wenn das Ereignis ein vom Benutzer eingeleitetes Ereignis ist, direktes Versetzen (406) der integrierten Schaltung aus dem ersten Performance-Zustand in den dritten Performance-Zustand auf Basis des Detektierens des Benutzerereignisses, wenn das Ereignis ein von Software eingeleitetes Ereignis ist, Versetzen (408) der integrierten Schaltung aus dem ersten Performance-Zustand in den zweiten Performance-Zustand.
**24.** Maschinenlesbares Medium nach Anspruch 23, ferner umfassend Anweisungen, die bei Ausführung durch die Maschine bewirken, dass die Maschine die weiteren Operationen durchführt, umfassend:
diff --git a/llama_parse_results/markdowns/page_12.md b/llama_parse_results/markdowns/page_12.md
index 3b0f043..956c536 100644
--- a/llama_parse_results/markdowns/page_12.md
+++ b/llama_parse_results/markdowns/page_12.md
@@ -19,31 +19,54 @@ Association count
**C**
-Partitions identified using Louvain (Louvain)
-
Partitions identified using Louvain
-| 60
50
40
30
20
10
0 |
-| ------------------------------------------- |
-
-
Rand index (standardized, Louvain)
+60
+50
+40
+30
+20
+10
+0
+
**D**
-| Number of events | 1100
1000
900
800
700
600
500
400
300
200 |
-| --------------------------------------------------- | ----------------------------------------------------------------------------- |
-| 10 20 30 40 50 60 70 80
Mean Z-score Rand index | |
+Number of events
+
+1100
+1000
+900
+800
+700
+600
+500
+400
+300
+200
+10 20 30 40 50 60 70 80
+
+Mean Z-score Rand index
**E**
-| Mean z-score Rand index & event count (standardized) | 0.6
0.4
0.2
0
-0.2
-0.4
-0.6 |
-| ---------------------------------------------------- | ---------------------------------------------------- |
-| 0 10 20 30 40 50 60 70 80
Subject ID | |
+Mean z-score Rand index & event count (standardized)
+
+0.6
+0.4
+0.2
+0
+-0.2
+-0.4
+-0.6
+0 10 20 30 40 50 60 70 80
-> **Figure 5: Partition degeneracy and correlation with excursion count.** (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlations.
+Subject ID
+
+**Figure 5: Partition degeneracy and correlation with excursion count.** (A) As an example, we show the set of 100 partitions obtained by maximizing modularity for a single instance of dFC (169 events). (B) The association matrix for this set of partitions. Each element in the association matrix counts the number of times that two nodes were assigned to the same partition. The node order is the same as in Figure 4. (C) Matrix of z-score Rand indices for all pairs of the 100 partitions shown in panel (A). (D) We show the scatterplot of mean z-score Rand index for each time point plotted against the event count, both calculated at the same time point, for one representative participant. (E) Correlation coefficients for z-score Rand index and event count plotted across participants. Note that of the 80 participants, only four exhibited negative correlations.
**A** Δjj (across all participants)
@@ -64,17 +87,18 @@ Rand index (standardized, Louvain)
**C**
-| Percentage change in community co-assignment | 60
50
40
30
20
10
0 |
-| -------------------------------------------- | ------------------------------------------- |
-| Nodes (ordered by rank) | |
+Percentage change in community co-assignment
+
+| 60 | ■CONT |
+| -- | ----- |
+| 50 | ■DMN |
+| 40 | ■DAN |
+| 30 | ■LIM |
+| 20 | ■VAN |
+| 10 | ■SMN |
+| 0 | ■VIS |
-■CONT
-■DMN
-■DAN
-■LIM
-■VAN
-■SMN
-■VIS
+Nodes (ordered by rank)
-> **Figure 6: Default mode network dissociates during mass-excursions.** A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during non-excursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN.
\ No newline at end of file
+**Figure 6: Default mode network dissociates during mass-excursions.** A) Mean difference in association matrices constructed during non-mass excursions and excursions. B) Node pairs that were statistically more or less likely to be observed in the same community during non-excursions compared to excursions. The network labels are taken from Yeo et al. (2011), with labels corresponding to networks for control (CONT), default mode (DMN), dorsal attention (DAN), limbic (LIM), ventral attention (VAN), somatomotor network (SMN), and visual (VIS). C) We sum the rows of the matrix in panel B) to identify regions that that consistently change their community co-assignments with other regions. The regions that change the most are predominantly regions associated with DMN.
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_121.md b/llama_parse_results/markdowns/page_121.md
index 26619e1..be7d4ec 100644
--- a/llama_parse_results/markdowns/page_121.md
+++ b/llama_parse_results/markdowns/page_121.md
@@ -1,41 +1,37 @@
-US 2012/0003590 A1 Jan. 5, 2012
+US 2012/0003590 A1 Jan. 5, 2012
60
-continued
-[Chemical structure: Polymer chain with CH2-CH repeating unit connected to a benzene ring with an oxygen substituent. The oxygen is connected to a sulfonyl group (O=S=O) with fluorine atoms. Below this is a complex counter-ion structure containing a central positively charged atom with three benzene rings, two of which have methoxy (OMe) substituents.]
+[Chemical structure showing a polymer chain with CH2-CH repeating units, containing a phenyl ring with an oxygen substituent connected to a sulfonyl group (O=S=O) with fluorine atoms and a negatively charged nitrogen oxide group (N⊖O), and another sulfonyl group with fluorine atoms. Adjacent to this is a structure showing MeO-substituted triphenyl cation with OMe groups]
P-54
-[Chemical structure: Polymer chain showing -CH2-C(CH3)- repeating unit connected to a carbonyl ester group, which is connected to a benzene ring with a biphenyl substituent.]
+[Chemical structure showing a polymer chain with CH2-C(CH3) repeating units, containing a phenyl ring with an ester linkage (O-C=O) connected to a phenyl group, and another CH2-CH unit with a phenyl ring connected to a sulfonyl group (O=S=O) with fluorine atoms and a negatively charged sulfonate group (SO3⊖)]
-continued
-[Chemical structure: Similar polymer chain with benzene ring connected to sulfonyl group with fluorine atoms and a negatively charged SO3 group.]
+[Chemical structure showing a polymer chain with CH2-C(CH3) repeating units, containing an ester group (O-C=O) connected to an anthracene moiety, and a CH2-CH unit with a biphenyl group with an OH substituent]
-[Chemical structure: Complex counter-ion showing a central positively charged atom with three benzene rings, two having methoxy (OMe) groups.]
+[Chemical structure showing a MeO-substituted triphenyl cation with OMe groups]
-[Chemical structure: Polymer chain with CH2-CH repeating unit connected to benzene ring with biphenyl substituent and OH group.]
-
-[Chemical structure: Polymer chain with -CH2-C(CH3)- repeating unit connected to carbonyl ester group attached to an anthracene structure.]
-
-[Chemical structure: Polymer chain with CH2-CH repeating unit connected to benzene ring with oxygen substituent connected to sulfonyl group with fluorine atoms and negatively charged SO3 group. Counter-ion shows triphenyl structure with positive charge.]
-
-P-55
-
-[Chemical structure: Two polymer chains - one with CH2-CH repeating unit connected to benzene ring with biphenyl and OH substituents, and another with -CH2-C(CH3)- repeating unit connected to carbonyl ester group attached to naphthalene ring with OMe substituent.]
+[Chemical structure showing a polymer chain with CH2-CH repeating units, containing a phenyl ring with an oxygen substituent connected to a sulfonyl group (O=S=O) with fluorine atoms and a negatively charged sulfonate group (SO3⊖), and a triphenyl cation structure]
[0317] The composition of the present invention may further contain a photo-acid generator, a basic compound, a surfactant, a solvent, a dye, a photo-base generator, an anti-oxidant, a solvent and the like. These components are described below.
-(Photo-Acid Generator)
+(Photo-Acid Generator)
[0318] The composition of the present invention may further contain a photo-acid generator in addition to the repeating unit (A) and the repeating unit (B).
[0319] The photo-acid generator is a compound capable of generating an acid upon irradiation with an actinic ray or radiation. The photo-acid generator which can be used may be appropriately selected, for example, from a photo-initiator for cationic photopolymerization, a photo-initiator for radical photopolymerization, a photo-decoloring agent, a photo-discoloring agent, known compounds capable of generating an acid upon irradiation with an actinic ray or radiation, which are used for microresist or the like, and a mixture thereof. Examples thereof include an onium salt such as sulfonium salt and iodonium salt, and a diazodisulfone compound such as bis(alkylsulfonyl diazomethane).
+P-55
+
+[Chemical structure showing a polymer chain with CH2-CH repeating units containing a biphenyl group with an OH substituent, and a CH2-C(CH3) unit with an ester linkage (O-C=O) connected to a naphthyl group with an OMe substituent]
+
[0320] Preferred examples of the photo-acid generator include compounds represented by the following formulae (ZI), (ZII) and (ZIII):
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_122.md b/llama_parse_results/markdowns/page_122.md
index ae8c1f2..adcdf25 100644
--- a/llama_parse_results/markdowns/page_122.md
+++ b/llama_parse_results/markdowns/page_122.md
@@ -14,20 +14,36 @@
(22) Anmeldetag: **02.10.2019**
-(84) Benannte Vertragsstaaten: **AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR** Benannte Erstreckungsstaaten: **BA ME** Benannte Validierungsstaaten: **KH MA MD TN**
+(84) Benannte Vertragsstaaten:
+**AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR**
+Benannte Erstreckungsstaaten:
+**BA ME**
+Benannte Validierungsstaaten:
+**KH MA MD TN**
-(71) Anmelder: **Dienes Werke für Maschinenteile GmbH & Co. KG 51491 Overath (DE)**
+(71) Anmelder: **Dienes Werke für Maschinenteile GmbH & Co. KG
+51491 Overath (DE)**
(72) Erfinder:
-* **Thielen, Rolf 50733 Köln (DE)**
+• **Thielen, Rolf
+50733 Köln (DE)**
-(51) Int Cl.: **B26D 1/16 (2006.01) B26D 1/18 (2006.01) B26D 5/00 (2006.01) B26D 7/26 (2006.01) B23Q 17/09 (2006.01)**
+(51) Int Cl.:
+**B26D 1/16 (2006.01) B26D 1/18 (2006.01)
+B26D 5/00 (2006.01) B26D 7/26 (2006.01)
+B23Q 17/09 (2006.01)**
-* **Klöcker, Gerd 51061 Köln (DE)**
+• **Klöcker, Gerd
+51061 Köln (DE)**
-(74) Vertreter: **Feucker, Max Martin et al Becker & Müller Patentanwälte Turmstraße 22 40878 Ratingen (DE)**
+(74) Vertreter: **Feucker, Max Martin et al
+Becker & Müller
+Patentanwälte
+Turmstraße 22
+40878 Ratingen (DE)**
-Bemerkungen: Geänderte Patentansprüche gemäss Regel 137(2) EPÜ.
+Bemerkungen:
+Geänderte Patentansprüche gemäss Regel 137(2) EPÜ.
(54) **SENSORVORRICHTUNG FÜR EINEN MESSERHALTER**
@@ -36,7 +52,7 @@ Bemerkungen: Geänderte Patentansprüche gemäss Regel 137(2) EPÜ.
- mindestens einen an dem Grundkörper (6) befestigten Sensor (7) zur Erfassung einer Größe und
- einen an dem Grundkörper (6) befestigten Sender (8) zur kabellosen Übertragung der von dem Sensor (7) erfassten Größe.
-[Technical drawing showing a mechanical device with numbered components: 1, 2, 3, 4, 5, 7, 11. The drawing depicts what appears to be a sensor mounting device with a cylindrical base (labeled with numbers 2, 3, 4, 5) and an upper mounting structure (labeled 11). Component 7 appears to be positioned on the cylindrical portion. The drawing is labeled "Fig. 1" at the bottom right.]
+[Technical drawing showing a mechanical device with numbered components: 1, 2, 3, 4, 5, 7, 11. The drawing depicts what appears to be a sensor mounting device with cylindrical and rectangular components arranged vertically. The figure is labeled "Fig. 1"]
**EP 3 800 018 A1**
diff --git a/llama_parse_results/markdowns/page_124.md b/llama_parse_results/markdowns/page_124.md
index f4fb4bb..917da2d 100644
--- a/llama_parse_results/markdowns/page_124.md
+++ b/llama_parse_results/markdowns/page_124.md
@@ -1,49 +1,48 @@
-US006482565B1
+# United States Patent
-# (12) United States Patent
**Jung et al.**
**(10) Patent No.: US 6,482,565 B1**
**(45) Date of Patent: Nov. 19, 2002**
-## (54) PHOTORESIST CROSS-LINKER AND PHOTORESIST COMPOSITION COMPRISING THE SAME
+**(54) PHOTORESIST CROSS-LINKER AND PHOTORESIST COMPOSITION COMPRISING THE SAME**
-(75) Inventors: **Jae Chang Jung; Keun Kyu Kong; Myoung Soo Kim; Hyoung Gi Kim; Hyeong Soo Kim; Ki Ho Baik,** all of Kyoungki-do (KR)
+**(75) Inventors: Jae Chang Jung; Keun Kyu Kong; Myoung Soo Kim; Hyoung Gi Kim; Hyeong Soo Kim; Ki Ho Baik, all of Kyoungki-do (KR)**
-(73) Assignee: **Hyundai Electronics Industries Co., Ltd.** (KR)
+**(73) Assignee: Hyundai Electronics Industries Co., Ltd. (KR)**
-( * ) Notice: Subject to any disclaimer, the term of this patent is extended or adjusted under 35 U.S.C. 154(b) by 0 days.
+**(*) Notice: Subject to any disclaimer, the term of this patent is extended or adjusted under 35 U.S.C. 154(b) by 0 days.**
-(21) Appl. No.: **09/448,964**
+**(21) Appl. No.: 09/448,964**
-(22) Filed: **Nov. 24, 1999**
+**(22) Filed: Nov. 24, 1999**
-## (30) Foreign Application Priority Data
+**(30) Foreign Application Priority Data**
-Nov. 27, 1998 (KR) ............................................. 98-51356
-Feb. 22, 1999 (KR) .............................................. 99-5825
+Nov. 27, 1998 (KR) ............................................ 98-51356
+Feb. 22, 1999 (KR) ............................................. 99-5825
-(51) **Int. Cl.7** ................................................ **G03F 7/004**
+**(51) Int. Cl.7 ................................................ G03F 7/004**
-(52) **U.S. Cl.** .................... **430/270.1; 430/325; 526/266; 526/320; 526/271; 549/347; 549/369; 549/430**
+**(52) U.S. Cl. .................... 430/270.1; 430/325; 526/266; 526/320; 526/271; 549/347; 549/369; 549/430**
-(58) **Field of Search** .............................. **430/270.1, 325; 549/347, 369, 430; 526/266, 320, 271**
+**(58) Field of Search .............................. 430/270.1, 325; 549/347, 369, 430; 526/266, 320, 271**
-## (56) References Cited
+**(56) References Cited**
-### U.S. PATENT DOCUMENTS
+**U.S. PATENT DOCUMENTS**
-| 3,468,857 A | 9/1969 | Graver ...................... | 260/80.3 |
-| ----------- | ---------- | ------------------------------- | --------- |
-| 5,049,463 A | \* 9/1991 | Kato et al. ................... | 430/49 |
-| 5,059,698 A | \* 10/1991 | Schulthess et al. ......... | 549/375 |
-| 5,412,041 A | \* 5/1995 | Lesko et al. ................ | 525/340 |
-| 6,060,212 A | \* 5/2000 | McCulloch et al. ..... | 430/270.1 |
+| 3,468,857 A | 9/1969 | Graver ...................... | 260/80.3 |
+| ----------- | --------- | ------------------------------- | --------- |
+| 5,049,463 A | \* 9/1991 | Kato et al. ................... | 430/49 |
+| 5,059,698 A | 10/1991 | Schulthess et al. ......... | 549/375 |
+| 5,412,041 A | \* 5/1995 | Lesko et al. ................ | 525/340 |
+| 6,060,212 A | \* 5/2000 | McCulloch et al. ..... | 430/270.1 |
-### FOREIGN PATENT DOCUMENTS
+**FOREIGN PATENT DOCUMENTS**
| DE | 3714276 A1 | 11/1988 |
| -- | ------------ | ---------- |
@@ -56,7 +55,7 @@ Feb. 22, 1999 (KR) .............................................. 99-5825
| WO | WO 99/61497 | 12/1999 |
-### OTHER PUBLICATIONS
+**OTHER PUBLICATIONS**
1970:100663 Caplus Abstract.*
1971:65746 Caplus Abstract.*
@@ -73,16 +72,16 @@ Anionic polymerizabilities of 2-vinyl-1,3-dioxolane and 2-vinyl-1,3-dioxane, Yam
Chemical Abstract No. 131:337017 & JP 11315075.
Chemical Abstract No. 128:295769 & JP 10088419.
Chemical Abstract No. 118:102825 & J. Maslinska-Solich et al., React. Polym. (1992), 18(2), 159-166.
-J.Maslinska-Solich et al., "Studies on Co(II) and Mn(II) complesex of some maleic anhydride copolymers," *Reactive Polymers,* vol. 18, 1992, pp. 159-166.
+J.Maslinska-Solich et al., "Studies on Co(II) and Mn(II) complesex of some maleic anhydride copolymers," Reactive Polymers, vol. 18, 1992, pp. 159-166.
* cited by examiner
-*Primary Examiner*—Rosemary E. Ashton
-(74) *Attorney, Agent, or Firm*—Townsend and Townsend and Crew LLP
+Primary Examiner—Rosemary E. Ashton
+(74) Attorney, Agent, or Firm—Townsend and Townsend and Crew LLP
-## (57) ABSTRACT
+**(57) ABSTRACT**
-The present invention relates to a cross-linker for use in a photoresist which is suitable for a photolithography process using KrF (248 ru), ArF (193 nm), E-beam, ion beam or EUV light source. According to the present invention, preferred cross-linkers comprise a copolymer having repeating units derived from: (i) a compound represented by following Chemical Formula 1 and/or (ii) one or more compound(s) selected from the group consisting of acrylic acid, methacrylic acid and maleic anhydride.
+The present invention relates to a cross-linker for use in a photoresist which is suitable for a photolithography process using KrF (248 ru), ArF (193 nm), E-beam, ion beam or EUV light source. According to the present invention, preferred cross-linkers comprise a copolymer having repeating units derived from: (i) a compound represented by following Chemical Formula 1 and/or (ii) one or more compound(s) selected from the group consisting of acrylic acid, meth-acrylic acid and maleic anhydride.
@@ -91,16 +90,14 @@ The present invention relates to a cross-linker for use in a photoresist which i
|
H₂C═C
|
- ⌈─⌉
- │ │ₘ
- ⌊─⌋
+ ⌈-⌉
+ | | m
+ ⌊-⌋
O
- ╱ ╲
- N R₂
- ╲ ╱
- R₁
+ / \
+ R₁ R₂
```
-wherein, R₁, R₂ and R individually represent straight or branched C₁₋₁₀ alkyl, straight or branched C₁₋₁₀ ester, straight or branched C₁₋₁₀ ketone, straight or branched C₁₋₁₀ carboxylic acid, straight or branched C₁₋₁₀ acetal, straight or branched C₁₋₁₀ alkyl including at least one hydroxyl group, straight or branched C₁₋₁₀ ester including at least one hydroxyl group, straight or branched C₁₋₁₀ ketone including at least one hydroxyl group, straight or branched C₁₋₁₀ carboxylic acid including at least one hydroxyl group, and straight or branched C₁₋₁₀ acetal including at least one hydroxyl group; R₃ represents hydrogen or methyl; m represents 0 or 1; and n represents a number of 1 to 5.
+wherein, R₁, R₂ and R individually represent straight or branched C1-10 alkyl, straight or branched C1-10 ester, straight or branched C1-10 ketone, straight or branched C1-10 carboxylic acid, straight or branched C1-10 acetal, straight or branched C1-10 alkyl including at least one hydroxyl group, straight or branched C1-10 ester including at least one hydroxyl group, straight or branched C1-10 ketone including at least one hydroxyl group, straight or branched C1-10 carboxylic acid including at least one hydroxyl group, and straight or branched C1-10 acetal including at least one hydroxyl group; R₃ represents hydrogen or methyl; m represents 0 or 1; and n represents a number of 1 to 5.
**16 Claims, 5 Drawing Sheets**
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_125.md b/llama_parse_results/markdowns/page_125.md
index c434fb4..8eb322f 100644
--- a/llama_parse_results/markdowns/page_125.md
+++ b/llama_parse_results/markdowns/page_125.md
@@ -24,9 +24,9 @@ Fb represents a monocyclic or polycyclic hydrocarbon group.
Fc represents a single bond or a straight chain or branched alkylene group, and preferably a single bond or a methylene group.
-F1 represents a group represented by formula (F1).
+F1 represents a group represented by formula (F1).
-P1 represents from 1 to 3.
+P1 represents from 1 to 3.
As the cyclic hydrocarbon group represented by Fb, a cyclopentyl group, a cyclohexyl group, or a norbornyl group is preferred.
diff --git a/llama_parse_results/markdowns/page_127.md b/llama_parse_results/markdowns/page_127.md
index e8d5462..d09da5b 100644
--- a/llama_parse_results/markdowns/page_127.md
+++ b/llama_parse_results/markdowns/page_127.md
@@ -6,29 +6,29 @@ US 2020/0050106 A1 Feb. 13, 2020
-continued
-[Chemical Structure 350A³: A cyclohexyl group attached to a benzene ring with HO₃S- group and isopropyl substituents]
+[Chemical structure: A cyclohexyl group attached to a benzene ring with HO3S- group and isopropyl substituents]
-350A³
+350A3
-[Chemical Structure 311A³: A fluorinated compound with HO₃S- group connected to a cyclohexyl ring through a sulfur dioxide bridge, with multiple fluorine atoms]
+[Chemical structure: A complex molecule with HO3S- group, multiple fluorine atoms, and a cyclohexyl group connected via S-O2 linkage]
-311A³
+311A3
-[Chemical Structure 250A³: A complex fluorinated compound with two sulfonic acid groups (HO-S(=O)₂-) connected by fluorinated carbon chains to a benzofuran ring system]
+[Chemical structure: A molecule with two sulfonic acid groups (HO-S(=O)2-), multiple fluorine atoms, and a benzofuran ring system]
-250A³
+250A3
-[Chemical Structure 535A³: A fluorinated compound with HO₃S- group, multiple fluorine atoms, and two cyclohexyl groups connected through an ester linkage to a benzene ring]
+[Chemical structure: A molecule with cyclohexyl groups, HO-S group, multiple fluorine atoms, and a biphenyl ether linkage with sulfonate group]
-535A³
+535A3
-[Chemical Structure 290A³: A compound with HO-S(=O)₂- group, CF₃ group, and an adamantane ring system connected through an ether linkage]
+[Chemical structure: An adamantane-based molecule with HO-S(=O)2- group, CF3 group, and an ester linkage]
-290A³
+290A3
-[Chemical Structure 315A³: A fluorinated compound with HO-S(=O)₂- group, multiple fluorine atoms, and an adamantane ring system with an amide linkage]
+[Chemical structure: An adamantane-based molecule with two sulfonic acid groups (HO-S(=O)2-), multiple fluorine atoms, and an amide linkage]
-315A³
+315A3
(ZI)
@@ -41,14 +41,23 @@ R204—I+—R205
Z-
[0293] In General Formula (ZI),
+
[0294] R201, R202, and R203 each independently represent an organic group.
+
[0295] The number of carbon atoms of the organic group as each of R201, R202, and R203 is preferably 1 to 30, and more preferably 1 to 20.
+
[0296] Furthermore, two of R201 to R203 may be bonded to each other to form a ring structure, and the ring may include an oxygen atom, a sulfur atom, an ester bond, an amide bond, or a carbonyl group, and examples of the group formed by the bonding of two of R201 to R203 include an alkylene group (for example, a butylene group and a pentylene group).
+
[0297] Z- represents a non-nucleophilic anion (anion having a remarkably low ability of causing a nucleophilic reaction).
+
[0298] Examples of the non-nucleophilic anion include a sulfonate anion (such as an aliphatic sulfonate anion, an aromatic sulfonate anion, and a camphor sulfonate anion), a carboxylate anion (such as an aliphatic carboxylate anion, an aromatic carboxylate anion, and an aralkyl carboxylate anion), a sulfonylimide anion, a bis(alkylsulfonyl)imide anion, and a tris(alkylsulfonyl)methide anion.
+
[0299] The aliphatic moiety in the aliphatic sulfonate anion and the aliphatic carboxylate anion may be an alkyl group or a cycloalkyl group, and is preferably a linear or branched alkyl group having 1 to 30 carbon atoms or a cycloalkyl group having 3 to 30 carbon atoms.
+
[0300] As the aromatic ring group in the aromatic sulfonate anion and the aromatic carboxylate anion, an aryl group having 6 to 14 carbon atoms is preferable, and examples thereof include a phenyl group, a tolyl group, and a naphthyl group.
+
[0301] Specific examples of the substituent which may be contained in the alkyl group, the cycloalkyl group, and the aryl group exemplified above include a nitro group, a halogen atom such as fluorine atom, a carboxyl group, a hydroxyl group, an amino group, a cyano group, an alkoxy group (preferably having 1 to 15 carbon atoms), a cycloalkyl group (preferably having 3 to 15 carbon atoms), an aryl group (preferably having 6 to 14 carbon atoms), an alkoxycarbonyl group (preferably having 2 to 7 carbon atoms), an acyl group (preferably having 2 to 12 carbon atoms), an alkoxycarbonyloxy group (preferably having 2 to 7 carbon atoms), an alkylthio group (preferably having 1 to 15 carbon atoms), an alkylsulfonyl group (preferably having 1 to 15 carbon atoms), an alkyliminosulfonyl group (preferably having 1 to 15 carbon atoms), an aryloxysulfonyl group (preferably having 6 to 20 carbon atoms), an alkyl aryloxysulfonyl group (preferably having 7 to 20 carbon atoms), a cycloalkylaryloxysulfonyl group (preferably having 10 to 20 carbon atoms), an alkyloxyalkyloxy group (preferably having 5 to 20 carbon atoms), and a cycloalkylalkyloxyalkyloxy group (preferably having 8 to 20 carbon atoms).
[0291] Among those, the photoacid generator is preferably a photoacid generator including an anionic moiety and a cationic moiety from the viewpoint that the effect of the present invention is more excellent.
+
[0292] More specifically, the photoacid generator is preferably a compound represented by General Formula (ZI) or General Formula (ZII).
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_128.md b/llama_parse_results/markdowns/page_128.md
index 8bc7649..d468b46 100644
--- a/llama_parse_results/markdowns/page_128.md
+++ b/llama_parse_results/markdowns/page_128.md
@@ -27,12 +27,12 @@
## MERMAID SUPPLIER
29.05m Landing Barge, Supply Vessel
-[Technical illustration showing side view of Mermaid Supplier vessel - a landing barge with orange deck and supply capabilities]
+[Technical illustration showing side view of Mermaid Supplier vessel - a landing barge with orange deck and bow ramp]
## MERMAID AVENGER
19.8m Oil Pollution, Crew Boat
-[Technical illustration showing side view of Mermaid Avenger vessel - an oil pollution response and crew boat with orange superstructure]
+[Technical illustration showing side view of Mermaid Avenger vessel - a crew boat with orange superstructure]
## MERMAID COMMANDO
20.04m Tug, Utility Vessel
diff --git a/llama_parse_results/markdowns/page_18.md b/llama_parse_results/markdowns/page_18.md
index aa01a02..dc685b4 100644
--- a/llama_parse_results/markdowns/page_18.md
+++ b/llama_parse_results/markdowns/page_18.md
@@ -2,8 +2,11 @@
6
-| \[FIG. 7: Graph showing Δφl,l+1(T) vs. temperature T(K). The x-axis ranges from 0 to 140 K, y-axis from 0 to 30 degrees. Multiple data series are shown with different symbols: triangles (l=1), squares (l=2), diamonds (l=3), and circles (l=4). Straight lines with filled symbols represent n=8, dashed lines with open symbols represent n=16. Two vertical lines mark TN(8) and TN(16) around 100-120 K. All curves show decreasing trends with temperature, with steeper drops near the transition temperatures.] | \[FIG. 8: Graph showing Qz,max vs. temperature T(K). The x-axis ranges from 0 to 100 K, y-axis from 0 to 30 degrees. Multiple curves with different symbols converge from about 21 degrees at low temperature to near 0 degrees above 60 K. Inset shows magnetic vector (mlx, mly) profile for some temperatures for L=64. Colors and symbols as in Fig. 2.] |
-| ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------ | ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------ |
+## Figures
+
+| FIG. 7 | FIG. 8 |
+| ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------ | ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- |
+| \[Graph showing Δφl,l+1(T) in degrees vs. T(K). Multiple data series with triangles (l=1), squares (l=2), diamonds (l=3), and circles (l=4). Straight lines and filled symbols represent n=8, dashed lines and open symbols represent n=16. Vertical lines mark TN(8) and TN(16). Temperature range 0-140K, angle range 0-30 degrees. All series show decreasing trends with temperature.] | \[Graph showing Qz,max in degrees vs. T(K). Multiple overlapping curves showing decreasing trends from \~21 degrees at low temperature to \~1 degree at high temperature. Temperature range 0-100K. Inset shows magnetic vector (mlx, mly) profile for some temperatures for L=64, with colors and symbols as in Fig. 2.] |
FIG. 7: (color online) Δφl(T) vs. temperature for the surface planes, l = 1 (triangles), l = 2 (squares), l = 3 (diamonds), l = 4 (circles). Straight lines and full symbols: n = 8. Dashed lines and open symbols: n = 16.
@@ -16,7 +19,10 @@ For this purpose, we look at the temperature dependence of the rotation angle of
In a previous study, where the magnetic properties of Ho thin films were investigated by MC simulations of a Heisenberg model with easy-plane single-ion anisotropy and six out-of-plane coupling constants (as obtained by experimental neutron scattering measurements16) on a HCP lattice14,15, it was found that for thicknesses comparable with the helical pitch the phase diagram landscape is quite different from what we find here. Indeed, for n = 9 − 16, three different magnetic phases could be sin-
-[FIG. 9: Graph showing Δφl vs. layer index l for a BCT lattice with n=12. The x-axis ranges from 0 to 12, y-axis from 0 to 80 degrees. Five temperature curves are shown: T=100K (circles), 130K (filled squares), 135K (diamonds), 140K (triangles), and 145K (inverted triangles). The curves show low values (~10-20°) for l=0-4, peak around l=6-7 (reaching ~80° for 135K), then decrease back to ~10° for l=8-12.]
+| FIG. 9 | FIG. 9 |
+| ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- | ------ |
+| \[Graph showing Δφl in degrees vs. l (layer index) for a BCT lattice with n=12. Five temperature curves are shown: T=100K (open circles), 130K (filled squares), 135K (open diamonds), 140K (open triangles up), and 145K (open triangles down). The x-axis ranges from 0 to 12, y-axis from 0 to 80 degrees. The curves show peaks around l=6-7, with the 135K curve reaching the highest value of approximately 80 degrees. The outer layers (l=1-5 and l=8-12) show values around 10-40 degrees, while middle layers show disorder or lower values.] | |
+
FIG. 9: Δφl for a BCT lattice and n = 12, when the six coupling constants set employed in Ref. 14,15 (see text) is used. The temperature range has been chosen around TC(n) (error bars lye within point size).
diff --git a/llama_parse_results/markdowns/page_19.md b/llama_parse_results/markdowns/page_19.md
index aec0a2c..df5a053 100644
--- a/llama_parse_results/markdowns/page_19.md
+++ b/llama_parse_results/markdowns/page_19.md
@@ -13,7 +13,7 @@ $$\cup \{y_1 \in \mathbb{R} | \exists y_0 < b_{k+1} \text{ s.t. } y_1 - y_0 \geq
Note that $$Y_1 = Y_0 + \delta$$ and $$Y_1 = \frac{t_1 - t_W}{t_0 - t_W} Y_0 - \frac{t_1 - t_0}{t_0 - t_W} w$$ intersect at $$\left(\frac{t_0 - t_W}{t_1 - t_0} \delta + y_{-1}, \frac{t_1 - t_W}{t_1 - t_0} \delta + w\right)$$. I consider the following three cases: a) $$b_{k+1} \leq b_k \leq \frac{t_0 - t_W}{t_1 - t_0} \delta + w$$, b) $$b_{k+1} \leq \frac{t_0 - t_W}{t_1 - t_0} \delta + w \leq b_k$$, and c) $$\frac{t_0 - t_W}{t_1 - t_0} \delta + w \leq b_{k+1} \leq b_k$$.
-[Figure A.6 shows three subfigures labeled (a), (b), and (c), each displaying a coordinate system with Y₁ on the vertical axis and Y₀ on the horizontal axis. Each subfigure shows the relationship Y₁ = Y₀ + δ and contains regions marked as $$B_k^D$$ with different configurations of the intervals b_{k+1} and b_k. The figures illustrate different geometric cases of the support regions.]
+[Figure A.6 shows three subfigures labeled (a), (b), and (c), each displaying a coordinate system with Y₁ on the vertical axis and Y₀ on the horizontal axis. Each subfigure shows the relationship Y₁ = Y₀ + δ and contains regions marked as $$B_k^D$$ with different configurations of the intervals bk+1 and bk. The figures illustrate different geometric cases with dotted lines, solid lines, and shaded regions (green in subfigure c) representing the sets $$B_k^D$$.]
Figure. A.6: $$B_k^D$$ for $$B_k = (-\infty, b_k)$$ and $$B_{k+1} = (-\infty, b_{k+1})$$
diff --git a/llama_parse_results/markdowns/page_2.md b/llama_parse_results/markdowns/page_2.md
index b78d1a2..ebe855e 100644
--- a/llama_parse_results/markdowns/page_2.md
+++ b/llama_parse_results/markdowns/page_2.md
@@ -16,11 +16,11 @@ In recent years, several approaches to extract s-SWNTs from nanotube powders wer
In this letter, we report on the electronic properties of FET consisting of *semiconducting-enriched single wall carbon nanotubes, without detectable traces of metallic nanotubes and impurities*, with in our detection limits. This unprecedented achievement is made possible by ultracentrifugation (250,000g), sonication and filtration of solutions composed of SWNT powders with polyfluorene as extracting agent in toluene. Evidences are gathered by optical absorption, Raman and electrical measurements (see Fig.1). We shall demonstrate that such s-
-| \*\*(a)\*\*Wavelength (nm) M Absorbance S Absorbance L Absorbance600 \~0.05 \~0.02 \~0.02
650 \~0.08 \~0.03 \~0.03
700 \~0.11 \~0.04 \~0.04
750 \~0.09 \~0.05 \~0.05
800 \~0.07 \~0.06 \~0.06
850 \~0.06 \~0.07 \~0.07
900 \~0.05 \~0.08 \~0.08
950 \~0.05 \~0.09 \~0.09
1000 \~0.05 \~0.10 \~0.10
1050 \~0.06 \~0.12 \~0.12
1100 \~0.07 \~0.14 \~0.14
1150 \~0.08 \~0.16 \~0.16
1200 \~0.10 \~0.18 \~0.18
1250 \~0.12 \~0.19 \~0.19
1300 \~0.14 \~0.18 \~0.18
1350 \~0.15 \~0.16 \~0.16
1400 \~0.14 \~0.14 \~0.14
1450 \~0.12 \~0.12 \~0.12
1500 \~0.10 \~0.10 \~0.10
1550 \~0.08 \~0.08 \~0.08
1600 \~0.06 \~0.06 \~0.06 | |
-| ---------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- | - |
+| \*\*(a)\*\*Wavelength (nm) M Absorbance S Absorbance L Absorbance600 \~0.10 \~0.05 \~0.08
700 \~0.08 \~0.03 \~0.06
800 \~0.12 \~0.04 \~0.09
900 \~0.10 \~0.03 \~0.07
1000 \~0.08 \~0.02 \~0.05
1100 \~0.10 \~0.03 \~0.06
1200 \~0.17 \~0.20 \~0.12
1300 \~0.12 \~0.15 \~0.08
1400 \~0.08 \~0.10 \~0.05
1500 \~0.05 \~0.07 \~0.03 | |
+| -------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- | - |
-Note: S22 peak at ~514.5 nm, S11 peak visible in spectrum
+Labels: M11, S22, S11 marked on peaks
@@ -29,37 +29,33 @@ Note: S22 peak at ~514.5 nm, S11 peak visible in spectrum
**(b)**
-| Wavenumber (cm) | s-SWNT Normalized Intensity | m-SWNT (L) Normalized Intensity | m-SWNT (M) Normalized Intensity | m-SWNT (S) Normalized Intensity |
-| --------------- | --------------------------- | ------------------------------- | ------------------------------- | ------------------------------- |
-| 150 | \~0.05 | \~0.02 | \~0.02 | \~0.02 |
-| 175 | \~0.15 | \~0.05 | \~0.05 | \~0.05 |
-| 200 | \~0.35 | \~0.10 | \~0.10 | \~0.10 |
-| 225 | \~0.60 | \~0.20 | \~0.20 | \~0.20 |
-| 250 | \~0.85 | \~0.40 | \~0.40 | \~0.40 |
-| 275 | \~1.00 | \~0.70 | \~0.70 | \~0.70 |
-| 300 | \~0.90 | \~1.00 | \~1.00 | \~1.00 |
+| Wavenumber (cm) | s-SWNT Intensity | m-SWNT Intensity |
+| --------------- | ---------------- | ---------------- |
+| 150 | \~0.05 | \~0.02 |
+| 175 | \~0.15 | \~0.05 |
+| 200 | \~0.90 | \~0.30 |
+| 225 | \~0.20 | \~0.10 |
+| 250 | \~0.10 | \~0.05 |
+| 275 | \~0.80 | \~0.25 |
+| 300 | \~0.15 | \~0.08 |
+Samples labeled: L, M, S
+
**(c)**
-| V (V) | I M (A) | I S (A) |
-| ----- | ------- | ------- |
-| -30 | \~10-3 | \~10-4 |
-| -25 | \~10-3 | \~10-4 |
-| -20 | \~10-3 | \~10-4 |
-| -15 | \~10-3 | \~10-4 |
-| -10 | \~10-3 | \~10-4 |
-| -5 | \~10-4 | \~10-5 |
-| 0 | \~10-5 | \~10-7 |
-| 5 | \~10-6 | \~10-8 |
-| 10 | \~10-7 | \~10-9 |
-| 15 | \~10-8 | \~10-9 |
-| 20 | \~10-9 | \~10-10 |
-| 25 | \~10-9 | \~10-10 |
-| 30 | \~10-9 | \~10-10 |
+| V (V) | I (A) - M | I (A) - S |
+| ----- | --------- | --------- |
+| -30 | \~10-3 | \~10-5 |
+| -20 | \~10-3 | \~10-5 |
+| -10 | \~10-4 | \~10-6 |
+| 0 | \~10-6 | \~10-8 |
+| 10 | \~10-8 | \~10-10 |
+| 20 | \~10-9 | \~10-10 |
+| 30 | \~10-9 | \~10-10 |
|
diff --git a/llama_parse_results/markdowns/page_23.md b/llama_parse_results/markdowns/page_23.md
index 7d198e4..c31b5a5 100644
--- a/llama_parse_results/markdowns/page_23.md
+++ b/llama_parse_results/markdowns/page_23.md
@@ -4,19 +4,19 @@
## A. The Hamiltonian
-Let us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion $$E(k)$$ and spectral coupling $$v(k)$$
+Let us consider the non-Hermitian FFA model defined by the following relations for the energy dispersion $E(k)$ and spectral coupling $v(k)$
$$E(k) = -2\kappa_0 \cos k \, , \, v(k) = -\sqrt{\frac{2}{\pi}}\kappa_a \sin k \qquad (47)$$
-where $$\kappa_0$$, $$\kappa_a$$ are two real-valued positive constants and $$0 \leq k \leq \pi$$. The Hermitian limit of this model, attained by assuming $$\text{Im}(E_a) = 0$$, is a special case of the FFA model previously investigated in Ref.[36], which is exactly solvable (see also [29]). Note that the continuous spectrum of $$H$$ spans the band $$(E_1, E_2)$$, with $$E_2 = -E_1 = 2\kappa_0$$. The density of states for this model is given by
+where $\kappa_0$, $\kappa_a$ are two real-valued positive constants and $0 \leq k \leq \pi$. The Hermitian limit of this model, attained by assuming $\text{Im}(E_a) = 0$, is a special case of the FFA model previously investigated in Ref.[36], which is exactly solvable (see also [29]). Note that the continuous spectrum of $H$ spans the band $(E_1, E_2)$, with $E_2 = -E_1 = 2\kappa_0$. The density of states for this model is given by
$$\rho(E) = \left(\frac{\partial E}{\partial k}\right)^{-1} = \begin{cases} \frac{1}{\sqrt{4\kappa_0^2 - E^2}} & -2\kappa_0 < E < 2\kappa_0 \\ 0 & |E| > 2\kappa_0 \end{cases} \qquad (48)$$
-which shows van-Hove singularities at the band edges, whereas the positive spectral function $$V(E)$$, defined by $$V(E) = \rho(E)|v(E)|^2$$, reads
+which shows van-Hove singularities at the band edges, whereas the positive spectral function $V(E)$, defined by $V(E) = \rho(E)|v(E)|^2$, reads
$$V(E) = \begin{cases} \frac{\kappa_a^2}{\pi\kappa_0}\sqrt{1 - \left(\frac{E}{2\kappa_0}\right)^2} & -2\kappa_0 < E < 2\kappa_0 \\ 0 & |E| > 2\kappa_0 \end{cases} \qquad (49)$$
-which is non-singular. Substitution of Eq.(49) into Eq.(11) yields the following expression for the self-energy $$\Sigma(z)$$ [46]
+which is non-singular. Substitution of Eq.(49) into Eq.(11) yields the following expression for the self-energy $\Sigma(z)$ [46]
$$\Sigma(z) = -i\frac{\kappa_a^2}{2\kappa_0^2}\left(\sqrt{4\kappa_0^2 - z^2} + iz\right) \qquad (50)$$
@@ -26,26 +26,28 @@ $$\Delta(\mathcal{E}) = \text{Re}\left(\Sigma(z = \mathcal{E} \pm i0^+)\right) =
$$= \begin{cases} \frac{\kappa_a^2}{2\kappa_0^2}\left(\mathcal{E} + \sqrt{\mathcal{E}^2 - 4\kappa_0^2}\right) & \mathcal{E} < -2\kappa_0 \\ \frac{\kappa_a^2}{2\kappa_0^2}\mathcal{E} & -2\kappa_0 \leq \mathcal{E} \leq 2\kappa_0 \\ \frac{\kappa_a^2}{2\kappa_0^2}\left(\mathcal{E} - \sqrt{\mathcal{E}^2 - 4\kappa_0^2}\right) & \mathcal{E} > 2\kappa_0 \end{cases}$$
-> The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let $$\xi_{1,2}$$ be the two roots of the second-order algebraic equation
+> The condition for the non-Hermitian Hamiltonian to possess a real-valued spectrum (i.e. to avoid complex-valued energies arising from bound states outside the continuum) is derived in Appendix B. Precisely, let $\xi_{1,2}$ be the two roots of the second-order algebraic equation
$$\xi^2 + \frac{E_a}{\kappa_0}\xi + 1 - (\kappa_a/\kappa_0)^2 = 0. \qquad (52)$$
-Then the Hamiltonian $$H$$ has a real-valued energy spectrum if and only if $$|\xi_{1,2}| \leq 1$$. Figure 2 shows the domain in the plane $$(\text{Im}(E_a)/\kappa_0, \kappa_a/\kappa_0)$$ where $$H$$ has a purely continuous energy spectrum for a few increasing values of the ratio $$|\text{Re}(E_a)/\kappa_0|$$. The domain lies in the sector
+Then the Hamiltonian $H$ has a real-valued energy spectrum if and only if $|\xi_{1,2}| \leq 1$. Figure 2 shows the domain in the plane $(\text{Im}(E_a)/\kappa_0, \kappa_a/\kappa_0)$ where $H$ has a purely continuous energy spectrum for a few increasing values of the ratio $|\text{Re}(E_a)/\kappa_0|$. The domain lies in the sector
-|  FIG. 2: Domains of non-existence of bound states for the Hamiltonian $H$ in the $(\text{Im}(E\_a)/\kappa\_0, \kappa\_a/\kappa\_0)$ plane (shaded regions) for increasing values of the ratio $\|\text{Re}(E\_a)\|/\kappa\_0$. For a non-Hermitian Hamiltonian, i.e. $\text{Im}(E\_a) \neq 0$, in the shaded regions the energy spectrum of $H$ is real-valued and purely continuous. Spectral singularities occur at the boundary of the shaded regions. | |
-| ----------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- | ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- |
-| **$\text{Re}(E\_a)/\kappa\_0 = 0$**
Plot showing shaded triangular region symmetric about x-axis
Axes: $\kappa\_a/\kappa\_0$ (y-axis, 0 to 1.6) vs $\text{Im}(E\_a)/\kappa\_0$ (x-axis, -2 to 2) | **$\text{Re}(E\_a)/\kappa\_0 = \pm 0.5$**
Plot showing shaded elliptical region
Axes: $\kappa\_a/\kappa\_0$ (y-axis, 0 to 1.6) vs $\text{Im}(E\_a)/\kappa\_0$ (x-axis, -2 to 2) |
-| **$\text{Re}(E\_a)/\kappa\_0 = \pm 1$**
Plot showing shaded narrower region
Axes: $\kappa\_a/\kappa\_0$ (y-axis, 0 to 1.6) vs $\text{Im}(E\_a)/\kappa\_0$ (x-axis, -2 to 2) | **$\text{Re}(E\_a)/\kappa\_0 = \pm 1.8$**
Plot showing two narrow vertical shaded regions
Axes: $\kappa\_a/\kappa\_0$ (y-axis, 0 to 1.6) vs $\text{Im}(E\_a)/\kappa\_0$ (x-axis, -2 to 2) |
+|  | |
+| --------------------------------------------------------------------------------------------------------------------------------------------------- | -------------------------------------------------------------------------------------------------------------------------------------------- |
+| **Re(Ea)/κ0=0**
Plot showing shaded triangular region symmetric about y-axis
x-axis: Im(Ea)/κ0 from -2 to 2
y-axis: κa/κ0 from 0 to 1.6 | **Re(Ea)/κ0=±0.5**
Plot showing shaded region narrower than left plot
x-axis: Im(Ea)/κ0 from -2 to 2
y-axis: κa/κ0 from 0 to 1.6 |
+| **Re(Ea)/κ0=±1**
Plot showing further narrowed shaded region
x-axis: Im(Ea)/κ0 from -2 to 2
y-axis: κa/κ0 from 0 to 1.6 | **Re(Ea)/κ0=±1.8**
Plot showing narrow vertical shaded region
x-axis: Im(Ea)/κ0 from -2 to 2
y-axis: κa/κ0 from 0 to 1.6 |
-$$\kappa_a/\kappa_0 \leq \sqrt{2}$$ and shrinks toward $$\text{Im}(E_a)/\kappa_0 = \kappa_a/\kappa_0 = 0$$ as $$|\text{Re}(E_a)/\kappa_0| \to 2^-$$. For $$|\text{Re}(E_a)/\kappa_0| \leq 2$$, bound states do exist for any value of $$\kappa_a/\kappa_0$$ and $$\text{Im}(E_a)/\kappa_0$$. The wider domain is attained for $$\text{Re}(E_a) = 0$$. In particular, for $$\text{Re}(E_a) = 0$$ and $$\kappa_a/\kappa_0 = \sqrt{2}$$, from Eq.(52) it follows that $$H$$ has a real-valued energy spectrum provided that
+FIG. 2: Domains of non-existence of bound states for the Hamiltonian $H$ in the $(\text{Im}(E_a)/\kappa_0, \kappa_a/\kappa_0)$ plane (shaded regions) for increasing values of the ratio $|\text{Re}(E_a)|/\kappa_0$. For a non-Hermitian Hamiltonian, i.e. $\text{Im}(E_a) \neq 0$, in the shaded regions the energy spectrum of $H$ is real-valued and purely continuous. Spectral singularities occur at the boundary of the shaded regions.
+
+$\kappa_a/\kappa_0 \leq \sqrt{2}$ and shrinks toward $\text{Im}(E_a)/\kappa_0 = \kappa_a/\kappa_0 = 0$ as $|\text{Re}(E_a)/\kappa_0| \to 2^-$. For $|\text{Re}(E_a)/\kappa_0| \leq 2$, bound states do exist for any value of $\kappa_a/\kappa_0$ and $\text{Im}(E_a)/\kappa_0$. The wider domain is attained for $\text{Re}(E_a) = 0$. In particular, for $\text{Re}(E_a) = 0$ and $\kappa_a/\kappa_0 = \sqrt{2}$, from Eq.(52) it follows that $H$ has a real-valued energy spectrum provided that
$$-2\kappa_0 < \text{Im}(E_a) < 2\kappa_0. \qquad (53)$$
-Let us now consider the occurrence of spectral singularities. According to Eqs.(19) and (20) and using Eqs.(49) and (51), a spectral singularity at energy $$\mathcal{E} = \mathcal{E}_0$$, inside the interval $$(−2\kappa_0, 2\kappa_0)$$, is found provided that the following two equations are simultaneously satisfied
+Let us now consider the occurrence of spectral singularities. According to Eqs.(19) and (20) and using Eqs.(49) and (51), a spectral singularity at energy $\mathcal{E} = \mathcal{E}_0$, inside the interval $(−2\kappa_0, 2\kappa_0)$, is found provided that the following two equations are simultaneously satisfied
-$$\text{Im}(E_a) = \pm \frac{\kappa_a^2}{\kappa_0}\sqrt{1 - \left(\frac{\mathcal{E}_0}{2\kappa_0}\right)^2} \qquad (54)$$
+$$\text{Im}(E_a) = \pm\frac{\kappa_a^2}{\kappa_0}\sqrt{1 - \left(\frac{\mathcal{E}_0}{2\kappa_0}\right)^2} \qquad (54)$$
$$\text{Re}(E_a) = \left(1 - \frac{\kappa_a^2}{2\kappa_0^2}\right)\mathcal{E}_0. \qquad (55)$$
-For arbitrarily given values of $$E_a$$, $$\kappa_a$$ and $$\kappa_0$$, the above conditions are generally not satisfied [nowhere for $$\mathcal{E}_0$$ in the range $$(−2\kappa_0, 2\kappa_0)$$], i.e. the non-Hermitian FFA Hamiltonian is generally diagonalizable. Spectral singularities appear solely when a constraint among $$\text{Re}(E_a)/\kappa_0$$, $$\text{Im}(E_a)/\kappa_0$$ and $$\kappa_a/\kappa_0$$ is satisfied. Let us first assume $$\kappa_a/\kappa_0$$ strictly smaller that $$\sqrt{2}$$. In this case, a single spectral singularity, at the energy $$\mathcal{E}_0 =$$
\ No newline at end of file
+For arbitrarily given values of $E_a$, $\kappa_a$ and $\kappa_0$, the above conditions are generally not satisfied [nowhere for $\mathcal{E}_0$ in the range $(−2\kappa_0, 2\kappa_0)$], i.e. the non-Hermitian FFA Hamiltonian is generally diagonalizable. Spectral singularities appear solely when a constraint among $\text{Re}(E_a)/\kappa_0$, $\text{Im}(E_a)/\kappa_0$ and $\kappa_a/\kappa_0$ is satisfied. Let us first assume $\kappa_a/\kappa_0$ strictly smaller that $\sqrt{2}$. In this case, a single spectral singularity, at the energy $\mathcal{E}_0 =$
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_26.md b/llama_parse_results/markdowns/page_26.md
index ea8140c..21544ab 100644
--- a/llama_parse_results/markdowns/page_26.md
+++ b/llama_parse_results/markdowns/page_26.md
@@ -38,7 +38,7 @@ T - Transmit Only
### Stand Alone AWOS & ASOS
-| GOONE AWOS-3PT 118.525 BKW | STAMPEDE PASS ASOS 135.275 SMP |
+| BOONE AWOS-3PT 118.525 BRW | STAMPEDE PASS ASOS 135.275 SMP |
| -------------------------- | ------------------------------ |
diff --git a/llama_parse_results/markdowns/page_3.md b/llama_parse_results/markdowns/page_3.md
index b5e5996..c1aa14e 100644
--- a/llama_parse_results/markdowns/page_3.md
+++ b/llama_parse_results/markdowns/page_3.md
@@ -6,21 +6,21 @@
| ----------- | ----------- | ---------- | ------------- |
| 0.2 | \~230 | \~850 | \~850 |
| 0.5 | \~160 | \~420 | \~420 |
-| 0.8 | \~50 | \~300 | \~300 |
+| 0.8 | \~50 | \~310 | \~310 |
| Model size (N) | All Blocked | All Scalar | Auto Blocking |
| -------------- | ----------- | ---------- | ------------- |
| 20 | \~1400 | \~1400 | \~7000 |
| 50 | \~250 | \~250 | \~1700 |
-| 100 | \~50 | \~50 | \~900 |
+| 100 | \~50 | \~50 | \~850 |
Figure 3: Efficiency results for two contrived model structures: varying sized blocks of fixed correlation (left), and fixed sized blocks of varying correlation (right).
## Random Effects Model
-In the random effects model (Table 1), automated blocking generates an MCMC algorithm identical to the Informed Blocking algorithm (blocking each αi, βi pair), which produces a tenfold improvement in Efficiency over the most efficient static algorithm – for this model, All Scalar sampling. The cut height h = 0.1 indicates that only the αi, βi pairs exhibit posterior correlations above 0.9. The Informed Cross-Level algorithm requires a substantially longer Runtime and produces a high ESS, which results in nearly identical Efficiency as the efficiently blocked Auto Blocking algorithm.
+In the random effects model (Table 1), automated blocking generates an MCMC algorithm identical to the Informed Blocking algorithm (blocking each αi, βi pair), which produces a tenfold improvement in Efficiency over the most efficient static algorithm – for this model, All Scalar sampling. The cut height h = 0.1 indicates that only the αi, βi pairs exhibit posterior correlations above 0.9. The Informed Cross-Level algorithm requires a substantially longer Runtime and produces a high ESS, which results in nearly identical Efficiency as the efficiently blocked Auto Blocking algorithm.
## Auto-Regressive Model
diff --git a/llama_parse_results/markdowns/page_32.md b/llama_parse_results/markdowns/page_32.md
index 5056b37..4623581 100644
--- a/llama_parse_results/markdowns/page_32.md
+++ b/llama_parse_results/markdowns/page_32.md
@@ -1,8 +1,8 @@
-**NAVWEPS 00-80T-80
+NAVWEPS 00-80T-80
APPLICATION OF AERODYNAMICS
-TO SPECIFIC PROBLEMS OF FLYING**
+TO SPECIFIC PROBLEMS OF FLYING
invitation for trouble of many sorts. The normal and emergency procedures applicable to each specific airplane will insure the proper operation of the equipment.
@@ -14,6 +14,6 @@ invitation for trouble of many sorts. The normal and emergency procedures applic
Great time and effort are expended in the preparation of the flight handbook to provide the most exact information, data, and procedures. Diligent *study* and continuous *use* of the flight handbook will ensure that the greatest effectiveness is achieved from the airplane while still operating within the inherent capabilities of the design.
-[Photograph showing a military jet aircraft in flight against a cloudy sky background. The aircraft appears to be flying at low altitude with spray or clouds visible below it.]
+[Photograph showing a military jet aircraft in flight against a cloudy sky background. The aircraft appears to be a single-engine jet with swept wings, captured in a side profile view during flight.]
412
diff --git a/llama_parse_results/markdowns/page_33.md b/llama_parse_results/markdowns/page_33.md
index 964b41f..27dffd8 100644
--- a/llama_parse_results/markdowns/page_33.md
+++ b/llama_parse_results/markdowns/page_33.md
@@ -2,11 +2,11 @@
115
-## Runway Declared Distance Information
+### Runway Declared Distance Information
Runway declared distance information when available will be indicated by **D** and is shown to the right of the airport elevation in the sketch box. Declared distances for a runway represent the maximum distances available and suitable for meeting takeoff and landing distance performance requirements.
-## Runway Lights
+### Runway Lights
Notes regarding approach lighting systems are shown at the bottom of the sketch box. Runway lights (HIRL) (MIRL) (LIRL) (TDZL)(TDZ/CL) shall be indicated by a note, e.g. HIRL Rwy 9-27.
@@ -16,29 +16,29 @@ Other approach lighting is shown on the airport sketch as a symbol on the side o
Runway centerline lights will be indicated by a note only when paired with TDZL, e.g., TDZ/CL Rwys 6 and 24.
-## Time/Distance Table
+### Time/Distance Table
When applicable, a Time/Distance Table is provided below the airport sketch. The table provides the distance and time that is required from the final approach fix to the missed approach point for select groundspeeds.
-## Base Information (Copter Approaches Only)
+### Base Information (Copter Approaches Only)
Base Information, as required and necessary to identify the MAP area and in the vicinity of the landing area shall be provided. Information shall be limited to and depict significant visual landmark features at and surrounding the MAP area and the heliport/pad of intended landing.
-# AIRPORT DIAGRAMS
+## AIRPORT DIAGRAMS
Airport Diagrams are specifically designed to assist in the movement of ground traffic at locations with complex runway/ taxiway configurations. Airport Diagrams are not intended for use in approach and landing or departure operations. An airport diagram assists pilots in identifying their location on the airport, thus reducing requests for "progressive taxi instructions" from controllers.
[Airport diagram showing runway layout with the following labeled elements from left to right:
-- HS 1
-- BAK-12
+- HS-1
+- BAK-12 (with "20" indicator)
- Runway End Elevation: ELEV 164
- Runway Slope: 0.7% UP
- FIELD ELEV 174
- Runway Dimensions (in feet): 9000 X 200
- Displaced Threshold
- Runway Heading (Magnetic): 023.2°
-- Movement Area Dimensions (in feet): 1000 X 200
- Runway Identification
+- Movement Area Dimensions (in feet): 1000 X 200
- Visual Screen
- EMAS]
@@ -46,7 +46,7 @@ Airport Diagrams are specifically designed to assist in the movement of ground t
ELEV 5434 **D** TDZE 5352
-Runway diagram with dotted centerline pattern and various runway lighting symbols, including approach lighting systems and runway end identifiers. Shows runway 9L-27R with dimensions and lighting configuration.
+Runway diagram with dotted centerline pattern and various runway lighting symbols, including approach lighting systems and runway end identifiers. Shows runway 9L-27R with elevation markers 091°19.1' and 082° 5 NM from FAF.
TDZ/CL Rwys 7, 16L, 16R, 17R, 26, 34L, 34R, 35L, 35R
HIRL All Rwys
diff --git a/llama_parse_results/markdowns/page_34.md b/llama_parse_results/markdowns/page_34.md
index 13a739b..f218392 100644
--- a/llama_parse_results/markdowns/page_34.md
+++ b/llama_parse_results/markdowns/page_34.md
@@ -12,7 +12,7 @@ The outer limit of the entire Terminal Radar Service Areas (TRSA) is a continuou
Each sector altitude is identified in solid black color by the MSL ceiling and floor values of the respective sector, eliminating the last two zeros. A leader line is used when the altitude values must be positioned outside the respective sectors because of charting space limitations. The TRSA name is shown near the north position of the TRSA as follows: **PALM SPRINGS TRSA**. Associated frequencies are listed in a table on the chart border.
-**Military Training Routes (MTRs)** are shown on Sectionals and TACs. They are identified by the route designator: ▬▬▬▬IR▬▬▬▬. Route designators are shown in solid black on the route centerline, positioned along the route for continuity. The designator IR or VR is not repeated when two or more routes are established over the same airspace, e.g., IR201-205-227. Routes numbered 001 to 099 are shown as IR1 or VR99, eliminating the initial zeros. Direction of flight along the route is indicated by small arrowheads adjacent to and in conjunction with each route designator.
+**Military Training Routes (MTRs)** are shown on Sectionals and TACs. They are identified by the route designator: ▬▬▬▬▬ IR21 ▬▬▬▬▬. Route designators are shown in solid black on the route centerline, positioned along the route for continuity. The designator IR or VR is not repeated when two or more routes are established over the same airspace, e.g., IR201-205-227. Routes numbered 001 to 099 are shown as IR1 or VR99, eliminating the initial zeros. Direction of flight along the route is indicated by small arrowheads adjacent to and in conjunction with each route designator.
The following note appears on Helicopters, Sectionals and TACs except for Hawaiian Islands which is different.
diff --git a/llama_parse_results/markdowns/page_35.md b/llama_parse_results/markdowns/page_35.md
index c805cda..d4e1236 100644
--- a/llama_parse_results/markdowns/page_35.md
+++ b/llama_parse_results/markdowns/page_35.md
@@ -27,10 +27,10 @@ $$\Delta n = 0.115 \frac{m\sqrt{\sigma}}{(W/S)} V_e (KU)$$
where
Δ*n*=change in load factor due to gust
-*m*=lift curve slope, unit of *CL* per degree of α
+*m*=lift curve slope, unit of *C**L* per degree of α
σ=altitude density ratio
*W*/*S*=wing loading, psf
-*Ve*=equivalent airspeed, knots
+*V**e*=equivalent airspeed, knots
*KU*=equivalent sharp edged gust velocity ft. per sec.
As an example, consider the case of an airplane with a lift curve slope *m*=0.08 and wing loading, (*W*/*S*)=60 psf. If this airplane were flying at sea level at 350 knots and encountered an effective gust of 30 ft. per sec., the gust would produce a load factor increment of *1.61*. This increment would be added to the flight load factor of the airplane prior to the gust,
diff --git a/llama_parse_results/markdowns/page_37.md b/llama_parse_results/markdowns/page_37.md
index 487b3bf..a30f7de 100644
--- a/llama_parse_results/markdowns/page_37.md
+++ b/llama_parse_results/markdowns/page_37.md
@@ -2,6 +2,8 @@
FAA Chart Users' Guide - IFR Enroute Symbology
+80
+
# AIRSPACE INFORMATION (Continued)
## Enroute Chart Examples
@@ -16,8 +18,8 @@ FAA Chart Users' Guide - IFR Enroute Symbology
15000
*13300
*13300 MEA GAP 51
- △————————————V12.5————————————————△ OLNUE
-LUNDI 35 11.4 63
+ △────────────V14.5──────────────────△ OLNUE
+LUNDI 35 11.4 63
```
**MEA VHF and RNAV Example**
@@ -33,15 +35,17 @@ MOCA of 13300'
```
122.05
- JACKSON
- 115.4 JAC 101 ≋≋≋
- N43°37.26' W110°43.90'
- CASPER
- MCA
- V520 15200W
- V330 13400W
- MTA
- V465 NE TO V330 W 16000
+ ┌─────────────────┐
+ │ JACKSON │
+ │ 115.4 JAC 101 ≋─·│
+ │ N43°37.26' W110°43.90' │
+ └─────────────────┘
+ CASPER
+ MCA
+ V520 15200W
+ V330 13400W
+ MTA
+ V465 NE TO V330 W 16000 V520 W 16000
V520 E TO V330 W 14200
V330 E TO V520 W 16000
V328 NW TO V465 SW 15100
@@ -60,6 +64,4 @@ Aircraft traveling E on V520 and turning to V330 on a W heading must turn at alt
Aircraft traveling E on V330 and turning to V520 on a W heading must turn at altitude of 16000' or higher
-Aircraft traveling NW on V328 and turning to V465 on a SW heading must turn at altitude of 15100' or higher.
-
-80
+Aircraft traveling NW on V328 and turning to V465 on a SW heading must turn at altitude of 15100' or higher.
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_38.md b/llama_parse_results/markdowns/page_38.md
index 4f1c793..2f357bb 100644
--- a/llama_parse_results/markdowns/page_38.md
+++ b/llama_parse_results/markdowns/page_38.md
@@ -74,9 +74,7 @@ ZONE
Appropriate notes as required may be shown
-[Visual representation showing a dashed purple curved line forming a large area]
-
-Small Area [with small dashed purple curved segment]
+[Visual representation showing a large dashed purple circle and a small dashed purple area labeled "Small Area"]
NOTICE
FOR REASONS OF NATIONAL SECURITY
@@ -85,7 +83,7 @@ BELOW 1200' MSL IN THIS AREA
## Special Awareness Training Areas
-[Visual representation showing a gray rectangular area with text:]
+[Visual representation showing a gray rectangular area with blue text:]
DCA-VOR-DME—60 NM
NOTICE
@@ -96,9 +94,7 @@ of DCA VOR-DME, as defined on Flyway.
Appropriate notes as required may be shown.
-[Visual representation showing a curved line labeled:]
-MODE C
-30 NM
+[Visual representation showing a curved purple line labeled "MODE C" with "30 NM" text]
## Air Defense Identification Zone (ADIZ)
@@ -106,6 +102,7 @@ Note: Delimiting line not shown when it coincides with International Boundary, p
CONTIGUOUS
U.S. ADIZ
-[shown with dotted pattern]
+
+[Visual representation showing dotted pattern]
30
diff --git a/llama_parse_results/markdowns/page_40.md b/llama_parse_results/markdowns/page_40.md
index 1166fac..05f2be3 100644
--- a/llama_parse_results/markdowns/page_40.md
+++ b/llama_parse_results/markdowns/page_40.md
@@ -3,16 +3,16 @@
FAA Chart Users' Guide - Terminal Procedures Publication (TPP) - Terms
[Diagram showing an aviation approach chart with the following elements:
-- Top section shows waypoints and altitudes: 1000, 949, 1546, 902, 918, 1252 on the left side
-- "SEE INSET" notation with waypoints 1348, 1354, 1000, 264, 963, 1875
-- Center shows "950" with "(MAP) OPNC" and "1068" with "2400" and "(FAF) BOULD 1542" and "(IF) LEE8R"
-- Large circle in center showing:
- - "L65" at top
- - "L52/74" on left side
- - "L70" on left
- - "336° (4.2) from MAP" notation
- - "(MAP) OPNC" on right side
- - Various connecting lines and markers]
+- Top section shows waypoints and altitudes: 1000, 949, 1546, 902, 918, 1252 on the left side; SEE INSET, 1348, 1354, 1000, 264, 963, 950 in the center; 1875, 2400, 60 (IF) LEE8R on the right
+- Labels include (MAP) OPNIC, 1068, (FAF) BOULD, 1542
+- Center shows a circular inset diagram with:
+ - L65 arc at top
+ - L70 on left side
+ - 336° (4.2) from MAP notation
+ - L52/74 at bottom
+ - (MAP) OPNIC label
+ - 20,951' marking
+ - Circular boundary with various segments]
*Example of Copter with Inset*
@@ -24,16 +24,16 @@ Missed approach information is shown in 3 locations on the chart:
* The Planview - The missed approach track is drawn using a thin, hash marked line with a directional arrow. If the missed approach fix is off the chart, the missed approach track shall extend to the chart border.
-[Dashed line with arrow showing:]
+[Dashed line with arrow] ▶
Missed Approach
* The Profile Box - Missed Approach Icons will be depicted in the upper left or upper right of the profile box. The Missed Approach Icons are intended to provide quick, at a glance intuitive guidance to the pilot, to supplement the textual missed approach instructions in the briefing strip. Space permitting, all textual missed approach instructions will be graphically depicted in sequence. If space does not permit the depiction of all missed approach icons, only the first four icon boxes will be shown.
-| Example Missed Approach Icons | Missed Approach Text |
-| ------------------------------------------------------------------------------------------------------------------------------------------------ | -------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- |
-| 13000
TEKGU
INT
RIL 19
RIL R-250
EKR
R-179
WOKPA
EKR 44.2 | MISSED APPROACH: Climb to 13000 on RIL VOR/DME R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in-hold to 13000. |
-| 8000
SVC R-128
SVC
Reverse
Course | MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold. |
-| 9000
tr
112°
JETRY
6700
tr
112°
PAKPE
WULKU
tr
289°
JNC | MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold. |
+| Example Missed Approach Icons | Missed Approach Text |
+| --------------------------------------------------------------------------------------------------------------------------------------------------------------- | -------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- |
+| 13000
↑
TEKGU
INT
RIL 19
RIL R-250
EKR
R-179
WOKPA
EKR 44.2 | MISSED APPROACH: Climb to 13000 on RIL VOR/DME R-250 to TEKGU INT/RIL 19 DME and on EKR VOR/DME R-179 to WOKPA/EKR 44.2 DME and hold, continue climb-in-hold to 13000. |
+| 8000
↖
SVC R-128
SVC
Reverse
Course
⟲ | MISSED APPROACH: Climbing left turn to 8000 via SVC R-128, then reverse course to SVC VOR/DME and hold. |
+| 9000
↑
tr
112°
JETRY
✈
6700
tr
112°
PAKPE
✈
WULKU
✈
tr
289°
JNC
⊙ | MISSED APPROACH: Climb to 9000 on track 112° to JETRY, cross JETRY at or above 6700, and on track 112° to PAKPE, right turn to WULKU, and on track 289° to JNC VOR/DME and hold. |
108
diff --git a/llama_parse_results/markdowns/page_41.md b/llama_parse_results/markdowns/page_41.md
index 7840ba0..045b2ba 100644
--- a/llama_parse_results/markdowns/page_41.md
+++ b/llama_parse_results/markdowns/page_41.md
@@ -40,6 +40,6 @@ The Secretary of State makes the following Regulations in exercise of the powers
(b) operating with the permission of Kent Police.
-(a) S.I. 2016/765, to which there are amendments not relevant to these Regulations.
+**(a)** S.I. 2016/765, to which there are amendments not relevant to these Regulations.
-(b) Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST).
\ No newline at end of file
+**(b)** Co-ordinated Universal Time (UTC) is one hour behind British Summer Time (BST).
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_42.md b/llama_parse_results/markdowns/page_42.md
index ed46990..d1c37a0 100644
--- a/llama_parse_results/markdowns/page_42.md
+++ b/llama_parse_results/markdowns/page_42.md
@@ -10,9 +10,9 @@
Open Area (White)
-*High Chart Only*
+**High Chart Only**
-*Controlled Airspace*
+**Controlled Airspace**
That airspace from 18,000' MSL to and including FL 600, including the airspace overflying the waters within 12 NM of the coast of the contiguous United States and Alaska and designated offshore areas, excluding Santa Barbara Island, Farallon Island, the airspace south of latitude 25° 04'00" N, the Alaska peninsula west of longitude 160°00'00" W, and the airspace less than 1,500' AGL.
@@ -24,11 +24,11 @@ That airspace from 18,000' MSL to and including FL 450, including Santa Barbara
Screened Blue with a Solid Blue Outline
-*Low Chart Only*
+**Low Chart Only**
-*Controlled Airspace*
+**Controlled Airspace**
-*Example:*
+Example:
That airspace from the surface to 10,000' MSL (unless otherwise designated) surrounding the nation's busiest airports. Each Class B airspace area is individually tailored and consists of a surface area and two or more layers.
@@ -38,12 +38,12 @@ That airspace from the surface to 10,000' MSL (unless otherwise designated) surr
A Solid Blue Outline
-*Low Chart Only*
+**Low Chart Only**
-*Controlled Airspace*
+**Controlled Airspace**
That airspace within 30 NM of the primary airports of Class B airspace and within 10 NM of designated airports. Mode-C transponder equipment is required. (See FAR 91.215)
-*Example:*
+Example:
-*See Chart example above.*
\ No newline at end of file
+See Chart example above.
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_43.md b/llama_parse_results/markdowns/page_43.md
index a3700fb..28b6229 100644
--- a/llama_parse_results/markdowns/page_43.md
+++ b/llama_parse_results/markdowns/page_43.md
@@ -6,18 +6,17 @@ FAA Chart Users' Guide - VFR Terms and Symbols
On VFR Charts, information about radio aids to navigation (NAVAID) are boxed, as illustrated. Duplication of data is avoided. When two or more radio aids in a general area have the same name with different frequencies, Tactical Air Navigation (TACAN) channel numbers, or identification letters, and no misinterpretation can result, the name of the radio aid may be indicated only once within the identification box. Very High Frequency/Ultra High Frequency (VHF/UHF) NAVAID names and identification boxes (shown in blue) take precedence. Only those items that differ (e.g., frequency, Morse Code) are repeated in the box in the appropriate color. The choice of separate or combined boxes is made in each case on the basis of economy of space and clear identification of the radio aids.
-| Crosshatch indicates
unknown status | FSS Radio Frequencies |
-| ----------------------------------------------------- | -------------------------------------------------------- |
-| Operates less
than continuously
or on-request | 122.1R |
-| HIWAS Frequency | 379.2 MHz VORTAC
PONTIAC
Ch 28 (T) 40° Pnc 121.5 |
-| Frequency | Channel |
-| Operational note | FSS oper. 0600-2200
Rancho Murieta FSS other times. |
-| | ASOS / AWOS
Name
Morse Code
Identifier |
+| Crosshatch indicates
unknown status | FSS Radio Frequencies | | |
+| ----------------------------------------------------- | ----------------------------- | ------------------- | ------------------- |
+| Operates less
than continuously
or on-request | 122.1R
VORTAC
PONTIAC | 121.5
⚓
R | ASOS/AWOS |
+| HIWAS Frequency | 379.2 MHz 28 CH | | Name
Morse Code |
+| Frequency | Channel | FSS oper. 0600-2200 | Identifier |
+| Operational note — Rancho Murieta FSS other times. | | | |
A NAVAID that is physically located on an airport may not always be represented as a typical NAVAID symbol. A small open circle indicates the NAVAID location when collocated with an airport icon.
-[Compass rose diagram showing: A circular compass with degree markings around the perimeter (0-360 degrees). In the center is a small airport symbol with "MON" and "114.3 SWL" text. An open circle symbol is shown at the top of the compass rose. Text annotation reads "Open circle symbol shown when NAVAID located on airport. Airport name shown in top of box."]
+[Compass rose diagram showing: A circular compass with degree markings around the perimeter. In the center is text reading "VOR 114.3 SWL" with an airplane symbol. At the bottom of the circle is text reading "Open circle symbol shown when NAVAID located on airport. Airport symbol shown in top of box."]
The type of NAVAID will be identified by: "VOR," (VHF Omni-Directional Range) "VORTAC" (VOR Tactical Aircraft Control), "VOR-DME," (VOR-Distance Measuring Equipment) or "DME" (Distance Measuring Equipment) positioned on and breaking the top line of the NAVAID box.
@@ -27,17 +26,17 @@ DMEs are shown without the compass rose.
Airports in the following categories are charted as indicated (additional symbols are shown later in this Section). Public use airports:
-[Blue and white airport symbol with runways] Hard-surfaced runways greater than 8069' or some multiple runways less than 8069'
+[Airport symbol: Star-shaped icon] Hard-surfaced runways greater than 8069' or some multiple runways less than 8069'
-[Purple circle with airplane symbol] Hard-surfaced runways 1500' to 8069'
+[Airport symbol: Circle with star inside] Hard-surfaced runways 1500' to 8069'
-[Purple circle] Other than hard-surfaced runways
+[Airport symbol: Circle] Other than hard-surfaced runways
-[Purple anchor symbol] Seaplane bases
+[Airport symbol: Anchor] Seaplane bases
Military airports:
-[Two circular symbols - one with circle inside circle, one with circle and dot] Other than hard-surfaced runways
+[Airport symbol: Circle with dot] [Airport symbol: Circle with ring] Other than hard-surfaced runways
Hard-surfaced runways are depicted the same as public-use airports.
@@ -45,10 +44,10 @@ U.S. military airports are identified by abbreviations such as AAF (Army Air Fie
Fuel Available:
-[Purple diamond symbol with tick marks] Fuel availability indicated by use of tick marks around the basic airport symbol. Consult Chart Supplement for details and availability.
+[Airport symbol: Star with tick marks] Fuel availability indicated by use of tick marks around the basic airport symbol. Consult Chart Supplement for details and availability.
Other airports with or without fuel:
-[Five circular symbols in a row showing variations of airport symbols with different markings]
+[Airport symbol: Circle with H] [Airport symbol: Circle with dot] [Airport symbol: Circle with U] [Airport symbol: Circle with R] [Airport symbol: Circle with X]
15
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_46.md b/llama_parse_results/markdowns/page_46.md
index 0d85c1d..825546e 100644
--- a/llama_parse_results/markdowns/page_46.md
+++ b/llama_parse_results/markdowns/page_46.md
@@ -22,4 +22,7 @@ Only in the case of a negotiated procedure, competitive dialogue or competitive
If foreseen in the 'Terms of Reference' and in accordance with the objective criteria defined therein, Tenderers having passed the exclusion and selection stage, may be invited to make an oral
-Last updated: June 2020 Page 6 of 21
+Last updated: June 2020presentation of their tender. The presentation may be followed by a question and answer session. The presentation and question and answer session will be conducted in accordance with the principles of equal treatment and transparency.
+
+
+Last updated: June 2020 Page 6 of 21
diff --git a/llama_parse_results/markdowns/page_5.md b/llama_parse_results/markdowns/page_5.md
index c832a20..1b0f44d 100644
--- a/llama_parse_results/markdowns/page_5.md
+++ b/llama_parse_results/markdowns/page_5.md
@@ -2,28 +2,24 @@
8
-|  |
-| ---------------------------------------------------------------- |
-
-
-| Additional Users Downloaded | Cumulative IV Tokens Found (Millions) - Predictive Ranking | Cumulative IV Tokens Found (Millions) - Random Baseline | Cumulative IV Tokens Found (Millions) - Edge Count Ranking |
-| --------------------------- | ---------------------------------------------------------- | ------------------------------------------------------- | ---------------------------------------------------------- |
-| 0 | 0.00 | 0.00 | 0.00 |
-| 100 | 0.50 | 0.10 | 0.10 |
-| 200 | 0.75 | 0.20 | 0.25 |
-| 300 | 1.00 | 0.30 | 0.35 |
-| 400 | 1.15 | 0.38 | 0.40 |
-| 500 | 1.25 | 0.43 | 0.43 |
+## B. *Queue Prioritization Experiment*
+We tested our method for prioritizing the crawling queue using Bengali language Twitter users. In order to properly compare the various methods we first collected a data set of 10,785 Twitter users. (5,684 users came from our search queries and an additional 5,103 came from those users' social connections.) The way the queue ranking works is to first download a small set of users and use that as training data to learn a ranking for the rest of the download queue. We randomly selected 300 users for our training set. The ranking methods were used to order the remaining 10,000+ users in the simulated download queue.
-Fig. 2. IV Tokens Gathered by Crawling Strategy
+In Figure 2, we show the cumulative in-vocabulary tokens obtained as an additional 500 users are processed from the download queue for each of the three prioritization strategies. The predictive ranking provides three times as many in-vocabulary tokens as either the edge count ranking or the random baseline. Figure 3 is similar but shows the cumulative vocabulary coverage (types) where the vocabulary is taken from a held-out dev set different from the text used to produce the Twitter queries. The horizontal line represents the type coverage of the in-domain training data. The predictive ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the dev-set are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially outperforming the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
-## B. *Queue Prioritization Experiment*
+The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and average sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @BarackObama followed by @BillGates.)
-We tested our method for prioritizing the crawling queue using Bengali language Twitter users. In order to properly compare the various methods we first collected a data set of 10,785 Twitter users. (5,684 users came from our search queries and an additional 5,103 came from those users' social connections.) The way the queue ranking works is to first download a small set of users and use that as training data to learn a ranking for the rest of the download queue. We randomly selected 300 users for our training set. The ranking methods were used to order the remaining 10,000+ users in the simulated download queue.
+We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the edge
-In Figure 2, we show the cumulative in-vocabulary tokens obtained as an additional 500 users are processed from the download queue for each of the three prioritization strategies. The predictive ranking provides three times as many in-vocabulary tokens as either the edge count ranking or the random baseline. Figure 3 is similar but shows the cumulative vocabulary coverage (types) where the vocabulary is taken from a held-out dev set different from the text used to produce the Twitter queries. The horizontal line represents the type coverage of the in-domain training data. The predictive ranking covers an additional 10% of the dev-set vocabulary compared to either of the other strategies. More than 53% of the vocabulary types and about 9% of the tokens in the dev-set are not found in the in-domain training data. The Twitter data downloaded using the predictive ranking covers 56% of these previously unseen vocabulary types, substantially out-performing the edge count ranking and the random baseline. The match between the vocabulary of the data obtained with the predictive ranking with the in-domain data is an indication of the value of the predictive ranking strategy.
+| Additional Users Downloaded | Predictive Ranking | Random Baseline | Edge Count Ranking |
+| --------------------------- | ------------------ | --------------- | ------------------ |
+| 0 | 0.00 | 0.00 | 0.00 |
+| 100 | 0.50 | 0.10 | 0.08 |
+| 200 | 0.75 | 0.20 | 0.18 |
+| 300 | 1.00 | 0.30 | 0.28 |
+| 400 | 1.15 | 0.38 | 0.35 |
+| 500 | 1.25 | 0.43 | 0.42 |
-The most important features for the predictive ranking (as measured by the average decrease in node impurity in the random forest regression model) are average number of reverse followers in the training set, average sentence count after filtering among followers in the training set and aver-age sentence count after filtering among mentioners in the training set. Even though edge features highly influence the predictive ranking model, the edge count ranking is worse than the predictive ranking on both of the type coverage and the cumulative IV token metrics. This is because there are high edge count connections from Bengali speaking Twitter users to international celebrities, which fools the edge count ranking strategy but not the random forest regression. (The top followed Twitter user by Bengali speakers is @BarackObama followed by @BillGates.)
-We created language models from the downloaded data to compare the effectiveness of the ranking strategies. The language models used the data from the 300 users in the training set as well as the additional users selected by each of the respective ranking strategies. Table VI lists the resulting perplexities on the held-out in-domain data. The predictive ranking LM achieved a 17% reduction in perplexity over the random baseline after downloading 500 users from the queue. When less than 500 additional users are downloaded, the predictive ranking has a better perplexity than the edge
\ No newline at end of file
+Fig. 2. IV Tokens Gathered by Crawling Strategy
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_51.md b/llama_parse_results/markdowns/page_51.md
index f2f1444..2f7906b 100644
--- a/llama_parse_results/markdowns/page_51.md
+++ b/llama_parse_results/markdowns/page_51.md
@@ -1,6 +1,6 @@
-[ECHA Logo: European Chemicals Agency - blue and yellow square logo with "ECHA" text and "EUROPEAN CHEMICALS AGENCY" underneath]
+[ECHA Logo - European Chemicals Agency]
**services for which these capacities are required (i.e. the latter will assume the role of subcontractors).**
diff --git a/llama_parse_results/markdowns/page_54.md b/llama_parse_results/markdowns/page_54.md
index 433cd1c..3aad44d 100644
--- a/llama_parse_results/markdowns/page_54.md
+++ b/llama_parse_results/markdowns/page_54.md
@@ -1,7 +1,6 @@
-# ECHA
-## EUROPEAN CHEMICALS AGENCY
+ECHA Logo - European Chemicals Agency
## 2.4 Ways to submit a tender: how can economic operators organise themselves to submit a tender?
diff --git a/llama_parse_results/markdowns/page_55.md b/llama_parse_results/markdowns/page_55.md
index 36b4151..cfa06cb 100644
--- a/llama_parse_results/markdowns/page_55.md
+++ b/llama_parse_results/markdowns/page_55.md
@@ -14,11 +14,11 @@ The aggregate amount of the advance and interim invoices issued by the Consultan
7.3 Unless otherwise permitted under the terms of the Sanction (as defined in Article 8 of the General Conditions), the Contracting Authority shall not make, nor shall the Consultant request, any payments under this Contract as of the date of a Sanction Event (as defined in Article 8 of the General Conditions), irrespective of whether the payment concerns delivery of Services predating the Sanction Event. For the avoidance of doubt, payments so extinguished shall not be recoverable.
-## **(8) Contact addresses**
+## (8) Contact addresses
Any written communication relating to this Contract between the Contracting Authority and the Consultant must state the Contract title and identification number, and must be sent by post, fax, e-mail or by hand to the addresses identified in accordance with Articles 5.3 and 7.8 of the General Conditions.
-## **(9) Law and language of the Contract**
+## (9) Law and language of the Contract
9.1 This Contract and any dispute or claim arising out or in connection with it shall be governed by the laws of the Grand Duchy of Luxembourg.
@@ -26,11 +26,11 @@ Any written communication relating to this Contract between the Contracting Auth
9.3 The language of the Contract and of all written communications between the Consultant and the Contracting Authority shall be English.
-## **(10) Tax and customs arrangements**
+## (10) Tax and customs arrangements
No duties, levies or taxes, including VAT, which may be payable in the beneficiary country/countries will be charged to the Contracting Authority.
-## **(11) Other specific conditions applying to the Contract**
+## (11) Other specific conditions applying to the Contract
11.1 Any subcontracting must be done in accordance with Article 4 of the General Conditions.
diff --git a/llama_parse_results/markdowns/page_6.md b/llama_parse_results/markdowns/page_6.md
index 516f0ab..c4c7cd1 100644
--- a/llama_parse_results/markdowns/page_6.md
+++ b/llama_parse_results/markdowns/page_6.md
@@ -2,19 +2,28 @@
30
-[Figure 12: A 3x3 grid of line plots showing comparisons between True DTE, Makarov lower bound, Makarov upper bound, and New lower bound across different parameter combinations]
+[Figure 12: A 3x3 grid of line plots showing comparisons between True DTE (solid black line), Makarov lower bound (red dashed line), Makarov upper bound (red dashed line), and New lower bound (solid blue line). The plots are arranged as follows:
-| k1=1, k2=1
Plot showing curves from 0 to 1 on y-axis and 0 to 30 on x-axis | k1=1, k2=10
Plot showing curves from 0 to 1 on y-axis and 0 to 30 on x-axis | k1=1, k2=40
Plot showing curves from 0 to 1 on y-axis and 0 to 30 on x-axis |
-| ------------------------------------------------------------------------------- | -------------------------------------------------------------------------------- | -------------------------------------------------------------------------------- |
-| k1=5, k2=1
Plot showing curves from 0 to 1 on y-axis and 0 to 30 on x-axis | k1=5, k2=10
Plot showing curves from 0 to 1 on y-axis and 0 to 30 on x-axis | k1=5, k2=40
Plot showing curves from 0 to 1 on y-axis and 0 to 30 on x-axis |
-| k1=10, k2=1
Plot showing curves from 0 to 1 on y-axis and 0 to 30 on x-axis | k1=10, k2=10
Plot showing curves from 0 to 1 on y-axis and 0 to 30 on x-axis | k1=10, k2=40
Plot showing curves from 0 to 1 on y-axis and 0 to 30 on x-axis |
+Row 1:
+- k1=1, k2=1: Shows curves from 0 to 1 on y-axis, 0 to 30 on x-axis
+- k1=1, k2=10: Shows curves from 0 to 1 on y-axis, 0 to 30 on x-axis
+- k1=1, k2=40: Shows curves from 0 to 1 on y-axis, 0 to 30 on x-axis
+Row 2:
+- k1=5, k2=1: Shows curves from 0 to 1 on y-axis, 0 to 30 on x-axis
+- k1=5, k2=10: Shows curves from 0 to 1 on y-axis, 0 to 30 on x-axis
+- k1=5, k2=40: Shows curves from 0 to 1 on y-axis, 0 to 30 on x-axis
+
+Row 3:
+- k1=10, k2=1: Shows curves from 0 to 1 on y-axis, 0 to 30 on x-axis
+- k1=10, k2=10: Shows curves from 0 to 1 on y-axis, 0 to 30 on x-axis
+- k1=10, k2=40: Shows curves from 0 to 1 on y-axis, 0 to 30 on x-axis
Legend:
- True DTE (solid black line)
-- Makarov lower (dashed red line)
-- Makarov upper (dashed red line)
-- New lower bound (solid blue line)
+- Makarov lower (red dashed line)
+- Makarov upper (red dashed line)
+- New lower bound (solid blue line)]
Figure 12: New bounds v.s. Makarov bounds
diff --git a/llama_parse_results/markdowns/page_62.md b/llama_parse_results/markdowns/page_62.md
index 7fe01f1..08afda3 100644
--- a/llama_parse_results/markdowns/page_62.md
+++ b/llama_parse_results/markdowns/page_62.md
@@ -1,6 +1,6 @@
-[ECHA EUROPEAN CHEMICALS AGENCY logo]
+[ECHA Logo - European Chemicals Agency]
# 4. FORM AND CONTENT OF THE TENDER
@@ -19,8 +19,7 @@ The following requirements apply to the technical and financial offer (to be upl
* *Technical offer.*
a) The technical proposal of the Tenderer shall be in free format and in accordance with the page limitation instructions provided**.**
-The technical offer must provide all the information needed to assess the compliance with **section 1.4** of these specifications, the **Annex 1 "Technical Specifications"** and the award criteria.
-
+ The technical offer must provide all the information needed to assess the compliance with **section 1.4** of these specifications, the **Annex 1 "Technical Specifications"** and the award criteria.
b) The Minimum Requirements Checklist in **Annex 14 "Minimum requirements checklist"** must also be submitted in the technical offer.
* *Financial offer.*
@@ -35,6 +34,6 @@ As part of the financial offer, tenderers must submit:
In case of doubt between the original electronic format and the scanned version of the financial model, the latter will prevail.
-Each tenderer's financial offer must be completely unambiguous and unconditional. Tenders which contain statements preventing an accurate and complete comparison of the tenders (e.g. "To be discussed", "Depending on x", etc.) or referring to external circumstances (such as an already existing but separate contract) will be disqualified.
+> Each tenderer's financial offer must be completely unambiguous and unconditional. Tenders which contain statements preventing an accurate and complete comparison of the tenders (e.g. "To be discussed", "Depending on x", etc.) or referring to external circumstances (such as an already existing but separate contract) will be disqualified.
43
diff --git a/llama_parse_results/markdowns/page_63.md b/llama_parse_results/markdowns/page_63.md
index a0107e8..0b93582 100644
--- a/llama_parse_results/markdowns/page_63.md
+++ b/llama_parse_results/markdowns/page_63.md
@@ -1,8 +1,10 @@
+European Investment Bank The EU bank
+
General Administrative and Submission Clauses
-• An image of the signature copy-pasted on the document is not acceptable, the signature should be made by hand (the document should be printed, hand signed and then scanned to pdf or image format).
+* An image of the signature copy-pasted on the document is not acceptable, the signature should be made by hand (the document should be printed, hand signed and then scanned to pdf or image format).
**Ad ii)** a copy of the corporate registration document (e.g. extract from the national register of companies, Official Gazette, etc.) or other proof of establishment (formation) issued by a national authority shall also be attached the VIF.
@@ -10,21 +12,16 @@ General Administrative and Submission Clauses
The registration document shall, as a minimum, include the following information:
-• official registered name;
-
-• official registered address (seat/Head Office);
-
-• alternative addresses, if any;
-
-• name and title of legal representative(s);
-
-• registration number;
-
-• VAT number (if available on the same document).
+* official registered name;
+* official registered address (seat/Head Office);
+* alternative addresses, if any;
+* name and title of legal representative(s);
+* registration number;
+* VAT number (if available on the same document).
Format:
-• Image file or pdf, as a scan of the document issued by the relevant registration authority.
+* Image file or pdf, as a scan of the document issued by the relevant registration authority.
Please note that the provision of the additional administrative documentation is necessary in order to prepare the contract as well as to authorise payments.
@@ -38,8 +35,8 @@ Where the `Terms of Reference` refers to 'Tenderer' it shall be considered as 'S
**Product names and trademarks**: whenever the technical specifications mention a specific product name or trademark and a sufficiently precise and fully intelligible description is not possible, such mention should be understood as referring to that product or its equivalent, unless otherwise provided for in the Terms of Reference.
-Once the contract has entered into force, the prices indicated in the financial proposal of the successful Tenderer may only be revised under the conditions laid down in the contract.
+~~Once the contract has entered into force, the prices indicated in the financial proposal of the successful Tenderer may only be revised under the conditions laid down in the contract.~~
Please be aware that after the UK's withdrawal from the EU, the rules of access to EU procurement procedures of economic operators established in third countries will apply to candidates or tenderers
-Last updated: June 2020 Page 17 of 21
+Last updated: June 2020 Page 17 of 21
diff --git a/llama_parse_results/markdowns/page_70.md b/llama_parse_results/markdowns/page_70.md
index 1d98d28..99d9d35 100644
--- a/llama_parse_results/markdowns/page_70.md
+++ b/llama_parse_results/markdowns/page_70.md
@@ -1,6 +1,6 @@
-Draft Document for Review December 11, 2019 1:55 pm 8459ch06.fm
+Draft Document for Review December 11, 2019 1:55 pm 8459ch06.fm
environment. The Master, Infrastructure and Compute Roles are deployed to a single node (Figure 6-1).
@@ -12,37 +12,62 @@ environment. The Master, Infrastructure and Compute Roles are deployed to a sing
|
-| Application Users
http\:/\.ocp.example.com
https\:/\.ocp.example.com:443 | | | | |
-| ---------------------------------------------------------------------------------------------- | - | - | - | - |
+| ☺ ☺ | | | | |
+| -------------------------------------------------------------------------------------------------- | - | - | - | - |
+| ☺ ☺ ☺ | | | | |
+| **Application Users**
http\:/\.ocp.example.com
https\:/\.ocp.example.com:443 | | | | |
|
+| ↓ ↓ ↓ ↓ |
+
+
-| **1** | **Web Console :8443**
https\://ocp.example.com:8443 | | **Router :80 & :443** | **2** |
-| ----- | ------------------------------------------------------- | - | --------------------- | ----- |
-| | POD
POD
C POD
POD
C | | | |
+| **1** | **Web Console :8443** - - - - **Router :80 & :443 2 ←** | | |
+| ----- | -------------------------------------------------------------- | - | - |
+| | https\://ocp.example.com:8443 | | |
+| | POD
POD
POD
C POD
POD
POD
C
3 PODs | | |
-3 PODs
|
-
-REGISTRY
-Jenkins
-S2i
-Prometheus
-K8s Operators
-OLM
-............
+ | REGISTRY |
+
+
+| Jenkins |
+
+
+|
+
+| 🗄️ 🗄️ 🗄️ | | |
+| ----------- | --------------- | - |
+| **4** | **PVC Storage** | |
+
+
|
+S2i |
+
+
+ |
+ |
+Prometheus |
-|
-|
-| 4 PVC Storage |
|
+ |
+K8s Operators |
+
+
+ |
+ |
+OLM |
+
+
+ |
+ |
+............ |
@@ -50,40 +75,46 @@ environment. The Master, Infrastructure and Compute Roles are deployed to a sing
-*Figure 6-1 OpenShift Container Platform 3.11 all-in-one*
+*Figure 6-1 OpenShift Container Platform 3.11 all-in-one*
-► **Seven nodes deployment** is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2).
+* **Seven nodes deployment** is highly available and suitable for production. The Master and Infrastructure Roles are deployed to three Nodes, the Computer Role is deployed to three Worker Nodes, and the Load Balancer is deployed to a single Node (Figure 6-2).
-| Automation
CI/CD Tools Cluster
Administrators Developers Application
Owners Application
Users http\:/\.ocp.example.com
https\:/\.ocp.example.com:443 | | | |
-| -------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- | - | - | - |
+| Automation
CI/CD Tools Cluster
Administrators Developers Application
Owners ☺ ☺
☺ ☺ ☺
Application
Users http\:/\.ocp.example.com
https\:/\.ocp.example.com:443 | | | | |
+| -------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- | - | - | - | - |
+| ↓ ↓ ↓ ↓ |
+
+
-| **Load Balancer \[LB]** | | |
-| ----------------------- | ------------------ | ------------------ |
-| **Routers** | | |
-| **Master - Infra** | **Master - Infra** | **Master - Infra** |
-| **Registry** | | |
-| **1** **Master Nodes** | | |
+| **Load Balancer \[LB]** | | |
+| -------------------------- | -------------------------- | -------------------------- |
+| ↙ ↓ ↘ | | |
+| **Routers** | | |
+| **Master - Infra**
🖥️ | **Master - Infra**
🖥️ | **Master - Infra**
🖥️ |
+| **Registry** | | |
+| **1** | **Master Nodes** | |
|
+ |
-| APP
POD
POD
C | APP
POD
POD
C | APP
POD
POD
C |
-| --------------------------- | ------------------------- | ------------------------- |
-| **PVC Storage** | | |
-| **2** **Application Nodes** | | |
+| **APP
POD
POD
C** | **APP
POD
POD
C** | **APP
POD
POD
C** |
+| ----------------------------- | ----------------------------- | ----------------------------- |
+| 🗄️ 🗄️ 🗄️ | | |
+| **PVC Storage** | | |
+| **2** | **Application Nodes** | |
|
-*Figure 6-2 OpenShift Container Platform 3.11 6xNodes + Load Balancer*
+*Figure 6-2 OpenShift Container Platform 3.11 6xNodes + Load Balancer*
-Chapter 6. Installing Red Hat OpenShift 3.11 on IBM PowerVC 105
+Chapter 6. Installing Red Hat OpenShift 3.11 on IBM PowerVC 105
diff --git a/llama_parse_results/markdowns/page_72.md b/llama_parse_results/markdowns/page_72.md
index 2932b8d..ed916b3 100644
--- a/llama_parse_results/markdowns/page_72.md
+++ b/llama_parse_results/markdowns/page_72.md
@@ -1,8 +1,8 @@
-Basic English Language Skills
+# Basic English Language Skills
-[Decorative image showing typewriter keys with letters D, F, G, H, J, K visible on circular white keys against a dark background]
+[Decorative image showing typewriter keys with letters D, F, G, H, J, K on circular white buttons against a dark background]
## Approve/Approve of
@@ -28,4 +28,4 @@ E.g. He complimented her by telling her that she was a good writer.
You "complement" something (or someone) when you add something else to it that suits or fits it well.
E.g. That scarf complements her dress.
-[Decorative image showing typewriter keys with letters E, R, T, Y, U, I visible on circular white keys against a dark background]
\ No newline at end of file
+[Decorative image showing typewriter keys with letters E, R, T, Y, U, I on circular white buttons against a dark background]
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_75.md b/llama_parse_results/markdowns/page_75.md
index c2fdff1..e030c44 100644
--- a/llama_parse_results/markdowns/page_75.md
+++ b/llama_parse_results/markdowns/page_75.md
@@ -36,6 +36,8 @@ Monday-Friday 8:30AM-5:30PM PST
NOTE: This warranty is valid to U.S.A. customers who have purchased this product from an authorized BARSKA dealer in the U.S.A.
+----
+
# MICROSCOPE USER MANUAL
**MODEL AY11240**
diff --git a/llama_parse_results/markdowns/page_77.md b/llama_parse_results/markdowns/page_77.md
index abe50c2..c4e791f 100644
--- a/llama_parse_results/markdowns/page_77.md
+++ b/llama_parse_results/markdowns/page_77.md
@@ -4,13 +4,9 @@
Now choose any cell in this table and choose Pivot Table wizard in the Data menu. Excel asks for the data source and suggests this table. Click OK.
-[Screenshot showing Excel interface with Insert tab ribbon displaying PivotTable, Table, Picture, Clip Art, and Shapes options. An "Insert PivotTable" dialog box is open with text explaining "Click here to summarize data using a PivotTable or to insert a PivotChart. PivotTables make it easy to arrange and summarize complicated data and drill down on details." Adjacent to this is a spreadsheet showing columns for "Name of Worker", "Week", "Nature of Payment", and "Amount" with entries for "Washing Allowance" and "Conveyance Expenses". A "Create PivotTable" dialog box is displayed showing options to "Select a table or range" with Table Range "Sheet1!$A$2:$D$50" and "Use an external data source", along with options to choose where the PivotTable report should be placed with "New Worksheet" and "Existing Worksheet" radio buttons.]
-
Here, we need to understand the data range. Excel suggests the table as shown in above Slide. If you expect to add data in the future, set the data range to include as many rows as you think you will ever need. Rather than A1:D50, you may want to specify $A$1:$D$500.
One more suggestion is, as shown in Graphic you can define the Destination of Pivot Table as New Sheet or Existing Sheet.
-[Screenshot showing "Create PivotTable" dialog box with "Choose the data that you want to analyze" section showing "Select a table or range" with Table Range "Sheet1!$A$2:$D$50" and "Use an external data source" option. Below is "Choose where you want the PivotTable report to be placed" section with "New Worksheet" and "Existing Worksheet" radio buttons, with a Location field. The "New Worksheet" and "Existing Worksheet" options are highlighted with a red border. OK and Cancel buttons are at the bottom.]
-
Page
19#
diff --git a/llama_parse_results/markdowns/page_8.md b/llama_parse_results/markdowns/page_8.md
index 40fa8a0..347163e 100644
--- a/llama_parse_results/markdowns/page_8.md
+++ b/llama_parse_results/markdowns/page_8.md
@@ -2,34 +2,32 @@
6
-[Figure: A line graph with x-axis labeled "Mode Number" ranging from 0 to 25, and y-axis labeled "λi" with logarithmic scale from 0.01 to 10. The line shows a steep decline from high values near mode 0, dropping sharply until about mode 10, then gradually flattening out towards mode 25.]
+[Figure: A line graph with x-axis labeled "Mode Number" ranging from 0 to 25, and y-axis labeled "λᵢ" with logarithmic scale from 0.01 to 10. The line shows a steep decline from high values near mode 0, dropping sharply until about mode 5, then gradually declining with a noticeable "kink" around mode 10, after which it flattens out approaching zero.]
FIG. 4: An ordered list of the Eigenvalues for our cluster covariance matrix.
-Before we invert $C_{ij}$ in Eqn. 12, we note that the values of $C_{ij}$ are estimated to limited resolution,
+Before we invert $$C_{ij}$$ in Eqn. 12, we note that the values of $$C_{ij}$$ are estimated to limited resolution,
-$$\Delta C_{ij} = \sqrt{\frac{2}{N_{jk}}}$$
-(14)
+$$\Delta C_{ij} = \sqrt{\frac{2}{N_{jk}}} \tag{14}$$
-and therefore, if $N_{jk}$ is small, or there are degeneracies within $C_{ij}$, the inversion will be affected. This problem can be eliminated by performing a Single Value Decomposition (SVD) of the matrix,
+and therefore, if $$N_{jk}$$ is small, or there are degeneracies within $$C_{ij}$$, the inversion will be affected. This problem can be eliminated by performing a Single Value Decomposition (SVD) of the matrix,
-$$C_{ij} = U_{ik}^{\dagger} D_{kl} V_{lj},$$
-(15)
+$$C_{ij} = U_{ik}^{\dagger} D_{kl} V_{lj}, \tag{15}$$
-where $U$ and $V$ are orthogonal matrices that span the range and the null space of $C_{ij}$ and $D_{kl} = \lambda^2 \delta_{kl}$, a diagonal matrix with singular values along the diagonal. In doing the SVD, we select the dominant modes to contribute to the $\chi^2$ by requiring that $\lambda^2 > \sqrt{2/N_{jk}}$.
+where $$U$$ and $$V$$ are orthogonal matrices that span the range and the null space of $$C_{ij}$$ and $$D_{kl} = \lambda^2 \delta_{kl}$$, a diagonal matrix with singular values along the diagonal. In doing the SVD, we select the dominant modes to contribute to the $$\chi^2$$ by requiring that $$\lambda^2 > \sqrt{2/N_{jk}}$$.
-In Figure 4, we rank the eigenvalues ($\lambda_i$) for the increasing eigenmodes and see a "kink" in the distribution which we interpret as indicating a transition in the signal–to–noise of the eigenmodes, i.e., only the first ten modes contain most of the signal, while higher-ordered modes are dominated by noise. We therefore remove eigenmodes beyond this kink (with $\lambda_i < 0.01$) where the eigenvalues start to flatten out.
+In Figure 4, we rank the eigenvalues ($$\lambda_i$$) for the increasing eigenmodes and see a "kink" in the distribution which we interpret as indicating a transition in the signal–to–noise of the eigenmodes, i.e., only the first ten modes contain most of the signal, while higher-ordered modes are dominated by noise. We therefore remove eigenmodes beyond this kink (with $$\lambda_i < 0.01$$) where the eigenvalues start to flatten out.
## A. Statistical determination of large scale flow
As discussed in the Introduction, there is recent evidence for excessive bulk flow motions compared to the WMAP5-normalised ΛCDM model [18] and therefore, it is important to confirm these results as it may indicate evidence for an alternative explanation for the observed cosmic acceleration such as modified gravity. In this paper, we provide a first demonstration of our new parameterization using clusters of galaxies from the SDSS. In detail, we attempt to model the "squashing" of the 2-D correlation function of the C4 cluster sample seen in Figure 5 using the formalism presented herein. We do however caution the reader that we expect the limited size of the DR3 sample to leads to large statistical errors, due to a significant shot–noise contribution because of their low number density. However, future cluster and galaxy samples (e.g., LRGs) should provide stronger constraints and provide a more robust test of these high bulk flow measurements in the literature.
-In Figure 5, we provide the best fit parameters $b$ and $v_p$ for the C4 correlation function presented in Figure 3 and there is as expected a clear anti-correlation between these two parameters because the anisotropic amplitude is generated by cross-correlations in the density and peculiar velocity fields. The best fit value from Figure 5 is $v_p = 270^{+433}$ km/s (at the $1\sigma$ level marginalised with other parameters including $b$) and is consistent with $v_p = 0$. We do not quote the negative bound of the error on $v_p$ as it is below zero and thus has no physical meaning. Instead, we quote the upper bound on $v_p$ and note that our result is consistent with zero. Our measurement of $v_p$ is close to the predicted value of 203 km/s for a WMAP5–normalised ΛCDM model.
+In Figure 5, we provide the best fit parameters $$b$$ and $$v_p$$ for the C4 correlation function presented in Figure 3 and there is as expected a clear anti-correlation between these two parameters because the anisotropic amplitude is generated by cross-correlations in the density and peculiar velocity fields. The best fit value from Figure 5 is $$v_p = 270^{+433}$$ km/s (at the $$1\sigma$$ level marginalised with other parameters including $$b$$) and is consistent with $$v_p = 0$$. We do not quote the negative bound of the error on $$v_p$$ as it is below zero and thus has no physical meaning. Instead, we quote the upper bound on $$v_p$$ and note that our result is consistent with zero. Our measurement of $$v_p$$ is close to the predicted value of 203 km/s for a WMAP5–normalised ΛCDM model.
-We propose above that $v_p$ is a complementary parameter for reporting such peculiar velocity measurements. The parameter $g_{\Theta}$, which is equivalent to $f\sigma_8$, is not determined precisely without the prior information of $A_S$. But when we report our measurement with $v_p$, there is no uncertainty due to other cosmological parameters which are not determined accurately, as it is equivalent to $g_{\Theta}^*$ determined statistically from redshift space distortion. The observed value $v_p$ at a given redshift is not only independent of bias but also independent of normalisation.
+We propose above that $$v_p$$ is a complementary parameter for reporting such peculiar velocity measurements. The parameter $$g_{\Theta}$$, which is equivalent to $$f\sigma_8$$, is not determined precisely without the prior information of $$A_S$$. But when we report our measurement with $$v_p$$, there is no uncertainty due to other cosmological parameters which are not determined accurately, as it is equivalent to $$g_{\Theta}^*$$ determined statistically from redshift space distortion. The observed value $$v_p$$ at a given redshift is not only independent of bias but also independent of normalisation.
-## B. Reconstruction of matter density field from vp
+## B. Reconstruction of matter density field from $$v_p$$
-We convert $v_p$ measurement into $g_{\Theta}$ using $A_s$ from WMAP5 ($g_{\Theta}$: coherent growth factor of peculiar velocity, and it is equivalent to $f\sigma_8$ in other parameterizations). With the evolution of $g_{\Theta}$ known, dynamics of perturbations are reconstructed to provide the history of $\Psi$ through the Euler equation. In most theoretical models, the time variation of $v_p$ is minimal at these low redshifts discussed here for the C4 sample ($z \approx 0.1$), which allows us to ignore the time-derivative part in Eq. 9. Therefore, it is straightforward to transform the coherent evolution of $\Theta$ into the coherent evolution of $\Psi$. If we assume no anisotropic stress, then it is easy to convert to the coherent evolution of $\Phi$, $g_{\Phi}$.
+We convert $$v_p$$ measurement into $$g_{\Theta}$$ using $$A_s$$ from WMAP5 ($$g_{\Theta}$$: coherent growth factor of peculiar velocity, and it is equivalent to $$f\sigma_8$$ in other parameterizations). With the evolution of $$g_{\Theta}$$ known, dynamics of perturbations are reconstructed to provide the history of $$\Psi$$ through the Euler equation. In most theoretical models, the time variation of $$v_p$$ is minimal at these low redshifts discussed here for the C4 sample ($$z \approx 0.1$$), which allows us to ignore the time-derivative part in Eq. 9. Therefore, it is straightforward to transform the coherent evolution of $$\Theta$$ into the coherent evolution of $$\Psi$$. If we assume no anisotropic stress, then it is easy to convert to the coherent evolution of $$\Phi$$, $$g_{\Phi}$$.
-We are able to determine matter density fluctuations through the Poisson equation. We calculate the coherent growth of $\delta_m$, $g_{\delta} = 0.7$, which is related to $g_{\Phi}$ as
\ No newline at end of file
+We are able to determine matter density fluctuations through the Poisson equation. We calculate the coherent growth of $$\delta_m$$, $$g_{\delta} = 0.7$$, which is related to $$g_{\Phi}$$ as
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_81.md b/llama_parse_results/markdowns/page_81.md
index 02716e5..ed08a44 100644
--- a/llama_parse_results/markdowns/page_81.md
+++ b/llama_parse_results/markdowns/page_81.md
@@ -20,7 +20,7 @@ Congratulations on your purchase of this high quality BARSKA microscope. With pr
1. Do not attempt to disassemble the instrument. This product has been carefully assembled at the factory and should only be examined by a factory-trained technician.
-2. This instrument should only be used in an environment with an indoor temperature range of 32oF to 104oF.
+2. This instrument should only be used in an environment with an indoor temperature range of 32ºF to 104ºF.
3. Do not use this instrument in an environment with a lot of dust. Cover the instrument when not in use.
@@ -50,47 +50,59 @@ Proper care and storage of this instrument is essential. Please read the followi
**Model AY11240**
-Eyepiece ← Eyepiece
+Eyepiece
Barrel
-Revolving Turret → Coarse Adjustment Knob
+Revolving Turret
-Objectives → Fine Adjustment Knob
+Objectives
Spring Clips
-Stand ← Stand
-
Stage
-5-Hole Diaphragm and Condenser
-
Concave Mirror
+Coarse Adjustment Knob
+
+Fine Adjustment Knob
+
+Stand
+
+5-Hole Diaphragm and Condenser
+
**Model AY11238**
Eyepiece
-Monocular Tube → Eyepiece
+Monocular Tube
Eyepiece Set Screw
-Rotating Head → Stage Height Limit Adjustment
+Rotating Head
+
+Stage Height Limit Adjustment
+
+Stand
-Revolving Turret → Stand
+Revolving Turret
-Objectives → Coarse Adjustment Knob
+Objectives
Spring Clips
-Stage → Fine Adjustment Knob
+Stage
5-Hole Diaphragm and Condenser
+Coarse Adjustment Knob
+
+Fine Adjustment Knob
+
Power Cord
-Lamp ← Lamp
+Lamp
Lamp On/Off Switch
@@ -100,6 +112,6 @@ BARSKA Model AY11240 and Model AY11238 are designed for biological studies such
# CONSTRUCTION
-BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90o vertical to 45o level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45o angle. The head rotates 360o. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.
+BARSKA Model AY11240 is a fixed tube type. For comfortable observation, the arm can be easily tilted at any angle from 90º vertical to 45º level. It is also equipped with a coarse adjustment and fine adjustment as well as a space limiter to protect the objective from contacting and damaging the specimen. BARSKA Model AY11238 features a monocular tube that is slanted at a 45º angle. The head rotates 360º. The Eyepiece Set Screw prevents the eyepiece from falling out of the tube.
1 2
diff --git a/llama_parse_results/markdowns/page_88.md b/llama_parse_results/markdowns/page_88.md
index dca4ab0..5dac5e5 100644
--- a/llama_parse_results/markdowns/page_88.md
+++ b/llama_parse_results/markdowns/page_88.md
@@ -3,6 +3,15 @@
28
Projects Report
+[Map showing South America with Peru, Bolivia, Argentina, and Chile. The map includes latitude markers at 70°, 20°, 30°, 40°, and 50°. Key locations marked include:
+- PERU (northwestern region)
+- BOLIVIA (northeastern region)
+- ARGENTINA (eastern region)
+- NUEVA ESPERANZA (marked with label in northern Chile)
+- COPIAPO (marked with label in northern Chile)
+- Cities marked: Antofagasta, Chañaral, La Serena, Santiago
+- A globe diagram showing the location of the region in South America]
+
# Nueva Esperanza Project
Chile
@@ -11,7 +20,7 @@ Chile
The Nueva Esperanza Project is 100% owned by Kingsgate since February 2012. Nueva Esperanza is located in the Maricunga Gold Belt near Copiapó, a regional mining centre in Northern Chile. The silver-rich mineralisation is hosted by the Esperanza high-sulphidation epithermal alteration system associated with the Cerros Bravos volcanic complex.
-> The project consists of three well-defined mineralised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimberos and Teterita. Arqueros was previously mined on a limited scale by underground methods and Chimberos was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60)1.
+The project consists of three well-defined mineralised deposits and a number of undeveloped exploration targets. The main deposits are Arqueros, Chimberos and Teterita. Arqueros was previously mined on a limited scale by underground methods and Chimberos was exploited as an open pit mine, delivering about 40 million ounces of silver in 1998/99. All three deposits currently have a combined Mineral Resources of about 93 million ounces of silver equivalent or 1.6 million ounces of gold equivalent (EQ60)1.
A feasibility study for a decision to mine the Arqueros portion of Nueva Esperanza was completed in late 2012, demonstrating that open pit mining at two million tonnes per year and processing by milling and agitation leaching in cyanide was technically feasible. Work remained to integrate the Teterita and Chimberos deposits into the project, as well as to test lower cost options for processing. Continued metallurgical testwork has shown that mineralisation from all three deposits by heap leaching is technically and economically feasible and the preferred alternative for development.
@@ -19,6 +28,6 @@ Environmental approvals to commence construction and mining at Nueva Esperanza w
----
-1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content *divided* by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).
+1 Equivalence is based on gold/silver price ratio of 60. Gold equivalence = gold content plus (silver content *divided* by 60), whereas Silver equivalent silver content plus (gold content multiplied by 60).
www.kingsgate.com.au
diff --git a/llama_parse_results/markdowns/page_92.md b/llama_parse_results/markdowns/page_92.md
index 2f25f61..6035246 100644
--- a/llama_parse_results/markdowns/page_92.md
+++ b/llama_parse_results/markdowns/page_92.md
@@ -1,8 +1,6 @@
-Santos Annual Report 2004 :: 15
-
-# Creating Opportunities
+Creating Opportunities
# DELIVERING ON THE EXPLORATION STRATEGY
@@ -40,4 +38,6 @@ Other wells in the offshore Otway Basin included the deep water Amrit 1 well, wh
Vice President
Geoscience and New Ventures
-Float-off of Jack Bates rig prior to deep water drilling operations, offshore Otway Basin, Victoria.
\ No newline at end of file
+Float-off of Jack Bates rig prior to deep water drilling operations, offshore Otway Basin, Victoria.
+
+Santos Annual Report 2004 15
diff --git a/llama_parse_results/markdowns/page_93.md b/llama_parse_results/markdowns/page_93.md
index c961b59..8a22562 100644
--- a/llama_parse_results/markdowns/page_93.md
+++ b/llama_parse_results/markdowns/page_93.md
@@ -76,7 +76,7 @@ CHK
LISTED
NYSE
-[Aerial photograph showing an industrial or energy facility with storage tanks and buildings surrounded by residential areas and vegetation]
+[Aerial photograph showing an industrial or energy facility with surrounding residential areas and landscape]
WWW.CHK.COM
@@ -88,4 +88,4 @@ YOUTUBE.COM/CHESAPEAKEENERGY
FSC MIX
Paper from responsible sources
-FSC® C101537
\ No newline at end of file
+FSC C101537
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_96.md b/llama_parse_results/markdowns/page_96.md
index 465a09c..43dfc20 100644
--- a/llama_parse_results/markdowns/page_96.md
+++ b/llama_parse_results/markdowns/page_96.md
@@ -18,7 +18,7 @@ Because of its relatively low operating costs, the Eagle Ford to remains profita
| JAN-15 | \~90 | \~140 | \~4.3 |
-### EAGLE FORD
+**EAGLE FORD**
*As at and for the Year Ended 31 December 2014*
| Production (boe) | 1,696,549 |
@@ -49,7 +49,7 @@ Since its entrance into the Eagle Ford in March 2013, the Company has:
• increased its undrilled 3P Reserves drilling locations to 153.7 net; which represents a 4.3 year drilling inventory (assuming two rig program drilling 36 net wells per year and 40-80 acre spacing)
-### EAGLE FORD CONSTANT CASE RESERVES
+**EAGLE FORD CONSTANT CASE RESERVES**
*As at and for the Year Ended 31 December 2014*
| 1P Reserves (mboe) | 18,131.9 |
@@ -61,9 +61,12 @@ Since its entrance into the Eagle Ford in March 2013, the Company has:
| Net 3P Reserves Drilling Locations | 153.7 |
-[Map of Texas showing Eagle Ford field locations with the following elements:
-- State of Texas outline
-- SEA Field Office and SEA Acreage marked in legend
-- Counties labeled: Maverick, Dimmit, Atascosa, McMullen, Live Oak
-- Windows marked: Oil Window (green), Volatile Oil & Condensate Window (yellow/orange), Dry Gas Window (red/orange)
-- Shaded areas showing SEA acreage and field office locations across the Eagle Ford trend]
\ No newline at end of file
+**Map of Texas showing Eagle Ford Operations:**
+
+The map displays the Eagle Ford field area in South Texas, showing:
+- SEA Field Office and SEA Acreage locations
+- Counties: Maverick, Dimmit, Atascosa, McMullen, Live Oak
+- Oil Window (shown in green)
+- Volatile Oil & Condensate Window (shown in orange/red)
+- Dry Gas Window (shown in red)
+- Field boundaries and acreage positions marked in blue and gray shading
\ No newline at end of file
diff --git a/llama_parse_results/markdowns/page_99.md b/llama_parse_results/markdowns/page_99.md
index eb6da1a..e47fb69 100644
--- a/llama_parse_results/markdowns/page_99.md
+++ b/llama_parse_results/markdowns/page_99.md
@@ -2,7 +2,7 @@
2010 ANNUAL REPORT | 3
-# Production Growth
+## Production Growth
Average mmcfe per day for year
| Year | Production (mmcfe/day) |
@@ -16,100 +16,99 @@ Average mmcfe per day for year
| 06 | 2,000 |
| 07 | 2,400 |
| 08 | 2,500 |
-| 09 | 2,400 |
-| 10 | 2,900 |
+| 09 | 2,800 |
-# Proved Reserve Growth
+## Proved Reserve Growth
Bcfe at end of year
-| Year | Reserves (Bcfe) |
-| ---- | --------------- |
-| 00 | 1,500 |
-| 01 | 2,000 |
-| 02 | 2,200 |
-| 03 | 3,000 |
-| 04 | 4,800 |
-| 05 | 7,500 |
-| 06 | 9,000 |
-| 07 | 10,500 |
-| 08 | 11,500 |
-| 09 | 14,500 |
-| 10 | 17,500 |
-
-
-# Total Resource Base Growth*
+| Year | Proved Reserves (Bcfe) |
+| ---- | ---------------------- |
+| 00 | 1,500 |
+| 01 | 2,000 |
+| 02 | 2,200 |
+| 03 | 3,000 |
+| 04 | 4,800 |
+| 05 | 7,500 |
+| 06 | 9,000 |
+| 07 | 10,500 |
+| 08 | 11,800 |
+| 09 | 14,500 |
+| 10 | 17,500 |
+
+
+## Total Resource Base Growth*
Bcfe at end of year
-| Year | Resource Base (Bcfe) |
-| ---- | -------------------- |
-| 00 | 0 |
-| 01 | 0 |
-| 02 | 0 |
-| 03 | 0 |
-| 04 | 0 |
-| 05 | 50,000 |
-| 06 | 75,000 |
-| 07 | 105,000 |
-| 08 | 175,000 |
-| 09 | 190,000 |
-| 10 | 285,000 |
+| Year | Total Resource Base (Bcfe) |
+| ---- | -------------------------- |
+| 00 | 10,000 |
+| 01 | 15,000 |
+| 02 | 20,000 |
+| 03 | 50,000 |
+| 04 | 65,000 |
+| 05 | 80,000 |
+| 06 | 105,000 |
+| 07 | 165,000 |
+| 08 | 175,000 |
+| 09 | 190,000 |
+| 10 | 280,000 |
*Proved and unrisked, unproved reserves
-# Chesapeake's Stock Price
+## Chesapeake's Stock Price
Chesapeake's Stock Price at Month End — Henry Hub Natural Gas Spot Price at Month End
-| Period | CHK Stock Price ($) | Henry Hub Price ($/mcf) |
-| ------ | ------------------- | ----------------------- |
-| DEC 00 | \~0.10 | \~5.00 |
-| DEC 01 | \~0.15 | \~2.50 |
-| DEC 02 | \~0.15 | \~5.00 |
-| DEC 03 | \~0.20 | \~6.00 |
-| DEC 04 | \~0.25 | \~6.50 |
-| DEC 05 | \~0.40 | \~15.00 |
-| DEC 06 | \~0.35 | \~6.50 |
-| DEC 07 | \~0.55 | \~7.50 |
-| DEC 08 | \~0.20 | \~5.50 |
-| DEC 09 | \~0.25 | \~5.50 |
-| DEC 10 | \~0.25 | \~4.50 |
+| Period | CHK Stock Price ($) | Henry Hub Natural Gas Spot Price ($/mcf) |
+| ------ | ------------------- | ---------------------------------------- |
+| DEC 00 | 0.50 | 5.00 |
+| DEC 01 | 1.00 | 2.50 |
+| DEC 02 | 1.50 | 4.50 |
+| DEC 03 | 2.00 | 6.00 |
+| DEC 04 | 2.50 | 6.50 |
+| DEC 05 | 3.80 | 15.00 |
+| DEC 06 | 3.50 | 6.50 |
+| DEC 07 | 5.50 | 7.00 |
+| DEC 08 | 1.50 | 5.50 |
+| DEC 09 | 2.50 | 5.00 |
+| DEC 10 | 2.50 | 4.50 |
-# Chesapeake's Five-Year and Ten-Year Common Stock Performance
+## Chesapeake's Five-Year and Ten-Year Common Stock Performance
The graphs below compare the performance of our common stock to the S&P 500 Stock Index and a group of peer companies for the past five and 10 years. The graph on the left assumes an investment of $100 on December 31, 2004 and the reinvestment of all dividends. The graph on the right assumes an investment of $100 on December 31, 1999 and the reinvestment of all dividends. The graphs show the value of the investment at the end of each year.
-## FIVE-YEAR PERFORMANCE
+### FIVE-YEAR PERFORMANCE
As of December 31
-| Year | CHK | 2010 Peer Group | S\&P 500 |
-| ---- | ---- | --------------- | -------- |
-| 05 | $100 | $100 | $100 |
-| 06 | $120 | $140 | $115 |
-| 07 | $150 | $125 | $120 |
-| 08 | $55 | $80 | $75 |
-| 09 | $90 | $115 | $95 |
-| 10 | $90 | $145 | $110 |
+| Year | CHK | 2010 Peer Group | S\&P 500 |
+| ---- | --- | --------------- | -------- |
+| 05 | 100 | 100 | 100 |
+| 06 | 120 | 110 | 115 |
+| 07 | 145 | 125 | 120 |
+| 08 | 55 | 75 | 75 |
+| 09 | 90 | 110 | 95 |
+| 10 | 90 | 145 | 110 |
-## TEN-YEAR PERFORMANCE
+### TEN-YEAR PERFORMANCE
As of December 31
-| Year | CHK | 2010 Peer Group | S\&P 500 |
-| ---- | ---- | --------------- | -------- |
-| 00 | $100 | $100 | $100 |
-| 01 | $75 | $80 | $90 |
-| 02 | $75 | $75 | $70 |
-| 03 | $150 | $100 | $90 |
-| 04 | $180 | $150 | $100 |
-| 05 | $310 | $200 | $105 |
-| 06 | $300 | $280 | $120 |
-| 07 | $410 | $300 | $125 |
-| 08 | $170 | $200 | $80 |
-| 09 | $280 | $280 | $100 |
-| 10 | $300 | $300 | $115 |
+| Year | CHK | 2010 Peer Group | S\&P 500 |
+| ---- | --- | --------------- | -------- |
+| 00 | 100 | 100 | 100 |
+| 01 | 75 | 100 | 90 |
+| 02 | 80 | 90 | 70 |
+| 03 | 150 | 110 | 90 |
+| 04 | 310 | 160 | 100 |
+| 05 | 300 | 200 | 105 |
+| 06 | 360 | 220 | 120 |
+| 07 | 410 | 300 | 125 |
+| 08 | 165 | 180 | 80 |
+| 09 | 270 | 265 | 100 |
+| 10 | 300 | 300 | 115 |
(1) The 2010 peer group is comprised of Anadarko Petroleum Corp., Apache Corp., Devon Energy Corp., Encana Corp. and EOG Resources, Inc. XTO Energy, Inc. was not included in the 2010 peer group due to its acquisition by Exxon Mobil Corp.
\ No newline at end of file
diff --git a/llama_parse_results/results.jsonl b/llama_parse_results/results.jsonl
index 2491e26..b7a9c74 100644
--- a/llama_parse_results/results.jsonl
+++ b/llama_parse_results/results.jsonl
@@ -1,3 +1,3 @@
version https://git-lfs.github.com/spec/v1
-oid sha256:43c394d497fcfd78644d6f3cd3e35df22f85034c7129013a183c3b3d85e171e2
-size 42375
+oid sha256:f073b669e508082b93d7a1451ba78a522e004954e32522865603759d79a0fcc0
+size 98833
diff --git a/markdown_gen/gemini_markdown.py b/markdown_gen/gemini_markdown.py
index 4a70f03..422b2a2 100644
--- a/markdown_gen/gemini_markdown.py
+++ b/markdown_gen/gemini_markdown.py
@@ -23,12 +23,14 @@
MAX_CONCURRENCY = 5
MAX_RETRIES = 3 # Number of retry attempts
RETRY_DELAY = 2 # Seconds to wait between retries
+
+SCRIPT_DIR = Path(__file__).parent
INPUT_DIR = Path("PDFs")
BASE_OUTPUT_DIR = Path("gemini_results")
MARKDOWNS_DIR = BASE_OUTPUT_DIR / "markdowns"
JSONL_OUTPUT = BASE_OUTPUT_DIR / "results.jsonl"
-with open("ai_prompt.md", "r") as f:
+with open(SCRIPT_DIR / "ai_prompt.md", "r") as f:
MASTER_PROMPT = f.read()
# Model Selection
@@ -248,20 +250,20 @@ async def main():
return
# Get all PDFs
- files_to_parse = list(INPUT_DIR.glob("*.pdf"))
all_pdfs = list(INPUT_DIR.glob("*.pdf"))
files_to_parse = [f for f in all_pdfs if not (MARKDOWNS_DIR / f.with_suffix('.md').name).exists()]
# Only process PDFs that are missing their .md output
-
- # FIXED: Remove or replace the buggy filter line
# If you want to filter specific files, uncomment and modify:
# SPECIFIC_FILES = ["file1.pdf", "file2.pdf"]
# files_to_parse = [f for f in files_to_parse if f.name in SPECIFIC_FILES]
if not files_to_parse:
- print(f"❌ No PDFs found in '{INPUT_DIR}'.")
+ if not all_pdfs:
+ print(f"❌ No PDFs found in '{INPUT_DIR}'.")
+ else:
+ print(f"✅ All {len(all_pdfs)} PDFs have already been processed. Nothing to do.")
return
print(f"🔄 Will retry failed documents up to {MAX_RETRIES} times\n")
diff --git a/markdown_gen/llamaprse_markdown.py b/markdown_gen/llamaprse_markdown.py
index 6901db2..b58cce0 100644
--- a/markdown_gen/llamaprse_markdown.py
+++ b/markdown_gen/llamaprse_markdown.py
@@ -16,7 +16,7 @@
# --- Configuration ---
INPUT_DIR = Path("PDFs")
-NUM_WORKERS = 19
+NUM_WORKERS = 5
BASE_OUTPUT_DIR = Path("llama_parse_results")
MARKDOWNS_DIR = BASE_OUTPUT_DIR / "markdowns"
JSONL_OUTPUT = BASE_OUTPUT_DIR / "results.jsonl"
@@ -25,9 +25,6 @@
# 1. Define your models and their costs here
MODEL_COSTS = {
"anthropic-sonnet-4.5": 90,
- "gpt-4o": 7,
- "gpt-4o-mini": 2,
- "llama-3.2-90b": 4
}
# 2. Select the model you want to use
@@ -51,125 +48,125 @@ def get_parser():
verbose=False
)
-def save_results(results, file_paths):
+def save_single_result(result, file_path):
"""
- Process the batch results and save them to disk.
- Returns the count of successfully extracted files.
+ Process and save a single result immediately.
+ Returns (success: bool, record: dict)
"""
- if not results:
- print("⚠️ No results to save")
- return 0
-
timestamp = datetime.now(timezone.utc).isoformat()
- records = []
- successfully_extracted = 0
-
- # Get the fixed credit cost from the dictionary
+ original_path = Path(file_path)
model_credit_cost = MODEL_COSTS.get(SELECTED_MODEL, 0)
- print(f"💾 Saving {len(results)} results to disk...")
+ try:
+ if result is None:
+ raise ValueError("Received None result from parser")
+
+ # Extract Markdown
+ md_docs = result.get_markdown_documents(split_by_page=True)
+
+ full_markdown = ""
+ parsing_error = None
+
+ if not md_docs:
+ parsing_error = "No markdown documents extracted"
+ else:
+ full_markdown = "\n\n".join([doc.text for doc in md_docs])
+ if not full_markdown.strip():
+ parsing_error = "Extracted markdown is empty"
- for i, result in enumerate(results):
- # Validate index bounds
- if i >= len(file_paths):
- print(f"⚠️ Warning: Result index {i} exceeds file_paths length")
- continue
-
- # Map back to original file path
- original_path = Path(file_paths[i])
+ # Save Markdown File
+ md_filename = f"{original_path.stem}.md"
+ md_path = MARKDOWNS_DIR / md_filename
try:
- # Validate result object
- if result is None:
- raise ValueError("Received None result from parser")
-
- # --- 1. Extract Markdown ---
- md_docs = result.get_markdown_documents(split_by_page=True)
-
- full_markdown = ""
- parsing_error = None
-
- if not md_docs:
- parsing_error = "No markdown documents extracted"
- print(f"⚠️ Warning: No markdown content for {original_path.name}")
- else:
- full_markdown = "\n\n".join([doc.text for doc in md_docs])
- # Double check if text is empty string
- if not full_markdown.strip():
- parsing_error = "Extracted markdown is empty"
-
- # --- 2. Save Markdown File (Only if we have content) ---
- md_filename = f"{original_path.stem}.md"
- md_path = MARKDOWNS_DIR / md_filename
-
- try:
- md_path.write_text(full_markdown, encoding="utf-8")
- except IOError as e:
- raise IOError(f"Failed to write markdown file: {e}")
-
- # --- 3. Extract Metadata (Credits from Dict, ID from Result) ---
- job_id = getattr(result, 'job_id', "N/A")
- credits_used = model_credit_cost # Uses dictionary value
-
- if hasattr(result, 'pages') and result.pages:
- num_pages = len(result.pages)
- elif md_docs:
- num_pages = len(md_docs)
- else:
- num_pages = 0
+ md_path.write_text(full_markdown, encoding="utf-8")
+ except IOError as e:
+ raise IOError(f"Failed to write markdown file: {e}")
- # --- 4. Determine Status & Build Record ---
- if parsing_error:
- status = "failed"
- record_error = parsing_error
- else:
- status = "success"
- record_error = None
- successfully_extracted += 1
-
- record = {
- "timestamp": timestamp,
- "service": "llama-cloud",
- "model": SELECTED_MODEL,
- "file": str(original_path),
- "filename": original_path.name,
- "job_id": job_id,
- "markdown_file": str(md_path),
- "status": status,
- "credits_used": credits_used,
- "pages": num_pages
- }
-
- if record_error:
- record["error"] = record_error
+ # Extract Metadata
+ job_id = getattr(result, 'job_id', "N/A")
+ credits_used = model_credit_cost
+
+ if hasattr(result, 'pages') and result.pages:
+ num_pages = len(result.pages)
+ elif md_docs:
+ num_pages = len(md_docs)
+ else:
+ num_pages = 0
- records.append(record)
-
- if status == "success":
- print(f"✅ Processed: {original_path.name} ({num_pages} pages, {credits_used} credits)")
- else:
- print(f"⚠️ Failed Logic: {original_path.name} - {record_error}")
+ # Determine Status & Build Record
+ if parsing_error:
+ status = "failed"
+ record_error = parsing_error
+ else:
+ status = "success"
+ record_error = None
+
+ record = {
+ "timestamp": timestamp,
+ "service": "llama-cloud",
+ "model": SELECTED_MODEL,
+ "file": str(original_path),
+ "filename": original_path.name,
+ "job_id": job_id,
+ "markdown_file": str(md_path),
+ "status": status,
+ "credits_used": credits_used,
+ "pages": num_pages
+ }
+
+ if record_error:
+ record["error"] = record_error
+
+ # Write to JSONL immediately
+ try:
+ with open(JSONL_OUTPUT, "a", encoding="utf-8") as f:
+ f.write(json.dumps(record, ensure_ascii=False) + "\n")
+ except IOError as e:
+ print(f"❌ Error writing JSONL: {e}")
+
+ return (status == "success", record)
+
+ except Exception as e:
+ record = {
+ "timestamp": timestamp,
+ "file": str(original_path),
+ "filename": original_path.name,
+ "error": str(e),
+ "status": "failed"
+ }
+ # Still try to write error to JSONL
+ try:
+ with open(JSONL_OUTPUT, "a", encoding="utf-8") as f:
+ f.write(json.dumps(record, ensure_ascii=False) + "\n")
+ except IOError:
+ pass
+ return (False, record)
+
+async def parse_single_file(parser, file_path, semaphore):
+ """
+ Parse a single file with semaphore-controlled concurrency.
+ """
+ async with semaphore:
+ try:
+ result = await parser.aparse(str(file_path))
+
+ num_pages = len(result.pages) if hasattr(result, 'pages') and result.pages else 0
+
+ return {
+ "file_path": file_path,
+ "status": "success",
+ "result": result,
+ "pages": num_pages,
+ }
except Exception as e:
- print(f"❌ Error processing result for {original_path.name}: {e}")
- records.append({
- "timestamp": timestamp,
- "file": str(original_path),
- "filename": original_path.name,
+ return {
+ "file_path": file_path,
+ "status": "error",
"error": str(e),
- "status": "failed"
- })
+ }
- # --- 5. Write JSONL ---
- try:
- with open(JSONL_OUTPUT, "a", encoding="utf-8") as f:
- for record in records:
- f.write(json.dumps(record, ensure_ascii=False) + "\n")
- print(f"📝 Results appended to {JSONL_OUTPUT}")
- except IOError as e:
- print(f"❌ Error writing JSONL file: {e}")
-
- return successfully_extracted
async def main():
# 1. Validation
@@ -182,9 +179,9 @@ async def main():
print(f"⚠️ Warning: Model '{SELECTED_MODEL}' not found in MODEL_COSTS dictionary.")
print(" Credits will be recorded as 0.")
- FILES_TO_PARSE = [str(p) for p in INPUT_DIR.glob("*.pdf")]
+ pdf_files = list(INPUT_DIR.glob("*.pdf"))
- if not FILES_TO_PARSE:
+ if not pdf_files:
print(f"❌ Error: No PDF files found in '{INPUT_DIR}'")
return
@@ -200,41 +197,75 @@ async def main():
print(f"🚀 Starting LlamaParse Batch")
print(f"🤖 Model: {SELECTED_MODEL}")
print(f"💰 Cost per file: {MODEL_COSTS.get(SELECTED_MODEL, 'Unknown')}")
- print(f"📄 Files to Process: {len(FILES_TO_PARSE)}")
- print(f"⚙️ Num Workers: {NUM_WORKERS}")
+ print(f"📄 Files to Process: {len(pdf_files)}")
+ print(f"⚙️ Max Concurrent Workers: {NUM_WORKERS}")
+
+ # Initialize parser with num_workers=1 since we control concurrency with semaphore
+ parser = LlamaParse(
+ api_key=llama_api_key,
+ num_workers=1, # We control concurrency with semaphore
+ parse_mode="parse_page_with_agent",
+ model=SELECTED_MODEL,
+ high_res_ocr=True,
+ adaptive_long_table=False,
+ output_tables_as_HTML=False,
+ precise_bounding_box=False,
+ page_separator="\n\n---\n\n",
+ verbose=False,
+ show_progress=False, # We'll show our own progress
+ )
- parser = get_parser()
+ # Create semaphore to limit concurrent requests
+ semaphore = asyncio.Semaphore(NUM_WORKERS)
start_time = time.time()
- try:
- print("⏳ Parsing documents...")
- results = await parser.aparse(FILES_TO_PARSE)
-
- if not results:
- print("⚠️ Warning: Parser returned empty results")
- return
+ # Create tasks for all files
+ tasks = [
+ asyncio.create_task(parse_single_file(parser, pdf_file, semaphore))
+ for pdf_file in pdf_files
+ ]
+
+ # Process results as they complete and save immediately
+ successfully_extracted_count = 0
+ error_count = 0
+
+ # Use tqdm with manual update for a single progress bar
+ from tqdm import tqdm
+
+ with tqdm(total=len(tasks), desc="Parsing PDFs", unit="file") as pbar:
+ for coro in asyncio.as_completed(tasks):
+ parse_result = await coro
- except Exception as e:
- print(f"\n❌ Critical Batch Error: {e}")
- return
+ if parse_result["status"] == "success":
+ # Eagerly save result to disk
+ success, record = save_single_result(
+ parse_result["result"],
+ parse_result["file_path"]
+ )
+ if success:
+ successfully_extracted_count += 1
+ else:
+ error_count += 1
+ else:
+ error_count += 1
+ # Save error record
+ save_single_result(None, parse_result["file_path"])
+
+ pbar.update(1)
duration = time.time() - start_time
print(f"\n✅ Batch finished in {duration:.2f} seconds")
- # 4. Save and get success count
- successfully_extracted_count = save_results(results, FILES_TO_PARSE)
+ # Summary Statistics
+ cost_per_file = MODEL_COSTS.get(SELECTED_MODEL, 0)
+ total_credits = len(pdf_files) * cost_per_file
- # 5. Summary Statistics
- if results:
- # Calculate total credits based on dictionary logic
- cost_per_file = MODEL_COSTS.get(SELECTED_MODEL, 0)
- total_credits = len(results) * cost_per_file
-
- print(f"\n📊 Summary:")
- print(f" Total Files Processed: {successfully_extracted_count}/{len(FILES_TO_PARSE)}")
- print(f" Total Credits Used: {total_credits}")
- print(f" (Based on fixed cost: {cost_per_file} credits/file for {SELECTED_MODEL})")
+ print(f"\n📊 Summary:")
+ print(f" Total Files Processed: {successfully_extracted_count}/{len(pdf_files)}")
+ print(f" Parse Errors: {error_count}")
+ print(f" Total Credits Used: {total_credits}")
+ print(f" (Based on fixed cost: {cost_per_file} credits/file for {SELECTED_MODEL})")
print(f"\n🎯 Total files extracted correctly: {successfully_extracted_count}")
diff --git a/prod_benchmark.py b/prod_benchmark.py
index ab85068..1ca5032 100644
--- a/prod_benchmark.py
+++ b/prod_benchmark.py
@@ -422,10 +422,9 @@ def analyze_results(
# Exclude specified folders (e.g., 'test' folders)
filtered_df = filtered_df[~filtered_df["Folder"].isin(excluded_folders)]
- filtered_df.to_csv("benchmark_granular.csv", index=False)
# Keep only rows where at least one method found a close match
filtered_df = filtered_df[filtered_df[score_columns].min(axis=1) < min_score_threshold]
- filtered_df.to_csv("benchmark_data/benchmark_filtered.csv", index=False)
+ filtered_df.to_csv("benchmark_granular.csv", index=False)
if filtered_df.empty:
logger.warning("No data left after filtering. Cannot generate report.")
@@ -480,7 +479,7 @@ def main() -> int:
)
# Input files
- parser.add_argument('--pdf-path', type=str, default='benchmark_data/PDFs',
+ parser.add_argument('--pdf-path', type=str, default='PDFs/',
help='Path to PDF file or directory containing PDFs')
parser.add_argument('--excel-path', type=str, default='benchmark_data/Pictures.xlsx',
help='Path to Excel file with OCR text')
|